Abstract: A dynamic random access memory (DRAM) is selectively operable in a sleep mode and another mode. The DRAM has data storage cells that are refreshed in the refresh mode. A boosted voltage is provided for the operation of the DRAM. A boosted voltage provider includes a group of charge pump circuits that are selectively activated by a pump control circuit based on a refresh time for refreshing data in the DRAM cells in the sleep mode.

Abstract: A pulsed dynamic LCV circuit for improving write operations for SRAM. The pulsed dynamic LCV circuit includes voltage adjustment circuitry having a plurality of selectable reduced supply voltages and timing adjustment circuitry having a plurality of selectable logical state transition timings for adjustably controlling the voltage and timing of a transition from a selected reduced supply voltage back to a nominal supply voltage. The voltage adjustment circuitry has a plurality of selectable transistors that when individually selected have a cumulative effect to pull the reduced supply voltage down further. The timing adjustment circuitry has a plurality of selectable multiplexers that when individually selected for a delayed voltage transition have a cumulative effect to delay return of voltage supplied to SRAM from a reduced supply voltage to a nominal supply voltage.

Abstract: Disclosed is a memory including a plurality of resistive change memory cells, including at least a first group and a second group of the memory cells and a comparison circuit configured to conduct a direct relative comparison of a remaining endurance of the first group of memory cells to a remaining endurance of the second group of memory cells.

Abstract: The gate tunnel leakage current is increased in the up-to-date process, so that it is necessary to reduce the gate tunnel leakage current in the LSI which is driven by a battery for use in a cellular phone and which needs to be in a standby mode at a low leakage current. In a semiconductor integrated circuit device, the ground source electrode lines of logic and memory circuits are kept at a ground potential in an active mode, and are kept at a voltage higher than the ground potential in an unselected standby mode. The gate tunnel leakage current can be reduced without destroying data.

Abstract: A regulator includes an input voltage adjusting unit configured to adjust a pumping voltage in response to a control signal varied depending on a target voltage and output the adjusted pumping voltage and a regulation unit configured to output the target voltage by regulating the adjusted pumping voltage. The regulator may reduce current consumption by adjusting the pumping voltage inputted according to the target voltage.

Abstract: A proposed inrush control circuit may work in the presence of supply noise. A linear regulator in bypass mode may be designed for inrush current control, but may be susceptible to irregularities from increased supply noise. The circuit may include a splitting of the bypass power MOS that are switched on with some delay during the power on to control the initial power-on inrush current.

Abstract: A semiconductor memory includes a plurality of memory blocks each comprising a plurality of memory cells, and a plurality of charge pumps each located near one of the plurality of memory blocks. In an access to the semiconductor memory, depending on the selected memory block, a subset or all of the plurality of charge pumps are activated in one of a predetermined number of sequences.

Abstract: This document discusses, among other things, methods for controlling a Rail-to-Rail enabling signal, including providing a first signal of an input signal of a control circuit to a level switching circuit, performing, by the level switching circuit, enabling control according to a high level and a low level of the first signal, and outputting, by the level switching circuit, a disabling signal in case of a failure of a power supply coupled to the level switching circuit. The document also discusses a circuit for controlling a Rail-to-Rail enabling signal and a level switching circuit configured to output a disabling signal properly to provide an accurate enabling control signal for equipment operated under control of an enabling control in case of the failure of the power supply.

Abstract: In low power CPUs, the best way to reduce power is to reduce supply voltage. Most low voltage memory arrays use an 8T cell, which has read stability immunity, in order to operate at low voltages. An embodiment of the disclosure determines when a write wordline (WWL) rises. If the determination shows that the WWL has risen, at least one of the plurality of p-channel field effect transistors (pFETS) is disconnected from a voltage supply, and the at least one plurality of n-channel field effect transistors (nFET) passgate transistors are opened.

Abstract: The semiconductor device includes a start signal generation circuit and a boot-up operation circuit. The start signal generation circuit detects a level of an external voltage signal to generate a pre-detection signal; executes a differential amplification operation of a voltage difference between the external voltage signal and a reference voltage signal to generate a first detection signal; detects a level of an internal voltage signal to generate a second detection signal, and generates a start signal in response to the first and second detection signals. The boot-up operation circuit executes a boot-up operation in response to the start signal.

Abstract: This document discusses, among other things, methods for controlling a Rail-to-Rail enabling signal, including providing a first signal of an input signal of a control circuit to a level switching circuit, performing, by the level switching circuit, enabling control according to a high level and a low level of the first signal, and outputting, by the level switching circuit, a disabling signal in case of a failure of a power supply coupled to the level switching circuit. The document also discusses a circuit for controlling a Rail-to-Rail enabling signal and a level switching circuit configured to output a disabling signal properly to provide an accurate enabling control signal for equipment operated under control of an enabling control in case of the failure of the power supply.

Abstract: An integrated circuit includes a voltage regulator to supply a regulated voltage and a data output that couples to an unterminated transmission line. The circuit draws a variable amount of power from the voltage regulator according to the data. The voltage regulator includes a first current generation circuit to provide a data transition-dependent current.

Abstract: A method and apparatus for setting trim parameters in a memory device provides multiple trim settings that are assigned to portions of the memory device according to observed or tested programming speed and reliability.

Abstract: According to one embodiment, a low power direction received from a host device is delayed for a first predetermined time and is output as a first signal, and an internal state is caused to transition to a low power consumption mode that corresponds to the low power direction when a second predetermined time has elapsed after the first signal is asserted.

Abstract: To provide a storage device with low power consumption. The storage device includes a plurality of cache lines. Each of the cache lines includes a data field which stores cache data; a tag which stores address data corresponding the cache data; and a valid bit which stores valid data indicating whether the cache data stored in the data field is valid or invalid. Whether power is supplied to the tag and the data field in each of the cache lines is determined based on the valid data stored in the valid bit.

Abstract: A memory device includes a command decoder and control interface logic. One or more external inputs, such as row and column address strobes, communicate with the command decoder through the control interface logic. A control signal is also in communication with the control interface logic. During operation of a drowsy mode in the memory device, a self-refresh signal causes the control signal to disable the external inputs. With the external inputs disabled, command hazards are reduced when exiting drowsy mode.

Abstract: The semiconductor memory device includes a cell capacitor having a first terminal electrically connected to a storage node and a second terminal electrically connected to an internal node, an internal voltage generator configured to generate an internal voltage signal applied to the internal node in response to a power-up signal, and an initialization element configured to initialize the internal node in response to the power-up signal.

Abstract: An electronic system, a reduced-noise reference voltage platform for a voltage converter device, and a method of manufacture of a reduced-noise reference voltage platform for a voltage converter device are disclosed. For example, the reduced-noise reference voltage (e.g., ground) platform includes a first conductor unit, a second conductor unit, and an insulator unit interposed between a first surface of the first conductor unit and a first surface of the second conductor unit. The reduced-noise reference voltage platform also includes a phase terminal connected to the first conductor unit, and a reference voltage (e.g., ground) terminal connected to the second conductor unit, wherein a second surface of the second conductor unit forms a platform coupled to the reference voltage (e.g., ground).

Abstract: Method and system are provided for handling data when power failure from a primary power source of a storage system is detected. The system provides a first memory and a second memory. The first memory is primarily used to store data when the primary power source is operating. If a power failure is detected, a first indicator is set to indicate that data is stored or being transferred to the second memory. Thereafter, data is transferred from the first memory to the second memory. Any errors during the transfer are logged. Once power is restored, data is transferred back to the first memory. A second indicator is set to indicate that there is no data at the second memory.

Abstract: A booster circuit is configured, such that: in response to a reading request for reading data from a flash memory, when a voltage of an output terminal detected by a voltage detection circuit is not higher than a voltage, an oscillator outputs a control clock signal of predetermined on time and off time to a transistor of a boost converter to perform switching control of the transistor; and when the voltage detection circuit detects that the voltage of the output terminal reaches a voltage, an oscillator outputs a control clock signal of an on time and an off time input from a selection circuit to a transistor of a boost converter to perform switching control of the transistor.

Abstract: A normally-off state of an OS transistor is maintained or an on-state current thereof is increased without additionally generating a positive potential or a negative potential. When data is written to a node connecting an OS transistor and a capacitor, a potential supplied to the other side of the capacitor is set to an L level, and when the data is retained, the potential is switched from the L level to an H level. In addition, a power switch for a volatile memory circuit is provided on a low power supply potential side so that the supply of a power supply voltage can be stopped. Accordingly, at the time of data retention, a source and a drain of the OS transistor can be set at a high potential, whereby the normally-off state can be maintained and the on-state current can be increased.

Abstract: Charge pump circuit and memory are provided. The charge pump circuit includes a clock driving unit, a voltage boosting unit, a boosting swing control unit, a first and second NMOS tubes, a first and second current mirror units. The clock driving unit is adapted to form and output clock driving signals to the voltage boosting unit. The voltage boosting unit is adapted to boost voltage and output it to the boosting swing control unit and the first current minor unit. The boosting swing control unit is adapted to output boosting swing control signals to the first NMOS tube. The first current minor unit is to output first mirror current and the second current minor unit is to minor the first mirror current and output second minor current. Frequency of the clock driving signal varies with leakage current load, and size of the charge pump circuit and power consumption are reduced.

Abstract: A semiconductor device includes an internal circuit, a power supply control circuit which controls supply of a power supply to the internal circuit upon receipt of a first control signal, and a control signal generation circuit which outputs the first control signal upon receipt of a second control signal. The control signal generation circuit does not deactivate the first control signal when an inactive period of the second control signal is equal to or less than a first period and deactivates the first control signal when the inactive period of the second control signal is more than the first period.

Abstract: According to one embodiment, a semiconductor storage device includes a nonvolatile memory, memory controller storing control information, a switch between the nonvolatile memory/memory controller and a power supply terminal, a second memory, an interpreter interprets a command, a switch controller, and a third memory stores an address of the control information in the second memory. The memory controller instructs the switch controller to open the switch after writing the control information into the second memory and reads the control information from the second memory based on the address stored in the third memory when the memory controller is electrically connected to the first power supply terminal.

Abstract: A voltage regulator includes: a comparator configured to compare a feedback voltage with a reference voltage to output an enable signal and operate based on a bias current; a pass transistor turned on according to the enable signal and configured to output an external power voltage as an output voltage; a voltage distribution circuit configured to distribute and output the output voltage to an input terminal of the comparator; and a bias current control unit configured to control an amount of the bias current supplied to the comparator based on the output voltage.

Abstract: An object is to increase the retention characteristics of a memory device formed using a wide bandgap semiconductor. A bit line controlling transistor is inserted in a bit line in series. The minimum potential of a gate of the transistor is set to a sufficiently negative value. The gate of the transistor is connected to a bit line controlling circuit connected to a battery. The minimum potential of the bit line is set higher than that of a word line. When power from an external power supply is interrupted, the bit line is cut off by the transistor, ensuring prevention of outflow of charge in the bit line. The potential of a source or a drain (bit line) of a cell transistor is sufficiently higher than that of a gate of the cell transistor, resulting in an absolute off-state; thus, data can be retained. Other embodiments are disclosed.

Abstract: A first transistor is turned on based on a first control signal provided to a first terminal of the first transistor. A second control signal is generated by a logic device based on a first input signal and a second input signal. The first input signal is controlled by a logical value stored by a keeper circuit and based on the first control signal, and the second input signal is generated by inverting the first control signal. A second transistor is turned on based on the second control signal provided to a first terminal of the second transistor. A second terminal of the first transistor is coupled with a second terminal of the second transistor.

Abstract: Programming a resistive memory structure at a temperature well above the operating temperature can create a defect distribution with higher stability, leading to a potential improvement of the retention time. The programming temperature can be up to 100 C above the operating temperature. The memory chip can include embedded heaters in the chip package, allowing for heating the memory cells before the programming operations.

Abstract: A data transmission circuit includes: a driving voltage generation unit configured to generate a driving voltage having a lower level than an external driving voltage; a switch unit configured to transmit the driving voltage when any one of a write enable signal and a read enable signal is enabled; and a data transmission unit configured to be driven by receiving the driving voltage, transmit a signal of a DQ pad as data in response to the write enable signal, and transmit the data to the DQ pad in response to the read enable signal.

Abstract: A semiconductor memory apparatus includes an enable signal generation unit configured to be inputted with a plurality of clocks which have different phases, and generate a plurality of enable signals; and a plurality of sampling units configured to output input data as sampling data in response to respective pairs of clocks of the plurality of clocks and respective ones of the plurality of enable signals.

Abstract: An apparatus, such as a nonvolatile solid-state memory device, may, in some implementations, include access line bias circuitry to set a bias level associated with a deselected access line(s) of a memory core in response to mode information. In one approach, access line bias circuitry may use linear down regulation to change a voltage level on deselected access lines of a memory core. A memory access device, such as a host processor, may be provided that is capable of dynamically setting a mode of operation of a memory core of a memory device in order to manage power consumption of the memory. Other apparatuses and methods are also provided.

Abstract: Various integrated circuits and methods of operating the integrated circuits are disclosed. The integrated circuit may include a circuit having one or more electrical parameters resulting from process variations during the manufacture of the integrated circuit, and a voltage source configured to supply a voltage to the circuit to power the circuit, wherein the voltage source is further configured to adjust the voltage as a function of the one or more electrical parameters.

Abstract: A refresh method for DRAM is provided, in which a memory cell array is arranged to have multiple storing pages. Each storing page has a counter value. The method includes detecting out a portion of the storing pages being no longer used, indicated as a “no-use portion”, and another portion of the storing pages being still in use, indicated as “in-use portion”. Then, only the in-use portion of the storing pages is performed with a refreshing operation.

Abstract: An internal voltage generation circuit includes: a selection unit configured to select one of first and second reference voltages as a selection reference voltage in response to a self refresh signal and a power-down mode signal and output the selection reference voltage; a driving signal generation unit configured to compare the selection reference voltage with a negative word line voltage applied to an unselected word line and generate a driving signal; and a driving unit configured to change the negative word line voltage in response to the driving signal.

Abstract: In some examples, a memory device includes multiple memory banks equipped with an isolation switch and dedicated power supply pins. The isolation switch of each memory bank is configured to isolate the memory bank from global signals. The dedicated power supply pins are configured to connect each of the memory banks to a dedicated local power supply pads on the package substrate to provide local dedicated power supplies to each of the memory banks and to reduce voltage transfer between memory banks over conductors on the device, the device substrate, or the package substrate of the memory device.

Abstract: A device comprises a non-volatile memory array, a first selection circuit selecting whether to make a first connection path between a first bit line and a first circuit node, and selecting whether to make a second connection path between the first bit line and a second circuit node, a power supplying circuit supplying a power supply voltage to the first circuit node, the power supply voltage being, when the first connection path is selected to be made, supplied to the first bit line, and a first voltage supplying circuit supplying a first voltage to the second circuit node, the first voltage being, when the second connection path is selected to be made, supplied to the first bit line, the first voltage and the power supply voltage being higher than a ground potential, and the first voltage being higher than the power supply voltage.

Abstract: A circuit for an integrated circuit power gating system includes a header device connected to a bank of a segmented memory array. The circuit is structured and arranged to: apply a ground input to a gate of the header device to activate the bank, and apply a regulated voltage to the gate of the header device to deactivate the bank.

Abstract: An arithmetic processing unit including an SRAM with low power consumption and performing backup and recovery operation with no burden on circuits. One embodiment is a memory device including a plurality of memory cells. The memory cells include inverters in which capacitors for backing up data are provided. When data of all the memory cells in a region is not rewritten after data is returned from the capacitors to the inverters, data in the region is not transferred from the inverters to the capacitors and the inverters are turned off. When data of at least one of the memory cells in the region is rewritten, data in the region is transferred from the inverters to the capacitors and then power of the inverters are turned off. In this manner, backup is selectively performed to reduce power consumption. Other embodiments are described and claimed.

Abstract: A user system is provided which includes a storage device and an auxiliary power device configured to supply a power to the storage device, wherein the auxiliary power device includes a first one direction device configured to supply a supply voltage from an external power supply to the storage device, a charging unit configured to be charged by the external power supply, a second one direction device configured to selectively supply an output voltage of the charging unit to the storage device, a voltage detector configured to detect a level of the output voltage of the charging unit and to output a first control signal to the storage device, and a switching unit connected between the charging unit and the second one direction device and configured to operate in response to a second control signal from the storage device.

Abstract: A flash memory device. In one embodiment, the flash memory device includes a flash memory, a diode, a controller, and a capacitor. The flash memory has a voltage source pin. The diode is coupled between a voltage source and the voltage source pin of the flash memory. The controller is coupled to the flash memory via a data bus. The capacitor is coupled between the voltage source pin of the flash memory and a ground, and supplies power to the flash memory to enable the flash memory to complete writing of at least one data page when the level of the voltage source is lowered.

Abstract: Implementations of the present disclosure involve a circuit and/or method for providing a static random access memory (SRAM) component of a very large scale integration (VLSI) design, such as a microprocessor design. In particular, the present disclosure provides for an SRAM circuit that includes a step voltage regulator coupled to the SRAM circuit and designed to maintain a fixed-value voltage drop across the regulator rather than a fixed voltage across the load of the SRAM circuit. The fixed-value drop across the regulator allows the SRAM circuit to be operated at a low retention voltage to reduce leakage of the SRAM circuit while maintaining the parasitic decoupling capacitance across the power supply from the SRAM circuit to reduce power signal fluctuations. In addition, the regulator circuit coupled to the SRAM circuit may include a switch circuit to control the various states of the SRAM circuit.

Abstract: A memory device includes a memory array having a plurality of memory cells each having first and second power supply nodes, first and second virtual power supply nodes, a latch circuit, and a write assist circuit. The latch circuit includes a first and second inverters in a cross-coupled inverter configuration. The first inverter is connected between the first virtual power supply node and the second power supply node, and the second inverter is connected between the second virtual power supply node and the second power supply node.

Abstract: In a memory cell including an inverter, a capacitor is provided. When the memory cell is not accessed, data stored in the memory cell is copied to the capacitor and then power supply to the inverter is stopped. When the memory cell needs to be accessed, the data is returned from the capacitor to the inverter. In this manner, power consumption when the memory cell is not accessed is reduced. Furthermore, in a memory device including a plurality of such memory cells, backup of the first memory cell and backup of the second memory cell are performed at different timings. Recovery of the first memory cell and recovery of the second memory cell are also performed at different timings. Consequently, power required for backup or recovery can be distributed. Other embodiments may be described and claimed.

Abstract: A memory apparatus includes an array of bit cells arranged in rows and columns, multiple pairs of complementary bit lines, multiple power lines, and multiple voltage control circuits. Each column of the array is selectable by a corresponding pair of complementary bit lines. Each power line is coupled to the bit cells in a corresponding column. The voltage control circuits are coupled to respective columns of the array. Each voltage control circuit is configured to set a voltage level of a respective one of the power lines responsive to logic levels of the pair of complementary bit lines corresponding to the respective column.

Abstract: A flash memory device. In one embodiment, the flash memory device includes a flash memory, a diode, a controller, and a capacitor. The flash memory has a voltage source pin. The diode is coupled between a voltage source and the voltage source pin of the flash memory. The controller is coupled to the flash memory via a data bus. The capacitor is coupled between the voltage source pin of the flash memory and a ground, and supplies power to the flash memory to enable the flash memory to complete writing of at least one data page when the level of the voltage source is lowered.

Abstract: A nonvolatile memory device includes a discharge circuit configured to selectively connect circuit nodes to discharge terminals through corresponding discharge paths, and an accumulation device for accumulating electric charge. A driving circuit is for driving the discharge circuit in such a way to connect at least a part of such circuit nodes to the discharge terminals if the value of the external supply voltage falls below a corresponding threshold. A supply circuit is for supplying the driving circuit with an intermediate supply voltage. Each one of the intermediate supply voltages is the corresponding external supply voltage when the value of the external supply voltage is higher than the corresponding threshold, or it is an internal voltage locally generated by the supply circuit by exploiting the electric charge stored by the accumulation device when the value of the external supply voltage is lower than the corresponding threshold.

Abstract: A host device includes a voltage source which is connected to a voltage line via a host voltage switch and which supplies a first voltage to the voltage line, a host regulator which is connected to the voltage line and which outputs the first voltage or a second voltage that is lower than the first voltage, a host IO driver for driving a data line with the output of the host regulator as a power source, a host voltage detection circuit for detecting whether the voltage of the data line is the second voltage or a voltage that is higher than the second voltage, and a host control unit for detecting a mismatch of interface voltages between the host device and a memory card based on the output voltage of the host regulator and the detection result of the host voltage detection circuit.

Abstract: According to some embodiments, an electronic circuit comprises a digital output which is held to a logic one after the power supply was removed, for a time duration in a narrow range. The electronic circuit comprises a first array of elements comprising capacitors and discharging devices (diodes or transistors). A time constant detector detects which elements has the discharging time closest to the target. A second array of elements also comprises capacitors and discharging devices, with discharging durations proportional to the discharging durations of the first array. A decoder charges the appropriate element from the second array. After the power is removed, this charged element starts to discharge. During the discharge duration, a comparator outputs a logic one, and a logic zero after the discharge is completed.

Abstract: Disclosed are methods, circuits, apparatuses and systems for providing power to a dynamic load such as a non-volatile memory array. According to embodiments, a voltage source may be adapted to generate and output a supply current at substantially a target voltage through a regulating transistor whose channel is in series between an output terminal of said charge pump and an input terminal of said NVM array. A discharge circuit branch coupled to an output terminal of the regulating transistor may be adapted to drain away current from the regulating transistor output terminal when a voltage at the regulating transistor output terminal exceeds a first defined threshold voltage. A bulk regulating circuit branch coupled to a bulk of the regulating transistor may be adapted to reduce a bulk-voltage of the regulating transistor when a voltage at the regulating transistor output terminal exceeds a defined threshold voltage.

Abstract: A system on chip includes an SRAM. The SRAM includes at least one memory cell and a peripheral circuit accessing the at least memory cell. A first power circuit is configured to supply a first driving voltage to the at least one memory cell. A second power circuit is configured to supply a second driving voltage to the peripheral circuit. The SRAM further includes an auto power switch that selects the higher of the first driving voltage and the second driving voltage and supplies the selected voltage to the at least one memory cell.