Standard Patents (Class 356/243.1)
  • Patent number: 6681151
    Abstract: A system and method for servoing robot marks using fiducial marks and machine vision provides a machine vision system having a machine vision search tool that is adapted to register a pattern, namely a trained fiducial mark, that is transformed by at least two translational degrees and at least one mon-translational degree of freedom. The fiducial is provided to workpiece carried by an end effector of a robot operating within a work area. When the workpiece enters an area of interest within a field of view of a camera of the machine vision system, the fiducial is recognized by the tool based upon a previously trained and calibrated stored image within the tool. The location of the work-piece is derived by the machine vision system based upon the viewed location of the fiducial. The location of the found fiducial is compared with that of a desired location for the fiducial. The desired location can be based upon a standard or desired position of the workpiece.
    Type: Grant
    Filed: December 15, 2000
    Date of Patent: January 20, 2004
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Russ Weinzimmer, Aaron Wallack
  • Publication number: 20040008343
    Abstract: The present invention provides a thermally stable reference member comprising, at least one radiation attenuating element and at least one radiation scattering element. The radiation attenuating element comprising at least one aperture for transmission of radiation therethrough. The attenuating and scattering elements placed in series so that radiation transmitted through the reference member passes through each of the attenuating and scattering elements. The attenuating and scattering elements of the reference member may further comprise a thermally stable mount to hold the elements in a selected position relative to each other, and in relation to an instrument, or the elements may be bonded together.
    Type: Application
    Filed: December 18, 2002
    Publication date: January 15, 2004
    Applicant: CME TELEMETRIX, INC.
    Inventors: Romuald Pawluczyk, Theodore Cadell, Bronislaw Bednarz, Ashwani Kaushal
  • Patent number: 6678061
    Abstract: To calibrate the optical system of a laser machine having a laser source, a deflecting unit and an imaging unit, firstly a first sample plate is arranged in the focal plane of the imaging unit, with prescribed grid points being marked by the laser beam. After that, the marked points are measured by means of a camera, and their position values are compared with the prescribed position values of the target points, in order to derive first correction values from this and store them. After that, a second sample plate is arranged in a second calibrating plane, at a distance from the focal plane, and is targeted by the laser beam and provided with markings. The second sample plate is measured by the camera, and the measured positions of the markings are compared with the positions of the target points, in order to derive second correction values and store them.
    Type: Grant
    Filed: April 15, 2002
    Date of Patent: January 13, 2004
    Assignee: Siemens Aktiengesellschaft
    Inventors: Alexander Kilthau, Andre Kletti, Hans Juergen Mayer, Eddy Roelants
  • Patent number: 6661963
    Abstract: A method and apparatus for controlling the attenuation level of a semiconductor VOA relative to an absolute temperature of the VOA without the use of a power monitor is provided. The method includes the step of providing a variable optical attenuator for attenuating the optical signal. The variable optical attenuator is instructed to maintain the desired attenuation level of the optical signal. The temperature of the variable optical attenuator is periodically sensed, and a required voltage level is determined to achieve the desired attenuation level based at least partially on the periodically sensed temperature of the VOA. The method can further include the step of increasing and decreasing a voltage to the VOA to achieve the required voltage level and thus the desired attenuation level.
    Type: Grant
    Filed: July 31, 2001
    Date of Patent: December 9, 2003
    Assignee: Sycamore Networks, Inc.
    Inventors: Richard Sharp, Vincent Scalesse, Ravindra N. Kolte
  • Patent number: 6657717
    Abstract: The present invention provides an artificial member (80, 210) which mimics the absorbance spectrum of a body part and includes the spectral components of blood analytes. The artificial member comprises a light scattering and reflecting material, and has a chamber portion comprising one or more chambers (90, 100, 220). The artificial member is configured to be reproducibly received in a measuring receptor which receptor is operatively connected to a non-invasive monitoring device.
    Type: Grant
    Filed: February 28, 2002
    Date of Patent: December 2, 2003
    Assignee: CME Telemetrix Inc.
    Inventors: Theodore E. Cadell, Paul Drennan, James Samsoondar, Romuald Pawluczyk, Ashwani Kaushal, Bronislaw Bednarz, John Kuta
  • Patent number: 6646737
    Abstract: A calibration standard which may be used to calibrate lateral dimensional measurement systems is provided. The calibration standard may include a first substrate spaced from a second substrate. In addition, the calibration standard may include at least one layer disposed between the first and second substrates. The layer may have a traceably measured thickness. For example, a thickness of the layer may be traceably measured using any measurement technique in which a measurement system may be calibrated with a standard reference material traceable to a national testing authority. The calibration standard may be cross-sectioned in a direction substantially perpendicular to an upper surface of the first substrate. The cross-sectioned portion of the calibration standard may form a viewing surface of the calibration standard. In this manner, a lateral dimensional artifact of the calibration standard may include the traceably measured thickness of at least the one layer.
    Type: Grant
    Filed: September 24, 2001
    Date of Patent: November 11, 2003
    Assignee: KLA-Tencor Technologies
    Inventors: Marco Tortonese, Ian Smith, Ellen Laird, Bradley W. Scheer
  • Publication number: 20030174321
    Abstract: The present invention provides a photometric reference member comprising PTFE and glass. The member exhibits an absorbance change of less than 0.0001 absorbance units per degree C. over a range of temperatures, preferably from about 20° C. to about 40° C., and over wavelengths from about 600 nm to about 1650 nm, preferably about 600 nm to about 1050 nm. The invention also pertains to methods of using the photometric reference member to correct for temperature variations or drift in absorbance measurements.
    Type: Application
    Filed: January 22, 2003
    Publication date: September 18, 2003
    Applicant: CME Telemetrix Inc.
    Inventors: James Samsoondar, Ashwani Kaushal
  • Patent number: 6621574
    Abstract: This invention relates to an accessory for incorporation into Raman and other spectroscopic instruments for combining shuttering and spectroscopic calibration functions. The accessory is comprised of an assembly with at least two positions that may be inserted into the light path, one position allowing light to be directed to and from the sample, and another position containing a reference standard that blocks the beam and provides a shuttering function. When the light strikes the reference standard, a reference spectrum is produced that may be used to calibrate the spectrograph. The device is especially useful in combination with compact sampling accessories for Raman spectroscopy.
    Type: Grant
    Filed: May 25, 2000
    Date of Patent: September 16, 2003
    Assignee: InPhotonics, Inc.
    Inventors: Robert W. Forney, Nancy T. Kawai
  • Patent number: 6614521
    Abstract: An artificial member that mimics the absorbance spectrum of an animal body part and includes the spectral components of blood analytes is disclosed. The artificial member is made of a light scattering and reflecting material and is configured to be reproducibly received in a measuring receptor that is operatively connected to a non-invasive monitoring device.
    Type: Grant
    Filed: June 28, 2002
    Date of Patent: September 2, 2003
    Assignee: CME Telemetrix Inc.
    Inventors: James Samsoondar, Ashwani Kaushal, Paul Drennan
  • Patent number: 6615062
    Abstract: The invention provides methods and apparatus to reference or normalize optical measurements, by removing or accounting for background factors and artifacts, such as motion artifacts, that arise during use of optical catheters.
    Type: Grant
    Filed: May 31, 2001
    Date of Patent: September 2, 2003
    Assignee: Infraredx, Inc.
    Inventors: S. Eric Ryan, Brett Bouma, Guillermo J. Tearney, Simon Furnish, Jing Tang, Andres Zuluaga
  • Publication number: 20030160954
    Abstract: In a spectroscopic process a sample for producing a test spectral line or spectrum of at least one component contained in the sample is stimulated and the transmitted and/or emitted electromagnetic rays are used to create the test spectral line or spectrum. In order to improve such a spectroscopic process to such an extent that variations of certain parameters, which alter the shape and/or occurrence of a spectral line, are compensated, a comparison spectral line or spectrum of a known comparison material is produced under substantially the same parameters as the sample. The comparison spectral line or spectrum is compared with an ideal comparison spectral line or spectrum in order to calculate a transfer function, and the transfer function is applied to the test spectral line or spectrum in order to calculate a corrected test spectral line or spectrum.
    Type: Application
    Filed: February 20, 2003
    Publication date: August 28, 2003
    Inventors: Yongdong Wang, Bernhard H. Radziuk, David H. Tracy
  • Publication number: 20030156281
    Abstract: A calibrator for a sorting device, with a conveyor running in the conveying direction T for sorting articles resembling each other, such as well-determined kinds of vegetables or fruits, the calibrator being used for repeatedly testing and calibrating a light beam coming from a test article, resembling, and obtained in the same manner as, the beams obtained when sorting the above articles, comprising: a first holder for a light receiving device, for instance a light fiber end with which the light beam from either an above article or the test article is received and passed from there further to a detection device, and a second holder with the test article placed therein, characterised in that the second holder is movably connected with the first holder between a test position and a rest position, the position of the test article in the test position at least substantially corresponding to the position of an article when sorting, in the test position the light beam being passed along a light guide path successi
    Type: Application
    Filed: February 25, 2003
    Publication date: August 21, 2003
    Inventors: Leonardus Paulus Crezee, Erik van Wijngaarden
  • Patent number: 6594008
    Abstract: Method and apparatus for forming thin films by the application of a film forming liquid to a substrate at rest or rotating a speed up to 500 rpm and then rotating the film forming liquid on the substrate at a speed and for a time sufficient to form the thin film. Such films can be used for analysis by spectrophotometric methods. Apparatus for forming such thin films is also disclosed.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: July 15, 2003
    Inventors: Robert Herpst, Kenneth B. Cuthbert
  • Patent number: 6570663
    Abstract: A calibration method and a calibration device for two-point cold calibration are suitable for calibration of any visual measuring system having a width analyzer. In particular, the method and the calibration device are used to calibrate a CCD camera in a visual measuring system used to monitor the diameter of a crystal rod being grown by a crystal growing apparatus using the well-known Czochralski process. The calibration method takes into account non-linear error and avoids the need to actually grow crystals for calibration. The calibration device is specifically designed for quick and accurate set-up.
    Type: Grant
    Filed: July 7, 2000
    Date of Patent: May 27, 2003
    Assignee: Seh America, Inc.
    Inventors: Leo N. Altukoff, Mike W. Mayer, Barton V. White
  • Publication number: 20030086085
    Abstract: A method for checking the operation of a laboratory instrument used in biochemistry by means of an individual test plate (10) by comparing measured values of sample units (20, 21) placed in the wells (12) of the frame plate (11) to previously known measured values verified by a reference device. The sample unit (20) placed in the frame plate (11) of the test plate (10) is a teflon plastic cup (22) provided with an aluminum cover (23), the sample material (24) in powdery form being placed in said cup, or an optical filter (21), which is locked in place by means of a locking spring ring (25).
    Type: Application
    Filed: September 4, 2002
    Publication date: May 8, 2003
    Inventors: Raimo Harju, Sanna Tauluvuori
  • Publication number: 20030070926
    Abstract: Marker compounds suitable for gel electrophoresis are disclosed. The compounds are natural, non-natural compounds or a mixture thereof, but not a protein. The compounds comprise at least one monomer unit, at least one functional group unit and optionally at least one core unit. Also contemplated is a method for positioning the marker compounds or a set of the compounds according to the invention and a method for the detection and/or quantification of s sample molecule in a two-dimensional gel.
    Type: Application
    Filed: September 17, 2002
    Publication date: April 17, 2003
    Inventors: Ola Forsstrom-Olsson, Anders Johan Malmstrom, Lars Gustay Malmstrom, Per Magnus Berglund, Ulf Christian Ellervik
  • Publication number: 20030059100
    Abstract: A calibration method for calibrating a parts-handling device with respect to a computer vision camera includes the steps of moving a parts-handling device into contact with a touch-off block, and storing a value indicative of the position of the parts-handling device when it is in contact with the touch-off block. In addition, there may be two orthogonal surface on the touch-off block. By touching the parts-handling device against both surfaces, the parts-handling device can be calibrated for position offset in two orthogonal directions. For parts-handling devices that are rotatable, the parts-handling device may be rotated to a succession of predetermined angular positions and brought into contact with the touch-off block in each position. By combining the measured positions of the parts-handling device in each rotational position, the system can be calibrated to compensate for the offset from the camera to the parts-handling device as a function of rotational position as well.
    Type: Application
    Filed: March 19, 2002
    Publication date: March 27, 2003
    Inventors: Timothy J. Fleming, Jeffrey J. Hohn, Christopher R. Holloman, Steven E. Wheeler, Charles N. Miller
  • Patent number: 6535291
    Abstract: A method of calibrating a pick and place machine having an on-head linescan sensor is disclosed. The calibration includes obtaining z-axis height information of one or more nozzle tips via focus metric methods, including a Fourier transform method and a normalized correlation method. Additionally, other physical characteristics such as linear detector tilt, horizontal scale factor, and vertical scale factor are measured and compensated for in the process of placing the component. Nozzle runout, another physical characteristic, is also measured by a sinusoidal curve fit method, and the resulting Z-height calibration data is used to later place the component.
    Type: Grant
    Filed: June 7, 2000
    Date of Patent: March 18, 2003
    Assignee: CyberOptics Corporation
    Inventors: Timothy A. Skunes, Eric P. Rudd, David W. Duquette
  • Publication number: 20030038933
    Abstract: An aspect of the invention relates to a calibration standard for a three-dimensional measurement system and various calibration methods and techniques. The calibration standard typically includes a calibration standard surface and a plurality of optical targets. The optical targets being are affixed to the calibration standard surface and define a three-dimensional distribution of optical reference points. The optical targets can be serve as active, passive calibration targets, or combinations of both. In one embodiment, the optical targets include an optical source and a diffusing target, and each of the optical sources are configured to illuminate the respective diffusing target. The optical targets can be removably affixed to the calibration standard surface.
    Type: Application
    Filed: April 19, 2002
    Publication date: February 27, 2003
    Applicant: Dimensional Photonics Inc.
    Inventors: Lyle G. Shirley, Gary J. Swanson, Nathan D. Derr
  • Patent number: 6522777
    Abstract: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a light source for propagating light to the device and an image detector that receives light from the device. The devices, such as semiconductors, are placed in trays for inspection at one or more inspection stations. A compartment for holding a plurality of trays is positioned near a first inspection station having a first inspection surface. An elevator elevates one of the trays from the compartment and presents the tray and the devices held by the tray to the first inspection surface. After being inspected at a first station, a tray-transfer device moves the tray from the first inspection station to a flipper mechanism. The flipper mechanism includes two jaws and a rotator.
    Type: Grant
    Filed: July 8, 1999
    Date of Patent: February 18, 2003
    Assignee: PPT Vision, Inc.
    Inventors: Mark T. Paulsen, Franz W. Ulrich
  • Publication number: 20030030798
    Abstract: An artificial member that mimics the absorbance spectrum of an animal body part and includes the spectral components of blood analytes is disclosed. The artificial member is made of a light scattering and reflecting material and is configured to be reproducibly received in a measuring receptor that is operatively connected to a non-invasive monitoring device.
    Type: Application
    Filed: June 28, 2002
    Publication date: February 13, 2003
    Applicant: CME Telemetrix, Inc.
    Inventors: James Samsoondar, Ashwani Kaushal, Paul Drennan
  • Publication number: 20030030797
    Abstract: Solid state devise for the calibration of microplate fluorescence and absorption readers and spectrometers is described. When present in a single moiety, the disclosed device can tell if the lamp photomultiplier tube and optical alignment of the microplate reader or spectrometer deviates from its true value. When present as graded calibration pieces, the disclosed device can be used to calibrate a fluorescence or absorption reader. Calibration pieces are shaped, polished and coated with color absorbing or fluorescent standard to fit in microplate holding trays or spectrometers which are commercially available. Solid state devices are stable and durable and very inert to manipulations and thus are more reliable and unfaltering than solutions for absorption and fluorescence microplate readers or spectrometers.
    Type: Application
    Filed: February 19, 2002
    Publication date: February 13, 2003
    Inventors: Henry Palladino, Andrew Hood
  • Publication number: 20030026581
    Abstract: A method and apparatus for controlling the attenuation level of a semiconductor VOA relative to an absolute temperature of the VOA without the use of a power monitor is provided. The method includes the step of providing a variable optical attenuator for attenuating the optical signal. The variable optical attenuator is instructed to maintain the desired attenuation level of the optical signal. The temperature of the variable optical attenuator is periodically sensed, and a required voltage level is determined to achieve the desired attenuation level based at least partially on the periodically sensed temperature of the VOA. The method can further include the step of increasing and decreasing a voltage to the VOA to achieve the required voltage level and thus the desired attenuation level.
    Type: Application
    Filed: July 31, 2001
    Publication date: February 6, 2003
    Inventors: Richard Sharp, Vincent Scalesse, Ravindra N. Kolte
  • Patent number: 6507013
    Abstract: An optical reference signal with a gas sealed in a space, an optical fiber and a lens collecting the light beam exiting the optical fiber before the front end of the space and a photodetector at the back end of the space, which can be connected with an evaluation device. Such an optical reference element makes it possible to use cost-effective and readily available components to provide a reference signal for calibrating an optical spectrum analyzer, for example. The optical reference element is connected to the output of the optical device.
    Type: Grant
    Filed: December 28, 2000
    Date of Patent: January 14, 2003
    Assignee: Wavetek Wandel Gotermann Eningen GmbH
    Inventor: Eberhard Loecklin
  • Publication number: 20020186369
    Abstract: The present invention provides an artificial member (80, 210) which mimics the absorbance spectrum of a body part and includes the spectral components of blood analytes. The artificial member comprises a light scattering and reflecting material, and has a chamber portion comprising one or more chambers (90, 100, 220). The artificial member is configured to be reproducibly received in a measuring receptor which receptor is operatively connected to a non-invasive monitoring device.
    Type: Application
    Filed: July 30, 2002
    Publication date: December 12, 2002
    Inventors: Theodore E. Cadell, Paul Drennan, James Samsoondar, Romuald Pawluczyk, Ashwani Kaushal, Bronislaw Bednarz, John Kuta
  • Patent number: 6490033
    Abstract: A method of calibrating an interferometer system and a multilayer thin film used for calibrating the interferometer system. The method including measuring the step height of a gold step with the interferometer system, the multilayer thin film comprising a gold layer that defines the gold step. The multilayer thin film having an optical flat, a first layer on the surface of the optical flat, a second layer on the first layer, a test layer on a part of the second layer, and a gold layer on the test layer and on a part of the second layer uncovered by the test layer. The test layer having a test layer step, and the gold layer having a gold step over the test layer step. Also, a reference standard and a method of making the reference standard for a thin film sample with one or more component thin film layers, the reference standard having a gold layer over the surface of the thin film sample.
    Type: Grant
    Filed: January 5, 2000
    Date of Patent: December 3, 2002
    Assignee: Lucent Technologies Inc.
    Inventors: David Gerald Coult, Gustav Edward Derkits, Jr., Franklin Roy Dietz, Ranjani C. Muthiah, Sonja Radelow
  • Publication number: 20020154300
    Abstract: Hyperspectral imaging calibration devices and methods for their use are described that generate images of three dimensional samples. A calibration device may assume the shape of a desired imaging sample such as a body part and may be sterile prior to placement. The calibration device may include openings or may be modified to expose a region of the sample during use. Spectral images, typically obtained at multiple wavelengths, are made of the calibration device. Algorithms are provided that utilize the spectral images of the calibration device to determine the effects of lighting conditions and sample shape on the sample image to form a calibrated image. Calibrated images produced by these devices and methods can provide information, including clinical data that are less sensitive to lighting and sample shape compared to alternative technologies.
    Type: Application
    Filed: November 7, 2001
    Publication date: October 24, 2002
    Inventors: James R. Mansfield, Jenny E. Freeman, Michael E. Leventon, Michael J. Hopmeier, Derek Brand
  • Patent number: 6459482
    Abstract: The present invention provides SEM systems, SEM calibration standards, and SEM calibration methods that improved accuracy in critical dimension measurements. The calibration standards have features formed with an amorphous material such as amorphous silicon. Amorphous materials lack the crystal grain structure of materials such as polysilicon and are capable of providing sharper edged features and higher accuracy patterns than grained materials. The amorphous material can be bound to a silicon wafer substrate through an intermediate layer of material, such as silicon dioxide. Where the intermediate layer is insulating material, as is silicon dioxide, the intermediate layer may be patterned with gaps to provide for electrical communication between the amorphous silicon and the silicon wafer. Charges imparted to the amorphous silicon during electron beam scanning may thereby drain to the silicon wafer rather than accumulating to a level where they would distort the electron beam.
    Type: Grant
    Filed: December 4, 2000
    Date of Patent: October 1, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Bhanwar Singh, Ramkumar Subramanian, Khoi A. Phan, Bharath Rangarajan, Michael K. Templeton, Sanjay K. Yedur, Bryan K. Choo
  • Publication number: 20020118361
    Abstract: The present invention provides an artificial member (80, 210) which mimics the absorbance spectrum of a body part and includes the spectral components of blood analytes. The artificial member comprises a light scattering and reflecting material, and has a chamber portion comprising one or more chambers (90, 100, 220). The artificial member is configured to be reproducibly received in a measuring receptor which receptor is operatively connected to a non-invasive monitoring device.
    Type: Application
    Filed: February 28, 2002
    Publication date: August 29, 2002
    Inventors: Theodore E. Cadell, Paul Drennan, James Samsoondar, Romuald Pawluczyk, Ashwani Kaushal, Bronislaw Bednarz, John Kuta
  • Patent number: 6441900
    Abstract: Light having a predetermined wavelength band as issued from a light-emitting diode is launched into a gas absorption cell which is filled with a gas having a plurality of absorption spectra. The light launched into the cell has a plurality of wavelengths absorbed by the gas. The absorption wavelengths are known and their values are preset in a memory in an optical spectrum analyzing section 58. The light passing through the cell is launched into the optical spectrum analyzing section 58, where it receives arithmetic operations to produce an optical spectrum. The optical spectrum analyzing section 58 has a CPU which compares a plurality of wavelengths having dominant absorption in the obtained optical spectrum with the preset reference wavelengths to compute the errors in wavelength measurement. The calibration value is determined on the basis of the average of these errors and the optical spectrum analyzer is accordingly calibrated in wavelength.
    Type: Grant
    Filed: March 28, 2000
    Date of Patent: August 27, 2002
    Assignee: Ando Electric Co., Ltd.
    Inventor: Kenichi Fujiyoshi
  • Publication number: 20020105639
    Abstract: A calibration artifact and a method of calibrating a machine vision measurement system. The calibration artifact includes a substrate and a number of concentric rings on one surface of the substrate. Each ring is of a different pre-defined size. The change in the size of any two adjacent rings is different than the change in size of any other two adjacent rings.
    Type: Application
    Filed: February 6, 2001
    Publication date: August 8, 2002
    Inventor: Richard Roelke
  • Patent number: 6421120
    Abstract: Optical wavelength reference apparatus with wide wavelength range. Illuminated by a wideband source, a first reference such as absorption lines in a gas cell is used as a transfer standard, calibrating the response of the secondary reference over the range of the first reference. The performance of the second reference is extrapolated to a wider wavelength range, retaining the stability and accuracy characteristics of the first reference. Suitable secondary devices include etalons such as Fabry-Perot filters and Mach-Zehnder interferometers.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: July 16, 2002
    Assignee: Agilent Technologies, Inc.
    Inventor: Kenneth R. Wildnauer
  • Patent number: 6385507
    Abstract: An illumination module (20) for illuminating an object (10) comprises a number of illumination rings (62, 64, 66) each comprising a number of radiation-generating elements (50) which are all arranged on a flat plate (42). For each ring, a light guide (72, 82, 84) is provided for guiding the radiation from the ring to the exit window (60) where the radiation exits at a range of angles which are specific to said ring. The rings can be switched on individually, so that different kinds of illumination can be realized.
    Type: Grant
    Filed: February 22, 2001
    Date of Patent: May 7, 2002
    Assignee: U.S. Philips Corporation
    Inventor: Antonius Gerardus Johannes Wilhelmina Maria Buijtels
  • Patent number: 6348965
    Abstract: Solid state devise for the calibration of microplate fluorescence and absorption readers and spectrometers is described. When present in a single moiety, the disclosed device can tell if the lamp photomultiplier tube and optical alignment of the microplate reader or spectrometer deviates from its true value. When present as graded calibration pieces, the disclosed device can be used to calibrate a fluorescence or absorption reader. Calibration pieces are shaped, polished and coated with color absorbing or fluorescent standard to fit in microplate holding trays or spectrometers which are commercially available. Solid state devices are stable and durable and very inert to manipulations and thus are more reliable and unfaltering than solutions for absorption and fluorescence microplate readers or spectrometers.
    Type: Grant
    Filed: September 24, 1999
    Date of Patent: February 19, 2002
    Inventors: Henry Palladino, Andrew Hood
  • Patent number: 6342947
    Abstract: By employing a high-repeatability optical switch that transmits input optical power selectively either to the standard or the unit under test (UUT), OPHASE presents a system for performing a rapid, repeatable comparison between the standard and the UUT. Further, the selective routing of beam traveling through one of the two output fibers that are coupled to the switch either to the standard or the UUT enables the elimination of much of the system uncertainty by enabling initial characterization of the ratio, Rp, and inequivalence, Im, between the power outputs of the multiple output fibers coupled to the switch. This characterization is accomplished by using an angled interface which is constructed so as to allow simultaneous coupling of the multiple output fibers to the angled interface and enable the power readout of all the output fibers at the standard. Rp and Im are then used to calculate the correction factor that reduces the total uncertainty level in the subsequent calibration of the unit under test.
    Type: Grant
    Filed: April 10, 2000
    Date of Patent: January 29, 2002
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventor: Gary D. Gillino
  • Patent number: 6320661
    Abstract: A method is provided for evaluating a transmittance of an optical member for ultraviolet use, which is an object of measurement. The method includes the steps of cleaning the object of measurement, measuring a transmittance of the object of measurement within a predetermined time period from completion of the cleaning during which a rate of decrease in the transmittance of the object of measurement remains substantially constant, and correcting the transmittance measured in the step of measuring to a transmittance at an evaluation time arbitrarily selected within the predetermined time period in accordance with the constant rate of decrease in the transmittance and a time at which the transmittance is measured.
    Type: Grant
    Filed: March 31, 2000
    Date of Patent: November 20, 2001
    Assignee: Nikon Corporation
    Inventors: Akiko Yoshida, Norio Komine, Hiroki Jinbo
  • Patent number: 6304326
    Abstract: An optical measurement system for evaluating a reference sample that has at least a partially known composition. The optical measurement system includes a reference ellipsometer and at least one non-contact optical measurement device. The reference ellipsometer includes a light generator, an analyzer and a detector. The light generator generates a beam of quasi-monochromatic light having a known wavelength and a known polarization for interacting with the reference sample. The beam is directed at a non-normal angle of incidence relative to the reference sample to interact with the reference sample. The analyzer creates interference between the S and P polarized components in the light beam after the light beam has interacted with reference sample. The detector measures the intensity of the light beam after it has passed through the analyzer.
    Type: Grant
    Filed: February 8, 1999
    Date of Patent: October 16, 2001
    Assignee: Therma-wave, Inc.
    Inventors: David E. Aspnes, Jon Opsal, Jeffrey T. Fanton
  • Patent number: 6268914
    Abstract: A dynamic self calibration process periodically calibrates a system for precisely measuring low-level birefringence properties (retardance and fast axis orientation) of optical materials. Variations in birefringence measurements can be caused by, for example, changes in the environmental conditions ( e.g., ambient pressure or temperature) under which birefringence properties of a sample are measured. In one implementation, the dynamic self calibration process repeatedly calibrates the system at different selected frequencies to compensate for different selected baseline variations.
    Type: Grant
    Filed: January 14, 2000
    Date of Patent: July 31, 2001
    Assignee: Hinds Instruments, Inc.
    Inventor: Baoliang Wang
  • Patent number: 6249343
    Abstract: Wavelength reference standard using multiple gasses and calibration methods using same. A wavelength reference using absorption lines of multiple gasses provides stable reference wavelengths over multiple regions of interest of the optical spectrum. The gasses may be in separate cells or combined in one cell. Improved calibration using the reference is achieved by performing calibration measurements at a plurality of known wavelengths and using an average calibration constant derived from the plurality of measurements. In a second embodiment, improved calibration is achieved by performing calibration measurements at a plurality of known wavelengths and calculating a higher order calibration model, such as a least-squares linear fit. Both approached may be extended by segmenting the wavelength range and using calculated calibration values for each segment.
    Type: Grant
    Filed: October 29, 1999
    Date of Patent: June 19, 2001
    Assignee: Agilent Technologies, Inc.
    Inventors: Gary Wang, Peter Egerton, Kenneth R. Wildnauer
  • Patent number: 6225136
    Abstract: A method of controllably adding at least one contaminant to a surface of a silicon wafer. The method includes providing a solution containing a known concentration of one or more contaminants and having a known pH. The solution is applied to a surface of a silicon wafer and allowed to remain there for a predetermined period of time so that the one or more contaminants adsorb to the wafer surface. The solution is then removed while leaving the adsorbed one or more contaminants on the surface.
    Type: Grant
    Filed: August 25, 1999
    Date of Patent: May 1, 2001
    Assignee: SEH America, Inc.
    Inventors: Justin R. Lydon, Brian L. Tansy
  • Patent number: 6226541
    Abstract: A disposable calibration device is used to calibrate a measurement system which transmits radiation or acoustic waves to a material or tissue in order to effect measurements. The disposable calibration device includes a structure with a window through which the radiation or acoustic waves can be transmitted, as well as a removable calibration target arranged on the window and capable of returning a portion of the radiation or acoustic waves for calibrating the measurement system. The removable calibration target can be peeled from a window to allow a measurement to be made on the material or tissue. Once a measurement is complete, the disposable calibration device can be discarded and a new calibration device can be inserted on the measuring system.
    Type: Grant
    Filed: December 17, 1997
    Date of Patent: May 1, 2001
    Assignee: SpectRx, Inc.
    Inventors: Jonathan A. Eppstein, Mark A. Samuels, Keith D. Ignotz
  • Patent number: 6198538
    Abstract: In an apparatus and method for remote ultrasonic determination of thin material properties, a match filter calibration technique is employed. For a plurality of known material property values and known material thicknesses, an elastic stress wave is generated in the material at a source location. The intensity of a signal generated by the elastic stress wave is sensed at a sense location positioned a known distance from the source location. A feature is selected from among the sensed signals which demonstrates minimal thickness dependents from a plurality of known material thicknesses. The selected feature is applied to the sensed signals to determine propagation time of the signals over the known distance. A calibration curve is then generated to characterize the relationship between signal propagation time and material property value for each material thickness.
    Type: Grant
    Filed: April 9, 1999
    Date of Patent: March 6, 2001
    Assignee: Textron Systems Corporation
    Inventors: Daniel E. Klimek, Petros A. Kotidis
  • Patent number: 6191851
    Abstract: The present invention is an apparatus and method for calibrating a downward viewing image acquisition system. The apparatus comprises a calibration panel with calibrative material of known reflectivity. The calibrative material coats the panel surface or is pulled across its surface or pulled across its frame so as to maintain a consistent reflectivity and/or emissivity. A housing is provided which protects the calibration panel from the deteriorative effects of natural elements. The housing alternately exposes the calibration panel to the downward viewing image acquisition system as a calibration exposure and covers the calibration panel after the calibration exposure.
    Type: Grant
    Filed: April 28, 1999
    Date of Patent: February 20, 2001
    Assignee: Battelle Memorial Institute
    Inventors: Randy R. Kirkham, Janelle L. Downs, Eileen M. Perry