Abstract: Semiconductor memory having both volatile and non-volatile modes and methods of operation. A semiconductor memory cell includes a substrate, a floating body to store data in volatile memory and a floating gate or trapping layer configured to receive transfer of data stored by the volatile memory and store the data as nonvolatile memory in the floating gate or trapping layer upon interruption of power to the memory cell.

Abstract: An apparatus, system, and method are disclosed for power reduction management. The method includes determining that a power source has failed to supply electric power above a predefined threshold. The method includes terminating one or more non-essential in-process operations on a nonvolatile memory device during a power hold-up time. The method includes executing one or more essential in-process operations on the nonvolatile memory device within the power hold-up time.

Abstract: A non-volatile memory module includes a volatile memory circuit and a reference voltage generator coupled to supply a reference voltage to the volatile memory circuit. The reference voltage provides a level by which the volatile memory and external devices may communicate reliably at high speeds. The reference voltage is applied to an external interface of the non-volatile memory module through an isolation circuit. A control circuit coupled to the isolation interface and to a circuit which is adapted to detect when the non-volatile memory module no longer draws power from an external source.

Abstract: A device for state retention power gating, the device includes a group of circuits, each circuit is characterized by a reset state, wherein the device is characterized by including: a first memory entity adapted to save during a shut down period of the group circuits, at least one location of at least one non-reset-state circuit of the group of circuits.

Abstract: A SRAM system includes: a SRAM cell array coupled between high and low supply nodes, a difference therebetween defining a data retention voltage (VDR) for a low power data retention mode; a main power switch coupling one of high and low supply nodes to a main power supply and disconnecting the one high and low supply nodes from the main power supply during the low power data retention mode; a monitor cell including a SRAM cell preloaded with a data bit and configured for data destruction responsive to a reduction in VDR before data destruction occurs in the SRAM cell array; and a clamping power switch responsive to data destruction in the monitor cell to couple the one of the high and low supply nodes to the main power supply.

Abstract: An integrated circuit and method includes retention voltage generation circuitry which receives a supply voltage from a supply voltage node and provides a retention voltage. Functional circuitry is connected between the retention voltage node and a reference voltage node and is held in a data retention state when at least a minimum voltage is provided between the retention voltage node and the reference voltage node. Each of the circuits includes at least one p-type threshold device and at least one n-type threshold device, both having a characteristic threshold voltage. The p-type and n-type threshold devices are connected in parallel between the supply voltage node and the retention voltage node. A variation in the characteristic threshold voltage of either of the at least one p-type or the at least one n-type device maintains at least the minimum voltage between the retention voltage node and the reference voltage node.

Abstract: A phase change memory array may include at least one cell used to determine whether the array has been altered by thermal exposure over time. The cell may be the same or different from the other cells. In some embodiments, the cell is only read in response to an event. If, in response to that reading, it is determined that the cell has changed state or resistance, it may deduce whether the change is a result of thermal exposure. Corrective measures may then be taken.

Abstract: An internal voltage generating circuit includes a divided voltage generator configured to generate a divided voltage by dividing a feedback internal voltage level at a division ratio corresponding to an operation mode control signal, a voltage detector configured to detect a level of the divided voltage based on a reference voltage level, an internal voltage generator configured to receive a supply voltage as power source and generate the internal voltage in response to an output signal of the voltage detector, and an under-driving unit configured to under-drive an internal voltage terminal to a supply voltage in an under-driving operation region that is determined in response to the operation mode control signal.

Abstract: A semiconductor memory device includes a memory core; a charge pump circuit providing a high voltage to the memory core; and a charge pump control circuit operating the charge pump circuit by a standby mode and measuring an operation time value of the standby mode. The charge pump control circuit controls the standby mode of the charge pump circuit using the time value.

Abstract: A dynamic memory module is fitted with a tamper detection circuit and a memory clear circuit responsive to a detected tampering signal for clearing the memory. A power retention circuit powers the memory, the tamper detection circuit, and the clearing circuit in the event that the main power fails. Failure of the main power or a System Reset may also initiate memory clearing.

Abstract: A semiconductor storage device includes a plurality of memory macros including a plurality of memory cell arrays; a low-potential power supply boosting circuit coupling the low-potential power supply to the ground in a normal mode and coupling the low-potential power supply to a voltage higher than a ground voltage in a sleep mode; a virtual power control circuits including a plurality of switches which is turned on when switching from the sleep mode to the normal mode and is turned off when switching from the normal mode to the sleep mode; and a sleep cancellation detecting circuit outputting, when the mode control signal supplied to the plurality of switches in one of the plurality of memory macros indicates to switch form the sleep mode to the normal mode, the mode control signal to a subsequent memory macro subsequent to the one of the plurality of memory macros.

Abstract: A memory module is provided comprising a substrate having an interface to a host system, volatile memory, non-volatile memory, and a logic device. The logic device may receive the indicator of an external triggering event and copies data from the volatile memory devices to the non-volatile memory devices upon receipt of such indicator. When the indicator of the triggering event has cleared, the logic device restores the data from the non-volatile to the volatile memory devices. The memory module may include a passive backup power source (e.g., super-capacitor) that is charged by an external power source and temporarily provides power to the memory module to copy the data from volatile to non-volatile memory. A voltage detector within the memory module may monitor the voltage of an external power source and generates an indicator of a power loss event if voltage of the external power source falls below a threshold level.

Abstract: A static memory cell, composed of cross-coupled MOS transistors having a relatively high threshold voltage, is equipped with MOS transistors for controlling the power supply line voltage of the memory cell. To permit the voltage difference between two data storage nodes in the inactivated memory cell to exceed the voltage difference between the two nodes when write data is applied from a data line pair DL and /DL to the two nodes in the activated memory cell, the power supply line voltage control transistors are turned on to apply a high voltage VCH to the power supply lines after the word line voltage is turned off. The data holding voltage in the memory cell can be activated to a high voltage independent of the data line voltage, and the data holding voltage can be dynamically set so that read and write operations can be performed at high speed with low power consumption.

Abstract: A voltage stabilization circuit of a semiconductor memory apparatus includes an operation speed detecting unit configured to detect an operation speed of the semiconductor memory apparatus to generate a detection signal, and a voltage line controlling unit configured to interconnect a first voltage line and a second voltage line in response to the detection signal.

Abstract: A memory device which can keep a stored logic state even when the power is off is provided. A signal processing circuit including the memory device, which achieves low power consumption by stopping supply of power, is provided. The memory device includes a logic circuit including a first node, a second node, a third node, and a fourth node; a first control circuit connected to the first node, the second node, and the third node; a second control circuit connected to the first node, the second node, and the fourth node; a first memory circuit connected to the first node, the first control circuit, and the second control circuit; and a second memory circuit connected to the second node, the first control circuit, and the second control circuit.

Abstract: A power gating circuit configured to couple with a memory array having an internal voltage, wherein the power gating circuit includes circuitry having an output signal that raises the internal voltage of the memory array if the internal voltage is lower than a first threshold voltage, and lowers the internal voltage if the internal voltage is higher than a second threshold voltage, thereby retaining the internal voltage between the first threshold voltage and the second threshold voltage.

Abstract: The present invention relates to a memory circuit and a method of controlling data retention in the memory circuit, wherein a supply signal is selectively switched to a respective one of at least two virtual supply lines (24) each shared by a respective one of a plurality of groups (30-1 to 30-n) of memory cells (C0,0 to Cy,z). The selective switching is controlled based on a global activity control signal (A), used for setting the memory circuit either into a standby state or into an active state, and a local data retention indication signal (DR1 to DRn) allocated to a dedicated group of memory cells. Thereby, the data retention part of the memory circuit can be adapted to the application and its state, and standby mode leakaged power is only dissipated in those memory cells for which data retentions actually required.

Abstract: A memory array comprises a plurality of memory cells arranged in a plurality of rows and a plurality of columns. A column of the plurality of columns includes a first power supply node configured to provide a first voltage, a second power supply node configured to provide a second voltage, and a plurality of internal supply nodes electrically coupled together and configured to receive the first voltage or the second voltage for a plurality of memory cells in the column and a plurality of internal ground nodes. The internal ground nodes are electrically coupled together and configured to provide at least two current paths for the plurality of memory cells in the column.

Abstract: A memory power supply circuit includes a memory module, a micro control unit (MCU), a phase switch circuit, and a multi-phase pulse-width modulation (PWM) controller. The MCU is operable to determine required current to be supplied to the memory module and output corresponding phase switch signals to the phase switch circuit. The PWM controller includes a number of phase pins connected to the phase switch circuit. The phase switch circuit controls enable states of the phase pins of the PWM controller.

Abstract: An apparatus, system, and method are disclosed for power loss management in a nonvolatile data storage device. A monitor module initiates a power loss mode in the nonvolatile data storage device in response to a primary power source failing to supply electric power above a predefined threshold to the nonvolatile data storage device. A secondary power source supplies electric power to the nonvolatile data storage device for at least a power hold-up time during the power loss mode. A power loss module adjusts execution of in-process operations on the nonvolatile data storage device during the power loss mode so that essential in-process operations execute within the power hold-up time.

Abstract: A nonvolatile semiconductor memory device has an internal step-down power generation circuit and a memory circuit. The internal step-down power generation circuit generates a first internal power supply voltage from an external power supply voltage in an active state, and generates a second internal power supply voltage different from the first internal power supply voltage from the external power supply voltage in a standby state. The memory circuit includes a cell array containing a nonvolatile memory cell and a sense amplifier detecting data read from the cell array. The sense amplifier is supplied with a voltage generated by the internal step-down power generation circuit as an internal power supply voltage.

Abstract: A multi-port memory is operated according to a method. Data is written, in a first mode, to a storage node of a memory cell from a first port through a first conductance. The first mode is characterized by a power supply voltage being applied at a power node at a first level. Data is written, in a second mode, to the storage node of the memory cell simultaneously from the first port through the first conductance and a second port through a second conductance. The second mode is characterized by the power supply voltage being applied at the power node at a second level different from the first level.

Abstract: Provided is a semiconductor integrated device including a semiconductor memory circuit and a peripheral circuit of the semiconductor memory circuit. The peripheral circuit includes a first transistor having a first voltage as a breakdown voltage of a gate oxide film. The semiconductor memory circuit includes a pair of bit lines, one of the pair of bit lines being connected to a gate transistor of a memory cell, and a precharge circuit that includes a transistor having a breakdown voltage substantially equal to that of the first transistor, and precharges the pair of bit lines to a predetermined voltage in response to an activation signal. The activation signal of the precharge circuit is a second voltage higher than the first voltage.

Abstract: There is provided a technique for ensuring both an SNM and a write margin simultaneously in a semiconductor device having static memory cells. A semiconductor device has a plurality of static memory cells. The semiconductor device includes a memory cell array having the static memory cells arranged in a matrix, a temperature sensor circuit for sensing a temperature in the semiconductor device, and a word driver for controlling a voltage supplied to a word line of the memory cell array based on an output of the temperature sensor circuit at the time of writing to or reading from a memory cell.

Abstract: When threshold voltages of constituent transistors are reduced in order to operate an SRAM circuit at a low voltage, there is a problem in that a leakage current of the transistors is increased and, as a result, electric power consumption when the SRAM circuit is not operated while storing data is increased. Therefore, there is provided a technique for reducing the leakage current of MOS transistors in SRAM memory cells MC by controlling a potential of a source line ssl of the driver MOS transistors in the memory cells.

Abstract: A system, method, and computer program product are provided for driving a memory circuit. In one embodiment, the memory circuit is driven utilizing a first resistance value in a first mode of operation. Further, in a second mode of operation, the memory circuit is driven utilizing a second resistance value. In another embodiment, a device is provided for driving a memory circuit without active termination utilizing a resistor.

Abstract: A memory system including a one time programmable (OTP) memory is provided. The memory system further includes a write enable verification circuit including an asymmetric inverter stage and a symmetric inverter stage coupled at a node. The write enable verification circuit is configured to receive a write enable signal. When the write enable signal changes from a first voltage level to a second voltage level, a voltage at the node changes at a first rate and wherein when the write enable signal changes from the second voltage level to the first voltage level, the voltage at the node changes at a second rate higher than the first rate. The write enable verification circuit is further configured to generate a verified write enable signal for enabling programming of the OTP memory.

Abstract: A memory array is provided having a memory cell coupled to a read word line and a write word line of the memory array and peripheral circuits for reading and writing to the memory cell. The memory cell comprises a storage element for storing a logical state of the memory cell powered at a reduced voltage during at least one functional operation and a write access circuit configured to connect the storage element to at least a first write bit line in the memory array in response to a write signal on the write word line for writing the logical state to the memory cell. The memory cell further comprises a read access circuit including an input node connected to the storage element and an output node connected to a read bit line of the memory array. The read access circuit is enabled and configured to read the logic state of the storage element in response to a read signal on the read word line.

Abstract: In a semiconductor device including a row-based control circuit applied with a current reduction circuit having a standby state and an active state, a refresh control circuit generates a refresh request signal every predetermined time interval on a self-refresh mode and time-sequentially generates an internal active signal at N times in connection with the refresh request signal once. The row-based control circuit time-sequentially refreshes information of memory cells on the based of the internal active signal at the N times. The refresh control circuit inactivates the row-based control circuit by making the current reduction circuit the standby state.

Abstract: There is provided a start-up circuit of an internal power supply of a semiconductor memory, including: an odd number of inverters that are connected in series and output a signal indicating whether or not to start to supply power from an internal power supply circuit of the semiconductor memory to an internal power supply circuit, and a discharge unit that is connected to an output side of an inverter at an odd-numbered stage and discharges charges remaining at the connection point between the inverter at the odd-numbered stage and the inverter at the stage immediately thereafter, after supply of power to operate the inverters is stopped.

Abstract: The present invention provides a method of reducing current of a memory in a self-refreshing mode and a related memory. The memory includes a word line driver and a controller, and the word line driver includes a transistor. The transistor has a control terminal, a first terminal coupled to a word line, and a second terminal. The method includes: after the memory enters the self-refreshing mode: controlling a voltage difference between the control terminal and the second terminal to correspond to a first value during a self-refreshing operation period; and controlling a voltage difference between the control terminal and the second terminal to correspond to a second value smaller than the first value during a non self-refreshing operation period.

Abstract: A flash storage device includes a power hold circuit including a double layer capacitor. A power source supplies power to the flash storage device and charges the double layer capacitor. The double layer capacitor supplies power for maintaining integrity of data during a data transfer occurring in the flash storage device when the power supplied by the power source is disrupted. Additionally, the flash storage device can inhibit subsequent data transfers until the power supplied by the power source is restored.

Abstract: The present invention provides a semiconductor memory circuit capable of reducing current consumption at non-operation in a system equipped with a plurality of chips that share the use of a power supply, address signals and a data bus. The semiconductor memory circuit has an internal circuit which is capable of selectively performing the supply and stop of an operating voltage via switch means and includes a memory array. An input circuit, which receives a predetermined control signal therein, controls the supply and stop of the operating voltage by the switch means to reduce a DC current and a leak current when no memory operation is done, whereby low power consumption can be realized.

Abstract: A computer program product for controlling a storage device using per-element selectable power supply voltages provides energy conservation in storage devices while maintaining a particular performance level. The storage device is partitioned into multiple elements, which may be sub-arrays, rows, columns or individual storage cells. Each element has a corresponding virtual power supply rail that is provided with a selectable power supply voltage. The power supply voltage provided to the virtual power supply rail for an element is set to the minimum power supply voltage unless a higher power supply voltage is required for the element to meet performance requirements. A control cell may be provided within each element that provides a control signal that selects the power supply voltage supplied to the corresponding virtual power supply rail. The state of the cell may be set via a fuse or mask, or values may be loaded into the control cells at initialization of the storage device.

Abstract: An integrated circuit includes at least one memory array for storing data. A first switch is coupled with the memory array. A first power line is coupled with the first switch. The first power line is operable to supply a first power voltage. A second switch is coupled with the memory array. A second power line is coupled with the second switch. The second power line is operable to supply a second power voltage for retaining the data during a retention mode. A third power line is coupled with the memory array. The third power line is capable of providing a third power voltage.

Abstract: An integrated circuit and method are provided, the integrated circuit comprising retention voltage generation circuitry which receives a supply voltage from a supply voltage node and provides a retention voltage at a retention voltage node. Functional circuitry is connected between the retention voltage node and a reference voltage node, the functional circuitry being held in a data retention state when at least a minimum voltage is provided between the retention voltage node and the reference voltage node.

Abstract: A power-up circuit comprises an external supply voltage potential detector, a first internal supply voltage potential detector, a second internal supply voltage potential detector, and a logic circuit. The external supply voltage potential detector is configured to detect a supply voltage that is external to the memory device and to generate a first detection signal indicating whether a voltage potential of the external supply voltage reaches a first predetermined value. The first internal supply voltage potential detector is configured to detect a first internal supply voltage that is internal to the memory device and to generate a second detection signal indicating whether a voltage potential of the first internal supply voltage reaches a second predetermined value.

Abstract: A plurality of fuses are arranged in pairs and configured such that each pair of fuses represents a data bit when one fuse of the pair is blown; represents an un-programmed bit when no fuse of the pair is blown; and represents a zero-ized bit when both fuses of the pair are blown. A fuse programming system programs the fuses of the pairs such that each pair represents a bit, comprising blowing a first fuse of a pair to represent a “1” bit, blowing a second fuse of a pair to represent a “0” bit, and blowing both fuses of a pair to represent a zero-ized pair, whereby if neither fuse of a pair is blown represents a null, un-programmed bit.

Abstract: A storage device includes a control unit, a first voltage supply unit for supplying a first working voltage to the control unit, N memory units, a second voltage supply unit for supplying a second working voltage to each memory unit, a logic gate, a first voltage detecting unit and a second voltage detecting unit. Once the first voltage detecting unit detects that the first working voltage of the control unit is abnormal, the logic gate outputs a first write protect signal to notify the control unit and control the memory units to enter a write protect mode. Once the second voltage detecting unit detects that the second working voltage of one or more memory units is abnormal, the logic gate outputs a second write protect signal to notify the control unit and control the one or more memory units to enter the write protect mode.

Abstract: A memory device for use with a primary power source including: non-volatile memory; volatile memory; an interface for connecting to a backup power source; isolation logic for controlling access to the volatile memory by a host processor, said isolation logic having a first mode during which the isolation logic provides the host processor with access to the volatile memory for storing or reading data and a second mode during which the isolation logic isolates the volatile memory from access by the host processor; and a controller controlling the isolation logic, said controller programmed to place the isolation logic in the first mode when the volatile memory is being powered by the primary power source and, when power to the volatile memory from the primary power source is interrupted, to place the isolation logic in the second mode and transfer data from the volatile memory to the non-volatile memory.

Abstract: A method for data storage in a non-volatile memory includes storing data in the non-volatile memory using a first storage configuration while the non-volatile memory is supplied with electrical power. After storing the data, an indication is accepted, indicating that shut-off of the electrical power is imminent. Responsively to the indication and before the shut-off, at least some of the data is re-programmed in the non-volatile memory using a second storage configuration.

Abstract: A memory circuit includes an operational memory and a monitor circuit comprising a circuit element in the operational memory and/or a circuit element substantially identical to a corresponding circuit element in the operational memory. The monitor circuit is operative to measure at least one functional characteristic of the operational memory. A control circuit coupled to the monitor circuit is operative to generate a control signal which varies as a function of the measured characteristic of the operational memory. The memory circuit further includes a programmable voltage source coupled to the operational memory which is operative to generate at least a voltage and/or a current supplied to at least a portion of the operational memory which varies as a function of the control signal.

Abstract: Semiconductor memory is provided wherein a memory cell includes a capacitorless transistor having a floating body configured to store data as charge therein when power is applied to the cell. The cell further includes a nonvolatile memory comprising a resistance change element configured to store data stored in the floating body under any one of a plurality of predetermined conditions. A method of operating semiconductor memory to function as volatile memory, while having the ability to retain stored data when power is discontinued to the semiconductor memory is described.

Abstract: The present invention provides a method of reducing current of a memory in a self-refreshing mode and a related memory. The memory includes a word line driver and a controller, and the word line driver includes a transistor. The transistor has a control terminal, a first terminal coupled to a word line, and a second terminal. The method includes: after the memory enters the self-refreshing mode: controlling a voltage difference between the control terminal and the second terminal to correspond to a first value during a self-refreshing operation period; and controlling a voltage difference between the control terminal and the second terminal to correspond to a second value smaller than the first value during a non self-refreshing operation period.

Abstract: A portion of a nonvolatile memory array that is likely to contain, partially programmed data may be identified from a high sensitivity read, by applying stricter than usual ECC requirements, or using pointers to programmed sectors. The last programmed data may be treated as likely to be partially programmed data. Data in the identified portion may be copied to another location, or left where it is with an indicator to prohibit further programming to the same cells. To avoid compromising previously stored data during subsequent programming, previously stored data may be backed up. Backing up may be done selectively, for example, only for nonsequential data, or only when the previously stored data contains an earlier version of data being programmed. If a backup copy already exists, another backup copy is not created. Sequential commands are treated as a single command if received within a predetermined time period.

Abstract: A CPU (1) automatically preserves the CPU context in a computer memory (5) that remains powered-up when the CPU is powered down in sleep mode. By means of the preserved CPU context, the CPU is able to instantly and transparently resume program execution at the instruction of the program that was asserted for execution when the CPU was powered down. The CPU is permitted to power down frequently, even during execution of a program, and results in reduced average overall power consumption.

Abstract: According to one embodiment, a storage device includes a volatile memory, an auxiliary power source, a nonvolatile memory, a write module, and an inhibition module. The volatile memory stores user data. The auxiliary power source supplies power to the volatile memory when power from a main power source is cut off. The nonvolatile memory is written with the user data, write incomplete information indicating the user data, and power off information indicating that power from the main power source is cut off. While supplied with power from the auxiliary power source when power from the main power source is cut off, the write module writes the write incomplete information, the user data, and the power off information to the nonvolatile memory. The inhibition module inhibits reading of the user data if the power off information is not written in the nonvolatile memory when the volatile memory is supplied with power.

Abstract: An internal voltage generator when activated, generates an internal voltage to be supplied to an internal circuit. Operating the internal voltage generator consumes a predetermined amount of the power. In response to a control signal from the exterior, an entry circuit inactivates the internal voltage generator. When the internal voltage generator is inactivated, the internal voltage is not generated, thereby reducing the power consumption. By the control signal from the exterior, therefore, a chip can easily enter a low power consumption mode. The internal voltage generator is exemplified by a booster for generating the boost voltage of a word line connected with memory cells, a substrate voltage generator for generating a substrate voltage, or a precharging voltage generator for generating the precharging voltage of bit lines to be connected with the memory cells.

Abstract: Embodiments of the invention relate to a state-monitoring memory element. The state-monitoring memory element may have a reduced ability to retain a logic state than other regular memory elements on an IC. Thus, if the state-monitoring memory elements fails or loses state during testing, it may be a good indicator that the IC's state retention may be in jeopardy, possibly requiring the IC to be reset. The state-monitoring memory element may be implemented by degrading an input voltage supply to the state-monitoring memory element across a diode and/or a transistor. One or more current sources may be used to stress the state-monitoring memory element. A logic analyzer may be used to analyze the integrity of the state-monitoring memory element and trigger appropriate actions in the IC, e.g., reset, halt, remove power, interrupt, responsive to detecting a failure in the state-monitoring memory element.

Abstract: Method and apparatus for assessing a time interval during which a refresh device can be maintained in a self-refresh mode by an associated energy source. The refresh device is initially operated in a self-refresh mode to maintain the device in a selected state. The time interval during which the refresh device can be subsequently maintained in the refresh mode is next determined in relation to an energy requirement value obtained during the self-refresh mode and an energy capacity value from the associated energy source. The energy capacity value is preferably obtained by fully discharging the associated energy source. Preferably, the refresh device is characterized as a dynamic random access memory (DRAM), and the associated energy source is characterized as a rechargeable backup battery. A selected test pattern is preferably written to the refresh device and maintained thereby during the self-refresh mode.