Abstract: A linearity enhancement circuit is disclosed which includes: a first shift amount creation block creating a first shift amount in keeping with the immediately preceding output code of an n-bit A/D converter; a first shifter circuit bit-shifting input code data by the first shift amount that has been supplied, the first shifter circuit further outputting the bit-shifted input code data; a register storing the output of the first shifter circuit in order to output the stored data as the input code data to the first shifter circuit thereby forming a loop circuit in conjunction with the first shifter circuit, the register further outputting the stored code data as a second shift amount; and a second shifter circuit bit-shifting the output code of the A/D converter by the second shift amount that has been supplied, the second shifter circuit further outputting the bit-shifted output code to an n-bit D/A converter.

Abstract: Provided is an analog digital converting device which consumes a low power and guarantees fast operation characteristic. The analog digital converting device includes a sub-ADC and a successive approximation ADC. The sub-ADC converts an external analog signal into a first digital signal by using first and second reference voltages. The successive approximation ADC comprises a plurality of bit streams, and converts the external analog signal into a second digital signal according to a successive approximation operation using the first and second reference voltages. The successive approximation ADC receives the first digital signal, and converts the second digital signal in a state where one of the first and second reference voltages has been applied to the bit streams based on the first digital signal.

Abstract: One embodiment of the present invention includes an analog-to-digital converter (ADC) system. The system includes an ADC configured to generate digital samples that are digital versions of at least one analog signal at a sampling frequency and a memory configured to store data corresponding to an average value of the digital samples in at least one register. The system further includes a processor configured to access the data corresponding to the average value for processing at an access frequency that is less than the sampling frequency.

Abstract: An inter-stage gain of a conversion stage of a pipeline ADC is calibrated by imposing a perturbation to a sub-ADC within the conversion stage and adjusting a gain factor in a closed loop manner so as to make a conversion output substantially independent of the perturbation.

Abstract: A solid-state image sensor includes a pixel array, and an analog to digital converter for converting a voltage signal read from the pixel array from analog to digital form, wherein the analog to digital converter includes a counter counting a first clock signal for a period depending on a voltage value of the voltage signal, and wherein a least significant bit of a count value of the counter is determined based on an exclusive OR of outputs of two 1-bit counters operating at a frequency of the first clock signal.

Abstract: An attenuator circuit includes a high-frequency circuit path to produce an attenuated first signal; a low-frequency circuit path to produce an attenuated second signal, where the attenuated first signal has a higher frequency than the attenuated second signal; and a transistor that includes a control input. The control input is configured to receive the attenuated second signal to bias the transistor for passage of the attenuated first signal and the attenuated second signal.

Abstract: A folding analog-to-digital converter (ADC) is disclosed. The folding ADC includes a reference voltage generating unit generating a plurality of reference voltages, a low power analog pre-processing unit including a plurality of folders, each of which compares a voltage level of an analog input signal with a corresponding reference voltage of the plurality of reference voltages to generate a pair of differential folded outputs, a comparison unit that compares outputs of the low power analog pre-processing unit to output a digital signal, and an encoding unit that converts an output of the comparison unit into a binary code signal.

Abstract: Systems, methods, and devices for obtaining data from a data location. The method may include generating a first value by sensing a data location under a first condition and generating a second value by sensing the data location under a second condition. The method may further include combining the first value with the second value to identify data conveyed by the data location.

Abstract: A D/A conversion circuit in accordance with the present invention, which is provided with a switch swD, allows a writing operation of a voltage (a true gradation voltage) to be performed at a higher speed by first applying a first voltage (a voltage close to the true gradation voltage), which is supplied without passing through a resistor element, to an output line and then applying a second voltage (the true gradation voltage), which is supplied via the resistor element, to the output line. Thus, the present invention can provide a D/A conversion circuit capable of writing display data to liquid crystal cells with higher precision at higher speed, and a semiconductor device utilizing such a D/A conversion circuit.

Abstract: Various implementations relating to analog-to-digital converters are provided. A comparator of such a circuit is used for converting different analog input signals, while analog-to-digital conversion circuitry for these conversions is implemented at least partially separately. In other implementations, a comparator is used both for analog-to-digital conversion and for comparing an input signal to a constant or non-constant value.

Abstract: First and second track and hold stages track and store an input voltage for a sample of an analog input signal. A coarse reference ladder provides a plurality of coarse references. In one embodiment, the coarse reference ladder includes a first coarse reference and a second coarse reference ladder. A coarse ADC performs a first comparison of the input voltage and the plurality of coarse references and outputs a coarse output based on the first comparison. A switch matrix includes a plurality of switches and is configured to close a switch corresponding to a coarse reference based on the coarse output. A fine reference ladder provides a plurality of fine references. A fine ADC performs a second comparison of the input voltage and the plurality of fine references and outputs a fine output based on the second comparison. Logic outputs a digital output for the sample of the analog input signal based on the coarse output and the fine output.

Abstract: Various embodiments are disclosed relating to techniques of filtering and down-converting a received signal. In accordance with an example embodiment of the present invention, an analog signal may be received and amplified in a transconductance amplifier. The amplified signal may be connected to a switching arrangement and an impedance circuit connected in series, and frequency down-converted in a second circuit. The resulting analog base band signal may be fed back to a base band input between the switching arrangement and the impedance circuit.

Abstract: A coarse reference ladder provides a plurality of coarse references. A coarse ADC receives an input voltage. The coarse ADC performs a first comparison of the input voltage and the plurality of coarse references and outputs a coarse output. A switch matrix is configured to close a switch based on the coarse output. An input line corresponding to a coarse reference is coupled to the switch matrix. The input line is precharged to the input voltage. The input line settles from the precharged input voltage to the coarse reference. A fine reference ladder provides a plurality of fine references based on the coarse reference. A fine ADC receives the input voltage and performs a second comparison of the input voltage and the plurality of fine references and outputs a fine output. Logic outputs a digital output for the input voltage based on the coarse output and the fine output.

Abstract: One embodiment of an apparatus for generating a time stamp includes a clock input, an event signal input and a time stamp output. A DLL is connected to the clock input, with a plurality of delay elements inside the DLL. An output of each of the delay elements is connected to a data input on a latch. An event signal input is connected to an enable input on each of the latches. An output of each of the latches is connected to the time stamp output. The apparatus is adapted to produce a value on the time stamp output indicating a point at which the event signal input transitions between transitions on the clock input.

Abstract: An A/D converter device is provided, which has a D/A conversion function and changes a resolution of A/D conversion and D/A conversion. The A/D converter device is configured to selectively execute an A/D conversion operation and a D/A conversion operation, by the operation of a control circuit controlling switching of switches according to an ADC/DAC function switching signal supplied from an external side. The A/D conversion operation performs A/D conversion of an input signal voltage inputted via a signal input terminal from an external side and outputs an A/D conversion value of 12 bits. The D/A conversion operation outputs, via a signal output terminal, an analog voltage produced by performing D/A conversion of a digital value supplied from the external side.

Abstract: According to embodiments of the present technique, a system and a method for obtaining low-noise measurements for a wide range of analog signal strengths is provided. According to aspects of the present technique, a low-gain measurement of an input pixel charge is performed, wherein the input pixel charge is distributed to two feedback capacitors, which together provide a relatively low integrator gain. After the low-gain measurement, a high-gain measurement is performed, wherein one of the capacitors is remove from the feedback loop and the charge is redistributed to the remaining capacitor.

Abstract: A circuit and method for providing a digital output indicative of the time at which an event occurred is disclosed. In one aspect, the circuit includes a fine timing circuit configured to determine in which sub-interval of a clock period the event occurred, and a correction circuit configured to correct an erroneous offset between a first and second clock signals in the fine timing circuit. The correction circuit includes a synch circuit configured to determine in which half of the clock period the event occurred so as to correct for erroneous offset in the fine timing circuit.

Abstract: A solid-state imaging device includes pixels, arranged in a matrix, each of which converts light into a signal voltage. The solid-state imaging device also includes column signal lines, each of which is provided for corresponding one of columns, so that the signal voltage is provided to corresponding one of the column signal lines. Additionally, the solid-state imaging device includes AD converting units, each of which is provided for the corresponding one of the column signal lines, and is configured to convert the signal voltage into a digital signal. Each of the AD converting units includes a comparing unit generating an output signal indicating a greater voltage of the signal voltage and a reference voltage, and a counting unit counting a count value until logic of the output signal is inverted The solid-state imaging device further includes a suspending unit suspending power supply to the comparing units after the logic of the output signals is inverted.

Abstract: An ADC includes: a single circuit capable of generating reference voltages that are constant and then decreasing over time, according to discrete values, including: a constant current source; a resistive bridge connected to the current source, the voltages of the bridge forming the reference voltages; a voltage source capable of producing a decreasing voltage on a node of the bridge; contact breaker for the connection of the voltage source to said node, a circuit including: means for comparing a voltage for conversion with the reference voltages; means for selecting the reference voltage whereof the value, when it is constant, is immediately higher than the voltage for conversion; means for counting a number of time units necessary for the reference voltage selected to become lower than the voltage for conversion during the decrease thereof; and means for storing, on the one hand a reference associated with the constant reference voltage which is immediately lower than or equal to the voltage for conversi

Abstract: A signal processing device, even when a steep difference in DC level is included in a signal read from a disc such as a DVD-RAM format, cuts off the DC level and pulls the read signal into an appropriate A/D input level. A steep difference in DC level between a data section and a CAPA section is absorbed by a first offset unit, and an asymmetry which occurs due to variations in the disc manufacturing stage is corrected by a second offset unit. Further, a control signal for operating the two offset units exclusively is generated by a controller, thereby controlling both offset units.

Abstract: An integrated circuit has a single input pin for determining a value associated with a resistor divider. First circuitry determines a resistor ratio of the resistor divider through the single input pin. A first register stores a first group of bits representing the resistor ratio. The first group of bits represents the least significant bits of the value. Second circuitry determines an equivalent resistance of the resistor divider through the single input pin. A second register stores a second group of bits representing the equivalent resistance.

Abstract: An analog to digital converter includes: a reference circuit adapted to generate reference voltages; differential amplifiers; normal phase circuits each of which samples a normal phase analog input signal and transfers a comparison voltage, obtained by comparison with a reference voltage generated by the reference circuit, to a first input terminal of one of the differential amplifiers when the input is differential and single-ended; and reversed phase circuits each of which samples a reversed phase analog input signal and transfers a comparison voltage, obtained by comparison with a reference voltage generated by the reference circuit, to a second input terminal of one of the differential amplifiers when the input is differential and which samples a ground level as a reference voltage of the reference circuit and supplies the reference voltage and comparison voltage to the second input terminal of the differential amplifier when the input is single-ended.

Abstract: A DA conversion device includes the following elements. A higher-bit current source cell portion includes uniformly weighted higher-bit current source cells to generate an identical constant current. A lower-bit current source cell portion includes a lower-bit current source cells that are weighted to generate 1/two-to-the-power-of-certain-numbers constant currents. A constant current source selection controller includes a lower-bit controller having a scaler that uses clocks scaled down to 1/two-to-the-power-of-certain-numbers to select the lower-bit current source cells, and a higher-bit controller having shift registers and using a signal indicating a carry bit or a borrow bit used in the lower-bit controller to sequentially activate shift outputs of the shift registers, and uses the shift outputs to select the higher-bit current source cells. Constant current outputs of the selected current source cells are added and output so that an output current corresponding to the digital input signal is obtained.

Abstract: A system for converting an analog signal to a digital codeword having N bit positions that includes a dual DAC structure having a small DAC and a large DAC. At least one comparator is coupled to the small DAC and large DAC. The small DAC performs bit trials to calculate bit positions 1 to M, and the large DAC with performs bit trial calculates bit positions M+1 to N after having been set with bit decisions from the bit trials of the small DAC.

Abstract: There are provided an analog-digital converter circuit capable of performing the same degree of operation as being performed at a high-frequency oscillation pulse using a low-frequency oscillation pulse without using the high-frequency oscillation pulse, a timing signal generating circuit generating a timing signal at the high frequency, and a control device using the circuits. In an analog-digital converter circuit, a periodic signal generating circuit allows the first to j-th pulse counting devices of the N pulse counting devices to count a count value X and allows the other pulse counting devices to count a count value X?1 in each sampling period by sequentially generating N serial periodic signals at a delay time interval of [approximate value of one period (T) of periodic signals]÷N. A digital signal generating circuit converts the analog signal to the digital signal.

Abstract: An apparatus for compensating for an error of a time-to-digital converter (TDC) is disclosed to receive a delay phase from a phase detector including the TDC and a phase error including a TDC error and compensate for the TDC error to have a time resolution higher by N times (N is a natural number). The apparatus includes: a fragmenting and multiplying unit fragmenting the delay phase by N times (N is a natural number) to generate first to (N?1)th fragmented delay phases; an adding unit adding each of the first to the (N?1)th fragmented delay phases to the phase error to generate first to (N?1)th phase errors; and a comparison unit acquiring a phase error compensation value nearest to an actual phase error from the phase error and the first to (N?1)th phase errors.

Abstract: An image sensor apparatus comprises an image sensor for generating digital images having a high dynamic range. The image sensor apparatus includes an image sensor for generating a first and a second set of digital image samples at a first bit depth, with each set of digital image samples generated by a different column readout circuit path. A processor combines the first and second set of digital image samples to generate a digital image at a second bit depth, the second bit depth higher than the first bit depth.

Abstract: An amplifier for amplifying a pulse-like signal output from a secondary side of an isolating transformer, a capacitor connected to a negative feedback loop across the input and output of the amplifier, and a timing control circuit for controlling an FET into a closed state, then controlling a switch into a closed state, and after that controlling the switch into an open state at timing simultaneously with the FET or earlier than the FET are provided, and when the switch is controlled into the open state, an AD converter converts the output signal of the amplifier to a digital signal.

Abstract: A folding analog-to-digital converter (ADC) is disclosed. The folding ADC includes a reference voltage generating unit generating a plurality of reference voltages, a low power analog pre-processing unit including a plurality of folders, each of which compares a voltage level of an analog input signal with a corresponding reference voltage of the plurality of reference voltages to generate a pair of differential folded outputs, a comparison unit that compares outputs of the low power analog pre-processing unit to output a digital signal, and an encoding unit that converts an output of the comparison unit into a binary code signal.

Abstract: An analog-to-digital conversion system includes an analog-to-digital converter (ADC), a plurality of receivers, each for capturing input analog signals, a multiplexer having inputs coupled to each of the receivers and an output coupled to the ADC, the multiplexer establishing a signal path between a selected one of the inputs and the output in response to an index signal, and a mux controller to supply a random sequence of index signals to the multiplexer.

Abstract: A method of analog-to-digital conversion over n bits of an analog signal, including the steps of: comparing the amplitude of the analog signal with a threshold representing the amplitude of the full-scale analog signal divided by 2k, where k is an integer smaller than n; performing an analog-to-digital conversion of the analog signal over n?k bits to obtain the n?k most significant bits of a binary word over n bits if the result of the comparison step indicates that the amplitude of the input signal is greater than the threshold, and the n?k least significant bits of this binary word otherwise. An analog-to-digital converter and its application to image sensors.

Abstract: An analog-digital converter according to the present invention includes an input polarity switching unit, an integrator that integrates an input signal, an integrator output adjusting circuit that adjusts an output voltage of the integrator, a window comparator, and a controller that controls the input polarity switching unit, the integrator output adjusting circuit, and the window comparator, and generates a digital signal. When the output voltage of the integrator reaches a first reference voltage, the controller resets reference voltage of a high-voltage side comparator to a second reference voltage. Further, when the output voltage of the integrator reaches a third reference voltage, the controller resets reference voltage of a low-voltage side comparator to a fourth reference voltage. According to the analog-digital converter of the present invention, it is possible to prevent device breakdown and occurrence of through current due to fluctuation of the output voltage of the integrator.

Abstract: Methods, and other embodiments associated with signal filtering are described. According to one embodiment, an apparatus includes an analog-to-digital converter that generates a first digital component and a second digital component from an analog signal. A filter filters the first digital component and the second digital component to substantially align the phase of the first digital component and the phase of the second digital component.

Abstract: There is provided a solid-state image sensing device including a pixel section in which cells are arrayed, each cell including a photoelectric conversion unit, a reading circuit reading out, to a detection unit, signal charges obtained by the photoelectric conversion unit, an amplifying circuit amplifying and outputting a voltage corresponding to the signal charges, and a reset circuit resetting the signal charges, an exposure time control circuit controlling an exposure time and controlling the exposure time to be equal for all cells, an A/D conversion circuit A/D-converting a signal output from the pixel section by changing a resolution of a signal level, line memories storing an A/D-converted signal, and a signal processing circuit processing output signals from the line memories to have a linear gradient with respect to an optical input signal amount by controlling an amplification factor in accordance with a resolution of a pixel output signal after A/D-conversion.

Abstract: A time-interleaved (TI) analog-to-digital converter (ADC) is provided. The TI ADC generally comprises a clock generator, two or more ADCs, adjustable delay elements, and an estimator. The clock generator generates clock signals. Each ADC is associated with at least one of the clock signals so as to sample an input signal that is generally wide-sense stationary at sampling instants, where correlation function exist between samples from a two or more of the ADCs that is a function of the time differences between associated sampling instants. The estimator is coupled to each of the adjustable delay elements and each of the ADCs so as to calculate the correlation function and adjust the adjustable delay elements to account for sampling mismatch between the ADCs based at least in part on the correlation function.

Abstract: An analog-to-digital converter circuit includes: a plurality of sample-and-hold circuits configured to sample an analog signal; an analog-to-digital converter configured to convert the analog signal held by each of the plurality of sample-and-hold circuits into a digital signal; and a control circuit configured to output a control signal, wherein a pair of sample-and-hold circuits among the plurality of sample-and-hold circuits sample an analog signal in a first period and hold an analog signal sampled by another pair of sample-and-hold circuits in a second period prior to the first period based on the control signal.

Abstract: A circuit configuration for obtaining a binary output signal from a current signal delivered by a magnetic-field sensor comprises a magnetic-field sensor, a voltage-supply unit, a measuring device, a signal-conditioning stage, a control stage, wherein the signal values represent the two current values of the current signal, alternating in pulse shape, as supplied by the magnetic-field sensor, for supplying the currently obtained first and second signal values to a memory device after every pulse-shaped change in the current signal and for identifying a digital changeover-threshold signal in accordance with a first algorithm from the real-time first and second signal values, the memory device for storing the currently obtained first and second signal values, a digital/analogue converter stage, and a comparator.

Abstract: An analog to digital converter, comprising a first converter adapted to perform a first, more significant, part of a conversion as a successive approximation conversion, a pipeline conversion or a flash conversion to generate a first conversion result and a residue. The ADC also comprising a second converter adapted to perform a second, least significant, part of the conversion as a sigma-delta conversion by sampling the residue to generate a second conversion result, and a processor adapted to combine the first conversion result and the second conversion result to generate a final conversion result.

Abstract: An improved (N:K) multiple description binning encoder that employs binning yet permits recovery of the input signal when fewer than K of the descriptions are available. In creating the encoder, a first choice is made of the number of descriptions that the encoder is to create and the minimum number of descriptions below which full recovery of the input signal is not possible. A second choice is made as to the number of descriptions that are to be broken up, to form descriptions that have two portions each. Once the first choice is made, appropriate quantization and binning scheme are selected by employing conventional techniques, and in response to the second choice, the chosen number of descriptions are each quantization split into coarse and fine quantization arrangements.

Abstract: A continuous-time sigma-delta analog-to-digital converter (CV) including i) a signal path (SP) having at least one combiner (C1) for combining analog signals to convert with feedback analog signals, at least two integrators (H1, H5), mounted in series, to integrate the combined analog signals, a quantizer (Q) for converting the integrated signals into digital signals, and a decimation filter (DF) for filtering digital signals, and ii) a feedback path (FP) having at least a digital-to-analog converter (DAC) for converting the digital signals output by the quantizer (Q) into feedback analog signals intended for the combiner (C1). Each integrator (H1, H5) having variable capacitance means arranged to be set in chosen states defined by the values of a digital word, to present the chosen capacitances.

Abstract: An analog-to-digital converter includes a higher-order analog-to-digital converter that outputs a higher-order digital value, a first lower-order converter that converts a first residual signal into a first lower-order digital value, a second lower-order converter that converts a second residual signal into a second lower-order digital value, a calibrator that outputs first and second offset adjustment signals for respectively designating offset adjustment amounts in reversed polarity based on a difference between the first and second lower-order digital values, wherein the first and second lower-order converters set a conversion calibration value based on the first and second offset adjustment signals and calibrate the first and second lower-order digital values based on the conversion calibration value.

Abstract: The analog-to-digital converter comprises a first stage in which a voltage to be converted is applied to the input of a first comparator. The first comparator delivers a first digital result representative of the comparison between the voltage to be converted and the reference voltage on a first digital output. The first digital output is connected to means for calculating a first intermediate voltage. A second comparator compares the first intermediate voltage with the reference voltage and delivers a second digital result on a second digital output terminal. The digital output terminal is connected to second means for calculating a residual voltage according to the voltage to be converted, the first and second voltages and the first and second digital results.

Abstract: A circuit for converting a charge signal into a binary format of output bits comprises: an integration circuit including an operational transconductance amplifier having an inverting input terminal and an output terminal, an integrating capacitor connected between the inverting input terminal and the output terminal, the integrating capacitor for storing a charge input selectively provided by a sensor diode; and a folding circuit having a fold capacitor, the fold capacitor switchably coupled either to a fold voltage source via a fold buffer for charging the fold capacitor to a predetermined fold charge value, or to the integrating capacitor for selectively removing at least a portion of the stored charge input.

Abstract: An AD converter includes a first amplitude circuit, a second amplitude circuit, and a determination circuit. A control signal line controls a first amplitude gain of the first amplitude circuit and a second amplitude gain of the second amplitude circuit.

Abstract: An integrated circuit comprises a threshold generation circuitry for generating at least one differential voltage signal. The threshold generation circuitry comprises at least one common mode current generation circuit arranged to generate at least one common mode current signal, whereby said at least one common mode current signal is combined with at least one input current signal to produce a combined current signal comprising a combined signal common mode component. Conversion circuitry is arranged to receive the combined current signal and convert the combined current signal into the at least one differential voltage signal for use within the comparator circuit. The threshold generation circuitry further comprises feedback circuitry arranged to receive an indication of the combined signal common mode component, compare the received indication to a reference value, and regulate the at least one common mode current signal based at least partly on the comparison results.

Abstract: An analog to digital converter comprising an Nth analog to digital converter and an N+1th analog to digital converter arranged in series such that a residue signal from the Nth analog to digital converter is provided as an input to the N+1th analog to digital converter, characterized in that a bandwidth control means is provided in a signal path for the residue signal and the bandwidth control means is controlled so as to have a first bandwidth during a first period following generation of a conversion result from the Nth analog to digital converter, and a second bandwidth less than the first bandwidth in a second period following the first period.

Abstract: A hybrid coarse-fine time-to-digital converter is disclosed. The hybrid coarse-fine time-to-digital converter is configured to receive a first input signal and a second input signal and to generate a digital output that corresponds to the time difference of between a rising edge of the first input signal and a rising edge of the second input signal. The hybrid coarse-fine time-to-digital converter comprises a coarse time-to-digital converter, a fine time-to-digital converter, and a correlated output generator.

Abstract: An Analog-to-Digital Converter (ADC) includes analog to digital conversion circuitry configured to receive an analog signal and output a digital representation of the analog signal on a plurality of data lines; a balancing circuit configured to encode the digital representation of the analog signal on the data lines such that a total number of 1's and 0's transmitted on any given data line is the same.

Abstract: The configuration of a successive approximation analog to digital converter (ADC) and a method thereof are provided in the present invention. The proposed configuration includes a comparator having an inverting input terminal, a non-inverting input terminal and an output terminal outputting a comparison result, a most significant bit ADC coupled to the non-inverting input terminal, and a least significant bit ADC coupled to the inverting input terminal.

Abstract: A novel analog-to-digital converter (ADC) architecture using subranging successive approximation approach is disclosed. The ADC architecture is capable of achieving high sampling rate, low power consumption and low complexity. It is also able to advance the chip production yield and area utilization ratio. The new proposed ADC is formed by combining a flash converter having high sampling rate and low resolution with a successive approximation converter having low power consumption and low sampling rate.