Abstract: A semiconductor integrated circuit including: N modules set in their functions in accordance with input function setting data, a circuit block having R number of I/O parts, and a module selection part for selecting R number of modules from among the N number of modules connecting the selected R number of modules and R number of I/O parts of the circuit block and connecting one module selected from among at least two modules to each of the R number of I/O parts. Each of the R number of I/O parts has a data holding part for holding a function setting data and inputting the held function setting data to the destination module, and N modules are able to replace functions of each other when the input function setting data are the same.

Abstract: Methods and systems for hardening a clocked latch against single event effects are disclosed. A system includes a first three-input OR gate, a first NAND gate, a second three-input OR gate, and a second NAND gate. The first three-input OR gate receives as inputs a clock signal, a first signal, and a redundant first signal. An output of the first three-input OR gate is connected to an input of the first NAND gate. The second three-input OR gate receives as inputs the clock signal, a second signal, and a redundant second signal. An output of the second three-input OR gate is connected to an input of the second NAND gate. A first output signal of the first NAND gate is connected to another input of the second NAND gate and a second output signal of the second NAND gate is connected to another input of the first NAND gate.

Abstract: Disclosed is a method of repairing an integrated circuit of the type comprising of a multitude of memory arrays and a fuse box holding control data for controlling redundancy logic of the arrays. The method comprises the steps of providing the integrated circuit with a control data selector for passing the control data from the fuse box to the memory arrays; providing a source of alternate control data, external of the integrated circuit; and connecting the source of alternate control data to the control data selector. The method comprises the further step of, at a given time, passing the alternate control data from the source thereof, through the control data selector and to the memory arrays to control the redundancy logic of the memory arrays.

Abstract: In a receiver circuit that receives data and clock signals through the cables, the number of transitions of a signal obtained based on the data or clock signal is detected by a frequency detection circuit, and when the number of transitions is not more than a predetermined set value, a signal for resetting the operation of a serial-parallel converter circuit included in a data processing unit is output, so as to control the output of received data. Thus, disconnection of the cable can be detected with low power consumption without providing a pull-up resistor and pull-down resistor and noise resistance can be improved.

Abstract: Provided is a disconnection and short detecting circuit capable of detecting disconnection and short of a signal line transmitting a differential clock signal. A differential buffer part DB1 has a first comparator to compare a non-inverting clock signal inputted from a PADI and an inverting clock signal inputted from a PADR; a second comparator to compare a non-inverting clock signal and a reference potential Vref; and a third comparator to compare an inverting clock signal and the reference potential Vref. Their respective outputs are defined as Y, YI and YR, respectively. If the signal line of either a non-inverting clock signal or an inverting clock signal is disconnected, or short-circuited to a grounding potential VSS of a logical value Low, the logical values outputted from the second and the third comparators are equal for a long period of time in one cycle of the non-inverting clock signal or the inverting clock signal.

Abstract: Disclosed is a method of repairing an integrated circuit of the type comprising of a multitude of memory arrays and a fuse box holding control data for controlling redundancy logic of the arrays. The method comprises the steps of providing the integrated circuit with a control data selector for passing the control data from the fuse box to the memory arrays; providing a source of alternate control data, external of the integrated circuit; and connecting the source of alternate control data to the control data selector. The method comprises the further step of, at a given time, passing the alternate control data from the source thereof, through the control data selector and to the memory arrays to control the redundancy logic of the memory arrays.

Abstract: Protection against anti single event effects associated with strikes of energetic particles is provided in current-mode logic (CML) or similar integrated circuits (ICs) using a current-switching architecture.

Abstract: Methods of implementing designs in programmable logic devices (PLDs) to reduce susceptibility to single-event upsets (SEUs) by taking advantage of the fact that most PLD designs leave many routing resources unused. The unused routing resources can be used to provide duplicate routing paths between source and destination of signals in the design. The duplicate paths are selected such that an SEU in a routing multiplexer included in each path simply switches the signal between the two paths. Thus, if one path is disabled due to an SEU, the other path can still provide the necessary connection, and the functionality of the design is unaffected. The methods can be applied, for example, to routing software for field programmable gate arrays (FPGAs) having programmable routing multiplexers controlled by static RAM-based configuration memory cells.

Abstract: A method of testing connectivity through a plurality of dual purpose current mode logic (“CML”) latch circuits connected in a series is provided. Each of the CML latch circuits are operable to latch at least one output signal at a timing in accordance with at least one clock signal and having a mode control device for operating the CML latch circuit as a buffer amplifier when the at least one clock signal is inactive. The method comprises the steps of activating the mode control devices of each of the CML latches to operate each of the CML latches as a buffer; inputting a first signal to a first CML latch of the series; latching an output signal of a second CML latch of the series, the second CML latch being connected at a point in the series downstream from the first CML latch; and determining whether the output signal changes in accordance with a change in the first signal.

Abstract: In a signal transmission system between a plurality of semiconductor apparatuses, a logic level decision circuit deciding a logic level of an input signal in accordance with which of two reference signals a signal level of the input signal is close to, by using two reference signals Vref1, Vref0 having a “1” level and a “0” level as reference signals for deciding the logic level of the input signal having a binary logic level, is used as an input receiver of the each semiconductor apparatus.

Abstract: A tamper response system to protect intellectual property is provided. In one embodiment, the tamper response system includes at least one sensor adapted to sense tamper activity and a tamper circuit. The tamper circuit is coupled to receive tamper signals from the at least one sensor. Moreover, the tamper circuit is adapted to clear at least one field programmable gate array (FPGA) upon receipt of a tamper signal.

Abstract: The invention includes an error correcting logic system that allows critical circuits to be hardened with only one redundant unit and without loss of circuit performance. The system provides an interconnecting gate that suppresses a fault in one of at least two redundant dynamic logic gates that feed to the interconnecting gate. The system is applicable to dynamic or static logic systems. The system prevents propagation of a fault, and addresses not only soft errors, but noise-induced errors.

Abstract: Systems and methods for mitigating the effects of soft errors in asynchronous digital circuits. Circuits are constructed using stages comprising doubled logic elements which are connected to c-elements that compare the output states of the double logic elements. The inputs of logic elements in a stage are inhibited from changing until the outputs of the c-elements of that stage are enabled. The c-elements inhibit the propagation of a soft error by halting the operation of the circuit until the temporary effects of the soft error pass.

Abstract: A method and apparatus to reduce the probability of programmable logic device (PLD) failure due to single event upset (SEU) of configuration memory. A first portion of configuration memory cells are initially programmed with configuration data, leaving a second portion of configuration memory cells that are un-programmed. The programmed and un-programmed configuration memory cells are grouped into voting groups, where each un-programmed configuration memory cell of each voting group is programmed with the identical configuration data as contained within the originally programmed configuration memory cell of each voting group. The logic values of each configuration memory cell of each voting group are monitored by voting circuits, which enforce a triple modular redundancy (TMR) validation policy. The logical validation results are then applied to control points to mitigate PLD configuration memory errors caused by anomalous events such as neutron induced SEUs.

Abstract: A data holding circuit includes a first data holding unit, a second data holding unit and a selection unit. In the first data holding unit, a probability of a soft error at a time when input data has a first level is lower than a probability of a soft error at a time when the input data has a second level. In the second data holding unit, a probability of a soft error at a time when the input data has the second level is lower than a probability of a soft error at a time when the input data has the first level. The selection unit selects an output from the first data holding unit when the input data has the first level, and selects an output from the second data holding unit when the input data has the second level.

Abstract: The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).

Abstract: An large scale integrated circuit (LSI) includes an input buffer for adjusting a signal input to an outer input terminal; an input side selector for outputting the signal to a first output side when a normal operation is specified and to a second output side when a test operation is specified; a logic circuit for performing a specific logic process and outputting the signal; a bypass circuit for transferring the signal from the second output side of the input side selector; an output side selector for selecting and outputting the signal from the logic circuit when the normal operation is specified and selecting and outputting the signal transferred through the bypass circuit when the test operation is specified; and an output buffer for amplifying and outputting the signal from the output side selector to an outer output terminal.

Abstract: Method and apparatus for data monitoring for error detection is described. A programmable logic device includes a configurable logic block having function generators, each of which is configurable for at least two programmable mode functions. The function generators are coupled to an array of memory cells for storing configuration bits for configuring the function generators. A primary address line is coupled to each memory cell spanning two or more of the function generators. A secondary address line is coupled to groups of memory cells associated with the function generators. A mask circuit is configured to selectively communicate a signal of the primary address line to a segment of the secondary address line or to a ground responsive in part to the program mode function.

Abstract: A method and a circuit for producing a fail-safe output signal in case of an open circuit condition of an input pad of a digital circuit unit, comprising a first inverter stage providing a constant switch level; a second inverter stage providing a variable switch level that depends of the signal level of the input pad and comparing the constant switch level of the first inverter stage with the variable switch level of the second stage and providing an output signal at an output terminal thereof if the variable switch level of the second stage is greater than the constant switch level; and an additional circuit clement connected in series with the second inverter for decreasing the switch level of the second inverter stage.

Abstract: A method, a computer program, and an apparatus are provided to protect transmission gates in a multiplexer (mux). Because transmission gates are much faster than the more convention AND-OR arrays, transmission gate usage in muxes are being used more often in high speed circuitry. However, transmission gate have a significant problem in that short circuit are possible for situations where there is not a one-hot select signal. Therefore, to eliminate the problem, logic gates are utilized specifically during Power-On Reset (POR) to force a one-hot selection to prevent any possible short circuits.

Abstract: Method and apparatus for a system monitor embedded in a programmable logic device are described. The system monitor includes a dynamic reconfiguration port interface for configuring or reconfiguring the system monitor during operation thereof. The system monitor includes an analog-to-digital converter which is reconfigurable responsive to input via a dynamic reconfiguration port.

Abstract: A method and apparatus to reduce the probability of programmable logic device (PLD) failure due to single event upset (SEU) of configuration memory. A first portion of configuration memory cells are initially programmed with configuration data, leaving a second portion of configuration memory cells that are un-programmed. The programmed and un-programmed configuration memory cells are grouped into voting groups, where each un-programmed configuration memory cell of each voting group is programmed with the identical configuration data as contained within the originally programmed configuration memory cell of each voting group. The logic values of each configuration memory cell of each voting group are monitored by voting circuits, which enforce a triple modular redundancy (TMR) validation policy. The logical validation results are then applied to control points to mitigate PLD configuration memory errors caused by anomalous events such as neutron induced SEUs.

Abstract: Method and apparatus for a system monitor embedded in a programmable logic device are described. The system monitor includes a dynamic reconfiguration port interface for configuring or reconfiguring the system monitor during operation thereof. The system monitor includes an analog-to-digital converter which is reconfigurable responsive to input via a dynamic reconfiguration port.

Abstract: By adding redundant logic gates into a circuit without changing function of the whole circuit, the present invention can tolerate certain delay variations. The present invention can be applied in the IC industries to improve the yield in semiconductor manufacturing.

Abstract: An embodiment of this invention pertains to a versatile and flexible logic element and logic array block (“LAB”). Each logic element includes a programmable combinational logic function block such as a lookup table (“LUT”) and a flip-flop. Within the logic element, multiplexers are provided to allow the flip-flop and the LUT to be programmably connected such that either the output of the LUT may be connected to the input of the flip-flop or the output of the flip-flop may be connected to the input of the LUT. An additional multiplexer allows the output of the flip-flop in one logic element to be connected to the input of a flip-flop in a different logic element within the same LAB. Output multiplexers selects between the output of the LUT and the output of the flip-flop to generate signals that drive routing lines within the LAB and to routing lines external to the LAB.

Abstract: Provided is a disconnection and short detecting circuit capable of detecting disconnection and short of a signal line transmitting a differential clock signal. A differential buffer part DB1 has a first comparator to compare a non-inverting clock signal inputted from a PADI and an inverting clock signal inputted from a PADR; a second comparator to compare a non-inverting clock signal and a reference potential Vref; and a third comparator to compare an inverting clock signal and the reference potential Vref. Their respective outputs are defined as Y, YI and YR, respectively. If the signal line of either a non-inverting clock signal or an inverting clock signal is disconnected, or short-circuited to a grounding potential VSS of a logical value Low, the logical values outputted from the second and the third comparators are equal for a long period of time in one cycle of the non-inverting clock signal or the inverting clock signal.

Abstract: Described are circuits that detect and correct for decryption key errors. In one example, a programmable logic device includes a decryption key memory with a number of decryption-key fields and, for each key field, an associated error-correction-code (ECC) field. The PLD additionally includes error-correction circuitry that receives each key and associated ECC and performs an error correction before conveying the resulting error-corrected key to a decryptor.

Abstract: It is configured by plurality of NAND circuits connected in series through a plurality of inverters, and a plurality of NOR circuits connected in series through the plurality of inverters. Each of a plurality of source signal lines provided in a pixel portion is connected to one input terminal of a NAND circuit and a NOR circuit, and an output of an inspection is obtained from final lines of the NAND circuit and the NOR circuit connected in series. In this manner, an inspecting circuit which is capable of determining a defect simply and accurately by using a small-scale circuit, and a method thereof are provided.

Abstract: The present invention aims to provide a programmable logic device (PLD), and a related control program, capable of improving a product yield by avoiding a defect point according to defect point detected after PLD fabrication. The PLD includes a plurality of logical blocks including programmable logic circuits; storage in which both circuit information specifying path connecting the plurality of logical blocks using information specifying resources included in the path and defect point information specifying fault resource are stored in advance; replacement control section which refers to defect point information, decides whether fault resource is included in the path specified by circuit information, and when fault path is included, obtains replacement path, and rewrites circuit information with data identifying resources included in replacement path; and wiring resource section which reads out circuit information stored in storage, and forms a predetermined logic circuit based on readout circuit information.

Abstract: An embodiment of the present invention provides a programmable logic device (“PLD”) including a redundancy architecture adapted to selective route signals via first or second staggered vertical lines. Other embodiments provide configuration logic and programs for determining routing selections. Other embodiments provide proximate grouping of vertical lines driven from a same row. Other embodiments provide definition of spare row locations once defective row locations are known.

Abstract: In a receiver circuit that receives data and clock signals through the cables, the number of transitions of a signal obtained based on the data or clock signal is detected by a frequency detection circuit, and when the number of transitions is not more than a predetermined set value, a signal for resetting the operation of a serial-parallel converter circuit included in a data processing unit is output, so as to control the output of received data. Thus, disconnection of the cable can be detected with low power consumption without providing a pull-up resistor and pull-down resistor and noise resistance can be improved.

Abstract: The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).

Abstract: Method and apparatus for a system monitor (20) embedded in a programmable logic device (10, 50, 60) are described. The system monitor (20) includes a dynamic reconfiguration port interface (205) for configuring or reconfiguring the system monitor (20) during operation thereof. The system monitor (20) includes an analog-to-digital converter (200) which is reconfigurable responsive to input via a dynamic reconfiguration port (201).

Abstract: A method and a circuit for protecting an electric motor and/or its trigger circuit against overload in the emergency-operation mode in a motor vehicle direct-current fan motor operated by means of pulse width modulation, in which the trigger circuit is designed as an emergency-operation controller, with a microcontroller preceding the motor end stage and with a comparator assembly for detecting overvoltages. Overload protection is assured at elevated battery voltage and at the same time when the emergency-operation controller is activated in response to malfunctions in the normal triggering of the electric motor. To that end, at least one overvoltage threshold (Us1, Us2) is defined; when it is exceeded, the power supplied to the motor is reduced or switched off.

Abstract: The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU).

Abstract: A data processing apparatus comprises a plurality of input signal lines, a plurality of output signal lines and an electronic circuit. The electronic circuit inputs first data from the plurality of input signal lines and outputs second data to the plurality of output signal lines. The first data is one bit data represented by a combination of bits of the plurality of input signal lines. The second data is one bit data represented by a combination of bits of the plurality of output signal lines.

Abstract: Structures and methods of reducing the susceptibility of programmable logic device (PLD) configuration memory cells to single event upsets (SEUs) by selectively adding metal-to-metal capacitors thereto. By adding capacitance to storage nodes in a memory cell, the susceptibility of the memory cell to SEUs is reduced. However, the performance of the memory cell also suffers. In PLD configuration memory cells, performance is not the most important factor. Therefore, for example, SEU-reducing capacitors can be selectively added to the PLD configuration memory cells while omitting the capacitors from user storage elements (e.g., block RAM) within the PLD. Thus, performance of the user storage elements is not adversely affected. Further, the use of metal-to-metal capacitors is well-suited to the configuration memory cells of a PLD, because these memory cells typically have additional area available for the capacitors above the programmable logic elements controlled by the associated configuration memory cells.

Abstract: An I/O pad has a data transmitting circuit, a data monitoring control circuit, and a control selection circuit. The control selection circuit controls the data transmitting circuit. When it is enabled, data in the data transmitting circuit are exported to a receiving circuit. When it is disabled, data exportation stops. The data monitoring circuit receives signals of the data transmission circuit and export signals to the control selection circuit. The data monitoring circuit judges whether the data transmission is under a stable condition. If it is not, an unstable signal is exported to a first input end of the control selection circuit. A second input end of the control selection circuit receives an output enabling signal. When the data transmission is stable and the output enabling signal indicates a disable status, the control selection circuit disables the data transmitting circuit. Otherwise, the control selection circuit enables the data transmitting circuit.

Abstract: A method includes providing a device under test (DUT) which has an input port and an output port. The DUT also has a squelch detector which is coupled to receive a signal from the input port. The DUT also has a receiver amplifier coupled to receive a signal from the input port. In addition, the DUT also has a transmitter to transmit data signals from the output port. The method further includes providing a loopback connection from the output port to the differential input port. The method also includes controlling the transmitter to transmit a test signal from the output port to the input port. The method includes monitoring at least one of respective outputs of the receiver amplifier and the squelch detector to determine whether a leakage condition exists in the DUT. Other embodiments are described and claimed.

Abstract: A programmable logic device and associated method is provided with repairable regions. In one aspect, general routing interconnect lines are segmented within repairable regions. In another aspect, IO bus lines and associated circuitry are provided that accommodate redundancy in a staggered segmented architecture. In another aspect, a dedicated routing architecture between particular logic regions accommodates shifting to define and utilize repairable regions. Principles of other aspects are illustrated and described in the context of several exemplary embodiments of aspects of the invention.

Abstract: An integrated circuit and method for indicating the integrated circuit to enter into a scan mode are disclosed. A designated signal, such as an analog supply signal, for an analog block of an integrated circuit is utilized for indicating entry of a digital block of the integrated circuit into a scan mode. Operations of the analog block and the digital block are generally independent from each other during scan mode. Prior to the digital block utilizing the designated signal, voltage rails for the designated signal are resolved with the voltage rails of a digital supply signal for the digital block.

Abstract: A recovery circuit and a method for employing the same are provided. The recovery circuit has a current driver and, preferably two pass-gates, a first pass-gate connected in series to the current driver and a second pass-gate connected to a ground. The recovery circuit also has a recovery assembly or element and one or more contacts operatively connecting the recovery circuit to a wearout sensitive circuit or circuit element.

Abstract: Fast electromagnetic transient (EFT) events of short duration are often not detected by power-on reset circuitry of an integrated circuit (IC). A fault detector circuit involves many fault detectors. The fault detectors are distributed across the IC and may be embodied in spare cells left in a standard cell IC. Each fault detector is initialized with a digital logic value. The fault detector circuit is then controlled such that the digital logic value stored should not change if the IC is operated under normal operating conditions. An EFT event that is undetected by the power-on reset circuit may, however, cause one of the digital logic values stored in one of the fault detectors to switch. If the digital logic value stored in any one of the fault detectors switches, then a fault signal is provided to the power-on reset circuit that in turn resets the IC.

Abstract: A method for operating a system having a plurality of modes and interlocks between the modes is provided. The method includes operating the system in a first mode and switching the system to a second mode without going to a standby mode.

Abstract: In some embodiments, a chip includes first and second nodes, a variable voltage source, and transmitter and control circuitry. The transmitter includes a driver coupled to the first and second nodes, and first and second resistive structures coupled between the first and second nodes, respectively, and the variable voltage source. The control circuitry selects an impedance level for the first and second resistive structures, and detect coupling of a remote receiver to the transmitter through interconnects and detect decoupling of the remote receiver from the transmitter. Other embodiments are described and claimed.

Abstract: Programmable systems and devices that include programmable multiplexers designed to minimize the impact of single event upsets (SEUs) on triple modular redundancy (TMR) circuits. In a programmable routing multiplexer, each path through the multiplexer is controlled by a different configuration memory cell. A unidirectional buffer is included on each routing path through the multiplexer. Therefore, an SEU changing the state of any single memory cell does not short together any two input terminals of the multiplexer. Hence, when a TMR circuit is implemented using the multiplexer, an SEU affecting the multiplexer causes no more than one TMR module to become defective. The other two TMR modules together provide the correct output signal, outvoting the defective module, and the circuit continues to operate correctly.

Abstract: Expander device and method for resetting bus segments in I/O subsystem to clear bus hang in an I/O subsystem having a plurality of bus segments. Each bus segment in the I/O subsystem includes a set of devices and a bus that is coupled to the set of devices. In addition, the I/O subsystem includes at least one expander, each expander being arranged to couple a pair of buses for propagating communication signals. A reset signal is asserted on a first bus segment. In response to the reset signal, each expander coupled to the first bus segment and each device in the first bus segment reset themselves. Additionally, each expander coupled to the first bus segment isolates the reset signal such that the reset signal is not propagated to the other bus segments. For each expander coupled to the first bus segment, all communication signals are isolated such that each expander prevents propagation of the communication signals between the first bus and other bus.

Abstract: The present system comprises a radiation tolerant programmable logic device having logic modules and routing resources coupling together the logic modules. Configuration data lines providing configuration data control the programming of the logic modules and the routing resources. Error correction circuitry coupled to the configuration data lines analyzes and corrects any errors in the configuration data that may occur due to a single event upset (SEU). The present system also comprises a method for correcting errors in a programmable logic device having configuration data to program the programmable logic device. The method comprises a background reading of the configuration data. Next, the configuration data is analyzed for errors. Finally, the configuration data is then corrected and the configuration data is rewritten if errors are located.

Abstract: An I/O pad has a data transmitting circuit, a data monitoring control circuit, and a control selection circuit. The control selection circuit controls the data transmitting circuit at the control end, so as to enable or disable the transmission. When it is enabled, data in the data transmitting circuit are exported to a receiving circuit. When it is disabled, data exportation stops. The data monitoring circuit receives signals of the data transmission circuit and export signals to the control selection circuit. The data monitoring circuit judges whether the data transmission is under a stable condition. If it is not yet, an unstable signal is exported to a first input end of the control selection circuit. A second input end of the control selection circuit receives an output enabling signal. The output end of the control selection circuit is connected to the control end of the data transmitting circuit.

Abstract: A clock signal is applied to a clock pin of an integrated circuit. The clock signal is coupled from the clock pin to a first scan chain in a first time period without coupling the clock signal to a second scan chain during the first time period. The clock signal is coupled from the clock pin to the second scan chain during a second time period without coupling the clock signal to the first scan chain during the second time period.