With Measuring Or Testing Patents (Class 438/14)
  • Patent number: 11556117
    Abstract: A method of detecting and classifying anomalies during semiconductor processing includes executing a wafer recipe a semiconductor processing system to process a semiconductor wafer; monitoring sensor outputs from a sensors that monitor conditions associated with the semiconductor processing system; providing the sensor outputs to models trained to identify when the conditions associated with the semiconductor processing system indicate a fault in the semiconductor wafer; receiving an indication of a fault from at least one of the models; and generating a fault output in response to receiving the indication of the fault.
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: January 17, 2023
    Assignee: Applied Materials, Inc.
    Inventors: Shahab Arabshahi, Michael Nichols
  • Patent number: 11548113
    Abstract: A polishing method is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. A method of polishing a substrate by a polishing apparatus includes a polishing table (100) having a polishing surface, a top ring (1) for holding a substrate and pressing the substrate against the polishing surface, and a vertically movable mechanism (24) for moving the top ring (1) in a vertical direction. The top ring (1) is moved to a first height before the substrate is pressed against the polishing surface, and then the top ring (1) is moved to a second height after the substrate is pressed against the polishing surface.
    Type: Grant
    Filed: April 17, 2019
    Date of Patent: January 10, 2023
    Assignee: EBARA CORPORATION
    Inventors: Makoto Fukushima, Tetsuji Togawa, Shingo Togashi, Tomoshi Inoue
  • Patent number: 11536763
    Abstract: Disclosed are a method and apparatus for determining electrical characteristics of a transistor, and a computer-readable storage medium. The method for determining electrical characteristics of a transistor includes: determining mobility characteristics of carriers in channels of the transistor at a transistor operating temperature condition; and determining electrical characteristics of the transistor based on the mobility characteristics of the carriers, semiconductor material properties of the transistor, and structural features of the transistor.
    Type: Grant
    Filed: August 31, 2018
    Date of Patent: December 27, 2022
    Assignee: BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Jiangnan Lu, Hongge Li
  • Patent number: 11467084
    Abstract: Aspects of the disclosure provide methods for polysilicon characterization. The method includes receiving image data of a polysilicon structure formed on a sample substrate. The image data is in a spatial domain and is generated by transmission electron microscopy (TEM). Further, the method includes extracting frequency spectrum of the image data in a frequency domain. Then, the method includes selecting a subset of the frequency spectrum that corresponds to characteristic of first crystal grains that are of a first orientation, and transforming the selected subset of the frequency spectrum to the spatial domain to construct a first spatial image for the first crystal grains of the first orientation.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: October 11, 2022
    Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
    Inventors: Junzhan Liu, Chao Shen, Zhiliang Xia, Qiangmin Wei, Lei Li, Hai Song, Bingguo Wang
  • Patent number: 11469074
    Abstract: Systems and methods of enhancing imaging resolution by reducing crosstalk between detection elements of a secondary charged-particle detector in a multi-beam apparatus are disclosed. The multi-beam apparatus may comprise an electro-optical system for projecting a plurality of secondary charged-particle beams from a sample onto a charged-particle detector. The electro-optical system may include a first pre-limit aperture plate comprising a first aperture configured to block peripheral charged-particles of the plurality of secondary charged-particle beams, and a beam-limit aperture array comprising a second aperture configured to trim the plurality of secondary charged-particle beams. The charged-particle detector may include a plurality of detection elements, wherein a detection element of the plurality of detection elements is associated with a corresponding trimmed beam of the plurality of secondary charged-particle beams.
    Type: Grant
    Filed: May 28, 2020
    Date of Patent: October 11, 2022
    Assignee: ASML Netherlands B.V.
    Inventors: Weiming Ren, Xuerang Hu, Qingpo Xi, Xuedong Liu
  • Patent number: 11445651
    Abstract: A substrate work system including a work device configured to perform predetermined work on a substrate by use of an exchangeable work unit includes a storage section configured to store the work unit, a maintenance device configured to perform maintenance of the work unit, a conveyance device capable of conveying the work unit, a determination section configured to determine a maintenance time for the work unit used in the work device based on quality information on work quality of the predetermined work, and a control section configured to, when the determination section determines that a maintenance time arrives, cause the conveyance device, the work device, and the maintenance device to unload the work unit, convey the work unit to the work device to exchange with the work unit that has been used, and convey the used-up work unit to the maintenance device.
    Type: Grant
    Filed: February 16, 2018
    Date of Patent: September 13, 2022
    Assignee: FUJI CORPORATION
    Inventor: Hiroyuki Ao
  • Patent number: 11424396
    Abstract: An array of light emitting devices is mounted on a support surface with the transparent growth substrate (e.g., sapphire) facing up. A photoresist layer is then deposited over the top surface of the growth substrate, followed by depositing a reflective material over the top and side surfaces of the light emitting devices to encapsulate the light emitting devices. The top surfaces of the light emitting devices are then ground down to remove the reflective material over the top surface of the photoresist. The photoresist is then dissolved to leave a cavity over the growth substrate having reflective walls. The cavity is then filled with a phosphor. The phosphor-converted light emitting devices are then singulated to form packaged light emitting devices. All side light is reflected back into the light emitting device by the reflective material and eventually exits the light emitting device toward the phosphor. The packaged light emitting devices, when energized, appear as a white dot with no side emission (e.g.
    Type: Grant
    Filed: December 13, 2016
    Date of Patent: August 23, 2022
    Assignee: Lumileds LLC
    Inventors: Iwan-Wahyu Saputra, Yeow-Meng Teo
  • Patent number: 11417551
    Abstract: High bandwidth time-and-space resolved phase transition microscopy systems configured to detect melt onset in a wafer being processed by laser annealing systems with ultra-short dwell times and spot size.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: August 16, 2022
    Assignee: Veeco Instruments Inc.
    Inventor: Matthew Earl Wallace Reed
  • Patent number: 11404283
    Abstract: A method for etching a ruthenium film includes a first step of etching the ruthenium film by plasma processing using oxygen-containing gas, and a second step of etching the ruthenium film by plasma processing using chlorine-containing gas. The first step and the second step are alternately performed. In the first step and the second step, the ruthenium film is etched at a target control temperature for a target processing time that are determined based on a pre-obtained relation between an etching amount per one cycle including the first step and the second step as a set, a control temperature of the ruthenium film, and processing times of each of the first step and the second step.
    Type: Grant
    Filed: September 4, 2020
    Date of Patent: August 2, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Shigeru Tahara, Nobuaki Seki, Takahiko Kato
  • Patent number: 11395081
    Abstract: An acoustic testing method includes providing an electrical signal to a wafer, receiving a sound wave generated by the acoustic transducer according to the electrical signal, and generating a sensing result for determining an acoustic functionality of the acoustic transducer. The wafer includes a plurality of acoustic transducers, and the electrical signal is provided to an acoustic transducer within the wafer.
    Type: Grant
    Filed: September 2, 2020
    Date of Patent: July 19, 2022
    Assignee: xMEMS Labs, Inc.
    Inventors: Chiung C. Lo, Yuan-Shuang Liu, David Hong
  • Patent number: 11391757
    Abstract: A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.
    Type: Grant
    Filed: April 16, 2020
    Date of Patent: July 19, 2022
    Inventors: Changhyun Song, Jaehwan Jeong
  • Patent number: 11379648
    Abstract: A method for determining an overlapping process window (OPW) of an area of interest on a portion of a design layout for a device manufacturing process for imaging the portion onto a substrate, the method including: obtaining a plurality of features in the area of interest; obtaining a plurality of values of one or more processing parameters of the device manufacturing process; determining existence of defects, probability of the existence of defects, or both in imaging the plurality of features by the device manufacturing process under each of the plurality of values; and determining the OPW of the area of interest from the existence of defects, the probability of the existence of defects, or both.
    Type: Grant
    Filed: August 14, 2020
    Date of Patent: July 5, 2022
    Assignee: ASML Netherlands B.V.
    Inventors: Frank Gang Chen, Joseph Werner De Vocht, Yuelin Du, Wanyu Li, Yen-Wen Lu
  • Patent number: 11360464
    Abstract: High intensity multi-directional FDM 3D printing method for stereo vision monitoring involves intelligent control and computer vision technology. Specifically, it involves multi-directional 3D printing hardware platform construction, stereo vision detection, laser heating to enhance the connection strength between various parts of the model, so as to reduce the use of external support structure as much as possible on the premise of ensuring the printing accuracy, and make the various parts of the model can be well connected to enhance the integrity of the model.
    Type: Grant
    Filed: May 3, 2021
    Date of Patent: June 14, 2022
    Assignee: BEIJING UNIVERSITY OF TECHNOLOGY
    Inventors: Lifang Wu, Yupeng Guan, Miao Yu, Yisong Gao, Meishan Liu, Zechao Liu, Meng Jian, Ye Xiang, Ge Shi
  • Patent number: 11362819
    Abstract: The present invention provides an identification key generating device and an identification key generating method. The identification key generating device comprises: a plurality of unit cells provided on a circuit in a semiconductor manufacturing procedure; a reading unit for reading for shorting of each of the unit cells; a digital value generation unit for determining the probability for the shorting of each of the unit cells, and generating a digital value of each of the unit cells on the basis of the reading for shorting from the reading unit; and a selection unit for selecting at least one of the plurality of unit cells, wherein an identification key is generated from a combination of respective digital values generated from the unit cells selected by means of the selection unit.
    Type: Grant
    Filed: April 18, 2018
    Date of Patent: June 14, 2022
    Inventor: Taewook Kim
  • Patent number: 11355361
    Abstract: The present disclosure provides a method for measuring an underfill profile of an underfill material in an underfill cavity having a plurality of solder bumps. The method includes the operations of: determining a mesh having a plurality of elements according to the underfill cavity; calculating a reference force according to the underfill cavity; obtaining a driving force and a flow speed of the underfill material according to a plurality of weighting factors and the reference force, wherein the plurality of weighting factors respectively correspond to the plurality of elements; obtaining a plurality of volume fractions respectively corresponding to the plurality of elements according to the flow speed; and obtaining the underfill profile according to the plurality of volume fractions.
    Type: Grant
    Filed: July 21, 2021
    Date of Patent: June 7, 2022
    Assignee: CORETECH SYSTEM CO., LTD.
    Inventors: Yu-En Liang, Chia-Peng Sun, Chih-Chung Hsu, Rong-Yeu Chang, Chia-Hsiang Hsu
  • Patent number: 11322365
    Abstract: There is provided a substrate processing method including: reducing an oxide of a ruthenium film by supplying a hydrogen-containing gas to a substrate including the ruthenium film; etching the ruthenium film by supplying an oxygen-containing gas to the substrate so as to oxidize the ruthenium film; and repeating, multiple times, a cycle including reducing the oxide of the ruthenium film and etching the ruthenium film.
    Type: Grant
    Filed: September 23, 2020
    Date of Patent: May 3, 2022
    Assignee: TOKYO ELECTRON LIMITED
    Inventor: Hiroki Murakami
  • Patent number: 11313810
    Abstract: A method for verifying semiconductor wafers includes receiving a semiconductor wafer including a plurality of layers. A first set of measurement data is obtained for at least one layer of the plurality of layers, where the first set of measurement data includes at least one previously recorded thickness measurement for one or more portions of the at least one layer. The first set of measurement data is compared to a second set of measurement data for the at least one layer. The second set of measurement data includes at least one new thickness measurement for the one or more portions of the at least one layer. The semiconductor wafer is determined to be an authentic wafer based on the second set of measurement data corresponding to the first set of measurement data, otherwise the semiconductor is determined to not be an authentic wafer.
    Type: Grant
    Filed: November 14, 2019
    Date of Patent: April 26, 2022
    Assignee: International Business Machines Corporation
    Inventor: Effendi Leobandung
  • Patent number: 11309197
    Abstract: An example of a method of micro-transfer printing comprises providing a micro-transfer printable component source wafer, providing a stamp comprising a body and spaced-apart posts, and providing a light source for controllably irradiating each of the posts with light through the body. Each of the posts is contacted to a component to adhere the component thereto. The stamp with the adhered components is removed from the component source wafer. The selected posts are irradiated through the body with the light to detach selected components adhered to selected posts from the selected posts, leaving non-selected components adhered to non-selected posts. In some embodiments, using the stamp, the selected components are adhered to a provided destination substrate. In some embodiments, the selected components are discarded. An example micro-transfer printing system comprises a stamp comprising a body and spaced-apart posts and a light source for selectively irradiating each of the posts with light.
    Type: Grant
    Filed: November 1, 2019
    Date of Patent: April 19, 2022
    Assignee: X Display Company Technology Limited
    Inventors: Erich Radauscher, Ronald S. Cok, Christopher Andrew Bower, Matthew Alexander Meitl
  • Patent number: 11293943
    Abstract: The present disclosure relates to a power interface, and more particularly, to a power interface for electrically connecting an object to be tested and a test driving unit. The electric power interface in accordance with an exemplary embodiment includes: a support member; an elastic member fixed to the support member and configured to provide an elastic force in a vertical direction; a first connection terminal disposed on the elastic member; a second connection terminal electrically connected to the first connection terminal; and a flexible sheet has one side fixed to the elastic member and the other side fixed to the support member to restrict a deformation range of the elastic member.
    Type: Grant
    Filed: February 7, 2019
    Date of Patent: April 5, 2022
    Inventors: Jung Bae Kim, Min Jong Keum, Young Tae Yoon, Kyung Guk Lee
  • Patent number: 11270428
    Abstract: Embodiments related to systems and methods for thickness measurement in semiconductor structures are disclosed. For example, a method for thickness detection in a semiconductor structure may include detecting, by at least one processor, a tilt of an image of a stack of layers in the semiconductor structure. The method may also include performing, by the at least one processor, rough boundary line detection on the layers of the stack in the image. The method may further include performing, by the at least one processor, fine thickness detection on the layers of the stack in the image. The rough boundary line detection may detect boundaries of the layers of the stack with a first precision and the fine thickness detection may detect thickness of the layers of the stack with a second precision greater than the first precision. The method may additionally include providing, by the at least one processor, output results of the fine thickness detection.
    Type: Grant
    Filed: April 28, 2020
    Date of Patent: March 8, 2022
    Assignee: YANGTZE MEMORY TECHNOLOGIES CO., LTD.
    Inventor: Olmez Fatih
  • Patent number: 11257931
    Abstract: In some embodiments, a field effect transistor structure includes a first semiconductor structure and a gate structure. The first semiconductor structure includes a channel region, and a source region and a drain region. The source region and the drain region are formed on opposite ends of the channel region, respectively. The gate structure includes a central region and footing regions. The central region is formed over the first semiconductor structure. The footing regions are formed on opposite sides of the central region and along where the central region is adjacent to the first semiconductor structure.
    Type: Grant
    Filed: January 10, 2020
    Date of Patent: February 22, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Che-Cheng Chang, Chang-Yin Chen, Jr-Jung Lin, Chih-Han Lin, Yung Jung Chang
  • Patent number: 11249400
    Abstract: Systems, metrology modules and methods are provided, which identify, per wafer site, components of residuals from measurement of metrology metric(s), and optimize measurement parameters for each site, according to the identified residuals' components. Certain embodiments utilize metric landscapes to identify sensitive sites and/or to identify sites exhibiting highest accuracy, and corresponding metrics may be combined over the wafer to further enhance the metrology performance. Zonal analysis may be used to reduce the systematic errors, and disclosed per-site analysis may be used to further reduce the non-systematic error components, and relate the remaining residuals components to process variation over the wafer.
    Type: Grant
    Filed: September 30, 2019
    Date of Patent: February 15, 2022
    Assignee: KLA CORPORATION
    Inventors: Lilach Saltoun, Tal Marciano, Dana Klein
  • Patent number: 11245052
    Abstract: A method of producing microelectronic components includes forming a functional layer system; applying a laminar carrier to the functional layer system; attaching a workpiece to a workpiece carrier; utilizing incident radiation of a laser beam is focused in a boundary region between a growth substrate and the functional layer system, and a bond between the growth substrate and the functional layer system in the boundary region is weakened or destroyed; separating a functional layer stack from the growth substrate, wherein a vacuum gripper having a sealing zone that circumferentially encloses an inner region is applied to the reverse side of the growth substrate, a negative pressure is generated in the inner region such that separation of the functional layer stack from the growth substrate is initiated in the inner region; and the growth substrate held on the vacuum gripper is removed from the functional layer stack.
    Type: Grant
    Filed: March 21, 2018
    Date of Patent: February 8, 2022
    Assignee: 3D-Micromac AG
    Inventors: Sven Albert, René Boettcher, Alexander Boehm, Mike Lindner, Thomas Schmidt
  • Patent number: 11222788
    Abstract: Methods for enhancing a surface topography of a structure formed on a substrate are provided. In one example, the method includes performing a polishing process on a substrate having a shallow trench isolation structure and a diffusion region, performing a surface topography enhancing process to enlarge a defect in at least one of the shallow trench isolation structure and the diffusion region, inspecting at least one of the shallow trench isolation structure and the diffusion region to detect the enlarged defect, and adjusting a parameter of the polishing process in response to detecting the enlarged defect.
    Type: Grant
    Filed: August 21, 2020
    Date of Patent: January 11, 2022
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Han-Wen Liao, Jun-Xiu Liu, Chun-Chih Lin
  • Patent number: 11189023
    Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.
    Type: Grant
    Filed: November 19, 2020
    Date of Patent: November 30, 2021
    Assignee: Canon Virginia, Inc.
    Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
  • Patent number: 11182531
    Abstract: A method and system is provided for detecting at risk structures due to mask overlay that occur during lithography processes. The method can be implemented in a computer infrastructure having computer executable code tangibly embodied on a computer readable storage medium having programming instructions. The programming instructions are operable to obtain a simulation of a metal layer and a via, and determine a probability that an arbitrary point (x, y) on the metal layer is covered by the via by calculating a statistical coverage area metric followed by mathematical approximations of a summing function.
    Type: Grant
    Filed: July 16, 2019
    Date of Patent: November 23, 2021
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Shayak Banerjee, William Brearley
  • Patent number: 11169203
    Abstract: Example systems for determining a configuration of a test system execute operations that include receiving first parameters specifying at least part of an operation of a test system; receiving second parameters specifying at least part of a first configuration of the test system; determining a second configuration of the test system based, at least in part, on the first parameters and the second parameters, with the second configuration being determined to impact a cost of test of the test system; generating, by one or more processing devices, data for a graphical user interface representing information about the second configuration and the cost of test; and outputting the data for the graphical user interface for rendering on a display device.
    Type: Grant
    Filed: September 26, 2018
    Date of Patent: November 9, 2021
    Assignee: TERADYNE, INC.
    Inventor: Randall T. Kramer
  • Patent number: 11132791
    Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.
    Type: Grant
    Filed: November 19, 2020
    Date of Patent: September 28, 2021
    Assignee: Canon Virginia, Inc.
    Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
  • Patent number: 11119122
    Abstract: There is provided a method for correcting a relative position between a probe card having a plurality of cantilever-type probes and an object to be inspected having a plurality of electrode pads, including: arranging a first group of cantilever-type probes among the plurality of cantilever-type probes in a first region and a second region; arranging a second group of cantilever-type probes among the plurality of cantilever-type probes in a third region and a fourth region; obtaining needle traces formed on the plurality of electrode pads, which are generated when the first group of cantilever-type probes and the second group of cantilever-type probes that are arranged in the first region, the second region, the third region, and the fourth region, are brought into contact with the plurality of electrode pads; and correcting the relative position between the probe card and the object to be inspected based on the obtained needle traces.
    Type: Grant
    Filed: March 1, 2019
    Date of Patent: September 14, 2021
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Kunihiro Furuya, Shingo Ishida
  • Patent number: 11114331
    Abstract: A method for fabricating semiconductor device includes the steps of: forming a trench in a substrate; forming a pad layer adjacent to two sides of trench; forming a dielectric layer to fill the trench; and performing a dry etching process to remove the pad layer and part of the dielectric layer to form a shallow trench isolation (STI). Preferably, the dry etching process comprises a non-plasma etching process.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: September 7, 2021
    Assignee: UNITED MICROELECTRONICS CORP.
    Inventors: Hao-Hsuan Chang, Hung-Chun Lee, Shu-Ming Yeh, Ting-An Chien, Bin-Siang Tsai
  • Patent number: 11101173
    Abstract: This disclosure relates to a method for using a high volume manufacturing system for processing and measuring workpieces in a semiconductor processing sequence without leaving the system's controlled environment (e.g., sub-atmospheric pressure). The system includes an active interdiction control system to implement corrective processing within the system when a non-conformity is detected. The corrective processing method can include a remedial process sequence to correct the non-conformity or compensate for the non-conformity during subsequent process. The non-conformity may be associated with fabrication measurement data, process parameter data, and/or platform performance data.
    Type: Grant
    Filed: March 18, 2019
    Date of Patent: August 24, 2021
    Assignee: Tokyo Electron Limited
    Inventors: Robert Clark, Jeffrey Smith, Kandabara Tapily, Angelique Raley, Qiang Zhao
  • Patent number: 11094556
    Abstract: In a method of manufacturing a semiconductor device, an underlying structure is formed over a substrate. A film is formed over the underlying structure. Surface topography of the film is measured and the surface topography is stored as topography data. A local etching is performed by using directional etching and scanning the substrate so that an entire surface of the film is subjected to the directional etching. A plasma beam intensity of the directional etching is adjusted according to the topography data.
    Type: Grant
    Filed: April 12, 2019
    Date of Patent: August 17, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Ya-Wen Yeh, Yu-Tien Shen, Shih-Chun Huang, Po-Chin Chang, Wei-Liang Lin, Yung-Sung Yen, Wei-Hao Wu, Li-Te Lin, Pinyen Lin, Ru-Gun Liu
  • Patent number: 11088037
    Abstract: A semiconductor device includes a substrate including a circuit region and an outer border, a plurality of detecting devices disposed over the substrate and located between the circuit region and the outer border, first and second probe pads electrically connected to two ends of each detecting device, and a seal ring located between the outer border of the substrate and the detecting devices. A method for detecting defects in a semiconductor device includes singulating a die having a substrate, a plurality of detecting devices, a first probe pad and a second probe pad electrically connected to two ends of each detecting device, and a seal ring; probing the first and the second probe pads to determine a connection status of the detecting devices; and recognizing a defect when the connection status of the detecting devices indicates an open circuit.
    Type: Grant
    Filed: January 22, 2019
    Date of Patent: August 10, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    Inventors: Yang-Che Chen, Wei-Yu Chou, Hong-Seng Shue, Chen-Hua Lin, Huang-Wen Tseng, Victor Chiang Liang, Chwen-Ming Liu
  • Patent number: 11087954
    Abstract: A wafer inspection system includes a controller in communication with an electron-beam inspection tool. The controller includes circuitry to: acquire, via an optical imaging tool, coordinates of defects on a sample; set a Field of View (FoV) of the electron-beam inspection tool to a first size to locate a subset of the defects; determine a position of each defect of the subset of the defects based on inspection data generated by the electron-beam inspection tool during a scanning of the sample; adjust the coordinates of the defects based on the determined positions of the subset of the defects; and set the FoV of the electron-beam inspection tool to a second size to locate additional defects based on the adjusted coordinates.
    Type: Grant
    Filed: July 19, 2019
    Date of Patent: August 10, 2021
    Assignee: ASML Netherlands B.V.
    Inventors: Wei Fang, Joe Wang
  • Patent number: 11080450
    Abstract: A netlist may include a set of resistance components of an integrated circuit (IC) design, and may specify a length, a width, and a metal layer of each resistance component in the set of resistance components, and physical locations of circuit nodes connected to each resistance component in the set of resistance components. A process description may specify the resistivity and thickness of each metal layer in the IC design. For a resistance component in the set of resistance components, resistivity and thickness of the metal layer of the resistance component may be determined based on the process description, and an inductance component corresponding to the resistance component may be determined based on the length and the width of the resistance component, the resistivity and the thickness of the metal layer of the resistance component, and the physical locations of the circuit nodes connected to the resistance component.
    Type: Grant
    Filed: October 15, 2020
    Date of Patent: August 3, 2021
    Assignee: Synopsys, Inc.
    Inventor: Joseph Gregory Rollins
  • Patent number: 11075225
    Abstract: A display device including: a substrate including a display area for displaying an image and a non-display area positioned at a periphery of the display area; a plurality of pixels positioned at the display area; a plurality of data lines connected with the plurality of pixels; and a crack detecting line positioned at the non-display area, wherein the crack detecting line includes: a plurality of unit connectors extending in a first direction, wherein the first direction is parallel to an extending direction of a side of the substrate nearest to the unit connectors; and a plurality of wiring portion units connected to each other through the plurality of unit connectors, wherein the number of wiring portion units is an even number.
    Type: Grant
    Filed: April 12, 2018
    Date of Patent: July 27, 2021
    Assignee: SAMSUNG DISPLAY CO., LTD.
    Inventors: Hey Jin Shin, Won Kyu Kwak, Seung-Kyu Lee
  • Patent number: 11069674
    Abstract: A semiconductor device includes “n” pairs of pn-junction structures, wherein the i-th pair includes two pn-junction structures of the i-th type, wherein the two pn-junction structures of the i-th type are anti-serially connected, wherein the pn-junction structure of the i-th type has an i-th junction grading coefficient mi. A first pair of the n pairs of pn-junction structures has a first junction grading coefficient m1 and a second pair of the n pairs of pn-junction structures has a second junction grading coefficient m2. The junction grading coefficients m1, m2 are adjusted to result in generation of a spurious third harmonic signal of the semiconductor device with a signal power level, which is at least 10 dB lower than a reference signal power level of the spurious third harmonic signal obtained for a reference case in which the first and second junction grading coefficients m1, m2 are 0.25.
    Type: Grant
    Filed: August 12, 2019
    Date of Patent: July 20, 2021
    Assignee: INFINEON TECHNOLOGIES AG
    Inventor: Joost Adriaan Willemen
  • Patent number: 11060895
    Abstract: A gas meter includes a meter body having a meter inlet into which a fluid-to-be-measured is to flow and a meter outlet from which the fluid-to-be-measured is to flow out, and an extended section extending from the meter inlet to an interior of the meter body. The gas meter further includes a flow rate measurement unit inside the meter body, the flow rate measurement unit having a measurement flow passage having a straight tubular shape, a lead-in port and a lead-out port for the fluid-to-be-measured, and a shutoff valve in an internal passage of the extended section. The lead-in port is airtightly connected to the extended section so as to communicate with the internal passage.
    Type: Grant
    Filed: May 10, 2018
    Date of Patent: July 13, 2021
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Masaki Sugiyama, Hiroaki Katase, Naoto Naganuma
  • Patent number: 11054752
    Abstract: An overlay metrology system includes one or more processors coupled to an illumination source to direct illumination to a sample and a detector to capture diffracted orders of radiation from the sample. The system may generate overlay sensitivity calibration parameters based on differential measurements of a calibration target including two overlay target cells on the sample, where first-layer target elements and second-layer target elements of the overlay target cells are distributed with a common pitch along a measurement direction and are misregistered with a selected offset value in opposite directions. The system may further determine overlay measurements based on differential measurements of additional overlay target cells with two wavelengths, where first-layer target elements and second-layer target elements of the additional overlay target cells are distributed with the common pitch and are formed to overlap symmetrically.
    Type: Grant
    Filed: August 13, 2018
    Date of Patent: July 6, 2021
    Assignee: KLA Corporation
    Inventors: Eran Amit, Daniel Kandel, Dror Alumot, Amit Shaked, Liran Yerushalmi
  • Patent number: 11036211
    Abstract: Based on at least one manufacturing process characteristics associated with a manufacturing process, a prediction time at which to execute a selected machine learning model selected from multiple trained machine learning models is determined, and at the prediction time, the selected machine learning model is executed. Executing the selected machine learning model predicts a control set point for future values of state variables of the manufacturing process, for controlling the manufacturing process. Based on at least one of the manufacturing process characteristics, a learning time at which to train a machine learning model is determined, and at the learning time, the machine learning model is trained based on historical process data associated with the manufacturing process.
    Type: Grant
    Filed: May 13, 2019
    Date of Patent: June 15, 2021
    Assignee: International Business Machines Corporation
    Inventors: Young Min Lee, Edward Pring, Kyong Min Yeo, Nam H Nguyen, Jayant R. Kalagnanam, Christian Makaya, Hui Qi, Dhavalkumar C Patel
  • Patent number: 11036203
    Abstract: A fabrication system for fabricating a three-dimensional object includes processing circuitry. The processing circuitry estimates, according to a fabrication condition and fabrication data, a three-dimensional object to be fabricated according to the fabrication data and corrects the fabrication data according to an estimation result of the three-dimensional object estimated by the processing circuitry.
    Type: Grant
    Filed: March 13, 2019
    Date of Patent: June 15, 2021
    Assignee: Ricoh Company, Ltd.
    Inventors: Wataru Sugawara, Hiroshi Maeda, Yoshinobu Takeyama, Tsukasa Matsuoka, Yoichi Ito, Shingo Nagatsuka
  • Patent number: 11010509
    Abstract: Embodiments of the present invention provide a novel method and discretization for animating water waves. The approaches disclosed combine the flexibility of a numerical approach to wave simulation with the stability and visual detail provided by a spectrum-based approach to provide Eulerian methods for simulating large-scale oceans with highly detailed wave features. A graphics processing unit stores a one-dimensional texture referred to as a wave profile buffer that stores pre-computed results at a number of discrete sample points for performing wave height evaluation. The water surface is rendered according to water height values computed using the wave profile, accounting for advection, spatial diffusion, angular diffusion, boundary reflections, and dissipation.
    Type: Grant
    Filed: August 21, 2018
    Date of Patent: May 18, 2021
    Assignee: NVIDIA Corporation
    Inventors: Stefan Jeschke, Matthias Mueller-Fischer, Nuttapong Chentanez, Miles Macklin
  • Patent number: 10997712
    Abstract: Devices, systems, and methods obtain a reference image; obtain a test image; globally align the test image to the reference image; select subfields in the test image; align the subfields in the test image with respective areas in the reference image; warp the test image based on the aligning of the subfields; select anchor points in the reference image; select anchor-edge points in the reference image; realign the subfields in the warped test image with respective areas in the reference image based on the anchor points in the reference image and on the anchor-edge points in the reference image; and warp the warped test image based on the realigning of the subfields.
    Type: Grant
    Filed: January 15, 2019
    Date of Patent: May 4, 2021
    Assignee: Canon Virginia, Inc.
    Inventors: Xiwu Cao, Nikhil Krishnan, Bradley Scott Denney, Hung Khei Huang
  • Patent number: 10989747
    Abstract: A device for measuring electrical properties of electrical contacts within an electroplating apparatus has a disc-shaped structure like that of a wafer. Multiple conductive pads are formed to collectively circumscribe an outer periphery of the disc-shaped structure. Adjacently positioned ones of the conductive pads are electrically isolated from each other. The device includes a current source that supplies electric current at a first terminal and sinks electric current at a second terminal. The device includes measurement circuitry, having first and second input terminals, that determines a value of an electrical parameter based on signals present at the first and second input terminals. The device includes switching circuitry for connecting selected ones of the conductive pads to the first and second terminals of the current source and to the first and second input terminals of the measurement circuitry at a given time. The device also includes an onboard power supply.
    Type: Grant
    Filed: September 17, 2019
    Date of Patent: April 27, 2021
    Assignee: Lam Research Corporation
    Inventors: Mark E. Emerson, Steven T. Mayer, Lawrence Ossowski
  • Patent number: 10990023
    Abstract: A method of overlay error measurement includes disposing a reference pattern module over a substrate. The substrate includes first and second overlay measurement patterns in first and second locations. The reference pattern module includes first and second reference patterns. The method includes creating a first overlap of the first reference pattern with the first overlay measurement pattern and a second overlap of the second reference pattern with the second overlay measurement pattern. The method further includes determining a first overlay error between the first reference pattern of the reference pattern module and the first overlay measurement pattern of the substrate and determining a second overlay error between the second reference pattern and the second overlay measurement pattern. The method also includes determining a total overlay error between the first and second overlay measurement patterns of the substrate based on the first and second overlay errors.
    Type: Grant
    Filed: February 27, 2020
    Date of Patent: April 27, 2021
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Hung-Chih Hsieh, Yen-Liang Chen
  • Patent number: 10987909
    Abstract: The present invention provides a method of laminating a film for a dye-sensitized cell. First, a composite film is taken by a robotic arm, in which the composite film includes a release layer, a protective layer and a hot glue layer between the release layer and the protective layer, and the release layer is removed by the robotic arm. Then, the hot glue layer is precisely attached to a substrate by a target positioning step. Next, the protective layer is removed by the robotic arm.
    Type: Grant
    Filed: October 2, 2019
    Date of Patent: April 27, 2021
    Assignee: FORMOSA PLASTICS CORPORATION
    Inventors: Ching-Fu Chen, Hao-Wei Chen, Kun-Tai Ho, Wan-Tun Hung, Po-Min Chen, Liang-Kun Huang, Chih-Chou Chang, Yung-Liang Tung, Po-Tsung Hsiao, Ming-De Lu
  • Patent number: 10977559
    Abstract: A method and a system are provided for predicting a non-linear relationship between a plurality of parameters in a deep neural network framework. The method comprises receiving, by an application server, a plurality of parameter values associated with the plurality of parameters. The method further comprises selecting, by the application server, an activation function based on a desired output. In an embodiment, the desired output is based on an industry type and an application area of the plurality of parameters. The method further comprises predicting, by the application server, the non-linear relationship between the plurality of parameters by modelling the deep neural network framework based on the selected activation function.
    Type: Grant
    Filed: March 27, 2017
    Date of Patent: April 13, 2021
    Assignee: Wipro Limited
    Inventor: Chaitanya Rajendra Zanpure
  • Patent number: 10971347
    Abstract: In order to provide a charged particle beam apparatus capable of stably detecting secondary particles and electromagnetic waves even for a non-conductive sample under high vacuum environment and enabling excellent observation and analysis, the charged particle beam apparatus includes a charged particle gun (12), scanning deflectors (17 and 18) configured to scan a charged particle beam (20) emitted from the charged particle gun (12) onto a sample (21), detectors (40 and 41) configured to detect a scanning control voltage input from an outside into the scanning deflectors, an arithmetic unit (42) configured to calculate, based on the detected scanning control voltage, irradiation pixel coordinates for the charged particle beam; and an irradiation controller (45) configured to control irradiation of the sample with the charged particle beam according to the irradiation pixel coordinates.
    Type: Grant
    Filed: June 23, 2016
    Date of Patent: April 6, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Mitsuhiro Nakamura, Hironori Itabashi, Hirofumi Satou, Tsutomu Saito, Masahiro Sasajima, Natsuki Tsuno, Yohei Nakamura
  • Patent number: 10969220
    Abstract: A method for characterizing a sample, by estimating a plurality of characteristic thicknesses, each being associated with a calibration material, including acquiring an energy spectrum (Sech) transmitted through this sample, located in an X and/or gamma spectral band; for each spectrum of a plurality of calibration spectra (sbase(Lk; Lt)) calculating a likelihood from said calibration spectrum (Sbase(Lk; Lt)), and from the spectrum transmitted through the sample (Sech), each calibration spectrum (Sbase(Lk; Lt)) corresponding to the energy spectrum transmitted through a stack of gauge blocks, each formed of a known thickness of a calibration material; estimating the characteristic thicknesses (L1, L2) associated with the sample according to the criterion of maximum likelihood.
    Type: Grant
    Filed: June 14, 2016
    Date of Patent: April 6, 2021
    Assignee: Commissariat a L'Energie Atomique et aux Energies Alternatives
    Inventors: Andrea Brambilla, Alexia Gorecki, Alexandra Potop
  • Patent number: 10970834
    Abstract: A deep learning algorithm is used for defect discovery, such as for semiconductor wafers. A care area is inspected with the wafer inspection tool. The deep learning algorithm is used to identify and classify defects in the care area. This can be repeated for remaining care areas, but similar care areas may be skipped to increase throughput.
    Type: Grant
    Filed: July 13, 2018
    Date of Patent: April 6, 2021
    Assignee: KLA-Tencor Corporation
    Inventor: Arpit Yati