Abstract: Embodiments of the present disclosure provide a test method and apparatus for a control chip, an electronic device, relating to the field of semiconductor device test technology. The method includes: reading first test vectors stored in a first target memory chip; sending the first test vectors to the control chip; receiving first output information returned by the control chip in response to the first test vectors; and acquiring a first test result of the control chip based on the first output information and the first test vectors corresponding to the first output information. By means of the technical solutions provided in the embodiments of the present disclosure, a memory chip can be used for storing test vectors for a control chip, so that a storage space for test vectors can be enlarged, and the test efficiency can be increased.

Abstract: An alignment mark count acquiring method includes: acquiring a first time at which an exposure machine performs exposure of a first wafer, and acquiring a second time at which the exposure machine performs alignment of a second wafer; acquiring a first buffer time between the second time and the first time when the first time is less than the second time; determining a target alignment mark count of the second wafer according to the exposure parameters of the first wafer and the corresponding relationship when the first buffer time is greater than a preset value, wherein the corresponding relationship is the relationship between the exposure parameters and the alignment mark counts, and the corresponding relationship is used to make the first buffer time to be less than or equal to the preset value; and outputting the target alignment mark count.

Abstract: Certain aspects of the present disclosure provide a method for optimizing process parameters for additive manufacturing, including: determining a change to at least one process parameter of a plurality of process parameters while additively manufacturing a first part using an additive manufacturing apparatus according to a build file comprising machine code defining the plurality of process parameters; modifying the build file based on the determined change to the at least one process parameter to generate a modified build file; additively manufacturing a second part using the additive manufacturing apparatus according to the modified build file, wherein: additively manufacturing the first part is performed in a closed-loop control mode, and additively manufacturing the second part is performed in an open-loop control mode.

Abstract: A system for controlling playback of various types of content includes a first computing device that provides a unique identifier to a second computing device to establish an association there between. By virtue of the established association, the second computing device can send one or more messages to the first computing device, the one or more messages referencing a piece of content associated with a first media playing element of a plurality of media playing elements, and one or more commands corresponding to the first media playing element. The first computing device can select the first media playing element based on the received one or more messages, and control how the first media playing element plays the referenced piece of content utilizing the one or more commands.

Abstract: The present disclosure discloses a semiconductor device and a method for manufacturing a semiconductor device. The method for manufacturing a semiconductor device includes following steps: providing a semiconductor substrate, and forming active regions and trench isolation structures in the semiconductor substrate, wherein the trench isolation structures are located between the active regions; forming first grooves in the active regions; filling the first grooves to form inversion polysilicon layers, the inversion polysilicon layers being inversely doped with the active regions; forming second grooves, the second grooves running through the polysilicon layers and a part of the semiconductor substrate, and reserving parts of the inversion polysilicon layers located on side faces of the second grooves; and, forming buried word line structures in the second grooves.

Abstract: The present disclosure relates to a memory test system and a memory test method. The memory test system comprises: a plurality of test devices, a host computer, and driving modules. Each of the test devices is provided with a test interface used for connecting a memory to be tested. The host computer is respectively connected to the plurality of test devices and configured to control the test devices to test the memory to be tested. The driving modules are connected to the test devices and configured to output, to the test devices, driving signals used for driving the test devices to perform data interaction with the host computer.

Abstract: Data about concentration of one or more types of molecules present within a human body are determined noninvasively using radio frequency signals. These signals generated at very low power levels are emitted and acquired using an antenna mounted to a wearable device. Information about changes to the signals is indicative of the concentration of one or more types of molecules within the user. The antenna includes two or more elements with a varying distance between them which reduces or eliminates power reflection and improves overall efficiency. The varying distance provides a first impedance at terminals of the antenna and a second impedance elsewhere on the antenna, such as midway along a long axis of the antenna. The first impedance matches an impedance of a transmitter output, a receiver input, or both. The second impedance results in the signal extending away from the antenna towards the user.

Abstract: A method for determining the memory power consumption includes: receiving a memory control command and controlling an analog memory to enter different working stages according to the memory control command (S410); acquiring an original current change curve of the analog memory in different working stages (S420); determining a target time period corresponding to a target working stage according to a time sequence of the memory control command (S430); intercepting a stage current change curve corresponding to the target working stage from the original current change curve according to the target time period to obtain a target current change curve (S440); selecting target performance parameters from a memory performance parameter table according to the target working stage (S450); and determining the power consumption of the memory according to the target performance parameters and the target current change curve (S460).

Abstract: A device that uses a motor may quickly and safely stop the motor using a rapid braking system. For example, the device may stop to avoid collision with an object, upon determining a failure of an internal component, upon receipt of a command, and so forth. Responsive to a signal to stop, the motor is disconnected from the battery. A braking circuit is activated that dissipates, in a controlled fashion, power produced by continuing motion of the motor. When the voltage produced by the motor's continuing motion drops below a threshold, a stop circuit shorts the terminals of the motor, causing the motor to resist further rotation. When the stop condition no longer applies the signal to stop is removed resulting in the motor being reconnected to the battery, the braking circuit being deactivated, the stop circuit opens the short between the terminals of the motor, and normal operation resumes.

Abstract: A system for controlling playback of various types of content includes a first computing device that provides a unique identifier to a second computing device to establish an association there between. By virtue of the established association, the second computing device can send one or more messages to the first computing device, the one or more messages referencing a piece of content associated with a first media playing element of a plurality of media playing elements, and one or more commands corresponding to the first media playing element. The first computing device can select the first media playing element based on the received one or more messages, and control how the first media playing element plays the referenced piece of content utilizing the one or more commands.

Abstract: Systems and methods for material composition detection includes a vessel containing a quantity of a fluid composition therein which has at least a first and second fluids. At least one acoustic transducer is positioned on an exterior sidewall of the vessel. A computerized device has a processor and is in communication with the acoustic transducer. A metric of a property of the first fluid is determined based on a first signal of the acoustic transducer. A metric of a property of the second fluid is determined based on a second signal of the acoustic transducer. A metric of a property of the fluid composition at a point in time is determined based on the metrics of the first and second fluids, and at least a determinable volume of at least a portion of the vessel. A material identity of the fluid composition is determined at the point in time.

Abstract: A manufacturing method of an integrated circuit memory includes: a substrate is provided; a bit line extending along a first direction is formed on the substrate; a word line extending along a second direction is formed on the bit line; and a vertical storage transistor is formed in an overlapping region where the word line and the bit line are spatially intersected, the vertical storage transistor being located on the bit line, and connected to the bit line.

Abstract: A machine learning environment utilizing training data generated by customer environments. A reinforced learning machine learning environment receives and processes training data generated by independently hosted, or decoupled, customer environments. The reinforced learning machine learning environment corresponds to machine learning clusters that receive and process training data sets provided by the decoupled customer environments. The customer environments include an agent process that collects training data and forwards the training data to the machine learning clusters without exposing the customer environment. The machine learning clusters can be configured in a manner to automatically process the training data without requiring additional user inputs or controls to configured the application of the reinforced learning machine learning processes.

Abstract: A method for polarizing a piezoelectric film is described. In this method, a piezoelectric film is formed by using an injection deposition method. The piezoelectric film is flat adhered to a surface of a conductive substrate. A polarization process is performed on the piezoelectric film while the piezoelectric film is flat adhered to the surface of the conductive substrate by generating static electricity on the adhesion surface of the piezoelectric film, and generating the static electricity on the adhesion surface of the piezoelectric film comprises using a pressurized gas to blow the adhesion surface, and the adhesion surface of the piezoelectric film is adhered to the even surface of the conductive substrate by an electrostatic adsorption method.

Abstract: Systems and methods are provided to perform PdM surveys using data acquisition units which scan screen multiple locations where equipment or structures to be evaluated are present. Video data will be acquired and processed to measure translational and vibratory motion and additional data will be collected from other camera, sensors or via data links. The motion present in the equipment or structures under test and the supplemental data will be automatically evaluated to detect suspect equipment conditions and to minimize the amount of video data maintained on the data acquisition unit and transmitted back the central PdM server for review by a PdM analyst and long term archival.

Abstract: A semiconductor structure includes: a substrate with conductive contact regions; a bit line structure and an isolation wall located on a sidewall of the bit line structure, the isolation wall includes at least one isolation layer including a first isolation part close to the bit line structure and a second isolation part deviating from the same, the second isolation part has doped ions, such that it has a greater hardness than the first isolation part, or has a smaller dielectric constant than the first isolation part; and a capacitor contact hole, which exposes the conductive contact region, and has a top width greater than a bottom width in a direction parallel to an orientation of the bit line structure.

Abstract: Various illustrative aspects are directed to a data storage device, comprising one or more disks; at least one actuator mechanism configured to position at least a first head proximate to a first disk surface and a second head proximate to a second disk surface; and one or more processing devices. The one or more processing devices are configured to: assign logical tracks to physical tracks of the disk surfaces such that a respective logical track comprises: at least a portion of sectors of a primary physical track, the primary physical track being on the first disk surface; and at least a portion of sectors of a donor physical track, the donor physical track being on the second disk surface. The one or more processing devices are configured to perform, using the first head and the second head, a data access operation with at least one of the logical tracks.

Abstract: Apparatuses, methods, systems, and program products are disclosed for data aggregation using a limited-use code. An apparatus includes a message module configured to intercept a message comprising a limited-use code. A message may be sent from a third-party server and intended for a user of a hardware device. A limited-use code may be used to verify an identity of a user for access to a third-party server. An apparatus includes a parse module configured to parse a message to determine a limited-use code. An apparatus includes a submission module configured to provide a limited-use code to a third-party server without user input. An apparatus includes an authorization module configured to prompt a user for authorization prior to intercepting a message, parsing the message for a limited-use code, and providing the limited-use code to a third-party server without user input.

Abstract: A method for testing crosstalk effect includes: obtaining a test signal and an interference input signal; inputting the test signal into a crosstalk effect test circuit obtained by simulation, so as to obtain an interfered signal; and when a rise time of the interfered signal or a fall time of the interfered signal is greater than a preset time threshold, determining that an excessive crosstalk effect exists in an integrated circuit under test. The crosstalk effect test circuit includes a first circuit, N second circuits, and N capacitors. The first circuit is configured to simulate an interfered first signal circuit in the integrated circuit under test; the N second circuits are configured to simulate N second signal circuits that interfere with the first signal circuit in the integrated circuit under test.