Abstract: A semiconductor integrated circuit, able to repair a fault and normally operate as an overall circuit even when a fault occurs in a portion of the circuit, and able to reduce a change of signal delay along with the repair of the fault, including N (larger than 2) number of circuit modules which can replace each other's functions; circuit blocks each including R (larger than 1 but smaller than N) number of I/O units for outputting at least one signal to one circuit module, and receiving at least one signal generated in the one circuit module; and a circuit module selection unit configured to select R number of circuit modules from among the N number of circuit modules in response to a control signal, connect the selected R number of circuit modules and R number of I/O units of the circuit block in a 1:1 correspondence, and connect one circuit module selected from at least two circuit modules in response to the control signal to each of the R number of I/O units, and a method of producing the same.

Abstract: A semiconductor integrated circuit having a test circuit for inspecting states of connections between a plurality of pads and respective external terminals by bonding wires. The test circuit comprises, for each of a plurality of pads, a control terminal provided to receive a control signal of a logic level equal to the logic level of a signal applied to a corresponding one of the external terminals, an inverter which inverts the logic level on the control terminal, an inverted output terminal of the inverter being connected to the pad via a connection line; and an exclusive-NOR gate which outputs an exclusive NOR of the logic level on the connection line and the logic level on the control terminal.

Abstract: The present invention includes a circuit-level system and method for preventing the propagation of soft errors in logic cells. A radiation jammer circuit in accordance with the present invention, including an RC differentiator and a depletion mode MOS circuit, when inserted at the output of a logic cell, significantly reduces the propagation of transient glitches. The radiation jammer circuit is a novel transistor-level optimization technique, which has been used to reduce soft errors in a logic circuit. A method to insert radiation jammer cells on selective nodes in a logic circuit for low overheads in terms of delay, power, and area is also introduced.

Abstract: The invention relates to a device for forming an electric circuit comprising logic means (30) generating and using small signals of intermediate levels between the device supply levels and means for detecting signals leaving the small signal range.

Abstract: A semiconductor integrated circuit device includes a target circuit of a low power consumption mode having at least one flip-flop circuit to which a clock signal is supplied in a normal operation mode and in a low power consumption mode, and a logic circuit to which each output of the at least one flip-flop circuit is input, wherein each of the flip-flop circuits includes a selector that selects a normal data signal in the normal operation mode, selects an inverted output of the flip-flop circuit in the low power consumption mode, based on an operation-mode switching signal that designates switching between the normal operation mode and the low power consumption mode, and inputs the selected signal to a data input terminal of the flip-flop circuit.

Abstract: A configuration management system is disclosed. For example, an embodiment of the present invention provides a configuration management system comprising a configuration storage device containing configuration data, and an integrated circuit, coupled to the configuration storage device, where the integrated circuit comprising at least one configuration management controller for managing a configuration of the integrated circuit in accordance with the configuration data, where the integrated circuit is deployed in a radiation tolerant device.

Abstract: The present invention describes systems and methods to provide defect-tolerant logic devices. An exemplary embodiment of the present invention provides a defect-tolerant logic device including a plurality of CMOS gates and at least one defective CMOS gate included within the plurality of CMOS gates. Additionally, the at least one defective CMOS gate is enabled to be reconfigured into a pseudo-NMOS transistor if a P-network of the at least one defective CMOS gate is diagnosed as defective. Furthermore, the at least one defective CMOS gate is enabled to be reconfigured into a pseudo-PMOS transistor if the N-network of the at least one defective CMOS gate is diagnosed as defective.

Abstract: Methods are disclosed to increase yielded performance of a reconfigurable integrated circuit; improve performance of an application running on a reconfigurable integrated circuit; reduce degradation of an integrated circuit over time; and maintain performance of an integrated circuit time.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: An input buffer has a high voltage leg in parallel with a low voltage leg. The low voltage leg pulls up the pad when the pad voltage is below the power supply voltage. The high voltage leg remains off when the pad voltage is below the power supply. The low voltage leg is turned off when the pad voltage is above the power supply voltage. The high voltage leg is on when the pad voltage is above power supply voltage. A low voltage bias circuit and a high voltage bias circuit protect the transistors in the low and voltage legs when the pad voltage is above the power supply voltage. As a result, the pull-up circuit is high voltage tolerant and does not sink the current from pad.

Abstract: An electronic device with logic circuitry (LC) is provided. The logic circuitry (LC) comprises at least one electronic unit (EU), in particular one logic gate with a first electronic component (EC1) for performing logic operations; and at least one second electronic component (EC2) for improving the soft-error sensitivity of the logic circuitry (LC). The first and the second electronic component (EC1, EC2) are implemented with substantially the same logical function. The second electronic component (EC2) is redundant. In addition, the inputs of the first and the second electronic component (EC1, E2) are coupled and the outputs of the first and the second electronic component (EC1, E2) are coupled, respectively.

Abstract: A configuration management system is disclosed. For example, an embodiment of the present invention provides a configuration management system comprising at least one configuration storage device containing configuration data, and a plurality of integrated circuits, coupled to said at least one configuration storage device, where the plurality of integrated circuits are coupled in a loop, where each of the plurality of integrated circuits comprising at least one configuration management controller for managing a configuration of another integrated circuit in the loop in accordance with the configuration data, where the plurality of integrated circuits is deployed in at least one radiation tolerant device.

Abstract: An apparatus for improving storage latch susceptibility to single event upsets includes a dual interconnected storage cell (DICE) configured within a storage latch circuit; a pair of separate three-state circuits configured to write the DICE latch, with each three-state circuit coupled to separate data nodes within the DICE latch; and a pair of local clock circuits configured within the storage latch circuit, the pair of local clock circuits configured to generate a duplicate pair of control signals that separately control a corresponding one of the separate three-state circuits. In the event of a charge accumulation event on only one of the pair of local clock circuits so as to change the logical state of the corresponding control signal, the presence of the other of the pair of local clock circuits that remains unaffected by the charge accumulation event prevents an error in the logical state of the DICE latch.

Abstract: Partial reconfiguration of programmable logic for supporting a Multiple-input, Multiple-Output Orthogonal Frequency Division Multiplexing (“MIMO-OFDM”) communication system is described. A PHY block in a programmable device may be instantiated generally in part in programmable logic of the programmable device. Control information is obtained for a network node when deployed and/or from a wireless transmission of a packet or frame, which is demodulated in the PHY block. Responsive to the control information demodulated, bitstream information is obtained to configure the portion of the PHY block using the programmable logic of the programmable device.

Abstract: A system, method, and apparatus for enhancing reliability on scan-initialized latches that affect functionality in a digital design are provided. The system includes a group of latches that affect functionality in the digital design based on state values of the latches, where the latches are scan initialized. The system also includes a disable allowance latch (DAL) allocated to the group of latches, where the DAL is a scan-initialized latch. The system further includes a gating function outputting the state value of at least one of the latches in the group to a functional block in the digital design in response to the DAL being in an enabled state and blocking the gating function output in response to the DAL being in a disabled state.

Abstract: A method and apparatus is provided to significantly increase the flexibility of readback capture mechanisms, the apparatus being an integrated circuit device, comprising a configuration data router coupled to receive at least one configuration data frame from a configuration interface, a configuration memory space coupled to the configuration data router and adapted to receive the configuration data frame to define a user logic block and a capture block within the programmable logic device, the user logic block including, a monitor control block coupled to the capture block and adapted to report activity within the user logic block to the capture block, and a configuration control logic block coupled to the capture block that is adapted to assert the capture signal in response to the asserted alert signal.

Abstract: A method of configuring an integrated circuit having programmable logic including the steps of generating a configuration bitstream in accordance with a configuration setup, storing the configuration bitstream into a portion of a memory, configuring the programmable logic of the integrated circuit with a first configuration portion of the configuration bitstream of the memory, monitoring the integrated circuit for at least one configuration error generated in response to an event upset, reconfiguring at least a portion of the programmable logic of the integrated circuit with a second configuration portion of the configuration bitstream in response to the at least one configuration error generated. The integrated circuit may operate normally during the process of reconfiguring the at least a portion of the programmable logic.

Abstract: Apparatus, systems, and methods may operate to identify state holding elements and functional logic elements in an original cyclic structure, and to insert additional state holding elements or initial tokens in series with the identified functional logic elements to create a modified cyclic structure, wherein the additional state holding elements or initial tokens have substantially identical functionality to the original state holding elements. Other activities may include coupling additional functional logic elements to output nodes of the modified cyclic structure, wherein the additional functional logic elements have substantially identical functionality to the original functional logic elements. Additional apparatus, systems, and methods are disclosed.

Abstract: A logic circuit includes a storage node coupled to a data line and a soft-error protection circuit to change a logical value of the storage node from a first value to a second value when the logical value of the storage node does not correspond a logical value of an output node. The logic circuit may be a set dominant latch and a memory circuit may be formed based on the set dominant latch.

Abstract: A method for single event transient filtering in an integrated circuit device is described. The device comprises three sequential elements, each having a data input and a data output with each of the three data outputs coupled to one of three inputs of a voting gate. The method comprises generating first and second nominally equivalent logic signals in first and second SET domains, converting the first and second nominally equivalent logic signals into first, second and third nominally equivalent data channels, and transmitting the first, second and third nominally equivalent data channels to the data inputs of the first, second and third sequential elements.

Abstract: A number of logic state catching circuits are described which use a logic circuit with a first input, a second input, and an output. The logic circuit is configured to respond to a change in state of a data value coupled to the first input causing a representative value of the data value to be generated on the output. The second input receives a latched version of the data value to hold the representative value on the output after the data value has returned to its original state. A latching element is configured to respond to the change in state of the data value by latching the data value and to couple the latched version of the data value to the second input. A reset element is configured to respond to a change in state of a clock input by resetting the latching element.

Abstract: A digital circuit with dynamic power and performance control via per-block selectable operating voltage level permits dynamic tailoring of operating power to processing demand and/or compensation for process variation. A set of processing blocks having a power supply selectable from two different power supply voltage levels is provided. The power level of the overall circuit is set by selecting the power supply voltage for each block to yield a combination of blocks that meets operating requirements. Alternatively, one circuit per pair from a set of pairs of redundant logic blocks supplied by the different power supply voltage levels can be selected to meet the operating requirements. The unselected blocks can be disabled by disabling foot devices or disabling transitions at the inputs to the unselected blocks. Performance measurement and feedback circuits can be included to tune the power consumption and performance level of the circuit to meet an expected level.

Abstract: It is configured by plurality of NAND circuits connected in series through a plurality of inverters, and a plurality of NOR circuits connected in series through the plurality of inverters. Each of a plurality of source signal lines provided in a pixel portion is connected to one input terminal of a NAND circuit and a NOR circuit, and an output of an inspection is obtained from final lines of the NAND circuit and the NOR circuit connected in series. In this manner, an inspecting circuit which is capable of determining a defect simply and accurately by using a small-scale circuit, and a method thereof are provided.

Abstract: Some embodiments of the invention provide a configurable integrated circuit (IC) that includes several configurable circuits for configurably performing different operations and several user design state (UDS) circuits for storing user-design state values. The IC further includes a trace buffer for storing user-design state values associated with an operational trigger even of the IC. In some embodiments, the configurable circuits, UDS circuits, and tracer buffer are on a single IC die.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: Some embodiments of the invention is a configurable integrated circuit (IC) that includes (1) several configurable logic circuits, (2) a first routing network for connecting the configurable logic circuits, (3) several user design state (UDS) circuits, and (4) a second network communicatively coupled to the UDS circuits. In least one period during the operation of the IC, the second network receives addresses for a several UDS circuits in a random access manner. In some embodiments, the second network is a debug network for reading randomly state values stored by the addressed UDS circuits during the user-design operation of the IC.

Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: An SEU hardening circuit and method is disclosed. In one embodiment, a method includes providing a semiconductor memory component having a pair of pMOS transistors and a pair of nMOS transistors, tying a first pMOS body terminal of a first pMOS transistor of the pair of pMOS transistors to a second pMOS gate terminal of a second pMOS transistor of the pair of pMOS transistors, and tying at least a first pre-designated body terminal of at least one transistor selected from the group including essentially of a pair of pMOS transistors and a pair of nMOS transistors to at least a second pre-designated terminal of at least one pre-designated transistor selected from the group including essentially of the pair of pMOS transistors and the pair of nMOS transistors.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: A design structure for an integrated circuit that includes input/output (I/O) state saving circuitry capable of stabilizing the I/O states during any predicted I/O disturbance event. The I/O state saving circuitry includes a plurality of transparent latches arranged between the output of a plurality of respective I/O receivers and the internal digital, analog, or mixed-signal circuitry of the integrated circuit. The transparent latches are transitioned between a pass-through mode and a state-saving mode via a common control signal. In anticipation of, for example, a predicted I/O signal disturbance generating event, the transparent latches are set to the state-saving mode. Consequently, the outputs of the transparent latches are held stable and glitchless during the disturbance event, which ensures that the internal logic of the integrated circuit does not lose state.

Abstract: A radiation hardened inverter includes first and second electrical paths between an input terminal and an output terminal. A first PFET is disposed in the first electrical path, and a bipolar junction transistor (BJT) is disposed in the second electrical path. The first PFET is configured to convert a low level signal at the input terminal to a high level signal at the output terminal, and the BJT is configured to convert a high level signal at the input terminal to a low level signal at the output terminal. The radiation hardened inverter includes a second PFET disposed in the second electrical path. The second PFET is configured to provide a path for bleeding excess current away from the BJT. The radiation hardened inverter also includes a current limiting PFET disposed in the second electrical path. The current limiting PFET is configured to limit current flowing into a base of the BJT. The radiation hardened inverter is free-of any NFETs.

Abstract: An exemplary adapter comprises an input port for connecting to a first hardware device; an output port for connecting to a second hardware device; a standby output port for connecting to the second hardware device; a programmable logic device (PLD) having at least one input terminal connected to the input port, at least one output terminal connected to the output port, at least one standby output terminal connected to the standby output port, and at least one control terminal to receive a voltage signal; and a jumper connected to the control terminal of the PLD to send a voltage signal thereto, wherein the input terminal of the PLD is selectively coupled to the output terminal or the standby output terminal of the PLD under the control of the voltage signal.

Abstract: Disclosed is an inverter, a NAND element, a NOR element, a memory element and a data latch circuit which exhibit high tolerance to single event effect (SEE). In an SEE tolerant inverter (3I), each of a p-channel MOS transistor and a n-channel MOS transistor which form an inverter is connected in series with an additional second transistor of the same conductive type as that thereof so as to form a double structure (3P1, 3P2; 3N1, 3N2). Further, a node A between the two p-channel MOS transistors and a node (B) between the two n-channel MOS transistors are connected together through a connection line. Each of an SEE tolerant memory element and an SEE tolerant data latch circuit comprises this SEE tolerant inverter (3I).

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: A low voltage differential signaling transceiver includes a transmitter and a receiver, the transmitter having a first terminal in signal communication with a transmission line, a source resistance in signal communication with the first terminal, a switch in signal communication with the source resistance and in switchable signal communication from ground or an input voltage, a voltage regulator in switchable signal communication with the switch for providing the input voltage to the switch, and a voltage controller in signal communication between the first terminal and the voltage regulator for controlling the input voltage to provide a controlled voltage to a receiver; and the receiver having an amplifier having a first input, a first pad in signal communication with the first input, a load resistance, and a second pad in signal communication with the load resistance, where the first and second pads are both in signal communication with one end of a first transmission line.

Abstract: The invention relates to a testable integrated circuit. In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell (34) which comprises a flipflop (11) and means (31) able to set the output voltage of the cell when the circuit is in the operation mode. These means for setting the output voltage are controlled by a control signal (15) which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.

Abstract: New and improved methods and circuit designs for asynchronous circuits that are tolerant to transient faults, for example of the type introduced through radiation or, more broadly, single-event effects. SEE-tolerant configurations are shown and described for combinational logic circuits, state-holding logic circuits and SRAM memory circuits.

Abstract: A latch circuit includes a feedback circuit having inverter circuits and at least two input terminals and an input circuit for inputting input signals or signals having the same phase as the input signals to the input terminals of the feedback circuit in synchronization with a clock signal. In the feedback circuit section, only when the input signals or the signals having the same phase as the input signals are input to the at least two input terminals at the same time, positive feedback using a predetermined number of amplification stages is applied to the input terminals.

Abstract: The invention includes an error correcting logic system that allows critical circuits to be hardened with only one redundant unit and without loss of circuit performance. The system provides an interconnecting gate that suppresses a fault in one of at least two redundant dynamic logic gates that feed to the interconnecting gate. The system is applicable to dynamic or static logic systems. The system prevents propagation of a fault, and addresses not only soft errors, but noise-induced errors. Also, there is provided a design structure embodied in a machine readable medium used in a design process, and which includes such error correcting logic system.

Abstract: The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).

Abstract: The invention relates to a testable integrated circuit. In order to replace ground and VDD in certain points of such a circuit, the circuit comprises a cell (34) which comprises a flipflop (11) and means (31) able to set the output voltage of the cell when the circuit is in the operation mode. These means for setting the output voltage are controlled by a control signal (15) which depends on the mode signal that indicates whether the signal is in the test mode or in the operation mode.

Abstract: A design structure for repairing an integrated circuit during operation of the integrated circuit. The integrated circuit comprising of a multitude of memory arrays and a fuse box holding control data for controlling redundancy logic of the arrays. The design structure provides the integrated circuit with a control data selector for passing the control data from the fuse box to the memory arrays; providing a source of alternate control data, external of the integrated circuit; and connecting the source of alternate control data to the control data selector. The design structure further passes the alternate control data from the source thereof, through the control data selector and to the memory arrays to control the redundancy logic of the memory arrays.

Abstract: The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).

Abstract: A method and system for determining convergence of iterative processes and estimating a scaling factor in decoding processes based on switching activity of the logic circuitry are provided. During execution of an iterative process using logic circuitry comprising logic gates switching activity of a plurality of the logic gates is sensed to determine switching data indicative of a total switching activity of the plurality of the logic gates. The iterative process is iterated using the logic circuitry until convergence is indicated by the switching data. Similarly, a scaling factor for use in decoding processes is determined based on the switching data.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function.

Abstract: A radiation-hardened logic circuit prevents SET-induced transient pulses from propagating through the circuit, using two identical logic paths. The outputs of the two logic paths are fed into an exclusive-OR gate, which controls gating circuitry. The gating circuitry can be a controlled pass-gate circuit and a data latch, an adjustable threshold comparator, or two controlled latches. Transient pulse suppression is achieved with less circuitry and expense than is found in TMR circuits.

Abstract: Some embodiments of the invention provide a configurable integrated circuit (IC) that includes several configurable circuits for configurably performing different operations and several user design state (UDS) circuits for storing user-design state values. The IC further includes a trace buffer for storing user-design state values associated with an operational trigger event of the IC. In some embodiments, the configurable circuits, UDS circuits, and tracer buffer are on a single IC die.