Flaw Analysis Patents (Class 378/58)
  • Patent number: 6157698
    Abstract: A method for determining the properties of a log, in which a moving log is radiographed by at least more than one X-radiation source, and the radiographic information is received by a detector array measuring radiation. Stemwood and knots of the log are calculated by a principle which is based on a known geometry and density of stemwood and knots. After measurement, the effect of stemwood in radiographic projections, and hence the analysis for locating knots, is eliminated by filtering. The knot mass is then converted from radiographic projections into volumetric elements of a cylindrical coordinate system and, from the value of each volumetric element, an evidence value representative of the presence of a knot in the element is derived. The evidence values of mutually associated elements are then combined, thus producing an aggregate evidence value which permits the knots to be located.
    Type: Grant
    Filed: October 30, 1998
    Date of Patent: December 5, 2000
    Assignee: Bintec Oy
    Inventors: Markku Pietikainen, Heikki Ailisto
  • Patent number: 6157699
    Abstract: X- or .gamma.-radiation is utilized during non-destructive examination of a sample, to detect hidden flaws in a test sample by generating a number referred to as a single figure-of-merit. The figure-of-merit is obtained by comparing the set of responses obtained from radiation emanating from a standard sample with a set of responses obtained from radiation emanating from a test sample. The resulting figure-of-merit is then compared with a reference value as an indicator of the presence of a flaw.
    Type: Grant
    Filed: May 14, 1999
    Date of Patent: December 5, 2000
    Assignee: Scannex, Inc.
    Inventor: William L. Dunn
  • Patent number: 6151380
    Abstract: This invention relates to a system for the removal and reattachment of a ball grid array (BGA) package component to a printed circuit board, that is adapted for the real time X-ray inspection of BGA package removal and reattachment. The system comprises heating means comprising upper and lower heating platens juxtaposed to each other for the reception, support and application of heat to the workpiece comprising the BGA package and the printed circuit board, wherein the heating means is prepared from materials that are transmissive to X-ray radiation. Suitable x-ray transmissive materials are selected from high melting point polymers, aluminum, glasses and ceramics, and include materials having an atomic number less than 14.
    Type: Grant
    Filed: February 10, 1999
    Date of Patent: November 21, 2000
    Assignee: Glenbrook Technologies Inc.
    Inventors: Gilbert Zweig, David Zweig
  • Patent number: 6137860
    Abstract: Disclosed is a weld inspection system that utilizes an automated digital radiographic camera and control system to generate and review digital X-ray images of the weld seam. The weld inspection system is mountable onto the weld fixture, such that the weld inspection system can inspect welds upon completion of welding operations while the barrel panels are still clamped in the weld fixture. The digital radiographic camera includes a fiber optic scintillator x-ray to light conversion screen coupled to a high resolution charged coupled device (CCD) camera to produce digital radiographic images of a portion of the weld between welded barrel panels. An X-ray source is located in a shielded housing which is attached to a carriage that is movably mounted to the vertical weld fixture on the convex side of the barrel weld. The digital radiographic camera is attached to a carriage that is movably mounted to the vertical weld fixture on the concave side of the barrel weld.
    Type: Grant
    Filed: August 17, 1999
    Date of Patent: October 24, 2000
    Assignee: Lockheed Martin Corporation
    Inventors: John P. Ellegood, Blaine J. Wiltshire, Marion D. Barker, Lee M. Klynn
  • Patent number: 6049585
    Abstract: An apparatus for X-ray inspection of liquid foodstuffs contained in glass vessels such as jars or bottles, comprising a conveyor, along which a plurality of such vessels is moved, having a horizontal path, a section for the inlet and a section for the outlet of said vessels, and a device fitted along said horizontal path for inspecting said vessels and detecting the presence of contaminants in said liquid foodstuff. The apparatus provides for two arcuate connecting sections between said inlet and outlet sections, respectively. The connecting sections extend in vertical directions with the vessel advancing direction varying by 180.degree. with respect to a horizontal axis, whereby said inspection device controls the vessels in an upturned position.
    Type: Grant
    Filed: May 11, 1998
    Date of Patent: April 11, 2000
    Assignee: Dylog Italia SpA
    Inventor: Rinaldo Ocleppo
  • Patent number: 6049586
    Abstract: A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.
    Type: Grant
    Filed: June 7, 1999
    Date of Patent: April 11, 2000
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kitaguchi, Shigeru Izumi, Hiroshi Miyai, Katsutoshi Sato, Yasuko Aoki, Yukiya Hattori
  • Patent number: 6047041
    Abstract: A method of comparison includes the step (14) of obtaining an interior and exterior image of an object to be compared. A standard of measurements for an acceptable object is created in step (12). An automatic comparison is made in step (14) of the image of the object to be compared with the standard and a comparison report is generated in step (16) listing deviations of the image of the object to be compared from the standard for the acceptable object. An x-ray CT scanner (76) may be utilized for obtaining the images and the standard may be derived from an actual, acceptable object or from design specifications for acceptable objects. In a preferred embodiment, CAD designs are utilized to create the standards for comparison.
    Type: Grant
    Filed: September 8, 1997
    Date of Patent: April 4, 2000
    Assignee: Scientific Measurement System
    Inventor: Hunter Ellinger
  • Patent number: 6009145
    Abstract: This invention relates to a system for the removal and reattachment of a ball grid array (BGA) package component to a printed circuit board, that is adapted for the real time X-ray inspection of BGA package removal and reattachment. The system comprises heating means comprising upper and lower heating platens juxtaposed to each other for the reception, support and application of heat to the workpiece comprising the BGA package and the printed circuit board, wherein the heating means is prepared from materials that are transmissive to X-ray radiation. Suitable x-ray transmissive materials are selected from high melting point polymers, aluminum, glasses and ceramics, and include materials having an atomic number less than 14.
    Type: Grant
    Filed: February 11, 1998
    Date of Patent: December 28, 1999
    Assignee: Glenbrook Technologies Inc.
    Inventors: Gilbert Zweig, David Zweig
  • Patent number: 6005912
    Abstract: Inspection apparatus for product-containing glass vessels and/or cans for the food industry, having a static structure including two modular units mutually placed at 90.degree. in relation to each other and placed at 45.degree. with respect to a line of vessels being conveyed by the apparatus, one unit being equipped with a semi-panoramic emitter and a sensor, the other unit being equipped only with a sensor, equal to the sensor of the first unit. With this inspection structure with a single emitter and two sensors a 100% inspection is realized.
    Type: Grant
    Filed: March 24, 1998
    Date of Patent: December 21, 1999
    Assignee: Dylog, Italia, S.p.A.
    Inventor: Rinaldo Ocleppo
  • Patent number: 6002740
    Abstract: Inspection of objects such as X-ray lithography masks is carried out by passing X-rays or extreme ultraviolet light through an object which absorbs in a pattern to provide a patterned X-ray or ultraviolet image which is then directed to a converter. The converter converts the image incident upon it to an image formed by electrons emitted from the converter. The emitted electrons are magnified in an electron microscope and the magnified electron image is displayed by the electron microscope. The visible image may be further digitized and processed by a computer, including long-term storage or display on a computer monitor. X-ray lithography masks may be inspected by passing X-rays through masks of the same type that will be used for lithography so that the magnified image of the X-rays passed through the masks corresponds to the pattern of X-rays that will be incident on a photoresist, allowing accurate inspection of X-ray masks before use.
    Type: Grant
    Filed: October 2, 1997
    Date of Patent: December 14, 1999
    Assignee: Wisconsin Alumni Research Foundation
    Inventors: Franco Cerrina, Thomas B. Lucatorto
  • Patent number: 5892808
    Abstract: A feature detection apparatus includes a reflective imaging system, a transmissive imaging system, and memory for generating an image of a workpiece. The reflective imaging system generates a first bit image of a surface of the workpiece. The transmissive imaging system generates a second, different bit image of the density of the workpiece. The two images are then combined in memory into a more complete image that contains data describing the surface and interior of the workpiece. The apparatus also includes a filter for enhancing the combined bit image so that physical features of the workpiece are accurately detected. The filter is constructed to perform the following steps. For detecting a feature of interest, the filter determines a mean, standard deviation, and normal distribution of the image's pixel intensities.
    Type: Grant
    Filed: January 30, 1997
    Date of Patent: April 6, 1999
    Assignee: Techne Systems, Inc.
    Inventors: John R. Goulding, Cary S. Kiest, Joseph G. LaChapelle
  • Patent number: 5864600
    Abstract: A container inspection system for inspecting a moving container includes a radiation source positioned to direct radiation at the moving container. A radiation detector is positioned to receive a portion of the radiation from the radiation source that is not absorbed or blocked by the moving container and to generate electrical signals in response thereto. Processing circuitry produces multi-dimensional image data for the moving container based on the electrical signals generated by the radiation detector, and compares at least a first portion of the multi-dimensional image data to a corresponding portion of the multi-dimensional image data for a standard container.
    Type: Grant
    Filed: February 6, 1997
    Date of Patent: January 26, 1999
    Assignee: Thermedics Detection Inc.
    Inventors: Glenn Gray, Clayton Wood, Helmut W. Klotzsch
  • Patent number: 5848118
    Abstract: A method and apparatus is provided for inspection in real-time of inhomogeneities at particular locations of objects using x-radiation. An object is fixed on a conveyor by a system of clamps, and a manipulator positions an x-ray source and detector such that the particular location to be inspected is between the two. X-ray photons passing through the spot to be inspected are recorded by the detector. When the manipulator is at the required position, the electronic control system (ECS) gives a `start` signal and the monitor begins to count the pulses from the detector. After a specified time, a `stop` signal passes from the ECS, and the monitor stops counting, while the manipulator passes to the following position to be inspected. The information coming from the detector is processed in the monitor. If no inhomogeneities are detected, the monitor gives permission for inspection of the following object, otherwise an alarm signal is triggered.
    Type: Grant
    Filed: June 19, 1997
    Date of Patent: December 8, 1998
    Assignee: Lear Corporation
    Inventor: Samvel Goukassian
  • Patent number: 5836504
    Abstract: It is an object of the present invention to provide a method and an apparatus for soldering inspection of a surface mounted circuit board, which can improve an inspection accuracy by obtaining a highly accurate X-rays transmission image corresponding to a real shape of the mounted surface.
    Type: Grant
    Filed: February 28, 1997
    Date of Patent: November 17, 1998
    Assignee: Kabushiki Kaisha Kobe Seiko Sho
    Inventors: Shiro Koike, Yasuo Morita, Yasunori Kakebayashi, Eiji Yoshida, Taro Nishijima, Yoshikazu Mori
  • Patent number: 5828723
    Abstract: A non destructive method determines the three-dimensional structure of a body opaque to visible light, by means of radiations from a single body, particularly suitable for parts of a reinforced concrete structure, wherein the distance between the source and the sensitive plate is shorter than that of the prior art, and wherein the labor time at the body site is substantially less than that of the prior art.
    Type: Grant
    Filed: February 15, 1996
    Date of Patent: October 27, 1998
    Assignee: Tomografia De Hormigon Armado S.A.
    Inventor: Mario A. J. Mariscotti
  • Patent number: 5778042
    Abstract: A method for inspecting masks used in x-ray lithography is described. An x-ray lithography mask is placed over a glass surface, followed by exposure of the mask and glass surface to soft x-rays. Portions of the mask absorb the soft x-rays while other portions of the mask, corresponding to circuit elements, allow the soft x-rays to strike the glass surface. The soft x-rays striking the glass surface cause the glass surface to darken, thereby forming an image of the circuit pattern in the glass surface corresponding to the stenciled circuit in the mask. An inspection of the image can reveal any defects in the x-ray lithography mask.
    Type: Grant
    Filed: July 18, 1996
    Date of Patent: July 7, 1998
    Assignee: University of Hawaii
    Inventor: William Pong
  • Patent number: 5754621
    Abstract: An X-ray inspection apparatus and method in which an object to be inspected is irradiated with characteristic X-rays containing at least one wavelength which affords a high X-ray absorbance in the object to be inspected. A transmitted X-ray image which has passed through the object to be inspected is detected, and the object to be inspected is inspected on the basis of the transmitted X-ray image. The method and apparatus are utilized to fabricate a multi-layer printed circuit board.
    Type: Grant
    Filed: December 18, 1996
    Date of Patent: May 19, 1998
    Assignee: Hitachi, Ltd.
    Inventors: Yoko Suzuki, Hideaki Doi, Yasuhiko Hara, Koichi Karasaki, Tadashi Iida
  • Patent number: 5740221
    Abstract: An x-ray inspection apparatus designed for safe, efficient, simple and rapid inspection of assembled automotive airbag inflators to detect the presence of defects in construction. The apparatus includes a lead-lined cabinet having spaced apart entry and exit openings and a central inspection space intermediate thereto which houses a continuous source of x-rays and an x-ray visual imaging system for converting x-radiation into a visible image that can be compared to a standard in order to determine whether the inflator has been properly constructed. The apparatus also includes a conveyor for moving inflators into and out of the x-ray cabinet. The entry and exit sections of the x-ray cabinet are sealed with respective single rotating doors. Each rotating door includes a rotatable cylindrical drum having only one opening in the sidewall of the drum configured to receive an inflator.
    Type: Grant
    Filed: October 29, 1996
    Date of Patent: April 14, 1998
    Assignee: Morton International, Inc.
    Inventors: Kerry J. Norman, Brian L. Baxter, Kenneth D. Fowler, Daren L. Sagers, Michael J. Hill, Jeffery P. England
  • Patent number: 5712893
    Abstract: A real time radiographic inspection system for inspecting a part includes a first, generally cylindrical housing having inner and outer substantially cylindrical coaxially aligned walls defining a substantially annular chamber therebetween. First and second through openings are formed in the outer cylindrical wall spaced substantially 180.degree. apart. A through opening is formed in the inner wall aligned with the first through opening in the outer wall. A second housing extends radially outwardly from and surrounds the first through opening in the outer wall, while the second through opening in the outer wall defines an entrance to the annular chamber. An X-ray source is mounted in one of the first and second housings for directing an X-ray beam through the aligned through openings of the inner and outer walls. An image intensifier is mounted in the other of the first and second housings in alignment with the aligned through openings and positionable in registry with the X-ray beam.
    Type: Grant
    Filed: November 5, 1996
    Date of Patent: January 27, 1998
    Assignee: Morton International, Inc.
    Inventors: Kerry R. Dykster, Jeffery P. England
  • Patent number: 5687209
    Abstract: An improved laminography system with automatic test object warp compensation that allows for generation of high speed and high resolution X-ray laminographs by using a continuous scan method with two or more linear detectors and one or more collimated X-ray sources. Discrete X-ray images, with different viewing angles, are generated by each detector. The discrete X-ray images are analyzed by a computer to generate Z-axis test object warp compensation parameters based upon the location of a pre-determined feature in the test object. The discrete X-ray images are then combined by a computer using the warp compensation parameters to generate laminographic images of different planes in the object under test, or analyzed in such a manner to derive useful data about the object under test. In one embodiment, the improved scanning laminography system does not require any motion of the source or detectors, but simply a coordinated linear motion of the object under test.
    Type: Grant
    Filed: September 13, 1996
    Date of Patent: November 11, 1997
    Assignee: Hewlett-Packard Co.
    Inventor: John A. Adams
  • Patent number: 5673298
    Abstract: A method for automatically analyzing the morphometry of bones from data obtained by lateral digital scans of the bone obtains a matrix of data values assembled from an x-ray scan. The matrix is analyzed to locate an axis of the bone from which subsequent measures may be referenced. Once the axis is fixed, one or more of several useful indicia of bone condition such a length or interbone spacing can be calculated. The measures are compared to a set of reference values that has been normalized to lumbar vertebrae of the patient.
    Type: Grant
    Filed: August 15, 1996
    Date of Patent: September 30, 1997
    Assignee: Lunar Corporation
    Inventor: Richard B. Mazess
  • Patent number: 5654994
    Abstract: A process for detecting the stroke motion of a body, which is displaceable in a housing, such as a valve member of an injection valve, by a measurement device disposed outside the housing, in which the stroke motion of the body is detected by means of an X-radiation penetrating the housing and detected by the measuring device.
    Type: Grant
    Filed: March 15, 1996
    Date of Patent: August 5, 1997
    Assignee: Robert Bosch GmbH
    Inventor: Heinz-Arno Marto
  • Patent number: 5638420
    Abstract: A radiographic inspection apparatus for large containers, vehicles and structures having a movable frame which can straddle the container or object being inspected. The straddling frame has opposed parallel sides which carry a source of penetrating radiation and a detector array. The source or sources and detectors are moved along the length of a container while radiographic image data is being sequentially recorded. By summing or collecting the sequence of data over the length of a container as the straddling frame moves along, a full two-dimensional radiographic image of the container may be obtained. Radiographic images may be enhanced either by providing uniform motion for the straddling frame or by measuring non-uniform motion and compensating corresponding regions of the radiographic image.
    Type: Grant
    Filed: July 3, 1996
    Date of Patent: June 10, 1997
    Assignee: Advanced Research and Applications Corporation
    Inventor: Robert A. Armistead
  • Patent number: 5629966
    Abstract: A real time radiographic test system comprises a protective housing and a conveyor for conveying articles to be tested through the housing. A real time radiographic test instrument is located in the housing for performing a real time radiographic test on the article. The real time radiographic test instrument includes X-ray equipment disposed for directing an X-ray beam within the housing in a direction which does not intersect the conveyor. An article-handling actuator is located in the housing for repositioning an article from the conveyor to a position in registry with the X-ray beam, for maintaining the article in registry with the X-ray beam while the real time radiographic test is performed on the article and thereafter returning the article to the conveyor. The article-handling actuator and the X-ray equipment are designed such that each article to be tested is positioned substantially identically relative to the X-ray beam.
    Type: Grant
    Filed: April 8, 1996
    Date of Patent: May 13, 1997
    Assignee: Morton International, Inc.
    Inventors: Kerry R. Dykster, Jeffrey P. England, Ronda R. Devereaux
  • Patent number: 5610966
    Abstract: A method and apparatus are disclosed for non-invasively determining the wear of a liner separating a rotatable bearing from a generally spherical housing. The method includes digitizing a first radiographic image of the bearing and housing and processing elements making up the image to define and locate the centers of the bearing and housing within the image. The process is also undertaken for a second radiograph image of the bearing and housing taken earlier than the first radiograph. The movement of the center of the bearing relative to the center of the housing during the time period between the making the first radiographic image and the second radiographic image being related to the wear of the liner.
    Type: Grant
    Filed: February 15, 1995
    Date of Patent: March 11, 1997
    Assignee: Argonne National Laboratories/University of Chicago Development Corp.
    Inventors: John M. Martell, Sunjay Berdia
  • Patent number: 5602890
    Abstract: A container inspection system for inspecting a moving container includes a radiation source positioned to direct radiation at the moving container. A radiation detector is positioned to receive a portion of the radiation from the radiation source that is not absorbed or blocked by the moving container and to generate electrical signals in response thereto. Processing circuitry produces multi-dimensional image data for the moving container based on the electrical signals generated by the radiation detector, and compares at least a first portion of the multi-dimensional image data to a corresponding portion of the multi-dimensional image data for a standard container.
    Type: Grant
    Filed: September 27, 1995
    Date of Patent: February 11, 1997
    Assignee: Thermedics Detection Inc.
    Inventors: Glenn Gray, Clayton Wood, Helmut W. Klotzsch
  • Patent number: 5594770
    Abstract: A method and apparatus are provided for imaging obscured areas of a test object. The apparatus includes an x-ray source having a cathode for producing a steerable electron beam. A controller directs the electron beam to predetermined locations on a target anode. The user may flexibly select appropriate predetermined positions. The predetermined locations may be obtained from the geometry of an obscuration. A detector receives x-rays that are transmitted through the test object from each of the predetermined locations, and produces images corresponding to each of the predetermined locations. The images are digitized and may be combined to produce an unobscured image of a region of interest.
    Type: Grant
    Filed: November 18, 1994
    Date of Patent: January 14, 1997
    Assignee: ThermoSpectra Corporation
    Inventors: Philip Bowles, Eric Duff, Dale D. Thayer
  • Patent number: 5594768
    Abstract: A laminograph including, a radiation source for generating radiation towards a subject, a radiation surface sensor device with a two-dimensional resolution, fitted opposite to the radiation source for detecting the radiation from the radiation source which has passed through the subject, a scanning device for moving the subject to take a plurality of different positions between the radiation source and the radiation surface sensor device and for scanning the subject in each of the different positions by the radiation from the radiation source.
    Type: Grant
    Filed: May 11, 1995
    Date of Patent: January 14, 1997
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Masashi Fujii, Kiichiro Uyama, Takeo Tsuchiya, Miki Mori, Hideo Kosuge, Hirokatsu Suzuki
  • Patent number: 5570407
    Abstract: The cavities of IC's are inspected for contaminants rising a point source x-ray. The IC's are arranged on a curved surface, approximating the arc formed by the radiation from the point source x-ray. In this way, the IC's may be stood on end with the sides parallel to the x-ray radiation. In this arrangement, the radiation from the x-ray point source passes approximately parallel to the IC size and a clear image of the cavity is achieved without distortion produced by the x-rays passing thou the bottom or the top. Alternately, the curved surface for mounting the IC's may be formed of small straight sections formed at angles approximating the curve.
    Type: Grant
    Filed: June 30, 1994
    Date of Patent: October 29, 1996
    Assignee: Harris Corporation
    Inventors: Eduardo Pesante, Terry Hammond, Gordon DeBoer
  • Patent number: 5561696
    Abstract: A method and apparatus which incorporate self learning techniques for the detection of solder defects and for statistical process control of solding operations on printed circuit board assemblies (PCBA) are disclosed. The invention includes learning techniques which are used during the inspection of cross-sectional X-ray images of solder joints. These learning techniques improve measurement accuracy by accounting for localized shading effects, which can occur when inspecting double-sided printed circuit board assemblies. Two specific examples are discussed. The first is a method for detection of solder short defects. The second method utilizes learning to improve the accuracy of statistical process control (SPC) measurements.
    Type: Grant
    Filed: May 2, 1995
    Date of Patent: October 1, 1996
    Assignee: Hewlett-Packard Company
    Inventors: John A. Adams, Bruce D. Baker, Robert L. Corey, Edward W. Ross
  • Patent number: 5559848
    Abstract: A system is provided for inspecting components, especially plastic components such as contact lens casting cup assemblies. A process for inspecting such components is also provided. The process comprises transmitting x-rays through the object to be inspected and then onto an image sensing means.
    Type: Grant
    Filed: August 16, 1994
    Date of Patent: September 24, 1996
    Assignee: Wesley-Jessen Corporation
    Inventor: Theresa A. Collins
  • Patent number: 5541856
    Abstract: An x-ray inspection machine particularly suited for use on an assembly line has a narrow footprint produced by mounting opposed x-ray tube and camera on independently movable stages locked together by way of a central computer rather than a physical member. The stages are aligned by using position sensors at home positions and a fiduciary mark on the part to be inspected. The independent motion of the stages permits a limited range of angled inspections to be obtained without additional angulation mechanisms.
    Type: Grant
    Filed: November 8, 1993
    Date of Patent: July 30, 1996
    Assignee: Imaging Systems International
    Inventor: David W. Hammermeister
  • Patent number: 5524038
    Abstract: A method of non-destructively inspecting a curved wall portion of a large and thick walled vessel for a defect by computed tomography is provided. A collimated source of radiation is placed adjacent one side of the wall portion and an array of detectors for the radiation is placed on the other side adjacent the source. The radiation from the source passing through the wall portion is then detected with the detectors over a limited angle, dependent upon the curvature of the wall of the vessel, to obtain a dataset. The source and array are then coordinately moved relative to the wall portion in steps and a further dataset is obtained at each step. The plurality of datasets obtained over the limited angle is then processed to produce a tomogram of the wall portion to determine the presence of a defect therein. In a preferred embodiment, the curved wall portion has a center of curvature so that the source and the array are positioned at each step along a respective arc curved about the center.
    Type: Grant
    Filed: January 3, 1995
    Date of Patent: June 4, 1996
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventor: James T. Fong
  • Patent number: 5524132
    Abstract: A process and apparatus for revealing manufacturing defects in testpieces, such as printed circuit boards, by passing through high-intensity attenuated x-rays (above 150 Kilo-Volts) to reusable photo plates for revealing defects in the testpieces. The x-rays are angled from 35 to 50 degrees for generating images of defects within thick multilayered printed circuit boards. During exposure, a thin lead sheet is placed between the testpiece and a phosphor photographic plate on a side of the testpeice opposite the x-ray gun. The lead sheet uniformly attenuates the high-energy x-rays to the captured image before they reach the phosphor plate to avoid damage to the photographic reuse of the plate and prevent over-exposure without loss of image contrast in the phosphor photograph. The exposed phosphor plate is excited with a low energy monochromatic radiation to visually activate the latent x-ray image in the exposed plate.
    Type: Grant
    Filed: May 12, 1995
    Date of Patent: June 4, 1996
    Assignee: International Business Machines Corporation
    Inventor: Nandakumar N. Ranadive
  • Patent number: 5521968
    Abstract: In a radio telephone system and a call charging method used in this radio telephone system, when a user of a radio telephone issues a telephone call to a public telephone network by utilizing a radio controller installed in a PBX employed on the premises of a company to which the telephone user does not belong, the PBX reports both of terminal number information of the radio telephone and call account information for charging the call account to the terminal to the public telephone network, in case that a telephone call is demanded. When the information is received, the public telephone network charges the call account to the radio telephone. If the information is not transmitted from the PBX to the public telephone network, the call account is charged to the call originating line of the PBX.
    Type: Grant
    Filed: March 20, 1995
    Date of Patent: May 28, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Tsuneo Furuya, Yohichi Ogawa
  • Patent number: 5509042
    Abstract: A method for automatically analyzing the morphometry of bone (20, 21) from data obtained by lateral digital scans of the bone (20, 21) obtains a matrix of data values assembled from an x-ray scan. The matrix is analyzed to locate an axis of the bone from which subsequent measures may be referenced. Once the axis is fixed, one or more of several useful indicia of bone condition such as length or interbone spacing can be calculated.
    Type: Grant
    Filed: May 10, 1994
    Date of Patent: April 16, 1996
    Assignee: Lunar Corporation
    Inventor: Richard B. Mazess
  • Patent number: 5504794
    Abstract: The invention relates to a device for the measurement of the thickness profile of a metal product in the form of a moving strip or a moving plate, of the type composed of an X-ray source emitting in the direction of the said product, an X-ray detection unit (21) located on the other side of the product with respect to the said source, means (22) for processing the signals emitted by the detection unit enabling the thickness profile of the said product to be measured, and means (23, 24) for cooling the detection unit and means for processing its signals, wherein the detection unit and the means for processing its signals are arranged on a support plate (18) fitted with a closure plate (19), the closure plate including electrical (27) and fluid (25, 26) connections necessary for the operation of the detection unit and of the means for processing its signals, in that the support plate is inserted into a box of which one of the side faces has an opening, means (20) for the attachment of the closure plate and mean
    Type: Grant
    Filed: January 30, 1995
    Date of Patent: April 2, 1996
    Assignee: SOLLAC (Societe anonyme)
    Inventors: Jean-Jacques Campas, Stephane Terreaux, Patrick Vanhee
  • Patent number: 5500886
    Abstract: A calibration system having a radiation source that generates the beam of radiation along the angular directions .theta., .phi.. A first reference element which is separated from the radiation source by a distance of approximately Z.sub.1 is then exposed to the beam of radiation. A second reference element is also present which is separated from the first reference element by a predetermined distance H and is exposed to the beam of radiation. An image detector produces images of the first and second reference elements, wherein the images are separated from each other by a distance R and angle .phi.. The device further includes an angle measurement device that calculates .theta. from the values of Z.sub.1 and H. A position measurement device having first and second sources of radiation that generate respective first and second beams of radiation directed at angles .theta..sub.1, .phi..sub.1, and .theta..sub.2, .phi..sub.2 respectively, toward an object of interest.
    Type: Grant
    Filed: April 6, 1994
    Date of Patent: March 19, 1996
    Assignee: ThermoSpectra
    Inventor: Eric A. Duff
  • Patent number: 5491737
    Abstract: According to the present invention, a material handling system for transporting a device to or from a radiation chamber in which the device is inspected is provided. The system includes a shuttle carriage having a base and two opposing walls, a conveyor mounted between the two opposing walls of the shuttle carriage, and means for moving the shuttle carriage along a path between a loading position and an unloading position. The system also includes a housing that encloses the shuttle carriage and the moving means. The housing has an internal cavity that is fitted to the two opposing walls. The housing also has a first opening coincident with the loading position and a second opening coincident with the unloading position. Further, a drive mechanism is provided for extending the conveyor partially through the first opening and the second opening.
    Type: Grant
    Filed: August 31, 1994
    Date of Patent: February 13, 1996
    Assignee: ThermoSpectra Corporation
    Inventors: Ransom A. Yarnall, J. Paul Axford, Dale D. Thayer
  • Patent number: 5483571
    Abstract: A method for the x-ray inspection of materials making use of the Moire effect is described. The Moire effect results when two patterns are superimposed, a third pattern is produced. Any change in either of the first two patterns creates a change in the third. Moire inspection is common with visible light, this invention allows the technique to be extended to locations inaccessible to visual inspection. A first pattern of high radio contrast material is attached to or included in the sample. X-rays are projected through the sample. A second pattern is imposed at the observation point, either before or after the formation of the x-ray image. The two patterns interact to create a third, Moire, pattern. As the material is stressed the Moire pattern changes, the degree of change indicating the degree of stress.
    Type: Grant
    Filed: May 31, 1994
    Date of Patent: January 9, 1996
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventor: Eric I. Madaras
  • Patent number: 5467379
    Abstract: Apparatus for x-ray viewing of the firing cycle of an air bag inflator includes a pressure tank for containing an inflator during a firing cycle thereof having an access opening in a wall for receiving the inflator. A mounting ring is secured in place in the access opening having a stop flange at an inner open end for engaging the base of the inflator when inserted into the open end of the housing and limiting the amount of insertion of the inflator into the tank. A pressure plug is removably securable in the mounting ring to engage the base of the inflator for rigidly securing the same in a fixed position in the tank and sealing off the tank during a firing cycle. An x-ray apparatus and film pack or recorder are disposed on opposite sides of the tank to view the progress of the ignition process during a firing cycle of the inflator.
    Type: Grant
    Filed: November 22, 1994
    Date of Patent: November 14, 1995
    Assignee: Morton International, Inc.
    Inventors: Steven D. Bybee, A. Kim Cummings
  • Patent number: 5463667
    Abstract: A method and an apparatus for inspecting a soldered joint with an X-ray, the soldered joint being formed by soldering a lead to a surface of a substrate.
    Type: Grant
    Filed: April 28, 1993
    Date of Patent: October 31, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Toshiaki Ichinose, Takanori Ninomiya, Asahiro Kuni, Kozo Nakahata, Toshimitsu Hamada, Toshihiko Ayabe
  • Patent number: 5388136
    Abstract: An X-ray computerized system for programmable, high-resolution X-ray inspection of manufactured electronic circuits. Such a system comprises: means for directing X-rays to produce X-ray images representing illuminations of circuit elements from different angles; and detecting means for detecting said images, said detecting means comprising a plurality of detectors, each of said detectors positioned to intercept X-rays after passing through a circuit element from a particular associated angle of illumination.
    Type: Grant
    Filed: May 24, 1993
    Date of Patent: February 7, 1995
    Assignee: International Business Machines Corporation
    Inventors: David K. Halliday, Colin D. McCall, Alexander S. McKinnon, Christopher D. Smith
  • Patent number: 5351307
    Abstract: The present invention relates to a process for the acquisition and processing of screen images or radiographs and to an apparatus making it possible to inspect or control mechanical parts. The process consists of obtaining at least two screen images of the part to be inspected, converting said images into digital video images coded on several grey levels, correcting each image with respect to itself and then with respect to a reference image and finally binarizing the corrected images in order to superimpose them, so as to determine the image points which correspond and thus detect defects. Application to the control and inspection of mechanical parts.
    Type: Grant
    Filed: October 28, 1992
    Date of Patent: September 27, 1994
    Assignee: Societe Nationale d'Etude et de Construction de Moteurs d'Aviation "S.N.E.C.M.A."
    Inventor: Veronique H. M. P. Prejean-Lefevre
  • Patent number: 5291537
    Abstract: A method for the derivation of indicia of vertebral morphology from data obtained by lateral digital scans of the vertebrae obtains a matrix of data values assembled from a lateral vertebral scan. The matrix is analyzed to locate local minima and maxima from which the borders of the vertebral body may be calculated. Once the borders of the vertebral bodies are derived, one or more of several useful indicia of vertebral condition can be calculated. These indicia are associated with clinically recognized modes of vertebral condition. The data values in the matrix are also scanned for areas of unusual densities so that nonhomogeneous regions are not used in measuring overall bone mineral density of a vertebra.
    Type: Grant
    Filed: May 26, 1993
    Date of Patent: March 1, 1994
    Assignee: Lunar Corporation
    Inventor: Richard B. Mazess
  • Patent number: 5268952
    Abstract: A measuring apparatus comprising a gamma radiation or x-ray source (2), two detectors (3,3.sup.1) and an output device, for measuring faults in a pipe (1) and for observing foreign objects present in the pipe. A procedure, in particular one for observing faults of a pipe and foreign objects present in a pipe, wherein the measuring apparatus and the pipe (1) are moved relative to each other.
    Type: Grant
    Filed: May 21, 1992
    Date of Patent: December 7, 1993
    Assignee: Valtion Teknillinen Tutkimuskeskus
    Inventor: Reino Tarvainen
  • Patent number: 5228068
    Abstract: A method for the derivation of indicia of vertebral morphology from data obtained by lateral digital scans of the vertebrae obtains a matrix of data values assembled from a lateral vertebral scan. The matrix is analyzed to locate local minima and maxima from which the borders of the vertebral body may be calculated. Once the borders of the vertebral bodies are derived, one or more of several useful indicia of vertebral condition can be calculated. These indicia are associated with clinically recognized modes of vertebral condition. The data values in the matrix are also scanned for areas of unusual densities so that nonhomogeneous regions are not used in measuring overall bone mineral density of a vertebra.
    Type: Grant
    Filed: September 14, 1992
    Date of Patent: July 13, 1993
    Assignee: Lunar Corporation
    Inventor: Richard B. Mazess
  • Patent number: 5193104
    Abstract: An X-ray volume analysis method of crystalline defects of a part (11), comprises the steps of positioning the part in the plane situated at equal distance from the focus of an X-ray source and a focusing plane (14); illuminating the part from a punctual X-ray source (10) by a beam of a large spectral width .DELTA..lambda. and of determined angular opening .DELTA..theta., the opening .DELTA..theta. of the beam being fixed by .DELTA..theta..ltoreq..DELTA..lambda./2d.cos.theta., d being the interreticular distance for the considered reticular planes; orienting the part (11) to obtain the diffraction on a chosen family of reticular planes (30); and collecting and analyzing the X-ray beam near the focusing plane or beyond.
    Type: Grant
    Filed: October 22, 1991
    Date of Patent: March 9, 1993
    Assignee: Centre National de la Recherche Scientifique
    Inventors: Pierre Bastie, Bernard Hamelin
  • Patent number: 5187728
    Abstract: A method of inspecting tube welds in tubular membrane panel walls whereby a radiation source if placed intermediate adjacent tube welds with radiographic film positioned along the far wall of each adjacent tube thereby covering the far wall critical area of each tube weld. Simultaneously each radiographic film is exposed to an intermediate radiation source thereby creating an actual size image of each tube weld with both images totaling or equaling at least one full weld being radiographed per exposure.
    Type: Grant
    Filed: April 27, 1990
    Date of Patent: February 16, 1993
    Assignee: The Babcock & Wilcox Company
    Inventor: Henry P. Vaughn
  • Patent number: RE35423
    Abstract: A method and apparatus for measuring structural characteristics of a manufactured circuit board containing solder joints by automated real-time digital X-ray radiographic inspection techniques. A circuit board under examination is automatically positioned by a digitally controlled multi-axis positioning system between an electronic X-ray source and an electronic X-ray imaging system, X-rays, in a beam of X-rays from the X-ray source, are directed towards the circuit board. The X-rays are absorbed, scattered and transmitted through the circuit board. The X-rays transmitted through the circuit board are directed upon the X-ray imaging system. The X-ray imaging system converts the transmitted X-rays into digital images which represent the radiographic density of the portion of the circuit board under examination. The digital images are stored within a digital image processor.
    Type: Grant
    Filed: January 14, 1994
    Date of Patent: January 14, 1997
    Assignee: ThermoSpectra Corporation
    Inventors: John Adams, Juan Amoroso, Jr., Paul Axford, Phil Bowles, Mike Juha, Van Nguyen, Charles Preskitt, Ed Ross, Doug Thompson, Paul Turner