Standard Patents (Class 356/243.1)
  • Patent number: 7317523
    Abstract: A method for calibrating a metrology tool, the method includes: determining a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; and defining a calibration parameter in response to the relationship. A metrology system that includes: a miller adapted to mill a reference structural element; and a measurement device adapted to determine a relationship between an upper portion of a milled reference structural element and between a lower portion of the milled reference structural element; wherein the metrology system is further adapted to define a calibration parameter in response to the relationship.
    Type: Grant
    Filed: May 12, 2005
    Date of Patent: January 8, 2008
    Assignee: Applied Materials, Israel, Ltd.
    Inventors: Nadav Wertsman, Ovadya Menadeva
  • Patent number: 7315368
    Abstract: A spectra generator having an electrically programmable diffraction grating. There may be a broad band light source that emits light which is diffracted by the grating. Diffracting elements in the grating may be individually adjustable so that generation of a specific spectrum or spectra may be achieved. The diffracting elements may be adjusted according to electrical signals of a program from a computer. The generated synthetic spectra may be used for testing and calibration of spectrometers or other devices. Synthetic spectra may also be used for scene generation and other purposes.
    Type: Grant
    Filed: September 22, 2004
    Date of Patent: January 1, 2008
    Assignee: Honeywell International Inc.
    Inventor: G. Benjamin Hocker
  • Publication number: 20070291250
    Abstract: A solid element for use as a control or calibration element which can be used in a diagnostic analyzer. The element includes a translucent or transparent solid material which when illuminated by a light source emits light corresponding to a specified concentration of a specific analyte as an analyte being measured.
    Type: Application
    Filed: June 20, 2006
    Publication date: December 20, 2007
    Inventors: Michael W. LaCourt, Glenn M. Mehalek
  • Patent number: 7307715
    Abstract: The structure size of a structure (100) is measured by forming an auxiliary measured value (Dx?, Dy?). A calibration measured value (Px?, Py?) is determined on the basis of a calibration structure (110), which comprises at least two structure elements (140) at a distance from one another, including at least the measured value sum of the width (By?) of one of the two structure elements (140) and the distance (Ay?) between the two structure elements (140). The calibration measured value (Px?, Py?) and a predetermined calibration preset value (Px, Py), which relates to the calibration structure (110), result in the determination of a calibration factor (C, Cx, Cy). The auxiliary measured value (Dx?, Dy?) is corrected using the calibration factor (C, Cx, Cy) in order to form the structure size measured value (Dx,k; Dy,k).
    Type: Grant
    Filed: April 22, 2005
    Date of Patent: December 11, 2007
    Assignee: Infineon Technologies AG
    Inventor: Christian Rotsch
  • Patent number: 7301638
    Abstract: A calibration standard, for calibrating lateral or angular dimensional measurement systems, is provided. The standard may include a first substrate spaced from a second substrate. The standard may be cross-sectioned in a direction substantially perpendicular or substantially non-perpendicular to an upper surface of the first substrate. The cross-sectioned portion of the standard may form a viewing surface of the calibration standard. The standard may include at least one layer disposed between the first and second substrates. The layer, or a feature etched into the first or second substrate or a feature etched into the layer may have a traceably measured thickness or may be oriented at a traceably measured angle with respect to the viewing surface. A thickness or angle of the layer or other feature may be traceably measured using any technique for calibrating a measurement system with a standard reference material traceable to a national testing authority.
    Type: Grant
    Filed: January 31, 2004
    Date of Patent: November 27, 2007
    Assignee: KLA Tencor, Inc.
    Inventors: Marco Tortonese, Jerry Prochazka, Ellen Laird, Pat Brady, Rene M. Blanquies
  • Publication number: 20070222980
    Abstract: A measurement system that can self calibrate is disclosed. The measurement system comprising a first light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second light source aligned along the second axis that is configured to illuminate the sensor during a calibration procedure.
    Type: Application
    Filed: December 11, 2006
    Publication date: September 27, 2007
    Inventor: Perry A. Palumbo
  • Patent number: 7262842
    Abstract: The invention relates to a device for referencing fluorescence signals and/or calibration of fluorescence detection systems, whereby the device comprises an essentially non-fluorescing support, on which are applied polymer layers in several defined regions and with partly varying thicknesses and/or compositions. Said polymer layers are applied to the support such as to fluoresce after corresponding irradiation and the device may thus be used as a fluorescence standard. The invention further relates to a method for the production of said fluorescence standards.
    Type: Grant
    Filed: March 20, 2002
    Date of Patent: August 28, 2007
    Assignee: Clondiag Chip Technologies GmbH
    Inventors: Eugen Ermantraut, Thomas Kaiser, Jens Tuchscheerer
  • Patent number: 7248356
    Abstract: A calibration aid may be assembled as follows. First, the standard reference substance is prepared by dissolving ICG dye and albumin protein in water. Then, the carrier sheet of fleece material is soaked therein and dried. After drying the carrier sheet, a thin well defined layer of protein bound dye is present at the surface of the fleece material. The carrier sheet and the backing sheet are laminated into a plastic card. For this, the plastic layers may be laminated tightly together in the framing region for example by welding or by use of adhesive. The plastic card is then sterilized and packed into a sealed package.
    Type: Grant
    Filed: April 6, 2004
    Date of Patent: July 24, 2007
    Assignee: Pulsion Medical Systems AG
    Inventor: Ulrich J. Pfeiffer
  • Patent number: 7241399
    Abstract: Methods for the preparation of inorganic nanoparticles capable of fluorescence, wherein the nanoparticles consist of a host material that comprises at least one dopant. The synthesis of the invention in organic solvents allows to gain a considerably higher yield compared to the prior art synthesis in water. All kinds of objects can advantageously be marked and reliably authenticated by using an automated method on the basis of a characteristic emission. Further, the size distribution of the prepared nanoparticles is nartower which renders a subsequent size-selected separation process superfluous.
    Type: Grant
    Filed: September 7, 2001
    Date of Patent: July 10, 2007
    Assignee: Centrum fuer Angewandte Nanotechnologie (CAN) GmbH
    Inventors: Stephan Haubold, Markus Haase, Karsten Riwotzki, Horst Weller, Heike Meyssamy, Fernando Ibarra
  • Patent number: 7236241
    Abstract: A method of making a standard tool for calibrating polarimeters that analyze stress in photoelastic material, includes the steps of partially annealing a starting piece of tempered glass so that the starting piece has a retardance below 250 nm/cm, removing a peripheral portion of the starting piece (preferably, at least about 20% of its radial dimension) to leave a working piece, cutting a rectangular parallelepiped from the working piece, polishing two opposing faces of the rectangular parallelepiped where the two opposing faces are spaced apart by a measurement distance through which light passes during stress analysis in a polarimeter, and determining a birefringence of the rectangular parallelepiped across the measurement distance using a calibrated polarimeter. The standard tool is the rectangular parallelepiped having the determined birefringence for the measurement distance. The method can be used to make a set of the standard tools with different measurement distances.
    Type: Grant
    Filed: March 30, 2005
    Date of Patent: June 26, 2007
    Assignee: Osram Sylvania Inc.
    Inventors: Mary Ann Johnson, David W. Johnston
  • Patent number: 7230696
    Abstract: A system that calibrates instruments for measuring the light or air permeability of a material, and includes a calibration target which can be used for calibration of either light-based or air-based instruments. The calibration target simulates the material whose permeability is being measured, and includes a plate having multiple, angled or parallel rows of perforations provided therethrough. The permeability measuring instrument measures the permeability of the calibration target, and compares the measured permeability with a predetermined permeability of the calibration target and calibrates the permeability measuring instrument based upon the comparison.
    Type: Grant
    Filed: May 26, 2004
    Date of Patent: June 12, 2007
    Assignee: Philip Morris USA Inc.
    Inventor: Bogdan N. Alexander
  • Patent number: 7227629
    Abstract: An optical measurement device calibration tool includes an optical probe suitable for calibrating various optical imaging devices, for example, low coherence reflectometers and optical coherence tomography devices. In a preferred embodiment the calibration tool comprises a container containing a calibration substance with stable optical scattering and absorption properties. The calibration substance includes a gel, paste or grease substance and is covered a protective seal, which is at least partially transparent providing optical contact between the optical probe and the calibration substance. The protective seal is covered with a viscous complementary material. Another protective seal made at least partially removable is placed above the viscous complementary material and may serve as a cover for the container.
    Type: Grant
    Filed: June 15, 2005
    Date of Patent: June 5, 2007
    Assignee: Imalux Corporation
    Inventors: Felix I. Feldchtein, J. Lloyd Breedlove, Stephanie A. S. Harrington
  • Patent number: 7193701
    Abstract: A system for providing and using a gray optical standard is disclosed, the standard generally comprising a housing having a cavity and an at least partially transparent portion adjacent to the cavity for receiving the radiation emitted radiation by an optical instrument and a particulate material disposed in the cavity. The particulate material is a mixture of highly absorptive and highly reflective particles having a diameter of about 20 microns or less. In some embodiments, the at least partially transparent portion of the housing is modified to be highly diffusely scattering in the wavelength region of interest.
    Type: Grant
    Filed: July 29, 2005
    Date of Patent: March 20, 2007
    Inventor: Howard L. Mark
  • Patent number: 7180607
    Abstract: A measuring system including a measuring device with a laser tracker and an opto-electronic sensor having fixed positions relative to one another and an auxiliary measuring tool with a reflector and at least three light spots, is calibrated. The auxiliary measuring tool is rigidly coupled with an arrangement of auxiliary reflectors and is moved around at least two different rotation axes. Reflector and auxiliary reflectors are registered by the laser tracker and the light spots are registered by the opto-electronic sensor. From the data of the laser tracker, positions and orientations of the reflector arrangement relative to the laser tracker and from the data of the opto-electronic sensor, positions and orientations of the light spot arrangement relative to the opto-electronic sensor are calculated and the two rotation axes relative to the reflector arrangement and the light spot arrangement are calculated. Calibration data are calculated by equating corresponding rotation axes.
    Type: Grant
    Filed: November 14, 2003
    Date of Patent: February 20, 2007
    Assignee: Leica Geosystems AG
    Inventors: Stephen Kyle, Konrad von Arb
  • Patent number: 7151597
    Abstract: The optical wavelength standard comprises a diffraction grating having a diffractive surface, an input arrangement and an output optical arrangement. The input optical arrangement is located to illuminate the diffractive surface of the diffraction grating with incident light at an angle of incidence at which absorption of the incident light at a resonance wavelength generates surface plasmons. The output optical arrangement is located to receive the incident light specularly reflected from the diffractive surface of the diffraction grating as reflected light. The reflected light includes an absorption line at the resonance wavelength. The absorption line provides the wavelength reference. The resonance wavelength is defined by the angle of incidence and the physical characteristics of the diffraction grating. A desired resonance wavelength can be obtained by appropriately defining the angle of incidence and the physical characteristics of the diffraction grating.
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: December 19, 2006
    Assignee: Agilent Technologie, Inc
    Inventors: Annette C. Grot, Thomas J. Mikes
  • Patent number: 7115232
    Abstract: A fluorescence validation microplate for testing the validity of a fluorometer is provided which can efficiently and cost-effectively test fluorometers to determine linearity, alignment, reproducibility, filter integrity, and cross-talk, each of which is important to proper functioning of the fluorometer.
    Type: Grant
    Filed: May 24, 2002
    Date of Patent: October 3, 2006
    Inventor: Gordon S. Hudson
  • Patent number: 7106435
    Abstract: A hyperspectral scene generator generates a projected linear scene where the spectral characteristics at each location that forms the scene are dynamically and arbitrarily controllable. The generator can be controlled to generate a projected linear scene including a targeted object and arbitrary spectral content that duplicates the spectral content of real targets and backgrounds to facilitate testing of target identification software of a hyperspectral imaging system in view of expected actual field operation of the sensor of the imaging system.
    Type: Grant
    Filed: March 17, 2004
    Date of Patent: September 12, 2006
    Assignee: DRS Sensors & Targeting Systems, Inc.
    Inventor: Neil R. Nelson
  • Patent number: 7099015
    Abstract: A fiber optic sensing device uses a Fabry-Perot cavity to sense a physical parameter. The cavity modulates the incident polychromatic light. The modulated light is recorded by an optical spectrometer means. The spectrum is analyzed in a signal processing unit which normalizes the spectrum and determines the phase of the modulated signal. The phase, accumulated over whole range of wavelengths, has been used for identification of the physical parameter using a look-up-table. The cavity, the polychromatic light source and the spectroscope means are connected by fiber optic means.
    Type: Grant
    Filed: August 25, 2003
    Date of Patent: August 29, 2006
    Inventor: Ivan Melnyk
  • Patent number: 7084386
    Abstract: A light source calibration target has a surface in view of a camera of an image capture system, The target includes a substrate having a substantially Lambertian surface, a visually distinct polygonal shape having corners formed on said surface so as to be visually distinct from the surface, and a plurality of objects each having an upstanding tip mounted on the surface, A method of using the calibration target operates, for each of the light sources to be calibrated, to capture an image of the target; process the captured image to derive light source calibration data and to store the calibration data.
    Type: Grant
    Filed: May 2, 2003
    Date of Patent: August 1, 2006
    Assignee: International Business Machines Corporation
    Inventors: Fausto Bernardini, Frank P. Giordano, Jose Gomes, Holly Rushmeier
  • Patent number: 7068366
    Abstract: A simulated calibration and verification reference sample for a measurement system including a blackbody radiation source and a spectrographic sensor is disclosed. By providing a simulating reference sample, no actual sample is required and the problems associated with an actual sample including preparation, maintenance, use, storage, replacement and the like are eliminated.
    Type: Grant
    Filed: October 31, 2003
    Date of Patent: June 27, 2006
    Assignee: ABB Inc.
    Inventor: Gary Neil Burk
  • Patent number: 7061608
    Abstract: An apparatus and related method for optical calibration of spectrophotometers is described. The apparatus is a calibration plate including one or more cuvettes filled with solutions of interest. The cuvettes are sealed to prevent evaporation. The cuvettes also possess a compressible component to allow for expansion of the solution and a bubble control apparatus to ensure that the compressible component does not intersect the beam path. A piece of neutral density glass is optionally included in the apparatus to track optical changes of the solutions over time.
    Type: Grant
    Filed: January 30, 2004
    Date of Patent: June 13, 2006
    Assignee: Artel, Inc.
    Inventors: John Thomas Bradshaw, Richard H. Curtis
  • Patent number: 7054000
    Abstract: A method of calibration of magnification of a microscope with the use of a diffraction grating has the steps of determining a mean period of a diffraction grating by irradiating the diffraction grating with an electromagnetic radiation having a known wavelength and analyzing a resulting diffraction pattern, determining a scatter of individual values of a period of the diffraction grating by multiple measurements of periods of the diffraction grating by a microscope in pixels in one area in a microscope field of view, and calculating a mean value of the period and the scatter based on the measurements, determining a sufficient number of measurements of the period for providing an accepted statistic error of a magnification of the microscope, performing measurements corresponding to the determined acceptable number of measurements, of individual values of the period in pixels in a plurality of portions of the diffraction grating, calculating a general mean value of the period in pixels based on the immediately
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: May 30, 2006
    Assignee: General Phosphorix LLC
    Inventors: Arkady Nikitin, Albert Sicignano, Dmitriy Yeremin, Tim Goldburt
  • Patent number: 7016032
    Abstract: The invention is directed to a device for calibrating an optical detection channel for a two-dimensional, spatially dependent measurement of fluorescent or luminescent radiation in multi-specimen carriers. The invention provides a system for calibrating an optical detection channel for a two-dimensional, spatially dependent measurement of fluorescent or luminescent radiation in multi-specimen carriers permitting a highly accurate calibration of the spatial sensitivity distribution of the sensor array in the detection channel. The invention provides a plate-shaped housing, a luminescent foil inside the housing which is arranged parallel to the window so as to cover its surface, a power source and control units which are provided in the housing for controlling the luminescent foil, so that the luminescent foil can be controlled for homogeneous emission of luminescent light through the window of the housing in different intensity levels.
    Type: Grant
    Filed: September 26, 2003
    Date of Patent: March 21, 2006
    Assignee: CyBio AG
    Inventors: Juergen Wulf, Andreas Fina, Michael Eberhard
  • Patent number: 6993179
    Abstract: The shape of a three-dimensional object is determined from uncalibrated stereo images by first determining the projection of the point on a reference plane. The distance of each point from the reference plane is obtained by a technique that makes use of a calibration based on two known points visible in each camera's field of view. The method requires only one high precision measurement, which is the depth of the two calibration points from a reference plane. These may be supplied in a setup apparatus thereby avoiding the need for a user to make measurements. The rest of the required calibration data may be derived directly from the images of the cameras.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: January 31, 2006
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Daphna Weinshall, Mi-Suen Lee
  • Patent number: 6989896
    Abstract: A standardized sample for scatterometry includes four quadrants each including an inner block surrounded by four outer blocks. A pattern of gratings is repeated within each of the blocks using different resolutions and orientations. Each grating within an outer block has a matching grating within the block's pair. A grating and its matching grating are negative images of each other—the pitch and line-size of a grating are equal, respectively to the line size and pitch of the matching grating. The inner block also includes a series of background patterns positioned behind the gratings. These patterns include repeating patterns of hole and repeating line structures. This series of structures cover a large die area, helping to simulate the conditions faced by real-world scatterometers. The various structures feature a high-degree of alignment, allowing rapid verification using SEM or other techniques.
    Type: Grant
    Filed: October 9, 2002
    Date of Patent: January 24, 2006
    Assignee: Therma-Wave, Inc.
    Inventors: Youxian Wen, Cheryl Staat, Jon Opsal
  • Patent number: 6956649
    Abstract: A ceramic reference in conjunction with a spectrometer, a metallized ceramic material, and a method of utilizing a ceramic material as a reference in the ultraviolet, visible, near-infrared, or infrared spectral regions are presented. The preferred embodiments utilize a ceramic reference material to diffusely reflect incident source light toward a detector element for quantification in a reproducible fashion. Alternative embodiments metallize either the incident surface or back surface of to form a surface diffuse reflectance standard. Optional wavelength reference layers or protective layers may be added to the ceramic or to the metallized layer. The reference ceramic is used to provide a measure of optical signal of an analyzer as a function of the analyzers spatial, temporal, and environmental state.
    Type: Grant
    Filed: November 25, 2003
    Date of Patent: October 18, 2005
    Assignee: Sensys Medical, Inc.
    Inventors: George M. Acosta, Kevin H. Hazen, N. Alan Abul-Haj, Stephen L. Monfre, Thomas B. Blank
  • Patent number: 6954681
    Abstract: An electronics assembly system includes an image acquisition system that is coupled to a controller through an improved interface. The coupling facilitates advanced monitoring and control of the image acquisition system. Multiple image acquisition systems can be coupled to the controller over the same interface.
    Type: Grant
    Filed: December 24, 2003
    Date of Patent: October 11, 2005
    Assignee: CyberOptics Corporation
    Inventors: Lance K. Fisher, John D. Gaida, Joseph L. Horijon, Todd D. Liberty
  • Patent number: 6917422
    Abstract: The present invention provides a photometric reference member comprising PTFE and glass. The member exhibits an absorbance change of less than 0.0001 absorbance units per degree C. over a range of temperatures, preferably from about 20° C. to about 40° C., and over wavelengths from about 600 nm to about 1650 nm, preferably about 600 nm to about 1050 nm. The invention also pertains to methods of using the photometric reference member to correct for temperature variations or drift in absorbance measurements.
    Type: Grant
    Filed: January 22, 2003
    Date of Patent: July 12, 2005
    Assignee: NIR Diagnostics Inc.
    Inventors: James Samsoondar, Ashwani Kaushal
  • Patent number: 6912049
    Abstract: The present invention provides a thermally stable reference member comprising, at least one radiation attenuating element and at least one radiation scattering element. The radiation attenuating element comprising at least one aperture for transmission of radiation therethrough. The attenuating and scattering elements placed in series so that radiation transmitted through the reference member passes through each of the attenuating and scattering elements. The attenuating and scattering elements of the reference member may further comprise a thermally stable mount to hold the elements in a selected position relative to each other, and in relation to an instrument, or the elements may be bonded together.
    Type: Grant
    Filed: December 18, 2002
    Date of Patent: June 28, 2005
    Assignee: NIR Diagnostics, Inc.
    Inventors: Romuald Pawluczyk, Theodore Cadell, Bronislaw Bednarz, Ashwani Kaushal
  • Patent number: 6842241
    Abstract: A method for checking the operation of a laboratory instrument used in biochemistry by means of an individual test plate (10) by comparing measured values of sample units (20, 21) placed in the wells (12) of the frame plate (11) to previously known measured values verified by a reference device. The sample unit (20) placed in the frame plate (11) of the test plate (10) is a teflon plastic cup (22) provided with an aluminum cover (23), the sample material (24) in powdery form being placed in said cup, or an optical filter (21), which is locked in place by means of a locking spring ring (25).
    Type: Grant
    Filed: September 4, 2002
    Date of Patent: January 11, 2005
    Assignee: Wallac Oy
    Inventors: Raimo Harju, Sanna Tauluvuori
  • Publication number: 20040263840
    Abstract: A method for calibrating an inspection machine including a plurality of displacement detectors for inspecting a production part and a linear motion stage for relative motion between the displacement detectors and the production part. The method includes determining relative positional errors of the displacement detectors relative to each other, determining the effect of motion stage errors on a first detector from the plurality of displacement detectors as a function of position of the motion stage, and determining the effect of motion stage errors on the remaining displacement detectors as a function of position of the motion stage.
    Type: Application
    Filed: May 24, 2004
    Publication date: December 30, 2004
    Inventors: Stephen B. Segall, Juris Upatnieks
  • Patent number: 6836323
    Abstract: The present invention overcomes the disadvantages of the related art by providing a spatial reference system that includes at least one artifact assembly. The artifact assembly has a measuring bar assembly including an inner member with a proximate end and a distal end, an outer member with a proximate end and a distal end, and a compensating member with a proximate end and a distal end operatively disposed between said inner and said outer members. The distal end of the outer member is fixedly mounted to the distal end of the compensating member. The proximate end of the compensating member is fixedly mounted to the proximate end of the inner member.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: December 28, 2004
    Assignee: Metronom U.S., Inc.
    Inventor: Ingobert Schmadel
  • Patent number: 6833912
    Abstract: An apparatus for testing the state of the optical system of an endoscope comprises a first supporting device for the endoscope, a test pattern and a second supporting device for the test pattern, wherein the test pattern comprises a pattern, which allows a check of the actual viewing direction and of the actual field of view angle within tolerance values.
    Type: Grant
    Filed: September 5, 2001
    Date of Patent: December 21, 2004
    Assignee: Karl Storz GmbH & Co. KG
    Inventors: Fang Lei, Jürgen Rudischhauser, Jörg Weitzel, Volker Preuss
  • Publication number: 20040252298
    Abstract: An emulative particle contamination standard is fabricated using photolithography and semiconductor processes to produce raised features, such as in a thick photoresist layer, to create stable and resilient raised structures that mimic realistic contamination, so as to enable the reproducible production of the emulative particle contamination standards that comprise the raised features of various sizes, shapes, and distribution across a highly reflective surface of an underlying substrate.
    Type: Application
    Filed: June 12, 2003
    Publication date: December 16, 2004
    Inventors: Kenneth T. Luey, Gidget Kaye Ternet, Bruce H. Weiller
  • Patent number: 6822748
    Abstract: Calibration techniques are disclosed for determining the rigid-body coordinate transformation that will precisely align the coordinate frame of a laser scanner with the coordinate frames of several different motion axes. The theory and use of at least these concepts are introduced by examining how these concepts aid the construction and use of a non-contact laser scanning system.
    Type: Grant
    Filed: October 29, 2003
    Date of Patent: November 23, 2004
    Assignee: Metron Systems, Inc.
    Inventors: Kyle S. Johnston, Charles M. Bass
  • Publication number: 20040223148
    Abstract: In a calibration method for a surface texture measuring instrument which measures a surface of a workpiece and includes an arm that is supported to be swingable around a base point thereof and is provided with a contact point at an end for scanning the workpiece surface, the calibration method includes a measurement step for measuring a calibration gauge of which cross section contains a part of a substantially perfect circle, an assignment step for assigning the detection results, which are obtained in the measurement step, in an evaluation formula based on a circle equation in which the center coordinates of the calibration gauge are (xc, zc) and the radius is “r”, and a calibration step for calibrating each parameter based on the evaluation formula obtained in the assignment step.
    Type: Application
    Filed: April 28, 2004
    Publication date: November 11, 2004
    Applicant: MITUTOYO CORPORATION
    Inventor: Isamu Takemura
  • Patent number: 6809865
    Abstract: A wavelength reference (10) including at least one gas-tunable etalons (12). Each etalon (12) has first and second reflective surfaces (20,22), making a reflecting surface pair (23). Each reflecting surface pair (23) surrounds a cavity (16) which is filled with a gas-tunable medium (19) having a variable optical index of refraction. The etalons (12) produce equally-spaced spectral lines (4) which are variable in response to changes in the gas-tunable medium (19) such as varying gas pressure or composition. The spectral lines (4) are tuned to align to an external wavelength standard, preferably an ITU reference grid (2). The properties of the gas-tunable medium (19) are then fixed, preferably by sealing an enclosure (14) which surrounds the etalons (12), so that they act as a wavelength reference (10). The etalon (12) can be a reflective etalon (29) or in an alternate embodiment (60), can be a transmissive etalon (29).
    Type: Grant
    Filed: September 27, 2001
    Date of Patent: October 26, 2004
    Assignee: Fibera, Inc.
    Inventor: George C. K. Chen
  • Publication number: 20040196455
    Abstract: The invention relates to a device for referencing fluorescence signals and/or calibration of fluorescence detection systems, whereby the device comprises an essentially non-fluorescing support, on which are applied polymer layers in several defined regions and with partly varying thicknesses and/or compositions. Said polymer layers are applied to the support such as to fluoresce after corresponding irradiation and the device may thus be used as a fluorescence standard. The invention further relates to a method for the production of said fluorescence standards.
    Type: Application
    Filed: May 24, 2004
    Publication date: October 7, 2004
    Inventors: Eugen Ermantraut, Thomas Kaiser, Jens Tuchscheerer
  • Publication number: 20040169857
    Abstract: A ceramic reference in conjunction with a spectrometer, a metallized ceramic material, and a method of utilizing a ceramic material as a reference in the ultraviolet, visible, near-infrared, or infrared spectral regions are presented. The preferred embodiments utilize a ceramic reference material to diffusely reflect incident source light toward a detector element for quantification in a reproducible fashion. Alternative embodiments metallize either the incident surface or back surface of to form a surface diffuse reflectance standard. Optional wavelength reference layers or protective layers may be added to the ceramic or to the metallized layer. The reference ceramic is used to provide a measure of optical signal of an analyzer as a function of the analyzers spatial, temporal, and environmental state.
    Type: Application
    Filed: November 25, 2003
    Publication date: September 2, 2004
    Inventors: George M. Acosta, Kevin H. Hazen, N. Alan Abul-Haj, Stephen L. Monfre, Thomas B. Blank
  • Publication number: 20040150816
    Abstract: A target, which is photographed with an object at a spot for a photogrammetric analytical measurement, includes a first bar and a second bar that are connected to each other; at least three standard point members, lying on one plane, and fixed on the first bar and the second bar; and non-reflecting members that are respectively attachable to and removable from said at least three standard points. The at least three standard point members may respectively include a circular portion, a diameter of which substantially equals a width of the first bar and the second bar. Each of the non-reflecting members includes a circular plate defining a circular opening, a diameter of which substantially equals the diameter of the circular portion of the three standard point members.
    Type: Application
    Filed: January 22, 2004
    Publication date: August 5, 2004
    Applicant: PENTAX Corporation
    Inventors: Shigeru Wakashiro, Atsumi Kaneko, Masami Shirai, Kiyoshi Yamamoto
  • Patent number: 6744499
    Abstract: A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized correlation method. Additionally, other physical characteristics such as linear detector tilt, horizontal scale factor, and vertical scale factor are measured and compensated for in the process of placing the component. Nozzle runout, another physical characteristic, is also measured by a sinusoidal curve fit method, and the resulting Z-height calibration data is used to later place the component.
    Type: Grant
    Filed: January 7, 2003
    Date of Patent: June 1, 2004
    Assignee: CyberOptics Corporation
    Inventors: Timothy A. Skunes, Eric P. Rudd, David W. Duquette
  • Publication number: 20040075829
    Abstract: A roundness calibration device includes a ring or plug gauge with a wall defining an arcuate surface traversable by a sensing probe. A protuberance, typically in the form of a piston, is displaceably mounted in a radial bore in the wall. A displacement device adjusts the amount of protrusion of said protuberance to locally, radially modify the arcuate surface. A calibrated measuring device accurately determines the amount of protrusion.
    Type: Application
    Filed: December 5, 2002
    Publication date: April 22, 2004
    Inventors: Kostadin Doytchinov, Jim Pekelsky, Lorne Munro
  • Patent number: 6721054
    Abstract: A method for accurately measuring the reflectance of translucent objects by illuminating small areas of the object is disclosed. The method involves determining the lateral diffusion error by use of a predetermined set of calibration standards. The lateral diffusion error is added to the uncorrected reflectance to produce the corrected reflectance value. The method has widespread potential applications in the paper, printing, textile, coating, and food industries.
    Type: Grant
    Filed: October 11, 2001
    Date of Patent: April 13, 2004
    Inventor: David L. Spooner
  • Publication number: 20040066508
    Abstract: The present invention overcomes the disadvantages of the related art by providing a spatial reference system that includes at least one artifact assembly. The artifact assembly has a measuring bar assembly including an inner member with a proximate end and a distal end, an outer member with a proximate end and a distal end, and a compensating member with a proximate end and a distal end operatively disposed between said inner and said outer members. The distal end of the outer member is fixedly mounted to the distal end of the compensating member. The proximate end of the compensating member is fixedly mounted to the proximate end of the inner member.
    Type: Application
    Filed: September 30, 2003
    Publication date: April 8, 2004
    Inventor: Ingobert Schmadel
  • Publication number: 20040061852
    Abstract: The invention is directed to a device for calibrating an optical detection channel for a two-dimensional, spatially dependent measurement of fluorescent or luminescent radiation in multi-specimen carriers.
    Type: Application
    Filed: September 26, 2003
    Publication date: April 1, 2004
    Applicant: CyBio AG
    Inventors: Juergen Wulf, Andreas Fina, Michael Eberhard
  • Patent number: 6710798
    Abstract: A probe card inspection system uses a fiduciary plate having a plurality of targets deposited thereon by photolithography and vapor deposition. A plurality of semiconductor probe card probe tips are contacted with the fiducial pattern on the plate. An electronic imaging system determines the position of geometric centroids of the probe tips with respect to an index mark in the fiducial pattern. A central processor determines the position of each imaged probe tip(s) with respect to the index mark, and calculates the relative positions of each probe tip from that data.
    Type: Grant
    Filed: March 9, 1999
    Date of Patent: March 23, 2004
    Assignee: Applied Precision LLC
    Inventors: Ron Hershel, Rich Campbell, Timothy S. Killeen, Donald B. Snow
  • Patent number: 6704102
    Abstract: A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.
    Type: Grant
    Filed: February 6, 2001
    Date of Patent: March 9, 2004
    Assignee: Metronics, Inc.
    Inventor: Richard Roelke
  • Publication number: 20040036867
    Abstract: The invention relates to a one-dimensional calibration standard for coordinate measuring devices, especially for optical coordinate measuring devices, so-called laser trackers that are provided with a rod-shaped calibration device. The inventive device is characterized in that the rod-shaped calibration device consists of a single material having a thermal expansion coefficient of <5×10−6K−1 and that the rod-shaped calibration device is provided with at least two bores at predetermined calibrated intervals into which the reflective devices of the optical measuring device or the balls used for the calibration of scanning coordinate measuring systems can be exactly and reproducibly inserted and withdrawn in order to calibrate the coordinate measuring device.
    Type: Application
    Filed: November 14, 2002
    Publication date: February 26, 2004
    Inventors: Ralf Jedamzik, Armin Thomas, Thorsten Dhring
  • Publication number: 20040036868
    Abstract: A multi-modality fluorescence reference plate comprising wells coated with a fluorogenic compound is described, together with a method of producing such a plate. The plate has utility for calibrating fluorescent plate readers and imaging systems for measuring steady-state fluorescence, time-resolved fluorescence, fluorescence lifetime and/or fluorescence polarisation.
    Type: Application
    Filed: May 21, 2003
    Publication date: February 26, 2004
    Inventors: Christopher Nicholas Jones, Philip John Meyler, Robert Arnold Jessop, Malcolm John Hatcher, Michael Keith Page, Michael Roger Looker
  • Patent number: RE39268
    Abstract: A method and system for simulating living tissue which is to be monitored by a pulse oximeter that provides red and infrared light flashes, the system including structure for: converting the red and infrared light flashes of the pulse oximeter into electrical signals; modulating the converted electrical signals to provide modulated electrical signals; and converting the modulated electrical signals to light flashes and transmitting the converted light flashes to the pulse oximeter for detection so that the pulse oximeter responds to the converted light flashes as it would to light flashes modulated by a living tissue.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: September 5, 2006
    Assignee: Fluke Electronics Corp.
    Inventors: Edwin B. Merrick, Kay Haas, John Tobey Clark, Michael William Lane, Peter Haas