Abstract: In one embodiment, a integrated circuit (IC) configurable to have any one of a plurality of different feature sets, the IC including (a) one or more feature blocks adapted to be independently enabled or disabled, (b) a one-time-programmable (OTP) memory cell for each feature block, the OTP memory cell storing a value, and (c) a feature control module for each feature block, each feature control module connected between the corresponding OTP memory cell and the corresponding feature block, and adapted to enable or disable the corresponding feature block based on the value stored in the corresponding OTP memory cell. The OTP memory cells are programmed by a vendor to select the particular feature set for the IC which is to be available to a purchaser.

Abstract: Methods and apparatus, including computer program products, for a one or multiple-times programmable memory device. A semiconductor may include an active region of a substrate, a thin oxide layer over a substrate, a first and second polysilicon layer, and a first and second metal layer. The first polysilicon layer may have a floating gate, the active region may be substantially perpendicular to the floating gate, and the second polysilicon layer may include a control gate. The first metal layer may include a bit line connected to a first n-diffused region, where the bit line is substantially perpendicular to the floating gate. The second metal layer may include a word line and source line. The word line may be connected to the control gate, and the source line may be connected to a second n-diffused region. The thin gate oxide may have a thickness between 65 and 75 angstroms.

Abstract: A programmable non-volatile device is operated with a floating gate that functions as a FET gate that overlaps a portion of a source/drain region and allows for variable coupling through geometry and/or biasing conditions. This allows a programming voltage for the device to be imparted to the floating gate through variable capacitive coupling, thus changing the state of the device. Multi-state embodiments are also possible. The invention can be used in environments such as data encryption, reference trimming, manufacturing ID, security ID, and many other applications.

Abstract: An antifuse circuit provides on a per bit basis a signal that indicates whether an MTJ (magnetic tunnel junction) antifuse has been previously programmed to a low resistance state in response to a program voltage. A sense amplifier provides the resistance state signal. A plurality of reference magnetic tunnel junctions are coupled in parallel and to the sense amplifier, each having a resistance within a range to provide a collective resistance that can be determined by the sense amplifier to differ from each resistance state of the MTJ antifuse. A write circuit selectively provides a current sufficient to create the program voltage when the write circuit is enabled to program the antifuse magnetic tunnel junction. Upon detecting a change in resistance in the MTJ antifuse, the write circuit reduces current supplied to the antifuse. Multiple antifuses may be programmed concurrently. Gate oxide thicknesses of transistors are adjusted for optimal performance.

Abstract: A system and method are disclosed for providing an electrically programmable read only memory (EPROM) in which each memory cell comprises an NMOS select transistor and a PMOS program transistor with a thick gate oxide and a PMOS breakdown transistor with a thin gate oxide. The source of the NMOS transistor and the source, drain and N well of the PMOS breakdown transistor are connected. The gate of the PMOS breakdown transistor is connected to the PMOS program transistor. The memory cell is programmed by two voltage pulses that are passed to the N well of the PMOS breakdown transistor. The combined voltage of the two pulses is sufficient to break the thin gate oxide of the PMOS breakdown transistor. Because the memory state of the memory cell depends on the breakdown status of the PMOS breakdown transistor, the data may be retained in the memory cell for an unlimited period of time.

Abstract: A programmable non-volatile device is made which uses a floating gate that functions as a FET gate that overlaps a portion of a source/drain region. This allows a programming voltage for the device to be imparted to the floating gate through capacitive coupling, thus changing the state of the device. The invention can be used in environments such as data encryption, reference trimming, manufacturing ID, security ID, and many other applications.

Abstract: A programmable non-volatile device is operated using a floating gate that functions as a FET gate that overlaps a portion of a source/drain region. This allows a programming voltage for the device to be imparted to the floating gate through capacitive coupling, thus changing the state of the device. The invention can be used in environments such as data encryption, reference trimming, manufacturing ID, security ID, and many other applications.

Abstract: Fuse data is supplied to each of a plurality of function blocks through a transfer path using shift registers. When the reliability of fuse elements is low, there is a possibility that a part of the fuse data may have an error. Further, when the transfer path of the fuse data is long, there is a possibility that a value of the fuse data may be inverted due to an influence of noises. Thus, a decoder is arranged in the transfer path of the fuse data, and encoded data is stored in the fuse elements. By performing error detection/correction in the decoder, the high reliability is assured with respect to chip operations and the like.

Abstract: The integrated circuit memory comprises a memory array including a plurality of memory cells in rows and columns, the memory array being divided into a plurality of blocks of the memory cells.

Abstract: A read only memory implemented as a 3D integrated device has a first stratum, a second stratum, and bonded inter-strata connections for coupling the first stratum to the second stratum. The physical bonding between the two strata implements the programming of the read only memory. The stratum may be in wafer form or in die form. The first stratum includes functional active devices and at least one non-programmed active device. The second stratum includes at least conductive routing to be associated with the at least one non-programmed active device. The bonded inter-strata connections include at least one bonded programmable inter-strata connection for programming the at least one non-programmed active device and for providing conductive routing to the programmed active device. The two strata thus form a programmed ROM. Other types of programmable storage devices may be implemented by bonding the two strata.

Abstract: A multi-layered memory device is provided. The multi-layered memory device includes two or more memory units and an active circuit unit arranged between each of the two or more memory units. The active circuit includes a decoder. Each memory unit includes one or more memory layers. Each memory layer includes a memory array.

Abstract: A non-volatile memory device capable of reading and writing a large number of memory cells with multiple read/write circuits in parallel has an architecture that reduces redundancy in the multiple read/write circuits to a minimum. The multiple read/write circuits are organized into a bank of similar stacks of components. In one aspect, each stack of components has individual components factorizing out their common subcomponents that do not require parallel usage and sharing them as a common component serially. Other aspects, include serial bus communication between the different components, compact I/O enabled data latches associated with the multiple read/write circuits, and an architecture that allows reading and programming of a contiguous row of memory cells or a segment thereof. The various aspects combined to achieve high performance, high accuracy and high compactness.

Abstract: An OTP memory device and method for testing the same is disclosed. The memory device includes a number of memory cells and each memory cell has an initial threshold voltage. Each memory cell is programmed to have a first threshold voltage larger than a maximum value of the initial threshold voltages in the test program operation. When the memory device is test pass, the memory device is directly provided for a user program operation without need of an erase operation.

Abstract: A nonvolatile semiconductor memory device includes a nonvolatile storage element to which data is inhibited from being rewritten, a read operation control circuit which captures a read operation instruction signal in synchronization with an external input clock, and a write operation control circuit to which a write operation instruction signal is input asynchronously with the external input clock. The read operation instruction signal gives an instruction to start a read operation to read data out of the nonvolatile storage element, and the write operation instruction signal gives an instruction to start a write operation to write data to the nonvolatile storage element. The device further includes a reset circuit which resets an operation of the read operation control circuit upon receiving the write operation instruction signal.

Abstract: In a p-type flash memory array, separate programming and read bit lines are provided. The programming bit line is used only to program the floating gate transistors in the memory cells connected to that bit line. The read bit line is used only to read the state of a floating gate transistor in a selected memory cell connected to that bit line during the operation of the memory circuit. The resulting structure allows the use of low voltages during both programming and operation of the memory array. This makes possible the use of transistors in the memory array with feature sizes less than, for example, 0.18 microns. At the same time variable, unpredictable capacitances associated with each bit line in prior art p-type flash memory structures using comparable low programming voltages are eliminated when a particular memory cell attached to that bit line is being read out.

Abstract: A one-time field programmable (OTP) memory cell with related manufacturing and programming techniques is disclosed. An OTP memory cell in accordance with one embodiment includes at least one resistance change element in series with a steering element. The memory cell is field programmed using a reverse bias operation that can reduce leakage currents through the array as well as decrease voltage levels that driver circuitry must normally produce in program operations. An array of memory cells can be fabricated by switching the memory cells from their initial virgin state to a second resistance state during the manufacturing process. In one embodiment, the factory switching operation can include popping an anti-fuse of each memory cell to set them into the second resistance state. The array of memory cells in the second resistance state are provided to an end-user.

Abstract: Disclosed herein is a semiconductor memory device which prevents the voltage of a select bit line from being reduced due to the action of coupling capacitance between the select bit line and a non-select bit line, reduces current consumption, and enables high speed reading of bit lines. The semiconductor memory device includes a plurality of memory banks, a plurality of second bit lines, a plurality of selector circuits, a voltage supply circuit. Each of the memory banks includes a plurality of first bit lines, a plurality of word lines, and a plurality of memory banks which are installed between the first bit lines and the word lines. The voltage supply circuit holds non-select bit lines of the first bit lines at the GND level at all times.

Abstract: A memory includes a plurality of word lines, a plurality of bit lines so arranged as to intersect with the plurality of word lines, a plurality of memory cells arranged on positions where the word lines and the bit lines intersect with each other respectively and selection circuits connected to the bit lines, wherein the current driving ability of the selection circuits is different depending on positions where the bit lines are arranged.

Abstract: A memory cell structure of a metal (or via) programmable ROM whereby a transistor is shared between bit cells of the programmable ROM. Such a memory cell structure may include: a word line; a bit line; first and second virtual grounding lines; a grounding line; a first bit cell selected by signals of the word line and the first virtual grounding line; and a second bit cell selected by signals of the word line and the second virtual grounding line, wherein a cell transistor, one side of which is connected to the bit line is shared both by the first and second bit cells. Also, the other side of the cell transistor may be floated or connected to the bit line or, alternatively, connected to any one of the first virtual grounding line, the second virtual grounding line and the grounding line, and the gate of the cell transistor is connected to the word line.

Abstract: A read only memory matrix in an integrated circuit contains data transistors coupled to both the bit lines and the word lines in data dependent ones of the cells of the matrix. A differential sense amplifier has a first input coupled to a bit line, a second input coupled to a reference circuit and a control input for controlling activation and deactivation of amplification by the sense amplifier. A coupling circuit controllably permits charge sharing between a selectable one of the bit lines and the first input. A timing circuit is arranged to signal operation in a first phase, when the word lines have selected a row of the matrix, followed by a second phase. The timing circuit controls the coupling circuit to permit charge sharing between the input and the selectable one of the bit lines in the first phase.

Abstract: A holographic read only memory card which can be coupled to and read by a card reader to which electronic read only memory cards can also be coupled to and read by the card reader is disclosed. The holographic read only memory card comprises: a housing having a compartment for receiving a holographic storage medium; a holographic storage medium having stored thereon holographic data; and optionally a an electronics panel member having an electronic memory component which can be read by the card reader when the holographic read only memory card is coupled to the electronic card reader. The housing comprises one or more card locating members to thereby repeatedly position the holographic read only memory card each time the holographic read only memory card is coupled to the electronic card reader so that the holographic data can be read.

Abstract: In a semiconductor integrated circuit device having a volatile memory therein, high-speed operation is enabled and the density of the memory can be enhanced. The volatile memory includes a word line, a complementary bit line having bit lines, a plurality of common source lines, and a memory cell that is coupled with the word line and the complementary bit lines. The memory cell includes transistors. The gate electrodes of the transistors are coupled with the word line, and the drain electrode of one of the transistors is coupled with one of the bit lines. The drain electrode of the other transistor is coupled with the other bit line. The respective source electrodes of the transistors are coupled with any one of the common source lines, or brought in a floating state, thereby storing storage information in the memory cell.

Abstract: One embodiment of the present invention relates to a read only memory (ROM) that includes a memory cell pair. The memory cell pair includes a first memory cell and a second memory cell that share a common drain that is associated with the memory cell pair. The memory cell also includes a bitline configured to provide data from the first and second memory cells, wherein the bitline is electrically isolated from the common drain. Other methods and systems are also disclosed.

Abstract: An enhanced memory compiler system and associated methods are provided. In one example, a method for accessing a plurality of memory compiler units includes: prompting, via a multi-compiler interface, for a selection of a first memory compiler unit from a plurality of memory compiler units; remotely linking to the selected first memory compiler unit; and generating a combination datasheet comprising a plurality of memory instances. In another example, a system for providing a combination datasheet to a remote computer includes a plurality of memory compiler units, and each memory compiler unit includes a program for assisting a multi-compiler interface to generate a combination datasheet, and the combination datasheet includes memory instances created by at least two of the plurality of memory compiler units.

Abstract: A memory device comprises a plurality of first and second non-volatile memory cells arranged as an array. Each memory cell stores information. The memory device further comprises an access unit coupled to the array. The access unit stores information in the plurality of first and second non-volatile memory cells. The memory device further comprises a verifying unit coupled to the array. The verifying unit verifies the information stored in a group of the first and second memory cells by verifying only a subset of the group. The subset comprises at least one of the second memory cells.

Abstract: A memory device has a first core memory array, a second core memory array, a third core memory array and a fourth core memory array, and a first common reference section for the first core memory array and the second core memory array, and a second common reference section for the third core memory array and the fourth core memory array. Another memory device with shared signals and a method is also provided.

Abstract: In memory array of a memory circuit, a discharging module and an auxiliary module are disposed on each column line. While accessing an objective memory unit on a column line of the memory, the memory unit discharges the corresponding row line of the objective memory unit according to a discharging signal and a column selective signal. When the objective memory unit is enabled, the voltage level of the corresponding column line is changed, if the voltage level reaches a threshold voltage level, the auxiliary module enhances the increment of the voltage level of the column line.

Abstract: A high-speed lookup table is designed using Rapid Single Flux Quantum (RSFQ) logic elements and fabricated using superconducting integrated circuits. The lookup table is composed of an address decoder and a programmable read-only memory array (PROM). The memory array has rapid parallel pipelined readout and slower serial reprogramming of memory contents. The memory cells are constructed using standard non-destructive reset-set flip-flops (RSN cells) and data flip-flops (DFF cells). An n-bit address decoder is implemented in the same technology and closely integrated with the memory array to achieve high-speed operation as a lookup table. The circuit architecture is scalable to large two-dimensional data arrays.

Abstract: A method for programming a one-time programmable memory of an integrated circuit includes the following steps: writing an instruction set into the one-time programmable memory via a first programmable interface, running a programmable self-instruction of the instruction set, and writing a proofreading value of the integrated circuit into the one-time programmable memory via a second programmable interface. The present method takes full advantage of the one-time programmable memory. Manufacturers for manufacturing integrated circuits don't write various proofreading values corresponding to different applications. A producing efficiency can be increased, and a producing cost can be decreased. The present integrated circuit needs not to be communicated with an addition storing device, so the present integrated circuit has a simple construction, and the cost can be decreased. Since the present integrated circuit can write perform a proofreading self-instruction, the producing cost can be decreased.

Abstract: The invention concerns a ROM comprising a set of memory points arranged in rows and columns, each memory point capable of storing two bits of data and comprising a single switch controllable to connect together first and second terminals of said switch, each of said first and second terminals being connected to one of first, second and third conductive lines, wherein said switch is connected via said first and second terminals between said first and second lines to encode a first data value, between said first and third lines to encode a second data value, between said second and third lines to encode a third data value, and both of said first and second terminals being connected to the same one of said first, second and third lines to encode a fourth data value.

Abstract: A read-only memory (ROM) is disclosed that uses the presence or absence of linear passive electrical elements, such as resistors or capacitors, to encode zeros and ones, permitting a large-area ROM to be fabricated, possibly on a flexible substrate. The ROM includes a substrate, a plurality of row conductors insulated from each other and at least partially layered on a portion of the substrate; a plurality of column conductors insulated from each other and from the row conductors and at least partially layered above or below a portion of the plurality of row conductors, a plurality of amplifiers electrically connected to the column conductors, and at least one linear passive element attached between the row conductors and the column conductors.

Abstract: A compact, shared source line and bit line architecture for a diffusion programmable ROM. In one embodiment, a ROM circuit or instance includes a plurality of storage cells organized as an array of rows columns. A shared source line is associated with a first pair of adjacent columns, the shared source line being maintained at a predetermined level, wherein source terminals of storage cells in the adjacent columns are electrically coupled to the shared source line. A shared bit line is associated with a second pair of adjacent columns, the shared bit line being maintained at the predetermined level, wherein drain terminals of storage cells in the adjacent columns are electrically coupled to the shared bit line.

Abstract: A circuit includes a first pre-charge module, a first multiplexer module, a second pre-charge module, a second multiplexer module, a sense amplifier circuit, a third pre-charge module, an output module. The circuit is operatively coupled to a first core block and a second core block to provide the desired matching characteristics. The first core block and the second core block are memory blocks used for storing data bits for read-write operations. The circuit utilizes a unique operational coupling with one of the core blocks to provide the matching characteristics.

Abstract: A trimming apparatus including a switch transistor and a one-time programming (OTP) memory component is provided. The switch transistor has a first source/drain terminal connected to a first bias voltage, a gate terminal used for receiving a switch signal, and a second source/drain terminal connected to a first source/drain terminal of the OTP memory component. When the trimming apparatus provided by the present invention intends to perform trimming for an integrated circuit, the switch transistor is conducted to program the OTP memory component.

Abstract: One-time programmable cell and memory device having the same includes a first metal oxide semiconductor (MOS) transistor configured to form a current path between a first node and a second node in response to a read-control signal, a second MOS transistor configured to form a current path between a third node and the second node in response to a write-control signal and an anti-fuse connected between the second node and a ground voltage terminal, wherein a voltage applied to the second node is output as an output signal.

Abstract: A method for reading data stored in a multiple bit memory cell, the memory cell comprising a switch located within an array of switches arranged in columns and rows, each switch having a control node and first and second switched nodes between which the flow of current is dependent on the voltage applied to the control node, wherein each row has a word line connected to the control nodes of the switches of that row, each column comprises only one switch from each row, and each column has first, second and third bit lines connectable to one of the switched nodes of each switch of that column to define the stored data, the method comprising: fixing the voltage of the second bit line of the switch and reading data from the first and third bit lines, and subsequently: fixing the voltage of the first bit line of the switch and reading data from the second and third bit lines.

Abstract: A nitride trapping memory device includes a comparator, a bias unit, a memory cell, a cycling cell, a compensation cell and a control unit. The comparator has a reference voltage. The bias unit is for outputting a bias voltage to the comparator, and the comparator outputs a bit value according to comparison of the bias voltage and the reference voltage. The memory cell is connected to the bias unit via a first switch. The cycling cell is connected to the bias unit via a second switch. The compensation cell is connected to the bias unit via a third switch. The control unit is for controlling the cycling cell and the compensation cell according to the bit value.

Abstract: A common voltage adjustment apparatus for adjusting a common voltage of a liquid crystal display (LCD) panel includes a data-read-write circuit and an output circuit. The data-read-write circuit includes a one-time-programmable (OTP) memory module and a control interface unit. The OTP memory module includes several OTP memories. The control interface unit outputs common-voltage-setting data according to a control signal and selectively stores the common-voltage-setting data into an unwritten OTP memory in the OTP memory module. The output circuit includes a reference-voltage generator and a digital-to-analog converter (DAC). The reference-voltage generator generates a reference voltage. The DAC converts the common-voltage-setting data into an output voltage according to the reference voltage.

Abstract: A semiconductor device with a plurality of one time programmable elements and to a method for programming a semiconductor device, and to a method for operating a semiconductor device is disclosed. One embodiment provides a method for programming a semiconductor device comprising a plurality of one time programmable elements that form a group of one time programmable elements. The one time programmable elements of the group are left in a non-programmed state if a first information is to be stored by the group. A first one time programmable element of the group is programmed if a second information differing from the first information is to be stored by the group.

Abstract: A nonvolatile semiconductor memory device includes a storage element which is programmed with information by breaking an insulating film by application of electrical stress to the storage element, a control switch which controls the application of electrical stress to the storage element, and a control circuit which controls conduction/nonconduction of the control switch. The device further includes a power supply circuit including a voltage generation circuit which generates a first voltage to cause the electrical stress in program operation, a sensing circuit which senses that the insulating film is broken down, and a counter circuit which controls the control circuit to interrupt the application of electrical stress to the storage element when a given period of time elapses after the sensing circuit senses that the insulating film is broken down.

Abstract: In a user-configurable pre-recorded memory (UC-PM), a user can select contents he is interested in, and pay copyright fees accordingly. With large capacity, low cost and great integratibility, 3D-M, more particularly 3D-MPM, is suitable for UC-PM. It provides excellent access control and impenetrable copyright protection. UC-PM will enable a copyright distribution model fair to both copyright holders and users. On the other hand, the 3D-MPM scaling should be the fastest among all memory types.

Abstract: A high-speed programmable ROM, a memory cell structure therefor, and a method for writing data on/reading data from the programmable ROM are provided.

Abstract: One embodiment of the present invention relates to a read only memory (ROM) that includes a memory cell pair. The memory cell pair includes a first memory cell and a second memory cell that share a common drain that is associated with the memory cell pair. The memory cell also includes a bitline configured to provide data from the first and second memory cells, wherein the bitline is electrically isolated from the common drain. Other methods and systems are also disclosed.

Abstract: An integrated circuit memory device includes programmed memory cells and programmable and erasable memory cells. The memory device includes a first memory array block in which programmed memory cells are arranged and a second memory array block in which programmable and erasable memory cells are arranged. The programmed memory cells in the first memory array block may be programmed with predetermined data during a semiconductor manufacturing process, and may be mask read-only memory (ROM) cells. The programmable and erasable memory cells in the second memory array block may be programmed or erased with predetermined data after the semiconductor manufacturing process, and may be electrically erasable and programmable read-only memory (EEPROM) cells or flash memory cells.

Abstract: This invention discloses a circuit trimming system that includes a one-time programmable memory (OTP). The OTP further includes a forward biased trim device connected between a voltage supply Vcc and a ground voltage wherein the Vcc having a reduced voltage substantially lower than a trimming voltage for a reversed biased device at ten volts or higher. The OTP further includes a drive circuit provided to select the OTP at a low current operating condition and for turning on a high trim current through the forward biased trim device for trimming and programming the OTP. The trimming system further includes a sense circuit connected across the forward biased trim device is for sensing a current and voltage of the forward biased trim device.

Abstract: This invention discloses a system comprising a first comparator circuit configured to assert a first control signal in response to a first input number matching one of a first numbers stored therein, a second comparator circuit configured to assert a second control signal in response to: (i) at least one latched assertion of the first control signal; (ii) a second input number matching an intermediate number produced by incrementing the first input number; and (iii) an assertion of an input signal, and to de-assert the second control signal absent of either the matching between the second input number and the intermediate number or the de-assertion of the input signal, and a generator circuit configured to output a predetermined instruction data stored therein in response to the assertion of the first control signal, and to output a third number in response to the assertions of the second control signal.

Abstract: Data is collected about samples that possess characteristics that change over time and that are contained in any array of containers arranged in a container spatial relationship. A matrix of cells is displayed in a cell spatial relationship corresponding to the container spatial relationship. The matrix user interface allows a user to enter a large number of data points per minute, compared to conventional systems, which may require a user to swipe a bar code, enter an indicia, or enter a row/column position prior to entering data. Data collection of characteristics of samples also can be scheduled, by storing past values of the characteristics of the samples and also storing rules in a rule base. The rules determine whether a characteristic of a sample is to be data collected and, if so, identify the characteristic which is to be data collected, based on the past values of characteristics of samples.

Abstract: Programmable logic devices (PLDs) that can be repeatedly erased and reprogrammed, e.g., during the testing and/or design phases, and then converted to one-time programmable (OTP) devices on a permanent basis, and methods of converting a PLD to an OTP device. In some embodiments, only the erase function is disabled in the device. Because programming data cannot then be erased from the device, the addition of new programming data is very unlikely to yield an operable design. Therefore, the programming function is also effectively disabled. The programming function can be directly disabled in addition to or instead of the erase function, if desired. The erase and/or programming functions can be disabled, for example, by blowing one or more fuses included in the erase and/or programming circuitry of the PLD.

Abstract: In a p-type flash memory array, separate programming and read bit lines are provided. The programming bit line is used only to program the floating gate transistors in the memory cells connected to that bit line. The read bit line is used only to read the state of a floating gate transistor in a selected memory cell connected to that bit line during the operation of the memory circuit. The resulting structure allows the use of low voltages during both programming and operation of the memory array. This makes possible the use of transistors in the memory array with feature sizes less than, for example, 0.18 microns. At the same time variable, unpredictable capacitances associated with each bit line in prior art p-type flash memory structures using comparable low programming voltages are eliminated when a particular memory cell attached to that bit line is being read out.

Abstract: According to the invention, mounting area is decreased and yield is improved by decreasing the number of elements, and a memory with less burden on peripheral circuitry and a driving method thereof are provided. The invention comprises a memory cell including a memory element in a region where a bit line and a word line cross with an insulator interposed between them, a column decoder, and a selector including a clocked inverter. An input node of the clocked inverter is connected to the bit line while an output node is connected to a data line. Among a plurality of transistors connected in series which form the clocked inverter, a gate of a P-type transistor of which source or drain is connected to a power source on the high potential side VDD and a gate of an N-type transistor of which source or drain is connected to a power source on the low potential side VSS are connected to the column decoder.