Abstract: Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays them as indexes. The equipment acquires data of edge roughness over a sufficiently long area, integrates a components corresponding to a spatial frequency region being set on a power spectrum by the operator, and displays them on a length measuring SEM. Alternatively, the equipment divides the edge roughness data of the sufficiently long area, computes long-period roughness and short-period roughness that correspond to an arbitrary inspection area by performing statistical processing and fitting based on theoretical calculation, and displays them on the length measuring SEM.

Abstract: By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced analysis of process flow characteristics may be accomplished. Consequently, an efficient yield loss estimation may be performed.

Abstract: There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a threshold voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.

Abstract: An integrated circuit (1) that comprises an internal clock circuit (12) with a clock output for clocking functional circuits (10) of the integrated circuit (1). The integrated circuit is provided with a counter circuit (16) and a state holding circuit (18) for use during testing. The integrated circuit is switched to a test mode and a start of a test time interval is signalled. Clock pulses from the internal clock circuit 12 are counted from the start of the test time interval and the state holding circuit (18) is locked into a predetermined state if the internal clock circuit has produced more than a predetermined number of clock pulses from the start of the test time interval. Information about whether the state holding circuit (18) has reached the predetermined state in the test time interval is read from the integrated circuit (1) and the information is used by a test evaluation apparatus (2) to accept or reject the integrated circuit (1).

Abstract: For a plurality of divided areas on a wafer that is exposed by generating measurement pattern images, a predetermined statistic that includes the deviation of the luminance value of each pixel included in imaging data obtained by the imaging with respect to a predetermined reference value is computed, for example, the variance is computed, and optical characteristics of a projection optical system are obtained based on a computation result of the computed statistic of each of the divided areas (steps 504, 506, 512 and 514). Therefore, the optical characteristics can be measured with good repeatability even by a measurement device such as a microscope having a lower resolution compared with the SEM or the like, for example, an alignment sensor by an image-forming method of an exposure apparatus or the like.

Abstract: A color sensor monitors the output of a color producing process and produces a signal representative of a color produced by the color producing process. The signal can be used as feedback signal to control the process. Occasionally, the color sensor signal includes a component representing a transient error. A system model of the color producing process is used to predict reasonable sensor signals. A comparison of the sensor signal with the predicted sensor signals is used to determine if the sensor signal is reasonable. If the sensor signal is unreasonable, a substitute signal is used as the feedback signal to the control process. The substitute signal can be a predicted sensor signal or a signal based on historical system performance data.

Abstract: An information processing apparatus processes information generated by an exposure apparatus. The information processing apparatus includes a collecting unit and a converting unit. The collecting unit collects first apparatus information obtained by the exposure apparatus via an operation thereof with respect to each of a plurality of first regions which form a first array defined on a substrate. The converting unit converts at least a part of the first apparatus information collected with respect to each of the plurality of first regions by the collecting unit into second apparatus information with respect to each of a plurality of second regions which form a second array.

Abstract: A system for certifying provenance of an alcoholic beverage includes a radio-frequency identification tag and a server. The radio-frequency identification tag, associated with a bottle containing an alcoholic beverage, periodically measures a plurality of values of an environmental condition of the bottle. The radio-frequency identification tag stores the plurality of measured values. The server receives the plurality of measured values for analysis. The server provides, via a user interface, a description of a provenance of the alcoholic beverage, the description generated responsive to an analysis of the plurality of measured values.

Abstract: An optical metrology model for a repetitive structure is optimized by selecting one or more profile parameters using one or more selection criteria. One or more termination criteria are set, the one or more termination criteria comprising measures of stability of the optical metrology model. The profile shape features of the repetitive structure are characterized using the one or more selected profile parameters. The optical metrology model is optimized using a set of values for the one or more selected profile parameters. One or more profile parameters of the profile of the repetitive structure are determined using the optimized optical metrology model and one or more measured diffraction signals. Values of the one or more termination criteria are calculated using the one or more determined profile parameters.

Abstract: A method and apparatus for authenticating items having a security mark containing a DNA fragment to prevent fraud uses a Raman spectrometer to generate a response spectrum from monochrome incident beam on the security mark on an item. Gross fluorescence is removed from the security mark response spectrum to produce a Raman security mark response spectrum. Peaks in the Raman security mark response spectrum are detected to generate Raman security mark peak data. The Raman security mark peak data is compared to a Raman peak library to determine if there is a match. The item is indicated as being authentic if a match of the Raman security mark peak data is found in the Raman peak library.

Abstract: A method of deciding the quality of a measurement value of the line width, the line interval or the like of a pattern on an object to-be-measured, including acquiring the signal intensity distribution of the pattern on the object to-be-measured, detecting the edge positions of the pattern from the acquired signal intensity distribution, detecting the taper widths of the edge parts of the pattern from the acquired signal intensity distribution, and deciding that the measurement value calculated on the basis of the detected edge positions is correct, when the detected taper widths fall within a predetermined range set beforehand. In this way, it is permitted to automatically decide the defective measurement of the line width of the pattern, or the like, attributed to an unclear image due to inferior focusing in an image photographing mode, an unclear image due to an image drift ascribable to charging-up, or the like.

Abstract: A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.

Abstract: A probe for a system for determining the chemical signature of a pharmaceutical compound. The probe comprises: a housing; an inlet in the housing adapted to be connected to a transmitting optical fiber; a scanning aperture in the housing; a receiving outlet in the housing adapted to be connected to a receiving optical fiber; at least one transmission reflector positioned in the housing to receive laser light from the transmitting optical fiber and reflect the laser light through the detection outlet to a pharmaceutical vial containing a pharmaceutical compound positioned outside the housing, and at least one receiving reflector positioned in the housing to receive light reflected by the pharmaceutical compound and reflect the light to the receiving outlet. This configuration can enable rapid and accurate scanning of a pharmaceutical contained in a vial positioned adjacent the detection outlet.

Abstract: A display (1100) comprises a passive screen (106, 502, 700, 1114) printed with a pattern (404) of different color quantum dots (602, 604, 606) that is excited by scanning a laser (130, 1108) over the screen (106, 502, 700, 1114). The display (1100) can be incorporated into a handheld device (100, 1200) to improve the use-ability of the device (100, 1200).

Abstract: A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an amount of defects classified by sizes of the defects existing in each of the intermediate products; a failure magnitude calculation module configured to calculate a systematic failure magnitude of the intermediate products caused by fabrication procedure of the intermediate products; a classification module configured to classify a calculated result of the systematic failure magnitude; and a review target selection module configured to select intermediate products becoming review targets.

Abstract: Aspects of the present invention describe a method and apparatus for automating quality control for gene expression data. A computer based device receives gene expression data associated with a spectral species and genetic sample in each well of a plate. Gene expression data may be received from a sequence detection instrument performing one or more gene expression related operations for each of the wells of the plate. The computer based device identifies gene expression data determined to have anomalous characteristics according to a set of one or more quality control metrics and may conditionally flag one or more wells of the plate affected by the anomalous characteristics. Filters can then be selectively applied to temporarily or permanently remove the flagged data from subsequent gene expression studies.

Abstract: There is provided a measuring apparatus for measuring a signal-under-test, having a comparator for sequentially comparing voltage values of the signal-under-test with a reference voltage value fed thereto at timing of strobe signals sequentially fed thereto, a strobe timing generator for sequentially generating the strobe signals placed almost at equal time intervals, a capture memory for storing the comparison result of the comparator and a digital signal processing section for calculating jitter of the signal-under-test based on the comparison result stored in the capture memory.

Abstract: The defect confirmation screen of a pattern inspection apparatus that allows the user to create a recipe and check defects easily and quickly includes a “map display part” where a wafer map is displayed, an “image display part” where a list of defect images is displayed, a “list display part” where detailed information on defects is displayed and set, and a “graph display part” where a graph is displayed for selected defect items. Those display parts cooperate with each other and change the defect images, defect information list, and defect graph according to selected map information. A classification code, a clustering condition, and a display filter entered using the information described above are registered in a recipe.

Abstract: A method includes defining a plurality of simple sampling rules for selecting material for metrology. Each simple sampling rule has an associated penalty. At least one combination sampling rule relating a subset of at least two simple sampling rules is defined. The combination sampling rule has an associated penalty. The penalties are assessed responsive to a previous material selection not satisfying the simple sampling rules or the combination sampling rule. Material is selected for subsequent metrology based on the sampling rules and the assessed penalties. At least one characteristic of the selected material is measured.

Abstract: An electrode material for a lithium secondary battery which includes particles each having a central portion and a surface portion covering the surface of the central portion. A distance from a center to an outermost surface of the particle is occupied 80 to 99% by the central portion and 1 to 20% by the surface portion. The central portion includes LiM1-aDaO2 having an ?-NaFeO2 structure, and the surface portion includes LiM1-bEbO2 having an ?-NaFeO2 structure. (M is C or Ni; D is a transition metal element or Al replacing a part of Co or Ni as M; E is a metal element replacing a part of Co or Ni as M; and M is not the same as D or E.) The following relationships are satisfied in the central portion, in terms of atomic ratio: D/(M+D+E)<0.05 and E/(M+D+E)<0.05.

Abstract: Various method embodiments comprise testing a plurality of RFID tags forming at least a portion of a first web to identify defective RFID tags and verified RFID tags, cutting the first web between a rotary die and an anvil to remove at least the verified RFID tags from the first web, rotating the anvil to transfer the verified RFID tags cut from the first web away from the first web, placing the verified RFID tags from the anvil onto a second web to form a third web having a first major surface, preventing the defective RFID tags from being placed from the anvil on the second web, and re-testing the RFID tags forming at least a portion of the third web. Other aspects and embodiments are provided herein.

Abstract: An alarm detection part 103 monitors each element of a manufacturing device 1, and detects an abnormality generated in the execution of a manufacturing process. In a process evaluation part 105, an alarm severity judgment part 1051 judges an influence (“alarm severity”) exerted by this abnormality upon an object such as a product, a semi-finished product or a product in process. Further, an alarm recurrence prevention advice judgment part 1053 makes judgment about advice on the recurrence prevention of an abnormality (“alarm recurrence prevention advice”). A detailed screen SC3 showing executed process results presented on an output device 57 contains the alarm severity and the alarm recurrence prevention advice.

Abstract: A method performs quality control testing on the objects in a set of objects to obtain a level of quality. The method identifies a number of objects that satisfy the static testing limits, determines statistical measures from the number of objects, determines a dynamic range of values from the statistical measures, and then identifies the objects that satisfy the dynamic range of values.

Abstract: The present system enables the monitoring and automatic control of the tolerance in splice overlap of textile play , though the identification of the overlap area, identification and counting of textile cords in the overlap area, and the generation of a control signal for the manufacturing equipment based on parameters and criteria defined by a user. The system includes an image acquisition sub-assembly that contains a lighting module, artificial vision module, and respective elements of support, fixation, conditioning and adjustment. The system also includes a quality control computer program that has a module of morphologic image analysis for detection and recognition of the overlap of the ply, detecting and counting of cords in the overlap area, a module of support to the decision of acceptance/rejection of the ply based on parameters defined by the user and a module of an interface with production equipment.

Abstract: Multiple parameters of manufactured units are continually measured until some of the units fail, where failure can be accelerated by adjusting operating conditions. Pre-failure data is then examined to find outliers or aberrant parameter values that may have contributed to the failures. The data is normalized to allow different parameters to be compared to one another. The parameters producing the highest outlier values are then used to screen subsequently manufactured units, thus significantly reducing the number of measurements that have to be taken to screen the units. Lower outlier values for these parameters are, however, used in screening subsequently manufactured units to “catch” potentially defective units.

Abstract: A method for augmenting quality or reliability of semiconductor units, including providing few populations of semiconductor units that are subject to quality or reliability testing. The populations include few quality or reliability fail candidate populations and other population(s). The method includes the step of associating test flows to the populations. Each test flow includes stress testing sequence. The stress testing sequence for the quality or reliability fail candidate population includes a stress test of increased duration compared to duration of a stress test in the test flow of the other population. The stress test sequence for the other population includes a stress test of increased voltage compared to corresponding operating voltage specification for a semiconductor unit. The method further includes the step of applying, within a sort testing stage, the corresponding test flow to the populations and identifying any unit which failed the stress sequence.

Abstract: A peel plate assembly for selectively removing RFID tags from a web for applying the RFID tags to a succession of articles includes an extendible or retractable peel blade and an RFID sensor recess mounted within a plate body. A cover for the plate body functions both as a web guide for advancing a succession of RFID tags past the sensor to the peel blade and as part of a shielding system to isolate communications between the sensor and the closest RFID tag to the peel blade.

Abstract: The invention relates to a method for color matching a reference color formulation to a defined color shade standard. The method comprises the steps 1. Measuring the reflectance spectrum RST of a color shade standard, 2. Mixing a paint according to a recipe for the color shade standard and applying the paint to a substrate, 3. Measuring the reflectance spectrum RPT of the applied paint, 4. Recalculating the theoretical reflectance spectrum RRPT for the recipe of the applied paint, 5. Calculating the difference spectrum ?R between the measured reflectance spectrum RPT of the applied paint and the recalculated reflectance spectrum RRPT, 6. Adjusting the reflectance spectrum RST of the color shade standard with the difference spectrum ?R, 7. Calculating a recipe on basis of the modified reflectance spectrum RSTM, 8. Mixing a paint according to the recipe and applying the paint to a substrate.

Abstract: A tool with one or more chambers in a manufacturing system is identified as performing at or below an acceptable level by the following steps. Store process data from tools for each one of a plurality of individual processes for a processed object in a process database. Store tool performance data for each individual process for a processed object in a yield database. Develop statistics for similar tool sets associating data with each of the similar tool units. Generate yield numbers for each group of the similar tool units based upon the statistics. Identify poorly/well performing tool units by using the yield numbers.

Abstract: Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequency of occurrence of disagreement between inspection results after an intermediate process and after the final results will come to within a specified range. After an initial value is assigned for a reference value, this value is sequentially varied while repeating specified processes of saving measured and judgment data on inspected portions of components in a memory and setting a reference value by using the data saved in the memory until a specified condition becomes satisfied.

Abstract: The present invention comprises systems and methods for providing electronic quality control in a process for applying a polyurethane to a substrate. One aspect of the present invention includes a computer-implemented method for providing electronic quality control during manufacturing of a polyurethane coated article. The method can include providing a user interface for a user to input at least one operating characteristic associated with a process for manufacturing a polyurethane coated article. Furthermore, the method can include receiving a selection of at least one operating characteristic from the user, and receiving at least one condition associated with the operating characteristic. Moreover, the method can include monitoring a process for manufacturing a polyurethane coated article, wherein a change to the operating characteristic can be detected. The method can also include generating a notification if the at least one condition is detected.

Abstract: When measurement data collected with a specific sampling cycle by MCs from measuring instrument units are stored into a data storage means, a sampling control means adjusts the sampling cycle to a longer setting if the apparatus state is other than a substrate processing execution state (e.g., an idling state) compared to the sampling cycle set in the substrate processing execution state, so as to minimize the volume of data stored into the data storage means.

Abstract: An apparatus, system and method to automate an interactive quality control inspection process. The apparatus may query a user for a response to an audit question integral to a quality control inspection process, such as, for example, a regulatory compliance question or a standard operating procedures question. The apparatus may determine, based on the response, compliance with predetermined quality control criteria. To maximize data security and privacy, the response and/or the predetermined quality control criteria may be stored in a storage device under the exclusive control of the user, and access to such information may be restricted to authorized users according to access rights. Further, the apparatus may facilitate quality and safety assurance by conditioning continuation of the quality control inspection process on completion of a corrective action where the response fails to comply with the predetermined quality control criteria.

Abstract: A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method including the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.

Abstract: A system for managing production information includes a defect information database, a defect information collection unit, and a manufacturing apparatus information managing unit. The defect information database stores defect information including a coordinate value of a defect portion and a defect feature amount which are detected by inspecting a specimen processed in a device manufacturing line by using an optical inspection apparatus having an ultraviolet light source. The defect information collection unit at least one of collates and retrieves defect information from the defect information database and judges a fatality of a defect. The manufacturing apparatus information managing unit which processes information stored in the defect information collection unit and stores information on transition of yield and maintenance condition of a manufacturing apparatus in the device manufacturing line.

Abstract: An aligner evaluation system includes (a) an error calculation module configured to calculate error information on mutual optical system errors among a plurality of aligners; (b) a simulation module configured to simulate device patterns to be delineated by each of the aligners based on the error information; and (c) a evaluation module configured to evaluate whether each of the aligners has appropriate performances for implementing an organization of a product development machine group based on the simulated device pattern.

Abstract: A method for determining metrology sampling rates for workpieces in a process flow includes determining a current status of the process flow. Future processing of the workpieces in the process flow is simulated based on the current status of the process flow over a predetermined time horizon to predict sampling rates for the workpieces. During the simulating, sampling rules are implemented that consider capacity constraints of a metrology resource in the process flow. Actual workpieces in the process flow are sampled based on the predicted metrology sampling rates.

Abstract: Data quality measurement is provided for use in a data processing stream, which comprises at least one upstream data processing system and at least one downstream data processing system. An input alert component can be used to provide a measurement of data prior to its input to a data processing system (e.g., a downstream data processing system or an upstream data processing system). An output alert component can be used to provide a measurement on data output by a data processing system. A self-consistency component can be used to measure consistency between items of input, or output data. An end-to-end component can be used to measure data quality using data items from both input data and output data. These components can be used in some combination, or independent of the other, and in any order. In addition, the data quality measurements can be performed separate from that processing performed by either the upstream or downstream processing system.

Abstract: A manufacturing cell for inspecting workpieces such as magnetic disk substrates comprises an input conveyor for providing workpieces to be tested, one or more testers for inspecting the workpieces, and three or more output receptacles for receiving tested workpieces. One or more robotic arms move the workpieces from the input conveyor to the tester and from the tester to one of the output receptacles depending upon the results of the test performed by the tester. The output receptacles include a pass receptacle, a reject receptacle, and at least an additional receptacle for workpieces that are to be re-worked or studied further. If the additional receptacle is full, workpieces that would otherwise be provided to the additional bin are placed in the reject receptacle. The reject receptacle is very large, so that it is rarely filled to capacity.

Abstract: Methods, systems, and mediums of controlling a semiconductor manufacturing process are described. The method comprises the steps of measuring at least one critical dimension of at least one device being fabricated on at least one of the plurality of wafers, determining at least one process parameter value on the at least one measured dimension, and controlling at least one semiconductor manufacturing tool to process the at least one of the plurality of wafers based on the at least one parameter value. A variation in the at least one critical dimension causes undesirable variations in performance of the at least one device, and at least one process condition is directed to controlling the processing performed on the plurality of wafers. The at least one manufacturing tool includes at least one of an implanter tool and an annealing tool.

Abstract: A power management architecture for an electrical power distribution system, or portion thereof, is disclosed. The architecture includes multiple intelligent electronic devices (“IED's”) distributed throughout the power distribution system to manage the flow and consumption of power from the system using real time communications. Power management application software and/or hardware components operate on the IED's and the back-end servers and inter-operate via the network to implement a power management application. The architecture provides a scalable and cost effective framework of hardware and software upon which such power management applications can operate to manage the distribution and consumption of electrical power by one or more utilities/suppliers and/or customers which provide and utilize the power distribution system.

Abstract: Test molding and mass-production molding are performed by an injection molding machine that includes a control apparatus in which neural networks are used. A quality prediction function determined based on the test molding is revised as necessary during mass-production molding.

Abstract: A machine readable medium and a method are disclosed that determine whether a pattern of manufactured or simulated features violates a feature relating tolerance and determines acceptability of the pattern. Allowable tolerance may include feature relating tolerances and material conditions. Manufactured centers are drawn relative to a one true position. A circle drawn through or outside the manufactured centers is used to determine if there is feature relating tolerance violation. Material condition may also be used.

Abstract: Data associated with at least one characteristic associated with the viability of a product is monitored. The data associated with the at least one characteristic is analyzed, and based on the analyzing, at least one future viability state condition of the product is predicted. At least one indicator is displayed related to the at least one future viability state condition.

Abstract: A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.

Abstract: A pulse controller device for controlling the excitation of a heat source used in thermographic imaging is disclosed. The pulse controller device comprises a power supply, a heat source coupled to the power supply, a device coupled to the power supply signaling the power supply to deliver electrical power to the heat source, a sensor for sensing the delivery of electrical power to the heat source, a flash duration module coupled to said sensor for measuring a duration of time, and a gate device coupled to said flash duration module for gating the electrical power utilized by the heat source. A method for thermographically evaluating a sample is also disclosed.

Abstract: A method for integrating Six Sigma into an inspection receiving process of outsourced products may include the following steps: defining specification limits for product acceptance criteria; identifying and reporting a substandard product to authorized personnel for disposition via a MES (manufacturing execution system) and SCADA (supervisory control and data acquisition); preparing a report containing historical data, identifying root cause and assigning a corrective action; segregating the substandard product, and documenting the substandard product in the MES; disposing the substandard product; documenting and recording the corrective action in the MES; and outlining a method of recovery and eliminating a non-conforming incoming product. The present method may provide a device for a Closed Loop Corrective Action (CLCA).

Abstract: A method of assessing a profile of a surface of a fuel injector assembly. The method includes the steps of measuring the surface to obtain a set of data points, selecting a subset of the set of data points, fitting a regression line to the subset, establishing a tolerance limit for the regression line, and determining whether the data points are within the tolerance limits.

Abstract: An unused state detection circuit is disclosed that detects an unused state in a semiconductor circuit. A semiconductor circuit is “unused” when the unused state detection circuit has not been permanently cleared. When a semiconductor circuit is first powered up, the unused state detection circuit will detect that the semiconductor circuit has not previously been “used” and can automatically activate a boot up procedure or a testing procedure (or both). After the semiconductor circuit is used, the unused state detection circuit provides an indication that the semiconductor circuit is no longer unused. The unused state detection circuit uses the state of a dedicated non-volatile memory array or a dedicated region of the general non-volatile memory portion of the semiconductor circuit to detect whether the semiconductor circuit has been previously unused.

Abstract: A method, apparatus, and system for determining the integrity of a sealed container utilizing one or more force signals which are converted into absolute force units is disclosed, providing a method that uses quantitative parameters, and can be validated. The force signals are measured in multiple data collection channels, and can be individually enabled or disabled by an operator to facilitate machine setup and troubleshooting. A user interface provides a display showing the force applied during the container-sealing process, as well as summary information regarding the status of multiple container-sealing machines in a production line.