Abstract: A low-power method and apparatus is provided for adapting to time-varying limitations of a power source, such as a vehicle power source which is in a more-limited state when the engine is off. The supply voltage is monitored for changes using an unclocked, low-power first stage having an analog section, a voltage comparator. Upon detecting voltage changes reflective of a potential power source state change, the first stage generates an interrupt. In response, a second stage transitions from a low-power standby mode to a higher-power active mode. The second stage may include a microprocessor and is configured to confirm or disconfirm the state change. Upon confirmation, further operations are triggered. Upon disconfirmation, the second stage returns to standby mode. The first stage may include an operational amplifier whose two inputs are indicative of the supply voltage, one input having a different response rate to voltage variations than the other.

Abstract: Adverse effects of noise are reduced. A photodetector circuit, a difference data generation circuit, and a data input selection circuit are included. The photodetector circuit has a function of generating an optical data signal. A first data signal and a second data signal is input to the difference data generation circuit and the difference data generation circuit has a function of generating difference data of data of the first data signal and data of the second data signal. The data input selection circuit has a function of determining that the data of optical data signal is regarded as data of the first data signal or data of the second data signal.

Abstract: A metal-to-metal leakage and breakdown testing structure for semiconductor structures and method of using the testing structure is disclosed. The testing structure includes plurality of resistor bridges connected to respective two terminal devices. The testing structure further includes a plurality of switches each having a voltage node provided between resistors of a respective one of the plurality of resistor bridges. The voltage node is read at a circuit pad when a respective one of the plurality of switches is in an on state. The testing structure further includes a device turning on and off each of the plurality of switches, individually.

Abstract: A key press detecting circuit and method detect the status of multiple keys through a single pin. In an embodiment, a constant current is provided to apply to a key module through a single pin, to generate a voltage at the single pin that is related to the equivalent resistance of the key module observed from the single pin, and the voltage of the single pin is compared with a set of reference values to identify the status of the plurality of keys. In another embodiment, a variable current is provided to apply to a key module through a single pin in such a way that the variable current is adjusted to maintain a constant voltage at the single pin, and the variable current is compared with a set of reference values to identify the status of the plurality of keys.

Abstract: In a voltage detecting circuit, a transistor is configured as a P-type MOSFET, and includes a source connected with an input terminal, a gate connected with a ground voltage terminal and a drain connected with an output terminal. A transistor is configured as a P-type MOSFET, and includes a gate and a source connected with the output terminal and a drain connected with the ground terminal. Gate width and gate length of the transistor and gate width and gate length of the transistor are adjusted so that source-drain current flowing between the source and the drain of the transistor becomes equal to source-drain current flowing between the source and the drain of the transistor when the voltage applied to the input terminal is set to be preset trigger voltage. This configuration accomplishes detecting that the input voltage exceeds the trigger voltage with simple configuration.

Abstract: A comparator has a first terminal, a second terminal, and an output terminal. A selection circuit is coupled to the first terminal. A calibration circuit is coupled to the output terminal and the second terminal. The comparator is configured to operate in a first mode when the selection circuit provides a first input signal to the first terminal and the calibration circuit provides a second input signal to the second terminal. The comparator is configured to operate in a second mode when the selection circuit provides a first calibration signal to the first terminal and the calibration circuit provides a second calibration signal to the second terminal based on an output signal at the output terminal. The comparator generates the output signal based on the first calibration signal and the second calibration signal.

Abstract: An electronic system comprises a resistive sensor structure and an electronic circuit portion whose design is selected such that different resistive sensor structures may be combined within the same electronic circuit. To this end, the resistive sensor structure is used as a voltage/current converter that provides input currents to a current amplifier, which in turn provides an amplified output voltage on the basis of a difference of the input currents. The operating range of the current amplifier is adjusted on the basis of a programmable current source irrespective of the configuration of the resistive sensor structure.

Abstract: A circuit for converting the state of a sensor into a signal interpretable by an electronic circuit, including: a comparator of the voltage level of an input terminal with respect to a reference level, the sensor being intended to be connected between a terminal of application of a first power supply voltage and the input terminal; a current-limiting element between said input terminal and the ground; and a switching element in series with the current source and intended to be controlled by a pulse train.

Abstract: The light receiving circuit includes: a photoelectric conversion element for causing a current corresponding to an amount of incident light to flow to a node; a voltage detection circuit for outputting a detection signal when a voltage of the node becomes equal to or higher than a first voltage; a reset circuit for causing, when the detection signal of the voltage detection circuit is input, the current of the photoelectric conversion element to flow to a GND terminal so that the voltage of the node becomes a second voltage lower than the first voltage, and for holding this state when the detection signal is no longer input; and a voltage increase detection circuit for detecting a fluctuation in the voltage of the node and outputting a detection result.

Abstract: A circuit having a centralized PT compensation circuit to provide compensation signals to localized I/O blocks on the chip. Process variations and temperature variations tend to be approximately uniform across an integrated circuit chip. Thus, a single, centralized PT compensation circuit may be used instead of one PT compensation circuit per I/O section as with solutions of the past. Further, the PT compensation circuit may generate a digital code indicative of the effects of process and temperature. Further yet, each section of I/O block may have a local voltage compensation circuit to compensate the voltage variation of the I/O block. The voltage compensation circuit utilizes an independent reference voltage. The reference voltage is generated by the PT compensation circuit, which is placed centrally in the IC chip and hence any need to repeat the reference generation for each I/O block is eliminated.

Abstract: The impedance of the elements of a capacitor array in the transmitter is kept substantially constant over changes in process, temperature, and supply voltage. The impedance is maintained substantially constant by compensating a gate voltage supplied to switches in each element of the capacitor array to adjust for changes in temperature and supply voltage to thereby maintain a substantially constant RC product for each unit element in the capacitor array and thereby improve the quality factor of the capacitor array.

Abstract: A voltage detection circuit including a comparator circuit, a tunable gain circuit and a switch circuit is disclosed. The comparator circuit has a first input terminal and a second input terminal. The tunable gain circuit is coupled between the first input terminal and a reference signal. The tunable gain circuit has a plurality of gain configurations. The tunable gain circuit adjusts the reference signal and transmits the adjusted reference signal to the first input terminal. The switch circuit selectively transmits a signal under test or the reference signal to the second input terminal. When the voltage detection circuit is in an auto-trimming mode, the switch circuit transmits the reference signal to the second input terminal and the tunable gain circuit sequentially adopts the gain configurations until the comparator circuit detects that voltage levels of the first input terminal and the second input terminal are substantially equal.

Abstract: A comparator comprises a differential amplifier type including input MOSFETs receiving differential input of a reference voltage and an input voltage, load MOSFETs for the input MOSFETs, and a constant current source to supply the sources of the input MOSFETs. The comparator comprises a Zener diode that is connected between the gate and source of the input MOSFETs and exhibits a breakdown voltage lower than the withstand voltage of the gate oxide film of the input MOSFET. Another comparator further comprises a feedback MOSFET that performs negative feedback of an output voltage of a main body comparator to the gates of the load MOSFETs to restrict the amplitude of the output voltage. Still another comparator further comprises a semiconductor rectifying element that exhibits a reverse-blocking characteristic higher than the power supply voltage and is interposed between the constant current source and the source of each of the input MOSFETs.

Abstract: A low voltage detector (100) includes a power supply voltage monitor circuit (110) that produces a voltage VSP related to a first a power supply voltage, and a voltage generator (105), which includes a plurality of self-cascode MOSFET (SCM) structures (101-103) in a cascade configuration, that generates a reference voltage Vxm. A voltage comparator (140) outputs an output signal in response to a differential between Vxm and VSP, wherein Vxm and VSP have proportional to absolute temperature behavior (PTAT) over temperature with respect to a second power supply voltage. The output signal changes state when the first power supply voltage equals a trip point of the comparator. Each SCM structure is sized to provide a rate of change with temperature of the PTAT behavior of Vxm that matches a rate of change with temperature of the PTAT behavior of VSP.

Abstract: A logic signal transmission circuit includes a driving circuit, an isolation section, and a latch section. The driving circuit converts an input digital signal to a differential digital signal. The isolation section blocks direct current and passes the differential digital signal. The latch section has even numbers of inverters which are connected in a loop and output a logic signal by turning ON and OFF a power supply voltage in a complementary manner. An input impedance of the latch section is set so that when a logic level of the differential digital signal changes, a transient voltage inputted through the isolation section to the latch section changes across a threshold voltage of the latch section. When the transient voltage changes across the threshold voltage, a logic level of the logic signal changes.

Abstract: In an embodiment, a circuit configured for asymmetric ageing prevention in an integrated circuit (IC) comprises a primary clock configured to generate a primary clock signal, a secondary clock configured to generate a secondary clock signal, a state determination circuit, and a control circuit. The state determination circuit is configured to determine a current operating state associated with at least one of a primary clock condition and a power-on-reset condition in the IC. The control circuit is configured to generate a control signal in response to a determination of an first operating state. The control signal is configured to facilitate a transition from the primary clock to the secondary clock upon determination of the first operating state, and a transition from a safe operating mode to a normal operating mode upon determination of a second operating state. The secondary clock is associated with a safe operating mode of the IC.

Abstract: Externally configurable power-on-reset systems and methods for integrated circuits are disclosed that utilize internal power-on-reset circuitry and reset control circuitry to provide operational configurations determined by external connections. In one configuration where no dedicated external reset signal is desired, the reset control circuitry relies upon the internal power-one-reset circuitry to generate the internal reset control signal. In another configuration where an external reset signal is utilized, the reset control circuitry relies upon the external reset signal, which overrides the internal power-on-reset circuitry, to generate the internal reset control signal. In further configurations, the reset control circuitry utilizes logic circuitry controlled through a digital interface to determine when the internal reset control signal can be de-asserted.

Abstract: An apparatus includes an integrated circuit (IC). The IC includes a differencing comparator. The differencing comparator receives a differential input signal. The differencing comparator compares the differential input signal to a threshold value. The differencing comparator includes a transconductance circuit coupled to receive the differential input signal and to provide a differential output signal.

Abstract: The light receiving circuit includes: a photoelectric conversion element for causing a current corresponding to an amount of incident light to flow to a node; a voltage detection circuit for outputting a detection signal when a voltage of the node becomes equal to or higher than a first voltage; a reset circuit for causing, when the detection signal of the voltage detection circuit is input, the current of the photoelectric conversion element to flow to a GND terminal so that the voltage of the node becomes a second voltage lower than the first voltage, and for holding this state when the detection signal is no longer input; and a voltage increase detection circuit for detecting a fluctuation in the voltage of the node and outputting a detection result.

Abstract: A ping pong comparator voltage monitoring circuit which includes first and second comparators having inputs connected to a voltage Vin to be monitored, and second inputs connected to first and second nodes, respectively. A multiplexer alternately couples the first and second comparator outputs to an output in response to a periodic control signal. A ground-referenced voltage Vref1 is provided at a third node and a voltage Vref2 referenced to Vref1 is at a fourth node. A hysteresis hyst1 is switchably connected between the third and first nodes, and a hysteresis hyst2 is switchably connected between the fourth and second nodes. Hyst1 and hyst2 are switched in when the mux output toggles due to a rising Vin, and are switched out when the mux output toggles due to a falling Vin.

Abstract: An analog disconnection envelope detection circuit having a low power supply detects a high speed, high differential voltage disconnect state on a data line. Level-shifting circuitry shifts the voltage level of two input signals by the value of a detection threshold voltage, generates differential signals used to indicate conditions of the input signals, and mitigates effects of input differential signal common-mode voltage on the detection operation. Circuitry is provided to equalize VDS of detecting tail current sources, thereby eliminating errors resulting from VDS mismatch of tail current sources. Comparator circuitry compares the sets of differential signals and indicates when the absolute difference between the two input signals is greater than a reference voltage. Output circuitry generates a disconnect signal corresponding to the disconnect condition.

Abstract: A power-on-detection (POD) circuit includes first and second comparators, a voltage divider, a detection circuit coupled to a first voltage source node and the voltage divider, and logic circuitry coupled to outputs of the first and second comparators. The detection circuit outputs a control signal identifying if a first voltage source node has a voltage potential that is higher than ground. The control signal turns on and off the first and second comparators, which are respectively coupled to first and second nodes of the voltage divider and to a reference voltage node. The logic circuitry outputs a power identification signal based on the signals received from the outputs of the first and second comparators.

Abstract: Several circuits and methods for field-based communication are provided. In an embodiment, a field-based communication circuit includes a receiver circuit, a detection circuit and a control circuit. The receiver circuit is configured to receive a field input signal from a field source. The detection circuit includes a voltage detection circuit and a current detection circuit configured to detect a voltage signal and a current signal, respectively associated with the field input signal. The control circuit is configured to trigger a selection of one of the voltage detection circuit and the current detection circuit based on a detection of a signal magnitude of one of the voltage signal and the current signal relative to at least a first predetermined threshold level, wherein the selection of one of the voltage detection circuit and the current detection circuit facilitates a demodulation of one of the voltage signal and the current signal.

Abstract: A ping pong comparator voltage monitoring circuit which includes first and second comparators having inputs connected to a voltage Vin to be monitored, and second inputs connected to first and second nodes, respectively. A multiplexer alternately couples the first and second comparator outputs to an output in response to a periodic control signal. A ground-referenced voltage Vref1 is provided at a third node and a voltage Vref2 referenced to Vref1 is at a fourth node. A hysteresis hyst1 is switchably connected between the third and first nodes, and a hysteresis hyst2 is switchably connected between the fourth and second nodes. Hyst1 and hyst2 are switched in when the mux output toggles due to a rising Vin, and are switched out when the mux output toggles due to a falling Vin.

Abstract: A buffer circuit includes a first current mirror circuit, a second current mirror circuit, a first transistor, and a second transistor. The first current mirror circuit passes a first mirror current through a second node, corresponding to a first current passed through a first node, and is activated based on a first activating signal. The second current mirror circuit is connected to the first node and the second node, passes a second mirror current through the second node, corresponding to a second current passed through the first node, and is activated based on a second activating signal. The first transistor has a gate to which a reference voltage is applied and has a drain connected to the first node. The second transistor has a gate to which an input voltage is applied and has a drain connected to the second node.

Abstract: Disclosed is a low voltage detection circuit. The low voltage detection circuit includes, a voltage comparison circuit, an output stage, an electric current circuit, and a judgment circuit. When the voltage comparison circuit detects that the voltage of the detection target is a predetermined voltage value or less, an output state of the output stage is promptly changed. When the voltage comparison circuit detects that the voltage of the detection target is a predetermined voltage value or more, the output state of the output stage is changed after a delay time obtained by the electric current circuit.

Abstract: In one embodiment, an integrated circuit includes a pin and a current source for driving current through the pin into an external resistor such as a resistor on a circuit board to generate a pin voltage. The integrated circuit includes an analog-to-digital converter for converting the pin voltage into a digital value, such as an address for the integrated circuit.

Abstract: According to one embodiment, a peak detector having extended dynamic range comprises a first differential output coupled to a supply voltage of the peak detector by a first load and coupled to ground by first and second switching devices, and a second differential output coupled to the supply voltage by a second load and coupled to ground by third and fourth switching devices. The control terminals of the first, second, third, and fourth switching devices receive a common bias voltage, and the respective first and second control terminals are configured as differential inputs of the peak detector. In some embodiments, corresponding first power terminals of the first and second switching devices share a first common node further shared by the first differential output, and corresponding first power terminals of the third and fourth switching devices share a second common node further shared by the second differential output.

Abstract: A constant current source circuit includes one end connected to a second node as sources of third and fourth transistors, and the other end connected to a second power supply node that supplies a second voltage different from a first voltage. The clamp circuit is configured to form a current path between the second node and the second power supply node. It adjusts the potential of the second node to a certain potential when a first external input signal is switched from a first state to a second state.

Abstract: Power monitoring circuitry is provided, comprising a capacitor configured to receive a current, so as to charge the capacitor and a switching device, connected to the capacitor. The switching device is configured to periodically discharge the capacitor in response to receipt of a clock signal from a circuit being monitored. The power monitoring circuitry also comprises a comparator, configured to perform a comparison of a voltage developed by the capacitor with a threshold voltage, and to output an indication of a change in power supplied to the circuit in response to the comparison. Other embodiments are also described.

Abstract: A semiconductor device comprising a first inverter circuit including a first PMOS transistor and a first NMOS transistor, a drain electrode of the first PMOS transistor coupled to a drain electrode of the first NMOS transistor, and a second inverter circuit including a second PMOS transistor and a second NMOS transistor, a drain electrode of the second PMOS transistor coupled to a drain electrode of the second NMOS transistor. A first output voltage pad coupled to gate electrodes of the first and second PMOS and NMOS transistors, and between the drain electrode of the first PMOS transistor and the drain electrode of the NMOS transistor to self-bias the first inverter circuit. A second output voltage pad coupled between the drain electrode of the second PMOS transistor and the drain electrode of the second NMOS transistor.

Abstract: A comparator circuit, includes a first power source terminal having a first potential, a second power source terminal having a second potential different from the first potential, a detection voltage terminal, a reference voltage generator coupled between the first power source terminal and the second power source terminal, the reference voltage generator generating a middle potential which is a potential between the first potential and the second potential and outputting the middle potential at a middle potential node, the reference voltage generator further generating a reference voltage, a bias unit coupled between the first power source terminal and the middle potential node, the bias unit receiving the reference voltage and generating a corresponding reference voltage by using the first potential and the middle potential as energy sources thereof, and a comparator unit coupled between the first and second power source terminals and the detection voltage terminal.

Abstract: A method of monitoring supply voltage includes providing a single reference voltage, providing a single ratioed supply voltage, comparing the reference voltage to the ratioed supply voltage to provide an output signal, wherein the output signal comprises a first logic value in first and second operating conditions, and a second logic value in a third operating condition, wherein the first, second, and third operating conditions are determined by two crossing points of the reference voltage and ratioed supply voltage characteristics. The first and second operating conditions can represent undervoltage and overvoltage conditions, and the third operating condition can represent a normal operating condition. The reference voltage can be provided by a bandgap reference circuit.

Abstract: A solid-state imaging apparatus includes: an amplifier circuit configured to amplify a signal from pixel; and a reference signal generating circuit configured to generate a ramp signal, wherein feedback capacitor elements having the same structure are electrically connected to a capacitive feedback type amplifier of the amplifier circuit and to a capacitive feedback type amplifier of the reference signal generating circuit respectively, and a connecting configuration between an amplifier of the amplifier circuit and the feedback capacitor element and a connecting configuration between an amplifier of the reference signal generating circuit and the feedback capacitor element are the same.

Abstract: A power-on reset circuit is disclosed. The power-on reset circuit includes a first resistor; a first transistor, including a first terminal coupled to a second terminal of the first resistor, and a control terminal for receiving a reference voltage; a second resistor, including a first terminal coupled to a second terminal of the first transistor; a second transistor, including a first terminal coupled to a second terminal of the first resistor, and a control terminal coupled to a second terminal of the second transistor and utilized for receiving an input voltage; and a comparator, including a first input terminal for receiving a comparison voltage, and a second input terminal for receiving the reference voltage, for generating a power-on reset signal according to the comparison voltage and the reference voltage.

Abstract: A semiconductor apparatus may comprise: a first chip ID generation unit configured to receive an enable signal through a first through-silicon via and a clock signal through a second through-silicon via and generate a first chip ID signal and a delayed enable signal; a second chip ID generation unit configured to receive the delayed enable signal through a third through-silicon via from the first chip ID generation unit and the clock signal and generate a second chip ID signal; a first chip selection signal generation unit configured to receive the first chip ID signal and a main ID signal and generate a first chip selection signal; and a second chip selection signal generation unit configured to receive the second chip ID signal and the main ID signal and generate a second chip selection signal.

Abstract: There are provided a signal detection circuit and an igniter capable of enhancing a capability of withstanding breakdown by noise. The signal detection circuit includes an input terminal Sin configured to receive a control signal from an ECU and a bidirectional floating diode provided between the input terminal and a ground. Further, the signal detection circuit includes an attenuation circuit configured to attenuate an output of the bidirectional floating diode, a low-pass filter configured to pass a low-frequency component of the output of the attenuation circuit, and a comparator configured to compare an output of the low-pass filter with a reference voltage.

Abstract: A voltage change detection device is provided, which can reduce a deviation of a detection potential and can detect a voltage change within a predetermined detection potential even when the threshold voltage of a field effect transistor is deviated. The voltage change detection device includes a first field effect transistor, a second field effect transistor, and a detection signal generator. The first field effect transistor has a drain connected to a power supply potential, a source connected to a first constant current source or a first resistor at a first node, and a gate connected to a fixed voltage. The second field effect transistor has a drain and a gate connected to the power supply potential and a source connected to a second constant current source or a second resistor at a second node.

Abstract: In accordance with various embodiments, a circuit is provided, including an output node, a first potential varying stage, which is designed to couple the output node to a supply potential in reaction to an input signal, and a second potential varying stage, which is designed to couple the output node to the supply potential if the difference between the potential of the output node and the supply potential lies below a predefined threshold value.

Abstract: A relaxation oscillator has a comparator that includes first through third bias current transistors coupled to a first supply rail. First and second input transistors form a pair of parallel coupled transistors connected to the first bias current transistor. A first current mirror control transistor connects the first input transistor to a second supply rail. A first current mirror output transistor is coupled to the first current mirror control transistor, and connects the second bias current transistor to the second supply rail. A second current mirror control transistor connects the second input transistor to the second supply rail. A second current mirror output transistor is coupled to the second current mirror control transistor, and connects the third bias current transistor to the second supply rail. A transition time reduction transistor, coupled across the third bias current transistor, is coupled to the second bias current transistor, and provides a comparator output.

Abstract: A data persistence control apparatus for an RFID tag is provided. The apparatus includes a capacitor to be charged, a charge circuit to charge the capacitor, a discharge circuit to discharge the capacitor, a switch switched on to electrically connect the charge circuit to the capacitor or the discharge circuit to the capacitor, and an output circuit to output a logic high signal or a logic low signal according to an input voltage determined based on a discharged degree of the capacitor.

Abstract: A high speed signal detecting circuit includes an input terminal, a reference terminal, an output terminal, a power source terminal, a ground terminal, a front-end receiver which is connected to the input terminal, the reference terminal and the ground terminal, a secondary amplifier which is connected to the front-end receiver and the ground terminal, a final amplifier which is connected to the secondary receiver, the output terminal, the power source terminal and the ground terminal, and a biasing circuit which is connected to the front-end receiver, the secondary amplifier, the final amplifier, the power source terminal and the ground terminal. A high speed signal detecting method is also provided to precisely detect high speed signal and change a detection threshold value of the high speed signals by changing a voltage value of the reference terminal and thus has a great flexibility.

Abstract: Embodiments related to an undervoltage detector are described and depicted. An undervoltage detector is formed to detect a low input bias voltage with a voltage divider network including first and second series circuits of semiconductor devices coupled to terminals of the input bias voltage source, and a resistor voltage divider including first and second voltage divider resistors coupled in series with the first and second series circuits. A ratio representing the numbers of semiconductor devices in the series circuits is substantially equal to a ratio of resistances in the resistor voltage divider. The equality of the ratios may be corrected by the presence of other resistances in the undervoltage detector. The semiconductor devices are each coupled in a diode configuration. The first series circuit is coupled to a current mirror to provide a bias current for a comparator that produces an output signal for the undervoltage detector.

Abstract: An impedance control circuit includes a first impedance unit configured to terminate an impedance node using an impedance value that is determined by an impedance control code, a second impedance unit configured to terminate the impedance node using an impedance value that is determined by an impedance control voltage, a comparison circuit configured to compare a voltage level of the impedance node and a voltage level of a reference voltage, generate an up/down signal indicating whether the voltage at the impedance node is greater than the reference voltage, and generate the impedance control voltage that has a voltage level corresponding to a difference between the voltage at the impedance node and the reference voltage, and a counter unit configured to increase or decrease a value of the impedance control code in response to the up/down signal.

Abstract: The high-side switch circuit includes a first output MOS transistor that is connected, at a first end thereof, to a power supply terminal. The high-side switch circuit includes a second output MOS transistor that is connected to a second end of the first output MOS transistor at a first end thereof and to a voltage output terminal at a second end thereof. The high-side switch circuit includes a current detecting circuit that detects a current flowing through the first output MOS transistor and outputs a detection signal. The high-side switch circuit includes a first gate driver that applies a first control voltage to a gate of the first output MOS transistor. The high-side switch circuit includes a second gate driver that applies a second control voltage to a gate of the second output MOS transistor.

Abstract: A comparator circuit can achieve a reduction in current consumption with a simple configuration, and can suppress an increase in current consumption accompanying a rise in power source voltage. A current mirror circuit is connected to a power source, and gates of MOSFETs of the circuit are interconnected. An input signal is applied to a gate of an NMOSFET of the circuit. By determining the value of the signal with a constant voltage device, the voltage across a tail resistor is constant, even in the event that the power source voltage and the input signal change.

Abstract: A power-up signal generation circuit includes: a first section signal generation unit configured to sense a level of an external voltage and a level of an internal voltage and generate a first section signal; a second section signal generation unit configured to output a second section signal by buffering the first section signal when the internal voltage is lowered to below a minimum level; and a selective output unit configured to output the first section signal as a power-up signal, wherein the selective output unit outputs the second section signal as the power-up signal when a power-up section is ended and a mode register setting operation is performed.

Abstract: A comparator is disclosed. The comparator includes a mirror circuit that is electrically coupled to a first voltage source and a second voltage source. The first voltage source produces a first voltage and the second voltage source produces a second voltage. The comparator also includes a first positive metal oxide semiconductor (PMOS) transistor electrically coupled to the first voltage source and an output terminal. The first PMOS transistor is biased by the mirror circuit. The comparator also includes a first negative metal oxide semiconductor (NMOS) that is electrically coupled to a ground terminal and the output terminal. The first NMOS transistor is also biased by the mirror circuit. An electrical current flowing across the first NMOS transistor is mirrored from an electrical current flowing through the first PMOS transistor. A method to operate the comparator and a comparator system is also disclosed.

Abstract: A bridge integrated circuit adapted for being coupled between a gate driver and a tester is provided. The bridge integrated circuit comprises a plurality of first detection units and a logic unit. Each first detection unit determines whether a corresponding gate driving signal satisfies a first standard according to one of the gate driving signals provided by the gate driver and accordingly generates a first detection signal according to the determination result. The logic unit is coupled to the first detection units and generates a test result signal in response to the first detection signal provided by each first detection unit. The test result signal is adapted for the tester.

Abstract: A detector circuit, has a first diode, to an anode of which an AC signal is input and to which a constant voltage is supplied, a second diode, to an anode of which the constant voltage is supplied, and a difference current generation circuit, which generates the difference current between a first current flowing in the first diode and a second current flowing in the second diode.