Using X-ray Laser (epo) Patents (Class 257/E21.348)
  • Patent number: 8709916
    Abstract: A laser processing method is disclosed, comprising the steps of: directing a laser beam to a workpiece; and effecting a relative motion between the laser beam and the workpiece. In particular, the step of directing the laser beam to the workpiece comprises focusing the laser beam within the workpiece until an internal damage forms within the workpiece and a crack propagates from the internal damage to at least one surface of the workpiece to form a surface crack on the workpiece. Further, the step of effecting the relative motion between the laser beam and the workpiece is such that the surface crack on the workpiece propagates along a line of separation on the workpiece. A laser processing apparatus is also disclosed.
    Type: Grant
    Filed: July 5, 2012
    Date of Patent: April 29, 2014
    Assignee: ASM Technology Singapore Pte Ltd
    Inventors: Chi Hang Kwok, Chi Wah Cheng, Lap Kei Chow
  • Patent number: 8124500
    Abstract: A laser processing method which can securely prevent particles from attaching to chips obtained by cutting a planar object is provided. When applying a stress to an object to be processed 1 through an expandable tape 23, forming materials of the object 1 (the object 1 formed with molten processed regions 13, semiconductor chips 25 obtained by cutting the object 1, particles produced from cut sections of the semiconductor chips 25, and the like) are irradiated with soft x-rays. As a consequence, the particles produced from the cut sections of the semiconductor chips 25 obtained by cutting the object 1 fall on the expandable tape 23 without dispersing randomly. This can securely prevent the particles from attaching to the semiconductor chips 25 obtained by cutting the object 1.
    Type: Grant
    Filed: May 21, 2010
    Date of Patent: February 28, 2012
    Assignee: Hamamatsu Photonics K.K.
    Inventor: Takeshi Sakamoto
  • Publication number: 20110201199
    Abstract: A laser annealing method for annealing a stacked semiconductor structure having at least two stacked layers is disclosed. A laser beam is focused on a lower layer of the stacked layers. The laser beam is then scanned to anneal features in the lower layer. The laser beam is then focused on an upper layer of the stacked layers, and the laser beam is scanned to anneal features in the upper layer. The laser has a wavelength of less than one micrometer. The beam size, depth of focus, energy dosage, and scan speed of the laser beam are programmable. Features in the lower layer are offset from features in the upper layer such that these features do not overlap along a plane parallel to a path of the laser beam. Each of the stacked layers includes active devices, such as transistors. Also, the first and second layers may be annealed simultaneously.
    Type: Application
    Filed: April 25, 2011
    Publication date: August 18, 2011
    Applicant: International Business Machines Corporation
    Inventors: Howard H. Chen, Louis C. Hsu, Lawrence S. Mok, J. Campbell Scott
  • Patent number: 7981814
    Abstract: A method for the duplication of microscopic patterns from a master to a substrate is disclosed, in which a replica of a topographic structure on a master is formed and transferred when needed onto a receiving substrate using one of a variety of printing or imprint techniques, and then dissolved. Additional processing steps can also be carried out using the replica before transfer, including the formation of nanostructures, microdevices, or portions thereof. These structures are then also transferred onto the substrate when the replica is transferred, and remain on the substrate when the replica is dissolved. This is a technique that can be applied as a complementary process or a replacement for various lithographic processing steps in the fabrication of integrated circuits and other microdevices.
    Type: Grant
    Filed: August 31, 2007
    Date of Patent: July 19, 2011
    Assignee: The Board of Trustees of the Leland Stanford Junior University
    Inventor: Charles Daniel Schaper
  • Patent number: 7947599
    Abstract: A laser annealing method for annealing a stacked semiconductor structure having at least two stacked layers is disclosed. A laser beam is focused on a lower layer of the stacked layers. The laser beam is then scanned to anneal features in the lower layer. The laser beam is then focused on an upper layer of the stacked layers, and the laser beam is scanned to anneal features in the upper layer. The laser has a wavelength of less than one micrometer. The beam size, depth of focus, energy dosage, and scan speed of the laser beam are programmable. Features in the lower layer are offset from features in the upper layer such that these features do not overlap along a plane parallel to a path of the laser beam. Each of the stacked layers includes active devices, such as transistors. Also, the first and second layers may be annealed simultaneously.
    Type: Grant
    Filed: January 23, 2008
    Date of Patent: May 24, 2011
    Assignee: International Business Machines Corporation
    Inventors: Howard H. Chen, Louis C. Hsu, Lawrence S. Mok, J. Campbell Scott
  • Patent number: 7547647
    Abstract: A method for making a structure includes depositing a solution upon a surface and irradiating the solution with microwaves to crystallize solute of the solution on the surface.
    Type: Grant
    Filed: July 6, 2004
    Date of Patent: June 16, 2009
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Gregory S. Herman, Peter Mardilovich, Chinmay Betrabet, Chih-hung Chang, Yu-jen Chang, Doo-Hyoung Lee, Mark W. Hoskins