Abstract: Some embodiments of the present disclosure relate to a high electron mobility transistor (HEMT) which includes a heterojunction structure arranged over a semiconductor substrate. The heterojunction structure includes a binary III/V semiconductor layer is a first III-nitride material and a ternary III/V semiconductor layer arranged over the binary III/V semiconductor layer and is a second III-nitride material. Source and drain regions are arranged over the ternary III/V semiconductor layer. A gate structure is arranged over the heterojunction structure and arranged between the source and drain regions. The gate structure is a third III-nitride material. A first passivation layer directly contacts an entire sidewall surface of the gate structure and is a fourth III-nitride material. The entire sidewall surface has no dangling bond. A second passivation layer is conformally disposed along the first passivation layer, the second passivation layer has no physical contact with the gate structure.

Abstract: The present invention provides a high voltage device and a manufacturing method thereof. The high voltage device includes: a semiconductor layer, a drift oxide region, a well, a body region, a gate, at least one sub-gate, a source, and a drain. The drift oxide region is located on a drift region in an operation region. The sub-gate is formed on the drift oxide region right above the drift region. The sub-gate is parallel with the gate. A conductive layer of the gate has a first conductivity type, and a conductive layer of the sub-gate has a second conductivity type or is an intrinsic semiconductor structure.

Abstract: A method including forming a III-V compound layer on a substrate and implanting a main dopant in the III-V compound layer to form source and drain regions. The method further includes implanting a group V species into the source and drain regions. A semiconductor device including a substrate and a III-V compound layer over the substrate. The semiconductor device further includes source and drain regions in the III-V layer, wherein the source and drain regions comprises a first dopants and a second dopant, and the second dopant comprises a group V material.

Abstract: A reaction chamber for vapor deposition apparatus, comprises a susceptor to carry substrates, a ceiling, an upper cavity, and protrusions. The ceiling comprises a front surface faces the substrates and comprises front convex parts and front concave parts with an interlaced arrangement to form a convex-concave surface. The ceiling also comprises a rear surface opposites to the front surface and comprises rear convex parts and rear concave parts corresponded to the front concave parts and the front convex parts respectively. The upper cavity opposites to the rear surface and separated to the rear convex parts to define a first flow channel. The protrusions are disposed in the rear concave parts and separated to a side wall and a bottom wall of the rear concave parts to define a second flow channel which is connected to the first flow channel to introduce a cooling fluid.

Abstract: Some embodiments of the present disclosure relate to a HEMT. The HEMT includes a heterojunction structure having a second III/V semiconductor layer arranged over a first III/V semiconductor layer. Source and drain regions are arranged over the substrate and spaced apart laterally from one another. A gate structure is arranged over the heterojunction structure and arranged between the source and drain regions. A first passivation layer is disposed about sidewalls of the gate structure and extending over an upper surface of the gate structure, wherein the first passivation layer is made of a III-V material. A second passivation layer overlies the first passivation layer and made of a material composition different from a material composition of the first passivation layer. The second passivation layer has a thickness greater than that of the first passivation layer.

Abstract: The present disclosure relates to a MIM (metal-insulator-metal) capacitor having a laminated capacitor dielectric layer including alternating layers of high-k dielectric material and high-energy band gap material, and a method of formation. In some embodiments, the MIM capacitor has a laminated capacitor dielectric layer disposed over a capacitor bottom metal layer. The laminated capacitor dielectric layer includes a first layer of a first dielectric material, a second layer of a second dielectric material disposed on top of the first layer, a third layer of a third dielectric material disposed on top of the second layer, and a fourth layer of a fourth dielectric material disposed on top of the third layer. The first and third dielectric materials have a differing capacitance and band gap energy as compared to the second and fourth dielectric materials. A capacitor top metal layer is disposed over the laminated capacitor dielectric layer.

Abstract: The present disclosure relates to a high electron mobility transistor (HEMT) and a fabrication method thereof. The HEMT may include a substrate; a channel layer disposed on the substrate; a barrier layer disposed on the channel layer; a semiconductor gate disposed on the barrier layer; a metal gate disposed on the semiconductor gate, the metal gate having a trapezoidal cross-sectional shape; and a passivation layer directly contacting the metal gate. A first surface of the metal gate contacts a first surface of the semiconductor gate, and an edge of the first surface of the metal gate is located inside an edge of the first surface of the semiconductor gate.

Abstract: A clock generation circuit and a clock adjustment method thereof are provided. The clock generation circuit includes a fixed clock source, a variable clock source, a timing adjustment circuit, and a pulse width signal generator. The fixed clock source generates a reference clock signal having a fixed frequency. The variable clock source receives a frequency setting signal to correspondingly generate an operational clock signal having a variable frequency. The timing adjustment circuit determines whether a frequency of the operation clock signal is N times of a target frequency according to the reference clock signal to set a frequency of the operation clock signal. The pulse width signal generator divides the operating clock signal to generate a pulse width modulation signal having the target frequency.

Abstract: A semiconductor device and a manufacturing method thereof are provided. The semiconductor device includes a substrate, a transistor and a heat dissipation structure. The substrate includes first and second semiconductor layers, and includes an insulating layer disposed between the first and second semiconductor layers. The substrate has a recess extending into the insulating layer from a surface of the first semiconductor layer. The transistor includes a hetero-junction structure, a gate electrode, a drain electrode and a source electrode. The hetero-junction structure is disposed on the second semiconductor layer. The gate, drain and source electrodes are disposed over the hetero-junction structure. The gate electrode is located between the drain electrode and the source electrode, and an active area of the hetero-junction structure located between the drain electrode and the source electrode is overlapped with the recess of the substrate.

Abstract: The present disclosure provides a high electron mobility transistor, including a silicon substrate, a channel layer, a barrier layer and a gate sequentially stacked in a thickness direction of the high electron mobility transistor. The high electron mobility transistor further includes a strain layer made of an insulating material. A surface of the barrier layer distal to the channel layer includes a gate region and an enhancement region. The gate is disposed in the gate region. The strain layer includes an enhancement portion stacked in the enhancement region. A mismatch rate of a lattice constant of the strain layer to a lattice constant of the barrier layer is not less than 0.5%. The present disclosure further provides a method for manufacturing a high electron mobility transistor. The high electron mobility transistor has good performance and low cost.

Abstract: A clock generation circuit and a clock adjustment method thereof are provided. The clock generation circuit includes a fixed clock source, a variable clock source, a timing adjustment circuit, and a pulse width signal generator. The fixed clock source generates a reference clock signal having a fixed frequency. The variable clock source receives a frequency setting signal to correspondingly generate an operational clock signal having a variable frequency. The timing adjustment circuit determines whether a frequency of the operation clock signal is N times of a target frequency according to the reference clock signal to set a frequency of the operation clock signal. The pulse width signal generator divides the operating clock signal to generate a pulse width modulation signal having the target frequency.

Abstract: A manufacturing method of a high electron mobility transistor includes providing an epitaxial stacked structure, wherein the epitaxial stacked structure includes a semiconductor substrate, a buffer layer formed on the semiconductor substrate, a channel layer formed on the buffer layer, an intermediate layer formed on the channel layer, and a barrier layer formed on the intermediate layer; forming a source and a drain on the barrier layer; performing a microwave annealing process, wherein the conditions of the microwave annealing process include a temperature between 450° C. and 550° C., a frequency between 5.8 GHz and 6.2 GHz, and a time between 150 seconds and 250 seconds; and forming a gate on the barrier layer between the source and the drain.

Abstract: A semiconductor device includes a compound semiconductor layer, an oxide layer over and contacting the compound semiconductor layer, a nitride layer over and contacting the oxide layer, and a dielectric layer over and contacting the nitride layer. At least a portion of the oxide layer comprises a first crystalline structure. At least a portion of the nitride layer comprises a second crystalline structure.

Abstract: Some embodiments of the present disclosure relate to a HEMT. The HEMT includes a heterojunction structure having a second III/V semiconductor layer arranged over a first III/V semiconductor layer. Source and drain regions are arranged over the substrate and spaced apart laterally from one another. A gate structure is arranged over the heterojunction structure and arranged between the source and drain regions. A first passivation layer is disposed about sidewalls of the gate structure and extending over an upper surface of the gate structure, wherein the first passivation layer is made of a III-V material. A second passivation layer overlies the first passivation layer and made of a material composition different from a material composition of the first passivation layer. The second passivation layer has a thickness greater than that of the first passivation layer.

Abstract: The present disclosure relates to a MIM (metal-insulator-metal) capacitor having a laminated capacitor dielectric layer including alternating layers of high-k dielectric material and high-energy band gap material, and a method of formation. In some embodiments, the MIM capacitor has a laminated capacitor dielectric layer disposed over a capacitor bottom metal layer. The laminated capacitor dielectric layer includes a first layer of a first dielectric material, a second layer of a second dielectric material disposed on top of the first layer, a third layer of a third dielectric material disposed on top of the second layer, and a fourth layer of a fourth dielectric material disposed on top of the third layer. The first and third dielectric materials have a differing capacitance and band gap energy as compared to the second and fourth dielectric materials. A capacitor top metal layer is disposed over the laminated capacitor dielectric layer.

Abstract: A reaction chamber for vapor deposition apparatus, comprises a susceptor to carry substrates, a ceiling, an upper cavity, and protrusions. The ceiling comprises a front surface faces the substrates and comprises front convex parts and front concave parts with an interlaced arrangement to form a convex-concave surface. The ceiling also comprises a rear surface opposites to the front surface and comprises rear convex parts and rear concave parts corresponded to the front concave parts and the front convex parts respectively. The upper cavity opposites to the rear surface and separated to the rear convex parts to define a first flow channel. The protrusions are disposed in the rear concave parts and separated to a side wall and a bottom wall of the rear concave parts to define a second flow channel which is connected to the first flow channel to introduce a cooling fluid.

Abstract: An access control system comprising a first detector, a second detector, and a processor. The first detector is operable to detect presence of a subject in proximity of the access control system. The second detector operable to detect an object identifier associated with an object carried by the subject in proximity of the access control system. The processor is operably connected with the first detector and the second detector. The processor is operable to receive, from the first detector, a first signal indicative of the detection of the presence of the subject, and receive, from the second detector, a second signal containing the detected object identifier. During operation, the processor is arranged to determine that an access event has occurred when it receives both the first signal and the second signal.

Abstract: A method includes forming a first III-V compound layer over a substrate; forming a second III-V compound layer over the first III-V compound layer, wherein the first and second III-V compound layers include different materials; forming a first crystalline oxide layer over the second III-V compound layer; and forming a first crystalline interfacial layer over the first crystalline oxide layer.

Abstract: Some embodiments of the present disclosure relate to a high electron mobility transistor (HEMT) which includes a heterojunction structure arranged over a semiconductor substrate. The heterojunction structure includes a first III/V semiconductor layer, and a second III/V semiconductor layer arranged over the first III/V semiconductor layer. Source and drain regions are arranged over the second III/V semiconductor layer and are spaced apart laterally from one another. A gate structure is arranged over the heterojunction structure and is arranged between the source and drain regions. The gate structure is made of a third III-nitride material. A first passivation layer is disposed about sidewalls of the gate structure and is made of a fourth III-nitride material.

Abstract: The present disclosure, in some embodiments, relates to a method of forming a transistor device. The method may be performed by forming an anode and a cathode over an electron supply layer disposed on a semiconductor material. A doped III-N semiconductor material is formed over the electron supply layer, and an insulating material is formed over the electron supply layer and the doped III-N semiconductor material. The insulating material continuously extends from over the anode to over the cathode. The insulating material is patterned to form sidewalls of the insulating material that define an opening over the doped III-N semiconductor material. A gate structure is formed directly between the sidewalls of the insulating material and over the doped III-N semiconductor material.