Abstract: A flash memory with low power consumption and rapid operations is disclosed, including a memory array of memory cells, a word line selection circuit for selecting a row of cells, a current-type sensing circuit electrically connected with each bit line for sensing the current of a selected bit line, and an erase unit erasing the cells in a selected block of the array. The erase unit includes: an erase sequence that determines whether the current of each bit line in the erased block is larger than a first value and ends the erasure if the result is “yes”, and a soft-program sequence that performs a soft program verification, which applies a soft-program voltage to all word lines in the erased block and determines whether the current of each bit line is lower than a second value, and ends the soft programming if the result is “yes”.

Abstract: Apparatuses and methods for nonconsecutive sensing of multilevel memory cells include methods of sensing a unit of information from a multilevel memory cell (MLC) using a sensing signal. The unit of information can correspond to a page of information. The MLC can store a plurality of units of information corresponding to a plurality of pages of information. The sensing signal can change from a first sensing magnitude to a second sensing magnitude and from the second sensing magnitude to a third sensing magnitude. The second sensing magnitude can be nonconsecutive from the first sensing magnitude and/or the third sensing magnitude can be nonconsecutive from the second sensing magnitude with respect to a plurality of sensing magnitudes corresponding to a plurality of charge storage states of the MLC.

Abstract: According to one embodiment, a communication device includes a data storage device and following units. The reception unit receives data from another communication device. The data storage device includes a data area controlled by a file system and a temporary area beyond control of the file system. The processing unit operates in one of first and second start modes, the processing unit being started faster in the second start mode than in the first start mode. The processing unit operating in the second start mode writes the received data to the temporary area, copies the received data in the temporary area to the data area after completion of data reception, and erases the received data in the temporary area after copying.

Abstract: A pre-reading method and a programming method for a 3D NAND flash memory are provided. The pre-reading method comprises the following steps. A selected string includes a first memory cell, two second memory cells and a plurality of third memory cells. The two second memory cells are adjacent to the first memory cell. The third memory cells are not adjacent to the first memory cell. A first pass voltage is applied on the second memory cells, a second pass voltage is applied on the third memory cells, and a read voltage is applied on the first memory cell via a plurality of word lines for reading a data of the first memory cell. The first pass voltage is larger than the second pass voltage.

Abstract: An integrated circuit includes an array of memory cells that is arranged into rows, main columns, and redundant columns that perform repairs in the array. The main columns and the redundant columns are divided into row blocks. Bit lines couple the main columns to status memory indicating repair statuses of the repairs by the redundant columns. The integrated circuit receives a command, and performs an update on the status memory with the repair statuses specific to particular ones of the row blocks in a portion of the memory accessed by the command. Alternatively or in combination, the status memory has insufficient size to store the repair statuses of multiple ones of the row blocks of the main columns.

Abstract: Methods and apparatuses for an enhanced block copy. One embodiment is reading data from a source block located in a first portion of the memory device, and programming the data to a target block located in a second portion of the memory device. The first and second portions are communicatively coupled by data lines extending across the portions. The data lines are communicatively uncoupled between the first and second portions for at least one of the reading and programming acts.

Abstract: Apparatus and methods of reducing power consumption in solid-state storage devices such as solid-state disks (SSDs) that can reduce idle power levels in an SSD, while maintaining low resume latency upon exiting a reduced power state. By arranging a storage controller and at least one NAND flash package of the SSD in separate power islands, storing context information for the SSD in at least one page buffer of NAND flash memory within the NAND flash package on one power island upon entering the reduced power state, and, once the context information is stored in the page buffer, allowing the NAND flash memory to enter a standby mode, placing the storage controller on the other power island in a predefined low power mode, and removing power from any unneeded components on the same power island as the storage controller, a scalable approach to reducing idle power levels in the SSD can be achieved.

Abstract: Various techniques of solid-state drive (“SSD”) management systems, components, modules, routines, and processes are described in this application. In one embodiment, a management engine for controlling a solid-state drive includes an input interface configured to receive a target operation profile from an input source. The management engine also includes a process component g configured to receive the target operation profile from the input interface, retrieve an operating policy from a database based on the target operation profile, and determine operating parameters for the SSD based on the retrieved operating policy. The management engine further includes a device interface coupled to the process component, the device interface being configured to transmit the determined operating parameters to the SSD for controlling operation of the SSD.

Abstract: A method and apparatus for managing write operations in memory. The method includes a memory including units, each of the units including subunits. Data updates are written “out-of-place”, in that new data does not overwrite the memory locations (subunits) where the data is currently stored. The at least one subunit containing the outdated data is marked as invalid. As a result, a subunit can contain up to date data in a valid subunit next to invalid subunits. For reclaiming units for erasure, it is searched amongst the units to identify a unit or units that match a predetermined criterion. The data of valid subunits of such identified unit is rewritten to another unit or units.

Abstract: Systems, devices, and methods are disclosed for leveling wear on memory. Such systems, methods, and devices include the memory, one or more wear leveling engines and one or more wear leveling policies, a were leveling mechanism comprising one of the wear leveling engines and one of the wear leveling policies. Further embodiments may include a decision engine having a write traffic signature mechanism wherein the decision engine selects a wear leveling engine and wear leveling policy based upon receiving a write traffic signature of the memory from the write traffic signature mechanism and receiving status data from the memory.

Abstract: A motherboard assembly includes a motherboard and an expansion card. The motherboard includes an expansion slot with a first idle pin connected to a standby power through a resistor. The expansion card includes an edge connector having a second idle pin and first to fifth electronic switches. When the first electronic switch receives a high level signal through the first and second idle pins, the first and fourth electronic switches are turned on. The second, third, and fifth electronic switches are turned off. The second system power outputs a standby voltage through the standby voltage output terminal. When the first electronic switch receives a low level signal, the first and fourth electronic switches are turned off. The second, third, and fifth electronic switches are turned on. The standby power outputs a standby voltage through the standby voltage output terminal.

Abstract: A memory device such as a solid state memory device have a dual-hardware, secure erase feature. A memory controller operating in a memory controller domain provides general memory management and interface operons. Upon receipt of a trigger signal which may be received from a secure supervisor circuit, a separate processor element that is configured to directly access the raw memory cells in the device bypasses the memory controller domain and executes a separately provided secure erase operating system whereby the raw cell data may be erased and rewritten with a predetermined data pattern and whereby the erase operation at the raw cell level may be verified and reported to the user by the processor.

Abstract: A semiconductor memory device includes a non-volatile memory, a memory controller, and a charge pump system. The memory controller establishes first parameters for a first programming cycle of a first plurality of memory cells of the non-volatile memory prior to the first programming cycle being performed. The charge pump system includes a plurality of charge pumps and provides a first programming pulse for use in performing the first program cycle. The first programming pulse is provided by selecting, according to the first parameters, which of the plurality of charge pumps are to be enabled during the first program cycle and which are to be disabled during the first program cycle.

Abstract: Embodiments include a split-gate non-volatile memory cell that is formed having a control gate and a select gate, where at least a portion of the control gate is formed over the select gate. A charge storage layer is formed between the select gate and the control gate. The select gate is formed using a first conductive layer and a second conductive layer. The second conductive layer is formed over the first conductive layer and has a lower resistivity than the first conductive layer. In one embodiment, the first conductive layer is polysilicon and the second conductive layer is titanium nitride (TiN). In another embodiment, the second conductive layer may be a silicide or other conductive material, or combination of conductive materials having a lower resistivity than the first conductive layer.

Abstract: Methods of operating an apparatus such as a computing system and/or memory device for memory endurance are provided. One example method can include receiving m digits of data having a first quantity of digits represented by a first data state that is more detrimental to memory cell wear than a second data state. The m digits of data are encoded into n digits of data having a second quantity of digits represented by the first data state. The value n is greater than the value m. The second quantity is less than or equal to the first quantity. The n digits of data are stored in an apparatus having memory cells.

Abstract: Techniques are described herein for detecting and recovering over-erased memory cells in a flash memory device. In one embodiment, a flash memory device includes a memory array including a plurality of blocks of memory cells. The device also includes a command interface to receive a command from a source external to the memory device. The device also includes a controller including logic to perform a leakage-suppression process in response to the command. The leakage-suppression process includes performing a soft program operation to increase a threshold voltage of one or more over-erased memory cells in a given block of memory cells and establish an erased state.

Abstract: Disclosed is a semiconductor device, including: an active region defined in a shape extended in at least four different directions in a semiconductor substrate; and gates of first to fourth transistors formed on extended portions of the active region, respectively, in which the first to fourth transistors share one junction area.

Abstract: According to one embodiment, a memory device comprises a writing device that writes data bits, check bits for error corrections, and overhead bit(s) into a memory, each bit of the overhead bit(s) corresponding to each group of bit group(s) including at least one bit of the data bits and/or the check bits, each bit of the overhead bit(s) indicating whether the corresponding bit group has been inverted, a reading unit that reads the data bits, the check bits, and the overhead bit(s) from the memory, a correcting unit that corrects an error in the data bits and overhead bit(s) read from the memory, based on the check bits, and an inverting unit that inverts the data bits contained in the bit group corresponding to the overhead bit and outputs the inverted data bits as data read from the memory when the error-corrected overhead bit indicates that inversion has been performed.

Abstract: Provided are a non-volatile memory device and a method for erasing the non-volatile memory device having vertical channel layers formed with different widths varying by height and a plurality of memory cells stacked along the vertical channel layers, the method including increasing potentials of the vertical channel layers, and when potentials of word lines connected to the memory cells are increased, erasing the memory cells while lowering the potentials of the word lines beginning from a word line positioned in an area in which a width of the vertical channel layer is wide to a word line positioned in an area in which the width of the vertical channel layer is narrow.

Abstract: Apparatuses and methods are disclosed, including an apparatus with a string of charge storage devices coupled to a common source, a first switch coupled between the string of charge storage devices and a load current source, and a second switch coupled between the load current source and the common source. Additional apparatuses and methods are described.

Abstract: An apparatus, system, and method are disclosed for managing erase operations for a data storage medium. A method includes determining whether a use threshold for one or more non-volatile storage cells is satisfied. A method includes performing a default erase operation for the one or more storage cells in response to determining that the use threshold is not satisfied. A method includes performing an extended erase operation for the one or more storage cells in response to determining that the use threshold is satisfied. An extended erase operation may include a greater number of erase pulse iterations than a default erase operation.

Abstract: A method, apparatus, and manufacture for memory device startup is provided. Flash memory devices are configured such that, upon the power supply voltage reaching a pre-determined level, each flash memory is arranged to load the random access memory with instructions for the flash memory, and then execute a first portion of the instructions for the flash memory. After executing the first portion of the instructions for the flash memory, each separate subset of the flash memories waits for a separate, distinct delay period. For each flash memory, after the delay period expires for that flash memory, the flash memory executes a second portion of the instructions for the flash memory.

Abstract: A flash memory device may include two or more flash memory cells organized as a NAND string in a block of flash memory cells, and flash cells, coupled to the NAND string at opposite ends, to function as select gates. The flash memory device may be capable of providing information related to a voltage threshold of the select gates to a flash controller, erasing the flash cells that function as select gates in response to a select gate erase command, and programming the flash cells that function as select gates in response to a select gate program command.

Abstract: A method of writing data includes receiving data pages to be stored in a data storage device and generating codewords corresponding to the received data pages. The codewords are stored to physical pages of a first memory portion of the data storage device. A first portion of a particular codeword that corresponds to a particular data page is stored at a first physical page of the first memory portion. A second portion of the particular codeword is stored at a second physical page of the first memory portion. The codewords are copied from the physical pages of the first memory portion to a physical page of a second memory portion of the data storage device.

Abstract: Apparatus and methods provide relatively low uncorrectable bit error rates, low write amplification, long life, fast and efficient retrieval, and efficient storage density such that a solid-state drive (SSD) can be reliably implemented using various types of memory cells, including relatively inexpensive multi-level cell flash. One embodiment intelligently coordinates remapping of bad blocks with error correction code control, which eliminates the tables used to avoid bad blocks.

Abstract: A method for erasing a first sub-block of a plurality of sub-blocks included in a block of a non-volatile memory device, wherein the first sub-block includes at least one word line, includes applying an erase voltage to a substrate, applying a third voltage lower than the erase voltage to the word line of the first sub-block, applying a first voltage at least one word line adjacent to the word line of the first sub-block, and applying a second voltage that is the same as or similar to the erase voltage to the other word lines, where the first voltage has a level between the third voltage and the second voltage.

Abstract: A device comprises a non-volatile memory array, a first selection circuit selecting whether to make a first connection path between a first bit line and a first circuit node, and selecting whether to make a second connection path between the first bit line and a second circuit node, a power supplying circuit supplying a power supply voltage to the first circuit node, the power supply voltage being, when the first connection path is selected to be made, supplied to the first bit line, and a first voltage supplying circuit supplying a first voltage to the second circuit node, the first voltage being, when the second connection path is selected to be made, supplied to the first bit line, the first voltage and the power supply voltage being higher than a ground potential, and the first voltage being higher than the power supply voltage.

Abstract: In a nonvolatile memory array, such as a three-dimensional array of charge-storage memory cells, data is randomized so that data of different strings along the same bit line are randomized using different keys and portions of data along neighboring word lines are randomized using different keys. Keys may be rotated so that data of a particular word line is randomized according to different keys in different strings.

Abstract: A flash memory device. In one embodiment, the flash memory device includes a flash memory, a diode, a controller, and a capacitor. The flash memory has a voltage source pin. The diode is coupled between a voltage source and the voltage source pin of the flash memory. The controller is coupled to the flash memory via a data bus. The capacitor is coupled between the voltage source pin of the flash memory and a ground, and supplies power to the flash memory to enable the flash memory to complete writing of at least one data page when the level of the voltage source is lowered.

Abstract: A method for prolonging the service life of a solid state drive. The method includes providing for use with a digital video recorder, a solid state drive (SSD) for time-shifted viewing of media content, changing the SSD from a first state to a second state based on a functional command from the user, and repeating changes between the first state and the second state, an accumulation of which over time results in a prolonged service life. A device designed to prolong the service life of a solid state drive is also provided.

Abstract: An method of operating a memory system including a plurality of memory cells includes changing an operation mode at least some of the memory cells which operate based on a first operation mode to operate based on a second operation mode; and performing a change erase operation on the memory cells for which an operation mode is changed on the basis of a change erase condition when the operation mode is changed. When memory cells operate in the first operation mode, a normal erase operation is performed based on a first erase condition, and when memory cells operate in the second operation mode, a normal erase operation is performed based on a second erase condition. The change erase condition is different from at least one of the first and second erase conditions.

Abstract: A flash memory device. In one embodiment, the flash memory device includes a flash memory, a diode, a controller, and a capacitor. The flash memory has a voltage source pin. The diode is coupled between a voltage source and the voltage source pin of the flash memory. The controller is coupled to the flash memory via a data bus. The capacitor is coupled between the voltage source pin of the flash memory and a ground, and supplies power to the flash memory to enable the flash memory to complete writing of at least one data page when the level of the voltage source is lowered.

Abstract: A method for determining a retention time in a solid state device (SSD), comprising the steps of providing a plurality of write operations to a memory, determining a reference voltage for each of the write operations, determining a difference between (i) the reference voltage after each of the write operations and (ii) a target reference voltage and if the difference is above a predetermined value, generating a flag indicating an excessive retention has occurred.

Abstract: A nonvolatile memory apparatus includes a control unit, a main storage medium with an electrically reloadable nonvolatile memory adapted to be operable even when faulty memory cells exist therein, and a storage region storing registered address values of faulty regions of the main storage medium containing the faulty memory cells. Data which is stored in the electrically reloadable nonvolatile memory is divided into blocks, each block having a plurality of data to be administrated and which is assigned an access address by the control unit. An administrative information region is provided in each block. The control unit carries out access requests of the main storage medium and the administration of faulty regions and the number of occurrences of reloading of respective memory cells of the main storage medium.

Abstract: Methods for programming memory cells and memory devices are disclosed. One such method for programming includes performing a program verify operation of a group of memory cells. A number of potential CS2 situations are detected. If the number of detected potential CS2 situations is greater than a threshold, programming compensation for a CS2 situation is used in a subsequent programming operation.

Abstract: Apparatus and method for managing data in a memory, such as but not limited to a flash memory array. In accordance with some embodiments, a soft erasure is performed on a block of memory cells by toggling an erasure status value without otherwise affecting a written state of the cells in the block. The memory cells are subsequently overwritten with a set of data using a write polarity direction determined responsive to the toggled erasure status value.

Abstract: The present invention discloses a small-grain three-dimensional memory (3D-MSG). Each of its memory cells comprises a thin-film diode with critical dimension no larger than 40 nm. The thin-film diode comprises at least a small-grain material, whose grain size G is substantially smaller than the diode size D. The small-grain material is preferably a nano-crystalline material or an amorphous material. The critical dimension f of the small-grain diode is smaller than the critical dimension F of the single-crystalline transistor.

Abstract: A semiconductor memory device is operated by forming channels in a cell string including a plurality of memory cells and coupled between a bit line and a source line, applying first and second erase voltages having different levels to the channels through the bit line and the source line, respectively, and applying a first word line voltage to at least one word line among word lines coupled to the plurality of memory cells.

Abstract: A Flash memory controller is coupled to a first Flash memory package through a first Flash memory interface and to a second Flash memory package through the first Flash memory interface. The Flash memory controller is designed to receive a first instruction relating to the first Flash memory package and to perform a first process depending on the first instruction. The Flash memory controller is further designed to receive a second instruction relating to the second Flash memory package and to perform a second process depending on the second instruction. The Flash memory controller is further adapted for splitting the first process into at least two first sub-steps and for splitting the second process into at least two second sub-steps. The Flash memory controller is further adapted for executing the first and second sub-steps, and for interleaving execution of first and second sub-steps.

Abstract: A Multi Level Cell (MLC) nonvolatile memory is tested and, if it fails to meet an MLC specification, is reconfigured for operation as an SLC memory by assigning two of the MLC memory cell states as SLC states in a first SLC mode, according to predefined sets of criteria. Subsequently, different MLC memory cell states are assigned as SLC states in a second SLC mode.

Abstract: A method is performed in a data storage device that includes a controller coupled to a non-volatile memory. The non-volatile memory includes a group of storage elements. Each storage element is configured to store multiple data bits. Data is sent from the controller to the non-volatile memory and first bits corresponding to a first portion of the data are stored into the group of storage elements during a first write stage. Each storage element of the group of storage elements stores at least one bit of the first bits upon completion of the first write stage. Second bits corresponding to a second portion of the data are sent to a second memory without sending the first bits to the second memory. The second bits are retrieved from the second memory and at least the second bits are stored into the group of storage elements during a second write stage.

Abstract: Innovative Non-Volatile Look-Up-Table (NV-LUT) has been constructed by Single Gate Logic Non-Volatile Memory (SGLNVM) devices processed with the standard CMOS logic process. One of a pair of complementary SGLNVM devices is always programmed to the high threshold voltage state and the other remains in the low threshold voltage state. By applying digital voltage rail (VDD and VSS) to the input nodes of the pair of complementary SGLNVM devices, the output node of the pair of complementary SGLNVM devices outputs digital signals according to its configuration. The NV-LUT outputs digital signals from a plurality of pairs of complementary SGLNVM devices through a digital switching multiplexer. The NV-LUT is a good substitution for SRAM based LUT commonly used in Field Programmable Gate Array (FPGA).

Abstract: Embodiments of decoding data stored in solid-state memory arrays are disclosed. In one embodiment, multiple read operations are performed while taking inter-cell interference (ICI) into account. Soft-decision information, such as log-likelihood ratios (LLRs), is determined by using known data and its corresponding multi-read output. Soft-decision information is provided to a detector. Reliability is improved and performance is increased.

Abstract: In an operating method for a nonvolatile memory device, first random data is sensed from a source area of the memory cell array, the first random data having been generated using first random sequence data. While sensing the first random data, third random sequence data is loaded to a page buffer circuit, the third random sequence data being generated from the first random sequence data and second random sequence data. A logical operation is performed on the sensed first random data and the third random sequence data in the page buffer circuit to generate second random data, and the second random data is programmed to a target area in the memory cell array different from the source area.

Abstract: Aspects of the invention provide for masking a current profile of a one-time programmable (OTP) memory. In one embodiment, a circuit includes: a first one-time programmable (OTP) memory configured to receive a data input for a plurality of address fields; and a second OTP memory configured to receive an inverse of the data input for a plurality of address fields, wherein a current profile for a programming supply for the first OTP memory and the second OTP memory is masked, such that the data input for the first OTP memory is undetectable.

Abstract: Writing data to a thermally sensitive memory device, including: receiving a physical layout of the thermally sensitive memory device; receiving the direction of airflow across the thermally sensitive memory device; selecting an address for writing data to the thermally sensitive memory device in dependence upon the physical layout of the thermally sensitive memory device and the direction of airflow across the thermally sensitive memory device; and writing data to the selected address of the thermally sensitive memory device.

Abstract: A memory controller includes a clock detector and a microprocessor. The clock detector is utilized for detecting if a specific pin of the memory controller has a clock signal thereon to generate a detecting result. The microprocessor is coupled to the clock generator, and is utilized for determining which type of memory devices that the memory controller is applied to according to the detecting result.

Abstract: A non-volatile semiconductor memory device has memory cell arrays, with the memory cells arranged in a matrix configuration and divided into p areas in the column direction, a column redundancy area arranged in a portion of the memory cell array and having redundancy columns that can substitute for defective user data columns, and a column substituting register that holds the column substituting information for substituting the defective user data columns of the selected area with the redundancy columns.

Abstract: A storage system, which comprises multiple memory cells and a storage controller, wherein the storage controller manages cell mode information, which either directly or indirectly denotes the number of bits to be stored in multiple memory cells. The cell mode information can be changed in accordance with a request from a management system.

Abstract: A flash memory management method is provided. According to the method, when a request to write the predetermined data to a page to which data has been written is made, the predetermined data is written to a log block corresponding to a data block containing the page. When a request to write the predetermined data to the page again is received, the predetermined data is written to an empty free page in the log block. Even if the same page is requested to be continuously written to, the management method allows this to be processed in one log block, thereby improving the effectiveness in the use of flash memory resources.