Scatter Analysis Patents (Class 378/86)
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Publication number: 20090213992Abstract: A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle X-ray diffraction, and in-plane X-ray diffraction, etc.Type: ApplicationFiled: July 4, 2006Publication date: August 27, 2009Inventor: Yoshio Iwasaki
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Publication number: 20090213993Abstract: The broadening of the lines in NRF from an isotope that is part of a material may be due to several causes: the temperature of the material, the molecular structure of the material and the crystalline structure of the material. By measuring the broadening caused by the molecular structure and the crystalline structure the material itself can be identified. The exact energy of the lines in NRF may also depend on the nature of the crystalline and molecular structure of the material. By measuring the changes in the energy of the NRF lines caused by the structure of the material the material itself may be identified. These techniques provide a “fingerprint” of the molecule or crystal that is involved. The fingerprint information may be used to determine a potential threat.Type: ApplicationFiled: December 12, 2008Publication date: August 27, 2009Inventors: William Bertozzi, Robert J. Ledoux
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Publication number: 20090202041Abstract: A Compton camera device according to the invention includes first means for reading coordinate data of a scattering point of a quantum ray detected by a pre-stage detector for each Compton scattering event, second means for reading coordinate data of a reaching point of the Compton-scattered quantum ray detected by a post-stage detector for each Compton scattering event, and third means for calculating a measurement accuracy of the scattered quantum ray by the first and second means for each Compton scattering event, calculating a statistical quantity of the quantum ray for each calculated measurement accuracy, and outputting the calculated statistical quantity to image reconstruction means.Type: ApplicationFiled: June 11, 2007Publication date: August 13, 2009Inventors: Takashi Shirahata, Ryota Kohara, Tetsuo Nakazawa, Osamu Miyazaki
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Patent number: 7564938Abstract: Scatter effects are reduced in a radiographic imaging device, such as a digital slot scan mammographic imaging device, by reducing detected scatter and processing detector information to compensate for scatter effects. In one embodiment, a digital mammographic imaging system (10) includes a source (24) for transmitting a narrow beam (28) and a detector assembly (32) for detecting the beam (28). The beam (28) and the detector assembly (32) are synchronously scanned across the patient's breast (48) to obtain an image. Collimator slats (74) are provided at the leading and trailing edges of the detector to reduce detected scatter. Additionally, attenuators (76 and 92) are provided at the ends of the scanned motion and at the anterior edge of the detector array to assist in determining a spatial intensity profile.Type: GrantFiled: April 12, 2004Date of Patent: July 21, 2009Assignee: Hologic, Inc.Inventors: Mike Tesic, Guy M. Besson, Morgan W. Nields
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Patent number: 7551719Abstract: Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a first, converging beam of X-rays toward a surface of the sample and to direct a second, collimated beam of the X-rays toward the surface of the sample. A motion assembly moves the radiation source between a first source position, in which the X-rays are directed toward the surface of the sample at a grazing angle, and a second source position, in which the X-rays are directed toward the surface in a vicinity of a Bragg angle of the sample. A detector assembly senses the X-rays scattered from the sample as a function of angle while the radiation source is in either of the first and second source configurations and in either of the first and second source positions. A signal processor receives and processes output signals from the detector assembly so as to determine a characteristic of the sample.Type: GrantFiled: August 10, 2005Date of Patent: June 23, 2009Assignee: Jordan Valley Semiconductord LtdInventors: Boris Yokhin, Alexander Krokhmal, Tzachi Rafaeli, Isaac Mazor, Amos Gvirtzman
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Publication number: 20090147919Abstract: A radiographing apparatus according to an aspect of the present invention is characterized in that an image processing device comprises an acquisition device which acquires projection data of a first energy spectrum and projection data of a second energy spectrum, and a synthetic image generating device which synthesizes a first image on the basis of the projection data of the first energy spectrum, and a second image on the basis of the projection data of the second energy spectrum according to a predetermined synthetic condition, and generating a synthetic image, and a display device displays the generated synthetic image.Type: ApplicationFiled: May 12, 2006Publication date: June 11, 2009Inventors: Taiga Goto, Osamu Miyazaki, Koichi Hirokawa, Yasuo Omi
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Patent number: 7529341Abstract: Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or not. Hence, the attenuation coefficient and the diffraction pattern of the item of baggage are used to determine whether the baggage should be cleared.Type: GrantFiled: February 10, 2004Date of Patent: May 5, 2009Assignee: Koninklijke Philips Electronics N.V.Inventors: Jens-Peter Schlomka, Geoffrey Harding, Bernd Schreiber
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Patent number: 7529343Abstract: An X-ray imaging system is provided which includes an X-ray tube including, a cathode for emitting electrons; and a dynamic anode. The dynamic anode receives the electrons from the cathode and generates an X-ray beam that is non-stationary. The dynamic anode rotates between a first position where the X-ray beam is directed at a first location on an object and a second position where the X-ray beam is directed at a second location on the object to generate the non-stationary beam.Type: GrantFiled: May 3, 2007Date of Patent: May 5, 2009Assignee: The Boeing CompanyInventors: Morteza Safai, Gary E. Georgeson, William T. Edwards
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Publication number: 20090110147Abstract: A method and apparatus for an x-ray apparatus. The x-ray apparatus comprises a vacuum tube. A cathode is located in the vacuum tube and capable of emitting electrons. A rotatable magnetic anode located in the vacuum tube, capable of being rotated by a motor located outside of the vacuum tube, and capable of generating an x-ray beam in response to receiving the electrons emitted by the cathode.Type: ApplicationFiled: October 24, 2007Publication date: April 30, 2009Inventors: Morteza Safai, Gary E. Georgeson, William Talion Edwards
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Patent number: 7508910Abstract: A system and methods for x-ray backscatter reverse engineering of structures. One embodiment includes a plurality of articulated arms attached to a movable base. Another embodiment includes a single counterweighted arm attached to a movable base. The arms include x-ray detectors. At least one x-ray source, which may be mounted on the arm(s), emits x-rays, which are backscattered off the surfaces and objects of interest and captured by the detectors to generate images of hidden objects. The present system provides improved speed and resolution over prior art systems. The system has a field-of-view and effective scanning range versatile enough to work in various orientations and in environments of various sizes. In certain embodiments the system is compact and lightweight so that it can be easily transported and used within confined spaces or in environments where weight is a consideration, such as inside or underneath aircraft. The system is also pointable and adaptable.Type: GrantFiled: April 25, 2007Date of Patent: March 24, 2009Assignee: The Boeing CompanyInventors: Morteza Safai, Gary E. Georgeson, William T. Edwards
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Publication number: 20090074141Abstract: A computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective locations. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected locations.Type: ApplicationFiled: September 12, 2008Publication date: March 19, 2009Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.Inventors: Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Dileep Agnihotri, Tzachi Rafaeli, Alex Tokar, David Berman, Moshe Beylin
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Patent number: 7505561Abstract: A system for observing the internal features of an object, such that the object's internal absorption, refraction, reflection and/or scattering properties are visualized, is disclosed. An embodiment may include one or more beams of penetrating radiation, an object with internal features to be imaged, a single or an array of radiation optics, and a detection system for capturing the resultant shadowgraph images. The beam(s) of radiation transmitted through the object typically originate from a line-shaped source(s), which has high spatial purity along the narrow axis, and low spatial purity in the perpendicular, long axis. In the long axis, radiation optic(s) capture and focus diverging rays exiting from the object to form a high resolution image of the object, without which optic(s) the shadowgraph would have blurring in this axis.Type: GrantFiled: November 17, 2007Date of Patent: March 17, 2009Inventor: Michael Keith Fuller
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Publication number: 20090060135Abstract: The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays scattered within the scanning region, and a processor arranged to process outputs from the detectors to generate image data.Type: ApplicationFiled: June 19, 2008Publication date: March 5, 2009Inventor: Edward James Morton
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Patent number: 7499523Abstract: A method for identifying a substance is described. The method includes detecting, by a first scatter detector, a first set of scattered radiation, generating a first effective atomic number from the first set of scattered radiation, detecting, by a second scatter detector, a second set of scattered radiation, generating a second effective atomic number from the second set of scattered radiation, and determining whether the first effective atomic number is within a limit of the second effective atomic number.Type: GrantFiled: August 2, 2006Date of Patent: March 3, 2009Assignee: General Electric CompanyInventor: Geoffrey Harding
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Patent number: 7492859Abstract: System and methods for measuring the density, level, or interface position of a fluid or fluids in a vessel using gamma-ray backscatter are disclosed. The gamma-ray instruments disclosed may account for vessel wall buildup or deterioration. Methods disclosed herein include detecting gamma rays backscattered by a fluid from a gamma-ray source positioned proximate to a vessel with at least two gamma-ray detectors positioned proximate to the vessel and to each other; and determining a density, level, or interface value of the fluid based upon intensities of backscattered gamma rays received by the two or more gamma-ray detectors; wherein the vessel wall is subject to at least one of buildup and deterioration. The density, level, or interface may be a function of a ratio of the intensity of backscattered gamma rays received by two or more of the detectors.Type: GrantFiled: March 24, 2008Date of Patent: February 17, 2009Assignee: Thermo Fisher Scientific Inc.Inventors: Alex Kulik, Alexander Joseph Esin, Nikolay Baturin
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Publication number: 20090034682Abstract: A method of utilizing the output of a first pulse processor, such as processor designed for use with an SDD, to generate the input signal expected by the second pulse processor, such as an existing processor not designed for use with an SDD. In one embodiment, piled-up pulses which would not be detected as such by the second pulse processor are omitted from the generated input signal. The method generates an output (which then serves as the input signal for the second pulse processor) of the same general form as the ramp signal from a detector with a pulsed-reset preamplifier, but which does not have the same noise characteristics. In addition, the method may alter the timing between the reconstructed steps in the ramp to increase the maximum throughput of the second pulse processor beyond what is normally possible with a direct connection to the associated detector.Type: ApplicationFiled: August 1, 2008Publication date: February 5, 2009Applicant: PulseTor, LLC.Inventor: RICHARD B. MOTT
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Patent number: 7486773Abstract: A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from the megavoltage radiation source and while a plurality of elements is between the megavoltage radiation source and the imaging device, and determination of an amount of scatter radiation based at least on areas of the acquired image corresponding to the plurality of elements. In some aspects, at least one of the plurality of elements is substantially pointed toward a focal spot of the megavoltage radiation source.Type: GrantFiled: May 9, 2006Date of Patent: February 3, 2009Assignee: Siemens Medical Solutions USA, Inc.Inventors: Jonathan S. Maltz, Zirao Zheng, Michelle M. Svatos
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Patent number: 7483513Abstract: A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on an area of a periodic feature on a surface of the sample and receiving the X-rays scattered from the surface in a reflection mode so as to detect a spectrum of diffraction in the scattered X-rays as a function of azimuth. The spectrum of diffraction is analyzed in order to determine a dimension of the feature.Type: GrantFiled: July 17, 2006Date of Patent: January 27, 2009Assignee: Jordan Valley Semiconductors, Ltd.Inventors: Isaac Mazor, Boris Yokhin
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Patent number: 7474728Abstract: The invention relates to a computed tomography apparatus (CT apparatus) for imaging by means of radiation having traversed an object to be examined (that is, directly transmitted radiation), as well as by means of radiation scattered by the object to be examined, which apparatus includes a radiation source (S), a detector arrangement (16) and a device whereby the radiation (41a) having traversed the object to be examined can be blocked at least to an extent that the intensity incident on the detector arrangement (16) does not substantially exceed the intensity of radiation (41b) scattered by the object (13) to be examined and incident on the detector arrangement (16). The invention enables the detection of scattered radiation (CSCT mode) which is not affected by crosstalk from the transmitted radiation, even when the detector arrangement does not satisfy severe requirements as regards crosstalk properties and/or is configured as a single-row detector arrangement.Type: GrantFiled: June 19, 2003Date of Patent: January 6, 2009Assignee: Koninklijke Philips Electronics N.V.Inventors: Jens-Peter Schlomka, Geoffrey Harding
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Publication number: 20080303664Abstract: An advanced technology screening checkpoint system includes a baggage screening zone, a passenger screening zone, and a secondary screening zone. The baggage screening zone may include an explosives scanning system and an imaging system, while the passenger screening zone may include an explosives detection portal and a self-divestment portal to show passengers what to divest prior to screening by a high sensitivity metal detection portal. In some implementations, a secondary screening zone includes a sealed-bottle scanning system, an enhanced explosives detection system, a weapons search routine, and a body scanning system. Centralized monitoring of screening results for individual detection and screening systems of the baggage, passenger, and secondary screening zones may be provided by a combined user interface (CUI).Type: ApplicationFiled: December 5, 2007Publication date: December 11, 2008Inventors: John H. Huey, Stephen Wolff
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Patent number: 7463714Abstract: A method and system for identifying foreign objection (FOD) in items such as aircraft are disclosed. The item may be imaged using x-ray backscatter before and after work is performed thereon. The image taken before work may be subtracted from the image taken after the work to provide a resultant image. The resultant image may indicate the presence of any FOD. Potential FOD in the resultant image may be checked against a database of known FOD to determine the identity thereof. By finding FOD, the occurrence of catastrophes such as aircraft crashes may be mitigated.Type: GrantFiled: October 17, 2006Date of Patent: December 9, 2008Assignee: The Boeing CompanyInventors: Talion Edwards, Gary Georgeson, Morteza Safai
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Patent number: 7456393Abstract: A device is provided for testing surfaces of a card for the presence of explosives, drugs or other substances of interest. The device includes a slot for receiving the card. Thin metallic wiper blades are dispose in alignment with the slot and wipe over surfaces of the card as the card is passed through the slot. Thus, substances on the surface of the card are transferred to the wiper blade. The wiper blade then is enclosed and rapidly heated to desorb the material retrieved from the card. The enclosure then is placed in communication with a detector to test for the presence of substances of interest.Type: GrantFiled: February 6, 2004Date of Patent: November 25, 2008Assignee: GE Homeland Protection, Inc.Inventor: Joseph D. Napoli
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Publication number: 20080285715Abstract: A shadow aperture backscatter radiography (SABR) system includes at least one penetrating radiation source for providing a penetrating radiation field, and at least one partially transmissive radiation detector, wherein the partially transmissive radiation detector is interposed between an object region to be interrogated and the radiation source. The partially transmissive radiation detector transmits a portion of the illumination radiation field. A shadow aperture having a plurality of radiation attenuating regions having apertures therebetween is disposed between the radiation source and the detector. The apertures provide illumination regions for the illumination radiation field to reach the object region, wherein backscattered radiation from the object is detected and generates an image by the detector in regions of the detector that are shadowed by the radiation attenuation regions.Type: ApplicationFiled: April 30, 2008Publication date: November 20, 2008Inventors: Daniel Shedlock, Alan M. Jacobs, Edward T. Dugan, Sharon Auerback Jacobs
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Patent number: 7453985Abstract: A method for analysis of a sample includes directing a beam of radiation to impinge on a target area on a surface of the sample along a beam axis at a plurality of different elevation angles. For each of the different angles, a respective offset of the beam in a direction transverse to the beam axis is determined. While sensing the radiation scattered from the sample at each of the different elevation angles in succession, a transverse correction is applied to at least one of the beam and the sample in order to compensate for the respective offset at each of the different elevation angles.Type: GrantFiled: July 3, 2007Date of Patent: November 18, 2008Assignee: Jordan Valley Semiconductors Ltd.Inventors: Isaac Mazor, David Berman
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Publication number: 20080267353Abstract: A specimen inspection system includes a photon source for outputting photons along a transmission path and a conveyor for translating a specimen completely through the transmission path. A radiation detector is positioned offset with respect to the transmission path for detecting photons that are scattered from the transmission path in response to interaction with the specimen passing therethrough. A controller determines from the detected scattered photons that a first material is present in the specimen.Type: ApplicationFiled: June 15, 2006Publication date: October 30, 2008Applicant: II-VI INCORPORATEDInventor: David S. Rundle
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Publication number: 20080253520Abstract: One aspect relates to determining a location of an at least one scattering event occurring within an at least some matter of at least a portion of an individual, wherein the determining the location of the the at least one scattering event is based at least in part on a combination of: a relative position and/or angle at which an at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, an applied energy level of the at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, a detected location of an at least one scattered X-ray resulting from scattering of the at least one applied X-ray scattering during the at least one scattering event, and a scattered energy level of the at least one scattered X-ray.Type: ApplicationFiled: April 11, 2007Publication date: October 16, 2008Inventors: Edward S. Boyden, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K.Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Victoria Y.H. Wood
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Publication number: 20080253522Abstract: One aspect relates to providing an at least one Compton scattered X-ray visualizing, imaging, or information providing operation relative to at least one visualizing, imaging, or information providing region within an at least some matter of an at least a portion of an individual; and providing a tool-based operation to at least the portion of the at least one visualizing, imaging, or information providing region within the at least some matter of the at least the portion of the individual based at least partially on the providing the at least one Compton scattered X-ray visualizing, imaging, or information providing operation relative to the at least the portion of the at least one visualizing, imaging, or information providing region.Type: ApplicationFiled: April 11, 2007Publication date: October 16, 2008Inventors: Edward S. Boyden, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K.Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Victoria Y.H. Wood
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Publication number: 20080253524Abstract: One aspect relates to at least a portion of at least one Compton scattered X-ray visualizer, imager, or information provider configured to receive an at least one Compton scattered X-ray that has scattered through a substantial scattering depth range to one or more substantial prescribed scattering depths within an at least one matter of an at least a portion of an individual based at least in part on a set of scattering characteristics, the set of scattering characteristics at least partially corresponding to the at least one matter of the least the portion of the individual; the at least the portion of the at least one Compton scattered X-ray visualizer, imager, or information provider being configured for providing an at least one Compton scattered X-ray visualization, imaging, or information providing through one or more visualization, imaging, or information providing depth ranges to one or more visualization, imaging, or information providing prescribed depths into the at least one matter of the least tType: ApplicationFiled: August 1, 2007Publication date: October 16, 2008Inventors: Edward S. Boyden, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K.Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Victoria Y.H. Wood
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Publication number: 20080253521Abstract: One aspect relates to locating an at least one scattering event at least partially within an at least some matter of an at least a portion of an individual at least partially by directing an at least one pulse-type applied X-ray at the at least some matter of the at least the portion of the individual to create an at least one corresponding pulse-type Compton scattered X-ray, wherein the locating the at least one scattering event is based at least in part on an at least one time of flight computation derived at least in part from a combination of an at least one applied duration and an at least one scattered duration, wherein the at least one applied duration corresponds to a time for the at least one pulse-type applied X-ray to reach the at least one scattering event within the at least some matter of the at least the portion of the individual, and further wherein the at least one scattered duration corresponds to a time for the at least one corresponding pulse-type Compton scattered X-ray to thereupon traveType: ApplicationFiled: April 11, 2007Publication date: October 16, 2008Inventors: Edward S. Boyden, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K. Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Victoria Y. H. Wood
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Publication number: 20080253511Abstract: One aspect relates to visualizing, imaging, or providing information at least partially through at least some matter of an at least a portion of an individual, based at least in part on Compton scattering to at least partially form scattered X-rays, the Compton scattering occurring primarily in the at least some matter of the at least the portion of the individual, wherein the visualizing, imaging, or providing information is at least partially performed by converting the scattered X-rays into an at least one scintillated viewable and/or visible light that is detectable by a user.Type: ApplicationFiled: April 11, 2007Publication date: October 16, 2008Inventors: Edward S. Boyden, Glenn B. Foster, Roderick A. Hyde, Muriel Y. Ishikawa, Edward K.Y. Jung, Eric C. Leuthardt, Robert W. Lord, Nathan P. Myhrvold, Dennis J. Rivet, Michael A. Smith, Clarence T. Tegreene, Thomas A. Weaver, Charles Whitmer, Lowell L. Wood, Victoria Y.H. Wood
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Publication number: 20080240340Abstract: A method is disclosed for scattered radiation correction in x-ray imaging devices having a number of x-ray sources that can be moved around an examination object in at least one scanning plane during a measurement pass. During the measurement pass, a number of x-ray projections are recorded at different projection angles with simultaneous use of the x-ray sources. In at least one embodiment of the present method, parameters characterizing an outer object contour are determined in the scanning plane from measured data of different x-ray projections.Type: ApplicationFiled: March 13, 2008Publication date: October 2, 2008Inventors: Herbert Bruder, Martin Petersilka, Karl Stierstorfer
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Publication number: 20080226019Abstract: According to an aspect of the present invention, a correction of X-ray intensities measured in an energy-resolved diffraction method may be provided for multiple scattered radiation without any assumptions on the geometry of the object examined. According to an exemplary embodiment of the present invention, the characteristic lines of the anode material in the primary spectrum are evaluated, resulting in a component analysis of the detected spectrum which may allow for a correction for its multiple scatter part.Type: ApplicationFiled: July 6, 2006Publication date: September 18, 2008Applicant: KONINKLIJKE PHILIPS ELECTRONICS, N.V.Inventors: Axel Thran, Jens-Peter Schlomka
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Publication number: 20080212739Abstract: In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.Type: ApplicationFiled: January 10, 2008Publication date: September 4, 2008Inventors: Takayuki Fukai, Yoshiki Matoba, Kiyoshi Hasegawa
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Patent number: 7418073Abstract: The invention relates to a computed tomography method in which an examination zone is irradiated along a circular trajectory by a fan-shaped radiation beam. Radiation coherently scattered in the examination zone is measured by a detector unit, the variation in space of the scatter intensity in the examination zone being reconstructed from said measuring values. Reconstruction is performed by back projection in a volume which is defined by two linearly independent vectors of the rotational plane and a wave vector transfer.Type: GrantFiled: October 24, 2003Date of Patent: August 26, 2008Assignee: Koninklijke Philips Electronics N.V.Inventors: Jens-Peter Schlomka, Michael Graβ
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Patent number: 7409042Abstract: Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional bremsstrahlung spectra but overlap nuclear resonances in elements of interest for purposes of detection, such as but not limited to the detection of threats in luggage or containers being scanned.Type: GrantFiled: February 22, 2006Date of Patent: August 5, 2008Assignee: Passport Systems, Inc.Inventors: William Bertozzi, Robert J. Ledoux
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Patent number: 7406153Abstract: Apparatus for analysis of a sample includes a radiation source, which is configured to direct a beam of radiation along a beam axis to impinge on a target area on a surface of the sample. A detector assembly is configured to sense the radiation scattered from the sample. A beam control assembly includes a beam blocker, which has a lower side adjoining the surface of the sample, and which contains front and rear slits perpendicular to the lower side that together define a beam plane that contains the beam axis and passes through the target area. The front slit is located between the radiation source and the target area, and the rear slit is located between the target area and the detector assembly.Type: GrantFiled: August 15, 2006Date of Patent: July 29, 2008Assignee: Jordan Valley Semiconductors Ltd.Inventor: David Berman
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Patent number: 7400705Abstract: Disclosed herein is a method of evaluating the performance of an ion-exchange film. In the method, small-angle scattering curves for the ion-exchange film at different humidities are obtained by an X-ray measuring apparatus that can detect X-rays scattered at small angles with respect to the axis of an X-ray applied to the ion-exchange film. From the positions of the peaks on the small-angle scattering curves and the X-ray intensities at these peaks, the change in the characteristic of the film, which accompanies change in the molecular structure (hence, ion-exchanging ability) of the ion-exchange film due to the change in humidity, is evaluated. The humidity ambient to the ion-exchange film can be adjusted by a humidity-adjusting device that comprises a vapor source, gas source, gas mixer and gas-introducing pipe.Type: GrantFiled: June 9, 2003Date of Patent: July 15, 2008Assignee: Rigaku CorporationInventors: Kazuhito Hoshino, Yoshio Iwasaki
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Patent number: 7400706Abstract: A method and an apparatus for liquid safety-detection by backscattering with a radiation source are provided that relate to a radiation detecting technology field.Type: GrantFiled: November 23, 2005Date of Patent: July 15, 2008Assignees: Tsinghua University, NucTech Company LimitedInventors: Yulan Li, Haifeng Hu, Yinong Liu, Zhiqiang Chen, Kejun Kang, Li Zhang, Wanlong Wu, Yuanjing Li, Yi Wang, Wenjun He, Mingrui Qi
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Patent number: 7394924Abstract: A method of processing a radiographic image obtained with a slot-scanning radiographic system to compensate for scattering of the illuminating beam in the tissue being imaged. A conventional circularly symmetric scatter mask, for example a point spread function, is adjusted to take account of the shape of the detector and time delay integration used in the slot scanning system, the presence of an air gap between the detector and the bottom of the tissue being imaged, and the collimation of the radiation beam. The result is a sharpened and shortened point spread function.Type: GrantFiled: October 14, 2003Date of Patent: July 1, 2008Assignee: Mirada Solutions LimitedInventors: Bruno Ancelin, Ralph Philip Highnam
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Patent number: 7336759Abstract: A method for compensating scattering includes acquiring the projective length of non-subject entities and acquiring the projective length of an object of radiography wherein the object of radiography is radiographed with a beam thickness set to the same value as a detector thickness and the object of radiography is radiographed with the beam thickness set to a value larger than the detector thickness. An amount of scattering is calculated based on the difference between the object data from the first scan and the object data from the second scan and stored in association with the sum of projective lengths. A subject is radiographed to produce data and the projective length of the subject is calculated along with the projective length of the non-subject entities having affected the data. The amount of scattering associated with the sum of the projective length and the projective length is then determined.Type: GrantFiled: March 1, 2006Date of Patent: February 26, 2008Assignee: GE Medical Systems Global Technology Company, LLCInventor: Masatake Nukui
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Patent number: 7334940Abstract: A method for correcting scatter in multi-slice imaging wherein, a projection p and a scatter correction factor R(d, do) are stored in association with each other, a projection p is determined from data D0 collected by imaging a subject with an X-ray beam with a beam thickness d using a detector with a detector thickness do, the scatter correction factor R(d, do) associated with the projection p is determined, and the data D0 is multiplied by the scatter correction factor R(d, do) to obtain scatter-corrected data D1.Type: GrantFiled: January 6, 2005Date of Patent: February 26, 2008Assignee: GE Medical Systems Global Technology Company, LLCInventor: Masatake Nukui
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Publication number: 20080043912Abstract: An imaging system for generating a diffraction profile is described. The imaging system includes a gantry including an x-ray imaging system configured to generate an x-ray image of a substance and a scatter system configured to generate a diffraction profile of the substance.Type: ApplicationFiled: August 15, 2006Publication date: February 21, 2008Inventor: Geoffrey Harding
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Patent number: 7324627Abstract: An apparatus for measuring the momentum transfer spectrum of elastically scattered X-ray quanta includes an anode having a focus extended in Y-direction which emits X-radiation in the X-direction, a primary collimator extending in the Y-direction which allows through only X-radiation aimed at a single isocenter, wherein the isocenter is the originating point of a Cartesian coordinates system, an examination area, a scatter collimator arranged between said examination area and the isocenter and configured to allow through only scattered radiation from an object introduced in said examination area, wherein the radiation is emitted at a fixed angle of scatter (?), and a detector. The X-component of a scatter voxel of the object is imaged onto the Z-component of the detector, and the detector is located in the Y-Z plane, distanced from the Z-axis, and developed as a two-dimensional pixellated detector having a plurality of energy-resolving detector elements.Type: GrantFiled: December 15, 2005Date of Patent: January 29, 2008Assignee: GE Homeland Protection, Inc.Inventor: Geoffrey Harding
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Publication number: 20080013685Abstract: An ultra-small angle X-ray scattering measuring apparatus includes a detector for detecting X-rays emitted from a sample, an X-ray collimating mirror arranged between the X-ray real focus and the sample, a monochromator arranged between the X-ray collimating mirror and the sample and an analyzer arranged between the sample and the detector. The X-ray collimating mirror includes a pair of X-ray mirrors that are arranged orthogonally relative to each other. The X-ray mirrors are multilayer film mirrors and their X-ray reflection surfaces are paraboloidal. The interplanar spacing of lattice planes of each of the multilayer films is continuously changed along the paraboloid so as to meet the Bragg's condition. The monochromator and the analyzer are formed by using a channel-cut crystal. The analyzer is driven to rotate for scanning around a 2?-axial line and diffracted rays reduced to a spectrum by the analyzer are detected by the detector.Type: ApplicationFiled: July 6, 2007Publication date: January 17, 2008Applicant: Rigaku CorporationInventors: Yoshio Iwasaki, Yutaka Yokozawa
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Publication number: 20080013684Abstract: A system for generating an improved diffraction profile is described. The system includes at least one x-ray source configured to generate x-rays and a primary collimator outputting a first x-ray beam to a first focus point and a second x-ray beam to a second focus point. The primary collimator generates the first and second x-ray beams from the x-rays. The system further includes a container, and a first scatter detector configured to detect a first set of scattered radiation generated upon intersection of the first x-ray beam with the container and to detect a second set of scattered radiation generated upon intersection of the second x-ray beam with the container. An angle of scatter of the first set of scattered radiation detected by the first scatter detector is at most half of an angle of scatter of the second set of scattered radiation detected by the first scatter detector.Type: ApplicationFiled: July 11, 2006Publication date: January 17, 2008Inventor: Geoffrey Harding
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Patent number: 7317390Abstract: An advanced technology screening checkpoint system includes a baggage screening zone, a passenger screening zone, and a secondary screening zone. The baggage screening zone may include an explosives scanning system and an imaging system, while the passenger screening zone may include an explosives detection portal and a self-divestment portal to show passengers what to divest prior to screening by a high sensitivity metal detection portal. In some implementations, a secondary screening zone includes a sealed-bottle scanning system, an enhanced explosives detection system, a weapons search routine, and a body scanning system. Centralized monitoring of screening results for individual detection and screening systems of the baggage, passenger, and secondary screening zones may be provided by a combined user interface (CUI).Type: GrantFiled: June 11, 2003Date of Patent: January 8, 2008Assignee: Quantum Magnetics, Inc.Inventors: John H. Huey, Stephen Wolff
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Patent number: 7295650Abstract: A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source (1) from which corresponding radiation is guided as a primary beam (2) to a sample (4) under investigation, with an X-ray or neutron detector (6) for receiving radiation diffracted or scattered from the sample (4), wherein the source (1), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop (5; 31; 41) is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector.Type: GrantFiled: September 18, 2006Date of Patent: November 13, 2007Assignee: Bruker AXS GmbHInventors: Joachim Lange, Rolf-Dieter Schipper
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Patent number: 7283605Abstract: A method for reconstructing an image of an object includes scanning the object with a computed tomography (CT) system to obtain data, estimating a size of the object using the obtained data, using the estimated size of the object to perform scatter correction on the obtained data, and reconstructing an image using the scatter corrected data.Type: GrantFiled: January 14, 2006Date of Patent: October 16, 2007Assignee: General Electric CompanyInventors: Paavana Sainath, Xiaoye Wu, Masatake Nukui, Ronald Joseph Lundgren, Thomas John Myers
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Patent number: 7282727Abstract: A method and apparatus is disclosed for an electron beam directed energy device. The device consists of an electron gun with one or more electron beams. The device includes one or more accelerating plates with holes aligned for beam passage. The plates may be flat or preferably shaped to direct each electron beam to exit the electron gun at a predetermined orientation. In one preferred application, the device is located in outer space with individual beams that are directed to focus at a distant target to be used to impact and destroy missiles. The aimings of the separate beams are designed to overcome Coulomb repulsion. A method is also presented for directing the beams to a target considering the variable terrestrial magnetic field. In another preferred application, the electron beam is directed into the ground to produce a subsurface x-ray source to locate and/or destroy buried or otherwise hidden objects including explosive devices.Type: GrantFiled: July 22, 2005Date of Patent: October 16, 2007Inventor: Michael W. Retsky
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Patent number: 7283613Abstract: A method of measuring a momentum transfer spectrum of elastically scattered X-ray quanta which emanate from a scatter voxel inside an object to be examined is described. A scatter voxel emits X-radiation in an X-direction and has a primary collimator which allows through only primary radiation aimed at a single isocentre at the origin of a Cartesian coordinates system. The X-ray quanta are emitted at an angle of scatter (?) with a constant Z-component (?z). The method includes simultaneous recording of the energy spectrum of scatter quanta from the scatter voxel at different angles of scatter (?) with a spatially-resolving and energy-resolving detector in the Y-Z plane, determining the momentum transfer from the geometric data of the radioscopy unit for different angles of scatter (?), and combining respective diffraction profiles belonging to different angles of scatter (?) to produce a total-diffraction profile.Type: GrantFiled: December 15, 2005Date of Patent: October 16, 2007Assignee: GE Homeland Protection, Inc.Inventor: Geoffrey Harding