Elastic membrane for semiconductor wafer polishing

- EBARA CORPORATION
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Description

FIG. 1 is a top perspective view a first embodiment of an elastic membrane for semiconductor wafer polishing showing our new design;

FIG. 2 is a bottom perspective view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom view thereof;

FIG. 5 is a front view thereof;

FIG. 6 is a side view thereof;

FIG. 7 is a cross sectional view taken along section line 7-7 in FIG. 3 thereof;

FIG. 8 is an enlarged portion view of section 8 in FIG. 7 thereof;

FIG. 9 is a top perspective view a second embodiment of an elastic membrane for semiconductor wafer polishing showing our new design;

FIG. 10 is a bottom perspective view thereof;

FIG. 11 is a top plan view thereof;

FIG. 12 is a bottom view thereof;

FIG. 13 is a front view thereof;

FIG. 14 is a side view thereof;

FIG. 15 is a cross sectional view taken along section line 15-15 in FIG. 11 thereof; and,

FIG. 16 is an enlarged portion view of section 16 in FIG. 15 thereof.

Claims

The ornamental design for an elastic membrane for semiconductor wafer polishing, as shown and described.

Referenced Cited
U.S. Patent Documents
6659850 December 9, 2003 Korovin
7357699 April 15, 2008 Togawa
D633452 March 1, 2011 Namiki
8469776 June 25, 2013 Zuniga
8859070 October 14, 2014 Yasuda
D769200 October 18, 2016 Fukushima et al.
D825505 August 14, 2018 Hanson
D837755 January 8, 2019 Riker
D839224 January 29, 2019 Yamaki
20130316628 November 28, 2013 Jang
Foreign Patent Documents
D1420846 August 2014 JP
D1421157 August 2014 JP
D1422692 September 2014 JP
D146490 April 2012 TW
Patent History
Patent number: D859332
Type: Grant
Filed: Dec 21, 2017
Date of Patent: Sep 10, 2019
Assignee: EBARA CORPORATION (Tokyo)
Inventors: Satoru Yamaki (Tokyo), Makoto Fukushima (Tokyo), Keisuke Namiki (Tokyo), Osamu Nabeya (Tokyo), Shingo Togashi (Tokyo), Tomoko Owada (Tokyo)
Primary Examiner: Selina Sikder
Application Number: 29/630,484