Contact wafer
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Description
The Dash-Dash broken lines in the drawing views are included to show portions of the contact wafer that form no part of the claimed design. The Dash-Dot broken lines in the drawing views are included to show claim boundaries that form no part of the claimed design.
Claims
The ornamental design for a contact wafer, as shown and described.
Referenced Cited
U.S. Patent Documents
Foreign Patent Documents
Other references
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Patent History
Patent number: D1069730
Type: Grant
Filed: Feb 26, 2020
Date of Patent: Apr 8, 2025
Assignee: SAMTEC, INC. (New Albany, IN)
Inventors: Jonathan E. Buck (New Albany, IN), John A. Mongold (New Albany, IN)
Primary Examiner: Shawn T Gingrich
Assistant Examiner: Bryan N. Melvin
Application Number: 29/725,670
Type: Grant
Filed: Feb 26, 2020
Date of Patent: Apr 8, 2025
Assignee: SAMTEC, INC. (New Albany, IN)
Inventors: Jonathan E. Buck (New Albany, IN), John A. Mongold (New Albany, IN)
Primary Examiner: Shawn T Gingrich
Assistant Examiner: Bryan N. Melvin
Application Number: 29/725,670
Classifications
Current U.S. Class:
Element Or Attachment (D13/154)