Abstract: The present invention discloses a power supply. The power supply may comprise an input power terminal, a capacitor module, a first converter module and a second converter module. The first converter module may have a first terminal and a second terminal, wherein the first terminal is coupled to the input power terminal and the second terminal is coupled to the capacitor module. The second converter module may comprise an input and an output, wherein the input of the second converter module is coupled to the input power terminal, and the output of the second converter module is configured to supply a load.

Abstract: A heterogeneous cache structure provides several memory cells into different ways each associated with different minimum voltages below which the memory cells produce substantial state errors. Reduced voltage operation of the cache may be accompanied by deactivating different ways according to the voltage reduction. The differentiation between the memory cells in the ways may be implemented by devoting different amounts of integrated circuit area to each memory cell either by changing the size of the transistors comprising the memory cell or devoting additional transistors to each memory cell in the form of shared error correcting codes or backup memory cells.

Abstract: Provided is a semiconductor integrated device including a semiconductor memory circuit and a peripheral circuit of the semiconductor memory circuit. The peripheral circuit includes a first transistor having a first voltage as a breakdown voltage of a gate oxide film. The semiconductor memory circuit includes a pair of bit lines, one of the pair of bit lines being connected to a gate transistor of a memory cell, and a precharge circuit that includes a transistor having a breakdown voltage substantially equal to that of the first transistor, and precharges the pair of bit lines to a predetermined voltage in response to an activation signal. The activation signal of the precharge circuit is a second voltage higher than the first voltage.

Abstract: The invention relates to an electronic memory system, and more specifically, to a system for providing voltage supply protection in a memory device, and a method for providing voltage supply protection in a memory device. According to an embodiment, a system for providing voltage supply protection in a memory device is provided, the system including a memory array including a plurality of memory cells arranged in a plurality of groups of memory cells, and a plurality of current limiting elements, wherein each group of memory cells is associated with at least one current limiting element.

Abstract: Embodiments of the invention are directed to systems and methods for adaptively boosting the supply voltage to an SRAM (Static Random Access Memory) in response to process-voltage-temperature variations when needed. Embodiments include a critical path that simulates a typical memory cell and read-out circuit in the SRAM. Applying a trigger signal to a word-line input port of the critical path, and comparing the output of the critical path to a reference-latch signal, provides an indication of when to boost the supply voltage to the read-out circuits of the SRAM.

Abstract: A circuit for controlling leakage current in random access memory devices comprises a pre-charge equalization circuit. The pre-charge equalization circuit provides a pre-charge voltage to a pair of complementary bit lines of a memory cell of a random access memory device in accordance with a pre-charge signal. When the memory cell is in a self-refresh mode, the pre-charge signal is activated by a periodically triggered pre-charge request and also activated before and after the memory cell is self-refreshed.

Abstract: Memory devices and methods are provided for reducing simultaneous switching output noise and power supply noise during burst data write and refresh operations. An embodiment of a memory device according to the present invention includes a first power domain coupled to some of the components of the memory device and a second power domain coupled to different components of the memory device. One or more distributed power domain coupling circuits may be coupled to the first and second power domains. The power domain coupling circuit includes a controller configured to generate an enable signal responsive to control signals, data signals, or any combination thereof. The power domain coupling circuit also includes coupling circuitry coupled to the first and second power domains and coupled to the controller. The coupling circuitry is configured to couple the first and second power domains together responsive to the enable signal.

Abstract: An integrated circuit having a logic element that includes an array of storage elements convertibly functioning as either a configuration random access memory (CRAM) or a static random access memory (SRAM) is provided. The logic element includes first and second pairs of data paths having dedicated multiplexers. In one embodiment, the first and second pairs of data paths are multiplexed into bit lines of a row of the array. The logic element also includes a data path control block generating control signals for each of the dedicated multiplexers. The control signals determine whether the storage elements function as a CRAM or a SRAM. A method for selectively configuring a memory array between a CRAM mode and SRAM mode are provided.

Abstract: A device includes a backup power supply configured to provide power to an external system upon loss of primary system power, the backup power provided by at least one capacitor; logic to create, while the capacitor is available as the backup power supply to the external system, a transient elevation of the capacitor's stored potential above a upper predetermined operating potential of the capacitor; logic to obtain measurements of the capacitor's output voltage during the transient elevation of the capacitor's stored potential; and logic to determine a capacitance of the capacitor from the measurements; the device comprising multiple capacitors in series; logic to discharge each capacitor in series individually from the others; and logic to monitor for overcharging of any of the capacitors in series, and, during charging of the capacitors in series, to operate the discharge logic for any capacitor in the series that is in danger of overcharging.

Abstract: A power supply voltage for a memory chip is compared with a plurality of threshold voltages that correspond to voltages below which classes of memory operations can no longer be guaranteed. When the power supply voltage drops below a threshold voltage, appropriate action is taken, which may include generating an indicator such as a flag, proceeding with the operations in some modified manner, or disabling operations that are no longer guaranteed, either permanently or until power is restored, or until some other appropriate time.

Abstract: A system for preventing data remanence in memory is provided. The system includes a computing device, a memory chip coupled to the computing device and including memory, and a heater, the heater configured to prevent data remanence in a memory by providing heat to at least a portion of the memory. The memory includes a plurality of bits configured to electronically store data.

Abstract: A memory circuit includes a transistor having a channel in an oxide semiconductor layer, a capacitor, a first arithmetic circuit, a second arithmetic circuit, a third arithmetic circuit, and a switch. An output terminal of the first arithmetic circuit is electrically connected to an input terminal of the second arithmetic circuit. The input terminal of the second arithmetic circuit is electrically connected to an output terminal of the third arithmetic circuit via the switch. An output terminal of the second arithmetic circuit is electrically connected to an input terminal of the first arithmetic circuit. An input terminal of the first arithmetic circuit is electrically connected to one of a source and a drain of the transistor. The other of the source and the drain of the transistor is electrically connected to one of a pair of electrodes of the capacitor and to an input terminal of the third arithmetic circuit.

Abstract: A semiconductor device includes a memory core with a plurality of memory cells, an internal voltage generator and a low power entry circuit. The low power entry circuit receives a plurality of control signals which are provided to a command decoder, and generates a low power signal indicating a low power consumption mode where a refresh operation is prohibited. The internal voltage generator includes a detector and at least one of booster circuits. The internal voltage generator, coupled to the memory core via an internal power supply line, generates a boosted internal voltage based on an external voltage and supplies the boosted internal voltage to the memory core via the internal power supply line. The internal voltage generator stops supplying the boosted internal voltage to the internal power supply line in response to the low power signal while the external voltage is supplied to the semiconductor device.

Abstract: Embodiments of the invention relate to a state-monitoring memory element. The state-monitoring memory element may have a reduced ability to retain a logic state than other regular memory elements on an IC. Thus, if the state-monitoring memory elements fails or loses state during testing, it may be a good indicator that the IC's state retention may be in jeopardy, possibly requiring the IC to be reset. The state-monitoring memory element may be implemented by degrading an input voltage supply to the state-monitoring memory element across a diode and/or a transistor. One or more current sources may be used to stress the state-monitoring memory element. A logic analyzer may be used to analyze the integrity of the state-monitoring memory element and trigger appropriate actions in the IC, e.g., reset, halt, remove power, interrupt, responsive to detecting a failure in the state-monitoring memory element.

Abstract: A voltage down converter (VDC) applicable to high-speed memory devices. The VDC includes a steady driver and active driver along with at least one additional transistor. The steady driver and active driver are coupled by a transistor switch during device start-up to provide fast ramp-up to operating voltage and current. After start-up, the steady driver and active drive function to maintain a steady operating voltage and current. An additional transistor is digitally controlled to drive up operating voltage and current upon issuance of an active command representing read, write, and/or refresh of memory. In this manner, the additional transistor provides fast compensation for fluctuations in operating voltage and current brought on by activity in the memory array.

Abstract: There is provided a technique for ensuring both an SNM and a write margin simultaneously in a semiconductor device having static memory cells. A semiconductor device has a plurality of static memory cells. The semiconductor device includes a memory cell array having the static memory cells arranged in a matrix, a temperature sensor circuit for sensing a temperature in the semiconductor device, and a word driver for controlling a voltage supplied to a word line of the memory cell array based on an output of the temperature sensor circuit at the time of writing to or reading from a memory cell.

Abstract: A memory device includes memory cells, each of the memory cells having corresponding bit and word lines connected thereto for accessing the memory cells, a word line circuit coupled with at least one word line, and a bit line circuit coupled with at least one bit line. The memory device further includes at least one control circuit coupled with the bit and word line circuits. The control circuit is operative to cause state information to be stored in the memory cells. At least one switching element selectively connects the memory cells, the bit and word line circuits, and the control circuit to at least one power supply as a function of at least one control signal. The control circuit generates the control signal for disconnecting at least portions of the word line and bit line circuits from the power supply while state information is retained in the memory cells.

Abstract: An apparatus for securely protecting data in a flash memory upon power off is disclosed. In the apparatus, a power detector monitors a voltage output from a power supply unit, and outputs a power fail signal when the voltage drops by a predetermined reference voltage or more. A Programmable Logic Device (PLD) outputs a Write Protect (WP) signal for performing write protection on the flash memory upon receiving the power fail signal from the power detector. A WP controller outputs the WP signal output from the PLD to the flash memory, according to a Ready/Busy (R/B) state of the flash memory.

Abstract: A data saving period control circuit; a power gating control circuit; and a data processing circuit including a general-purpose register, an error correction code storage register, and an error correction code circuit are included. The general-purpose register and the error correction code storage register each include a volatile memory unit and a nonvolatile memory unit. The data saving period control circuit is a circuit for changing a length of a data saving period in which data output from the power gating control circuit is saved from the volatile memory unit to the nonvolatile memory unit included in the general-purpose register, depending on whether an error in an error correction code stored in the error correction code storage register is detected by the error correction code circuit.

Abstract: A semiconductor device capable of simply performing power gating and a driving method thereof are provided. Power gating is started passively (automatically in the case of satisfying predetermined conditions). Specifically, the semiconductor device includes a transistor for selecting whether a power source voltage is supplied or not to a functional circuit. The power gating is started by turning off the transistor in the case where a voltage between a source and a drain is less than or equal to a predetermined voltage. Therefore, complicated operation is not needed at the time of starting power gating. Specifically, it is possible to start power gating without a process for predicting the timing at which an arithmetic operation performed in the functional circuit is terminated. As a result, it is possible to start power gating easily.

Abstract: A power supply voltage for a memory chip is compared with a plurality of threshold voltages that correspond to voltages below which classes of memory operations can no longer be guaranteed. When the power supply voltage drops below a threshold voltage, appropriate action is taken, which may include generating an indicator such as a flag, proceeding with the operations in some modified manner, or disabling operations that are no longer guaranteed, either permanently or until power is restored, or until some other appropriate time.

Abstract: A serial advanced technology attachment dual in-line memory module device includes a power circuit, a storage chip, a control chip connected to the storage chip, and a detecting chip storing a preset voltage. The detecting chip includes a detecting pin connected to a power circuit through a first resistor and grounded through a second resistor, a ground pin grounded, a voltage pin connected to the power circuit, the control chip, and the storage chip, and an output pin connected to the storage chip. The detecting chip compares an output voltage of the power circuit detected by the detecting pin with the preset voltage, to output a control signal through the output pin to the control chip in response to the detected voltage being less than the preset voltage, to signal the control chip to control the storage chip to store data.

Abstract: It is an object to provide a semiconductor device with a novel structure in which stored data can be held even when power is not supplied, and does not have a limitation on the number of writing operations. A semiconductor device includes a plurality of memory cells each including a transistor including a first semiconductor material, a transistor including a second semiconductor material that is different from the first semiconductor material, and a capacitor, and a potential switching circuit having a function of supplying a power supply potential to a source line in a writing period. Thus, power consumption of the semiconductor device can be sufficiently suppressed.

Abstract: Semiconductor memory having both volatile and non-volatile modes and methods of operation.

Abstract: A mechanism is presented memory circuits, such a NAND-type flash memories, to autonomously protect themselves from temporary and short power drops. A detection mechanism looks for the supply voltage to drop below a function voltage for a period of time. When such an event occurs, a suspend mechanism is activated, and after completing the last micro-operation (such as a program pulse) the memory freezes. When power is again stable at an operational level, the suspended operation is resumed. The memory controller can then be notified upon occurrence of such voltage drop by polling a special status bit. Examples of how the pausing can be implemented include altering of clock signals and suspending sub-phases of larger operations.

Abstract: Disclosed is a non-volatile memory data protecting device and method. The non-volatile memory data protecting device that is used for protecting non-volatile memory data when a power is shut down in a system, may include a signal delay unit to delay a drop in voltage of an input/output line, a power shutdown sensor to sense power shutdown of a system, and a controller to control the signal delay unit in response to whether the system is shut down.

Abstract: Voltage generators may generate a level of a high target voltage with respect to a low external power supply voltage. A reference voltage generator includes a clamp regulator which is driven by a first power supply voltage supplied from an external source and receives a first voltage to generate a clamp voltage, and a level amplifier which is driven by a second power supply voltage that is higher than the first power supply voltage and receives the clamp voltage to generate a reference voltage. The clamp voltage may be set to have a voltage level which results in a successful restore operation with respect to a memory cell array in a dynamic random access memory (DRAM).

Abstract: Embodiments for selecting regions of memory are described. For example, in one embodiment a memory device having an array of memory cells includes an array selection block. The array selection block receives an input signal indicative of a region in the array of memory cells. The array selection block generates a selection signal to map the region to at least one physical location in the array of memory cells, based on the detection of the number of defects in that location.

Abstract: According to an embodiment, a semiconductor device includes a power supply switch and a first regulator. One end of the power supply switch is connected to an input terminal. The other end of the power supply switch is connected to an output terminal. The first regulator includes a power supply terminal connected to the one end of the power supply switch, and a voltage output terminal connected to the other end of the power supply switch. The first regulator is configured to control a voltage of the voltage output terminal to approach a target voltage based on a voltage of the power supply terminal. The target voltage is switched to a first voltage or a second voltage. The first voltage is equal to or more than the voltage of the power supply terminal. The second voltage is lower than the voltage of the power supply terminal.

Abstract: A system for providing write-protection functionality to a memory device includes: a memory device including configurable registers controlling write and erase operations in the memory device; a system interface; a filter logic device in electrical communication with the memory device and further in communication with the system interface; and a power on reset circuit in communication with the system interface and the filter logic device, wherein the power on reset circuit asserts a reset signal to the system interface on startup of the system, further wherein, while the reset signal is asserted to the system interface, the filter logic device modifies the configurable registers to prevent all further write and erase operations to the memory device and then the power on reset circuit de-asserts the reset signal to the system interface enabling communication between the system interface and the memory device.

Abstract: An embodiment includes configuring a current-limiting device to place along a power-supply bus to limit current through a first complimentary-metal-oxide semiconductor (CMOS) circuit coupled to the power-supply bus so that current does not exceed a trigger current level of a pnpn diode in a second CMOS circuit coupled to the power bus.

Abstract: Provided is a semiconductor integrated device including a semiconductor memory circuit and a peripheral circuit of the semiconductor memory circuit. The peripheral circuit includes a first transistor having a first voltage as a breakdown voltage of a gate oxide film. The semiconductor memory circuit includes a pair of bit lines, one of the pair of bit lines being connected to a gate transistor of a memory cell, and a precharge circuit that includes a transistor having a breakdown voltage substantially equal to that of the first transistor, and precharges the pair of bit lines to a predetermined voltage in response to an activation signal. The activation signal of the precharge circuit is a second voltage higher than the first voltage.

Abstract: The present invention discloses a power supply. The power supply may comprise an input power terminal, a capacitor module, a first converter module and a second converter module. The first converter module may have a first terminal and a second terminal, wherein the first terminal is coupled to the input power terminal and the second terminal is coupled to the capacitor module. The second converter module may comprise an input and an output, wherein the input of the second converter module is coupled to the input power terminal, and the output of the second converter module is configured to supply a load.

Abstract: A memory device is provided comprising: a volatile memory device, a non-volatile memory device, a memory control circuit volatile memory controller coupled to the volatile memory device and non-volatile memory device, and a backup power source. The backup power source may be arranged to temporarily power the volatile memory devices and the memory control circuit upon a loss of power from the external power source. Additionally, a switch may serve to selectively couple: (a) a host memory bus to either the volatile memory device or non-volatile memory device; and (b) the volatile memory device to the non-volatile memory device. Upon reestablishment of power by an external power source from a power loss event, the memory control circuit is configured to restore data from the non-volatile memory device to the volatile memory device prior to a host system, to which the memory device is coupled, completes boot-up.

Abstract: Embodiments of the invention relate to a state-monitoring memory element. The state-monitoring memory element may be implemented by degrading an input voltage supply to the state-monitoring memory element across a diode and/or a transistor. One or more current sources may be used to stress the state-monitoring memory element. A logic analyzer may be used to analyze the integrity of the state-monitoring memory element and trigger appropriate actions in the IC, e.g., reset, halt, remove power, interrupt, responsive to detecting a failure in the state-monitoring memory element. Multiple state-monitoring memory elements may be disturbed in different locations on the IC for better coverage.

Abstract: “A non-volatile memory module includes a volatile memory circuit; an interface to a reference voltage source external to the module providing an external reference voltage to the volatile memory circuit by which the volatile memory circuit and external devices may communicate reliably at high speeds; an internal reference voltage generator; and a control circuit adapted to cause the volatile memory circuit to be decoupled from using the external reference voltage and coupled to using a reference voltage from the internal reference voltage generator upon the non-volatile memory module ceasing to draw power from an external power source.

Abstract: RFID tag ICs employ tunneling-voltage profile calibration during IC manufacturing to determine and store, typically in nonvolatile memory, a tunneling-voltage profile for writing data to the IC's nonvolatile memory. The IC may subsequently read the profile at power-up, prior to writing the memory, or at other times as determined by the IC or by an interrogating reader. By using the stored profile when writing to the nonvolatile memory the IC may reduce nonvolatile memory write time and oxide stress.

Abstract: Disclosed is a non-volatile memory data protecting device and method. The non-volatile memory data protecting device (200) that is used for protecting non-volatile memory data when a power is shut down in a system, may include a signal delay unit (230) to delay a drop in voltage of an input/output line, a power shutdown sensor (210) to sense power shutdown of a system, and a controller (220) to control the signal delay unit in response to whether the system is shut down.

Abstract: To provide a plurality of memory banks, each of which is divided into a plurality of segments; a bank address register that designates a memory bank that becomes a refresh target; a segment address register that designates a segment that becomes a refresh target; and a refresh control circuit that prohibits a refresh operation of the memory bank or the segment not designated by at least one of the bank address register and the segment address register. This semiconductor device is capable of designating whether to perform a refresh operation not only in a memory bank unit but also in a segment unit within the memory bank, and thus it achieves a further reduction of the power consumption.

Abstract: This disclosure describes techniques for using a non-volatile-memory device such as flash memory to store memory data during hibernation or suspend. By so doing, hard drives and/or data are safer, and less power may be used.

Abstract: A circuit to protect data on an FRAM during a read operation includes an FRAM voltage regulator having an output to supply an FRAM operating voltage to the FRAM. A voltage monitor monitors a supply voltage for the FRAM to generate a voltage fault signal if the supply voltage falls below a predetermined value. And a circuit responsive to the voltage fault signal maintains the FRAM operating voltage above a voltage required to assure data integrity of the FRAM for a sufficient time required to perform an FRAM read operation.

Abstract: A memory array has a memory cell that comprises a storage element storing a logical state at a reduced voltage during at least one functional operation and a write access circuit configured to connect the storage element to at least a first write bit line in response to a write signal on the write word line for writing the logical state to the memory cell. The memory cell further comprises a read access circuit including an input node connected to the storage element and an output node connected to a read bit line of the memory array. The read access circuit is enabled and configured to read the logic state of the storage element in response to a read signal on the read word line. The reduced voltage is reduced relative to an operating voltage of at least one peripheral circuit associated with reading and/or writing of the memory cell.

Abstract: A non-volatile random access memory (NV-RAM) and an operation method thereof are provided. The NV-RAM includes a latch unit, a switch, and a first to fourth non-volatile memory elements. First terminals of the first and the third non-volatile memory elements respectively couple to a first voltage and a second voltage. A second terminal of the first non-volatile memory element and a first terminal of the second non-volatile memory element are coupled to a first terminal of the latch unit. A second terminal of the third non-volatile memory element and a first terminal of the fourth non-volatile memory element are coupled to a second terminal of the latch unit. Second terminals of the second and the fourth non-volatile memory element are coupled to a first terminal of the switch. A second terminal of the switch is coupled to a third voltage.

Abstract: The self-powered detection device comprises a non-volatile memory cell and a sensor activated by a physical or chemical action or phenomenon, this sensor forming an energy harvester transforming energy from the physical or chemical action orphenomenon into an electrical stimulus pulse, the memory cell arranged for storing, by using electrical power of the electrical stimulus pulse, at least a bit of information relative to detection by the sensor of at least a first physical or chemical action or phenomenon. The non-volatile memory cell comprises a FET transistor having a control gate, a first diffusion defining a first input and a second diffusion defining a second input. This FET transistor is set to its written logical state from its initial logical state when, in a detection mode, it receives on a set terminal a voltage stimulus signal resulting from the first physical or chemical action or phenomenon.

Abstract: A non-volatile memory storage apparatus having a connector, an energy storage circuit, a power regulator and supply circuit, a non-volatile memory module, a memory controller and a buffer memory is provided. The power regulator and supply circuit is configured for transforming an output voltage from the energy storage circuit into a first voltage used for the non-volatile memory module and a second voltage used for the memory controller and the buffer memory. The memory controller is configured for writing data stored temporarily in the buffer memory into the non-volatile memory module with a special writing mode when receiving a detecting signal indicating that an input voltage is continuously smaller than a predetermined voltage for a predetermined period or receiving a detecting signal indicating that an inactive status of the connector or receiving a suspend mode signal, a warm reset signal or a hot reset signal from a host system.

Abstract: A memory circuit includes at least one memory array. At least one sleep transistor is electrically coupled between the at least one memory array and a first power line for providing a first power voltage. At least one diode-connected transistor is electrically coupled between the at least one memory array and the first power line. A back-bias circuit is electrically coupled with a bulk of the at least one diode-connected transistor.

Abstract: Embodiments of the invention describe systems, methods, and apparatuses to reduce the instantaneous power necessary to execute a DRAM device initiated self-refresh. Embodiments of the invention describe a DRAM device enabled to stagger self-refreshes between a plurality of banks. Staggering self-refreshes between banks reduces the current required for a DRAM self-refresh, thus reducing the amount of current required by the DRAM device.

Abstract: A storage device includes a volatile memory, an auxiliary power source, a nonvolatile memory, a write module, and an inhibition module. The volatile memory stores user data. The auxiliary power source supplies power to the volatile memory when power from a main power source is cut off. The nonvolatile memory is written with the user data, write incomplete information indicating the user data, and power off information indicating that power from the main power source is cut off. While supplied with power from the auxiliary power source when power from the main power source is cut off, the write module writes the write incomplete information, the user data, and the power off information to the nonvolatile memory. The inhibition module inhibits reading of the user data if the power off information is not written in the nonvolatile memory when the volatile memory is supplied with power.

Abstract: An integrated circuit employing a percolation tamper protection device includes a circuit housing with a die disposed in circuit housing. The die includes a volatile memory. A percolation tamper protection device that is connected to the volatile memory and also disposed in the circuit housing. The percolation tamper protection device includes a percolation gate which is biased in a conductive state. The percolation gate includes a first terminal that is connected to the volatile memory and a second terminal configured to be connected to a power supply. The percolation gate has a conductivity that varies proportional to pressure.

Abstract: A method for refreshing a Dynamic Random Access Memory (DRAM) includes performing a refresh on at least a portion of the DRAM at a first refresh rate, and performing a refresh on a second portion of the DRAM at a second refresh rate. The second portion includes one or more rows of the DRAM which do not meet a data retention criteria at the first refresh rate, and the second refresh rate is greater than the first refresh rate.