Abstract: A structural color body is film-like and comprises a front surface layer disposed on a front surface side and a back surface layer disposed on a back surface side, the front surface layer and the back surface layer contain block copolymers and have micro-phase separated structures including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, a maximum value of distances predetermined in the micro domains of the front surface layer is larger than the wavelength in the visible light range, and distances predetermined in the micro domains of the back surface layer are equal to or less than the wavelength in the visible light range.

Abstract: There is provided a measuring apparatus including: an imaging optical system configured to form an image of an object to be measured; and an imaging section including a transmissive member which is arranged in the vicinity of an image plane of the imaging optical system to be inclined with respect an optical axis of the imaging optical system. The imaging optical system includes a first optical member which is non-coaxial with respect to the optical axis.

Abstract: A device for optically scanning and measuring an environment is designed as a laser scanner having a light emitter that emits an emission light beam and a light receiver that receives a reception light beam which is reflected from an object in the environment of the laser scanner. The laser scanner also includes a control and evaluation unit which, for a multitude of measuring points, determines at least the distance to the object. The spot of the emission light beam temporarily moves along a prism of the laser scanner, the prism having at least two different brightness levels and/or colors.

Abstract: Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including: but not limited to, critical dimension and overlay misregistration; defects and thin film characteristics; critical dimension and defects; critical dimension and thin film characteristics; critical dimension, thin film characteristics and defects; macro defects and micro defects; flatness, thin film characteristics and defects; overlay misregistration and flatness; an implant characteristic and defects; and adhesion and thickness.

Abstract: A measurement apparatus includes an illumination light setting unit which sets illumination light having an optical characteristic corresponding to a microstructure which is formed on the surface of a measurement target and is to be measured, and a measurement unit which measures reflected light when the measurement target is irradiated with the illumination light. In addition, an extraction unit extracts, from the measured reflected light, information about the surface shape of the measurement target and the microstructure formed on the surface.

Abstract: The attenuation and other optical properties of a medium are exploited to measure a thickness of the medium between a sensor and a target surface. Disclosed herein are various mediums, arrangements of hardware, and processing techniques that can be used to capture these thickness measurements and obtain dynamic three-dimensional images of the target surface in a variety of imaging contexts. This includes general techniques for imaging interior/concave surfaces as well as exterior/convex surfaces, as well as specific adaptations of these techniques to imaging ear canals, human dentition, and so forth.

Abstract: A surface inspection apparatus includes an irradiating unit that has a plurality of light sources that respectively emit a plurality of illumination light beams having different wavelength ranges, and irradiates an inspection surface as a surface of a body to be inspected with the illumination light beams, in a condition where the light sources are located adjacent to each other and arranged in a given order along the inspection surface, an imaging unit that images reflected light when the illumination light beams are reflected by the inspection surface, so as to obtain a plurality of items of image data corresponding to the respective wavelength ranges, and a control unit that detects a detection object on the inspection surface, based on the items of image data corresponding to the respective wavelength ranges which are obtained by the imaging unit.

Abstract: The present invention provides a method and apparatus for non-destructive testing of a seed. In various embodiments, the method may comprise vibrating the seed to orient the seed on an axis, identifying a location of a known feature of the seed, determining a sample location on the seed based on the location of the known feature, and performing a non-destructive testing procedure on the seed proximate the sample location. In one embodiment, the method may comprise removing a sample portion of the seed from the sample location without damaging the embryo of the seed. Accordingly, the viability of the seed may be maintained while allowing for subsequent testing on the sample portion of the seed.

Abstract: A measuring apparatus includes a filter that transmits light of a predetermined wavelength; a first light receiving unit receives at least one of a first light that is output from a first light source, reflected by or transmitted through an object to be measured, and transmitted through the filter and a second light that is output from a second light source, reflected by or transmitted through the object to be measured, and transmitted through the filter, and through which a signal according to the received light travels; a second light receiving unit receives light of a different path from that received by the first light receiving unit; a difference extracting unit that obtains a difference signal between the signals traveling through the first and second light receiving units and an information generating unit that generates information of the object to be measured based on the difference signal.

Abstract: A two-dimensional displacement sensor includes first and second laser units that emit first laser light incident on the surface of the strip-shaped member from a direction intersecting the thickness direction of the strip-shaped member and second laser light incident on the surface of the strip-shaped member from a direction parallel to the thickness direction of the strip-shaped member, a camera that has a light receiving element for receiving light reflected from the surface of the strip-shaped member and measures the amount of displacement of the surface of the strip-shaped member from the reflected light receiving position detected by the light receiving element, an optical element for focusing the reflected light on the light receiving element, and a switching member for switching the laser light to be incident on the surface of the strip-shaped member between the first laser light and the second laser light.

Abstract: A measuring apparatus for measuring a three-dimensional shape includes a light source, a contact tip that is brought into contact with an object to be measured and scans the object to be measured, a holding portion that is movable along the object to be measured, a coupling portion for coupling the contact tip to the holding portion via a flexible support member, and an objective lens supported by the holding portion. In addition, an optical system condenses light provided by the light source on the contact tip via the objective lens, a photodetector receives backscattered light from the contact tip and detects a position of the contact tip that is brought into contact with the object to be measured, a moving unit moves the holding portion, and a position measuring instrument measures a position of the holding portion.

Abstract: Method for measuring the shape of a section of a semi-transparent object such as one section of a tooth, using a light source for generating light with a broadband spectrum in a device for generating a multifocal illumination pattern, a lens with a large chromatic aberration for imaging foci of the illumination pattern onto the object, and a detection device for determining the wavelength spectra of the foci confocally imaged onto the object via the lens, wherein a spectral peak position of each focus is determined from the respective wavelength spectrum, from which position the extent of the object in the direction of the imaging beam (Z coordinate) is calculated.

Abstract: Described are an imaging device and method for determining three-dimensional position information of a surface of an object. The device includes a pair of optical fibers, a phase shifter, a detector array and a processor. The phase shifter is coupled to one of the optical fibers and is used to change a phase of optical radiation emitted from the optical fiber relative to a phase of optical radiation emitted from the other optical fiber. The detector array receives optical radiation scattered by the surface of the object. The processor communicates with the detector array and the phase shifter. Signals generated by the detector array are received by the processor and three-dimensional position information for the surface is calculated in response to the received optical radiation scattered by the surface of the object and the change in the relative phase of optical radiation emitted by the optical fibers.

Abstract: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens, at least one polarization-coded aperture obstructing the lens, a polarization-sensitive sensor operable for capturing electromagnetic radiation transmitted from an object through the lens and the at least one polarization-coded aperture, and a processor communicatively connected with the sensor for processing the sensor information and producing a 3-D image of the object.

Abstract: A method for monitoring the manufacturing process of hot-rolled tubes in which the type and dimensional characteristics of structures produced by the rolling process on an outer surface of the tube are evaluated to assess the process state. Immediately subsequent to the rolling process in the exit side region of a rolling stand the outer surface of at least one defined portion of the tube is detected by measuring technology, linearly by means of an optical laser stripe method and in a clocked manner in the form of profile lines, and the profile lines are then combined to form an at least two-dimensional topography and the topography is evaluated to assess the process state.

Abstract: The invention concerns a method for the contactless scanning of three-dimensional objects (1). The objects are scanned using a bundled light beam (7), preferably using a laser beam. The object is scanned in at least two different measuring sections. When scanning in two different measuring sections, the measuring lines on the object (1) are not parallel. As an alternative or additional option, the object (1) is rotated during one measuring operation and not during the other.

Abstract: Provided is a method for controlling a fabrication cluster comprising an optical metrology tool and an optical metrology model including a profile model of a sample structure, the optical metrology tool having an illumination beam, the illumination beam having a range of angles of incidence and azimuth angles. A library comprising Jones and/or Mueller matrices and/or components (JMMOC) and corresponding profile parameters is generated using ray tracing and a selected range of beam propagation parameters and can be used to train a machine learning system (MLS). A regenerated simulated diffraction signal is obtained with a regenerated JMMOC using the library or MLS, integrated for all the rays of the optical metrology model. One or more profile parameters are determined from the best match regenerated simulated diffraction signal. At least one process parameter of the fabrication cluster is adjusted based on the determined one or more profile parameters.

Abstract: A method for aircraft surface contamination detection and measurement includes: mounting a laser probe on an airfoil; positioning the laser probe to emit laser energy at multiple pre-determined surface points along the leading edge of the airfoil; and using a processor device for activating the laser probe and obtaining measurement data for generating a surface contour of the shape and accurate measurement of the depth of airfoil icing in the surface target area. The icing data is presented to the pilot in a display that alerts him to the icing and accurately shows the depth and shape of the airfoil icing.

Abstract: System and method for tridimensional cartography of a structural surface. Two wires are extended in front and along the structural surface so as to define a reference surface. A measuring unit comprising a laser arrangement and a camera is moved in front of the structural surface so as to progressively scan the surface. Tow distinct light planes directed toward the structural surface are projected by means of the laser arrangement. Images of the structural surface containing lines resulting from an intersection of the light planes with the structural surface and four reference points resulting from an intersection of the light planes with the wires are captured by means of the camera. The images are processed to determine the 3D coordinates of the lines defining the mapping in a reference system bound to the reference surface considering the position and the orientation of the measuring unit based on the reference points.

Abstract: An apparatus for measuring a shape of a surface, comprises a measurement head which measures a direction of a normal from the surface to a reference point by detecting test light obtained when light that passes through the reference point is emitted, is reflected by the surface, and returns to the reference point, a scanning mechanism which scans the measurement head, and a processor which calculates the shape of the surface based on the direction of the normal measured using the measurement head and a position of the reference point.

Abstract: The concept includes projecting at the object surface, along a first optical axis, two or more two-dimensional (2D) images containing together one or more distinct wavelength bands. The wavelength bands vary in intensity along a first image axis, forming a pattern, within at least one of the projected images. Each projected image generates a reflected image along a second optical axis. The 3D surface data is obtained by comparing the object data with calibration data, which calibration data was obtained by projecting the same images at a calibration reference surface, for instance a planar surface, for a plurality of known positions along the z-axis. Provided that the z-axis is not orthogonal to the second optical axis, the z-axis coordinate at each location on the object surface can be found if the light intensity combinations of all predefined light intensity patterns are linearly independent along the corresponding z-axis.

Abstract: There is provided a form measuring apparatus including; an imager configured to take an image of a object, an irradiator configured to irradiate a measurement light from a projection direction different from the direction along which the imager performs imaging to form a predetermined light amount distribution on the object, a reference light generator configured to generate a reference light to irradiate the object, and a detector configured to detect a target area for form measurement of the object based on a pickup image taken by the imager as the reference light is irradiated on the object.

Abstract: Described is a method and system for fast three-dimensional imaging using defocusing and feature recognition is disclosed. The method comprises acts of capturing a plurality of defocused images of an object on a sensor, identifying segments of interest in each of the plurality of images using a feature recognition algorithm, and matching the segments with three-dimensional coordinates according to the positions of the images of the segments on the sensor to produce a three-dimensional position of each segment of interest. The disclosed imaging method is “aware” in that it uses a priori knowledge of a small number of object features to reduce computation time as compared with “dumb” methods known in the art which exhaustively calculate positions of a large number of marker points.

Abstract: A vision recognition system is provided for use with a high speed, automatic produce labeling machine. The system uses laser profiling to direct a sheet of light transversely to the longitudinal axis of a produce feed conveyor. The sheet of light periodically impacts, and generates laser profiles of, the surfaces of the produce items, such as pears, being fed by the conveyor to one or more labeling machines. The laser profiles are used to generate real world (x,y) coordinates of the domes of the incoming produce items, which are passed to the labeling machine or machines. Real world height (or z) coordinates may also be created and passed to the labeler.

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided.

Abstract: A plurality of sensors are utilized for continuously detecting a plurality of relative distances between a surface of an object and the plurality of sensors within a predetermined space, and are utilized for generating a plurality of distance data according to the plurality of relative distances. A data processing module is utilized for establishing an object outline model of the object according to the plurality of distance data. Therefore, resolution or accuracy of the object outline model generated by measuring an outline of the object can be significantly increased.

Abstract: The method (M) for detecting the shape and/or dimensions of a wheel (3) on vehicle repair workshop machines or the like comprises the stages of: projection (B1, B2) of a line of light (6) onto the surface of a portion of a wheel (3) mounted rotating on a vehicle repair workshop machine (1) or the like; acquisition (C1, C2) of at least a two-dimensional image (Ii) of the projected line of light (6); processing (F) of the acquired image (Ii) to determine the profile (Pi) of the portion of the wheel (3); at least two stages (D1, D2) of complete rotation of the wheel (3); and a distributed detection stage (A), wherein the projection stage (B1, B2) and acquisition stage (C1, C2) are performed in correspondence to first angular positions (?j) of the wheel (3) during the first rotation stage (D1), and in correspondence to second angular positions (?k) of the wheel (3) during the second rotation stages (D2), at least some of the first angular positions (?j) and the second angular positions (?k) being non-coincident.

Abstract: The present invention relates to a monitoring apparatus for a ground processing machine, especially a ground milling machine, with the ground processing machine comprising at least one processing device for mechanically processing a ground surface and/or for applying a ground cover layer, comprising: at least one detection device for contactless detection at least in sections of a condition of the ground surface and/or the ground cover layer as produced by the processing device, and an evaluation device for the automated evaluation of the condition detected by the detection device. The present invention further relates to a ground processing machine, especially a ground milling machine, comprising at least one such monitoring apparatus.

Abstract: A method of measuring a 3D shape, which can measure a 3D shape of target objects on a board by searching a database for bare board information when a measuring object is not set to a normal inspection mode or by performing bare board teaching when the board is supplied from a supplier having not the bare board information is provided.

Abstract: A method for controlling focus of an optical system. The method includes providing a pair of incident light beams to a conjugate lens. The incident light beams are directed by the lens to converge toward a focal region. The method also includes reflecting the incident light beams with an object positioned proximate to the focal region. The reflected light beams return to and propagate through the lens. The method also includes detecting a phase of each of the reflected light beams and determining a degree-of-focus of the optical system with respect to the object by comparing the phases of the reflected light beams.

Abstract: A structural color body is film-like and formed of a resin layer containing a block copolymer, the resin layer has a micro-phase separated structure including lamellar micro domains, each of the micro domains has a wave-like shape having amplitudes in the thickness direction of the structural color body, and in each of the micro domains, a maximum value of distances in the direction between the tops of convexities and the bottoms of concavities is larger than the wavelength in the visible light range.

Abstract: A system and method reconstruct an anatomical impression. The system contains a light signal generating device for generating a light signal directed toward a synthetic test body having the anatomical impression. The light signal is directed toward the synthetic test body such that the light signal is attenuated upon passing through the synthetic test body. A sensor captures the attenuated light signal through the synthetic test body and converts the captured attenuated light signal into digitized image information. The system further includes a digital reconstruction device for reconstructing the digitized image information based on measurement of light attenuation to generate a three-dimensional volume of the anatomical impression.

Abstract: A device is described for testing the quality of microstructurization of a surface (2) in the case of a known target microstructurization quality, comprising a radiation source (1) for coherent radiation, a first detector (10) and a second detector (4) and a masking system, which are set up and arranged with respect to one another so that (a) radiation emitted by the radiation source (1) onto a surface (2), which is provided with a microstructurization of the target quality, produces a diffraction pattern, (b) the diffraction maximum of order n of the diffraction pattern without the masking system would impinge on the first detector (10), (c) the masking system prevents 80% of the photons that are assigned to the diffraction maximum of order n from impinging on the detector and (d) the diffraction maximum of order a of the diffraction pattern impinges on the second detector (4), wherein n is selected from the group consisting of 1, 2, 3, 4, 5, 6, 7, 8, 9 and 10 and a is selected from the group consisti

Abstract: An optical measurement apparatus includes a fixed headstock and an opposed, movable tailstock mounted on a reference support. The movable tailstock is movable along a linear axis to maintain a piece to be measured between the headstock and tailstock. A mobile carriage is movable along the linear axis. The carriage carries a light source directing a beam of collimated light across the linear axis to be interrupted by a piece under measurement. An optical detector aligned with the light source is arranged to receive residual light of the beam that has not been interrupted by the piece under measurement. The measuring apparatus has a rectilinear guide, fastened on the reference support, on which are slideably engaged the optical carriage and the tailstock, whereas the headstock is placed on a headstock carrier that is fastened on the reference support and hangs at least in part over the rectilinear guide.

Abstract: A system (100) for scanning a three-dimensional object (150) comprises a device for illuminating a plane (110); an imaging sensor (120); and a transparent container (130) for immersing the object (150) in a participating medium (140).

Abstract: A method for controlling a focus of an optical system. The method includes providing a pair of incident light beams to a conjugate lens. The incident light beams are directed by the lens to converge toward a focal region. The method also includes reflecting the incident light beams with an object positioned proximate to the focal region. The reflected light beams return to and propagate through the lens. The method also includes determining relative separation measured between the reflected light beams and determining a degree-of-focus of the optical system with respect to the sample based upon the relative separation.

Abstract: The present invention may include acquiring a wafer shape value at a plurality of points of a wafer surface at a first and second process level, generating a wafer shape change value at each of the points, generating a set of slope of shape change values at each of the points, calculating a set of process tool correctables utilizing the generated set of slope of shape change values, generating a set of slope shape change residuals (SSCRs) by calculating a slope of shape change residual value at each of the points utilizing the set of process tool correctables, defining a plurality of metric analysis regions distributed across the surface, and then generating one or more residual slope shape change metrics for each metric analysis region based on one or more SSCRs within each metric analysis region.

Abstract: A calibrating jig comprises a reference sphere, and a reflecting plate configured to support the reference sphere from a lower side thereof and mirror-reflect light in a case that the reference sphere is illuminated from an upper side thereof.

Abstract: The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.

Abstract: A method and system for high-speed, high-resolution 3-D imaging of manufactured parts of various sizes at an imaging station having a measurement axis are provided. The part has a 3-D end surface and a length, a width and a part axis defined as being central to the part and parallel to its length. The system includes apparatus having a central axis substantially parallel to the measurement axis and a plurality of members having open and closed positions. The members have holding faces which are substantially equidistant from the central axis during movement between the positions to align a part disposed between the holding faces at the station so that the part axis is substantially parallel to the measurement and central axes. The holding faces releasably hold the aligned part in a holding position between the positions. The system further includes an actuator for moving the apparatus so that the end surface moves in a plane substantially perpendicular to the measurement axis.

Abstract: A non-contact, opto-electronic method to determine glass surface shape involves pattern projection in reflection from a screen. The pattern is formed of black and white or coloured squares with a central reference pattern taken as origin of the x-y axes in the subsequent quantitative analysis of the optical distortion in formed glass sheets or panels.

Abstract: A method for the measurement of the stock of a gear with an axis of rotation which has to be finished in the hardened state, wherein the gear has a gearing with a plurality of teeth at its outer and/or inner circumference and wherein the teeth have, compared with the finished geometry, a stock on their tooth flanks. To carry out a reliable measurement of the stock the invention proposes that the position of the surface of the tooth flank with the stock is detected by using optical distance measurement by means of a distance sensor, wherein a light beam is directed by the distance sensor onto the surface, wherein the light beam is guided onto the surface in such a way that it is perpendicular to the axis of rotation or that it is parallel to this direction.

Abstract: A method and an arrangement for determining the coordinates K of at least one point P1 on an edge of an optical lens, wherein the lens is held/can be positioned, by a retaining device, with the edge which is to be measured in an optical path of an optical micrometer, whereby the lens is held/can be positioned with the edge in the optical path, a coordinate Za is determined for the point P1, a variation of the relative position between the lens and the optical path is made, which is based on a pivotal axis S, a coordinate Zb is determined in the new position B for the point P1, and the coordinates Ya and Yb are determined.

Abstract: Directional albedo of a particular article, such as an identity card, is measured and stored. When the article is later presented, it can be confirmed to be the same particular article by re-measuring the albedo function, and checking for correspondence against the earlier-stored data. The re-measuring can be performed through us of a handheld optical device, such as a camera-equipped cell phone. The albedo function can serve as random key data in a variety of cryptographic applications. The function can be changed during the life of the article. A variety of other features are also detailed.

Abstract: An apparatus for measuring a shape of a surface, comprises a measurement head which measures at least one of a distance between a reference point and the surface and a direction of a normal from the surface to the reference point, a scanning mechanism which scans the measurement head, and a processor which calculates the shape of the surface based on a measurement result measured using the measurement head and coordinates of the reference point, wherein the coordinates of the reference point are calibrated using a measurement result measured by scanning the measurement head along a scanning path in association with a first surface to be measured, and a shape of a second surface to be measured is calculated based on a measurement result measured by scanning the measurement head along the same scanning path in association with the second surface, and the calibrated coordinates of the reference point.

Abstract: Embodiments of the present application can provide systems and methods for mode shape identification of turbine buckets. According to one embodiment, a system can be provided. The system can include a turbine bucket having numerous trigger patterns disposed at a distal end of the turbine bucket. A sensor is disposed adjacent to the distal end of the turbine bucket for detecting the trigger patterns. The trigger patterns are patterned to identify at least one mode shape of the turbine bucket.

Abstract: An apparatus for measuring a shape profile of a surface of a sheet of material includes a light source for providing a light beam to be directed at the surface of the sheet of material, a linear translation stage coupled to the light source for translating the light source over the surface of the sheet of material such that the light beam, when directed at the surface, is incident on the surface at multiple positions and produces a reflected light beam at each of the multiple positions, a plurality of light receivers located at predetermined positions for selectively intercepting the reflected light beam produced at each of the multiple positions, a data acquisition device configured to receive information related to position difference between the light source and a selected one of the plurality of light receivers intercepting the reflected light beam produced at each of the multiple positions, and a data analysis device configured to correlate the position difference information to a shape profile of the su

Abstract: The present invention provides a three dimensional scanning system for generating a three dimensional profile of an object being scanned. The scanning system comprises a light source, a beam splitter, a first reflector, a second reflector, a detector, a driving member and a processor, for generating a profile of the object based on the detection signal and the track of movement of the object.

Abstract: A method for detecting blast induced pressure changes includes exposing a material, a contained solution, a membrane-bound solution, or a photonic crystal material, having a first optical property, to a pressure wave having a blast level. A change in the first optical property to a second optical property of the exposed material, contained solution, membrane-bound solution, or photonic crystal material is determined, and the extent of change corresponds to the blast level.

Abstract: To provide a recording-material type determination apparatus and recording-material type determination method which can determine the type of recording material using simple calculations as well as to provide an image forming apparatus capable of obtaining stable image quality independent of the type of recording material using the apparatus and method. Based on data read by a read unit which reads surface images of recording material, a first calculation unit calculates the depth of irregularities in the surface of recording material and stores the results of calculation in a register A while a second calculation unit calculates the spacing of irregularities on the surface of the recording material and stores the results of calculation in a register B. Based on the values in the registers A and B, the type of recording material such as gloss paper, plain paper, rough paper or OHT is determined.