Inspection Of Flaws Or Impurities Patents (Class 356/237.1)
  • Patent number: 10584413
    Abstract: A thin film deposition system includes a vacuum-preloaded gas bearing deposition head positioned in an external environment. The deposition head has a vertically-oriented output face including a plurality of source openings through which gaseous materials are supplied and one or more exhaust openings. An exhaust pressure at the exhaust openings is less than an ambient pressure, and a source pressure at the source openings is greater than the exhaust pressure, with the pressure at the outermost source openings being greater than the ambient pressure. A substrate positioner applies a vertical force onto a substrate unit, the vertical force passing through a center of gravity of the substrate unit. A motion control system moves the substrate positioner, thereby moving the substrate unit relative to the output face in an in-track direction without constraining the motion of the substrate unit in a direction normal to the output face of the deposition head.
    Type: Grant
    Filed: March 14, 2017
    Date of Patent: March 10, 2020
    Assignee: EASTMAN KODAK COMPANY
    Inventors: Todd Mathew Spath, Carolyn Rae Ellinger
  • Patent number: 10585424
    Abstract: Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters.
    Type: Grant
    Filed: January 17, 2018
    Date of Patent: March 10, 2020
    Assignee: The Procter & Gamble Company
    Inventors: Eric Christopher Berg, Louis J. Cedrone, Jeffrey Michael Kent, Helen Louise Von Den Steinen, William Lawrence Lightcap, Daniel Royce
  • Patent number: 10571811
    Abstract: Metrology methods and targets are provided, that expand metrological procedures beyond current technologies into multi-layered targets, quasi-periodic targets and device-like targets, without having to introduce offsets along the critical direction of the device design. Several models are disclosed for deriving metrology data such as overlays from multi-layered target and corresponding configurations of targets are provided to enable such measurements. Quasi-periodic targets which are based on device patterns are shown to improve the similarity between target and device designs, and the filling of the surroundings of targets and target elements with patterns which are based on device patterns improve process compatibility. Offsets are introduced only in non-critical direction and/or sensitivity is calibrated to enable, together with the solutions for multi-layer measurements and quasi-periodic target measurements, direct device optical metrology measurements.
    Type: Grant
    Filed: May 19, 2016
    Date of Patent: February 25, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Eran Amit, Daniel Kandel, Dror Alumot, Amit Shaked, Liran Yerushalmi
  • Patent number: 10561311
    Abstract: An ophthalmic imaging apparatus according to an exemplary embodiment includes a three dimensional data generator, an analyzer, and a display controller. The three dimensional data generator generates three dimensional data by scanning a three dimensional region of a subject's eye using optical coherence tomography (OCT). The analyzer generates a plurality of analysis maps by analyzing a plurality of pieces of partial three dimensional data in the three dimensional data. The display controller displays the plurality of analysis maps over a front image of the subject's eye on a display device.
    Type: Grant
    Filed: October 12, 2016
    Date of Patent: February 18, 2020
    Assignee: Topcon Corporation
    Inventors: Takaki Tokuyama, Katsuhiro Yamada
  • Patent number: 10565698
    Abstract: A circular scratch inspection apparatus includes: a camera capturing an image of a workpiece surface around a hole; illumination device emitting light to the workpiece surface around the hole, the light being reflected on the workpiece surface is not directly incident on the camera; and image processor. The image processor: generates a second-derivative image by performing secondary differentiation on luminance values in an actual image obtained by the camera; generates a second-derivative curve for each of a plurality of ruler lines, extending radially from the hole center and are set in an inspection target region on the workpiece surface; counts a first reference number of times for each ruler line; calculates a first reference total number of times; and determines presence or absence of a circular scratch by using the first reference total number of times.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: February 18, 2020
    Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Kenji Kasahara, Shuhei Segawa, Osamu Ohji, Yuuki Hanawa, Shogo Kojima
  • Patent number: 10568251
    Abstract: A component mounter comprises first and second imaging systems, and a mounting head configured to hold a component by a nozzle. The first and second imaging systems irradiate light of first and second wavelengths, respectively, toward a working position to illuminate the nozzle located at the working position. The nozzle is imaged by the first and second imaging systems, respectively, that receive light having the first and second wavelengths, respectively, transmitted through first and second optical filters, respectively, after being irradiated on the working position. The first and second optical filters thus prevent light having wavelengths different from the first and second wavelengths from reaching the first and second imaging devices. Therefore, the nozzle can be imaged more precisely, since the influence of light different from the illumination light having the first and second wavelengths is suppressed by the first and second optical filters.
    Type: Grant
    Filed: August 31, 2015
    Date of Patent: February 18, 2020
    Assignee: YAMAHA HATSUDOKI KABUSHIKI KAISHA
    Inventor: Tadashi Onishi
  • Patent number: 10558024
    Abstract: An optical imaging assembly is provided, having an optical axis; an object axis defined by an object being imaged; an aperture stop disposed on the optical axis; a light-transmissive sleeve enclosing the object axis, being disposed in object space defined by the object axis; and at least three refractive lens elements being arranged between the object and the aperture stop without any other intervening optical component, at least one of the elements having surfaces having at least one of cylindrical and acylindrical prescription, with an image plane, wherein the object being imaged lies within the sleeve.
    Type: Grant
    Filed: September 14, 2017
    Date of Patent: February 11, 2020
    Assignees: BAXTER INTERNATIONAL INC., BAXTER HEALTHCARE SA
    Inventor: James F. Munro
  • Patent number: 10551608
    Abstract: Imaging systems and methods using an ancillary image detector for sample location. An exemplary system may comprise a light source to irradiate a sample on an irradiation axis, a first image detector on an optical axis oblique to the irradiation axis, and a stage. The system also may comprise a second image detector disposed on an imaging axis, and a drive mechanism configured to move the stage and the imaging axis relative to one another. The system further may comprise a processor configured to (a) receive an image of the sample detected by the first image detector, (b) determine a physical location for a region of contrast produced by the sample within the image, and (c) send a signal to the drive mechanism based on the physical location, to dispose at least part of the sample in a field of view of the second image detector.
    Type: Grant
    Filed: March 24, 2016
    Date of Patent: February 4, 2020
    Assignee: Molecular Devices, LLC
    Inventors: Matthew Chan, Avrum Isaac Cohen
  • Patent number: 10540548
    Abstract: A comparison system includes a portable terminal including image capturing unit configured to capture a comparison image of a predetermined comparison region of a comparison object; and a server including comparison unit configured to compare the comparison object with a registered object on the basis of a statistical value for the luminance value of pixels in a registered image of the registered object, the pixels of the registered image existing at pixel positions corresponding to pixel positions estimated to be generating specular reflection in the comparison image captured by the portable terminal.
    Type: Grant
    Filed: February 25, 2016
    Date of Patent: January 21, 2020
    Assignee: NEC CORPORATION
    Inventors: Rui Ishiyama, Toru Takahashi, Yuta Kudo
  • Patent number: 10533954
    Abstract: Disclosed are methods and apparatus for detecting defects or reviewing defects in a semiconductor sample. The system has a brightfield (BF) module for directing a BF illumination beam onto a sample and detecting an output beam reflected from the sample in response to the BF illumination beam. The system has a modulated optical reflectance (MOR) module for directing a pump and probe beam to the sample and detecting a MOR output beam from the probe spot in response to the pump beam and the probe beam. The system includes a processor for analyzing the BF output beam from a plurality of BF spots to detect defects on a surface or near the surface of the sample and analyzing the MOR output beam from a plurality of probe spots to detect defects that are below the surface of the sample.
    Type: Grant
    Filed: August 31, 2017
    Date of Patent: January 14, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Lena Nicolaides, Mohan Mahadevan, Alex Salnik, Scott A. Young
  • Patent number: 10522426
    Abstract: This system and method minimize an effect of haze to signal-to-noise ratio and compensate for haze on the haze map. A first mask with a first aperture is disposed along the path of the light beam between a light source and a collector. A first actuator moves the first mask along a tangential direction. A second mask with a second aperture is disposed along the path of the light beam between the first mask and the collector. A second actuator moves the second mask along a radial direction perpendicular to the tangential direction. The first mask and the second mask are independently movable along the tangential direction and the radial direction using the first actuator and the second actuator.
    Type: Grant
    Filed: February 8, 2019
    Date of Patent: December 31, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Hongxing Yuan, Dimitry Pokras, William VanHoomissen, Douglas Chan
  • Patent number: 10509214
    Abstract: A method for determining the size of a void-type defect in a top side of a structure comprising a top layer placed on a substrate, the defect being located in the top layer, includes introducing the structure into a reflected darkfield microscopy device in order to generate, from a light ray scattered by the top side, a defect-related first signal and a roughness-related second signal. The intensity of the roughness-related second signal is captured with a plurality of pixels. The intensity captured by each pixel is compared with the intensities captured by neighboring pixels. It is defined whether or not the pixel is contained in an abnormal zone. The standard deviation of the intensity values captured by the pixels of the abnormal zone is extracted, and the size of the void-type defect associated with the abnormal zone is determined from the extracted standard deviation. A new device may be used for carrying out such a method.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: December 17, 2019
    Assignee: Soitec
    Inventor: Olivier Pfersdorff
  • Patent number: 10499797
    Abstract: Biological tissue such as skeletal and cardiac muscle can be imaged by using an objective-based probe in the tissue and scanning at a sufficiently fast rate to mitigate motion artifacts due to physiological motion. According to one example embodiment, such a probe is part of a system that is capable of reverse-direction high-resolution imaging without needing to stain or otherwise introduce a foreign element used to generate or otherwise increase the sensed light. The probe can include a light generator for generating light pulses that are directed towards structures located within the thick tissue. The system can additionally include aspects that lessen adverse image-quality degradation. Further, the system can additionally be constructed as a hand-held device.
    Type: Grant
    Filed: November 18, 2014
    Date of Patent: December 10, 2019
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventors: Gabriel Nestor Sanchez, Scott L. Delp, Mark J. Schnitzer, Michael E. Llewellyn
  • Patent number: 10495451
    Abstract: A measuring equipment is provided. The equipment includes: a multi-axial actuated device; at least one sensor disposed on the multi-axial actuated device to adjust the orientation of the at least one sensor by the multi-axial actuated device, wherein scanning constraints of the sensor include a movable range of the at least one sensor, a scanning range of the at least one sensor and a scanning dead space of the at least one sensor for the contour of an object to be tested; a rotating device configured to rotate the object; and a processing device configured to obtain information relating to an optimal scanning orientation of the sensor based on the scanning constraints, and configured to control the multi-axial actuated device to adjust the at least one sensor.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: December 3, 2019
    Assignee: Industrial Technology Research Institute
    Inventors: Min-Qiao Lu, Chin-Chia Chang, Yi-Chia Hsu, Kuo-Chih Wang, Yao-Hui Lee, Yi-Cheng Chen
  • Patent number: 10488302
    Abstract: A device for checking a tyre in a tyre production line. The device includes a detection system, an illumination arrangement and a reflective element. The detection system includes a camera having a target line lying on an optical plane passing through the camera. The illumination arrangement includes first, second and third light sources, the second and third light sources being arranged at opposite sides with respect to the optical plane and symmetrically with respect to the first light source. The reflective element defines a reflective plane arranged perpendicular to the optical plane and arranged between the second and the third light source.
    Type: Grant
    Filed: December 28, 2016
    Date of Patent: November 26, 2019
    Assignee: PIRELLI TYRE S.P.A.
    Inventors: Alessandro Held, Vincenzo Boffa, Daniele Pecoraro, Valeriano Ballardini
  • Patent number: 10475177
    Abstract: An inspection method for a surface of a ceramic body capable of determining any crack more reliably than conventionally done is provided. The method includes a step of performing image capturing of an illuminated region of an inspection surface being illuminated with at least one of first and second illumination light from mutually different directions sandwiching an image capturing means, a step of generating a determination image, and a step of performing determination. When a first determination image is generated based on a first image capturing result obtained under illumination at least with the first illumination light, and a second determination image is generated based on a second image capturing result under illumination at least with the second illumination light, those images are generated so that determination of the presence or absence of any crack can be performed based on a difference between formation manners of shadow regions in those images.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: November 12, 2019
    Assignee: NGK Insulators, Ltd.
    Inventors: Ryota Kurahashi, Akihiro Mizutani, Takafumi Terahai
  • Patent number: 10467447
    Abstract: The disclosure features dendritic tags, and methods and systems for fabricating and using such tags. The methods can include obtaining at least one image of a dendritic tag attached to an article, analyzing the at least one image to identify a set of features associated with the dendritic tag, and comparing the set of features to stored information to identify the article.
    Type: Grant
    Filed: July 26, 2019
    Date of Patent: November 5, 2019
    Assignee: ARIZONA BOARD OF REGENTS, A BODY CORPORATE OF THE STATE OF ARIZONA ACTING FOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY
    Inventor: Michael N. Kozicki
  • Patent number: 10451410
    Abstract: [Object] To measure the surface height of a rigid body to be measured more accurately even if any one of three types of disturbance of translation in the height direction, rotation around the longitudinal-direction axis, and rotation around the width-direction axis has occurred during conveyance.
    Type: Grant
    Filed: April 22, 2016
    Date of Patent: October 22, 2019
    Assignee: NIPPON STEEL CORPORATION
    Inventors: Atsuhiro Hibi, Yusuke Konno, Nobuhiro Furuya, Tomohiro Kuroiwa
  • Patent number: 10438341
    Abstract: A system and method of detecting, quantifying, and characterizing corrosion and degradation of an article, includes receiving signals indicative of a stack of images of a surface of the article; determining depth and nature of features in the stack of images; generating a surface model of the article in response to the determination of the depth and the nature of features; determining features of interest from the surface model; comparing the features of interest with predetermined information on the article; and characterizing the article as corroded or degraded in response to the comparisons of the features of interest.
    Type: Grant
    Filed: September 24, 2015
    Date of Patent: October 8, 2019
    Assignee: SIKORSKY AIRCRAFT CORPORATION
    Inventors: Myra Torres, Avinash Sarlashkar, Michael J. Moore, Maksim Bobrov, Carl Palmer, Michael J. Bluett, Jeremy W. Sheaffer
  • Patent number: 10429318
    Abstract: A detection system for a multilayer film is provided. The detection system for a multilayer film includes a light source device, a first image capture device, a second image capture device and an image processing device. The light source device projects a pair of parallel incident light to a transparent multilayer film obliquely. The pair of parallel incident light is projected onto the transparent multilayer film for producing and enabling a forward scattered light and a back scattered light to be projected therefrom. The first image capture device captures the back scattered light to produce a first image. The second image capture device captures the forward scattered light to produce a second image. The image processing device is coupled to the first image capture device and the second image capture device. The image processing device is used to compares and detect the differences between the second image and the first image.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: October 1, 2019
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Ding-Kun Liu, Chia-Hung Cho
  • Patent number: 10417468
    Abstract: A printed code associated with a product is illuminated with light having a first lighting characteristic, and is readable in a default mode of an imaging reader. An electronic code displayed on a mobile communication device is readable in another mode of the reader, with a different second lighting characteristic that is designed to minimize specular reflection from a screen of the device. When the presence of the device in close proximity to the reader is detected, the reader is automatically configured to switch from the default mode to the other mode to enable the electronic code to be read.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: September 17, 2019
    Assignee: Symbol Technologies, LLC
    Inventors: Joseph S. Slowik, Charles Torzilli
  • Patent number: 10412311
    Abstract: A method and apparatus for optimizing inspection high-speed optical inspection of parts using intelligent image analysis to determine optimal focus using high numerical aperture (NA) optics, achieve a superior signal-to-noise ratio, resolution, and inspection speed performance with very limited depth of field lenses.
    Type: Grant
    Filed: July 13, 2016
    Date of Patent: September 10, 2019
    Assignee: Rudolph Technologies, Inc.
    Inventors: Robert Bishop, Timothy Pinkney
  • Patent number: 10408711
    Abstract: A sample point extraction unit (323) extracts natural defect candidate portions by using sample points comprising height data for one line obtained by scanning once around the measurement surface of a tire surface. Natural defect candidate portions include natural defect portions and intentional irregularity portions, such as characters and patterns. A differentiation unit (325) stores, in advance, conditions characteristic of the shape of intentional irregularity portions formed on the measurement surface, and from among the natural defect candidate portions, excludes natural defect candidate portions that satisfy those conditions from the natural defect candidate portions. Due to this configuration, intentional irregularity portions are differentiated from natural defect portions.
    Type: Grant
    Filed: October 10, 2014
    Date of Patent: September 10, 2019
    Assignee: Kobe Steel, Ltd.
    Inventors: Kaname Araki, Eiji Takahashi
  • Patent number: 10393671
    Abstract: Methods and systems for detecting defects on a specimen are provided. One system includes one or more computer subsystems configured for acquiring images generated by an imaging subsystem at multiple instances of a pattern of interest (POI) within a die formed on the specimen. The multiple instances include two or more instances that are located at aperiodic locations within the die. The computer subsystem(s) are also configured for generating a POI reference image from two or more of the images generated at the multiple instances of the POI within the die. The computer subsystem(s) are further configured for comparing the images generated at the multiple instances of the POI within the die to the POI reference image and detecting defects in the multiple instances of the POI based on results of the comparing.
    Type: Grant
    Filed: April 27, 2016
    Date of Patent: August 27, 2019
    Assignee: KLA-Tencor Corp.
    Inventors: Govindarajan Thattaisundaram, Hucheng Lee, Lisheng Gao
  • Patent number: 10371644
    Abstract: An apparatus (1) for optical inspection of objects (2), in particular metal lids, comprises: a camera (6) oriented according to a vertical viewing axis (7) to see the object (2) to be inspected positioned in an inspection station (4) and to capture an image of the object (2); a first illuminator (10) irradiating grazing light at a first frequency a second illuminator (11) irradiating top-down light at a second frequency different from the first frequency; a third illuminator (12) irradiating diffused light at a third frequency different from the first and second frequencies; a processor connected to the camera (6) for processing the captured image and deriving a first, a second and a third filtered image corresponding to the illumination contributions of the first, second and third illuminators (10, 11, 12), respectively and separately.
    Type: Grant
    Filed: April 13, 2016
    Date of Patent: August 6, 2019
    Assignee: SACMI COOPERATIVA MECCANICI IMOLA SOCIETA' COOPERATIVA
    Inventors: Sanzio Caroli, Massimo Balducci
  • Patent number: 10366104
    Abstract: Methods, systems, apparatuses, and computer program products are provided that enable immediate access to data associated with a source blob. The foregoing is achieved by creating a copy-on-read blob based on the source blob and a link blob based on the copy-on-read blob for each virtual machine to be deployed. When creating the copy-on-read blob, the source blob is not copied. Instead, data from the source blob is copied to the copy-on-read blob upon request by a virtual machine. Subsequent requests for that data are retrieved from the copy-on-read blob. Each link blob stores write data provided by its corresponding virtual machine. When a virtual machine requests data, its corresponding link blob is checked for the data. If the data is not stored therein, the copy-on-read blob is checked for the data. If the copy-on-read blob does not store the data, the data is retrieved from the source blob.
    Type: Grant
    Filed: June 21, 2017
    Date of Patent: July 30, 2019
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Krishnan Varadarajan, Shane Mainali, Maneesh Sah, Manan Shah, Andrew Edwards, Ivan Brugiolo, Ju Wang, Ovais Khan, Sivakumar Kalva, Venkates P. Balakrishnan
  • Patent number: 10360670
    Abstract: A method for the non-destructive testing of the volume of a test object, during the course of which a volume raw image of the test object is recorded by a suitable non-destructive imaging testing method. Then, those regions of the volume raw image are identified that are not to be attributed to the test object material. It is checked whether an identified region is completely embedded in regions that are to be associated with the test object material. If necessary, such a region is assimilated to those regions that are to be associated with the test object material, forming a filled volume raw image. Finally, a difference is generated between the volume raw image and the filled volume raw image, forming a first flaw image.
    Type: Grant
    Filed: February 3, 2014
    Date of Patent: July 23, 2019
    Assignee: GE Sensing & Inspection Technologies GmbH
    Inventor: Ingo Stuke
  • Patent number: 10360684
    Abstract: A method for edge determination of a measurement object in optical metrology, such as performed by an optical coordinate measuring machine. The method includes the steps of capturing first image data of the measurement object under reflected-light illumination, capturing second image data of the measurement object under transmitted-light illumination, and determining a position of an edge of the measurement object based on an evaluation in which both the first and the second image data are used.
    Type: Grant
    Filed: April 25, 2017
    Date of Patent: July 23, 2019
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Dominik Seitz, Nils Haverkamp
  • Patent number: 10352856
    Abstract: Ultra-thin conductors are employed to generate plasmon fields near the surface of the conductors. Emitters, such as atoms, molecules, quantum dots, or quantum wells, in the plasmon fields can emit and absorb light via transitions that are otherwise forbidden in the absence of the plasmon fields. Applications using these forbidden transitions include spectroscopy, organic light sources, and broadband light generation. For example, in a spectroscopic platform, an emitter is disposed in the plasmon fields to excite electronic transitions that are otherwise unexcitable. In organic light sources, plasmon fields quench excited triplet states, allowing fast singlet decay with the emission of light. In broadband light generation, strong two-plasmon spontaneous emission of emitters near ultrathin conductors is employed to produce a broad spectrum of light.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: July 16, 2019
    Assignee: Massachusetts Institute of Technology
    Inventors: Nicholas Rivera, Ido Kaminer, Bo Zhen, Marin Soljacic, John Joannopoulos
  • Patent number: 10345247
    Abstract: An apparatus for detecting a degree of particulate contamination on a flat panel is disclosed, including: an illuminator for producing a radiation beam which results in scattered radiation from its scattering by contaminants on a surface of the flat panel under test and reflected radiation from its reflection by the surface of the flat panel under test; a detector for collecting the scattered radiation, the detector having a radiation collection surface perpendicular to a normal of the surface of the flat panel under test; and a beam trimmer for separating the reflected radiation from the scattered radiation, the beam trimmer including a first optical member, disposed in correspondence with the scattered radiation and configured for directing the scattered radiation to be collected by the detector, and a second optical member disposed in correspondence with the reflected radiation and configured for directing the reflected radiation not to be collected by the detector.
    Type: Grant
    Filed: February 28, 2018
    Date of Patent: July 9, 2019
    Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
    Inventors: Yongqiang Shen, Xiaoqing Yang, Xueshan Han
  • Patent number: 10346764
    Abstract: This invention discloses a novel system and method for distributing electronic ticketing such that the ticket is verified at the entrance to venues by means of an animation or other human perceptible verifying visual object that is selected by the venue for the specific event. This removes the need to use a bar-code scanner on an LCD display of a cell phone or other device and speeds up the rate at which human ticket takers can verify ticket holders. The system also can permit ticket purchase verification in the absence of a network connection during verification.
    Type: Grant
    Filed: August 11, 2015
    Date of Patent: July 9, 2019
    Assignee: BYTEMARK, INC.
    Inventors: Micah Bergdale, Matthew Grasser, Nicholas Ihm, Samuel Krueckeberg, Gregory Valyer
  • Patent number: 10330465
    Abstract: The present invention regards a method for measuring displacement of a surface at a region of interest when the region of interest is exposed to a load.
    Type: Grant
    Filed: August 7, 2015
    Date of Patent: June 25, 2019
    Inventor: Richard Baxter Byrne
  • Patent number: 10324064
    Abstract: A method and apparatus are disclosed for assessment of a sealed package. Light is emitted from a narrow-band laser source towards said package from outside of said package. An absorption signal of said light scattered in said package is measured, wherein said absorption is caused by said at least one gas when said light is scattered and travels in said sealed package. Measuring is made outside of said package, whereby said assessment is non-intrusive with regard to said package. It is determined if a deviation exists from a predetermined, expected gas composition and/or concentration of said at least one gas within said sealed package based on said measured absorption signal. Thus sealing of said package for said gas is detected.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: June 18, 2019
    Assignee: GasPorOx AG
    Inventors: Sune Svanberg, Anders Johnsson, Märta Lewander, Annika Olsson
  • Patent number: 10299982
    Abstract: A method, performed by a mobile device, for assisting blind or visually impaired users navigate a room or a new and unfamiliar environment. The method includes blind user acquiring one or more images using a mobile device and invoking processing algorithms. Processing algorithms include one of Multi View Stereo and Structure from Motion, whereby algorithms construct a 3D representation of the environment being imaged. Further algorithms are applied to identify and assign attributes to objects in the imaged environment. The 3D representation is responsive to mobile device orientation. The environment is presented to the user via a touch screen, enabling the user to virtually explore the environment using touch, whereby objects being touched are identified, and associated with dimensional and other attributes.
    Type: Grant
    Filed: July 21, 2017
    Date of Patent: May 28, 2019
    Inventor: David M Frankel
  • Patent number: 10295334
    Abstract: A 3D measuring system having a projector, a camera and a chassis that connects the projector and the camera, characterized by a heating device for heating one or more components of the 3D measuring system.
    Type: Grant
    Filed: January 18, 2017
    Date of Patent: May 21, 2019
    Assignee: CARL ZEISS OPTOTECHNIK GMBH
    Inventors: Ernst Semmelmann, Thomas Roth
  • Patent number: 10295655
    Abstract: Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.
    Type: Grant
    Filed: July 13, 2018
    Date of Patent: May 21, 2019
    Assignee: COGNEX CORPORATION
    Inventors: Benjamin Braker, Aaron Wegner, Ronald Zimmerman, Eric Moore, Trevor McDonald
  • Patent number: 10295565
    Abstract: A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: May 21, 2019
    Assignee: CELADON SYSTEMS, INC.
    Inventors: John L. Dunklee, William A. Funk
  • Patent number: 10295477
    Abstract: A photomask blank having a thin film on a transparent substrate is inspected for defects by irradiating inspection light to a surface region of the blank, collecting the reflected light from the irradiated region via an inspection optical system to form a magnified image of the region, extracting a feature parameter of light intensity distribution from the magnified image, and identifying the bump/pit shape of the defect based on the feature parameter combined with the structure of the thin film. The defect inspection method is effective for discriminating defects of bump or pit shape in a highly reliable manner. On application of the defect inspection method, photomask blanks having no pinhole defects are available at lower costs and higher yields.
    Type: Grant
    Filed: January 25, 2018
    Date of Patent: May 21, 2019
    Assignee: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Tsuneo Terasawa, Hiroshi Fukuda, Atsushi Yokohata, Takahiro Kishita, Daisuke Iwai
  • Patent number: 10254311
    Abstract: A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: April 9, 2019
    Assignee: CELADON SYSTEMS, INC.
    Inventors: John L. Dunklee, William A. Funk
  • Patent number: 10255521
    Abstract: A portable computing device equipped with at least one image capture device and/or a light source captures an image (or a video) of a portion of a surface of interest having the damage that is exposed to a light from the light source. The portable computing device converts the image to an output image that highlights the damage. If the damage is a dent, the image is converted to a false color image using a saliency algorithm. If the damage is a scratch, the image is converted to a colorspace stretched image using color stretching algorithms. The size of the damage is determined by capturing an image of a ruler placed adjacent to the damage and the portion of surface of interest having the damage. The ruler is then removed from the image. The resulting image is converted to the output image. The ruler is added to the output image.
    Type: Grant
    Filed: December 12, 2016
    Date of Patent: April 9, 2019
    Assignee: Jack Cooper Logistics, LLC
    Inventors: Andrea Amico, Mohit Prabhushankar
  • Patent number: 10247679
    Abstract: Medical syringe barrels having the inner surface coated with cured silicone oil are used for calibration and detection of silicone oil in medical syringe barrels. Calibration standards as provided in this invention allow for quick determination how well a lubrication system for lubricating medical syringe barrels with silicone oil is working.
    Type: Grant
    Filed: October 14, 2016
    Date of Patent: April 2, 2019
    Assignee: ZebraSci, Inc
    Inventors: Frederick Talley Gertz, Robert James Schultheis, Jaan Noolandi
  • Patent number: 10249038
    Abstract: A DNA flow cell processing method including positioning the flow cell on a stage at a predetermined location relative to a camera, illuminating the flow cell from a side with a first light source to reflect light off the DNA fragment bead locations, obtaining a first image of the flow cell and identifying a first reference pattern of bead locations in the first image, moving at least one of the flow cell and the stage relative to the camera, attempting to reposition the stage at the predetermined location, obtaining a second image of the flow cell, identifying the first reference pattern in the second image, and evaluating a first offset, relative to the camera, between the first reference pattern in the first image and the first reference pattern in the second image.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: April 2, 2019
    Assignee: Qiagen Sciences, LLC
    Inventors: David Ray Stoops, Phillip Alan Veatch, Steven Jeffrey Gordon
  • Patent number: 10223567
    Abstract: The disclosure features dendritic tags, and methods and systems for fabricating and using such tags. The methods can include obtaining at least one image of a dendritic tag attached to an article, analyzing the at least one image to identify a set of features associated with the dendritic tag, and comparing the set of features to stored information to identify the article.
    Type: Grant
    Filed: September 17, 2015
    Date of Patent: March 5, 2019
    Assignee: ARIZONA BOARD OF REGENTS, A BODY CORPORATE OF THE STATE OF ARIZONA ACTING FOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY
    Inventor: Michael N. Kozicki
  • Patent number: 10225483
    Abstract: A method for creating a projected image including capturing an image of an item or data relating to an image of an item with an image capture device having a plurality of light sensing units, at a first exposure time. The method further includes receiving as an input or determining a second exposure time, and creating a projected image of the item at the second exposure time based upon the captured image or the captured data relating to the image.
    Type: Grant
    Filed: April 29, 2014
    Date of Patent: March 5, 2019
    Assignee: PIERCE BIOTECHNOLOGY, INC.
    Inventors: Suk J. Hong, Nikki L. Jarrett, Eric Leigh Hommema, Jason Aravich
  • Patent number: 10220640
    Abstract: According to one embodiment, a tablet printing apparatus includes: a conveyor belt including a suction hole to suck a tablet; and an ink jet print head configured to perform printing on the tablet; wherein the conveyor belt further includes a plurality of protrusions formed around the suction hole and configured to support the tablet in contact with the tablet, and a recess formed between the protrusions and communicated with the suction hole, each of the protrusions has a bottom surface, an upper surface, area of which is smaller than that of the bottom surface, and a side surface having an inclined surface, the protrusions support the tablet such that a gap is formed between a surface of the tablet on conveyor belt side and the suction hole, and a suction force is applied to the gap and space of the recess through the suction hole to suck the tablet.
    Type: Grant
    Filed: April 26, 2018
    Date of Patent: March 5, 2019
    Assignee: SHIBAURA MECHATRONICS CORPORATION
    Inventors: Yasutsugu Tsuruoka, Hironori Haijima, Toru Kuribayashi, Yuki Umemura
  • Patent number: 10217205
    Abstract: Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.
    Type: Grant
    Filed: March 10, 2016
    Date of Patent: February 26, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Min Chul Park, Dae Sin Kim, Sat Byul Kim, Sae Jin Kim, Zhiliang Xia, Je Hyun Lee
  • Patent number: 10197507
    Abstract: An inspection apparatus comprising, an optical system emitting light having a predetermined wavelength, illuminating a sample while the light is converted into light having a polarization plane not in the range of ?5 degrees to 5 degrees and 85 degrees to 95 degrees with respect to a direction of a repetitive pattern on the sample, an optical system for acquiring an image and forming said image on an image sensor using a lens, a half-wave plate, a first image sensor, a second image sensor, an inspection analyzer, wherein these differ in a transmission axis direction, a processor that obtains an average gray level and a standard deviation in each predetermined unit region of the image, and a defect detector, wherein a resolution limit defined by a wavelength of the light source and a numerical aperture of the lens is a value in which the pattern is not resolved.
    Type: Grant
    Filed: January 13, 2014
    Date of Patent: February 5, 2019
    Assignee: NuFlare Technology, Inc.
    Inventors: Riki Ogawa, Hiromu Inoue, Masatoshi Hirono
  • Patent number: 10197387
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Grant
    Filed: October 3, 2014
    Date of Patent: February 5, 2019
    Assignee: TENARIS CONNECTIONS B.V.
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Patent number: 10192298
    Abstract: A device for identifying an end of a fiber tape rolling over a composite structure is presented. The device includes a light source disposed proximate to the composite structure and configured to project a line of light at a first angle on the fiber tape rolling over the composite structure. Also, the device includes an image capturing unit disposed proximate to the composite structure and configured to capture an image of the line of light on the fiber tape at a second angle. Further, the device includes a controller coupled to the image capturing unit and configured to process the captured image to detect a discontinuity in the line of light on the fiber tape and identify the end of the fiber tape based on the detected discontinuity in the line of light on the fiber tape.
    Type: Grant
    Filed: April 20, 2015
    Date of Patent: January 29, 2019
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Kevin George Harding, Christopher Allen Nafis, Robert William Tait
  • Patent number: 10191194
    Abstract: A spectrally selective (e.g., color) target has been designed and fabricated for reflectance micro- and/or macro-imaging that utilizes microlens arrays and color mirrors. The color mirrors are optical interference coatings. The microlenses are designed and fabricated such that the light reflected from the color mirror is incident onto the detector. This system of microlenses and color mirrors allows the user to image different colored specular highlights. An infinite number of spectral reflectance profiles can be created with these color targets and used for spectral and colorimetric imaging applications. The targets are not limited to the visible region; they can also be designed to work in the ultraviolet and infrared wavelength regions.
    Type: Grant
    Filed: November 5, 2015
    Date of Patent: January 29, 2019
    Assignee: Rochester Institute of Technology
    Inventors: Jennifer D. T. Kruschwitz, Roy S. Berns