Clamp-around Type Patents (Class D10/79)
  • Measuring apparatus
    Patent number: 7530277
    Abstract: A measuring apparatus has a display unit that can be favorably viewed when a measured object is clamped by a clamp-type sensor regardless of the orientation and position of the measured object. The measuring apparatus includes a first main unit on which the clamp-type sensor is disposed and a second main unit that is rotatably connected to the first main unit and on which the display unit is disposed. The second main unit is connected to the first main unit via a hinge unit capable of maintaining an arbitrary rotation position. The display unit is disposed on a surface of the second main unit that is opposite the first main unit when the measuring apparatus is folded up.
    Type: Grant
    Filed: January 29, 2007
    Date of Patent: May 12, 2009
    Assignee: Hioki Denki Kabushiki Kaisha
    Inventors: Takao Miyasaka, Akihiro Nagai, Yusaku Miyata, Tomoyuki Inoue
  • Volt-ohm-ammeter
    Patent number: D440892
    Type: Grant
    Filed: April 28, 2000
    Date of Patent: April 24, 2001
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto
  • Clamp type electrical multimeter
    Patent number: D446138
    Type: Grant
    Filed: October 4, 2000
    Date of Patent: August 7, 2001
    Assignee: Appa Technology Corp.
    Inventor: Shang-Wen Chang
  • Meter housing
    Patent number: D446737
    Type: Grant
    Filed: December 13, 2000
    Date of Patent: August 21, 2001
    Assignee: Greenlee Textron Inc.
    Inventor: Geoffrey Olson
  • Multi-meter
    Patent number: D447070
    Type: Grant
    Filed: November 15, 2000
    Date of Patent: August 28, 2001
    Inventor: Li-Chuan Chen
  • Clamp meter
    Patent number: D514005
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: January 31, 2006
    Assignee: IDEAL Industries, Inc.
    Inventors: James L. Gregorec, Jr., David Hines, Ray P. Harju
  • Clamp type electrical multimeter
    Patent number: D450002
    Type: Grant
    Filed: January 10, 2001
    Date of Patent: November 6, 2001
    Assignee: APPA Technology Corp.
    Inventor: Shang-Wen Chang
  • Clamp multimeter
    Patent number: D515953
    Type: Grant
    Filed: May 4, 2005
    Date of Patent: February 28, 2006
    Assignee: APPA Technology Corp.
    Inventor: Shan-Wen Chang
  • Clamp multimeter
    Patent number: D517434
    Type: Grant
    Filed: May 4, 2005
    Date of Patent: March 21, 2006
    Assignee: APPA Technology Corp.
    Inventor: Shan-Wen Chang
  • Clamp meter
    Patent number: D452659
    Type: Grant
    Filed: January 31, 2001
    Date of Patent: January 1, 2002
    Assignee: Ideal Industries, Inc.
    Inventors: Rey P. Harju, James L. Gregorec, Jr., David Hines
  • Clamp multimeter
    Patent number: D457451
    Type: Grant
    Filed: June 14, 2001
    Date of Patent: May 21, 2002
    Inventor: Li-Chuan Chen
  • Clamp meter
    Patent number: D457824
    Type: Grant
    Filed: April 30, 2001
    Date of Patent: May 28, 2002
    Assignee: Brymen Technology Corporation
    Inventor: Po-Chao Tan
  • Electrical test instrument
    Patent number: D467190
    Type: Grant
    Filed: May 14, 2001
    Date of Patent: December 17, 2002
    Assignee: Fluke Corporation
    Inventors: John K. Ikeda, Duncan N. Kearsley
  • Alternating current clamp
    Patent number: D472482
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: April 1, 2003
    Assignee: Advanced Test Products, Inc.
    Inventors: Adam Seymour, Jaroslaw Bras
  • Clamp type electrical multimeter (I)
    Patent number: D472829
    Type: Grant
    Filed: May 8, 2002
    Date of Patent: April 8, 2003
    Assignee: APPA Technology Corp.
    Inventor: Shan-Wen Chang
  • Clamp type electrical multimeter (II)
    Patent number: D472830
    Type: Grant
    Filed: May 8, 2002
    Date of Patent: April 8, 2003
    Assignee: APPA Technology Corp.
    Inventor: Shan-Wen Chang
  • Electrical test instrument
    Patent number: D545703
    Type: Grant
    Filed: May 7, 2003
    Date of Patent: July 3, 2007
    Assignee: Fluke Corporation
    Inventor: John K. Ikeda
  • Volt-ohm-ammeter
    Patent number: D545704
    Type: Grant
    Filed: September 9, 2005
    Date of Patent: July 3, 2007
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto
  • Electrical test instrument body
    Patent number: D474704
    Type: Grant
    Filed: September 27, 2002
    Date of Patent: May 20, 2003
    Assignee: Fluke Corporation
    Inventors: John K. Ikeda, Duncan N. Kearsley
  • DMM amp probe
    Patent number: D559137
    Type: Grant
    Filed: October 27, 2006
    Date of Patent: January 8, 2008
    Assignee: Innova Electronics Corporation
    Inventor: John Protti
  • Electrical test instrument body
    Patent number: D559715
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: January 15, 2008
    Assignee: Fluke Corporation
    Inventors: B. Matthew Marzynski, Tim Richter
  • Clamp meter
    Patent number: D560130
    Type: Grant
    Filed: February 8, 2007
    Date of Patent: January 22, 2008
    Assignee: Hioki Denki Kabushiki Kaisha
    Inventors: Akihiro Nagai, Takao Miyasaka, Kouichi Tanaka
  • Meter device
    Patent number: D567687
    Type: Grant
    Filed: April 9, 2007
    Date of Patent: April 29, 2008
    Assignee: Fluke Corporation
    Inventor: Jeffrey M. Elrod
  • Volt-ammeter
    Patent number: D490331
    Type: Grant
    Filed: February 12, 2003
    Date of Patent: May 25, 2004
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto
  • Electric meter (III)
    Patent number: D585316
    Type: Grant
    Filed: February 28, 2008
    Date of Patent: January 27, 2009
    Assignee: APPA Technology Corp.
    Inventor: Shan-Wen Chang
  • Current probe
    Patent number: D315522
    Type: Grant
    Filed: October 6, 1988
    Date of Patent: March 19, 1991
    Assignee: Societe Chauvin Arnoux
    Inventors: Daniel Arnoux, Axel Arnoux, Claude Genter
  • Clamp multimeter
    Patent number: D332574
    Type: Grant
    Filed: February 15, 1991
    Date of Patent: January 19, 1993
    Assignee: APPA Technology Corporation
    Inventor: Shang-Wen Chang
  • Voltammeter
    Patent number: D335095
    Type: Grant
    Filed: August 28, 1990
    Date of Patent: April 27, 1993
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto
  • Multimeter
    Patent number: D345704
    Type: Grant
    Filed: June 24, 1992
    Date of Patent: April 5, 1994
    Assignee: Kaise Kabushiki Kaisha
    Inventor: Etsuo Shirai
  • Internal caliper
    Patent number: D349067
    Type: Grant
    Filed: March 19, 1993
    Date of Patent: July 26, 1994
    Inventor: Kam K. Li
  • Volt-ohm-ammeter
    Patent number: D358349
    Type: Grant
    Filed: April 5, 1994
    Date of Patent: May 16, 1995
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto
  • Digital clamp meter
    Patent number: D359006
    Type: Grant
    Filed: April 5, 1994
    Date of Patent: June 6, 1995
    Assignee: Fluke Corporation
    Inventors: George L. McCain, Carol A. Young
  • Digital current probe
    Patent number: D362639
    Type: Grant
    Filed: January 24, 1994
    Date of Patent: September 26, 1995
    Inventor: Daniel Arnoux
  • Electrical multimeter
    Patent number: D363441
    Type: Grant
    Filed: December 13, 1994
    Date of Patent: October 24, 1995
    Assignee: APPA Technology Corporation
    Inventor: Shang-Wen Chang
  • Transparent variable voltage tester
    Patent number: D373543
    Type: Grant
    Filed: July 31, 1995
    Date of Patent: September 10, 1996
    Inventor: William I. Price
  • Clamp meter
    Patent number: D374405
    Type: Grant
    Filed: September 12, 1995
    Date of Patent: October 8, 1996
    Inventor: Brian Rawsthorne
  • Clamp-on current probe
    Patent number: D383989
    Type: Grant
    Filed: March 5, 1996
    Date of Patent: September 23, 1997
    Assignee: Societe Chauvin Arnoux
    Inventors: Daniel Arnoux, Axel Arnoux
  • Clamp-on current probe
    Patent number: D388346
    Type: Grant
    Filed: March 5, 1996
    Date of Patent: December 30, 1997
    Assignee: Societe Chauvin Arnoux
    Inventors: Daniel Arnoux, Axel Arnoux
  • Clamp meter
    Patent number: D396657
    Type: Grant
    Filed: March 6, 1997
    Date of Patent: August 4, 1998
    Assignee: Hioki Denki Kabushiki Kaisha
    Inventors: Akihiro Nagai, Hideo Watanabe, Kouichi Tanaka
  • Clamp-on current probe
    Patent number: D398547
    Type: Grant
    Filed: July 28, 1997
    Date of Patent: September 22, 1998
    Assignee: Societe Chauvin Arnoux
    Inventors: Daniel Arnoux, Axel Arnoux, Claude Genter
  • Electrical tester
    Patent number: D399150
    Type: Grant
    Filed: October 29, 1997
    Date of Patent: October 6, 1998
    Assignee: Fluke Corporation
    Inventors: Steven W. Fisher, Brian S. Aikins, Roger M. Trana
  • Electrical tester
    Patent number: D399151
    Type: Grant
    Filed: October 29, 1997
    Date of Patent: October 6, 1998
    Assignee: Fluke Corporation
    Inventors: Steven W. Fisher, Edmond C. Eng
  • Ammeter
    Patent number: D401172
    Type: Grant
    Filed: November 19, 1997
    Date of Patent: November 17, 1998
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto
  • Clamp meter
    Patent number: D413538
    Type: Grant
    Filed: August 4, 1998
    Date of Patent: September 7, 1999
    Inventor: Li-Chuan Chen
  • Clamp-on current probe
    Patent number: D416211
    Type: Grant
    Filed: September 10, 1998
    Date of Patent: November 9, 1999
    Assignee: Societe Chauvin Arnoux
    Inventors: Daniel Arnoux, Axel Arnoux, Claude Genter
  • Clamp meter
    Patent number: D416820
    Type: Grant
    Filed: November 24, 1998
    Date of Patent: November 23, 1999
    Assignee: Hioki Denki Kabushiki Kaisha
    Inventors: Kouichi Tanaka, Kenichi Shionoiri
  • Current probe
    Patent number: D419083
    Type: Grant
    Filed: December 9, 1998
    Date of Patent: January 18, 2000
    Assignee: Bell Technologies Inc.
    Inventor: Matt H. Shafie
  • Clamp tester
    Patent number: D419467
    Type: Grant
    Filed: April 12, 1999
    Date of Patent: January 25, 2000
    Assignee: Kaise Kabushiki Kaisha
    Inventors: Hideo Kaise, Etsuo Shirai
  • Clamp-meter
    Patent number: D419894
    Type: Grant
    Filed: January 26, 1999
    Date of Patent: February 1, 2000
    Assignee: Precision Mastech Enterprises Company
    Inventors: Ji Lie Luo, Deng Wei Shu
  • Volt-ohm-ammeter
    Patent number: D422229
    Type: Grant
    Filed: April 30, 1999
    Date of Patent: April 4, 2000
    Assignee: Kyoritsu Electrical Instruments Works, Ltd.
    Inventor: Masamichi Kuramoto