Standard Patents (Class 356/243.1)
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Patent number: 11892742Abstract: The present invention discloses a method for calibrating controllable phase shifters in a multi-stage staggered Mach-Zehnder interferometer structure on an optical chip, aiming to solve the problem of calibrating the controllable phase shifters in a configurable optical network of the multi-stage staggered Mach-Zehnder interferometers. The technical solution is to calibrate the controllable phase shifters that can be calibrated in the optical network; and then to constitute calibration conditions for and calibrate inner phase shifters that has not been; and finally to constitute calibration conditions for and calibrate outer phase shifters that is not calibrated.Type: GrantFiled: September 10, 2020Date of Patent: February 6, 2024Assignee: NATIONAL UNIVERSITY OF DEFENSE TECHNOLOGYInventors: Junjie Wu, Yang Wang, Xiaogang Qiang, Ping Xu, Jiangfang Ding, Mingtang Deng, Anqi Huang, Xiang Fu
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Patent number: 11860317Abstract: A method and a system for optically adjusting an image fusion LiDAR system are provided. The method includes: presetting initial positions of a first detector and a second detector; acquiring signal strengths of the echo signals emitted by diffuse reflection at different positions on a background wall detected by the first detector; determining a first mark position on the background wall according to the signal strengths of the echo signals; and adjusting at least one of a position or an attitude of the second detector according to an echo signal emitted by diffuse reflection at the first mark position, the first detector and the second detector being each a linear array detector.Type: GrantFiled: February 16, 2022Date of Patent: January 2, 2024Assignee: Tanway Technology (Beijing) Co., Ltd.Inventors: Feifei Shi, Shiwei Wang, Ruitong Zheng, Luofeng Shen
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Patent number: 11826919Abstract: A work coordinate generation device includes a shape register section configured to register shape information about a shape of a work region optically defined on a target which is a work target of a work robot; a first recognition section configured to acquire first image data; a first coordinate generation section configured to generate a first work coordinate which represents the work region of the first target based on a result of recognition of the first recognition section; a second recognition section configured to acquire second image data; and a second coordinate generation section configured to generate a second work coordinate which represents the work region of the second target based on the first work coordinate and a result of recognition of the second recognition section.Type: GrantFiled: January 30, 2019Date of Patent: November 28, 2023Assignee: FUJI CORPORATIONInventors: Anusuya Nallathambi, Hiroshi Oike, Hirotake Esaki, Takahiro Morikawa
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Patent number: 11759957Abstract: A system including a robot mean to move a member by using a first camera coupled to the robot, a second camera coupled to the robot, a control device configured to control position of the robot in order to minimize a pixel-wise distance between the member and a target based on alternating input from the first camera and the second camera.Type: GrantFiled: February 26, 2021Date of Patent: September 19, 2023Assignee: Hamilton Sundstrand CorporationInventors: Brigid A. Blakeslee, Edward Tunstel, Jr.
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Patent number: 11749571Abstract: In a method of inspection of a semiconductor substrate a first beam of light is split into two or more second beams of light. The two or more second beams of light are respectively transmitted onto a first set of two or more first locations on top of the semiconductor substrate. In response to the transmitted two or more second beams of light, two or more reflected beams of light from the first set of two or more first locations are received. The received two or more reflected beams of light are detected to generate two or more detected signals. The two or more detected signals are analyzed to determine whether a defect exists at the set of the two or more first locations.Type: GrantFiled: August 31, 2021Date of Patent: September 5, 2023Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.Inventors: Sheng He Huang, Chung-Pin Chou, Shiue-Ming Guo, Hsuan-Chia Kao, Yan-Cheng Chen, Sheng-Ching Kao, Jun Xiu Liu
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Patent number: 11735401Abstract: Embodiments disclosed herein include optical sensor systems and methods of using such systems. In an embodiment, the optical sensor system comprises a housing and an optical path through the housing. In an embodiment, the optical path comprises a first end and a second end. In an embodiment a reflector is at the first end of the optical path, and a lens is between the reflector and the second end of the optical path. In an embodiment, the optical sensor further comprises an opening through the housing between the lens and the reflector.Type: GrantFiled: September 3, 2021Date of Patent: August 22, 2023Assignee: Applied Materials, Inc.Inventors: Chuang-Chia Lin, Upendra Ummethala, Steven E. Babayan, Lei Lian
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Patent number: 11719828Abstract: Techniques disclosed herein are directed to detect the presence of false, incorrect, or spoofed Global Navigation Satellite Systems (GNSS) signals. Embodiments may comprise receiving, at a mobile device, a global navigation satellite system (GNSS) signal via a GNSS antenna of the mobile device; determining first movement data based on the GNSS signal; determining second movement data based on data from one or more motion sensors of the mobile device, wherein the first movement data and the second movement data each comprise respective movement-related information regarding the mobile device during a time period; and providing an indication that GNSS error is occurring based on a determination that a difference between first movement data and the second movement data exceeds a threshold.Type: GrantFiled: June 28, 2021Date of Patent: August 8, 2023Assignee: QUALCOMM IncorporatedInventors: David Tuck, James Stephen, Inchara Lakshminarayan
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Patent number: 11510353Abstract: A mounting accuracy measurement chip includes a chip main body; and one or more protrusions provided on a mounting face of the chip main body, which serve as a contact surface with a mounting target at a position shifted from the mounting face of the chip main body. The one or more protrusions are disposed only within a range defined by a circle whose center is center of gravity of the mounting face and whose radius is half the length of the longest distance from center of gravity to the outer edge of chip main body. Further, a mounting accuracy measurement kit includes the above-mentioned mounting accuracy measurement chip and placement portion, having a degree of adhesiveness, to which the contact surface of mounting accuracy measurement chip, which can be placed, adheres.Type: GrantFiled: February 12, 2018Date of Patent: November 22, 2022Assignee: FUJI CORPORATIONInventor: Yusuke Yamakage
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Patent number: 11499822Abstract: A calibration standard for geometry measurement calibration of a measurement system operating by tactile and/or optical means is provided which includes a flat surface having a structure that is capturable by a measurement system operating by optical and/or tactile means. The structure has a changeable periodicity that is capturable by a sensor in a first direction and/or in a second direction and for a change in the periodicity to code position information and/or direction information. In addition, a method for calibrating a coordinate measuring machine operating by tactile and/or optical means and to a coordinate measuring machine for such a method or having such a calibration standard is provided.Type: GrantFiled: March 26, 2021Date of Patent: November 15, 2022Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventors: Philipp Mayinger, Tobias Held
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Patent number: 11499819Abstract: A shape measurement method includes: acquiring first data of a change of a distance between a first probe and a calibration measurement object and acquiring second data of a change of a distance between a second probe and the calibration measurement object while moving the calibration measurement object in a first direction, the calibration measurement object being rotationally symmetric around an axis parallel to the first direction, the first probe and the second probe being arranged in a second direction orthogonal to the first direction; estimating an error of the movement included in the first data based on the first and second data; acquiring third data of a change of a distance between the first probe and a measurement object while moving the measurement object relative to the first probe in the first direction; and correcting the third data by using the error.Type: GrantFiled: November 20, 2020Date of Patent: November 15, 2022Assignee: KABUSHIKI KAISHA TOSHIBAInventor: Masahiro Uekita
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Patent number: 11410297Abstract: A method of verifying a fault of an inspection unit, an inspection apparatus, and an inspection system are disclosed. The method according to the present disclosure includes: providing a verification reference body which is formed on a frame attached to an inspection system; placing the inspection unit on the verification reference body; obtaining image data of the verification reference body through the inspection unit; verifying a fault of the inspection unit by extracting a movement error and height error of the inspection unit from the image data; and generating a verification result indicating the fault of the inspection unit.Type: GrantFiled: February 6, 2017Date of Patent: August 9, 2022Assignee: KOH YOUNG TECHNOLOGY INC.Inventors: Kwan Seong Kim, Myung Ho Kim, Nam Kyu Park, Joo Hyuk Kim
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Patent number: 11407115Abstract: A work robot system including a conveying apparatus that conveys an object, a robot that performs a predetermined task on a target portion of the object being conveyed by the conveying apparatus, a controller that controls the robot, a sensor that is attached to the robot and successively detects a position, relative to the robot, of the target portion of the object being conveyed by the conveying apparatus, and a force detector that detects a force generated by a contact between the object and a part supported by the robot. When the robot is performing the predetermined task, the controller performs force control based on a detection value of the force detector while controlling the robot by using a detection result of the sensor.Type: GrantFiled: January 11, 2019Date of Patent: August 9, 2022Assignee: FANUC CORPORATIONInventor: Masafumi Ooba
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Patent number: 11125858Abstract: A method for initial calibration of a sensor for a driver assistance system of a vehicle, comprising the steps of: detecting a trajectory of the vehicle by way of a reference device disposed externally to the vehicle; ascertaining a sensor axis of the sensor; ascertaining a travel axis of the vehicle from the detected trajectory; and ascertaining an angle between the sensor axis and the travel axis.Type: GrantFiled: June 18, 2019Date of Patent: September 21, 2021Assignee: Robert Bosch GmbHInventors: Alexander Carsten Ulrich, Stephan Dorenkamp
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Patent number: 11125683Abstract: Identifying object characteristic based on a contrast ratio of an amount of light reflected or absorbed by the object. Part of the object is illuminated, where the object is a material that absorbs or reflects light emitted by the light source. An amount of light absorbed/reflected by the object is measured. A contrast ratio of the absorbed/reflected light is determined by comparing an amount of light absorbed/reflected by the object to a default absorption or reflection value to obtain a difference between the amount of light absorbed/reflected by the object and the default absorption/reflection value. A characteristic of the object is determined based on the contrast ratio. The wavelength of the light from the light source can be substantially the same as the wavelength of the energy used to form the object by a welding process that uses energy to join at least two parts together to form the object.Type: GrantFiled: December 22, 2020Date of Patent: September 21, 2021Assignee: Dukane IAS, LLCInventor: Dax Hamilton
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Patent number: 11112342Abstract: A particle characterisation instrument, comprising a light source, a sample cell, an optical element between the light source and sample cell and a detector. The optical element is configured to modify light from the light source to create a modified beam, the modified beam: a) interfering with itself to create an effective beam in the sample cell along an illumination axis and b) diverging in the far field to produce a dark region along the illumination axis that is substantially not illuminated at a distance from the sample cell. The detector is at the distance from the sample cell, and is configured to detect light scattered from the effective beam by a sample in the sample cell, the detector positioned to detect forward or back scattered light along a scattering axis that is at an angle of 0° to 10° from the illumination axis.Type: GrantFiled: September 22, 2017Date of Patent: September 7, 2021Assignee: Malvern Panalytical LimitedInventors: Jason Corbett, Richard Scullion
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Patent number: 11015445Abstract: A property of a downhole fluid, for example, a chemical species or ion concentration, may be accurately determined and logged based on measurements received from an optical detector where the optical detector is fed information or signals from an optical system coupled to one or more electrochemical probes calibrated for one or more properties of a fluid. The one or more electrochemical probes provide a potential to the optical system based, at least in part, on exposure to the downhole fluid. The optical system receives an optical signal from a light source that is transmitted via a transmission line, such as a fiber optic cable. Downhole information from the optical system is transmitted to the surface via the same or another transmission line. Thus, the signals are in the optical domain rather than the electrical domain. Multiple properties may be measured simultaneously using the same transmission line.Type: GrantFiled: October 3, 2016Date of Patent: May 25, 2021Assignee: Halliburton Energy Services, Inc.Inventors: Xinwei Lan, Yenny Natali Martinez, Michel Joseph LeBlanc, Neal Gregory Skinner, John L. Maida
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Patent number: 10987459Abstract: The invention relates to a method and to an assembly for calibrating devices 11 for detecting blood or blood components in a liquid, in particular dialysate, which devices comprise a light transmitter 17 and a light receiver 18, and an evaluation unit 20 that receives the signal from the light receiver 18 and is designed such that blood or blood components in the liquid are detected on the basis of the weakening of radiation passing through the liquid. The method according to the invention is based on the fact that the calibration of the devices 11 for detecting blood or blood components is carried out without the use of blood. The calibration is carried out using an absorption standard 30, which has predetermined optical properties in relation to the absorption of the light in blood, the absorption standard 30 being arranged in the beam path 19 between the light transmitter 17 and the light receiver 18.Type: GrantFiled: February 15, 2018Date of Patent: April 27, 2021Assignee: Fresenius Medical Care Deutschland GmbHInventors: Andreas Rose, Sylvia Heinitz
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Patent number: 10955590Abstract: A system for irradiating a microplate may include a light engine with a plurality of light sources, such as light-emitting diodes, included in one or more linear arrays. The plurality of light sources are configured to emit germicidal irradiation, which is directed to the microplate by optical components, such as optical lenses positioned on top of each well of the microplate. The linear array is linearly movable so that as the linear array scans across the microplate, the optical components direct the germicidal irradiation to a plurality of surfaces of each well.Type: GrantFiled: May 23, 2019Date of Patent: March 23, 2021Assignee: Phoseon Technology, Inc.Inventors: Shiou-jyh Ja, Scott Igl
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Efficient synthesis of chelators for nuclear imaging and radiotherapy: compositions and applications
Patent number: 10925977Abstract: Novel methods of synthesis of chelator-targeting ligand conjugates, compositions comprising such conjugates, and therapeutic and diagnostic applications of such conjugates are disclosed. The compositions include chelator-targeting ligand conjugates optionally chelated to one or more metal ions. Methods of synthesizing these compositions in high purity are also presented. Also disclosed are methods of imaging, treating and diagnosing disease in a subject using these novel compositions, such as methods of imaging a tumor within a subject and methods of diagnosing myocardial ischemia.Type: GrantFiled: June 28, 2007Date of Patent: February 23, 2021Assignees: Ceil>Point, LLC, The Board of Regents of the University of Texas SystemInventors: David J. Yang, Dongfang Yu, Andrew S. Thompson -
Patent number: 10841570Abstract: A calibration method is provided.Type: GrantFiled: May 9, 2019Date of Patent: November 17, 2020Assignee: Samsung Electronics Co., Ltd.Inventors: Petro Kytsun, Iegor Vdovychenko, Alona Vitiuk, Nataliya Sakhnenko, Oleksii Panfilov
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Efficient synthesis of chelators for nuclear imaging and radiotherapy: compositions and applications
Patent number: 10814013Abstract: Novel methods of synthesis of chelator-targeting ligand conjugates, compositions comprising such conjugates, and therapeutic and diagnostic applications of such conjugates are disclosed. The compositions include chelator-targeting ligand conjugates optionally chelated to one or more metal ions. Methods of synthesizing these compositions in high purity are also presented. Also disclosed are methods of imaging, treating and diagnosing disease in a subject using these novel compositions, such as methods of imaging a tumor within a subject and methods of diagnosing myocardial ischemia.Type: GrantFiled: July 31, 2012Date of Patent: October 27, 2020Assignees: The Board of Regents of the University of Texas System, Cell>Point, LLCInventors: David J. Yang, Dongfang Yu, Andrew S. Thompson, F. David Rollo -
Patent number: 10801947Abstract: The present disclosure relates to a calibration insert for the adjustment, calibration, and/or implementation of a function test of an optical sensor that is designed to measure at least one measurand in a medium by means of light, the calibration insert including: an inlet cross-section through which light enters into the calibration insert; an outlet cross-section through which light exits from the calibration insert; and at least one blocking element that is arranged between the inlet cross-section and the outlet cross-section, wherein the blocking element does not entirely let through the light, independently of its wavelength, from the inlet cross-section to the outlet cross-section. Instead, the blocking element partially absorbs, reflects, or scatters the light, wherein the ratio of the intensity of the light at the outlet cross-section to the intensity of the light at the inlet cross-section corresponds to a value of the measurand.Type: GrantFiled: August 14, 2018Date of Patent: October 13, 2020Assignee: Endress+Hauser Conducta GmbH+Co. KGInventors: Ralf Bernhard, Matthias Grossmann
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Patent number: 10794826Abstract: A calibration material may be used to calibrate an optical sensor to help ensure that the optical sensor produces accurate measurements. In some examples, the calibration material may be used to calibrate both turbidity measurements made by an optical sensor and fluorometric measurements made by the same optical sensor. The calibration material may be an aqueous mixture that includes water in an amount greater than 70 percent by weight of the composition, inorganic, water-insoluble, light-scattering particles, and a viscosity modifier in an amount effective to maintain the inorganic, water-insoluble, light-scattering particles in suspension in the composition. The composition can be non-fluorescing when exposed to ultraviolet light. In addition, in some applications, the composition is formulated of food safe ingredients, allowing the composition to be used in facilities that process consumable foods and beverages.Type: GrantFiled: March 21, 2018Date of Patent: October 6, 2020Assignee: Ecolab USA Inc.Inventors: Richard Joseph Walsh, Evan Hendrickson, Caleb Power, Rodney Banks
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Patent number: 10775621Abstract: A method, a device and a computer-readable storage medium containing instructions for setting a head-up display in a transportation vehicle. A setting device is introduced into a defined position in the transportation vehicle. The setting device has at least one camera and one projection unit. The projection unit is used to project an alignment pattern onto a calibration target positioned outside the transportation vehicle. The calibration target and the alignment pattern are acquired using a calibrated camera installed in the transportation vehicle. A deviation of the setting device from the defined position in the transportation vehicle is determined based on the image data of the calibrated camera. At least one test image displayed by the head-up display is acquired using the camera of the setting device. Setting information for the head-up display is determined based on the at least one acquired test image.Type: GrantFiled: September 5, 2019Date of Patent: September 15, 2020Assignee: VOLKSWAGEN AKTIENGESELLSCHAFTInventor: Tim Wunderwald
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Patent number: 10677726Abstract: A tunable diode laser absorption spectroscopy device includes a tunable diode laser. A laser driver is configured to drive the diode laser and ramp it within a particular frequency range. An analyte gas container, a reference gas container, and a fringe generating device are configured to receive the laser therethrough. An optical detector is configured to detect the laser after it has passed through the analyte gas container and/or the reference gas container, and the in-line fringe generating device. An acquisition card is configured to sample an output of the optical detector. A spectral analyzer is configured to receive output data from the acquisition card, determine a spectrum of the output data, decouple the fringe spectrum from the measured spectrum, calibrate the spectrum based on an expected ideal spectrum of both the fringe and reference gas, and determine a composition of the analyte based on the calibrated spectrum.Type: GrantFiled: December 19, 2017Date of Patent: June 9, 2020Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: William Green, Chu Cheyenne Teng, Gerard Wysocki, Chi Xiong, Eric Zhang
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Patent number: 10661442Abstract: A calibration article is provided for calibrating a robot and 3D camera. The calibration article includes side surfaces that are angled inward toward a top surface. The robot and camera are calibrated by capturing positional data of the calibration article relative to the robot and the camera. The captured data is used to generate correlation data between the robot and the camera. The correlation data is used by the controller to align the robot with the camera during operational use of the robot and camera.Type: GrantFiled: February 3, 2017Date of Patent: May 26, 2020Assignee: ABB Schweiz AGInventors: Jianjun Wang, Remus Boca, Biao Zhang
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Patent number: 10615084Abstract: A method of configuring a parameter determination process, the method including: obtaining a mathematical model of a structure, the mathematical model configured to predict an optical response when illuminating the structure with a radiation beam and the structure having geometric symmetry at a nominal physical configuration; using, by a hardware computer system, the mathematical model to simulate a perturbation in the physical configuration of the structure of a certain amount to determine a corresponding change of the optical response in each of a plurality of pixels to obtain a plurality of pixel sensitivities; and based on the pixel sensitivities, determining a plurality of weights for combination with measured pixel optical characteristic values of the structure on a substrate to yield a value of a parameter associated with change in the physical configuration, each weight corresponding to a pixel.Type: GrantFiled: February 28, 2017Date of Patent: April 7, 2020Assignee: ASML Netherlands B.V.Inventors: Adriaan Johan Van Leest, Anagnostis Tsiatmas, Paul Christiaan Hinnen, Elliott Gerard McNamara, Alok Verma, Thomas Theeuwes, Hugo Augustinus Joseph Cramer
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Patent number: 10416863Abstract: An image measuring apparatus including an image measurer capable of switching between one of a type of lens and a magnification power, the image measurer obtaining an image of a measured object; a display displaying the image obtained by the image measurer and providing an operation screen to a user; and a controller controlling operations of the image measurer and the display. A calibration value and an expiration date for the calibration value are recorded by the controller for one of each type of lens and each magnification power. The controller communicates to the user, using the display, that one of the lens and the magnification power has an expired calibration value.Type: GrantFiled: July 9, 2015Date of Patent: September 17, 2019Assignee: MITUTOYO CORPORATIONInventor: Makoto Kaieda
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Patent number: 10396520Abstract: A method for calibrating a mounting-device used for automatically mounting a contact-part attached to an electrical line with a connector-housing includes the steps of providing the mounting-device, marking a plurality of marking-points, capturing an image of the plurality of marking-points, and determining the positions of the plurality of marking-points. The mounting-device comprises a holder for the connector-housing, a positioning-device that includes a moveable-gripper that includes a marking-device, a camera configured to capture an image of a portion of the holder, and a control unit in communication with the positioning-device, the camera, and the moveable-gripper. The control unit determines the positions of the marking-points based on the image. The positions are indicative of an actual insertion-position of the contact-part into the connector-housing by the moveable-gripper. The control unit stores the positions of the marking-points in a memory of the control unit.Type: GrantFiled: June 15, 2015Date of Patent: August 27, 2019Assignee: APTIV TECHNOLOGIES LIMITEDInventors: Markus Larisch, Achim Rosemann, Rainer Bego-Ghina
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Patent number: 10334186Abstract: A method of calibrating a hyperspectral imaging device includes illuminating a hyperspectral imaging sensor with a light source having known spectral properties, sampling the light from the light source with the hyperspectral imaging sensor to obtain sampled spectral properties, and calibrating a performance characteristic of the hyperspectral imaging sensor based upon comparing the sampled spectral properties of the light source to the known spectral properties.Type: GrantFiled: May 25, 2017Date of Patent: June 25, 2019Assignee: Palo Alto Research Center IncorporatedInventors: Alex Hegyi, Joerg Martini
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Patent number: 10302489Abstract: The invention relates to a method for calibrating a spectroradiometer (1), comprising the following method steps: capture of light measurement data by the measurement of the radiation of at least one standard light source (4) using the spectroradiometer (1) that is to be calibrated; derivation of calibrated data from the light measurement data by the comparison of the captured light measurement data with known data of the standard light source (4); and calibration of the spectroradiometer (1) according to the calibration data. The aim of the invention is to provide a reliable and practical method for calibrating the spectroradiometer (1). In particular, the synchronism of spectroradiometers (1) situated in different locations (9, 10, 11) is to be produced simply and reliably. To achieve this aim, the validity, i.e.Type: GrantFiled: December 1, 2015Date of Patent: May 28, 2019Assignee: INSTRUMENT SYSTEMS OPTISCHE MESSTECHNIK GMBHInventors: Felix Frank, Richard Young, Juliane Kraft, Reto Haring
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Patent number: 10288410Abstract: A method, system and computer program product are provided for identifying wire contact insertion holes of a connector to facilitate the automated insertion of the wire ends of a wire bundle assembly into the wire contact insertion holes of a connector. In the context of a method, each of a plurality of pixels of an image of the connector is analyzed to identify one or more candidate contact insertion holes for the connector. The method also determines whether the one or more candidate contact insertion holes are to be consolidated and, if so, consolidates the one or more candidate contact insertion holes. The method further includes assigning contact identification numbers of the connector to the one or more candidate contact insertion holes.Type: GrantFiled: November 10, 2016Date of Patent: May 14, 2019Assignee: THE BOEING COMPANYInventor: Heiko Hoffmann
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Patent number: 10269173Abstract: There is provided a method and a device, each of which can improve the reproducibility of the appearance of an actual product. A design layer data creation device 100 includes: a measuring instrument 151 which measures a BRDF of a design layer 210 configured by a paint color layer 202 and a clear coat layer 201; and a calculation element 120 which creates design layer data on the basis of an approximate BRDF according to a BRDF model. The calculation element 120 defines the approximate BRDF by respectively obtaining coupling coefficients Ks1, Ks2, and Kd of a specular reflectance distribution function and a diffuse reflectance distribution function so as to approximate measured BRDF data.Type: GrantFiled: August 5, 2014Date of Patent: April 23, 2019Assignee: HONDA MOTOR CO., LTD.Inventor: Daisuke Ide
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Patent number: 10241031Abstract: A measuring device (1) includes a first signal generation section (3) and a first removal section (5). The first signal generation section (3) generates a first source signal (x1(t)) including a fundamental and a plurality of harmonics based on a first physical quantity (p1) and a second physical quantity (p2). The first removal section (5) removes some or all of the harmonics from the first source signal (x1(t)). The first source signal (x1(t)) is a periodic signal, and one period of the first source signal (x1(t)) includes a first signal (p1), a second signal (p2), and a reference signal (pr). The first signal (p1) has a first duration (w1) and indicates the first physical quantity (p1). The second signal (p2) has a second duration (w2) and indicates the second physical quantity (p2). The reference signal (pr) has a third duration (w3) and indicates the reference physical quantity (pr).Type: GrantFiled: July 1, 2015Date of Patent: March 26, 2019Assignee: OSAKA UNIVERSITYInventor: Makoto Katsura
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Patent number: 10234266Abstract: A method for calibrating electromagnetic radiation-based three-dimensional imaging includes: obtaining (501) a calibration imaging result at least partly on the basis of electromagnetic waves received from a calibration artifact, forming (502) calibration data on the basis of the calibration imaging result and a known thickness profile of the calibration artifact, and correcting (503), with the aid of the calibration data, an imaging result obtained at least partly on the basis of electromagnetic waves received from a sample to be imaged. The calibration artifact includes layers, for example Langmuir-Blodgett films, having pre-determined thicknesses and stacked on each other so as to achieve the pre-determined thickness profile of the calibration artifact. A three-dimensional imaging system configured to carry out the method.Type: GrantFiled: October 29, 2015Date of Patent: March 19, 2019Assignees: ABO AKADEMI (ABO AKADEMI UNIVERSITY), HELSINGIN YLIOPISTOInventors: Edward Hæggstrom, Ivan Kassamakov, Anton Nolvi, Tuomo Ylitalo, Niklas Sandler, Tapani Viitala, Johan Nyman
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Patent number: 10215708Abstract: Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120° in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.Type: GrantFiled: May 26, 2017Date of Patent: February 26, 2019Assignee: EyeC GmbHInventors: Ansgar Kaupp, Soeren Springmann, Dirk Luetjens
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Patent number: 10206585Abstract: The disclosed automatic calibration systems and methods provide a repeatable way to detect internal catheter reflections and to shift the internal catheter reflections to calibrate an image.Type: GrantFiled: February 23, 2017Date of Patent: February 19, 2019Assignee: VOLCANO CORPORATIONInventors: Nathaniel Kemp, Elizabeth Begin, Badr Elmaanaoui
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Patent number: 10156520Abstract: An optical sample characterization method is disclosed comprising: holding a sample in a sample container proximate at least one two-dimensional detector array assembly, wherein the sample container has a first end and a second end; setting up a gradient between the first end of the sample container and the second end of the sample container; illuminating the sample between the first end of the sample container and the second end of the sample container; and detecting light received from the illuminated sample from the first end of the sample container to the second end of the sample container by the two-dimensional array assembly.Type: GrantFiled: June 6, 2014Date of Patent: December 18, 2018Assignee: MALVERN PANALYTICAL LIMITEDInventor: E. Neil Lewis
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Patent number: 10107745Abstract: A method and a device allow optical properties of a sample to be estimated. The method includes the illumination of the sample by a first light source, and the formation of an image of the sample thus illuminated, on the basis of which a first optical property is estimated, at various points on a surface of the sample. The method also includes measuring an auxiliary optical property of the sample and estimating the first optical property, taking account of the auxiliary optical property measured on the sample.Type: GrantFiled: April 21, 2017Date of Patent: October 23, 2018Assignees: Commissariat à l'énergie atomique et aux énergies alternatives, Centre National De la Recherche Scientifique, Université Pierre et Marie Curie (Paris 6)Inventors: Veronica Sorgato, Michel Berger, Anne Planat-Chretien, Christine Vever-Bizet, Genevieve Bourg-Heckly, Charlotte Emain
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Patent number: 9933479Abstract: The present invention includes an interface apparatus for semiconductor testing. The interface apparatus comprises a housing substrate and two product substrates. The first product substrate has a first micro-scale conductive pattern and is situated within a first opening of the housing substrate. The second product substrate has a second micro-scale conductive pattern and is situated within a second opening of the housing substrate. The first and the second micro-scale conductive patterns are aligned to a conductive semiconductor wafer pattern using a continuous translucent media having targets corresponding to the conductive semiconductor wafer pattern.Type: GrantFiled: November 11, 2015Date of Patent: April 3, 2018Assignee: Spire ManufacturingInventors: Hai Dau, Lim Hooi Weng, Kothandan Shanmugam, Christine Bui
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Patent number: 9818971Abstract: An organic light emitting diode (OLED) display device and a preparation method thereof, and a display apparatus are disclosed. The OLED display device includes: a thin layer transistor (22), a first electrode (23?), a second electrode (26?) and an organic functional layer (25) located between the first electrode (23?) and the second electrode (26?). The thin film transistor (22) comprises a gate electrode (221), a source electrode (222) and a drain electrode (223); and the first electrode (23?) is electrically connected with the drain electrode (223). The display device further comprises a first auxiliary electrode (27) formed from a topological insulator. The first auxiliary electrode (27) is electrically connected with the second electrode (26?) to provide electrical signals for the second electrode (26?). The OLED display avoids the problems of high IR drop and non-uniform lightness caused by the large transmission resistance of the cathodes.Type: GrantFiled: October 27, 2014Date of Patent: November 14, 2017Assignee: BOE Technology Group Co., Ltd.Inventors: Hongfei Cheng, Yong Qiao, Yongchun Lu, Jianbo Xian
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Patent number: 9816925Abstract: A method for 3D recording of data on a medium formed from a transparent photosensitive material including at least one dopant. The method includes a first step of calibrating and checking a pulsed light source including calibrating the number of pulses, the level of fluence of each pulse emitted and the rate of the pulses and a step of inscribing an area of the material. The fluence of each pulse emitted, the number of pulses and the rate of the pulses are suitable for irradiating the material in the area so as to form fluorescent clusters stabilized from the dopant while minimizing the modification of the refractive index and the absorption coefficient of the medium in a wavelength range from visible to near infrared.Type: GrantFiled: November 14, 2013Date of Patent: November 14, 2017Assignee: Universite Bordeaux 1Inventors: Lionel Stephane Canioni, Thierry Cardinal, Bruno Bousquet, Arnaud Royon, Matthieu Bellec, Kevin Bourhis, Gautier Papon, Philippe Legros
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Patent number: 9808187Abstract: A measuring chamber device for an optically operating sensor for determining a concentration of a substance that is contained in tissue fluid of a mammal. The measuring chamber device has a measuring chamber filled with a liquid measuring medium and a wall with better diffusion permeability for the substance than for other constituents of the tissue fluid. A transmitter device for emitting optical radiation into the measuring chamber, and a receiver device for receiving optical radiation that has passed through the measuring chamber are also provided.Type: GrantFiled: November 30, 2012Date of Patent: November 7, 2017Assignee: Schildtec GMBHInventor: Hans-Joachim Freitag
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Patent number: 9772562Abstract: A reconstruction process includes measuring structures formed on a substrate by a lithographic process, determining a reconstruction model for generating modeled patterns, computing and minimizing a multi-variable cost function including model errors. Errors induced by nuisance parameters are modeled based on statistical description of the nuisance parameters' behavior, described by probability density functions. From the statistical description model errors are calculated expressed in terms of average model errors and weighing matrices. These are used to modify the cost function so as to reduce the influence of the nuisance parameters in the reconstruction, without increasing the complexity of the reconstruction model. The nuisance parameters may be parameters of the modeled structure, and/or parameters of an inspection apparatus used in the reconstruction.Type: GrantFiled: November 5, 2014Date of Patent: September 26, 2017Assignee: ASML Netherlands B.V.Inventors: Martijn Peter Mink, Janne Maria Brok, Irwan Dani Setija
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Patent number: 9738666Abstract: Provided is an electrolyte salt comprising a quaternary ammonium cation indicated by formula (1) and a trimethylsilyl alkanesulfonate anion indicated by formula (2). (In the formula, R1-R4 each independently indicate a C1-4 alkyl group or an alkoxyalkyl group indicated by —(CH2)n—OR. Any two among R1-R4 can mutually bond and form a ring together with a nitrogen atom to which same have bonded. The remaining two can mutually bond and form a spiro ring having a nitrogen atom as the spiro atom therefor. R indicates a methyl group or an ethyl group. n indicates 1 or 2 and m indicates 2 or 3.Type: GrantFiled: October 7, 2013Date of Patent: August 22, 2017Assignee: NISSHINBO HOLDINGS, INC.Inventor: Gen Masuda
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Patent number: 9645044Abstract: A controlled-contact method of measuring an insertion loss of a compressible DUT having a first ferrule with a first optical fiber and a first end face is disclosed. The method utilizes a compressible reference connector having a second ferrule with a second optical fiber and a second end face. The method includes: axially aligning the first and second ferrules to define a gap with an axial gap distance of greater than 150 ?m; moving the reference connector at a connector velocity in the range from 1 mm/s to 5 mm/s; when the gap distance is less than 150 ?m, reducing the connector velocity to between 10 ?m/s and 500 ?m/s until contact while continuing to measure the coupled optical power; after contact, increasing the connector velocity as the reference and DUT connector axially compress. The insertion loss is determined from ongoing measurements of the coupled optical power.Type: GrantFiled: September 30, 2014Date of Patent: May 9, 2017Assignee: Corning Optical Communications LLCInventors: Adam Joseph Fusco, Daniel Ohen Ricketts, James Scott Sutherland, Neil David Vance, Elvis Alberto Zambrano
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Patent number: 9549494Abstract: A set of circuit carriers includes a number of N?1 circuit carriers, each of which has an upper side, an underside opposite from the upper side, a distinctive structure, and a conductor structure on the upper side. Each of the circuit carriers is populated by: determining a first relative position between the distinctive structure and the conductor structure; picking up the circuit carrier by a pickup of a lifting and positioning unit; determining a second relative position between the lifting and positioning unit and the distinctive structure of the circuit carrier picked up by the pickup; and populating the circuit carrier with one or more components while taking the first relative position and the second relative position into account.Type: GrantFiled: June 4, 2014Date of Patent: January 17, 2017Assignee: Infineon Technologies AGInventor: Michael Schmidt
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Patent number: 9442005Abstract: A non-contact method of measuring an insertion loss of a DUT connector is disclosed. The DUT connector has a first ferrule with a first optical fiber and a first end face. The method utilizes a reference connector having a second ferrule with a second optical fiber and a second end face. The method includes: axially aligning the first and second ferrules so that the first and second end faces are confronting and spaced apart to define a gap with an axial gap distance d; measuring values of the insertion loss between the first and second optical fibers for different gap distances d>0; and estimating a value for the insertion loss for a gap distance of d=0 based on the measured values of the insertion loss when d>0.Type: GrantFiled: July 30, 2014Date of Patent: September 13, 2016Assignee: Corning Optical Communications LLCInventors: Adam Joseph Fusco, Daniel Ohen Ricketts, James Scott Sutherland, Neil David Vance, Elvis Alberto Zambrano
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Patent number: 9347823Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.Type: GrantFiled: January 28, 2014Date of Patent: May 24, 2016Assignee: NATIONAL INSTITUTE OF METROLOGYInventor: Ruoduan Sun
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Patent number: 9347852Abstract: Modern implementations of Kohler illuminated epi illumination microscope systems provide state of the art performance in various scientific fields such as clinical practice and biological research. While modern microscope performance has increased by use of high performance components, modern microscopes now degrade over time and exhibit inconstant performance. New systems comprise new illumination cubes that replace existing components and contain optical components that provide users with a diagnostic image of the epi illumination.Type: GrantFiled: May 6, 2014Date of Patent: May 24, 2016Inventor: Thomas DiMatteo