Standard Patents (Class 356/243.1)
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Patent number: 7317523Abstract: A method for calibrating a metrology tool, the method includes: determining a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; and defining a calibration parameter in response to the relationship. A metrology system that includes: a miller adapted to mill a reference structural element; and a measurement device adapted to determine a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; wherein the metrology system is further adapted to define a calibration parameter in response to the relationship.Type: GrantFiled: May 12, 2005Date of Patent: January 8, 2008Assignee: Applied Materials, Israel, Ltd.Inventors: Nadav Wertsman, Ovadya Menadeva
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Patent number: 7315368Abstract: A spectra generator having an electrically programmable diffraction grating. There may be a broad band light source that emits light which is diffracted by the grating. Diffracting elements in the grating may be individually adjustable so that generation of a specific spectrum or spectra may be achieved. The diffracting elements may be adjusted according to electrical signals of a program from a computer. The generated synthetic spectra may be used for testing and calibration of spectrometers or other devices. Synthetic spectra may also be used for scene generation and other purposes.Type: GrantFiled: September 22, 2004Date of Patent: January 1, 2008Assignee: Honeywell International Inc.Inventor: G. Benjamin Hocker
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Publication number: 20070291250Abstract: A solid element for use as a control or calibration element which can be used in a diagnostic analyzer. The element includes a translucent or transparent solid material which when illuminated by a light source emits light corresponding to a specified concentration of a specific analyte as an analyte being measured.Type: ApplicationFiled: June 20, 2006Publication date: December 20, 2007Inventors: Michael W. LaCourt, Glenn M. Mehalek
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Patent number: 7307715Abstract: The structure size of a structure (100) is measured by forming an auxiliary measured value (Dx?, Dy?). A calibration measured value (Px?, Py?) is determined on the basis of a calibration structure (110), which comprises at least two structure elements (140) at a distance from one another, including at least the measured value sum of the width (By?) of one of the two structure elements (140) and the distance (Ay?) between the two structure elements (140). The calibration measured value (Px?, Py?) and a predetermined calibration preset value (Px, Py), which relates to the calibration structure (110), result in the determination of a calibration factor (C, Cx, Cy). The auxiliary measured value (Dx?, Dy?) is corrected using the calibration factor (C, Cx, Cy) in order to form the structure size measured value (Dx,k; Dy,k).Type: GrantFiled: April 22, 2005Date of Patent: December 11, 2007Assignee: Infineon Technologies AGInventor: Christian Rotsch
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Patent number: 7301638Abstract: A calibration standard, for calibrating lateral or angular dimensional measurement systems, is provided. The standard may include a first substrate spaced from a second substrate. The standard may be cross-sectioned in a direction substantially perpendicular or substantially non-perpendicular to an upper surface of the first substrate. The cross-sectioned portion of the standard may form a viewing surface of the calibration standard. The standard may include at least one layer disposed between the first and second substrates. The layer, or a feature etched into the first or second substrate or a feature etched into the layer may have a traceably measured thickness or may be oriented at a traceably measured angle with respect to the viewing surface. A thickness or angle of the layer or other feature may be traceably measured using any technique for calibrating a measurement system with a standard reference material traceable to a national testing authority.Type: GrantFiled: January 31, 2004Date of Patent: November 27, 2007Assignee: KLA Tencor, Inc.Inventors: Marco Tortonese, Jerry Prochazka, Ellen Laird, Pat Brady, Rene M. Blanquies
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Publication number: 20070222980Abstract: A measurement system that can self calibrate is disclosed. The measurement system comprising a first light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second light source aligned along the second axis that is configured to illuminate the sensor during a calibration procedure.Type: ApplicationFiled: December 11, 2006Publication date: September 27, 2007Inventor: Perry A. Palumbo
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Patent number: 7262842Abstract: The invention relates to a device for referencing fluorescence signals and/or calibration of fluorescence detection systems, whereby the device comprises an essentially non-fluorescing support, on which are applied polymer layers in several defined regions and with partly varying thicknesses and/or compositions. Said polymer layers are applied to the support such as to fluoresce after corresponding irradiation and the device may thus be used as a fluorescence standard. The invention further relates to a method for the production of said fluorescence standards.Type: GrantFiled: March 20, 2002Date of Patent: August 28, 2007Assignee: Clondiag Chip Technologies GmbHInventors: Eugen Ermantraut, Thomas Kaiser, Jens Tuchscheerer
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Patent number: 7248356Abstract: A calibration aid may be assembled as follows. First, the standard reference substance is prepared by dissolving ICG dye and albumin protein in water. Then, the carrier sheet of fleece material is soaked therein and dried. After drying the carrier sheet, a thin well defined layer of protein bound dye is present at the surface of the fleece material. The carrier sheet and the backing sheet are laminated into a plastic card. For this, the plastic layers may be laminated tightly together in the framing region for example by welding or by use of adhesive. The plastic card is then sterilized and packed into a sealed package.Type: GrantFiled: April 6, 2004Date of Patent: July 24, 2007Assignee: Pulsion Medical Systems AGInventor: Ulrich J. Pfeiffer
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Patent number: 7241399Abstract: Methods for the preparation of inorganic nanoparticles capable of fluorescence, wherein the nanoparticles consist of a host material that comprises at least one dopant. The synthesis of the invention in organic solvents allows to gain a considerably higher yield compared to the prior art synthesis in water. All kinds of objects can advantageously be marked and reliably authenticated by using an automated method on the basis of a characteristic emission. Further, the size distribution of the prepared nanoparticles is nartower which renders a subsequent size-selected separation process superfluous.Type: GrantFiled: September 7, 2001Date of Patent: July 10, 2007Assignee: Centrum fuer Angewandte Nanotechnologie (CAN) GmbHInventors: Stephan Haubold, Markus Haase, Karsten Riwotzki, Horst Weller, Heike Meyssamy, Fernando Ibarra
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Patent number: 7236241Abstract: A method of making a standard tool for calibrating polarimeters that analyze stress in photoelastic material, includes the steps of partially annealing a starting piece of tempered glass so that the starting piece has a retardance below 250 nm/cm, removing a peripheral portion of the starting piece (preferably, at least about 20% of its radial dimension) to leave a working piece, cutting a rectangular parallelepiped from the working piece, polishing two opposing faces of the rectangular parallelepiped where the two opposing faces are spaced apart by a measurement distance through which light passes during stress analysis in a polarimeter, and determining a birefringence of the rectangular parallelepiped across the measurement distance using a calibrated polarimeter. The standard tool is the rectangular parallelepiped having the determined birefringence for the measurement distance. The method can be used to make a set of the standard tools with different measurement distances.Type: GrantFiled: March 30, 2005Date of Patent: June 26, 2007Assignee: Osram Sylvania Inc.Inventors: Mary Ann Johnson, David W. Johnston
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Patent number: 7230696Abstract: A system that calibrates instruments for measuring the light or air permeability of a material, and includes a calibration target which can be used for calibration of either light-based or air-based instruments. The calibration target simulates the material whose permeability is being measured, and includes a plate having multiple, angled or parallel rows of perforations provided therethrough. The permeability measuring instrument measures the permeability of the calibration target, and compares the measured permeability with a predetermined permeability of the calibration target and calibrates the permeability measuring instrument based upon the comparison.Type: GrantFiled: May 26, 2004Date of Patent: June 12, 2007Assignee: Philip Morris USA Inc.Inventor: Bogdan N. Alexander
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Patent number: 7227629Abstract: An optical measurement device calibration tool includes an optical probe suitable for calibrating various optical imaging devices, for example, low coherence reflectometers and optical coherence tomography devices. In a preferred embodiment the calibration tool comprises a container containing a calibration substance with stable optical scattering and absorption properties. The calibration substance includes a gel, paste or grease substance and is covered a protective seal, which is at least partially transparent providing optical contact between the optical probe and the calibration substance. The protective seal is covered with a viscous complementary material. Another protective seal made at least partially removable is placed above the viscous complementary material and may serve as a cover for the container.Type: GrantFiled: June 15, 2005Date of Patent: June 5, 2007Assignee: Imalux CorporationInventors: Felix I. Feldchtein, J. Lloyd Breedlove, Stephanie A. S. Harrington
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Patent number: 7193701Abstract: A system for providing and using a gray optical standard is disclosed, the standard generally comprising a housing having a cavity and an at least partially transparent portion adjacent to the cavity for receiving the radiation emitted radiation by an optical instrument and a particulate material disposed in the cavity. The particulate material is a mixture of highly absorptive and highly reflective particles having a diameter of about 20 microns or less. In some embodiments, the at least partially transparent portion of the housing is modified to be highly diffusely scattering in the wavelength region of interest.Type: GrantFiled: July 29, 2005Date of Patent: March 20, 2007Inventor: Howard L. Mark
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Patent number: 7180607Abstract: A measuring system including a measuring device with a laser tracker and an opto-electronic sensor having fixed positions relative to one another and an auxiliary measuring tool with a reflector and at least three light spots, is calibrated. The auxiliary measuring tool is rigidly coupled with an arrangement of auxiliary reflectors and is moved around at least two different rotation axes. Reflector and auxiliary reflectors are registered by the laser tracker and the light spots are registered by the opto-electronic sensor. From the data of the laser tracker, positions and orientations of the reflector arrangement relative to the laser tracker and from the data of the opto-electronic sensor, positions and orientations of the light spot arrangement relative to the opto-electronic sensor are calculated and the two rotation axes relative to the reflector arrangement and the light spot arrangement are calculated. Calibration data are calculated by equating corresponding rotation axes.Type: GrantFiled: November 14, 2003Date of Patent: February 20, 2007Assignee: Leica Geosystems AGInventors: Stephen Kyle, Konrad von Arb
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Patent number: 7151597Abstract: The optical wavelength standard comprises a diffraction grating having a diffractive surface, an input arrangement and an output optical arrangement. The input optical arrangement is located to illuminate the diffractive surface of the diffraction grating with incident light at an angle of incidence at which absorption of the incident light at a resonance wavelength generates surface plasmons. The output optical arrangement is located to receive the incident light specularly reflected from the diffractive surface of the diffraction grating as reflected light. The reflected light includes an absorption line at the resonance wavelength. The absorption line provides the wavelength reference. The resonance wavelength is defined by the angle of incidence and the physical characteristics of the diffraction grating. A desired resonance wavelength can be obtained by appropriately defining the angle of incidence and the physical characteristics of the diffraction grating.Type: GrantFiled: December 5, 2003Date of Patent: December 19, 2006Assignee: Agilent Technologie, IncInventors: Annette C. Grot, Thomas J. Mikes
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Patent number: 7115232Abstract: A fluorescence validation microplate for testing the validity of a fluorometer is provided which can efficiently and cost-effectively test fluorometers to determine linearity, alignment, reproducibility, filter integrity, and cross-talk, each of which is important to proper functioning of the fluorometer.Type: GrantFiled: May 24, 2002Date of Patent: October 3, 2006Inventor: Gordon S. Hudson
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Patent number: 7106435Abstract: A hyperspectral scene generator generates a projected linear scene where the spectral characteristics at each location that forms the scene are dynamically and arbitrarily controllable. The generator can be controlled to generate a projected linear scene including a targeted object and arbitrary spectral content that duplicates the spectral content of real targets and backgrounds to facilitate testing of target identification software of a hyperspectral imaging system in view of expected actual field operation of the sensor of the imaging system.Type: GrantFiled: March 17, 2004Date of Patent: September 12, 2006Assignee: DRS Sensors & Targeting Systems, Inc.Inventor: Neil R. Nelson
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Patent number: 7099015Abstract: A fiber optic sensing device uses a Fabry-Perot cavity to sense a physical parameter. The cavity modulates the incident polychromatic light. The modulated light is recorded by an optical spectrometer means. The spectrum is analyzed in a signal processing unit which normalizes the spectrum and determines the phase of the modulated signal. The phase, accumulated over whole range of wavelengths, has been used for identification of the physical parameter using a look-up-table. The cavity, the polychromatic light source and the spectroscope means are connected by fiber optic means.Type: GrantFiled: August 25, 2003Date of Patent: August 29, 2006Inventor: Ivan Melnyk
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Patent number: 7084386Abstract: A light source calibration target has a surface in view of a camera of an image capture system, The target includes a substrate having a substantially Lambertian surface, a visually distinct polygonal shape having corners formed on said surface so as to be visually distinct from the surface, and a plurality of objects each having an upstanding tip mounted on the surface, A method of using the calibration target operates, for each of the light sources to be calibrated, to capture an image of the target; process the captured image to derive light source calibration data and to store the calibration data.Type: GrantFiled: May 2, 2003Date of Patent: August 1, 2006Assignee: International Business Machines CorporationInventors: Fausto Bernardini, Frank P. Giordano, Jose Gomes, Holly Rushmeier
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Patent number: 7068366Abstract: A simulated calibration and verification reference sample for a measurement system including a blackbody radiation source and a spectrographic sensor is disclosed. By providing a simulating reference sample, no actual sample is required and the problems associated with an actual sample including preparation, maintenance, use, storage, replacement and the like are eliminated.Type: GrantFiled: October 31, 2003Date of Patent: June 27, 2006Assignee: ABB Inc.Inventor: Gary Neil Burk
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Patent number: 7061608Abstract: An apparatus and related method for optical calibration of spectrophotometers is described. The apparatus is a calibration plate including one or more cuvettes filled with solutions of interest. The cuvettes are sealed to prevent evaporation. The cuvettes also possess a compressible component to allow for expansion of the solution and a bubble control apparatus to ensure that the compressible component does not intersect the beam path. A piece of neutral density glass is optionally included in the apparatus to track optical changes of the solutions over time.Type: GrantFiled: January 30, 2004Date of Patent: June 13, 2006Assignee: Artel, Inc.Inventors: John Thomas Bradshaw, Richard H. Curtis
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Patent number: 7054000Abstract: A method of calibration of magnification of a microscope with the use of a diffraction grating has the steps of determining a mean period of a diffraction grating by irradiating the diffraction grating with an electromagnetic radiation having a known wavelength and analyzing a resulting diffraction pattern, determining a scatter of individual values of a period of the diffraction grating by multiple measurements of periods of the diffraction grating by a microscope in pixels in one area in a microscope field of view, and calculating a mean value of the period and the scatter based on the measurements, determining a sufficient number of measurements of the period for providing an accepted statistic error of a magnification of the microscope, performing measurements corresponding to the determined acceptable number of measurements, of individual values of the period in pixels in a plurality of portions of the diffraction grating, calculating a general mean value of the period in pixels based on the immediatelyType: GrantFiled: August 4, 2003Date of Patent: May 30, 2006Assignee: General Phosphorix LLCInventors: Arkady Nikitin, Albert Sicignano, Dmitriy Yeremin, Tim Goldburt
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Patent number: 7016032Abstract: The invention is directed to a device for calibrating an optical detection channel for a two-dimensional, spatially dependent measurement of fluorescent or luminescent radiation in multi-specimen carriers. The invention provides a system for calibrating an optical detection channel for a two-dimensional, spatially dependent measurement of fluorescent or luminescent radiation in multi-specimen carriers permitting a highly accurate calibration of the spatial sensitivity distribution of the sensor array in the detection channel. The invention provides a plate-shaped housing, a luminescent foil inside the housing which is arranged parallel to the window so as to cover its surface, a power source and control units which are provided in the housing for controlling the luminescent foil, so that the luminescent foil can be controlled for homogeneous emission of luminescent light through the window of the housing in different intensity levels.Type: GrantFiled: September 26, 2003Date of Patent: March 21, 2006Assignee: CyBio AGInventors: Juergen Wulf, Andreas Fina, Michael Eberhard
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Patent number: 6993179Abstract: The shape of a three-dimensional object is determined from uncalibrated stereo images by first determining the projection of the point on a reference plane. The distance of each point from the reference plane is obtained by a technique that makes use of a calibration based on two known points visible in each camera's field of view. The method requires only one high precision measurement, which is the depth of the two calibration points from a reference plane. These may be supplied in a setup apparatus thereby avoiding the need for a user to make measurements. The rest of the required calibration data may be derived directly from the images of the cameras.Type: GrantFiled: August 7, 2000Date of Patent: January 31, 2006Assignee: Koninklijke Philips Electronics N.V.Inventors: Daphna Weinshall, Mi-Suen Lee
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Patent number: 6989896Abstract: A standardized sample for scatterometry includes four quadrants each including an inner block surrounded by four outer blocks. A pattern of gratings is repeated within each of the blocks using different resolutions and orientations. Each grating within an outer block has a matching grating within the block's pair. A grating and its matching grating are negative images of each other—the pitch and line-size of a grating are equal, respectively to the line size and pitch of the matching grating. The inner block also includes a series of background patterns positioned behind the gratings. These patterns include repeating patterns of hole and repeating line structures. This series of structures cover a large die area, helping to simulate the conditions faced by real-world scatterometers. The various structures feature a high-degree of alignment, allowing rapid verification using SEM or other techniques.Type: GrantFiled: October 9, 2002Date of Patent: January 24, 2006Assignee: Therma-Wave, Inc.Inventors: Youxian Wen, Cheryl Staat, Jon Opsal
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Patent number: 6956649Abstract: A ceramic reference in conjunction with a spectrometer, a metallized ceramic material, and a method of utilizing a ceramic material as a reference in the ultraviolet, visible, near-infrared, or infrared spectral regions are presented. The preferred embodiments utilize a ceramic reference material to diffusely reflect incident source light toward a detector element for quantification in a reproducible fashion. Alternative embodiments metallize either the incident surface or back surface of to form a surface diffuse reflectance standard. Optional wavelength reference layers or protective layers may be added to the ceramic or to the metallized layer. The reference ceramic is used to provide a measure of optical signal of an analyzer as a function of the analyzers spatial, temporal, and environmental state.Type: GrantFiled: November 25, 2003Date of Patent: October 18, 2005Assignee: Sensys Medical, Inc.Inventors: George M. Acosta, Kevin H. Hazen, N. Alan Abul-Haj, Stephen L. Monfre, Thomas B. Blank
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Patent number: 6954681Abstract: An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be coupled to the controller over the same interface.Type: GrantFiled: December 24, 2003Date of Patent: October 11, 2005Assignee: CyberOptics CorporationInventors: Lance K. Fisher, John D. Gaida, Joseph L. Horijon, Todd D. Liberty
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Patent number: 6917422Abstract: The present invention provides a photometric reference member comprising PTFE and glass. The member exhibits an absorbance change of less than 0.0001 absorbance units per degree C. over a range of temperatures, preferably from about 20° C. to about 40° C., and over wavelengths from about 600 nm to about 1650 nm, preferably about 600 nm to about 1050 nm. The invention also pertains to methods of using the photometric reference member to correct for temperature variations or drift in absorbance measurements.Type: GrantFiled: January 22, 2003Date of Patent: July 12, 2005Assignee: NIR Diagnostics Inc.Inventors: James Samsoondar, Ashwani Kaushal
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Patent number: 6912049Abstract: The present invention provides a thermally stable reference member comprising, at least one radiation attenuating element and at least one radiation scattering element. The radiation attenuating element comprising at least one aperture for transmission of radiation therethrough. The attenuating and scattering elements placed in series so that radiation transmitted through the reference member passes through each of the attenuating and scattering elements. The attenuating and scattering elements of the reference member may further comprise a thermally stable mount to hold the elements in a selected position relative to each other, and in relation to an instrument, or the elements may be bonded together.Type: GrantFiled: December 18, 2002Date of Patent: June 28, 2005Assignee: NIR Diagnostics, Inc.Inventors: Romuald Pawluczyk, Theodore Cadell, Bronislaw Bednarz, Ashwani Kaushal
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Patent number: 6842241Abstract: A method for checking the operation of a laboratory instrument used in biochemistry by means of an individual test plate (10) by comparing measured values of sample units (20, 21) placed in the wells (12) of the frame plate (11) to previously known measured values verified by a reference device. The sample unit (20) placed in the frame plate (11) of the test plate (10) is a teflon plastic cup (22) provided with an aluminum cover (23), the sample material (24) in powdery form being placed in said cup, or an optical filter (21), which is locked in place by means of a locking spring ring (25).Type: GrantFiled: September 4, 2002Date of Patent: January 11, 2005Assignee: Wallac OyInventors: Raimo Harju, Sanna Tauluvuori
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Publication number: 20040263840Abstract: A method for calibrating an inspection machine including a plurality of displacement detectors for inspecting a production part and a linear motion stage for relative motion between the displacement detectors and the production part. The method includes determining relative positional errors of the displacement detectors relative to each other, determining the effect of motion stage errors on a first detector from the plurality of displacement detectors as a function of position of the motion stage, and determining the effect of motion stage errors on the remaining displacement detectors as a function of position of the motion stage.Type: ApplicationFiled: May 24, 2004Publication date: December 30, 2004Inventors: Stephen B. Segall, Juris Upatnieks
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Patent number: 6836323Abstract: The present invention overcomes the disadvantages of the related art by providing a spatial reference system that includes at least one artifact assembly. The artifact assembly has a measuring bar assembly including an inner member with a proximate end and a distal end, an outer member with a proximate end and a distal end, and a compensating member with a proximate end and a distal end operatively disposed between said inner and said outer members. The distal end of the outer member is fixedly mounted to the distal end of the compensating member. The proximate end of the compensating member is fixedly mounted to the proximate end of the inner member.Type: GrantFiled: September 30, 2003Date of Patent: December 28, 2004Assignee: Metronom U.S., Inc.Inventor: Ingobert Schmadel
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Patent number: 6833912Abstract: An apparatus for testing the state of the optical system of an endoscope comprises a first supporting device for the endoscope, a test pattern and a second supporting device for the test pattern, wherein the test pattern comprises a pattern, which allows a check of the actual viewing direction and of the actual field of view angle within tolerance values.Type: GrantFiled: September 5, 2001Date of Patent: December 21, 2004Assignee: Karl Storz GmbH & Co. KGInventors: Fang Lei, Jürgen Rudischhauser, Jörg Weitzel, Volker Preuss
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Publication number: 20040252298Abstract: An emulative particle contamination standard is fabricated using photolithography and semiconductor processes to produce raised features, such as in a thick photoresist layer, to create stable and resilient raised structures that mimic realistic contamination, so as to enable the reproducible production of the emulative particle contamination standards that comprise the raised features of various sizes, shapes, and distribution across a highly reflective surface of an underlying substrate.Type: ApplicationFiled: June 12, 2003Publication date: December 16, 2004Inventors: Kenneth T. Luey, Gidget Kaye Ternet, Bruce H. Weiller
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Patent number: 6822748Abstract: Calibration techniques are disclosed for determining the rigid-body coordinate transformation that will precisely align the coordinate frame of a laser scanner with the coordinate frames of several different motion axes. The theory and use of at least these concepts are introduced by examining how these concepts aid the construction and use of a non-contact laser scanning system.Type: GrantFiled: October 29, 2003Date of Patent: November 23, 2004Assignee: Metron Systems, Inc.Inventors: Kyle S. Johnston, Charles M. Bass
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Publication number: 20040223148Abstract: In a calibration method for a surface texture measuring instrument which measures a surface of a workpiece and includes an arm that is supported to be swingable around a base point thereof and is provided with a contact point at an end for scanning the workpiece surface, the calibration method includes a measurement step for measuring a calibration gauge of which cross section contains a part of a substantially perfect circle, an assignment step for assigning the detection results, which are obtained in the measurement step, in an evaluation formula based on a circle equation in which the center coordinates of the calibration gauge are (xc, zc) and the radius is “r”, and a calibration step for calibrating each parameter based on the evaluation formula obtained in the assignment step.Type: ApplicationFiled: April 28, 2004Publication date: November 11, 2004Applicant: MITUTOYO CORPORATIONInventor: Isamu Takemura
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Patent number: 6809865Abstract: A wavelength reference (10) including at least one gas-tunable etalons (12). Each etalon (12) has first and second reflective surfaces (20,22), making a reflecting surface pair (23). Each reflecting surface pair (23) surrounds a cavity (16) which is filled with a gas-tunable medium (19) having a variable optical index of refraction. The etalons (12) produce equally-spaced spectral lines (4) which are variable in response to changes in the gas-tunable medium (19) such as varying gas pressure or composition. The spectral lines (4) are tuned to align to an external wavelength standard, preferably an ITU reference grid (2). The properties of the gas-tunable medium (19) are then fixed, preferably by sealing an enclosure (14) which surrounds the etalons (12), so that they act as a wavelength reference (10). The etalon (12) can be a reflective etalon (29) or in an alternate embodiment (60), can be a transmissive etalon (29).Type: GrantFiled: September 27, 2001Date of Patent: October 26, 2004Assignee: Fibera, Inc.Inventor: George C. K. Chen
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Publication number: 20040196455Abstract: The invention relates to a device for referencing fluorescence signals and/or calibration of fluorescence detection systems, whereby the device comprises an essentially non-fluorescing support, on which are applied polymer layers in several defined regions and with partly varying thicknesses and/or compositions. Said polymer layers are applied to the support such as to fluoresce after corresponding irradiation and the device may thus be used as a fluorescence standard. The invention further relates to a method for the production of said fluorescence standards.Type: ApplicationFiled: May 24, 2004Publication date: October 7, 2004Inventors: Eugen Ermantraut, Thomas Kaiser, Jens Tuchscheerer
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Publication number: 20040169857Abstract: A ceramic reference in conjunction with a spectrometer, a metallized ceramic material, and a method of utilizing a ceramic material as a reference in the ultraviolet, visible, near-infrared, or infrared spectral regions are presented. The preferred embodiments utilize a ceramic reference material to diffusely reflect incident source light toward a detector element for quantification in a reproducible fashion. Alternative embodiments metallize either the incident surface or back surface of to form a surface diffuse reflectance standard. Optional wavelength reference layers or protective layers may be added to the ceramic or to the metallized layer. The reference ceramic is used to provide a measure of optical signal of an analyzer as a function of the analyzers spatial, temporal, and environmental state.Type: ApplicationFiled: November 25, 2003Publication date: September 2, 2004Inventors: George M. Acosta, Kevin H. Hazen, N. Alan Abul-Haj, Stephen L. Monfre, Thomas B. Blank
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Publication number: 20040150816Abstract: A target, which is photographed with an object at a spot for a photogrammetric analytical measurement, includes a first bar and a second bar that are connected to each other; at least three standard point members, lying on one plane, and fixed on the first bar and the second bar; and non-reflecting members that are respectively attachable to and removable from said at least three standard points. The at least three standard point members may respectively include a circular portion, a diameter of which substantially equals a width of the first bar and the second bar. Each of the non-reflecting members includes a circular plate defining a circular opening, a diameter of which substantially equals the diameter of the circular portion of the three standard point members.Type: ApplicationFiled: January 22, 2004Publication date: August 5, 2004Applicant: PENTAX CorporationInventors: Shigeru Wakashiro, Atsumi Kaneko, Masami Shirai, Kiyoshi Yamamoto
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Patent number: 6744499Abstract: A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized correlation method. Additionally, other physical characteristics such as linear detector tilt, horizontal scale factor, and vertical scale factor are measured and compensated for in the process of placing the component. Nozzle runout, another physical characteristic, is also measured by a sinusoidal curve fit method, and the resulting Z-height calibration data is used to later place the component.Type: GrantFiled: January 7, 2003Date of Patent: June 1, 2004Assignee: CyberOptics CorporationInventors: Timothy A. Skunes, Eric P. Rudd, David W. Duquette
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Publication number: 20040075829Abstract: A roundness calibration device includes a ring or plug gauge with a wall defining an arcuate surface traversable by a sensing probe. A protuberance, typically in the form of a piston, is displaceably mounted in a radial bore in the wall. A displacement device adjusts the amount of protrusion of said protuberance to locally, radially modify the arcuate surface. A calibrated measuring device accurately determines the amount of protrusion.Type: ApplicationFiled: December 5, 2002Publication date: April 22, 2004Inventors: Kostadin Doytchinov, Jim Pekelsky, Lorne Munro
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Patent number: 6721054Abstract: A method for accurately measuring the reflectance of translucent objects by illuminating small areas of the object is disclosed. The method involves determining the lateral diffusion error by use of a predetermined set of calibration standards. The lateral diffusion error is added to the uncorrected reflectance to produce the corrected reflectance value. The method has widespread potential applications in the paper, printing, textile, coating, and food industries.Type: GrantFiled: October 11, 2001Date of Patent: April 13, 2004Inventor: David L. Spooner
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Publication number: 20040066508Abstract: The present invention overcomes the disadvantages of the related art by providing a spatial reference system that includes at least one artifact assembly. The artifact assembly has a measuring bar assembly including an inner member with a proximate end and a distal end, an outer member with a proximate end and a distal end, and a compensating member with a proximate end and a distal end operatively disposed between said inner and said outer members. The distal end of the outer member is fixedly mounted to the distal end of the compensating member. The proximate end of the compensating member is fixedly mounted to the proximate end of the inner member.Type: ApplicationFiled: September 30, 2003Publication date: April 8, 2004Inventor: Ingobert Schmadel
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Publication number: 20040061852Abstract: The invention is directed to a device for calibrating an optical detection channel for a two-dimensional, spatially dependent measurement of fluorescent or luminescent radiation in multi-specimen carriers.Type: ApplicationFiled: September 26, 2003Publication date: April 1, 2004Applicant: CyBio AGInventors: Juergen Wulf, Andreas Fina, Michael Eberhard
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Patent number: 6710798Abstract: A probe card inspection system uses a fiduciary plate having a plurality of targets deposited thereon by photolithography and vapor deposition. A plurality of semiconductor probe card probe tips are contacted with the fiducial pattern on the plate. An electronic imaging system determines the position of geometric centroids of the probe tips with respect to an index mark in the fiducial pattern. A central processor determines the position of each imaged probe tip(s) with respect to the index mark, and calculates the relative positions of each probe tip from that data.Type: GrantFiled: March 9, 1999Date of Patent: March 23, 2004Assignee: Applied Precision LLCInventors: Ron Hershel, Rich Campbell, Timothy S. Killeen, Donald B. Snow
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Patent number: 6704102Abstract: A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.Type: GrantFiled: February 6, 2001Date of Patent: March 9, 2004Assignee: Metronics, Inc.Inventor: Richard Roelke
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Publication number: 20040036867Abstract: The invention relates to a one-dimensional calibration standard for coordinate measuring devices, especially for optical coordinate measuring devices, so-called laser trackers that are provided with a rod-shaped calibration device. The inventive device is characterized in that the rod-shaped calibration device consists of a single material having a thermal expansion coefficient of <5×10−6K−1 and that the rod-shaped calibration device is provided with at least two bores at predetermined calibrated intervals into which the reflective devices of the optical measuring device or the balls used for the calibration of scanning coordinate measuring systems can be exactly and reproducibly inserted and withdrawn in order to calibrate the coordinate measuring device.Type: ApplicationFiled: November 14, 2002Publication date: February 26, 2004Inventors: Ralf Jedamzik, Armin Thomas, Thorsten Dhring
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Publication number: 20040036868Abstract: A multi-modality fluorescence reference plate comprising wells coated with a fluorogenic compound is described, together with a method of producing such a plate. The plate has utility for calibrating fluorescent plate readers and imaging systems for measuring steady-state fluorescence, time-resolved fluorescence, fluorescence lifetime and/or fluorescence polarisation.Type: ApplicationFiled: May 21, 2003Publication date: February 26, 2004Inventors: Christopher Nicholas Jones, Philip John Meyler, Robert Arnold Jessop, Malcolm John Hatcher, Michael Keith Page, Michael Roger Looker
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Patent number: RE39268Abstract: A method and system for simulating living tissue which is to be monitored by a pulse oximeter that provides red and infrared light flashes, the system including structure for: converting the red and infrared light flashes of the pulse oximeter into electrical signals; modulating the converted electrical signals to provide modulated electrical signals; and converting the modulated electrical signals to light flashes and transmitting the converted light flashes to the pulse oximeter for detection so that the pulse oximeter responds to the converted light flashes as it would to light flashes modulated by a living tissue.Type: GrantFiled: May 25, 2004Date of Patent: September 5, 2006Assignee: Fluke Electronics Corp.Inventors: Edwin B. Merrick, Kay Haas, John Tobey Clark, Michael William Lane, Peter Haas