Patents Assigned to Advanced Micro Devices
  • Publication number: 20110063010
    Abstract: A circuit includes a differential circuit having at least to two inputs, a first variable impedance circuit, and a second variable impedance circuit. The first variable impedance circuit is between a first branch of the differential circuit and an output. The first variable impedance circuit provides a first variable impedance. The a second variable impedance circuit is between a second branch of the differential circuit and the output. The second variable impedance circuit provides a second variable impedance. The first variable impedance and the second variable impedance vary in accordance with a voltage difference between the two inputs.
    Type: Application
    Filed: September 16, 2009
    Publication date: March 17, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Jinyung Namkoong, Arvind Bomdica, Ming-Ju Lee
  • Publication number: 20110063311
    Abstract: A method for executing processes within a computer system is provided. The method includes determining when to switch from a first process, executing within the computer system, to executing another process. Execution of the first process corresponds to a computer system storage location. The method also includes switching to executing the other process based upon a time quantum and resuming execution of the first process after the time quantum has lapsed, the resuming corresponding to the storage location.
    Type: Application
    Filed: September 9, 2010
    Publication date: March 17, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Rex McCRARY, Frank LILJEROS, Gongxian Jeffrey CHENG
  • Publication number: 20110066813
    Abstract: Embodiments for a local data share (LDS) unit are described herein. Embodiments include a co-operative set of threads to load data into shared memory so that the threads can have repeated memory access allowing higher memory bandwidth. In this way, data can be shared between related threads in a cooperative manner by providing a re-use of a locality of data from shared registers. Furthermore, embodiments of the invention allow a cooperative set of threads to fetch data in a partitioned manner so that it is only fetched once into a shared memory that can be repeatedly accessed via a separate low latency path.
    Type: Application
    Filed: September 8, 2010
    Publication date: March 17, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Michael MANTOR, Michael MANG, Karl MANN
  • Patent number: 7906424
    Abstract: Various semiconductor die conductor structures and methods of fabricating the same are provided. In one aspect, a method of manufacturing is provided that includes forming a conductor structure on a conductor pad of a semiconductor die. The conductor layer has a surface. A polymeric layer is formed on the surface of the conductor layer while a portion of the surface is left exposed. A solder structure is formed on the exposed portion of the surface and a portion of the polymeric layer.
    Type: Grant
    Filed: August 1, 2007
    Date of Patent: March 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Roden R. Topacio, Neil McLellan, Yip Seng Low, Andrew K W Leung
  • Patent number: 7906383
    Abstract: By forming a stressed dielectric layer on different transistors and subsequently relaxing a portion thereof, the overall process efficiency in an approach for creating strain in channel regions of transistors by stressed overlayers may be enhanced while nevertheless transistor performance gain may be obtained for each type of transistor, since a highly stressed material positioned above the previously relaxed portion may also efficiently affect the underlying transistor.
    Type: Grant
    Filed: March 10, 2008
    Date of Patent: March 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Ralf Richter, Andy Wei, Manfred Horstmann, Joerg Hohage
  • Patent number: 7908109
    Abstract: A method includes receiving measured values for a plurality of electrical test parameters associated with integrated circuit devices on at least one wafer measured prior to completion of the wafer. Values of the electrical test parameters are predicted. The measured values are compared to the predicted values to generate residual values associated with the electrical test parameters. At least one performance metric associated with the devices is generated based on the residual values.
    Type: Grant
    Filed: July 8, 2008
    Date of Patent: March 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Richard P. Good, Lothar Waetzold, Thomas Depaly
  • Patent number: 7906815
    Abstract: By forming a direct contact structure connecting, for instance, a polysilicon line with an active region on the basis of an increased amount of metal silicide by removing the sidewall spacers prior to the silicidation process, a significantly increased etch selectivity may be achieved during the contact etch stop layer opening. Hence, undue etching of the highly doped silicon material of the active region would be suppressed. Additionally or alternatively, an appropriately designed test structure is disclosed, which may enable the detection of electrical characteristics of contact structures formed in accordance with a specified manufacturing sequence and on the basis of specific design criteria.
    Type: Grant
    Filed: March 27, 2008
    Date of Patent: March 15, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Carsten Peters, Ralf Richter, Kai Frohberg
  • Publication number: 20110060879
    Abstract: A processing system is provided. The processing system includes a first processing unit coupled to a first memory and a second processing unit coupled to a second memory. The second memory comprises a coherent memory and a private memory that is private to the second processing unit.
    Type: Application
    Filed: September 9, 2010
    Publication date: March 10, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Philip J. ROGERS, Warren Fritz Kruger, Mark Hummel, Eric Demers
  • Publication number: 20110057938
    Abstract: A system and method are presented by which data on a graphics processing unit (GPU) can be output to one or more buffers with independent output frequencies. In one embodiment, a GPU includes a shader processor configured to respectively emit a plurality of data sets into a plurality of streams in parallel. Each data is emitted into at least a portion of its respective stream. Also included is a first number of counters configured to respectively track the emitted data sets.
    Type: Application
    Filed: September 9, 2010
    Publication date: March 10, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Todd Martin, Vineet Goel
  • Publication number: 20110057940
    Abstract: Disclosed herein is a processing unit configured to process video data, and applications thereof. In an embodiment, the processing unit includes a buffer and an execution unit. The buffer is configured to store a data word, wherein the data word comprises a plurality of bytes of video data. The execution unit is configured to execute a single instruction to (i) shift bytes of video data contained in the data word to align a desired byte of video data and (ii) process the desired byte of the video data to provide processed video data.
    Type: Application
    Filed: April 16, 2010
    Publication date: March 10, 2011
    Applicants: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: Michael J. MANTOR, Jeffrey T. Brady, Christopher L. Spencer, Daniel W. Wong, Andrew E. Gruber
  • Publication number: 20110057939
    Abstract: Disclosed herein are systems, apparatuses, and methods for enabling efficient reads to a local memory of a processing unit. In an embodiment, a processing unit includes an interface and a buffer. The interface is configured to (i) send a request for a portion of data in a region of a local memory of an other processing unit and (ii) receive, responsive to the request, all the data from the region. The buffer is configured to store the data from the region of the local memory of the other processing unit.
    Type: Application
    Filed: March 8, 2010
    Publication date: March 10, 2011
    Applicants: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: David I.J. GLEN, Philip J. Rogers, Gordon F. Caruk, Gongxian Jeffrey Cheng, Mark Hummel, Stephen Patrick Thompson, Anthony Asaro
  • Publication number: 20110057936
    Abstract: A method of managing resources is provided. The method includes identifying a resource associated with a processor responsive to an impending transition, and copying the identified resource from a memory associated with the GPU or to the memory associated with the GPU.
    Type: Application
    Filed: January 28, 2010
    Publication date: March 10, 2011
    Applicants: Advanced Micro Devices, Inc., ATI Technologies ULC
    Inventors: David GOTWALT, Oleksandr Khodorkovsky
  • Publication number: 20110060928
    Abstract: A method of operating a device is provided. The method includes transitioning the GPU to a substantially disabled state in response to a first received signal, and generating, while the GPU is in the substantially disabled state, a response signal in response to a second received signal. The response signal is substantially similar to a second response signal that would be generated by the GPU in a powered state in response to the second received signal.
    Type: Application
    Filed: February 26, 2010
    Publication date: March 10, 2011
    Applicants: ATI Technologies ULC, Advanced Micro Devices, Inc.
    Inventors: Oleksandr KHODORKOVSKY, Ali Ibrahim, Phil Mummah
  • Publication number: 20110057677
    Abstract: A method to test and package dies so as to increase overall yield is provided. The method includes performing a wafer test on a first die and mounting the first die on a package substrate to form a partial package, if the wafer test of the first die is successful. The method further includes performing a system test on the partial package including the first die and stacking a second die on the first die if the system test on the partial package and the first die is successful.
    Type: Application
    Filed: September 2, 2010
    Publication date: March 10, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Bryan BLACK, Joseph Seigel
  • Publication number: 20110057933
    Abstract: A method and computer program product are provided for resolution enhancement of a video stream based on spatial and temporal correlation. For instance, the method can include predicting interpolated pixels for an image frame of the video stream based on a spatial correlation of pixels in the image frame. The method can also include generating one or more motion vectors for the image frame. Based on the spatially-correlated pixels and the one or more motion vectors, an enhanced image can be reconstructed. Further, the method can include providing a correction factor to one or more pixels in the enhanced image frame.
    Type: Application
    Filed: May 3, 2010
    Publication date: March 10, 2011
    Applicant: Advanced Micro Devices, Inc.
    Inventor: Alexander LYASHEVSKY
  • Patent number: 7902599
    Abstract: Embodiments of an integrated circuit are provided. In one embodiment, the integrated circuit includes a substrate, a short channel (SC) device, and a long channel (LC) device. The short channel device includes an SC gate insulator overlying a first portion of the substrate, an SC metal gate overlying the SC gate insulator, a polycrystalline silicon layer overlying the metal gate, and a silicide layer formed on the polycrystalline silicon layer. The long channel (LC) device includes an LC gate insulator overlying a second portion of the substrate and an LC metal gate overlying the LC gate insulator. An etch stop layer overlies an upper surface of the substrate, and an interlayer dielectric overlies an upper surface of the etch stop layer. An SC cap is disposed in the interlayer dielectric, overlies the SC device, and is formed substantially from the same metal as is the LC metal gate.
    Type: Grant
    Filed: October 28, 2009
    Date of Patent: March 8, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Richard J. Carter, Michael J. Hargrove, George J. Kluth, John G. Pellerin
  • Patent number: D633877
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: March 8, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Stephen Heng, Mahesh Hardikar, Ali Hassanzadeh, Sanjay Dandia
  • Patent number: D633878
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: March 8, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Stephen Heng, Ali Hassanzadeh, Mahesh Hardikar, Srikumar Seshasayee
  • Patent number: D633879
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: March 8, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Stephen Heng, Mahesh Hardikar
  • Patent number: D633880
    Type: Grant
    Filed: March 26, 2010
    Date of Patent: March 8, 2011
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Stephen Heng, Ali Hassanzadeh, Mahesh Hardikar, Sanjay Dandia