Abstract: Modern implementations of Kohler illuminated epi illumination microscope systems provide state of the art performance in various scientific fields such as clinical practice and biological research. While modern microscope performance has increased by use of high performance components, modern microscopes now degrade over time and exhibit inconstant performance. New systems comprise new illumination cubes that replace existing components and contain optical components that provide users with a diagnostic image of the epi illumination.

Abstract: Methods and systems for variable polarization wafer inspection are provided. One system includes one or more polarizing components position in one or more paths of light scattered from a wafer and detected by one or more channels of an inspection system. The polarizing component(s) are configured to have detection polarization(s) that are selected from two or more polarization settings for the polarizing component(s).

Abstract: A computer-implemented method which may be used with imaging systems is provided. The method may include receiving a first image from a first device configured to generate the first image based upon, at least in part, a first portion of an item. The method may further include receiving a second image from a second device configured to generate the second image based upon, at least in part, a second portion of the item. The method may also include extracting one or more features from the first image and the second image in a multi-view calibration space wherein the one or more features share a global coordinate system. The method may further include applying a global constraints embedded Hough transform to the one or more features present in the first image and the second image.

Abstract: An optoacoustic system includes first and second light sources capable of generating pulse of light at first and second wavelengths, optical output control, first and second light sync detectors, and a combiner. A power meter that is calibrated to determine power at the first and second predominant wavelength measures power at the first wavelength after the first light sync is detected and measures power at the second wavelength after the second light sync is detected. The system includes a calibration mode wherein it reduces optical output of the first light source when the power measured by the power meter at the first wavelength after the first light sync is detected is above a first level, and reduces optical output of the second light source when the power measured by the power meter at the second wavelength after the second light sync is detected is above a second level.

Abstract: The invention provides, in a general sense, a new labeling strategy employing compounds that are N2S2 chelates conjugated to a targeting ligand, wherein the targeting ligand is a disease cell cycle targeting compound, a tumor angiogenesis targeting ligand, a tumor apoptosis targeting ligand, a disease receptor targeting ligand, amifostine, angiostatin, monoclonal antibody C225, monoclonal antibody CD31, monoclonal antibody CD40, capecitabine, a COX-2 inhibitor, deoxycytidine, fullerene, herceptin, human serum albumin, lactose, leuteinizing hormone, pyridoxal, quinazoline, thalidomide, transferrin, or trimethyl lysine. The present invention also pertains to kits employing the compounds of interest, and methods of assessing the pharmacology of an agent of interest using the present compounds.

Abstract: A surrogate challenge set including a plurality of containers containing a fluid, wherein at least one of the containers contains particulate matter; and reference probability-of-detection (POD) data for the at least one container containing the particulate matter is described. The fluid may be water containing at least about 0.5 wt % of a preservative, such as benzyl alcohol. The containers may be pharmaceutically acceptable containers such as vials, bottles, syringes, ampules and intravenous bags. The particulate matter may consist of a single particle having a particle size of at least about 50 ?m. A method of making the challenge set may include: disposing particulate matter in at least one of a plurality of containers comprising a fluid; generating probability-of-detection (POD) data for the plurality of containers; and including the probability-of-detection (POD) data in the challenge set. Methods of using the surrogate challenges sets are also provided.

Abstract: A method of supporting an item in a mounting apparatus includes providing an item having first, second, and third members that are at least partially-spherical. The method additionally includes supporting the first member with a first mount configured to constrain the first member against movement along three mutually-orthogonal directions. The method also includes supporting the second member with a second mount configured to constrain the second member against movement along exactly two of the directions, and supporting the third member with a third mount configured to constrain the third member against movement along exactly one of the directions.

Abstract: Light intensity data quantifying intensity of light generated by a light source and received at a detector during a validation mode of an absorption spectrometer can be compared with a stored data set representing at least one previous measurement in a validation mode of an analytical system. The validation mode can include causing the light to pass at least once through each of a zero gas and a reference gas contained within a validation cell and including a known amount of a target analyte. The zero gas can have at least one of known and negligible first light absorbance characteristics within a range of wavelengths produced by the light source. A validation failure can be determined to have occurred if the first light intensity data and the stored data set are out of agreement by more than a predefined threshold amount. Related systems, methods, and articles of manufacture are also described.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: The invention relates to a check-tile for validating instrument scales of color measurement instruments, in particular goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition I comprising at least one achromatic solid pigment, B) a pigmented mid-coat, wherein said pigmented mid-coat is translucent and made of a base coat coating composition II comprising at least one transparent interference pigment and at least one transparent or semi-transparent solid pigment, and C) a clear top coat made of a transparent clear coat coating composition on top of the mid-coat.

Abstract: Methods of designing metrology targets are provided, which comprise distinguishing target elements from their background area by segmenting the background area and optionally segmenting the target elements. The provided metrology targets may maintain a required feature size when measured yet be finely segmented to achieve process and design rules compatibility which results in higher accuracy of the metrology measurements. Particularly, all transitions between target features and adjacent background features may be designed to maintain a feature size of the features below a certain threshold.

Abstract: A probe detachably connected to an optical measurement apparatus includes: a fiber that emits light by the optical measurement apparatus, and outputs reflected light and/or scattered light from an object to be measured; a covering member that covers a side face of the fiber; a cap that covers a distal end of the probe; a standard object that is provided on a surface of the cap facing the distal end of the fiber and that is used in calibration measurement by light emitted from the distal end of the fiber; an adhesive member that adheres the cap to the distal end of the probe and is made of an adhesive material; a heat-generating portion that generates heat to be applied to the adhesive member; and a thermal conduction portion that conducts heat that decreases the adhesive strength of the adhesive material with respect to the covering member.

Abstract: The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins.

Abstract: Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.

Abstract: A method according to an embodiment includes obtaining calibration measurement data, with an optical detection apparatus, from a plurality of marker structure sets provided on a calibration substrate. Each marker structure set includes at least one calibration marker structure created using different known values of the process parameter. The method includes obtaining measurement data, with the optical detection apparatus, from at least one marker structure provided on a substrate and exposed using an unknown value of the process parameter; and determining the unknown value of the process parameter from the obtained measurement data by employing regression coefficients in a model based on the known values of the process parameter and the calibration measurement data.

Abstract: A surface inspecting apparatus can inspect a smaller defect by using a PSL of a smaller particle size. However, the particle size of the PSL is restricted. In the conventional surface inspecting apparatus, therefore, no consideration has been taken as to how to inspect the defect of such a small particle size as is not set in the PSL which will be needed in the near future in an inspection of a semiconductor manufacturing step. The invention has a light source device for generating light which simulated at least one of a wavelength, a light intensity, a time-dependent change of the light intensity, and a polarization of light which was scattered, diffracted, or reflected by an inspection object, and the light is inputted to a photodetector of the surface inspecting apparatus. The smaller defect can be inspected.

Abstract: A schematic eye is used for the evaluation of the optical system of an optical coherence tomography apparatus which captures a tomogram of the fundus. The eye includes a first optical member which irradiated light from the optical system strikes and a second optical member which irradiated light from the first optical member strikes. A plurality of layers having different scattering intensities in the incident direction of irradiated light are formed on the second optical member.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: The present disclosure relates generally to devices that may be used to calibrate a reader. Such devices may comprise an electrical memory chip, a calibration device comprising an optical check, and an interface that allows interaction with the reader.

Abstract: A method is provided in which with respect to an optical detection apparatus including an optical detection unit and a temperature control unit, whether optical signal detection and temperature control are performed accurately, i.e. the performance thereof, can be verified simply with high reliability. With respect to an optical detection apparatus including an optical detection unit for detecting an optical signal of a sample and a temperature control unit for controlling temperature of the sample, the optical signal detection performance and temperature control performance are verified by the following method. First, a standard sample containing a nucleic acid sequence and a strand complementary thereto that have a known optical signal intensity and Tm value is provided, the temperature of the standard sample is increased or decreased with the temperature control unit, and optical signal intensity of the standard sample is measured with the detection unit.

Abstract: The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition I comprising at least one achromatic solid pigment, B) a pigmented mid-coat, wherein said pigmented mid-coat is translucent and made of a base coat coating composition II comprising at least one transparent interference pigment and at least one transparent or semi-transparent solid pigment, and C) a clear top coat made of a transparent clear coat coating composition on top of the mid-coat.

Abstract: The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular of goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising: A) a pigmented ground coat, wherein said pigmented ground coat is opaque and made of a base coat coating composition I comprising at least one opaque solid coloured pigment, and B) a pigmented mid-coat, wherein said pigmented mid-coat is translucent and made of a base coat coating composition II comprising at least one transparent interference pigment.

Abstract: The invention relates to an attachment for placement onto an optical sensor having a housing with an inlet opening for the entry of detection light into the attachment, a test light receiver for receiving light incident at the test light receiver and for a power measurement of the light incident at the test light receiver as test light and having a signal outputting device for outputting an output signal correlated to the test light power. The invention moreover relates to a combination of an optical sensor and such an attachment and to a method for operating an optical sensor which method can be carried out with such an attachment.

Abstract: The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis.

Abstract: Described herein are devices and methods for making extremely accurate measurements in a medium by continuously measuring the index of refraction of the medium such as water or biological tissue. Also described herein is a device for constantly measuring the index of refraction, and using the index of refraction data to constantly calibrate the optical measurement device. In addition, a primary measurement device (a ladar) that is optimized for data collection in a volume backscattering medium such as water or biological tissue is described, along with data results from the lab.

Abstract: An integrating sphere photometer and a measuring method of the same are provided to precisely measure a directional light source. The integrating sphere photometer includes an integrating sphere having a plurality of through-holes, a plurality of photometers disposed at the through-holes, baffles disposed in front of the photometers to be spaced apart therefrom, an auxiliary light source disposed inside the integrating sphere, an auxiliary baffle disposed in front of the auxiliary light source, and a summing unit of output signals of the photometers under the illumination of a light source to be measured disposed in the central area inside the integrating sphere.

Abstract: A method for calibrating a device for monitoring the curvature of a stiffener (18) of a flexible sea line: A monitoring device has a deformable rod (26) having a central axis (C) and at least three optical sensors (29, 30, 31) maintained pressed against the perimeter of the rod (26). The method includes the steps, for different consecutive orientations of bending planes around the central axis; bending the rod (26) according to the same curvature radius; measuring the deformation of the sensors (29, 30, 31) during the bending; using the measured deformations to extrapolate a sine function of the deformation for each sensor according to the orientation of the bending plane; calculating error-correction coefficients according to the angular shift between the extrapolated sine functions and according to the amplitude of the extrapolated sine curves.

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Abstract: A method and a microelectronic sensor device for making optical examinations in an investigation region at the contact surface of a carrier, wherein an input light beam is sent from a light source towards the investigation region, and wherein an output light beam coming from the investigation region is detected by a light detector. An evaluation unit that is coupled to the light detector is adapted to determine the wetting grade of the investigation region based on a characteristic parameter of the output light beam. The evaluation unit may be adapted to determine a change in the light intensity caused by a liquid contacting the contact surface. The wetting grade may be detected in a test region that is located adjacent to the investigation region and that has a higher roughness than the investigation region.

Abstract: A calibration device 21 according to the present invention is a member used for white calibration of an optical characteristic measuring apparatus 1 for measuring an optical characteristic of a specimen arranged to close a measuring opening and is used together with a spacer 24. Accordingly, such a calibration device 21 can perform more accurate white calibration by preventing formation of an interference pattern by the spacer 24.

Abstract: Disclosed herein is a calibration device for a light measuring equipment, the calibration device including: a standard illuminant emitting light for calibration; and a universal jig fixing target light measuring equipments to be calibrated having various sizes and moving in a direction in parallel with an optical axis of the standard illuminant. Therefore, it is possible to use both of a method of performing calibration by changing a distance between the standard illuminant and the target light measuring equipment to be calibrated and a method of performing calibration by changing a current applied to the standard illuminant. In addition, it is possible to perform calibration for the light measuring equipment having a plurality of sensors and to significantly improve accuracy of calibration.

Abstract: A method and a device for providing a predeterminable concentration of at least one component in a microscopic sample liquid medium are described. The device includes a feeding device for the at least one component. Measurement data are determined, measuring a predeterminable parameter using a microscopic method. The concentration of the at least one component is adjusted or controlled via the feeding device based on the basis of measurement data.

Abstract: A probe detachably connected to an optical measurement apparatus includes: a fiber that emits light by the optical measurement apparatus, and outputs reflected light and/or scattered light from an object to be measured; a covering member that covers a side face of the fiber; a cap that covers a distal end of the probe; a standard object that is provided on a surface of the cap facing the distal end of the fiber and that is used in calibration measurement by light emitted from the distal end of the fiber; an adhesive member that adheres the cap to the distal end of the probe and is made of an adhesive material; a heat-generating portion that generates heat to be applied to the adhesive member; and a thermal conduction portion that conducts heat that decreases the adhesive strength of the adhesive material with respect to the covering member.

Abstract: A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Abstract: The present invention relates to a method of processing analyte using a portable incubator apparatus. The incubator apparatus 10 has a plurality of cavities 20 each configured to receive analyte to be incubated. The method comprises: receiving analyte in each of the plurality of cavities; incubating the analyte in the plurality of cavities, the incubator apparatus being operable to control temperatures of analyte contained in the plurality of cavities independently of each other; and moving the incubator apparatus from a first location to a second location while the analyte is being incubated, the incubator apparatus being configured to maintain desired incubation conditions independently of a supply of electrical power and apparatus external to the incubator apparatus as the incubator apparatus is being moved.

Abstract: A laser scanner measuring system is disclosed, which has a laser scanner and a calibration target. The laser scanner comprises a light emitting element for emitting a pulsed laser beam, a rotary projecting unit for projecting the pulsed laser beam, a distance measuring unit, and a control unit for driving and controlling the light emitting element and the distance measuring unit. The calibration target has a reflection sector with a known shape and with high reflectance and is installed at a known position. In use, there is a step for judging a reflected pulsed laser beam from the reflection sector by detecting a level of light quantity, a step for determining a center position of the reflection sector based on the result of the judgment, and a step for calibrating the laser scanner measuring system based on the determined center position and on the known position.

Abstract: An apparatus for accelerating the weathering effects on test specimens within a test chamber including a calibration-access assembly for replacing test sensors located within the apparatus with reference sensors when the apparatus door is closed. An improved sensor support assembly is also included. The calibration-access assembly from an improved location, facilitating superior irradiance detection. The calibration-access assembly including an aperture defined in the door of the apparatus and a shield connected to the door that is movable to permit or prevent access to sensors when the apparatus door is closed.

Abstract: An improved dimensional detection system is portable and can be used to characterize a workpiece. The dimensional detection system employs as few as a single focused light source and as few as a single camera along with a calibration data set to convert the illuminated pixels of an image of a beam on the workpiece into a cloud of real world points in space on an outer surface of the workpiece. The cloud of points can be processed to characterize the workpiece, such as by determining the right hexahedron that would encompass all of the real world points in space and which could be used to determine a dimensional weight of the workpiece.

Abstract: In one embodiment, a method for evaluating calibration data collected by a range sensor of a mobile machine on a site includes collecting a calibration data set using the range sensor. The calibration data set includes information indicating the locations of a plurality of points on a surface of the site relative to the range sensor. The method further includes determining an expected error score of the calibration data set. Finally, the method includes determining whether to use the calibration data set to calibrate the range sensor based on the expected error score.

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Abstract: Described herein are devices and methods for making extremely accurate measurements in a medium by continuously measuring the index of refraction of the medium such as water or biological tissue. Also described herein is a device for constantly measuring the index of refraction, and using the index of refraction data to constantly calibrate the optical measurement device. In addition, a primary measurement device (a ladar) that is optimized for data collection in a volume backscattering medium such as water or biological tissue is described, along with data results from the lab.

Abstract: A method for calibrating a spatial light modulator comprising an array of channels includes selecting a plurality of channel sets; operating each of the channel sets to provide corresponding output radiation; providing a detector for measuring the output radiation; determining a plurality of intensity values, each representing an intensity of the output radiation provided by a different one of the channel sets; providing a correction factor for each of the channels sets, wherein each correction factor remains constant during a subsequent recalibration of the spatial light modulator; modifying each determined intensity value in accordance with a corresponding one of the correction factors; determining a difference between one of the modified intensity values and a target intensity value; and reducing the determined difference by adjusting a control level of at least one channel in the channel set corresponding to the one of the modified intensity values.

Abstract: The present invention is directed to a method of calibrating sensitivity gain. In a preview mode, an imaging device is calibrated by a standard light source, therefore obtaining standard sensitivity gain of the preview mode. In a capture mode, the imaging device is calibrated by the standard light source, therefore obtaining standard sensitivity gain of the capture mode. A gain ratio of the standard sensitivity gain of the capture mode to the standard sensitivity gain of the preview mode is determined, and is then used to deduce the exposure parameters of the capture mode according to the exposure parameters of the preview mode.

Abstract: The present invention provides an instrument and method for measuring total luminous flux of luminous elements, which forms an approximately uniform spatial intensity distribution by simultaneously lighting a plurality of luminous elements for measurement in an integrating sphere when comparing a total luminous flux standard lamp with the luminous elements to measure the total luminous flux of the luminous elements, thus not requiring spatial mismatch error correction.

Abstract: A method for calibrating a spatial light modulator comprising an array of channels includes selecting a plurality of channel sets; operating each of the channel sets to provide corresponding output radiation; providing a detector for measuring the output radiation; determining a plurality of intensity values, each representing an intensity of the output radiation provided by a different one of the channel sets; providing a correction factor for each of the channels sets, wherein each correction factor remains constant during a subsequent recalibration of the spatial light modulator; modifying each determined intensity value in accordance with a corresponding one of the correction factors; determining a difference between one of the modified intensity values and a target intensity value; and reducing the determined difference by adjusting a control level of at least one channel in the channel set corresponding to the one of the modified intensity values.

Abstract: Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems.

Abstract: The present invention provides a particle standard including particles having optical properties similar to those of a carrier in which the particles are dispersed, as well as a method of calibrating or validating a subject optical particle analyzer with respect to a reference optical particle analyzer by using the particle standard. In the method, the particle standard is analyzed with the reference optical particle analyzer to obtain a reference particle concentration and a reference particle-size distribution. Analogously, the particle standard is analyzed with the subject optical particle analyzer to obtain a subject particle concentration and a subject particle-size distribution. The subject particle concentration and the subject particle-size distribution are then compared to the reference particle concentration and the reference particle-size distribution, respectively, and the subject optical particle analyzer is adjusted accordingly.

Abstract: Methods for normalizing output from an instrument employing a reference standard or non-fluorescing substance disposed within at least one of a plurality of reaction chambers. The method comprises collecting and analyzing a signal associated with the reference standard or non-fluorescing substance to determine a normalizing bias. The normalizing bias is then applied to the data signal collected from a remainder of the plurality of reaction chambers.

Abstract: A device for calibrating an optical scanner includes a substrate; and a pattern disposed on the substrate, the pattern comprising a photoresist.