Portion of an electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of a portion of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof; the rear view is not part of the claimed design;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a front, top and right side perspective view thereof shown in an opened positioned; the front, top and left side perspective view of the claimed design (shown in solid lines) is a mirror image of the claimed design as shown in FIG. 8.

The broken lines shown are for illustrative purpose and form no part of the claimed design.

Claims

We claim the ornamental design for a portion of an electron microscope, as shown and described.

Referenced Cited
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Other references
  • U.S. Patent Application of Oonuma et al., U.S. Appl. No. 29/343,661, filed Sep. 17, 2009.
  • U.S. Patent Application of Oonuma et al., U.S. Appl. No. 29/356,716, filed Mar. 2, 2010.
Patent History
Patent number: D635168
Type: Grant
Filed: Mar 2, 2010
Date of Patent: Mar 29, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiko Ajima (Hitachinaka), Tomohisa Ohtaki (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/356,722
Classifications
Current U.S. Class: Microscope (D16/131)