Abstract: A system and a method for determining a delay time interval of components are provided. The system includes a delay chain of components having a plurality of components wherein each component of the delay chain of components has a first delay time interval. The system utilizes a reference clock signal to stimulate the delay change of components and monitors a delay clock signal output by the delay chain of components to determine a delay time interval associated with each component in the delay chain of components.

Abstract: The voltage applied to an integrated circuit is controlled by a temporal process monitor formed as part of the integrated circuit. The temporal process monitor includes a voltage controlled oscillator for producing a first output signal having a first period. A comparator compares the first period to one or more reference values. Should the first period be greater than a first selected reference value the comparator sends a signal to increase the voltage being supplied to the integrated circuit. Should the first period be less than a second selected reference value, the comparator sends a signal to decrease the voltage applied to the integrated circuit. In some embodiments a scaling circuit is provided for producing a second output signal having a second period different from (typically but not necessarily longer than) the first period.

Abstract: A delay-locked loop includes a phase detector, a delay line, and a filter unit. The phase detector compares the phase of the external clock signal with that of the feedback clock signal and outputs a phase difference as an error control signal. The delay line includes delay cells having various unit time delays. The number of delay cells is adjusted in response to a shift signal. The delay line receives the external clock signal and outputs an output clock signal. The filter unit generates the shift signal in response to the error control signal. In the delay-locked loop, the front delay cells, which compensate for a delay of an external clock signal having a high frequency, have short unit time delays. The rear delay cells, which compensate for a delay of the external clock signal having a low frequency, have long unit time delays.

Abstract: A method and apparatus is presented that can provide first and second windows for driving data onto a bus in dependence on bus clock frequency. In one example, the speed of the bus clock is determined by a component such as a processor. If the bus clock frequency is at a first, relatively high frequency, data is driven onto the bus in an earlier time window (e.g., near the rising edge of the bus clock signal). If the bus clock frequency is at a second, lower frequency, data is driven onto the bus in a second, later time window (e.g., near the center of the high level of the bus clock). Accordingly, the time window for receiving the data driven onto the bus need not be changed (e.g., near the rising edge of the next bus clock signal) allowing components to work effectively with both bus clock frequencies.

Abstract: One embodiment pertains generally to a method of delaying based on a single clock signal. The method includes providing a first clock signal and generating a second clock signal based on the first clock signal and a third clock signal that is the inverse of the second clock signal. The method also includes generating a unit of delay based the first clock single and generating a half unit of delay based on the first and second clock signal.

Abstract: A delay circuit includes: an input signal line (IN) through which an input signal is inputted; a capacitor (106) charged with and discharging electric charge; a first switch (101) connected to the input signal line and operating according to the input signal when the capacitor is to be charged with electric charge; a second switch (102) connected to the input signal line and operating according to the input signal when the electric charge is to be discharged from the capacitor; and a comparison circuit (107) comparing a voltage of the capacitor and a reference voltage to output a delay signal of the input signal.

Abstract: A device includes a first circuit having rows and columns of delay cells to generate delayed signals based on an input signal. The delayed signals are selectable and have a different delay from one another with respect to the input signal. The device is programmable based on a delay code. Different values of the delay code allow the device to select different delayed signals. The device may select one of the delayed signals from the first circuit for use as a timing signal in a second circuit of the device. The device may also use the delayed signals from the first circuit to evaluate a clock and data recovery circuit. In an embodiment, the circuits may be located on a single die.

Abstract: In a circuit in which a signal arrival time with respect to a register is different in accordance with the change of a delay time of the circuit, a mechanism capable of adjusting a clock signal of the register is previously provided to deal with the case in which a set-up time in the register is not satisfied due to an increase of the delay time, and the delay time of the clock signal is changed in response to the change of the delay time of the circuit in respective modes. Thereby, the set-up time of data in the register can be satisfied, and an operation frequency of the circuit can be prevented from lowering.

Abstract: An input circuit (1?) provided with a time delay element (40), which circuit is capable of being tested by a controlled high level or low level connection, and a method for the operation thereof. The delay time of the time-delay element can be modified during operation of the input circuit. In particular, the elapsed delay time is read out prior to the testing of the input circuit and is restored again after testing, so that the test does not increase the effective input delay time for the process signals. In addition or as an alternative, the delay time is set to a minimum value prior to the test to enable rapid testing of the input circuit independent of the set delay time.

Abstract: An output driver for use in a semiconductor is capable of maintaining its slew rate constantly regardless of PVT(Process/Voltage/Temperature) variation. The output driver includes a pre-driving unit for pre-driving a data signal; a main driving unit for driving an output pad in response to the output signal of the pre-driving unit; and a slew rate modeling unit for generating a pre-driver bias signal to constantly maintain effective resistances of a pull-up path and a pull-down path of the pre-driving unit by modeling the pre-driving unit.

Abstract: There is provided a delay circuit including a first delay element, a second delay element, and an initializing section that measures a delay amount generated by the first delay element with respect to each delay setting value and initializes the first delay element. The initializing section includes: a first loop path that inputs an output signal of the first delay element into the first delay element; a second loop path that inputs an output signal of the second delay element into the second delay element; a first measuring section that sequentially sets delay setting values mutually different from the delay setting value in the first delay element and sequentially measures delay amounts in the first delay element; a second measuring section that measures a delay amount in the second delay element; and a delay amount computing section that corrects a delay amount measured by the first measuring section.

Abstract: A memory device, delay lock loop circuit (DLL) and DLL reset circuitry are described. The DLL includes a shift register and a measured delay for pre-loading the shift register. The reset circuitry selectively filters a clock signal propagation through the measured delay during a reset operation.

Abstract: A leakage efficient anti-glitch filter with variable delay stages. In accordance with a first embodiment of the present invention, a leakage efficient anti-glitch filter with variable delay stages comprises a plurality of variable delay stages and a coincidence detector element for detecting coincidence of an input signal to the delay element and an output of the delay element. The plurality of variable delay stages may comprise stacked inverter circuits or stacked NAND circuits.

Abstract: A leakage efficient anti-glitch filter. In accordance with a first embodiment of the present invention, a leakage efficient anti-glitch filter comprises a delay element and a coincidence detector element for detecting coincidence of an input signal to the delay element and an output of the delay element. The delay elements may comprise stacked inverter circuits or stacked NAND gates.

Abstract: A stacked inverter delay chain. The stacked inverter delay chain includes a plurality of stacked inverter delay elements. A switch circuit is included and is coupled to the stacked inverter delay elements and configured to select at least one of the plurality of stacked inverter delay elements to create a delay signal path. The delay signal path has an amount of delay in accordance with a number of stacked inverter delay elements comprising the delay signal path. An input is coupled to a first stacked inverter delay element of the delay signal path to receive an input signal and an output is coupled to the switch circuit and is coupled to the delay signal path to receive a delayed version of the input signal after propagating through the delay signal path.

Abstract: A clock signal generation system and method to distribute at least one clock signal to a plurality of points on a circuit board using a plurality of digitally programmable delay circuits each of which delays the clock signal by a desired amount so as to synchronize arrival of the clock signal when distributed to each of the plurality of points on the circuit. Each digitally programmable delay circuit comprises a plurality of circuit stages connected in series with each other. Each circuit stage comprises a plurality of transistors of a first type (e.g., P-type) connected in parallel with each other, and a plurality of transistors of a second type (e.g., N-type) connected in parallel with each other. In each circuit stage, one or more of the plurality of transistors of the first type are selected to delay a rising edge, and one or more of the plurality of transistors of a second type are selected to delay a falling edge.

Abstract: Systems and methods provide analog delay elements, which may be utilized in isolation or in a cascade. For example, a delay element may include a broadband amplifier and a passive, programmable filter, which may provide a desired magnitude and group delay response over a wide frequency range while being tolerant of process variations.

Abstract: A timing delay generator for supplying a signal delayed by a predetermined period comprises a vernier that provides variable delays for a main signal, the delays being sensitive to temperature variation, a sensor for sensing the vernier's temperature and a feedback loop to maintain the temperature of the silicon die at a constant level and thus, to provide the high long-term accuracy of the timing delay generator.

Abstract: A pulse width modulator (100) and method that facilitates high resolution pulse width modulation is provided. The pulse width modulator (100) creates a pulse width modulated signal having a duty cycle that is proportional to a controllable delay in the modulator. The pulse width modulator combines a first digitally controllable delay (102) with a delay adjustment (104) to provide the controllable delay. In one embodiment, a digital counter (202) is used to provide coarse delay, with the delay adjustment device (210) coupled to the digital counter (202) to provide the fine, high resolution, delay control. Together the digital counter (202) and delay adjustment device (210) provide high resolution pulse width modulation. In one particular implementation, the analog delay adjustment device (100) comprises a delay block (500) designed to provide delay adjustment that is selectively controllable by changing a capacitance in the device.

Abstract: A semiconductor device can accurately control the timings of various signals used in the semiconductor device using a simple configuration.

Abstract: A timing calibration system for an adjustable delay time of a delay module for an electronic circuit is provided. The system includes a control delay module including at least one calibration delay module, the control delay module having a second delay time. The system also includes a timing module associated with the control delay module, a comparison module associated with the timing module and an adjustment module for the delay module. The timing module measures the second delay time, the comparison module compares the second delay time with a desired delay time and produces a comparison result and the adjustment module calibrates the adjustable delay time utilizing the comparison result.

Abstract: Delay elements and delay lines having glitchless operation are disclosed. By way of example, apparatus for delaying an input signal comprises a reference current generator for generating a constant current, wherein the constant current is insensitive to a variation of a power supply voltage, at least one variable bias voltage generator coupled to the reference current generator for generating a set of bias voltages based on the constant current generated by the reference current generator and a digitally programmable delay control input, and at least one delay element coupled to the at least one variable bias voltage generator for delaying the input signal by a constant delay which is determined by the set of bias voltages generated by the at least one variable bias voltage generator.

Abstract: Delay circuitry is described that includes clock mixing circuitry to provide a selectable propagation time. Output signals from the mixing circuitry are selectively coupled through a variable delay line to synchronize two clock signals.

Abstract: An output circuit includes a level-change detecting device, a delay adjusting device and a first multiplexer. The level-change detecting device receives the parallel data signal, detects a level change degree of the parallel data signal between a first time point and a second time point, and outputs a select signal according to the level change degree. The delay adjusting device receives a strobe signal and differentially delaying the strobe signal into a first and a second delayed strobe signals with a first and a second delay time, respectively. The first multiplexer is electrically connected to the level-change detecting device and the delay adjusting device, and selects one of the first and the second delayed strobe signals to be outputted in response to the select signal.

Abstract: A first variable delay circuit delays an input signal, introduces a first delay into a first edge of the input signal, and generates a first delay signal. A second variable delay circuit delays the input signal, introduces a second delay into a second edge, and generates a second delay signal. A control circuit controls the first variable delay circuit and the second variable delay circuit such that the first delay and the second delay are identical. A generation circuit combines the first edge of the first delay signal and the second edge of the second delay signal, and generates a third delay signal.

Abstract: A digital circuit according to the present invention includes a pulse delay circuit where a driving current of an inverter is variable, for causing timing of a clock signal to be variable; and the pulse delay circuit has a stabilizing circuit for an amount of a pulse delay by a delay synchronizing loop, and a generating circuit for a pulse delay amount setting voltage with nonlinear characteristics. The present invention makes it possible to realize a timing delay circuit with high resolution, which is not influenced by an operating environment and requires only a small area for the circuit.

Abstract: A data delay control circuit and method that can adaptively reflect changes in an operating environment, such as an operating temperature, an operating voltage and a manufacturing process of a semiconductor chip. The data delay control circuit is designed to be able to adaptibly delay data when an expected delay of a predetermined period should be required when the semiconductor chip is designed. The data delay circuit includes a clock oscillation unit that can reflect changes in a delay period of a delay cell and automatically adjust the delay period of the delay cell. Since the data delay circuit includes a monitoring circuit and a plurality of delay paths, the data delay circuit can provide a delay path having a desired delay value. Therefore, even when the operating environment of a semiconductor device changes, the data delay circuit can control the delay period of a data signal.

Abstract: A SDRAM. The SDRAM including: at least one bank of DRAM cells; the SDRAM operable to a first specification defined by a first clock frequency, a first write recovery time and a first time interval for precharge to row address strobe; and means for programming the SDRAM operable to a second specification defined by a second clock frequency, a second write recovery time and a second time interval for precharge to row address strobe.

Abstract: There is provided a shift clock generator for phase-shifting a shift clock by inserting insertion pulses into the shift clock, wherein an insertion pulse generating section has a compensation memory for storing compensation data for calculating a number of insertion pulses to be inserted into the shift clock with respect to a phase difference preset value based on a phase shift amount, a number-of-pulses calculating section for integrating the compensation data stored in an address range of the compensation memory to calculate a number-of-insertion pulses data based on the phase difference preset value and a pulse generating section for generating the insertion pulses based on the number-of-insertion pulses data.

Abstract: To prevent a timing shift of a clock and data supplied to a driver IC. A driver 1011 includes a phase adjustment circuit 201 for receiving via input terminals a clock and data outputted from a controller 103, latching received data with the clock adjusted to a 50-percent duty ratio, and outputting as phase-adjusted signals the data having the latched data further latched by synchronizing it with a delay clock having the duty-ratio-adjusted clock delayed by (?/2) and the clock of the 50-percent duty ratio.

Abstract: A delay circuit comprising a delay line to delay an input signal that has a plurality of delay cells connected in series; a PLL circuit that supplies the delay line with a delay control voltage to control the delay; and a first selector that selects one of output signals of the delay cells. Each of the delay cells comprises two stages of delay inverters connected in series and an output inverter connected to a connection point of the delay inverter of the first stage and the delay inverter of the second stage. Input into the delay inverter of the first stage is an output signal of the delay inverter of the second stage in the preceding delay cell, and the first selector outputs as a delayed signal an output signal of the output inverter or the delay inverter of the second stage in one of the delay cells.

Abstract: Memory devices used to control delay line circuitry, and that may be implemented in one embodiment to provide a self-tuning delay line device using empirical calibration technique/s to achieve a desired signal delay. The memory control device may be implemented to store electrical characteristics of the delay line circuitry during testing to enable self-calibration of the delay line circuitry.

Abstract: A delay line for a digital clock manager includes a tap delay structure and a trim delay structure. The trim delay structure includes a first buffer coupled to receive a clock signal from the tap delay structure, and in response, provide a delayed clock signal to a set of clock lines. The trim delay structure also includes a capacitive trim unit having a plurality of capacitive trim elements tapped off the set of clock lines. The capacitive trim elements are selectively enabled or disabled, thereby introducing additional delay to the delayed clock signal on the set of clock lines. Each capacitive trim element can include a transmission gate structure, which is turned on to introduce significant junction capacitance to the set of clock lines. The trim delay structure can also include a second buffer adapted to buffer the delayed clock signal on the set of clock lines.

Abstract: A delay signal generator circuit is provided. A delay circuit including a plurality of series-connected inverters for sequentially delaying a first clock signal and for generating a plurality of delay signals and a multiplexer for selecting one of the delay signals. A delay control circuit samples the selected delay signal in response to a transition of a second clock signal. The second clock signal has twice the frequency of the first clock signal, and the delay control circuit controls the delay circuit based upon the sampled value(s) so that the selected delay signal output from the delay circuit has a delay time of ¼ clock cycle relative to the first clock signal.

Abstract: A digital delay line including a first feedback delay line having a first number of interlinked first delay elements, at least one second feedback counter having a second number of second interlinked counting elements, the counting elements being clocked by one of the first delay elements.

Abstract: A delay cell has selectable numbers of parallel load resistance transistors operable in parallel, and a similarly selectable number of bias current transistors connectable in parallel. The delay cell is preferably differential in construction and operation. A voltage controlled oscillator (“VCO”) includes a plurality of such delay cells connected in a closed loop series. Phase locked loop (“PLL”) circuitry includes such a VCO controlled by phase/frequency detector circuitry. The PLL can have a very wide range of operating frequencies as a result of the ability to control the number of load resistance transistors and bias current transistors that are active or inactive in each delay cell. Such activation/deactivation may be programmable or otherwise controlled.

Abstract: Delays induced to leading and trailing edges of an input pulse train are updated faster than before. First and second delay paths receive delay data for inducing delays to leading edges and/or trailing edges of an input pulse train. An OR circuit combines the outputs of the delay paths. First and second gates receive the input pulse train and selectively provide the input pulse train to the first and second delay paths independent of the edge position of the input pulse train. A delay time setup circuit generates a CTRL signal for controlling the first and second gates and the loading of the delay data to the first and second delay path. The CTRL signal causes the gates to selectively switch the input pulse train from one delay path to another while the delay data is selectively loaded in the delay path not receiving the input pulse train.

Abstract: The present invention provides apparatus and methods relating to delay circuits. An electronic system includes a deskewing circuit configured to measure a delay and generate a synchronized signal according to the measured delay. The deskewing circuit may configured to detect an overflow condition and respond accordingly, for example by asserting an overflow signal. Further, the deskewing circuit may be additionally or alternatively configured to detect successful measurement of the delay and respond, for example by executing a power saving and/or noise reducing procedure.

Abstract: Circuitry for providing an input data signal to other circuitry on an integrated circuit includes a course delay chain and a fine delay chain. These two delay chains are cascadable, if desired, to provide a very wide range of possible amounts of delay which can be finely graded by use of the fine delay chain.

Abstract: An apparatus for generating a phase delay is disclosed. The apparatus includes a buffer utilized for buffering an input signal and then outputting an output signal; a digital to analog converter (DAC) utilized for converting a digital value representative of phase delay into a corresponding control voltage and outputting a control voltage; and a variable capacitor that has a capacitance value controlled by the control voltage. By controlling the variable capacitance value, the apparatus for generating a phase delay can adjust the phase delay between the input signal and the output signal.

Abstract: The present invention provides a phase shift circuit that supports multiple frequency ranges. The phase shift circuit receives a plurality of control bits and causes a phase shift in a received signal, the phase shift corresponding to a number of time steps, the number depending on the control bits, and the time step is selected from a plurality of different time steps based on a frequency range associated with the received signal.

Abstract: An apparatus comprising an input section, a first delay circuit and a second delay circuit. The input section may be configured to present a first intermediate signal by selecting either (i) an input clock signal or (ii) a feedback of an output signal. The first delay circuit may be configured to generate a second intermediate signal by delaying the first intermediate signal by inserting one of a plurality of fixed delays in response to a first control signal. The second delay circuit may be configured to generate the output signal by delaying the second intermediate signal by inserting a programmable delay in response to a second control signal.

Abstract: A method of transmitting adjacent signals is disclosed. Sensing is performed on signals in the group and adjacent signals are either switched or delayed if the adjacent signals are switching at the same time. The method is used in networks where coupling and capacitance effects are possible.

Abstract: A tuning circuit for setting a signal propagation time on a signal line in an integrated circuit, particularly a DRAM circuit, has a transistor and a capacitor. A control connection of the transistor is connected to a control unit for the purpose of switchably connecting the capacitor to the signal line through the transistor in order to set the signal propagation time on the signal line on the basis of application of a control signal, generated in the control unit, to the control connection on the transistor.

Abstract: A delay circuit includes: an input signal line (IN) through which an input signal is inputted; a capacitor (106) charged with and discharging electric charge; a first switch (101) connected to the input signal line and operating according to the input signal when the capacitor is to be charged with electric charge; a second switch (102) connected to the input signal line and operating according to the input signal when the electric charge is to be discharged from the capacitor; and a comparison circuit (107) comparing a voltage of the capacitor and a reference voltage to output a delay signal of the input signal.

Abstract: A device includes an output circuit to output an output signal. The device also includes a control loop circuit to measure the real slew of the output signal. The control loop circuit compares the real slew with a target slew adjusts the output circuit when the real slew and the target are mismatched.

Abstract: A delay circuit. The delay circuit includes a first circuit, a falling edge delay circuit and a rising edge delay circuit. The first circuit includes a circuit input for receiving a reference signal and a circuit output for outputting a delayed signal. The falling edge delay circuit is coupled to the first circuit to control delay of a falling edge of the reference signal. The rising edge delay circuit is coupled to the first circuit to control delay of a rising edge of the reference signal.

Abstract: A programmable jitter signal generator is provided that includes a jitter distribution control unit, a selection unit in signal communication with the jitter distribution control unit, and a delay unit in signal communication with the selection unit; and a corresponding method of generating a programmable jitter signal includes programming a control unit, receiving a reference signal, delaying the received reference signal by a multiple of a base time increment, and selecting a delayed reference signal delayed by a desired multiple of the base time increment in accordance with the programmed control unit.

Abstract: Described are fast synchronous counters with reduced combinatorial logic. In one embodiment, a four-bit shift register is configured in a ring and preset with a data pattern (e.g., 1000). The register is then rapidly shifted into any of four unique states. Combinatorial logic connected to the shift register converts the four unique states into a two-bit binary signal representative of the four states. In the general case, counters in accordance with this embodiment represent N-bit binary numbers using 2N synchronous storage elements. Two or more counters can be combined to produce larger synchronous counters. An up/down counter in accordance with yet another embodiment is connected to a multi-path delay line to create a variable delay circuit. The switching speed of the delay circuit is independent of the number of delay settings. Also advantageous, the delay circuit scales linearly, in terms of power consumption and area, with changes in delay granularity.

Abstract: A clock generator for generating an output clock signal synchronized with an input clock signal having first and second adjustable delay lines. The first adjustable delay lines is adjusted following initialization of the clock generator to expedite obtaining a lock condition following the initialization. The second adjustable delay line is adjusted after synchronization is achieved with the first adjustable delay line, or when the first adjustable delay line reaches a maximum adjustable delay. The first adjustable delay line is reset when a lock condition is initially obtained, and the second adjustable delay line is adjusted to compensate for the resetting of the first adjustable delay line.