Abstract: A peripheral device can be powered off when not in use by redirecting accesses to the peripheral device's configuration space from the peripheral device to a memory located separate from the peripheral device. A method for redirecting accesses includes copying the current contents of the configuration space to the memory. Accesses to the configuration space are redirected to the memory, whereby the memory services the accesses to the configuration space. After the redirection is enabled, the peripheral device can be powered off. When the peripheral device needs to be used again, it is powered on and the contents of the memory are copied to the configuration space. The configuration space can then resume servicing configuration space accesses.

Abstract: An integrated circuit includes a radiation-triggered shutdown circuit that disables a critical aspect of the integrated circuit rendering the integrated circuit non-functional when the integrated circuit receives a predetermined radiation dose. That ensures integrated circuits including the radiation-triggered shutdown circuit are ITAR compliant.

Abstract: A semiconductor circuit is provided that includes a short channel device, and a long channel device that is electrically isolated from the short channel device. The long channel device comprises a plurality of first gate electrodes, a first source region adjacent one of the plurality of first gate electrodes, a first drain region adjacent another of the plurality of first gate electrodes, and a plurality of common source/drain regions positioned between adjacent ones of the plurality of first gate electrodes. The first gate electrodes each overlie portions of a layer of high-dielectric constant (k) gate insulator material. Each of the first gate electrodes are electrically coupled to at least one of the other first gate electrodes.

Abstract: In one embodiment, a method comprises assigning a unique node number to each of a first plurality of nodes in a first partition of a system and a second plurality of nodes in a second partition of the system. A first memory address space spans first memory included in the first partition and a second memory address space spans second memory included in the second partition. The first memory address space and the second memory address space are generally logically distinct. The method further comprises programming a first address map in the first partition to map the first memory address space to node numbers, wherein the programming comprises mapping a first memory address range within the first memory address space to a first node number assigned to a first node of the second plurality of nodes in the second partition, whereby the first memory address range is mapped to the second partition.

Abstract: A method for executing a plurality of data-parallel threads of a processing logic on a processor core includes grouping the plurality of data-parallel threads into one or more workgroups, associating a first workgroup from the one or more workgroups with an operating system thread on the processor core, and configuring threads from the first workgroup as user-level threads within the operating system thread. In an example, a method enables the execution of GPU-kernels that has been previously configured for a GPU, to execute on a CPU such as a multi-core CPU. The mapping of the numerous data-parallel threads to the CPU is done in such a manner as to reduce the number of costly operating system threads instantiated on the CPU, and to enable efficient debugging.

Abstract: A system includes a processor coupled to a memory through a memory controller. The memory controller includes first and second queues. The memory controller receives memory requests from the processor, assigns a priority to each request, stores each request in the first queue, and schedules processing of the requests based on their priorities. The memory controller changes the priority of a request in the first queue in response to a trigger, sends a next scheduled request from the first queue to the second queue in response to detecting the next scheduled request has the highest priority of any request in the first queue, and sends requests from the second queue to the memory. The memory controller changes the priority of different types of requests in response to different types of triggers. The memory controller maintains a copy of each request sent to the second queue in the first queue.

Abstract: By selectively providing a buffer layer having an appropriate thickness, height differences occurring during the deposition of an SACVD silicon dioxide may be reduced during the formation of an interlayer dielectric stack of advanced semiconductor devices. The buffer material may be selectively provided after the deposition of contact etch stop layers of both types of internal stress or may be provided after the deposition of one type of dielectric material and may be used during the subsequent patterning of the other type of dielectric stop material as an efficient etch stop layer.

Abstract: The claimed subject matter provides a system and/or a method that facilitates utilizing a resolution enhancement for a circuit feature. A scanning electron microscope component (104, 204, 304, 404) can provide at least one two-dimensional image of the circuit feature. An image analysis engine (106, 206, 306, 406) can analyze the two-dimensional image. An advanced process control (APC) engine (108, 208, 308, 408) can generate at least one instruction for at least one of a feed forward control and a feedback control and a process component (102, 202, 302, 402) can utilize the at least one instruction to minimize an error.

Abstract: A highly stressed dielectric material, such as a tensile stressed material, may be deposited in a conformal manner so as to respect any deposition constraints caused by pronounced surface topography of highly scaled semiconductor devices, followed by the deposition of a buffer material having enhanced gap-filling capabilities. Thereafter, a further stress-inducing layer is deposited to form a doublet structure, which acts on the transistor elements, thereby enhancing overall performance, without increasing the probability of creating deposition-related irregularities. Hence, production yield as well as performance of highly scaled semiconductor devices may be increased.

Abstract: A system for testing a processor. The system includes a gold processor and a test access port (TAP). A processor that is a under test (DUT) is coupled to both the gold processor and the TAP. Test signals are simultaneously provided to both the gold processor and the DUT such that the gold processor and the DUT operate in synchronous functional lockstep. The TAP may also input test signals into the gold processor and DUT simultaneously and access data from each of these processors through separate test data out (TDO) connections. Test output data accessed from the gold processor may be compared to test output data accessed from the DUT to determine if any differences are present. The comparison data generated may then be used for analysis purposes.

Abstract: Apparatus and methods for remotely configuring a computer BIOS of a testing computer system are provided. In one aspect, a method of testing is provided that includes establishing an interface between a first computer system and a second computer system. The second computer system includes a computer readable storage device that has a BIOS and a first set of BIOS configuration settings. The first set of BIOS configuration settings is adapted to a first device under test. At least one instruction is sent from the first computer system to the second computer system to enable the second computer system to select a second set of BIOS configuration settings adapted to a second device under test having different electronic characteristics than the first device under test. An electrical test is performed on the second device under test using the second computer system and the second set of BIOS configuration settings.

Abstract: By providing a silicon cap layer on a compressive silicon nitride layer, the diffusion of nitrogen into sensitive resist material may be efficiently reduced, while the silicon may be converted into a highly compressive silicon dioxide in a later manufacturing stage. Consequently, yield loss due to contact failures during the formation of semiconductor devices requiring differently stressed silicon nitride layers may be reduced.

Abstract: A receive circuit (320) includes a DLL core (510), a latch (326), and a DLL control circuit (520). The DLL core (510) has a first input for receiving a DLL clock signal, a second input for receiving a delay line select signal, and an output for providing a delayed data strobe signal. The latch (326) has a signal input for receiving an external data signal, a control input coupled to the output of the DLL core (510), and an output for providing an internal data signal. The DLL control circuit (520) provides the DLL clock signal to the first input of the DLL core (510) responsive to a memory data strobe signal while the receive circuit is in a first mode, and provides the DLL clock signal to the first input of the DLL core (510) responsive to a processor clock signal while the receive circuit (320) is in a second mode.

Abstract: A processor can operate in different power modes. In an active power mode, the processor executes software. In response to receiving a halt indication from the software, hardware at the processor evaluates bus transactions for the processor. If the bus transactions meet a heuristic, hardware places a processor core in a lower power mode, such as a retention mode. Because the bus transactions are evaluated by hardware, rather than by software, and the software is not required to perform handshakes and other protocols to place the processor in the lower power mode, the processor is able to place the processor core into the lower power mode more quickly, thereby conserving power.

Abstract: A plurality of sequential nodes in a design file for an electronic device are identified and an effective switching capacitance is determined for a first sequential node of the plurality of sequential nodes based upon statically predicted operation of a first device downstream from the first sequential node. The effective switching capacitance for the first sequential node is stored, and the process is repeated for the other identified sequential nodes in the design file.

Abstract: By directly using relative biases, contained in the relative bias date matrix, and by appropriately weighting the components thereof, sampling rate limitations in an APC control scheme may be efficiently compensated for. In particular embodiments, an age-based weighting factor is established that scales measurement data uncertainty according to the delay with which the corresponding measurement data for a specific control thread are obtained.

Abstract: By providing a barrier layer stack including a thin SiCN layer for enhanced adhesion, a silicon nitride layer for confining a copper-based metal region (thereby also effectively avoiding any diffusion of oxygen and moisture into the copper region), and a SiCN layer, the total relative permittivity may still be maintained at a low level, since the thickness of the first SiCN layer and of the silicon nitride layer may be moderately thin, while the relatively thick silicon carbide nitride layer provides the required high etch selectivity during a subsequent patterning process of the low-k dielectric layer.

Abstract: An oscillator device includes a plurality of stages. Each stage is a monostable stage having a delay path, whereby a signal transition of a designated type (rising or falling) at the input of the delay path results in a signal transition at the output of the stage of the same transition type. Each stage of the oscillator device also includes a reset module that causes the output signal to be reset to a nominal state a predetermined period of time after the signal transition of the output signal. Each stage thus provides an output signal pulse in response to the signal transition of the designated type at the input. The output of the final stage of the oscillator device is connected to the input, so that the oscillator output provides an oscillating signal having a period based upon the delay path of each the oscillator device stages.

Abstract: A scannable IO circuit featuring reduced latch count for pipelined memory architectures and test methodology. For a pipelined memory system performing at speed tests, the timing sequence for processing a test command includes a precharge-read-precharge-write sequence for each clock cycle starting with the rising clock edge. The memory circuit utilizing this test command timing sequence comprises a sense amplifier and a single latch. The sense amplifier itself is used as a latch to implement scan functionality for the memory circuit. The memory device is incorporated into an integrated test wrapper circuit that executes back-to-back commands through serial compare operations using integrated scan flip-flop circuits. The test wrapper includes a fanout block and padded address scheme for testing multiple and disparate size memory devices in parallel.

Abstract: A processor core includes an instruction decode unit that may dispatch a same integer instruction stream to a plurality of integer execution units operating in lock-step. The processor core also includes signature generation logic that may generate, concurrently with execution of the integer instructions, a respective signature from result signals conveyed on respective result buses in one or more pipeline stages within each of the integer execution units in response to the result signals becoming available. The processor core also includes compare logic that may detect a mismatch between signatures from each of the integer execution units. Further, in response to the compare logic detecting any mismatch, the compare logic may cause instructions causing the mismatch to be re-executed.