Abstract: A method of radiographic inspection of an object includes the steps of: providing a radiation source and a radiation detector located on opposite sides of the object; positioning the radiation detector to receive radiation transmitted through the object from the radiation source; radiographically imaging an region of interest of the object with the radiation source and the radiation detector, using an set of initial imaging parameters, to produce a test image; obtaining at least one quality measurement of the test image; comparing the quality measurement to predetermined image quality limits; and in response to the quality measurement exceeding the predetermined image quality limits, changing at least one of the initial imaging parameters to generate a new set of image parameters. The process may be repeated iteratively until a final set of imaging parameters is obtained.

Abstract: A ceramic electron beam accelerator is disclosed finding particularly efficacious uses in X-ray electronic circuit imaging and testing applications. The ceramic stage design eliminates the need for placing metal reinforcements between adjoining stages of the accelerator, thereby increasing the accelerator's mechanical robustness and reliability, while also reducing manufacturing costs.

Abstract: Systems and methods for process monitoring based upon X-ray emission induced by a beam of charged particles such as electrons or ions. Concept as expressed herein.

Abstract: Systems and methods are disclosed for non-intrusively inspecting circuit breakers, which may include one or more connector assemblies. An X-ray unit may be placed at a first location around the circuit breaker while at least one digital imaging plate may be placed at a second location around the circuit breaker. The X-ray unit may generate X-rays, where at least a portion of the generated X-rays traverse a plane that includes at least a portion of the connector assembly and at least a portion of the at least one digital imaging plate. The image that includes at least a portion of the connector assembly may be retrieved from the digital imaging plate and inspected to determine a status of the circuit breaker.

Abstract: Methodologies for non-destructively inspecting and characterizing micro-structural features in a thermal barrier coating (TBC) on a component, wherein the micro-structural features define pores and cracks, if any, in the TBC. The micro-structural features having characteristics at least in part based on a type of process used for developing the TBC and affected by operational thermal loads to which a TBC is exposed. In one embodiment, the method allows detecting micro-structural features in a TBC, wherein the detecting of the micro-structural features is based on energy transmitted through the TBC, such as may be performed with a micro-feature detection system 20. The transmitted energy is processed to generate data representative of the micro-structural features, such as may be generated by a controller 26. The data representative of the micro-structural features is processed (e.g.

Abstract: A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the diffraction peaks being not available for such a sample. The invention includes three aspects. The first aspect is that an equipment constant is determined and an unknown void or particle content is calculated based on the equipment constant. The second aspect is that a plurality of samples having unknown matrix densities are prepared, the matrix densities are determined so that differences in the matrix densities among the samples become a minimum, and a void or particle content is calculated based on the matrix density and the scale factor of the X-ray small angle scattering. The third aspect is for a plurality of samples having unknown particle densities, and executes procedures similar to those of the second aspect.

Abstract: A system for radiographic inspection of an object includes a radiation source located on one side of the object and a radiation detector located on another side of the object, being positioned to receive radiation from the radiation source. At least one motion sensor is associated with the radiation detector, the radiation source, or the object, for detecting motion. The magnitude of motion of the components is compared to a pre-established limit value. The imaging process is conducted when the magnitude of any motion is less than the limit value.

Abstract: An apparatus and method for inspecting a sample is described. The apparatus can have an X-ray source and detector, a housing, an access aperture in the housing, an access door covering the access aperture, and a stage positionable to extend through the access aperture to a load/unload point outside the housing. The method can include opening the first access door, moving at least a portion of a stage through the first access aperture to a position outside of the housing to receive the sample, moving the stage into the housing, closing the first access door, moving the stage to a position for inspection of the sample, applying X-rays to the sample, receiving X-rays passing through the sample with the X-ray detector, generating one or more signals based on the received X-rays, and displaying an image of the sample for analysis based on the one or more signals.

Abstract: An X-ray inspection apparatus is disclosed. An inside area defining unit defines an area inside the rim of the can in an X-ray image created by an image formation unit. An extension area defining unit rotates a circle such that the circle externally touches the above-mentioned area, and defines an extension area whose boundary is the locus of the center of the externally touching circle. A reduction area defining unit rotates a circle having the same radius such that it internally touches the extension area, and defines a reduction area whose boundary is the locus of the center of the internally touching circle. A mask area defining unit defines a region outside the boundary of the reduction area as a mask area, and the first contaminant detection unit performs an inspection for contamination in an inspection area inside the mask area defined by an inspection area defining unit.

Abstract: An x-ray inspection system. The x-ray inspection system includes an x-ray source, an on-axis x-ray sensor, at least one off-axis x-ray sensor, a fixture, and an accumulation circuit. The on-axis x-ray sensor is configured to capture on-axis images of radiation from the x-ray source. The x-ray source is displaced from the on-axis x-ray sensor, and the x-ray source and the on-axis x-ray sensor are positioned on an axis conceptually drawn between the x-ray source and the on-axis x-ray sensor. At least one off-axis x-ray sensor is configured to capture off-axis images of radiation from the x-ray source, wherein each off-axis x-ray sensor is positioned off the axis. The fixture is configured to maintain an article between the x-ray source and the on-axis and off-axis x-ray sensors, and the accumulation circuit is configured to receive and accumulate images captured by the on-axis and off-axis x-ray sensors.

Abstract: A linear array detector (LAD) for scanning an object is provided. The detector includes a scintillator layer configured for generating a number of optical signals representative of a fraction of an incident X-ray beam passing through the object. The plane of the scintillator is parallel to the X-ray beam. The LAD further includes a two dimensional array of photo-conversion elements configured to receive several X-rays of the X-ray beams and configured to generate corresponding electrical signals. An arrangement of the photo-conversion elements is independent of the X-ray paths.

Abstract: An x-ray inspection is provided featuring a single x-ray source and a planar array of linear sensors aligned in parallel. An article to be inspected is moved between the x-ray source and the linear sensors in a series of passes parallel to the array of linear sensors and substantially perpendicular to the long axes of the linear sensors. Alternately, the x-ray source and the sensors are moved as a unit relative to a stationary article. As a result, a transmission image of the article is captured for each of the linear sensors. These transmission images are then combined mathematically to generate a layer image for each separate conceptual layer of the article. In some embodiments, these layer images may then be interpreted in order to determine the quality of the article.

Abstract: An x-ray confocal defect detection system comprises an x-ray source, a confocal component, and defect detectors and operates on a target portion of a semiconductor device. The x-ray source generates x-ray energy. The semiconductor device includes a plurality of formed layers. The target portion is a selected layer or portion of the plurality of formed layers. At least a portion of the x-ray is transmitted through the semiconductor device as transmitted x-ray. The confocal component receives the transmitted x-ray and passes target x-ray intensity from the target portion of the transmitted x-ray energy. Detectors receive the target x-ray from the confocal component from which defect analysis can be performed.

Abstract: An apparatus and method for non-destructive inspection of materials housed in containers involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle substantially parallel to a sloped surface of the container to be inspected. A first X-ray apparatus is located opposite a second X-ray apparatus, and both the first and second X-ray apparatus are adapted to provide two X-ray beams. This arrangement provides for imaging of the entire area of a sloped portion of the container without any shadow or hidden spots.

Abstract: In a method for calculating the temperature T of a solid body or the time t that is needed for a change of the temperature T of the solid body, a solution function to a dimensionless equation corresponding to the differential equation dT/dt=b?aT4?cT, is determined and used to create a matrix A=(aij) with which T or t can be easily calculated.

Abstract: A tomographic reconstruction method and system incorporating Bayesian estimation techniques to inspect and classify regions of imaged objects, especially objects of the type typically found in linear, areal, or 3-dimensional arrays. The method and system requires a highly constrained model M that incorporates prior information about the object or objects to be imaged, a set of prior probabilities P(M) of possible instances of the object; a forward map that calculates the probability density P(D|M), and a set of projections D of the object. Using Bayesian estimation, the posterior probability p(M|D) is calculated and an estimated model MEST of the imaged object is generated. Classification of the imaged object into one of a plurality of classifications may be performed based on the estimated model MEST, the posterior probability p(M|D) or MAP function, or calculated expectation values of features of interest of the object.

Abstract: The present invention is a method for inspecting objects. The method includes obtaining a structural model of a first object, the model providing dimensions and material properties for the first object, inspecting a second object to provide inspection data for at least two views of a structure of the second object, comparing inspection and predicted data based on the structural model of the first object and a simulation of the inspection process, reconstructing stereographic data for the second object based on the structural model of the first object and contributions of the inspection data of the second object. In another embodiment, where there is a structural model of an object, the object can be subjected to a dynamic process and the object is inspected throughout the process.

Abstract: A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.

Abstract: An inspection method utilizing vertical slice imaging. A number of horizontal slice images, extending through an object of interest, are acquired. A vertical region of interest is defined from the data representing the horizontal slice images. A vertical slice image is constructed based upon the horizontal slice image data falling within the vertical region of interest. The vertical slice image data may be analyzed to detect defects. In addition, a method is provided to detect defects in a BGA joint. The method includes locating a center of the joint. The method may further include measuring a number of diameters through the center of the joint and applying a rule to compare the measured diameters to an expected diameter.

Abstract: A method for inspecting a golf ball comprising the steps of providing a golf ball comprising a core and a cover; providing at least one flat reference marker; abutting the golf ball against at least one marker; rotating the golf ball about a single axis; capturing an x-ray image of the golf ball and marker; and determining the eccentricity of the golf ball.

Abstract: A device for non-destructive inspection of containers (22) of food products comprises an emitter (24) emitting a divergent radiation beam, with vertical axis and a pair of detectors (26) detecting the radiation coming from the emitter (24) and passing through a container (22) to be inspected; the radiation detectors (28, 30) are linear detectors and are spaced so as to receive radiation (32, 32?) emitted by the emitter (24) according to two different directions.

Abstract: An imaging system that is capable of capturing images of moving objects as they are moving with minimal blurring by moving a point source of illumination such that the position from which illumination is projected is changed as the object moves to ensure that the position of the image projected onto an imaging plane remains substantially effectively stationary. The position from which illumination is projected functions as a point source of illumination. A image sensor of the imaging system is positioned in the imaging plane and receives illumination projected from the position of the illumination source that passes through the moving object. The image sensor produces electrical signals in response to the received illumination.

Abstract: An apparatus and method for inspecting parts. The apparatus includes an x-ray source for illuminating a part from a plurality of locations with respect to the part and an imaging detector for forming a plurality of measured x-ray images of the part, one such measured x-ray image corresponding to each of the illumination locations. A controller compares each of the measured x-ray images with a corresponding calibration image. The controller provides a defective part indication if one of the measured x-ray images differs from the corresponding calibration image by more than a threshold value in part of the measured x-ray image. The controller localizes defects on the part by comparing two or more of the measured x-ray images with two or more corresponding calibration images. The calibration images can be constructed from measured images of defect free parts.

Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.

Abstract: An optical inspection unit inspects a surface of an object under inspection optically. A processing unit detects defects on the surface of the object under inspection and their features according to inspection results from the optical inspection unit, detects positions of the detected defects on the surface of the object under inspection, and classifies the detected defects according to their features. The processing unit selects the defects, on which a X-ray analysis should be performed, according to predetermined conditions about the features or the classification results of the defects. Alternatively, the processing unit displays the positions and the classification results of the defects, and an operator picks the defects, on which the X-ray analysis should be performed. A X-ray inspection unit performs the X-ray analyses on the selected or picked defects.

Abstract: A digital radiography apparatus (10) and process for providing images of an object, for example, an exhaust transition duct (12) comprising a core material and an overlying thermal barrier layer, to detect surface and interior defects within the duct (12). Incident energy is provided by an energy source (30), transmitted through the object (12), and sensed by a sensor (32). An image of the object (12) is formed by processing the signal from the sensor (32) in a signal processor (34) and displaying the image on a display (36) for determining defects in the object (12).

Abstract: A cotton sample is subjected to noninvasive x-ray microtomographic image analysis in order to recognize cotton contaminants in the cotton sample. The cotton contaminants are detected and classified using an x-ray microtomographic system. Once the cotton contaminants in the cotton sample are detected and classified, the cotton sample may be graded based on the type and amount of cotton contaminants present.

Abstract: An improved circuit inspection system incorporates an automated measuring technique that accounts for acceptable Z-axis elevation variance across both a printed-circuit device and a mounting surface when making solder-joint pass/fail decisions. The improved solder-joint inspection system applies a near neighbor solder joint diameter error analysis for each solder joint on a printed-circuit device. A near neighbor solder joint diameter error outlier analysis is used to identify solder joint defects with improved accuracy.

Abstract: An in-situ monitoring system for a bonding process and a method therefor are provided. The monitoring system includes: a light source irradiating rays to a sample; a heating unit heating the sample; a temperature detecting unit detecting the temperature of the sample; a light detecting unit detecting the rays passing through the sample and converting the rays into an image signal; and a controlling unit receiving and outputting the image signal, and transmitting a signal for controlling the light source and the heating unit.

Abstract: A radiation source is disclosed comprising a source of charged particles that travel along a path. Target material lies along the path to generate radiation upon impact by the beam. A magnet is provided to deflect the beam prior to impacting the target. The magnet may generate a time-varying magnetic field or a constant magnetic field. A constant magnetic field may be varied spatially across the beam. The magnet may be an electromagnet or a permanent magnet. In one example, deflection of the beam results in impact of the beam on the target along a plurality of axes. In another example, portions of the beam are differentially deflected. The source may thereby irradiate an object to be scanned with more uniform radiation. The charged particles may be electrons or protons and the radiation may be X-ray or gamma ray radiation, or neutrons. Scanning systems incorporating such sources, methods of generating radiation and methods of examining objects are disclosed, as well.

Abstract: A method for inspecting a golf ball comprising the steps of providing a golf ball comprising a core and a cover; providing at least one flat reference marker; abutting the golf ball against at least one marker; rotating the golf ball about a single axis; capturing an x-ray image of the golf ball and marker; and determining the eccentricity of the golf ball.

Abstract: An x-ray inspection is provided featuring a single x-ray source and a planar array of linear sensors aligned in parallel. An article to be inspected is moved between the x-ray source and the linear sensors in a series of passes parallel to the array of linear sensors and substantially perpendicular to the long axes of the linear sensors. Alternately, the x-ray source and the sensors are moved as a unit relative to a stationary article. As a result, a transmission image of the article is captured for each of the linear sensors. These transmission images are then combined mathematically to generate a layer image for each separate conceptual layer of the article. In some embodiments, these layer images may then be interpreted in order to determine the quality of the article.

Abstract: An apparatus for non-destructively inspecting an arbitrary heat exchanger tube among a group of heat exchanger tubes. The apparatus includes a radiation detector inserted in a heat exchanger tube to be inspected, at least one radiation source inserted in a plurality of heat exchanger tubes surrounding the heat exchanger tube to be inspected, and a CT processing unit. A cross section of the heat exchanger tube to be inspected is imaged by the CT processing. Also, by setting at least one radiation source in an inner portion of the heat exchanger tube, on the inner side of a group of heat exchanger tubes or on the outer side of the group of heat exchanger tubes, and by setting at least one radiation detector carrying a collimator on the outer side of the group of heat exchanger tubes, a cross section of the group of heat exchanger tubes can be imaged by the CT processing.

Abstract: A method and apparatus is disclosed for mapping the relevant material properties of a log, such as knot location and extent. The outer shape of the log under bark is also revealed using this method, and the boundary between the heartwood and sapwood is accurately mapped. The apparatus includes three x-ray sources and arrays of x-ray detectors, for measuring the attenuation of the wood in the log. Deviations in attenuation are related to changes in density, which are indicative of knots and other defects. Accurate estimates of shape, density and knot location render improved sawing decisions at the headrig of a sawmill, which improve the yield of high quality lumber from a given log. The techniques may also be used in a system for sorting logs according to quality.

Abstract: A method for inspecting a golf ball comprising the steps of providing a golf ball comprising a core and a cover; providing at least one flat reference marker; abutting the golf ball against at least one marker; rotating the golf ball about a single axis; capturing an x-ray image of the golf ball and marker; and determining the eccentricity of the golf ball.

Abstract: A method for inspecting pipe, the method, in at least certain aspects, including detecting an inspection parameter in at least a first part of a pipe, the pipe having a length, a hollow body, an outer surface, and a generally circular pipe wall with an inner diameter and an outer diameter, locating at a first location the first part of the pipe with respect to the length of the pipe and with respect to the outer diameter of the pipe; and such a method for inspecting pipe which, in at least certain aspects, includes detecting at least a first part of a first imperfection of the pipe.

Abstract: An optical inspection unit inspects a surface of an object under inspection optically. A processing unit detects defects on the surface of the object under inspection and their features according to inspection results from the optical inspection unit, detects positions of the detected defects on the surface of the object under inspection, and classifies the detected defects according to their features. The processing unit selects the defects, on which a X-ray analysis should be performed, according to predetermined conditions about the features or the classification results of the defects. Or the processing unit displays the positions and the classification results of the defects, and an operator picks the defects, on which the X-ray analysis should be performed. A X-ray inspection unit performs the X-ray analyses on the selected or picked defects.

Abstract: The system and method enable cost-effective classification of objects, such as solder joints, that are under inspection. A classifier is operable to receive a feature vector f of an object under inspection and compute a probability that such object is properly assigned membership in a first of a plurality of different classes. For instance, a “good” class may be available for objects that meet a pre-determined criteria, and a “bad” class for objects that do not meet such criteria. The classifier analyzes f to compute the probability that an object is properly classified as “good.” Embodiments of the invention enable the classifier to be tuned as desired for a given inspection section for proper risk management. A cost variable is input to the classifier and used to determine whether, given the computed probability that an object is “good,” it is cost-effective to classify the object as “good.

Abstract: The present invention relates to a method and an apparatus for the testing or inspection of objects, particularly for detecting defects or irregularities therein, by means of X-radiation, where the object to be inspected is brought into different spatial positions and stays there during image detection. For mechanical positioning of the objects, known methods and apparatuses require a relatively long time with limited inspection precision, while having a considerable space requirement. Accompanied by a small size, the invention obviates this problem in that the X-ray components, comprising X-ray tube and X-ray detector, are only moved in translatory manner and the inspection object or part in a gimbal suspension is only moved in rotary manner in at least one axis and a maximum of three axes x, y and z.

Abstract: An apparatus and method for inspecting electronic component orientation along with x-ray verification of connection integrity is presented. An exemplary method comprises providing an electronic component 100 for surface mount integration and providing an x-ray visible orientation indicator 300, 402, 500, 600 for the electronic component 100 such that proper orientation of the electronic component 100 is verifiable by x-ray inspection after performing surface mount integration of the electronic component. The x-ray inspection also makes connection integrity of the electronic component 100 verifiable.

Abstract: There is described an inspection system for inspecting an object, the system comprising: a structural inspection module for inspecting the object structurally; a functional test module for testing the object functionally; a support device for supporting the object to be inspected structurally and tested functionally; and a common controller for the structural inspection module and the functional test module. A method for use with the system is also described.

Abstract: In a method for the nondestructive quality testing of a thermocouple (10) which can be used in particular at high temperatures and/or under high levels of vibration, which thermocouple (10) comprises at least two wires (13, 14) which run substantially parallel to one another in one plane, are connected to one another at their ends by a welded joint (15), are surrounded by a hermetically sealed sheath (11) and inside the sheath (11) are embedded in insulation (16, 17) comprising a compacted powder, simple and reliable assessment is achieved by the fact that the X-radiation is passed through the thermocouple (10) perpendicular to the plane of the wires (13, 14) and an X-ray image is taken, that the position of the wires (13, 14) in the vicinity of the welded joint (15) is determined from the X-ray image, and that the quality of the thermocouple (10) is established from the position of the wires (13, 14) in the vicinity of the welded joint (15).

Abstract: A radiation inspection apparatus is configured in such a way as to totalize pixels, whose gray levels represented by pixel gray level information, which is outputted from radiation detector, are within a preset gray level range of gray level profile from XL to XH, and to inspect from a result of the totalization whether or not a stockout of object occurs. Thus, the apparatus is enabled to correctly determine an occurrence of a stockout of the object by simple data processing without performing pattern recognition on a radiation perspective image.

Abstract: An x-ray technique-based nonintrusive inspection apparatus is provided which is capable of inspecting 600 containers an hour which is small, and which is easily maintainable. Features of the apparatus include “radiation locking” with “active curtains”, “continuous scanning” utilizing an x-ray line scanner subsystem and a CT scanner subsystem, good structural integrity, radiation containment in a self-shielding manner, an easily maintainable driving arrangement, shielding curtains that can be raised and lowered quickly, a container jam release mechanism, and efficient air conditioning.

Abstract: An inspection system utilized to inspect a structure for particularities, including defects, includes a first gantry with a detector inspection device that is placed in a known position on one side of the structure, and a second gantry with a source inspection device that is placed on the other side of the structure. In an embodiment, the detector inspection device is an x-ray detector inspection device and the source inspection device is an x-ray source inspection device. The movement of the first and second gantries is controlled by a gantry control system. A data acquisition system controls the data, e.g., image, collection process. During the data collection process, the relative positions of the source and detector inspection devices are initialized. The detector and source inspection devices are then moved in synchronized motion to each data collection position, such that the relative alignment of the inspection devices is maintained.

Abstract: A method and an apparatus for detecting unacceptable items in objects, such as in luggage, wherein a detector apparatus, functioning as a second detector stage is divided into a lower testing stage and a higher testing stage. In the lower testing stage, the coordinates of the object location are determined, and subsequently, a diffraction apparatus is moved to this location in the higher testing stage. In particular, X-ray diffraction can be employed to determine the explosive material of the item in the object. The diffraction apparatus comprises a collimator/detector arrangement, which is disposed to be adjusted height-wise and laterally in the higher testing stage, with a laterally-adjustable X-ray source, which is synchronized with the collimator/detector arrangement. The collimator/detector arrangement preferably has only one collimator and one detector. The collimator preferably has a conically-expanding ring slot, which simulates a predetermined angle &THgr;M of a scatter radiation.

Abstract: An x-ray shielding system includes a beam controller configured to surround an x-ray source and includes a detector shield configured to position behind an x-ray detector. The beam controller includes a source shield and an aperture. The source shield and the detector shield are adapted to block x-rays, and the aperture is adapted to transmit x-rays. A shielded digital radiographic inspection system includes the x-ray source and the beam controller surrounding the x-ray source. The beam controller includes the source shield and the aperture. The aperture is configured to rotate around the x-ray source. The inspection system further includes a digital x-ray detector positioned radially outward from the x-ray source and facing the aperture. The digital x-ray detector is configured to be movable along an orbit around the x-ray source. The inspection system further includes the detector shield configured to be movable with and positioned behind the digital x-ray detector.

Abstract: A system and method for radiographic inspection of airfoil structure on aircraft includes a radiation source located on one side of the airfoil structure and an X-Y scanning device located on an opposing side of the airfoil structure. The X-Y scanning device is positioned to receive radiation from the radiation source. A radiation detector is mounted on the X-Y scanning device so as to be moveable relative to the airfoil structure along t two mutually orthogonal axes. In operation, the radiation detector is moved in a predetermined raster pattern while the radiation source is emitting radiation. This allows a large area to be inspected with single positioning of the X-Y scanning device, thereby improving throughput. The radiation detector converts impinging radiation into electrical signals, and a computer system processes the signals to generate radiographic images of the airfoil structure.

Abstract: A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection.

Abstract: The X-ray inspection system 10 comprises an X-ray electron conversion face 42 for converting an entered X-ray image transmitted through the measurement object into an electronic image, an output fluorescent face 46 for emitting fluorescence when an electronic image is entered, and deflecting means 44 which is installed between the X-ray electron conversion face 42 and output fluorescent face 46, wherein the electronic image which was entered and converted at the X-ray electron conversion face 42 is converged into a predetermined area on the output fluorescent face 46 by the deflecting means 44 so as to make the X-ray fluoroscopic image of the moving measurement object stand still on the output fluorescent face 46. By this, the image of the measurement object can be captured during the time when the X-ray fluorescence image is standing still, so sensitivity can be secured while increasing the resolution.