Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Abstract: Systems and methods for calibrating a solid-imaging system (10) are disclosed. A calibration plate (110) having a non-scattering surface (140) with a plurality (150) of light-scattering fiducial marks (156) in a periodic array is disposed in the solid-imaging system. The actinic laser beam (26) is scanned over the fiducial marks, and the scattered light (26S) is detected by a detector (130) residing above the calibration plate. A computer control system (30) is configured to control the steering of the light beam and to process the detector signals (SD) so as to measure actual center positions (xA, yA) of the fiducial marks and perform an interpolation that establishes a calibrated relationship between the angular positions of the mirrors and (x,y) locations at the build plane (23). The calibrated relationship is then used to steer the laser beam in forming a three-dimensional object (50).

Abstract: A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system.

Abstract: There is provided an optical measuring device including: plural light-receiving units; a frame to which the respective light-receiving units are mounted on a same circumference whose axial center is a predetermined position, with optical axes of the light-receiving units being directed toward the axial center, an object of measurement being disposed at an axially central portion of the circumference; a measuring section that outputs measured values corresponding to received light amounts; a reference sample disposed, instead of the object of measurement, at the axially central portion of the circumference such that a longitudinal direction of the reference sample runs along an axis of the circumference; a reference light source that illuminates light of the predetermined wavelength toward the reference sample; and a calibrating section that calibrates the sensitivities of the plural light-receiving units at a time of measuring the object of measurement.

Abstract: A system for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part such as an ammunition case based on direct measurements of the part when fixtured at a measurement station is provided. The system includes first and second holding devices for holding the part therebetween in a part-retaining position in which the part is firmly held between the devices at its end surfaces. In one embodiment, a portion of each of the holding devices extends into its respective opening in the part-retaining position. The system also includes a head apparatus which has a plurality of radiation sources for successively directing arrays of planes of radiation at the holding devices and at the part, and a plurality of receiver modules for measuring the amount of radiation present in unobstructed planar portions of the planes to obtain holding device and part signals.

Abstract: A fluorescent color calibrator for calibrating RGB pixel values is provided. The fluorescent color calibrator includes a plurality of fluorogenic compounds adapted to fluoresce in a visible color spectrum; and a second plurality of fluorogenic compounds adapted to fluoresce in multiple visible gray spectrums. Also provided is a method for using the fluorescent color calibrator to standardize fluorescent colors when viewing with an RGB monitor.

Abstract: A method for calibrating a device for monitoring the curvature of a stiffener (18) of a flexible sea line: A monitoring device has a deformable rod (26) having a central axis (C) and at least three optical sensors (29, 30, 31) maintained pressed against the perimeter of the rod (26). The method includes the steps, for different consecutive orientations of bending planes around the central axis; bending the rod (26) according to the same curvature radius; measuring the deformation of the sensors (29, 30, 31) during the bending; using the measured deformations to extrapolate a sine function of the deformation for each sensor according to the orientation of the bending plane; calculating error-correction coefficients according to the angular shift between the extrapolated sine functions and according to the amplitude of the extrapolated sine curves.

Abstract: A method for using a calibration standard. The method includes providing a calibration standard. In a specific embodiment, the calibration standard has a substrate, a thickness of material having an edge region; and a conformal material of uniform thickness disposed on the edge region. The standard also has an upper surface pattern having the uniform thickness provided on the edge region. The method also includes using the upper surface pattern for a calibration process on a scanning electron microscope process.

Abstract: The present invention is directed to a method of calibrating sensitivity gain. In a preview mode, an imaging device is calibrated by a standard light source, therefore obtaining standard sensitivity gain of the preview mode. In a capture mode, the imaging device is calibrated by the standard light source, therefore obtaining standard sensitivity gain of the capture mode. A gain ratio of the standard sensitivity gain of the capture mode to the standard sensitivity gain of the preview mode is determined, and is then used to deduce the exposure parameters of the capture mode according to the exposure parameters of the preview mode.

Abstract: The present invention is directed to a method of calibrating a light source. In one embodiment, a standard image sensor is used to capture emitted light of a standard and a to-be-calibrated light source in order to obtain a standard and a nonstandard image, respectively. A standard and a nonstandard luminance response are generated according to the standard and the nonstandard image, respectively. The to-be-calibrated light source is adjusted until the nonstandard luminance response is about equal to the standard luminance response. In another embodiment, the standard image sensor is used to capture emitted light of the standard and the to-be-calibrated light source. According to sampled outputs of the standard image sensor, a standard and a nonstandard chrominance response are respectively generated, which are used to compensate an image sensor under test.

Abstract: The invention relates to a method for generating calibrated colour data of a target using colour measurement instruments distributed in the network comprising the steps A) generating at least one standard instrument profile for the colour measurement instruments distributed in the network to correct photometric and wavelength scale differences, and B) generating at least one geometry instrument profile for the colour measurement instruments distributed in the network to correct geometry scale differences. The method can be used in applications where colour measurement instrument networks are used, particularly in robotic systems where colour measurement instruments are integrated.

Abstract: A calibration device 21 according to the present invention is a member used for white calibration of an optical characteristic measuring apparatus 1 for measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer 24. Accordingly, such a calibration device 21 can perform more accurate white calibration by preventing formation of an interference pattern by the spacer 24.

Abstract: There is provided a film measuring device capable of accurately and easily measuring the thickness of a microporous film formed on a battery electrode plate over the entire area of the film. A color CCD sensor 8 shoots the microporous film. A video board 11 converts a color tone of a color image signal obtained by the image pickup into gradation data of respective color components of RGB. After the data conversion, an image processing board 12 extracts line images of the respective color components. A calculator 14 obtains the thickness of the microporous film by referring to pre-measured film thickness reference values corresponding to the gradation data of the green or blue color component, which are stored in a table storage 13 as reference thickness table data, using the gradation data of the line image of the green color component or the blue color component as lookup data.

Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.

Abstract: A tunable microlens uses at least two layers of electrodes and a droplet of conducting liquid. Such a droplet, which forms the optics of the microlens, moves toward an electrode with a higher voltage relative to other electrodes in the microlens. When calibration of the microlens is desired, an equal and constant voltage is passed over the first layer of electrodes and a different, constant voltage is passed over the second layer of electrodes, which may, for example, be disposed in a star-like pattern. A driving force relative to each electrode in the second layer results and is proportional to the length of the circumference of the droplet that intersects with each of the electrodes. This driving force reaches equilbrium, and hence the droplet reaches its nominal centered position relative to the second layer of electrodes, when the length of intersection of the circumference of the droplet with each of the electrodes in the second layer is equal.

Abstract: An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Abstract: A method and apparatus for calibration of a result from a test device using a reagent are provided. The method includes measuring an optical signal for a sample contained in the test device to obtain a measured optical signal value, the sample having a known concentration; and determining a relationship between the known concentration of the sample and a ratio of an estimated optical signal value to the measured optical signal value of the sample.

Abstract: Calibration of an arbitrary spectrometer can use a stable monolithic interferometer as a wavelength calibration standard. Light from a polychromatic light source is input to the monolithic interferometer where it undergoes interference based on the optical path difference (OPD) of the interferometer. The resulting wavelength-modulated output beam is analyzed by a reference spectrometer to generate reference data. The output beam from the interferometer can be provided to an arbitrary spectral instrument. Wavelength calibration of the arbitrary spectral instrument may then be performed based on a comparison of the spectral instrument output with the reference data. By appropriate choice of materials for the monolithic interferometer, a highly stable structure can be fabricated that has a wide field and/or is thermally compensated. Because the interferometer is stable, the one-time generated reference data can be used over an extended period of time without re-characterization.

Abstract: An object is to efficiently measure the resistivity of a transparent conductive film with high accuracy in a non-destructive and non-contact manner.

Abstract: A method for evaluating three-dimensional (3-D) coordinate system measurement accuracy of an optical 3-D measuring system using targeted artifacts is provided. In this regard, an exemplary embodiment of a method for evaluating 3-D coordinate system measurement accuracy using targeted artifacts comprises: taking a series of measurements from different positions and orientations using target dots on a targeted artifact with an optical 3-D measuring system; and calculating measurement errors using the series of measurements. An exemplary embodiment of a targeted artifact used with the method includes a base and target dots located on the base.

Abstract: An optical system calibration system and method particularly suited for calibrating the optical slit planes in an ophthalmic diagnostic instrument. The system includes an illumination source projector, an illumination image receiver, and a calibration component all having known relative positions, orientations and physical and optical characteristics. The calibration component includes at least two separated, diffusely reflecting surfaces. Images of an exemplary slit illumination pattern projected onto the calibration component and formed on the diffusely reflecting surfaces are detected by the image receiver such as a video camera. Based upon camera image coordinates and triangulation parameters of the projector, the receiver, and the calibration component, the slit image positions on the image detector plane can be calibrated to the axially displaced, diffusely reflecting calibration component surface positions.

Abstract: A fluorescent color calibrator for calibrating RGB pixel values is provided. The fluorescent color calibrator includes a plurality of fluorogenic compounds adapted to fluoresce in a visible color spectrum; and a second plurality of fluorogenic compounds adapted to fluoresce in multiple visible gray spectrums. Also provided is a method for using the fluorescent color calibrator to standardize fluorescent colors when viewing with an RGB monitor.

Abstract: A Method of correcting a multi-path absorbance measuring system is suggested. The multi-path absorbance measuring system has a plurality of n measuring path: The method is executed by correcting the signal of the measuring paths based on a determined linearization function.

Abstract: A portable device includes a base unit, an extension, and a mirror. The base unit includes a light source, a light detector, and at least one window through which light exits from, and is received by, the base unit. The extension is configured, during use, to be attached to the base unit and to extend from the at least one window, in a direction away from the base unit, the extension defining at least a portion of a sample volume in fluid communication with gases substantially surrounding one or more of the extension and the base unit. The mirror is attached to the extension at a distance from the at least one window. An optical path is defined between the mirror and the at least one window such that light from the light source moves through the sample volume along the optical path, and the mirror is aligned to reflect the light back to the at least one window for detection by the light detector.

Abstract: A visible/near-infrared spectrum analyzing method for identifying components of a sample and determining characteristics of the components using visible light and/or near-infrared light having a wavelength of 400 to 2500 nm. The quantitative determination of the components, which have been conventionally hard to identify, of a grape of a small fruit cultivar for wine making can be made in a nondestructive way. A grape of a small fruit cultivar for wine making (a sample under examination) is irradiated with visible light and/or near-infrared light having a wavelength of 600 to 1100 nm and is subjected to spectrum determination of the sample and an absorption spectrum is determined from the obtained spectrum. By employing a multivariate statistical analysis (hereinafter referred to multivariate analysis) by the PLS or MLR method, a model enabling quantitative determination of the components of the sample under examination is created.

Abstract: The positions of diffraction gratings used for calibration can be checked easily by arranging marks near the diffraction gratings, the marks indicating the coordinate positions of the diffraction gratings. Dummy patterns including a pattern of cross marks are arranged around the array of the diffraction gratings. Consequently, a uniform diffraction grating pattern is accomplished in which the proximity effect is uniform across the diffraction grating array. Furthermore, cross marks can be disposed adjacent to the diffraction grating array. Therefore, the diffraction gratings can be placed in position and calibrated accurately and easily by using a standard component capable of realizing accurate positioning of the diffraction gratings. Hence, accurate metrology calibration coping with the next generation of semiconductor lithography technology can be accomplished.

Abstract: A field deployable optical assembly for use in testing a light-responsive sample is disclosed. The assembly includes a microfluidic device, a first optical package, and a second optical package. The first optical package includes a light emitting diode (LED), a first optical device, and a first light-path control, the first optical package configured to guide and focus light from the LED onto the sample. The microfluidic device includes a tethered control substance. In response to a substance within the sample being associated with, and attaching to, the tethered control, the sample emits light. The second optical package includes a photo sensor, a second optical device, and a second light-path control, the second optical package configured to guide and focus the light emitted from the sample onto the photo sensor.

Abstract: An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.

Abstract: The apparatus and methods herein provide light sources and spectral measurement systems that can improve the quality of images and the ability of users to distinguish desired features when making spectroscopy measurements by providing methods and apparatus that can improve the dynamic range of data from spectral measurement systems.

Abstract: The invention relates to an optical standard (10) for the calibration or characterization of optical measuring devices and as a reference system for intensities and intensity measurements. The standard (10) according to the invention, constructed sandwich-like, comprises a combination of at least two layer-like optical standard modules (12) having defined optical properties, joinable or joined together plane-parallel, wherein the standard modules (12) in each instance differ from each other by at least one optical property, namely, by their absorption, emission, scatter and/or reflection properties, and the standard modules (12) are made so that they enter into physical interaction with electromagnetic radiation striking one of their two principal surfaces (12.1).

Abstract: A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system.

Abstract: A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes.

Abstract: 1.1. Method for the configuration a laser scanning microscope for a raster image correlation spectroscopy measurement and method for carrying out and evaluating a measurement of this kind. 2.1. Manual setting of the scan parameters for a raster image correlation spectroscopy measurement (RICS) is complicated because the effects of setting a certain parameter are not apparent due to the complex interaction between the various parameters and also depend on the physical-technical properties of the microscope. By means of an improved configuration method, mathematical transport models can be fitted to correlations determined by means of scanning fluorescence spectroscopy with few errors. With improved methods for carrying out or evaluating a RICS measurement, the amount of data to be stored can be reduced and RICS correlations of high statistical quality can be determined within a short period of time. 2.2.

Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.

Abstract: Photovoltaic thin film quality control is obtained where the thin film is supported by a support and a section of the film is illuminated by a polychromatic or monochromatic illumination source. The source forms on the thin film an illuminated line. The light collected from discrete sampled points located on the illuminated line is transferred to a photo-sensitive sensor through an optical switch. The spectral signal of the light reflected, transmitted or scattered by the sampled points is collected by the sensor, processed and photovoltaic thin film parameters applicable to the quality control are derived e.g. thin film thickness, index of refraction, extinction coefficient, absorption coefficient, energy gap, conductivity, crystallinity, surface roughness, crystal phase, material composition and photoluminescence spectrum and intensity. Manufacturing equipment parameters influencing the material properties may be changed to provide a uniform thin film layer with pre-defined properties.

Abstract: Methods for normalizing output from an instrument employing a reference standard or non-fluorescing substance disposed within at least one of a plurality of reaction chambers. The method comprises collecting and analyzing a signal associated with the reference standard or non-fluorescing substance to determine a normalizing bias. The normalizing bias is then applied to the data signal collected from a remainder of the plurality of reaction chambers.

Abstract: A method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts are provided. The system includes a support for supporting a part to be inspected and/or a calibration device along a measurement axis. The system further includes a head apparatus including a plurality of radiation plane generators for directing an array of planes of radiation at the part and/or device so that the part and/or device occludes each of the planes of radiation to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part and/or device. The head apparatus further includes a plurality of radiation plane receivers or cameras such as line scan cameras.

Abstract: A fluid control platform that may control various fluid control components and is scalable by connecting with additional substantially identical platforms, as well as related systems, methods of manufacturing the same, and methods of fluid control are disclosed. The platform may include a programmable controller, a power supply, a data input, a data output device, and/or a networking connection, among other things. A coordinated fluid control system may include multiple networked platforms, which may be networked to each other in, for example, a ring. The programmable controller may be provided with hardware that permits operation of each of a plurality of fluid control components, some of which may be intelligent fluid control components.

Abstract: A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system.

Abstract: The invention relates to a tool for tuning the pitch of the blades of a model propeller (50) with pivoting blades, characterized in that it comprises: means (2, 13-16) for mounting the model propeller in the tool, able to make it possible to position the propeller in such a way that its axis of rotation coincides with a fixed reference axis (3) of the tool, and to place each blade of the propeller successively in a measurement position, optical means (4, 8-11) for determining the angle between a chord of a blade (51) in measurement position and a fixed reference plane of the tool orthogonal to the reference axis on the basis of two points (5, 6), referred to as measurement points, sighted by the said optical means on the suction face of the said blade in measurement position. The invention extends to a tool set additionally comprising at least one standard propeller provided with fixed blades of different pitches, and to a tuning method using the tool or the tool set according to the invention.

Abstract: A calibration method for calibrating an ambient light sensor (ALS) includes: testing the ALS by a plurality of test brightness inputs, and deriving a plurality of test ALS outputs respectively corresponding to the test brightness inputs; converting at least the test ALS outputs from an analog manner into a digital manner to generate a plurality of test ALS output values respectively; storing a test result including at least the test ALS output values; and calibrating a brightness value corresponding to a normal ALS output value according to information stored in the test result, thereby generating a calibrated brightness value.

Abstract: An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system.

Abstract: A surface plasmon measurement instrument measures a change in a property (e.g., refractive index) of a material layer. The method includes providing a prism with a rear surface having a metal layer disposed thereon; providing the material layer on the metal layer on the rear surface of the prism; directing a source beam through the prism toward the rear surface in a vicinity of the material layer; performing at least two sampled measurements to detect light reflected from the rear surface and to produce two corresponding data sets; transforming the data sets to a transform domain; processing the transformed data sets to estimate a sample shift between the two data sets; and determining a change in a property of the material layer using the estimated sample shift.

Abstract: One aspect of the disclosure is directed to a calibration system. The calibration system includes an imaging device including a predetermined print engine capable of being calibrated and a calibration sheet. The calibration sheet includes at least one visible calibration reference region including a given mix of pre-selected reference colorants printed in the calibration reference region on the calibration sheet. The pre-selected reference colorants have been previously printed on the printable calibration sheet using a different imaging device that is different than the given imaging device and that has the same print engine as the given imaging device. The calibration sheet includes freshly printable target regions on the calibration sheet. The given imaging device is configured to enter into the calibration mode, wherein the given imaging device is configured to freshly print a mix of colorants corresponding to the pre-selected reference colorants onto at least one of the target regions.

Abstract: In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost.

Abstract: A sample having a patterned area and a method for use in controlling a pattern parameter is presented. The sample comprises at least one test structure having a patterned region similar to a pattern in the patterned area, the patterns in the patterned area and in the at least test structure being produced by the same patterning process. The at least one test structure comprises at least one pattern parameter of a predetermined value intentionally increased above a natural value of said certain parameter induced by a patterning process. By this, the natural value of the parameter induced by the patterning process can be determined.

Abstract: The present invention relates to a system for the optical detection of light from analytical samples, the system comprising an analytical instrument comprising an optical detection unit and a sample block unit for receiving a plurality of analytical samples, the system further comprising a calibration device for calibrating the optical detection unit of the analytical instrument, wherein the calibration device comprises a substrate and at least one electrically powered reference light source coupled to the substrate, said at least one reference light source emitting light being detected by the optical detection unit.

Abstract: Method for the fabrication of Haze noise standards having, respectively, an insulating thin layer and a plurality of nano-structures of hemi-spherical form on the insulating thin layer, with the respective standards being fabricated by: the formation on at least one insulating layer of seeds made of a first semi-conductor material by chemical deposition from a first precursor gas for the first semi-conductor material, formation on the insulating layer of nano-structures based on a second semi-conductor material and in the form of hemi-spheres, from stable seeds of the first semi-conductor material, by chemical deposition from a second precursor gas of the second semi-conductor material. The invention also relates to a calibration method using standards obtained by means of such a method.

Abstract: A method for preserving a sample is described. A method for preserving a sample device such as microarrays, slides and membranes is described. The preservation is achieved by applying a coating composition to a sample or sample device, and curing the coating composition. Candidate coating materials for forming the coating compositions are described. Preferably, the coating composition is an optically clear, solidifying solution. Also described are preservation kits which provide materials and instructions for the preservation of sample devices. Calibration devices are also described.