Composition Analysis Patents (Class 378/45)
  • Patent number: 7978814
    Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.
    Type: Grant
    Filed: October 26, 2009
    Date of Patent: July 12, 2011
    Assignee: Spectramet, LLC
    Inventors: Edward J. Sommer, Robert H. Parrish, David B. Spencer, Charles E. Roos
  • Patent number: 7970101
    Abstract: An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included.
    Type: Grant
    Filed: August 20, 2009
    Date of Patent: June 28, 2011
    Assignee: SII Nanotechnology Inc.
    Inventors: Noriaki Sakai, Toshiyuki Takahara, Yoshiki Matoba
  • Publication number: 20110142200
    Abstract: A hand-held, self-contained x-ray fluorescence (XRF) analyzer produces a small x-ray spot on a sample to interrogate the elemental composition of a sample region of millimeter-size characteristic dimension. The analyzer includes a collimator for aiming an x-ray beam toward a desired location on the sample and for determining the size of the spot produced on the sample. The analyzer may include a digital camera oriented toward the portion of the sample that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer. The analyzer may generate a reticule in a displayed image to indicate the portion of the sample that is, or would be, illuminated by the x-ray beam. The analyzer may automatically annotate the image of the sample with text or graphics that contain information about the analyzed sample. The image may be stored in the hand-held analyzer or provided for external storage or display.
    Type: Application
    Filed: February 25, 2011
    Publication date: June 16, 2011
    Inventors: Stanislaw PIOREK, Mark HAMILTON, Kenneth P. MARTIN, Pratheev SREETHARAN, Michael E. DUGAS, Paul ESTABROOKS, Lee GRODZINS
  • Patent number: 7961842
    Abstract: An X-ray fluorescence spectrometer which includes a calculating device (10) operable to calculate the theoretical intensity of secondary X-rays (6), emanated from each of elements contained in a sample (13), based on the assumed composition and then to successively approximately modify and calculate the assumed composition so that the theoretical intensity and the converted and measured intensity, which have been detected by a detecting device (9) and then converted in a theoretical intensity scale, can match with each other, to thereby calculate the composition of the sample (13). The calculating device (10), when calculating the theoretical intensity, performs a simulation to determine the theoretical intensity of the secondary X-rays (6) for each of optical paths, using the size of the sample (13), and the intensity and the incident angle (?) of primary X-rays (2) impinged upon various areas of the sample surface (13a) as parameters.
    Type: Grant
    Filed: December 8, 2005
    Date of Patent: June 14, 2011
    Assignee: Rigaku Corporation
    Inventors: Naoki Kawahara, Shinya Hara
  • Patent number: 7957504
    Abstract: A system and method are disclosed for determining the enrichment of 235U in Uranium Hexafluoride (UF6) utilizing synthesized X-rays which are directed at a container test zone containing a sample of UF6. A detector placed behind the container test zone then detects and counts the X-rays which pass through the container and the UF6. In order to determine the portion of the attenuation due to the UF6 gas alone, this count rate may then be compared to a calibration count rate of X-rays passing through a calibration test zone which contains a vacuum, the test zone having experienced substantially similar environmental conditions as the actual test zone. Alternatively, X-rays of two differing energy levels may be alternately directed at the container, where either the container or the UF6 has a high sensitivity to the difference in the energy levels, and the other having a low sensitivity.
    Type: Grant
    Filed: October 20, 2009
    Date of Patent: June 7, 2011
    Assignee: Los Alamos National Security, LLC
    Inventors: Thomas Roy Hill, Kiril Dimitrov Ianakiev
  • Publication number: 20110121979
    Abstract: The present disclosure relates, according to some embodiments, to apparatus, devices, systems, and/or methods for real-time detection of a concealed or camouflaged explosive device (e.g., EFPs and IEDs) from a safe stand-off distance. Apparatus, system and/or methods of the disclosure may also be operable to identify and/or spatially locate and/or detect an explosive device. An apparatus or system may comprise an x-ray generator that generates high-energy x-rays and/or electrons operable to contact and activate a metal comprised in an explosive device from a stand-off distance; and a detector operable to detect activation of the metal. Identifying an explosive device may comprise detecting characteristic radiation signatures emitted by metals specific to an EFP, an IED or a landmine. Apparatus and systems of the disclosure may be mounted on vehicles and methods of the disclosure may be performed while moving in the vehicle and from a safe stand-off distance.
    Type: Application
    Filed: November 20, 2009
    Publication date: May 26, 2011
    Applicant: Raytheon Company
    Inventors: Brandon W. Blackburn, Alan W. Hunt, David L. Chichester
  • Patent number: 7949093
    Abstract: An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—K? line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—K? line and Cr—K? line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
    Type: Grant
    Filed: November 24, 2006
    Date of Patent: May 24, 2011
    Assignee: Rigaku Industrial Corporation
    Inventors: Yoshiyuki Kataoka, Hisayuki Kohno, Noboru Yamashita, Makoto Doi
  • Patent number: 7949092
    Abstract: The invention relates to a device for performing X-ray analysis. Device 1 comprises an X-ray tube 2 and at least one capillary lens 4 for focusing the X-rays in a micro-region at a location 5 for a sample for analysis. Device 1 further comprises a detector 6 for detecting X-ray fluorescence from the sample. Device 1 further comprises at least one energy-dependent filter 3 placed between the X-ray tube 2 and the capillary lens 4. The filter 3 is adapted to substantially block X-rays with an energy which is lower than a predetermined threshold value.
    Type: Grant
    Filed: April 25, 2008
    Date of Patent: May 24, 2011
    Assignee: Panalytical B.V.
    Inventors: Gustaaf Christian Simon Brons, Petronella Emerentiana Hegeman
  • Publication number: 20110103547
    Abstract: In the present invention, a fluorescent X-ray analysis is made for a sample such as a liquid fuel including an object component such as sulfur. A background related to scattered X-rays and a system peak is subtracted from a fluorescent X-ray intensity of the object component, which is obtained from a spectrum acquired by the fluorescent X-ray analysis. A correction corresponding to the composition of the sample is performed for the fluorescent X-ray intensity obtained by subtracting the background. A calibration curve representing the relation between a value, which is obtained after performing the correction for the fluorescent X-ray intensity obtained by subtracting the background, and a concentration of the object component is preset. The concentration of the object component in the sample is calculated on the basis of the calibration curve.
    Type: Application
    Filed: November 5, 2010
    Publication date: May 5, 2011
    Applicant: HORIBA, LTD.
    Inventor: Sumito OHZAWA
  • Patent number: 7933379
    Abstract: A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined.
    Type: Grant
    Filed: March 17, 2010
    Date of Patent: April 26, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Lee Grodzins, John Pesce
  • Publication number: 20110085638
    Abstract: In a sample cell that is sealed with an X-ray transmission sheet after a sample such as a liquid fuel or the like is contained therein, when an internal pressure is increased, a cup end surface is deformed so as to increase an internal capacity of the sample cell before the X-ray transmission sheet serving as a window part is expanded. The cup end surface is formed by folding a film-like material and, when the internal pressure of the sample cell is increased, the cup end surface is unfolded outwardly of the sample cell to increase the internal capacity of the sample cell. The increase in pressure is relieved by the increase in capacity, and the expansion of the X-ray transmission sheet is thereby prevented.
    Type: Application
    Filed: October 7, 2010
    Publication date: April 14, 2011
    Inventors: Mayuko Kishida, Shintaro Komatani, Sumito Ohzawa, Takuji Kurozumi, Satoru Goto, Takashi Kinba, Kimihiko Arimoto
  • Publication number: 20110079734
    Abstract: Methods and apparatus for analyzing a test sample using complementary techniques, such as x-ray fluorescence (XRF) and optical emission spectroscopy (OES), are disclosed for registering two or more test instruments, in relation to the test sample, such that each of the instruments analyzes substantially the same region as is analyzed by the other instrument(s), and for communicating analytical results between or among the instruments, or between the instruments and another component, to enable one or more of the instruments, or the other component, to combine the results and, thereby, more completely and accurately determine the composition of the test sample. Such registration and communication enables, for example, separate XRF and OES instruments to collectively determine the composition of the test sample, including the absolute amounts of light and heavy elements in the test material.
    Type: Application
    Filed: September 30, 2010
    Publication date: April 7, 2011
    Inventors: Lee GRODZINS, William L. Adams, Paul Estabrooks
  • Patent number: 7916834
    Abstract: A hand-held, self-contained x-ray fluorescence (XRF) analyzer produces a small x-ray spot on a sample to interrogate the elemental composition of a sample region of millimeter-size characteristic dimension. The analyzer includes a collimator for aiming an x-ray beam toward a desired location on the sample and for determining the size of the spot produced on the sample. The analyzer may include a digital camera oriented toward the portion of the sample that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer. The analyzer may generate a reticule in a displayed image to indicate the portion of the sample that is, or would be, illuminated by the x-ray beam. The analyzer may automatically annotate the image of the sample with text or graphics that contain information about the analyzed sample. The image may be stored in the hand -held analyzer or provided for external storage or display.
    Type: Grant
    Filed: February 11, 2008
    Date of Patent: March 29, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Stanislaw Piorek, Mark Hamilton, Kenneth P. Martin, Pratheev Sreetharan, Michael E. Dugas, Paul Estabrooks, Lee Grodzins
  • Patent number: 7899153
    Abstract: A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed.
    Type: Grant
    Filed: April 17, 2009
    Date of Patent: March 1, 2011
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Michael E. Dugas, Lee Grodzins, Stephen I. Shefsky
  • Patent number: 7899154
    Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
    Type: Grant
    Filed: March 14, 2008
    Date of Patent: March 1, 2011
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: Zewu Chen, Li Danhong
  • Publication number: 20110042143
    Abstract: A method and an apparatus for intensifying ore prospecting, a core (1) and/or drill cuttings sample being analyzed in said method, whereby the analysis of the sample (1) is performed with a movable analysing apparatus (4, 7) on the drilling site of the sample or in the vicinity thereof after the sample to be analyzed has been drilled.
    Type: Application
    Filed: February 16, 2009
    Publication date: February 24, 2011
    Applicant: MINE ON-LINE SERVICE OY
    Inventors: Ilpo Auranen, Jukka Raatikainen
  • Publication number: 20110046204
    Abstract: The present invention provides methods of detecting prostate cancer employing biomarkers, including hZIP1, zinc and citrate. Also provided are antibodies to detect hZIP1 protein or peptides and an expression vector comprising a genetic sequence effective to increase uptake of zinc into a prostate cell upon expression thereof. Furthermore, methods of treating prostate cancer and of increasing uptake of zinc into a prostate cell are provided.
    Type: Application
    Filed: January 23, 2007
    Publication date: February 24, 2011
    Inventors: Leslie C. Costello, Renty B. Franklin
  • Publication number: 20110044426
    Abstract: An apparatus and a method for X-ray fluorescence analysis of a mineral sample is disclosed. The apparatus comprises an X-ray source (2) for generating an X-ray beam to irradiate the mineral sample; at least one fluorescence detector (4,5) for measuring fluorescent radiation emitted by the mineral sample when irradiated by the X-ray beam; and a processing unit for providing an analysis of the mineral sample based on the measurements made by the at least one fluorescence detector (4,5). Further, the apparatus comprises a sample container (3) arranged to hold the mineral sample during the irradiation, wherein the sample container is arranged to provide at least two different irradiation paths through said mineral sample during irradiation. An advantage with this arrangement is that it enables analysis of elements having a wide range of atomic numbers in a single sample with improved reliability and accuracy.
    Type: Application
    Filed: February 2, 2009
    Publication date: February 24, 2011
    Inventors: Anders Ullberg, Erik Oden, Ragnar Kullenberg, Fredrik Danielsson
  • Patent number: 7864920
    Abstract: A system and methods for identifying contents of an enclosure such as an air cargo container. A three-dimensional image indicative of at least one of the CT number and the density of contents of the enclosure is obtained using penetrating radiation such as x-rays. If one or more suspect regions are identified among contents of the enclosure, a collimated neutron beam is activated to traverse each suspect region and fluorescent emission from the suspect region is detected, allowing material within the suspect region to be characterized based at least on the detected fluorescent emission. Additionally, the collimated neutron beam may be employed for neutron imaging of the contents of the enclosure.
    Type: Grant
    Filed: May 20, 2009
    Date of Patent: January 4, 2011
    Assignee: American Science and Engineering, Inc.
    Inventor: Peter J. Rothschild
  • Publication number: 20100310041
    Abstract: An X-ray fluorescence instrument in which x-rays are directed from a source onto a sample by a focusing element. Fluorescence from the sample is detected by an x-ray detector disposed entirely within a volume “interior” to the focusing element, as defined in the description of the invention. A second focusing element may collect emission by the sample and direct it monochromatically, over a large opening angle, onto the x-ray detector. Methods for applying the instrument, particularly for the quantification of sulfur and other contaminating elements in lubricants and fuel are also provided.
    Type: Application
    Filed: June 3, 2010
    Publication date: December 9, 2010
    Inventors: William L. Adams, Stephen I. Shefsky
  • Patent number: 7848483
    Abstract: The present invention provides a multilayer structure including a substrate having formed on a surface thereof at least one period of individual layers, the period having at least two layers including a first layer which includes magnesium silicide and a second layer which includes at least one of tungsten, tantalum, cobalt, nickel, copper, iron, chromium, alloys, oxides, borides, silicides, and nitrides of these elements, silicon, carbon, silicon carbide, boron, and boron carbide. If the period includes three layers, the second layer includes one of silicon, carbon, silicon carbide, boron, and boron carbide and a third layer includes one of tungsten, tantalum, cobalt, nickel, copper, iron, chromium, and alloys, oxides, borides, silicides, and nitrides of these elements, the second layer being disposed between the first and the third layers.
    Type: Grant
    Filed: August 5, 2008
    Date of Patent: December 7, 2010
    Assignees: Rigaku Innovative Technologies, Rigaku Industrial Corporation
    Inventors: Yuriy Y. Platonov, Kazuaki Shimizu
  • Publication number: 20100303201
    Abstract: A method for the online determination of the ash content of a substance conveyed on a conveying device, includes a first measurement for determining the mass per unit area of the substance and a second measurement for determining the mean atomic number of the atoms present in the substance. An additional X-ray fluorescence measurement is carried out.
    Type: Application
    Filed: April 26, 2006
    Publication date: December 2, 2010
    Inventor: Albert Klein
  • Patent number: 7839969
    Abstract: A method and device for detecting mercury or other material deposits on an inner surface of an enclosed passage are provided. The device includes a detection unit that is adapted to be transported through the passage, and the detection unit includes a radiation source and an x-ray fluorescence detector. The radiation source is configured to emit a radiation emission toward the inner surface of the passage to excite a portion of the inner surface, and the x-ray fluorescence detector is configured to detect a resulting x-ray emission from the portion of the inner surface to identify a material deposit on the inner surface. The detection unit can identify material deposits at successive positions along a length of the passage and thereby generate a plurality of data points, each data point providing an indication of a material deposit existence for a corresponding position along the length of the passage.
    Type: Grant
    Filed: April 24, 2008
    Date of Patent: November 23, 2010
    Assignee: Chevron U.S.A. Inc.
    Inventors: Darrell Lynn Gallup, Christopher Henry Spurrell
  • Publication number: 20100284513
    Abstract: An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle ? of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.
    Type: Application
    Filed: September 1, 2006
    Publication date: November 11, 2010
    Applicant: JEOL Ltd.
    Inventor: Kazuyasu Kawabe
  • Publication number: 20100278303
    Abstract: An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both.
    Type: Application
    Filed: April 30, 2010
    Publication date: November 4, 2010
    Inventor: Lee GRODZINS
  • Publication number: 20100278302
    Abstract: An apparatus for detecting a specific element for detecting presence or content concentration of a specific element contained in a measurement target, which includes a raw material, such as soil or ore, a product in the form of powder, granule or gravel, and an intermediate product, a by-product, a waste material and the like generated during a process for producing the product, the apparatus comprising fluorescent X-ray measuring means that radiates an X-ray to the measurement target and measures a fluorescent X-ray generated thereby to detect the presence of the content concentration of the specific element, and film feeding means that inserts a resin film between a measuring window of the fluorescent X-ray measuring means and the measurement target, and feeds a fresh resin film between the measuring window and the measurement target along with repetition of detection of the specific element, whereby the intensity of the fluorescent X-ray can be prevented from being attenuated by measuring with the measurin
    Type: Application
    Filed: September 6, 2007
    Publication date: November 4, 2010
    Applicants: SUMITOMO METAL MINING CO., LTD., INTERNATIONAL CENTER FOR ENVIRONMENTAL TECHNOLOGY TRANSFER
    Inventors: Jun Yokoyama, Ryozo Ushio, Koji Komatsu
  • Patent number: 7825376
    Abstract: One aspect relates to optically detecting an at least one scintillated viewable and/or visible photon that has been converted from the at least one induced X-ray fluorescing photon. The aspect can also relate to optically detecting an at least one scintillated viewable and/or visible photon that has been converted from the at least one induced X-ray fluorescing photon.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: November 2, 2010
    Inventors: Edward S. Boyden, Glenn B. Foster, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K. Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Jr., Victoria Y. H. Wood
  • Publication number: 20100272232
    Abstract: A method is provided for screening lead concentration compliance of objects, particularly consumer products such as toys, using x-ray fluorescence (XRF) analysis. The measured intensity ratio of the characteristic L? and L? x-rays of lead provides an indication of whether the lead is located primarily in a coating (e.g., paint) layer on the object, or in a thin or thick bulk material. If the intensity ratio indicates that the lead is located in a coating layer or distributed in a thin bulk material, an areal density of lead is determined from at least one of the characteristic x-ray intensities, and the measured areal density is compared to specified lower and upper limits to determine whether the object is unambiguously compliant, unambiguously non-compliant, or indeterminate.
    Type: Application
    Filed: April 23, 2010
    Publication date: October 28, 2010
    Inventors: John Pesce, Lee Grodzins
  • Patent number: 7796726
    Abstract: An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate.
    Type: Grant
    Filed: February 14, 2007
    Date of Patent: September 14, 2010
    Assignee: University of Maryland, Baltimore County
    Inventors: Keith Gendreau, Jose Vanderlei Martins, Zaven Arzoumanian
  • Patent number: 7787589
    Abstract: Methods for in vivo measurement of lead or other trace elements in bone by x-ray fluorescence (XRF) without independent measurement of underlying tissue thickness are disclosed. In one method, the lead concentration is calculated based on the intensity of a first characteristic fluoresced peak and a function having as an argument the intensity ratio of first and second characteristic fluoresced peaks, with at least one parameter of the function being empirically determined by measurements of calibration phantoms having differing thicknesses of tissue surrogate material. In another method, the lead concentration is measured by estimating tissue thickness based on the intensity of the Compton scattering peak, or ratio of Compton/Rayleigh intensities, and the intensity of a characteristic fluoresced x-ray peak corrected for attenuation by tissue of the estimated thickness. Also disclosed is a method for determining the calcium concentration and density of bone based on XRF spectrum data.
    Type: Grant
    Filed: April 30, 2009
    Date of Patent: August 31, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventor: Lee Grodzins
  • Publication number: 20100189215
    Abstract: A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined.
    Type: Application
    Filed: March 17, 2010
    Publication date: July 29, 2010
    Inventors: Lee GRODZINS, John Pesce
  • Patent number: 7763820
    Abstract: A piece of material that includes low-Z elements is classified based on photonic emissions detected from the piece of material. Both XRF spectroscopy and OES techniques, for example, Laser-Induced Breakdown Spectroscopy (LIBS) and spark discharge spectroscopy, may be used to classify the piece of material. A stream of pieces of material are moved along a conveying system into a stimulation and detection area. Each piece of material, in turn, is stimulated with a first and second stimulus, of a same or different type, causing the piece of material to emit emissions, for example, photons, which may include at least one of x-ray photons (i.e., x-rays) and optical emissions. These emissions then are detected by one or more detectors of a same or different type. The piece of materials is then classified, for example, using a combination of hardware, software and/or firmware, based on the detected emissions, and then sorted.
    Type: Grant
    Filed: November 27, 2007
    Date of Patent: July 27, 2010
    Assignee: Spectramet, LLC
    Inventors: Edward J. Sommer, Jr., David B. Spencer, R. Lynn Conley, Richard E. Hill, Robert H. Parrish, Charles E. Roos
  • Publication number: 20100150307
    Abstract: A method of operating an x-ray fluorescence (XRF) analyzer to automatically suppress sum-peaks is disclosed. The method includes irradiating a sample to acquire an initial energy spectrum. The energy spectrum is processed to identify a sum-peak that interferes with a characteristic fluoresced peak of an element of interest. A filter is positioned in the emitted radiation path to attenuate radiation that contributes to the identified sum-peak, and a filtered energy spectrum is acquired. In certain embodiments, the filtered energy spectrum is acquired only when a limit of detection (LOD) of an element of interest calculated from the initial energy spectrum does not satisfy a targeted objective.
    Type: Application
    Filed: December 11, 2009
    Publication date: June 17, 2010
    Inventor: Lee GRODZINS
  • Patent number: 7729471
    Abstract: A sample cell for an analysis instrument, having an outer body forming a sample reservoir therein; a directional fill valve disposed in an upper end of the outer body and forming an upper end of the sample reservoir, the fill valve for accepting a sample during filling, and preventing sample leakage while providing venting after filling; and a film covering a lower end of the outer body, and forming a bottom end of the sample reservoir, the film for presenting the sample to an analysis focal spot of the analysis instrument. The disclosed sample cell is especially suited for an x-ray analysis engine having a focal spot requiring alignment with the sample in the sample cell. At least one x-ray optic may be disposed in an excitation and/or detection path, requiring alignment to the focal spot, in e.g., a WDXRF or EDXRF system.
    Type: Grant
    Filed: November 26, 2008
    Date of Patent: June 1, 2010
    Assignee: X-Ray Optical Systems, Inc.
    Inventors: John H. Burdett, Jr., Daniel L. Dunham, James B. Quinn
  • Publication number: 20100124313
    Abstract: Example methods and apparatus to perform downhole x-ray fluorescence to detect sulfur in formation fluids are disclosed. A disclosed example downhole x-ray fluorescence apparatus comprises a flowline comprising a flowline wall, an x-ray source, a boron carbide crystal window in the flowline wall to allow x-rays emitted by the x-ray source to pass into a formation fluid in the flowline, and a detector to measure a value representative of a fluorescence of the formation fluid in response to the emitted x-rays.
    Type: Application
    Filed: November 16, 2008
    Publication date: May 20, 2010
    Applicant: SCHLUMBERGER TECHNOLOGY CORPORATION
    Inventor: GO FUJISAWA
  • Patent number: 7720193
    Abstract: An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample 106, comprises a measurement step (S3) of irradiating the sample 106 with X-rays, and measuring the spectrum of the sample 106, and an assay step (S4) of comparing the components of the specific substance in the spectrum of the sample 106 and in a reference spectrum that has been pre-stored for the sample 106, and determining whether the specific substance is contained in the sample 106 in an amount equal to or greater than a specific value.
    Type: Grant
    Filed: August 14, 2006
    Date of Patent: May 18, 2010
    Assignee: Panasonic Corporation
    Inventors: Yoshiyuki Tani, Hiroshi Iwamoto, Takao Hisazumi, Yukihiro Iwata
  • Publication number: 20100111252
    Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.
    Type: Application
    Filed: October 26, 2009
    Publication date: May 6, 2010
    Applicant: Spectramet, LLC
    Inventors: Edward J. Sommer, JR., Robert H. Parrish, David B. Spencer, Charles E. Roos
  • Publication number: 20100098211
    Abstract: A system and method are disclosed for determining the enrichment of 235U in Uranium Hexafluoride (UF6) utilizing synthesized X-rays which are directed at a container test zone containing a sample of UF6. A detector placed behind the container test zone then detects and counts the X-rays which pass through the container and the UF6. In order to determine the portion of the attenuation due to the UF6 gas alone, this count rate may then be compared to a calibration count rate of X-rays passing through a calibration test zone which contains a vacuum, the test zone having experienced substantially similar environmental conditions as the actual test zone. Alternatively, X-rays of two differing energy levels may be alternately directed at the container, where either the container or the UF6 has a high sensitivity to the difference in the energy levels, and the other having a low sensitivity.
    Type: Application
    Filed: October 20, 2009
    Publication date: April 22, 2010
    Applicant: LOS ALAMOS NATIONAL SECURITY, LLC
    Inventors: Thomas Roy Hill, Kiril Dimitrov Ianakiev
  • Patent number: 7702066
    Abstract: One aspect relates to inducing at least one induced X-ray fluorescing photon at a X-ray fluorescence event within an at least some matter of an at least a portion of an at least one individual responsive to an at least some input energy being applied to the at least some matter of the at least the portion of the at least one individual. The aspect can include detecting the at least one induced X-ray fluorescing photon, wherein the inducing at least one induced X-ray fluorescing photon and the detecting the at least one induced X-ray fluorescing photon is configured to be transported portably as a self-contained and self-powered unit.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: April 20, 2010
    Inventors: Edward S. Boyden, Glenn B. Foster, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K. Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Jr., Victoria Y. H. Wood
  • Patent number: 7702067
    Abstract: A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: April 20, 2010
    Assignee: Thermo Niton Analyzers LLC
    Inventors: Lee Grodzins, John Pesce
  • Publication number: 20100091944
    Abstract: A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value.
    Type: Application
    Filed: October 8, 2009
    Publication date: April 15, 2010
    Inventors: Mitsuhiro OKI, Miyuki TAKENAKA
  • Publication number: 20100089663
    Abstract: A device, system and method for nondestructively obtaining qualitative and/or quantitative information relating to the material properties of a region in a diamond body comprises directing x-rays onto the body. The body can comprise sintered or unsintered diamond. The body can ultimately be in the form of a cutting element used with a subterranean drill bit. The x-rays penetrate the body and cause a target element within the desired region including the same to emit x-ray fluorescence. The emitted x-ray fluorescence is received and information relating to content, location, and/or distribution of the target element in the region within the body is determined therefrom. The measured region can extend axially or radially from a surface of the body, and the target elements are nondiamond materials that can be constituents of a substrate attached to the body, or of a container used during HPHT sintering of the body.
    Type: Application
    Filed: September 25, 2009
    Publication date: April 15, 2010
    Inventors: Loel Corbett, Ronald K. Eyre
  • Publication number: 20100080351
    Abstract: A handheld X-ray fluorescence spectrometer includes a pyroelectric radiation source for directing X-rays toward a sample to be analyzed and a detector for receiving secondary X-rays emitted from the sample and converting the secondary X-rays into one or more electrical signals representative of the received secondary X-rays. A module is configured to receive the one or more electrical signals and send a representation of the one or more signals over a communication channel to a computing device without performing any spectral analysis on the one or more electrical signals to characterize the sample. The computing device is configured to perform spectral analysis on the one or more electrical signals and send the spectral analysis to the spectrometer over the communications channel.
    Type: Application
    Filed: September 25, 2009
    Publication date: April 1, 2010
    Applicant: i-Nalysis LLC
    Inventors: Andrew Hession-Kunz, Robert Allard, Jerzy Wilder
  • Patent number: 7688943
    Abstract: Elemental concentrations in hair (head and body hair) and dried serum have been measured by x-ray fluorescence analysis using synchrotron radiation. The relative concentration defined by log P?log S are obtained from the fluorescent spectra, where P is the peak height for the element and S is the background height. The observation shows that hair has two separate [Ca] concentration levels, the upper level and lower level. Since the content in hair growing at a steady state must be equal to the supply from serum, the upper and the lower level of hair [Ca] are attributed to open and close Ca ion channels of the hair matrix cells and can be derived from the serum concentrations of Ca ion and Ca atoms included in serum protein, respectively. The hair analysis is useful for cancer detection and protection as well as for diagnosing the Ca metabolism.
    Type: Grant
    Filed: August 10, 2005
    Date of Patent: March 30, 2010
    Inventor: Jun-ichi Chikawa
  • Publication number: 20100074406
    Abstract: [Problems] To provide a reverse X-ray photoelectron holography device, in which energy control and convergence are facilitated and a hologram of good contrast is obtained; and to provide its measuring method.
    Type: Application
    Filed: October 13, 2006
    Publication date: March 25, 2010
    Inventors: Koichi Hayashi, Eiichiro Matsubara, Tomohiro Matsushita
  • Patent number: 7684540
    Abstract: An apparatus and method for determining the phase fraction of a fluid collected downhole is shown comprising an x-ray generator, a filter, a sample cell, and a radiation detector. The filter produces a radiation spectrum with a high energy portion and a low energy portion. Filtered radiation is passed through a sample fluid and the resulting attenuated radiation signal is used in calculating the phase fractions of oil, water, and gas in the sample fluid. In one embodiment, a second reference radiation detector measures the radiation directly from the x-ray generator and this measurement is used in normalizing the fraction result. The ratio of the high energy signal to low energy signal of the reference detector is used in controlling the input voltage of the x-ray generator thus ensuring a stable spectrum.
    Type: Grant
    Filed: June 20, 2006
    Date of Patent: March 23, 2010
    Assignee: Schlumberger Technology Corporation
    Inventors: Joel Groves, Etienne Vallee, Peter Wraight
  • Patent number: 7680243
    Abstract: A method for analyzing a sample includes directing one or more beams of X-rays to impinge on an area of a surface of the sample on which a layer of nano-particles of a selected element has been formed. Secondary X-ray radiation from the area is detected responsively to the one or more beams. A distribution of the nano-particles on the surface is characterized based on the detected radiation.
    Type: Grant
    Filed: September 6, 2007
    Date of Patent: March 16, 2010
    Assignee: Jordan Valley Semiconductors Ltd.
    Inventors: Boris Yokhin, Alexander Tokar, Alexander Krokhmal, Asher Peled, Dileep Agnihotri
  • Publication number: 20100051547
    Abstract: A solid-phase extraction device utilizing a section of expanded polytetrafluoroethylene (ePTFE) tubing as the stationary phase is disclosed. The microscopic pores of ePTFE tubing are impregnated with a binding agent having an affinity for a target constituent within a matrix. The matrix is prepared and loaded onto the stationary phase of the system. The target constituent is retained by the stationary phase. The constituent is stripped from the stationary phase with a stripping solution, and collected for further analysis or use.
    Type: Application
    Filed: September 2, 2008
    Publication date: March 4, 2010
    Applicant: DATACHEM LABORATORIES, INC.
    Inventors: Stephen M. Workman, Robert T. Shannon
  • Patent number: 7671350
    Abstract: An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material, a detector for detecting fluorescence emission by the test material and for generating a detector signal, and a controller for converting the detector signal into a spectrum characterizing the composition of the test material. A platen of attenuating material extends outward from adjacent to, and surrounding, the irradiated surface of the test material. In certain embodiments, the thickness of the attenuating platen is tapered such as to decrease with increasing radial distance from the central irradiated region of the test material.
    Type: Grant
    Filed: May 25, 2007
    Date of Patent: March 2, 2010
    Assignee: Thermo Niton Analyzer LLC
    Inventor: Lee Grodzins
  • Publication number: 20100046702
    Abstract: An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
    Type: Application
    Filed: March 14, 2008
    Publication date: February 25, 2010
    Applicant: X-RAY OPTICAL SYSTEMS, INC.
    Inventors: Zewu Chen, Li Danhong