Composition Analysis Patents (Class 378/45)
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Patent number: 10012603Abstract: A combined handheld XRF and LIBS system and method includes an XRF subsystem with an X-ray source operated at a fixed medium voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a detector for detecting fluoresced radiation from the sample. The LIBS subsystem includes a low power laser source for delivering a laser beam to the sample and a narrow wavelength range spectrometer subsystem for analyzing optical emissions from the sample. The X-ray source is operated at the fixed medium voltage to analyze the sample for a first group of elements, namely, transition and/or heavy metals.Type: GrantFiled: June 22, 2015Date of Patent: July 3, 2018Assignee: SciAps, Inc.Inventor: Donald W. Sackett
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Patent number: 9945796Abstract: An X-ray fluorescence analysis method in which the quantity of a contained component other than the principal component in the sample is determined by using the result of measurement of X-rays emitted from a sample whose principal component is an organic component, includes: setting a quantitative value of the contained component; calculating an area occupancy ratio representing the proportion of X-rays falling onto the sample; recalculating the area occupancy ratio based on a comparison of a measured value of the scattered X-ray intensity with a theoretical value of the scattered X-ray intensity calculated using a recalculated quantitative value of the contained component and the area occupancy ratio; repeating the recalculation of the quantitative value of the contained component and the recalculation of the area occupancy ratio, and determining the quantitative value as the definite quantitative value of the contained component when the quantitative value satisfies a previously set convergence condition.Type: GrantFiled: October 15, 2013Date of Patent: April 17, 2018Assignee: SHIMADZU CORPORATIONInventor: Eisaku Terashita
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Patent number: 9885676Abstract: A method for measurement of the thickness of thin layers or determination of an element concentration of a measurement object. A primary beam is directed from an X-ray radiation source onto the measurement object. A secondary radiation emitted by the measurement object is detected by a detector and is relayed to an evaluation device. The primary beam is moved within a grid surface which is divided into grid partial surfaces as well as subdivided into at least one line and at least one column. For each grid partial surface a primary beam is directed onto the grid surface. A measuring spot of the primary beam fills at least the grid point. A lateral dimension of the measurement surface is detected and compared to the size of the measuring spot of the primary beam appearing on the measurement object, for size determination of the measurement surface of the measurement object.Type: GrantFiled: March 2, 2015Date of Patent: February 6, 2018Assignee: Helmut Fischer GmbH Institut für Elektronik und MesstechnikInventor: Volker Roessiger
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Patent number: 9744497Abstract: A duct can be configured to receive a denuding gas flow. A solid denuding surface that is connected to a drive system can be configured to move the solid denuding surface within the duct while the solid denuding surface is continuously concentrating one or more gas-phase species from the denuding gas flow on the denuding surface. Also, a denuding gas flow can be passed along a denuding surface to concentrate one or more gas phase species from the denuding gas flow onto the denuding surface with a diffusion denuding action. The denuding surface can be moved while continuing to concentrate the one or more gas phase species from the denuding gas flow onto the denuding surface.Type: GrantFiled: October 21, 2015Date of Patent: August 29, 2017Assignee: Cooper Environmental Services LLCInventor: John Arthur Cooper
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Patent number: 9575018Abstract: A method of testing for impurities includes directing an x-ray source toward a surface at an angle ? relative to the plane of the surface, the surface defined by a ceramic coating over a crystalline substrate; detecting x-ray fluorescent radiation emitted from the ceramic coating at an angle ? different from the angle ? and its supplementary angle; and comparing characteristics of the detected x-ray fluorescent radiation to characteristics associated with impurities.Type: GrantFiled: September 15, 2014Date of Patent: February 21, 2017Assignee: CERIUM LABORATORIES, LLCInventor: Timothy Hossain
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Patent number: 9541511Abstract: An XRF (XRF=x-ray fluorescence) measurement apparatus (1) has an x-ray source (2) for generating x-rays (4), x-ray optics (3) for directing x-rays (4) from the x-ray source (2) to a sample (5) and an EDS (EDS=energy dispersive spectroscopy) detector (7) for detecting fluorescent x-rays (14) from the sample (5). The apparatus is characterized in that the sample (5) is a wafer (6), in particular a Si wafer, wherein the x-ray optics (3) is positioned to direct the x-rays (4) onto the bevel (12) of the wafer (6). The x-ray source (2) plus the x-ray optics (3) has a brilliance of at least 5*107 counts/sec mm2, preferably at least 1*108counts/sec mm2. The apparatus allows an improved contamination control of wafers, in particular silicon wafers.Type: GrantFiled: January 21, 2014Date of Patent: January 10, 2017Assignee: Bruker AXS GmbHInventor: Assunta Vigliante
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Patent number: 9435757Abstract: An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.Type: GrantFiled: June 15, 2015Date of Patent: September 6, 2016Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: George Allen, Stuart Shakshover, Sony Cheryian
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Patent number: 9392961Abstract: An apparatus and a method for detecting clinically-relevant features of the gastrointestinal (GI) tract of a subject are disclosed. The apparatus includes a capsule to be swallowed by a subject and passing through the GI tract of the subject, a capsule housing, a radiation source emitting radiation, a rotatable collimator configured to rotate with respect to the housing and to collimate the radiation emitted by the radiation source, and a radiation detector configured to detect particles, such as photons, gamma radiation, beta radiation and electrons photons generated responsive to the emitted radiation. The apparatus also includes a control unit configured to analyze data regarding the photons. Movement of the capsule in the GI tract can be detected. The radiation source, radiation detector and control unit may advantageously be integrated inside a single housing.Type: GrantFiled: June 29, 2010Date of Patent: July 19, 2016Assignee: CHECK-CAP LTD.Inventors: Yoav Kimchy, Yitzak Klein, Gideon Baum, Rafi Sommer
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Patent number: 9390881Abstract: A compact source for high brightness x-ray generation is disclosed. The higher brightness is achieved through electron beam bombardment of multiple regions aligned with each other to achieve a linear accumulation of x-rays. This may be achieved by aligning discrete x-ray sub-sources, or through the use of x-ray targets that comprise microstructures of x-ray generating materials fabricated in close thermal contact with a substrate with high thermal conductivity. This allows heat to be more efficiently drawn out of the x-ray generating material, and in turn allows bombardment of the x-ray generating material with higher electron density and/or higher energy electrons, leading to greater x-ray brightness. Some embodiments of the invention comprise x-ray optical elements placed between sub-sources of x-rays. These x-ray optical elements may form images of one or more x-ray sub-sources in alignment with other x-ray sub-sources, and may enhance the linear accumulation that can be achieved.Type: GrantFiled: September 19, 2014Date of Patent: July 12, 2016Assignee: Sigray, Inc.Inventors: Wenbing Yun, Sylvia Jia Yun Lewis, Janos Kirz, Alan Francis Lyon
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Patent number: 9281102Abstract: An electric power cable for medium or high voltage without lead sheath is provided having at least one diffusion barrier (7) based on a metallized layer or a layer of polymer (HDPE). In addition there is a polymer (PUR) layer (6) for absorbing limited amounts of water that might after all pass through the diffusion barrier layer.Type: GrantFiled: November 3, 2010Date of Patent: March 8, 2016Assignee: NEXANSInventors: Liv Molvig-Lundegaard, Georg Balog, Knut Magne Furuheim
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Patent number: 9244027Abstract: The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.Type: GrantFiled: May 31, 2013Date of Patent: January 26, 2016Assignee: OLYMPUS NDTInventor: Brendan Connors
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Patent number: 9244026Abstract: An x-ray fluorescence apparatus for measuring properties of a sample fluid, the apparatus comprising a housing having an inlet and an outlet; a test chamber disposed within the housing, the test chamber comprising an injection port in fluid communication with the inlet; a slide disposed within the test chamber, the slide comprising a sample cavity; and a test port; an x-ray fluorescence spectrometer disposed within the housing, and at least one motor operatively coupled to the slide of the test chamber. Also, a method of testing a fluid, the method comprising injecting a fluid through an injection port of a test chamber into a sample cavity of a slide; moving the slide laterally within the test chamber to an intermediate position; moving the slide laterally within the test chamber to a test position; and actuating an x-ray fluorescence spectrometer to sample the fluid within the sample cavity when the slide is in the test position.Type: GrantFiled: March 28, 2013Date of Patent: January 26, 2016Inventors: Tore Stock, Egil Ronaes, Thomas Hilton
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Patent number: 9208987Abstract: A radioactive ray generating apparatus includes a second shielding member, a target, and a first shielding member, which are sequentially disposed from an electron emission source side. A shortest distance from a maximum radiation intensity portion of the target to the first shielding member is shorter than a shortest distance from the maximum radiation intensity portion of the target to the second shielding member.Type: GrantFiled: February 21, 2011Date of Patent: December 8, 2015Assignee: Canon Kabushiki KaishaInventors: Kazuya Miyazaki, Takao Ogura, Kazuyuki Ueda, Yasue Sato, Ichiro Nomura, Shuji Aoki, Miki Tamura
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Patent number: 9188553Abstract: An X-ray fluorescence analyzer includes a sample stage having an opening at an X-ray irradiation position, an X-ray source which irradiates a sample placed on the opening with a primary X-ray from below, a detector which detects an X-ray fluorescence generated from the sample, a transparent drop prevention plate supported to be advanced and retracted immediately below the opening, a drive mechanism which advances and retracts the drop prevention plate, an observation camera which observes the drop prevention plate positioned immediately below the opening, and an operation unit which processes an image of the drop prevention plate which is captured by the observation camera. The operation unit detects a foreign matter on the drop prevention plate based on an image difference between images before and after the drive mechanism moves or vibrates the drop prevention plate within an observation range of the observation camera.Type: GrantFiled: March 24, 2014Date of Patent: November 17, 2015Assignee: Hitachi High-Tech Science CorporationInventors: Masahiro Sakuta, Kiyoshi Hasegawa, Yoshiki Matoba
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Patent number: 9182363Abstract: An instrument and a method of detecting a target element in a multi-layer thin coating. L?, L? and L? x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using L? and L? intensities once, and then using the L? and L? intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.Type: GrantFiled: November 14, 2013Date of Patent: November 10, 2015Assignee: OLYMPUS NDT, INC.Inventor: Xunming Chen
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Patent number: 9146186Abstract: An assay device capable of assaying purity of a substance in an object includes a memory, an emitter, a receiver, a processing unit, and a display device. The memory stores names and standard densities of a number of substances. The emitter emits rays at the object. The receiver receives the rays reflected by the object. The processing unit calculates density of the object according to intensity of the emitted rays and intensity of the reflected rays. The processing unit further calculates purity of a selected substance in the object according to the density of the object and standard density of the selected substance stored in the memory, and outputs the calculated purity to the display device.Type: GrantFiled: October 18, 2011Date of Patent: September 29, 2015Assignees: Fu Tai Hua Industry (Shenzhen) Co., Ltd., HON HAI PRECISION INDUSTRY CO., LTD.Inventors: Cheng-Zhi Li, Jun Zhang, Jun-Wei Zhang, Tsung-Jen Chuang, Shih-Fang Wong
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Patent number: 9116107Abstract: The X-ray detection apparatus is equipped with an X-ray irradiation unit, an X-ray detector, a movable collimator and a shield for blocking X-rays. The shield blocks X-rays, which are to enter the X-ray detector directly from the X-ray irradiation unit. The shield also blocks fluorescent X-rays and scattered X-rays generated by irradiation of the collimator with X-rays. In such a manner, it is possible to prevent X-rays other than fluorescent X-rays from the sample S from being detected by the X-ray detector. The shield is joined with the collimator, so that the collimator and the shield move as a unit. It is possible to locate the shield even in a downsized X-ray detection apparatus.Type: GrantFiled: April 12, 2013Date of Patent: August 25, 2015Assignee: HORIBA, LTD.Inventors: Satoru Goto, Tomoki Aoyama
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Patent number: 9116106Abstract: The X-ray detection apparatus is equipped with an X-ray irradiation unit, an X-ray detector, and a movable collimator having a plurality of apertures. The collimator is provided with a window unit through which light passes, and the apertures and the window unit are aligned in one direction. The collimator moves in the direction so as to change the diameter of an aperture for narrowing X-rays from the X-ray irradiation unit to be used for irradiation of a sample and move to a position to allow an imaging unit to photograph a sample through the window unit. It becomes possible to photograph a sample even in a state where the X-ray irradiation unit, the X-ray detector and the collimator are positioned proximally to each other.Type: GrantFiled: April 12, 2013Date of Patent: August 25, 2015Assignee: HORIBA, LTD.Inventors: Satoru Goto, Yoshito Komada, Yoshiyuki Nakajima
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Patent number: 9057685Abstract: An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow.Type: GrantFiled: August 14, 2012Date of Patent: June 16, 2015Assignee: X-RAY OPTICAL SYSTEMS, INC.Inventors: George Allen, Stuart Shakshober, Sony Cheriyan
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Patent number: 8989344Abstract: A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: an X ray device, disposed over the coal and configured to emit an X ray to the coal; at least one X ray measuring device, disposed over the coal and configured to measure an energy spectrum of an X ray reflected by the coal; a distance sensor, disposed over the coal and configured to measure a distance between the coal and the at least one X ray measuring device; and a computing device, configured to receive the energy spectrum and the distance from the at least one X ray measuring device and the distance sensor and to compute the ash content and the calorific value of the coal according to the energy spectrum and the distance.Type: GrantFiled: December 20, 2012Date of Patent: March 24, 2015Assignee: Tsinghua UniversityInventors: Hongchang Yi, Qian Lin, Jianping Cheng
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Patent number: 8989346Abstract: From radiation images obtained by driving radiation tube with a plurality of tube voltages, including a normal tube voltage, a density gradient with respect to at least two sections of a reference substance having different radiation transmission characteristics is obtained for each of the plurality of tube voltages prior to obtaining a bone mineral density. If a radiation image captured for obtaining a bone mineral density is determined to have been captured under a tube voltage other than the normal tube voltage, an image signal representing the image and/or a bone mineral density analysis result is corrected so as to correspond to that which should have been obtained if the image had been captured under the normal tube voltage based on the relationship between the density gradient in the image and the density gradient in the radiation image captured under the normal tube voltage.Type: GrantFiled: December 20, 2012Date of Patent: March 24, 2015Assignee: FUJIFILM CorporationInventor: Kenji Yoshikawa
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Patent number: 8953741Abstract: A system and a method for measuring an ash content and a calorific value of a coal are provided. The system comprises: at least two dual-energy gamma ray transmission measuring devices and a computing device, in which at least one first dual-energy gamma ray transmission measuring device is disposed before an inlet of a coal combustion apparatus for measuring a first attenuation coefficient of a gamma ray from the at least one first dual-energy gamma ray transmission measuring device with regard to the coal; at least one second dual-energy gamma ray transmission measuring device is disposed after an outlet of the coal combustion apparatus for measuring a second attenuation coefficient of a gamma ray from the at least one second dual-energy gamma ray transmission measuring device with regard to a coal ash; and the computing device is configured to compute the ash content and the calorific value of the coal.Type: GrantFiled: October 19, 2012Date of Patent: February 10, 2015Assignee: Tsinghua UniversityInventors: Hongchang Yi, Lin Qian
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Patent number: 8903040Abstract: An X-ray multiple spectroscopic analyzer includes an X-ray source, an optical system inputting X-rays to a single-crystal sample, a sample stage supporting the single-crystal sample, an X-ray diffraction detector, a rotation driving system that changes the angle of the X-ray diffraction detector, an X-ray diffraction measurement data storage unit, a structural analysis data analyzing unit, an energy-dispersive X-ray fluorescence detector, an X-ray fluorescence measurement data storage unit, an X-ray fluorescence analyzing unit, an X-ray fluorescence analysis data storage unit, and X-ray fluorescence analysis data acquiring unit. The structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit.Type: GrantFiled: May 4, 2012Date of Patent: December 2, 2014Assignee: Rigaku CorporationInventors: Masataka Maeyama, Akihito Yamano
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Patent number: 8878090Abstract: The method relates to the field of mineral enrichment.Type: GrantFiled: November 8, 2011Date of Patent: November 4, 2014Assignee: Research and Production Enterprise “Bourevestnik”Inventors: Evgeny Nikolaevich Vladimirov, Leonid Vasilievich Kazakov, Vladimir Iosifovich Tsvetkov
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Patent number: 8873707Abstract: An apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. A plate has one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays.Type: GrantFiled: August 6, 2012Date of Patent: October 28, 2014Assignee: Caldera Pharmaceuticals, Inc.Inventors: Eva R. Birnbaum, Benjamin P. Warner, Sharon M. Baldwin, Jennifer A. Berger, Rebecca L. E. Miller
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Publication number: 20140307849Abstract: Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and at least one window protecting film allowing X-rays to pass through and providing protections to the window, the film being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film presently in use.Type: ApplicationFiled: April 10, 2014Publication date: October 16, 2014Applicant: OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INCInventors: Fabrice Cancre, Ted Michael Shields, Jiawei Tan
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Publication number: 20140301533Abstract: In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body configured to substantially protect a front of the spectrometer, the body including an aperture that includes a protective mesh. The protective mesh includes a high-strength, low-Z material, such as an arrangement of carbon fibers. A method of fabrication, a spectrometer and a method of using the spectrometer are disclosed.Type: ApplicationFiled: December 23, 2013Publication date: October 9, 2014Inventors: James L. Failla, JR., David A. Clifford, Wayne Allen Minter
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Publication number: 20140301532Abstract: In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body configured to substantially protect a front of the spectrometer, the body including an aperture that includes a protective mesh. The protective mesh includes a high-strength, low-Z material, such as an arrangement of carbon fibers. A method of fabrication, a spectrometer and a method of using the spectrometer are disclosed.Type: ApplicationFiled: October 10, 2013Publication date: October 9, 2014Inventors: James L. Failla, JR., David A. Clifford, Wayne Allen Minter
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Publication number: 20140301531Abstract: In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body configured to substantially protect a front of the spectrometer, the body including an aperture that includes a protective mesh. The protective mesh includes a high-strength, low-Z material, such as an arrangement of carbon fibers. A method of fabrication, a spectrometer and a method of using the spectrometer are disclosed.Type: ApplicationFiled: August 23, 2013Publication date: October 9, 2014Inventors: James L. Failla, JR., David A. Clifford, Wayne Allen Minter
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Publication number: 20140301530Abstract: In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body and an aperture that includes a protective mesh. The protective mesh includes a high-strength, low Z material, such as an arrangement of carbon fibers. A method of fabrication and a spectrometer are disclosed.Type: ApplicationFiled: April 8, 2013Publication date: October 9, 2014Inventors: James L. Failla, JR., David A. Clifford, Wayne Allen Minter
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Patent number: 8853584Abstract: Disclosed herein is the use of differences in x-ray linear absorption coefficients to process ore and remove elements with higher atomic number from elements with lower atomic numbers. Use of this dry method at the mine reduces pollution and transportation costs. One example of said invention is the ejection of inclusions with sulfur, silicates, mercury, arsenic and radioactive elements from coal. This reduces the amount and toxicity of coal ash. It also reduces air emissions and the energy required to clean stack gases from coal combustion. Removal of said ejected elements improves thermal efficiency and reduces the pollution and carbon footprint for electrical production.Type: GrantFiled: November 17, 2013Date of Patent: October 7, 2014Assignee: Mineral Separation Technologies Inc.Inventors: Charles E. Roos, Edward J. Sommer, Jr.
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Publication number: 20140294145Abstract: An X-ray fluorescence spectrometer includes: an X-ray source which irradiates a sample with primary X-rays; a light condensing device which condenses the primary X-rays to reduce an irradiation area on the sample; a detector which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a housing which accommodates the X-ray source and the light condensing device; a temperature sensor which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan which is disposed on the housing, and which can exchange internal air with external air; and a control section which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature.Type: ApplicationFiled: March 21, 2014Publication date: October 2, 2014Applicant: Hitachi High-Tech Science CorporationInventors: Ryusuke Hirose, Haruo Takahashi, Yoshiki Matoba, Koichi Tamura
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Publication number: 20140270063Abstract: A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area.Type: ApplicationFiled: March 13, 2014Publication date: September 18, 2014Applicant: X-RAY OPTICAL SYSTEMS, INC.Inventors: George ALLEN, John H. BURDETT, JR., Zewu CHEN, Leslie JOHNSON
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Patent number: 8835857Abstract: A device for a radiation detector includes a main body, which includes a material G and is at least partially provided with a coating. The coating has at least a first layer with a material A1. The material G of the main body can be excited by a primary radiation impinging on the coating, so that an x-ray fluorescence radiation is produced with an x-ray fluorescence spectrum, which has a maximum MG at an energy EG. Furthermore, at an energy E1, the material A1 has an absorption edge. In this case, the material A1 is chosen such that the relationships E1<EG and EG?E1?4 keV apply. Also specified is a radiation detector, which has the device and a detector element, which is suitable for the detection of the primary radiation.Type: GrantFiled: August 9, 2012Date of Patent: September 16, 2014Assignee: Ketek GmbHInventor: Tobias Eggert
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Patent number: 8774356Abstract: In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (11), when correcting a counting rate of pulses determined by a counting unit (10) on the basis of a dead time of a detector (7), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (9), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation.Type: GrantFiled: April 3, 2012Date of Patent: July 8, 2014Assignee: Rigaku CorporationInventors: Yoshiyuki Kataoka, Hisashi Inoue, Kosuke Kawakyu
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Patent number: 8766129Abstract: The method relates to the field of mineral enrichment. It involves setting a threshold value for the intensity of a luminescence signal after a given time following the end of a pulse of exciting radiation, measuring, in the course of registering the intensity of the luminescence signal of a mineral, the intensity of the luminescence signal after a given time following each pulse of exciting radiation, recording the intensity value obtained for each luminescence signal if the signal registered exceeds the set threshold value, comparing the value measured in the current period with the values obtained in the preceding periods, determining the period in which the intensity value was at its peak, and processing the luminescence signal in which the value of the measured intensity was at its peak in order to determine the separation parameters; a decision to separate the mineral to be enriched is taken in the event that the separation parameters are inside the range of given values.Type: GrantFiled: November 8, 2011Date of Patent: July 1, 2014Assignee: Research and Production Enterprise “Bourevestnik”Inventors: Leonid Vasilievich Kazakov, Natalia Pavlovna Kolosova
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Publication number: 20140161224Abstract: A method and a system for bump's inspection are disclosed. The inspection done by comparing the volume of the bump's outside contour and the volume the solid materials from which the bump is made and/or analyzing the bump's solid materials ratio. Principally, the inspection id done by preparing an empiric reference table of the emitted energy received from the solid materials, from which a reference proper bump with a given volume is comprised, using ED-XRF (Energy-Dispersive-X-ray-Fluorescence analysis) analyze; obtaining a first calculated volume of the bump, using a 3D image-processing method; adapting the reference table according to the difference between the given volume and the first calculated volume of the bump; performing a second volume calculation of the bump by applying ED-XRF technology. The difference between the first and second volume calculations and the solid material combination are used to inspect the bump.Type: ApplicationFiled: September 2, 2012Publication date: June 12, 2014Applicant: XWINSYS LTD.Inventors: MICHA Geffen, Doron Reinis
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Publication number: 20140140473Abstract: An instrument and a method of detecting a target element in a multi-layer thin coating. L?, L? and L? x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using L? and L? intensities once, and then using the and Ly intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating.Type: ApplicationFiled: November 14, 2013Publication date: May 22, 2014Inventor: Xunming Chen
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Patent number: 8693626Abstract: Methods are disclosed utilizing synchrotron X-ray microscopy including x-ray fluorescence and x-ray absorption spectra to probe elemental distribution and elemental speciation within a material, and particularly a solid that may have one or more elements distributed on a solid substrate. Representative materials are relatively homogeneous in composition on the macroscale but relatively heterogeneous on the microscale. The analysis of such materials, particularly on a macroscale at which their heterogeneous nature can be observed, provides valuable insights into the relationships or correlations between localized concentrations of elements and/or their species, and concentrations of other components of the materials. Sample preparation methods, involving the use of a reinforcing agent, which are advantageously used in such methods are also disclosed.Type: GrantFiled: June 17, 2011Date of Patent: April 8, 2014Assignee: UOP LLCInventors: Simon Russell Bare, Shelly D Kelly, Wharton Sinkler, Nan Greenlay
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Patent number: 8693625Abstract: Methods and apparatus for adapting the shaping time and/or other pulse processing parameters of an x-ray detector (114) in accordance with the elemental composition of a sample and/or energy resolving requirements. X-rays (104) are directed from a source (102) onto a sample (110) and the radiation (108) responsively emitted from the sample (e.g., fluoresced radiation characteristic of the sample's elemental composition) and detected by an x-ray detector (114) that generates pulses representative of the energy and intensity of the incident radiation. Based upon initial analysis of elemental composition, the shaping time and/or other pulse processing parameter (s) are set to optimize count rate subject to constraints of energy resolution in a spectral region of interest.Type: GrantFiled: November 4, 2009Date of Patent: April 8, 2014Assignee: Thermo Scientific Portable Analytical Instruments Inc.Inventors: Michael E. Dugas, Lee Grodzins
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Publication number: 20140091216Abstract: A sample analyzer is offered which creates a ternary scatter diagram representing a concentration ratio distribution of three elements out of several elements to be analyzed. This three-dimensional graph is created by adding an axis to the ternary scatter diagram and representing concentration information about the two additional elements on the added axis. The sample analyzer performs elemental analysis of a sample by scanning a primary beam over the sample and detecting a signal emanating from the sample. The added axis intersects the plane of the ternary scatter diagram.Type: ApplicationFiled: September 25, 2013Publication date: April 3, 2014Applicant: JEOL Ltd.Inventor: Shingo Kinoshita
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Patent number: 8653457Abstract: A method of examining a sample using a spectroscopic apparatus, comprising the following steps: Mounting the sample on a sample holder; Directing a focused input beam of radiation onto a location on the sample, thereby producing an interaction that causes a flux of stimulated photonic radiation to emanate from said location; Examining said flux using a multi-channel photon-counting detector, thus accruing a measured spectrum for said location; Automatically repeating said directing and examining steps for a series of successive locations on the sample, which method comprises the following steps: Choosing a beam parameter of the input beam that will influence a magnitude of said flux of stimulated photonic radiation; For each location within a first set of locations on the sample, accruing a spectrum using a first value of said beam parameter; For each location within a second set of locations on the sample, accruing a spectrum using a second value of said beam parameter, different from said first value.Type: GrantFiled: July 19, 2013Date of Patent: February 18, 2014Assignee: FEI CompanyInventor: Sander Richard Marie Stoks
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Publication number: 20140037053Abstract: An X-ray fluorescence analyser is provided which comprises: (1) an X-ray source selected to produce an intense X-ray beam, (2) a first optical element that focuses the X-ray beam produced by the X-ray source onto a sample and selects X-rays of a desired energy, (3) an energy resolving detector, and (4) a second optical element that receives fluorescent X-rays emitted from elements in the sample and focuses a selected energy range of said fluorescent X-rays onto said energy resolving detector. Each of the first and second optical elements includes a crystal component. The X-ray fluorescence analyser is configured such that: (i) the X-ray source has a spot size dimensioned so that it is substantially in a field of view of the first optical element, and (ii) the first optical element focuses the X-ray beam emitted by the X-ray source onto an area of the sample that corresponds to a field-of-view of the second optical element.Type: ApplicationFiled: August 2, 2013Publication date: February 6, 2014Applicant: COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATIONInventors: Yves Leon VAN HAARLEM, James TICKNER
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Patent number: 8644450Abstract: The X-ray fluorescence spectrometer of the present invention includes a sample table (8) for a sample (S) having a crystalline structure, an X-ray source (1), a detecting unit (7) for detecting secondary X-rays (4) from the sample (S), a rotating unit (11) for rotating the sample table (8), a parallel translating unit (12) for causing the sample table (8) to undergo a parallel translational movement, a selecting unit (17) for selecting three of circumvent angles, at which diffracted X-rays can be circumvented, based on a diffraction profile obtained from the angle of rotation of the sample (S) and the intensity of secondary X-rays (4), the interval between the neighboring circumvent angles being smaller than 180°, and a control unit (15) for controlling the rotating unit (11) so as to set the sample (S) at the circumvent angle at which the sample table (8) will not interfere with any other structures.Type: GrantFiled: April 21, 2011Date of Patent: February 4, 2014Assignee: Rigaku CorporationInventors: Hiroaki Kita, Hiroshi Kobayashi
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Publication number: 20140020603Abstract: The present application provides a method for analyzing a raw material for manufacturing of gypsum products, analyzing a plurality of gypsum products, and the gypsum products produced therefrom. Desirably, the analyzing of the raw material is conducted using prompt gamma neutron activation analysis.Type: ApplicationFiled: July 18, 2013Publication date: January 23, 2014Applicant: Georgia-Pacific Gypsum LLCInventors: William E. Barger, Carmine Perri
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Publication number: 20140016745Abstract: The method of steel grade determination for a steel material having a substantially circular cross-section comprise: a detection step in which while a measurement section 2 including an irradiation section 21 for performing X-ray irradiation and a detection section 22 for detecting fluorescent X-rays is relatively moved along an outer peripheral surface of the steel material 4 with respect to the steel material for a predetermined time period necessary for analysis, the steel material is irradiated with X-rays from the irradiation section, and fluorescent X-rays radiated from the steel material are detected by the detection section; a calculation step of calculating a composition of the steel material based on fluorescent X-rays detected in the detection step; and a determination step of determining a steel grade of the steel material according to the composition calculated in the calculation step.Type: ApplicationFiled: January 19, 2012Publication date: January 16, 2014Applicant: NIPPON STEEL & SUMITOMO METAL CORPORATIONInventors: Kenji Fujiwara, Hiroshi Kubota
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Patent number: 8611494Abstract: In the present disclosure, before disassembly of liquid crystal module (1) having liquid crystal panel (2) and a back light, irradiation is performed with X-rays (13) from the front surface side of liquid crystal panel (2) of liquid crystal module (1). By this irradiation with X-rays (13), generated fluorescent X-rays (14) are detected to analyze an element contained in liquid crystal panel (2), while X-rays (17) backscattered or transmitted to the rear surface side of liquid crystal module (1) are detected to determine a type and a state of the back light. Then, based on the determined type and state of the back light, liquid crystal module (1) is disassembled.Type: GrantFiled: March 8, 2013Date of Patent: December 17, 2013Assignee: Panasonic CorporationInventor: Hiroshi Iwamoto
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Patent number: 8582717Abstract: In the present invention, a fluorescent X-ray analysis is made for a sample such as a liquid fuel including an object component such as sulfur. A background related to scattered X-rays and a system peak is subtracted from a fluorescent X-ray intensity of the object component, which is obtained from a spectrum acquired by the fluorescent X-ray analysis. A correction corresponding to the composition of the sample is performed for the fluorescent X-ray intensity obtained by subtracting the background. A calibration curve representing the relation between a value, which is obtained after performing the correction for the fluorescent X-ray intensity obtained by subtracting the background, and a concentration of the object component is preset. The concentration of the object component in the sample is calculated on the basis of the calibration curve.Type: GrantFiled: November 5, 2010Date of Patent: November 12, 2013Assignee: Horiba, Ltd.Inventor: Sumito Ohzawa
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Patent number: 8568673Abstract: A gas analysis device according to the present invention includes a flue-gas extraction pipe for extracting flue gas from a flue gas duct to which flue gas including both of NH4Cl and SO3 is fed, a collector that is provided in the flue-gas extraction pipe, for removing soot dust contained in the extracted flue gas, a roll filter that is provided in the flue-gas extraction pipe, for depositing both of NH4Cl and SO3 contained in the flue gas, and a measurement device for measuring both of NH4Cl and SO3 contained in the flue gas by irradiating a sample including both of NH4Cl and SO3 deposited by the roll filter with X-rays and detecting fluorescent X-rays generated from the sample.Type: GrantFiled: September 22, 2011Date of Patent: October 29, 2013Assignee: Mitsubishi Heavy Industries, Ltd.Inventors: Seiji Kagawa, Masaru Chiyomaru, Nobuyuki Ukai, Takuya Okamoto, Moritoshi Murakami
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Publication number: 20130279652Abstract: Provided is a measuring apparatus which is capable of measuring the distribution of a specific element in a specimen by soft X rays in a state where there is no effect by a staining agent and the like even though the specimen is composed of living single cells or cell aggregates living as they are, extracted in vitro from an organism. A measuring apparatus using soft X rays includes a connection part which is connected with a soft X ray beam line, a mechanism which light-collects a spot size of soft X rays into a micro beam, and a low vacuum vessel having a measurement chamber in which a specimen is disposed.Type: ApplicationFiled: March 15, 2013Publication date: October 24, 2013Applicant: HITACHI, LTD.Inventors: Akira NAMBU, Kazuhiro UEDA, Tsuyoshi YAMAMOTO, Hideaki KOIZUMI, Tomihiro HASHIZUME