Abstract: A scan clock modifier, a method of providing a variable scan clock, an IC including a scan clock modifier and a library including a cell of a scan clock modifier. In one embodiment, the scan clock modifier includes: (1) logic circuitry configured to provide at least one selected clock signal based on a test scan clock signal and a first clock control signal, both of the test scan clock signal and the first clock control signal received from test equipment and (2) comparison logic configured to provide a scan clock signal based on the at least one selected clock signal and at least one other clock control signal received from the test equipment, wherein the first and the at least one other clock control signals are different clock control signals.

Abstract: A single-path latch, a dual-path latch, a method of operating a DFF and a library of cells. In one embodiment, the single-path latch includes: (1) a passgate coupled to the data input, (2) a feedback path coupled to the passgate, the data output coupled thereto and (3) tristate circuitry coupled to the passgate and having a single transistor pair of opposite conductivity coupled to Boolean logic gates, the Boolean logic gates configured to control operation of the single transistor pair based on the data input and a pulse clock signal to drive the feedbacks path.

Abstract: An apparatus comprising a buffer circuit, a rotation circuit and a memory. The buffer may be configured to store original image data in one or more sub-matrices. The rotation circuit may be configured to (i) produce rotated data and (ii) store the rotated data in a transposed matrix. The memory may be configured to position the rotated data in the transposed matrix. The transposed matrix comprises final image data rotated by a predetermined angle from the original image data.

Abstract: A filing system for a storage area network with inode based policy identifiers is disclosed. The filing system includes a processor and a storage device configured to store data. The processor receives an operation to perform on an object of the filing system and retrieves a policy identifier from an inode for the object. The processor then determines a policy from the policy identifier and determines whether execution of the operation is in compliance with the policy. The processor also determines an action to perform based on the determination of compliance with the policy.

Abstract: A flexible architecture component for providing data integration and exchange between a plurality of client applications is disclosed. The client applications are coupled to a network and access respective data sources, wherein the data sources of each of the client applications may be stored in different formats and are not directly accessible by the other client applications. Aspects of the present invention include providing an adapter API that provides a first set of methods for the client applications to use to translate data into XML. Each of the client applications is then modified to invoke the methods in the adapter API to convert data in their respective data sources into XML format and to have the XML formatted data imported into a database on a server, thereby standardizing the data from the data sources.

Abstract: A margin violation detector for detecting margin violations of critical paths, a method of monitoring data paths and an IC. In one embodiment, the margin violation detector includes: (1) a monitor flip-flop having a monitor input couplable to a critical path input of a capture flip-flop of a critical path, (2) an exclusive OR gate having a first input couplable to an output of the capture flip-flop and a second input couplable to an output of the monitor flip-flop and (3) a violation detect flip-flop having a detection input couplable to an output of the exclusive OR gate.

Abstract: A command is issued to a first data storage system for addressing a set of data and at least one of a first referral response including a referral to at least a second data storage system or at least a first subset of the set of data and the first referral response including the referral to the at least the second data storage system. The at least one of a first referral response including a referral to at least a second data storage system or at least a first subset of the set of data and the first referral response including the referral to the at least the second data storage system is accessed. A command is issued to the second data storage system for addressing the set of data and a second referral response including a referral to at least one of the first data storage system and a third data storage system, the second data storage system including at least a second subset of the set of data.

Abstract: A method for generating a test pattern set for detecting small delay defects of an IC is disclosed. In one embodiment, the method includes: (1) generating a traditional delay fault pattern, (2) fault grading the traditional delay fault pattern for small delay defect coverage, (3) reporting faults detected by the fault grading and delay information associated with the detected faults, (4) determining which of the detected faults are timing-aware target faults employing the delay information and (5) generating timing-aware delay fault patterns for the timing-aware target faults.

Abstract: An apparatus comprises a summer suitable for subtracting a jfiltered feedback signal from an input; a symbol decision device suitable for receiving an output from the summer; a feedback filter suitable for filtering an output from the symbol decision device and for sending the filtered feedback signal to the summer, the feedback filter comprising an adjustable swing amplifier and an adjustable pole filter; and an adaptation algorithm suitable for simultaneously adapting both a pole setting and a swing setting based upon a least mean squared error criteria. The summer, the symbol decision device, and the feedback filter form a feedback circuit utilized to reconstruct an electrical signal distorted during transmission.

Abstract: In one embodiment, a circuit has multiple flip-flops with gated clock inputs controlled by an enable signal, where the clock signal is gated in order to reduce power consumption by the circuit. The circuit has an error detection and correction (EDC) module that is active when the enable signal is low in order to detect and correct soft errors of the flip-flops. The EDC module generates and stores an error-correction code based on the data outputs of the flip-flops. The EDC module then compares the stored error-correction code to a presently generated error-correction code, where if they are not identical, then the EDC (a) determines (i) that a soft error has occurred and (ii) which flip-flop suffered the soft error and (b) flips a corresponding error-correction signal to provide a correct corresponding output signal while the enable signal is low.

Abstract: A modulated clock, a method of providing a modulated clock signal, an integrated circuit including a modulated clock and a library of cells including a modulated clock. In one embodiment, the modulated clock includes (1) a clock controller configured to generate a digital control stream and (2) clock logic circuitry having a first input configured to receive a clock signal and a second input configured to receive the digital control stream. The clock logic circuitry is configured to provide a modulated clock signal in response to the clock signal and the digital control stream, wherein the modulated clock signal has an effective frequency that differs from the first frequency.

Abstract: A leakage power recovery system and method, and a electronic design automation (EDA) tool incorporating either or both of the system and the method.

Abstract: A timing error sampling generator, a path monitor, an IC, a method of performing timing tests and a library of cells. In one embodiment, the timing error sampling generator includes: (1) a hold delay element having an input and an output and configured to provide a hold violation delayed signal at said output by providing a first predetermined delay to a clock signal received at said input, said first predetermined delay corresponding to a hold violation time for a path to be monitored and (2) a hold logic element having a first input coupled to said input of said hold delay element, a second input coupled to said output of said hold delay element and an output at which said hold logic element is configured to respond to said first and second inputs to provide a clock hold signal when logic levels at said first and second inputs are at a same level.

Abstract: A method of generating an IRF pattern for testing an IC and a test pattern generator are disclosed. In one embodiment, the method includes: (1) identifying a path of the integrated circuit for inline resistive fault pattern generation, (2) determining if the path is a minimal slack path of the IC and (3) generating, when the path is the minimal slack path, a restricted inline resistive fault pattern for the path using only a capture polarity having a minimal inherent margin.

Abstract: The present invention is a method for providing multi-pathing via Small Computer System Interface Input/Output (SCSI I/O) referral between an initiator and a storage cluster which are communicatively coupled via a network, the storage cluster including at least a first target device and a second target device. The method includes receiving an input/output (I/O) at the first target device from the initiator via the network. The I/O includes a data request. The method further includes transmitting a SCSI I/O referral list to the initiator when data included in the data request is not stored on the first target device, but is stored on the second target device. The referral list includes first and second port identifiers for identifying first and second ports of the second target device respectively. The first and second port identifiers are SCSI relative port identifiers. The first and second ports of the target device are identified as access ports for accessing the data requested in the data request.

Abstract: A method for electrically coupling a bond pad of an integrated circuit such as a field programmable device, an application-specific integrated circuit, or a rapid chip with an input/output device is disclosed. The bond pad is provided with a plurality of metal layers configurable for making a connection with the input/output device. The bond pad is then coupled to the input/output device with an interconnect structure. The method for electrically coupling the bond pad to the input/output device allows the customer to configure the power and ground pad counts after the slice is created.

Abstract: An improvement to an arithmetic unit of a low-density parity-check decoder, where the arithmetic unit has a pipelined architecture of modules. A first module calculates a difference between absolute values of md_R and md_g_in, and passes the result to a first Gallager module. The first Gallager module converts this value from a p0/p1 representation to a 2*p0?1 representation, and passes the result to a second module. The second module selectively adjusts the result of the previous module based on the sign values of md_g_in and md_R, and passes one of its outputs to a third module (the other two outputs, loc_item_out and hard_out, are not a part of the pipeline). The third module calculates a new md_g value by adding the result of the second module and loc_item_in, and passes this result to a fourth module. The fourth module separates a sign and an absolute value of the new md_g, and passes the result to a second Gallager module.

Abstract: A method of configuring a random access memory matrix containing partially configured memories in the matrix. The method includes the steps of independently calculating a memory enable signal and a configuration signal for a partially configured memory in each memory tile of the memory matrix. Memory tiles not supported by a memory compiler are determined. A memory wrapper is provided for each tile not supported by the memory compiler. An address controller is inserted in the memory matrix for each tile in a group of tiles. Output signals from each memory location in a memory group having a common group index are combined into a single output signal. A first stripe of memory tiles containing non-configured memory having a first width is selected. A second strip of memory tiles containing configured memory having a second width is also selected.

Abstract: The present invention provides an optimized direct write lithography system using optical mirrors. That is, a maskless lithography system is provided. The maskless direct-write lithography system provided uses an array of mirrors configured to operate in a tilting mode, a piston-displacement mode, or both in combination. The controlled mirror array is used as a substitute for the traditional chrome on glass masks. In order to avoid constraining the system to forming edges of patterns aligned with the array of mirrors, gray-scale techniques are used for subpixel feature placement. The direct-writing of a pattern portion may rely on a single mirror mode or a combination of modes.

Abstract: Methods and structures within a SAS expander for detecting link level errors in PHYs of a SAS expander to reduce overhead bandwidth utilization of SAS links between SAS initiators and SAS expanders. In one aspect hereof, a SAS expander self monitors the error status registers of its own PHYs over an internal path that does not use bandwidth of the attached SAS links. When a link level error is so detected the SAS expander may initiate actions and/or report the error to a SAS initiator to thereby reduce the potential for lost data integrity. Where multiple SAS expanders are configured in a SAS domain fabric, each expander may monitor its PHYs or one expander may be designated a master and monitor PHYs of all expanders in the fabric.