Abstract: A method for programming a one-time programmable memory of an integrated circuit includes the following steps: writing an instruction set into the one-time programmable memory via a first programmable interface, running a programmable self-instruction of the instruction set, and writing a proofreading value of the integrated circuit into the one-time programmable memory via a second programmable interface. The present method takes full advantage of the one-time programmable memory. Manufacturers for manufacturing integrated circuits don't write various proofreading values corresponding to different applications. A producing efficiency can be increased, and a producing cost can be decreased. The present integrated circuit needs not to be communicated with an addition storing device, so the present integrated circuit has a simple construction, and the cost can be decreased. Since the present integrated circuit can write perform a proofreading self-instruction, the producing cost can be decreased.

Abstract: Bit lines (BL0, BL0R, BL1, BL1R, . . . ) of a ROM memory array with differential detection reading are arranged within two overlaid metallization levels so as to increase the read reliability of binary values stored in the array. The ROM array is divided into matrix segments (100, 101, . . . ) aligned parallel to the bit lines. The bit lines are shifted horizontally and/or vertically within transition regions (T) located between the segments of matrix, by effecting circular permutations between the positions of the bit lines that are divided up into groups of four.

Abstract: The invention relates to a ROM memory cell of a ROM memory, which provides a first predetermined potential or a second predetermined potential in the driven state at a memory cell output in a manner dependent on the programming state of the ROM memory cell.

Abstract: A semiconductor integrated circuit has a nonvolatile memory and a logic circuit which uses information stored in the nonvolatile memory to perform logical operation. The nonvolatile memory comprises bit lines, word lines, and memory cells. The memory cell comprises MOS transistors whose gate electrodes are connected with a word line. Information storage is carried out according to whether one source/drain electrode of the MOS transistors is connected with a source line or floated. During other periods than a predetermined period in the operation of accessing the memory cell, the potential difference between the source/drain electrodes of the MOS transistors constituting the memory cell is zeroed. Subthreshold leakage current is prevented from passing through the memory cell on standby. During the predetermined period in accessing operation, a potential difference is produced between the source/drain electrodes of the MOS transistors.

Abstract: A method is described that induced dielectric breakdown within a capacitor's dielectric material while driving a current through the capacitor. The current is specific to data that is being written into the capacitor. The method also involves reading the data by interpreting behavior of the capacitor that is determined by the capacitor's resistance, where, the capacitor's resistance is a consequence of the inducing and the driving.

Abstract: A sense amplifier circuit for a non-volatile semiconductor memory device is used to output data written in a selected non-volatile memory cell and is constructed as a current mirror circuit including a first mirror transistor and a second mirror transistor of a mirror circuit. A selection gate transistor and a detection transistor of the selected non-volatile memory cell are included as part of a load circuit connected to a drain electrode of the second mirror transistor. The detection transistor has a drain electrode linked to a source electrode of the selection gate transistor. An operating current of the selection gate transistor is smaller than an operating current of the detection transistor, and an electric current output from the second mirror transistor is determined by the operating current of the selection gate transistor. This arrangement enables determination of the stable operating current of the memory cell irrespective of the state of a floating gate of the detection transistor.

Abstract: A high speed read-only memory (ROM). Data stored in a memory cell in the ROM array is provided to a sense amplifier in a differential form. Two transistors storing complementary logic states form a memory cell and store a data bit. One transistor has a source terminal connected to a ground terminal while the other transistor has a source terminal left unconnected. The drain terminals of each of the two transistors is connected to a corresponding one of a differential bit-line pair which provides a differential signal representing the stored data bit to a sense amplifier.

Abstract: Disclosed herein is a semiconductor memory device which prevents the voltage of a select bit line from being reduced due to the action of coupling capacitance between the select bit line and a non-select bit line and reduces current consumption in the non-select bit line. The semiconductor memory device includes a memory cell array, a plurality of word lines, a plurality of bit lines, a data line, a plurality of selector circuits, at least one precharge circuit, and at least one pull-down circuit. The selector circuits switch electrical connections and isolations between the respective bit lines and the data line. The precharge circuit precharges the select bit line to a predetermined voltage level which is different from a voltage level of a first voltage line. The pull-down circuit pulls the select bit line down to the voltage level of the first voltage line.

Abstract: A nitride read-only memory (NROM) device includes a comparator, a bias unit, a memory cell, a cycling cell, a compensation cell and a control unit. The comparator has a reference voltage. The bias unit is for outputting a bias voltage to the comparator, and the comparator outputs a bit value according to comparison of the bias voltage and the reference voltage. The memory cell is connected to the bias unit via a first switch. The cycling cell is connected to the bias unit via a second switch. The compensation cell is connected to the bias unit via a third switch. The control unit is for controlling the cycling cell and the compensation cell according to the bit value.

Abstract: A method and system for quantifying and correcting spatial-intensity trends for each channel of a microarray data set having one or more channels. The method and system of one embodiment of the present invention selects a set of features from each channel of the microarray data set. Based on the selected set of features, a surface is used to determine the intensities for all features in each channel of the microarray data set. Spatial-intensity trends within the microarray data set are quantified, based on the surface to the intensities for each channel of the microarray data set. After the surface has been determined, the spatial-intensity trend can be removed from the microarray data set.

Abstract: A electrically blowable fuse is programmed using an electro-migration effect and is reprogrammed using a reverse electro-migration effect. The state (i.e., “opened” or “closed”) of the electrically blowable fuse is determined by a sensing system which compares a resistance of the electrically blowable fuse to a reference resistance.

Abstract: The number of times of manifestation of each of a plurality of partial base sequences obtained from own base sequence data containing a target base sequence is counted, and held as an own frequency table. The number of times of manifestation of each of the plurality of partial base sequences is also counted for competing base sequence data to be distinguished from the own base sequence data, and held as a competing frequency table. In a probe evaluation step, the frequency information in the own and competing frequency tables is displayed so as to be comparable with reference to the partial base sequences, and at least one of the plurality of partial base sequences is determined according to instruction operations made by a user, thereby forming probe candidates based on the determined partial base sequences.

Abstract: A semiconductor integrated circuit device includes a storage element, program circuit, and sensing circuit. The storage element stores information by electrically irreversibly changing the element characteristics. The program circuit programs the storage element by electrically irreversibly changing its element characteristics. The sensing circuit senses the irreversibly changed element characteristics of the storage element in distinction from an unchanged state. The program circuit includes a high-voltage generator which irreversibly changes the element characteristics of the storage element by applying a high voltage to it, and a current source which supplies an electric current to the storage element having element characteristics changed by the high-voltage generator, thereby stabilizing the element characteristics.

Abstract: A nonvolatile semiconductor memory device comprising a storage element which is programmed with information by varying electrical properties irreversibly, a selection switch connected in series to the storage element, a protection element connected in parallel to the storage element to protect the storage element from irreversible variations of electrical properties when the storage element is unprogrammed, a first activation circuit which activates the selection switch, a second activation circuit which activates the protection element in complement with the first activation circuit in normal mode, and a test circuit which conducts a test on the storage element while the second activation circuit is activating the protection element together with the first activation circuit in test mode.

Abstract: Methods and apparatus for efficiently enabling pages within a block to be accessed are disclosed. According to one aspect of the present invention, a method for writing data into a first block in a non-volatile memory which includes pages that are grouped into groups which each include two or more pages involves determining when a first group is available to receive the data. When it is determined that the first group is available to receive the data, the data is written into a first page included in the first group. The method also includes determining when a second group is available to receive the data if it is determined that the first group is not available to receive the data, and writing the data into a second page included in the second group when it is determined that the second group is available to receive the data.

Abstract: A method of programming a radiation-hardened integrated circuit includes the steps of supplying a prototype device including an SRAM memory circuit or programmable key circuit to a customer, having the customer develop working data patterns in the field in the same manner as a reading and writing to a normal RAM memory, having the customer save the final debugged data pattern, delivering the data pattern to the factory, loading the customer-developed data pattern into memory, programming the customer-developed data pattern into a number of production circuits, irradiating the production circuits at a total dosage of between 300K and 1 Meg RAD to burn the data pattern into memory, and shipping the irradiated and programmed parts to the customer.

Abstract: In a memory cell array in a hierarchical bit line mode in which sub-arrays in a virtual ground line mode are arranged in a column direction, data is read out at high speed, preventing fluctuation in wiring capacity of a main bit line. In each sub-array, one of a source electrode or a drain electrode in each of the memory cells in the same column is connected to a common first bit line, and the other thereof is connected to a second bit line. The first bit lines of one half of the sub-arrays positioned in the same column are connected to the first main bit line through selection transistors and the second bit lines thereof are connected to the second main bit line through selection transistors, and the first bit lines of the other half of the sub-arrays positioned in the same column are connected to the second main bit line through selection transistors and the second bit lines thereof are connected to the first main bit line through selection transistors.

Abstract: A system includes a pull-up circuit to program a memory cell. The pull-up circuit may include a level shifter to receive a control signal, a supply voltage, and one or more of a plurality of rail voltages, each of the plurality of rail voltages substantially equal to a respective integer multiple of the supply voltage, and to generate a second control signal, and a cascode stage. The cascode stage may include a plurality of transistors, a gate voltage of each of the plurality of transistors to be controlled at least in part by a respective one of the second control signal, the supply voltage, and at least one of the plurality of rail voltages, and an output node to provide a cell programming signal.

Abstract: An apparatus and method to improve a cycle time of a Read Only Memory (ROM). Loading of each bit line is controlled such that no bit line has less than a specified loading fraction of a loading of a maximally loaded bit line. No additional space or additional circuitry is required. Four NFET pair arrangements are personalizable by via placement by a designer or design automation program. One of the NFET pair arrangements is usable to pad load on a bit line without altering a logical personalization of the bit line. Proper selection from the four NFET pair arrangements ensure that no bit line has less than the specified loading fraction of the loading of the maximally loaded bit line, as well as providing proper logical personality of the bit line.

Abstract: A high-density memory device and design method that utilizes some or all of the existing stacked process conductor layers provided by a manufacturing process to enhance the number of available bitlines and/or wordlines within the memory device. The memory device includes a plurality of memory cells arranged in columns and rows, a plurality of wordlines, a plurality of bitlines, at least one via-stack, wherein said existing stacked process conductor layers are used to implement at least one additional wordline or bitline. The via-stacks consist of a plurality of vias, are located close to a memory cell, and adapted to electrically connect the memory cell to multiple bitlines or multiple wordlines or both0. This design method increases the number of possible connections to or from each individual memory cell. When this design method is combined with varied configurations of basic underlying ROM cell types, even further increased cell density can be achieved.

Abstract: A one time programmable (OTP) memory has two-bit cells for increasing density. Each cell has two select transistors and a programmable transistor in series between the two select transistors. The programmable transistor has two independent storage locations. One is between the gate and a first source/drain region and the second is between the gate and a second source/drain region. The storage locations are portions of the gate dielectric where the sources or drains overlap the gate and are independently programmed by selectively passing a programming current through them. The programming current is of sufficient magnitude and duration to permanently reduce the impedance by more than three orders of magnitude of the storage locations to be programmed. The programming current is limited in magnitude to avoid damage to other circuit elements and is preferably induced at least in part by applying a negative voltage to the gate of the programming transistor.

Abstract: The disclosure is NAND flash memory device with a partial copy-back mode, comprised of a cell array constructed of pages, a page buffer block composed of page buffers storing data in correspondence with the pages, a selection circuit for designating one or more pages to be initialized in the partial copy-back mode, and a control circuit for generating control signals to operate the page buffers and the selection circuit.

Abstract: Selection signals output from a decoder are selectively set at High according to the states (blown or not blown) or fuses in bit cells in a cell group specifying circuit. Then, one of transistor gates is turned ON so that a data bit cell group in/from which data is written and read out is selected. Accordingly, stored data can be rewritten multiple times by sequentially blowing the fuses in the cell group specifying circuit.

Abstract: A device for selecting an operating mode of an integrated circuit, comprising a ROM storing at least one predetermined value formed of data words, a non-volatile programmable memory controllable to store said predetermined value, a comparator indicating how many data words of the value stored in the programmable memory are identical to the data words of the predetermined value, and a control means deactivating a selection signal for selecting the operating mode when the number of identical words is greater than a predetermined threshold.

Abstract: A method for operating a semiconductor memory (M) including a plurality of memory cells (MC), wherein the memory cells (MC) are arranged adjacent to one another, the arrangement starts with a first memory cell (MF) and ends with a last memory cell (ML), each memory cell (MC) has a first side (S) and a second side (D), the memory cells (MC) are connected by a bitline (BL) on the first side (S) of the memory cell and connected by another bitline (BL) on the second side (D) of the memory cell, the first side (S) of a memory cell is connected to a same bitline (BL) as the second side (D) of an adjacent memory cell, each of the memory cells (MC) is connected by a same wordline (WL), including the steps of: selecting a memory cell (MC) for operation, applying a first potential (VS) to all the bitlines (BL) connected to memory cells (MC) arranged to the first side (S) of the memory cell, applying a second potential (VD) to all the bitlines (BL) connected to memory cells (MC) arranged to the second side (D) of the me

Abstract: A ROM-type memory is provided that includes a matrix of memory cells made up of rows and columns, with each row allowing storage of a page of MUX words of N bits. An address decoder decodes addresses in order to extract the page to be read. At the output of the matrix, N multiplexers are each coupled to the columns that correspond to one of the bits of the output stage. An N-bit output stage includes at least one inverter, with each of the inverters being connected to the output of one of the multiplexers so as to restore inverted values of information to be stored to correct values. The inverted values are stored in all of the memory cells of all of the columns coupled to the one multiplexer. Storing the inverted values makes it possible to store less “0” values within the matrix and further makes LVS testing of the ROM memory considerably easier. Also provided is a method for sequentially checking groups of memory cells.

Abstract: A One-Time Programmable (OTP) memory device can include a first OTP memory cell enabled for programming responsive to protected status associated with a second OTP memory cell configured for programming prior to the first OTP memory cell. Related methods are also disclosed.

Abstract: A semiconductor physical quantity sensing device to perform electrical trimming at low cost by using a CMOS manufacturing process and a small number of terminals. The semiconductor physical quantity sensing device includes a wheatstone bridge circuit, which is a sensor element, an auxiliary memory circuit, which stores provisional trimming data, a main memory circuit, which stores finalized trimming data, an adjusting circuit, which adjusts the output characteristics of the sensor element based on trimming data stored in the auxiliary memory circuit or the main memory circuit, with the elements and circuits being only configured of active elements and passive elements manufactured by way of the CMOS manufacturing process formed on a same semiconductor chip.

Abstract: A method and apparatus are provided for reducing leakage current in a read only memory device. Leakage current is reduced by reducing the duration of the precharge cycle during each read cycle so that the associated leakage current will flow for a shorter time period during each cycle. The precharge phase is positioned at the beginning of each read cycle, prior to the evaluation phase. The precharge phase is terminated by a subsequent clock edge or by an internal time out prior to a subsequent clock edge. The time interval between when the columns reach their precharge voltage and the evaluation phase begins is reduced.

Abstract: Methods and systems for automated polynucleotide synthesis design are provided. Example embodiments provide an Automated Polynucleotide Synthesis Design System (“APSDS”), which automatically generates a synthesis design for a designated target sequence specification. In one embodiment, the APSDS comprises a synthesis design engine, user interface support, a synthesis rules data repository, and a synthesis data repository. The APSDS automatically generates a synthesis design by receiving a target sequence(s) specification, generating a potential synthesis design, evaluating the potential design against synthesis rules, and when the evaluation indicates that the potential design is not successful according to the synthesis rules, adjusting the design to generate a new potential synthesis design and repeating the process of evaluating and adjusting until a potential synthesis design is found that satisfies the synthesis rules or until no solution is found.

Abstract: A read-only memory arrangement and method for programming the memory arrangement are provided. The memory arrangement includes memory cells, which each have a transistor with two contacts and a control terminal, address lines, bit lines and a potential line. A combination of one of the address lines and one of the bit lines is uniquely assigned to each memory cell. The control terminal of each transistor is connected to the address line assigned to the respective memory cell. To program a memory cell into a first memory state, one of the contacts of the transistor of the memory cell is connected to the assigned bit line and the other of the contacts is connected to the potential line. To program a memory cell into a second memory state, no connections are established between the contacts of the transistor and either the assigned bit line or the potential line.

Abstract: A computer-based method is provided for transferring data that includes a genomic sequence. The method includes identifying at least one genomic base in an input data stream comprising said genomic sequence; assigning a base-specific binary code to the at least one genomic base; grouping the base-specific binary code to form a genomic data stream representative of the genomic sequence; assigning a command binary code to at least one command for selectively processing said genomic data stream; and integrating said genomic data stream and said command binary code to form an output binary data stream.

Abstract: A memory having a bit line, a word line crossing the bit line, a memory cell electrically connected to the bit line and to the word line, a column decoder and a selector including a clocked inverter having a plurality of transistors electrically connected in series between a first power source and a second power source is provided. An input node of the clocked inverter is connected to the bit line, an output node of the clocked inverter is electrically connected to a data line, the plurality of transistors comprise a P-type transistor and a N-type transistor, a gate electrode of the P-type transistor and a gate electrode of the N-type transistor are electrically connected to the column decoder, and a sense amplifier is not interposed between the bit line and the input node of the clocked inverter.

Abstract: In a flat-cell ROM including a plurality of memory banks, each of the memory banks comprises a memory array, a plurality of bit lines, a plurality of virtual ground lines, three select lines, and a common row of contacts shared with an adjacent memory bank. The common row of contacts are used for connecting the bit lines and virtual ground lines to bit signal lines and virtual ground lines, respectively, and the select lines are used for selecting memory cells in the memory array. With a common row of contacts shared by two adjacent banks, the ROM area is reduced.

Abstract: Provided is a semiconductor memory device using a single-bit line method that determines read operation timing in accordance with operation of a replica bit line. Further provided is a control method for the semiconductor memory device. Even when a transistor property fluctuation has occurred, the semiconductor memory device and the control method are capable of preventing, for example, increases in access time and circuit size and concurrently capable of reducing the occurrence probability of data readout error. The gate lengths of replica memory cell transistors are set as being values greater than the gate length of memory cell transistors. Thereby, a distribution center of a current drive capability distribution of the replica memory cell transistors is set lower than a distribution center of a current drive capability distribution of the memory cell transistors.

Abstract: Structures and methods for write once read only memory employing charge trapping in insulators are provided. The write once read only memory cell includes a metal oxide semiconductor field effect transistor having a first source/drain region, a second source/drain region, a channel region between the first and the second source/drain regions, and a gate separated from the channel region by a gate insulator. A plug couples the first source/drain region to an array plate. A bitline is coupled to the second source/drain region. The MOSFET can be programmed by operation in a reverse direction trapping charge in the gate insulator adjacent to the first source/drain region such that the programmed MOSFET operates at reduced drain source current when read in a forward direction.

Abstract: A method and system for protecting a memory having a plurality of blocks from modification is disclosed. The method and system include providing a plurality of one time programmable (OTP) cells and OTP cell logic coupled with the OTP cells. An OTP cell of the plurality of OTP cells corresponds to a portion of a block of the plurality of blocks. The OTP cell allows modification of the portion of the block when the OTP cell is in a first state and permanently prevents modification of the portion of the block when the OTP cell is in a second state. The OTP cell logic uses the plurality of OTP cells to select the portion of the block as corresponding to the OTP cell. This portion of the block is write protected when the OTP cell is placed in the second state.

Abstract: A semiconductor integrated circuit has nonvolatile memory and a logic circuit which uses information stored in the nonvolatile memory to perform logical operation. The nonvolatile memory comprises bit lines, word lines, and memory cells. The memory cell comprises MOS transistors whose gate electrodes are connected with a word line. Information storage is carried out according to whether one source/drain electrode of the MOS transistors is connected with a source line or floated. During other periods than a predetermined period in the operation of accessing the memory cell, the potential difference between the source/drain electrodes of the MOS transistors constituting the memory cell is zeroed. Subthreshold leakage current is prevented from passing through the memory cell on standby. During the predetermined period in accessing operation, a potential difference is produced between the source/drain electrodes of the MOS transistors. Therefore, the bit line potential can be varied by word line selection.

Abstract: An output end and an inverted output end of a latch circuit that is connected to an output buffer circuit are switched with each other, and thereby, the relationship between the data of “0” or “1” and the drain of a memory cell is connected or not connected to a bit line is changed. In addition, an input of a sense amplifier is fixed at the grounding potential by means of a test control signal, and thereby, positive logic is confirmed in the case where the output of the output buffer circuit is “L,” and negative logic is confirmed in the case where the output of the output buffer circuit is “H.

Abstract: A candidate single nucleotide polymorphism (SNP) combination is selected from a plurality of candidate SNP combinations for a gene associated with a genetic trait. Haplotype data associated with this candidate SNP combination are read for a plurality of individuals and grouped into a positive-responding group and a negative-responding group based on whether a predetermined trait criteria for an individual is met. A statistical analysis on the grouped haplotype data is performed to obtain a statistical measurement. The acts of selecting, reading, grouping, and performing are repeated as necessary to identity the candidate SNP combination having the optimal statistical measurement. In one approach, a directed search based on results of previous statistical analysis of SNP combinations is performed until the optimal statistical measurement is obtained. In addition, the number of SNP combinations selected and analyzed may be reduced based on a simultaneous testing procedure.

Abstract: An integrated circuit memory device includes programmed memory cells and programmable and erasable memory cells. The memory device includes a first memory array block in which programmed memory cells are arranged and a second memory array block in which programmable and erasable memory cells are arranged. The programmed memory cells in the first memory array block may be programmed with predetermined data during a semiconductor manufacturing process, and may be mask read-only memory (ROM) cells. The programmable and erasable memory cells in the second memory array block may be programmed or erased with predetermined data after the semiconductor manufacturing process, and may be electrically erasable and programmable read-only memory (EEPROM) cells or flash memory cells.

Abstract: Systems and methods for identifying, confirming, mapping, and categorizing sample polymers, such as nucleic acid sequences, are provided. An estimation of the fraction of first and second polymers in a sample of polymers can be calculated by inputting a first hybridization value indicative of hybridization affinity of the sample of polymers to polymers probes that are complementary to the first polymer and inputting a second hybridization value indicative of hybridization affinity of the sample of polymers to polymers probes that are complementary to the second polymer. The estimation of the fraction of the first and second polymers in the sample of polymers can then be calculated by dividing the first hybridization value by a sum of the first and second hybridization values. Estimations of the fractions of alleles in a sample can be clustered to form a fraction pattern usable for identifying, confirming, mapping, and genotyping sample nucleic acids.

Abstract: A first wiring part in a first wiring layer is a starting terminal that is connected to a ground potential. The first wiring part and a second wiring part in a second wiring layer are connected by a first connecting part. The second wiring part and a third wiring part in a third wiring layer are connected by a second connecting part. A fourth wiring part continuously connected with the third wiring part and a fifth wiring part in the second wiring layer are connected by a third connecting part. The fifth wiring part and a sixth wiring part in the first wiring layer are connected by a fourth connecting part. A conducting path that is continuously connected from the starting terminal to an output end is formed by connecting a mound-shaped conducting path thus formed.

Abstract: A method and apparatus are provided for reducing leakage current in a read only memory device. Leakage current is reduced by applying a biased gate voltage (relative to a source voltage) to the gate of at least one of transistor in the array. The biased gate voltage is applied at least during a precharge phase of a read cycle. When the array transistors are n-channel transistors, the biased voltage is a negative bias voltage (relative to the source voltage). When the array transistors are p-channel transistors, the biased voltage is a positive bias voltage (relative to the source voltage). Applying a negative backgate bias to the transistor's p-well contact can also reduce n-channel transistor subthreshold leakage current. Thus, for an n-channel array, a negative gate voltage and backgate bias (optional) are applied to cell transistors in the off state.

Abstract: A memory cell structure of a metal (or via) programmable ROM whereby a transistor is shared between bit cells of the programmable ROM. Such a memory cell structure may include: a word line; a bit line; first and second virtual grounding lines; a grounding line; a first bit cell selected by signals of the word line and the first virtual grounding line; and a second bit cell selected by signals of the word line and the second virtual grounding line, wherein a cell transistor, one side of which is connected to the bit line is shared both by the first and second bit cells. Also, the other side of the cell transistor may be floated or connected to the bit line or, alternatively, connected to any one of the first virtual grounding line, the second virtual grounding line and the grounding line, and the gate of the cell transistor is connected to the word line.

Abstract: The invention concerns a ROM circuit (40) including columns of storage cells, each column being connected to a bit site (BLi, BLi+1), wherein the columns are arranged in groups of two adjacent columns, each column of a group capable of being selectively activated relative to the other column of the group, thereby enabling the elimination of a connection to the ground of columns and the design of efficient reading amplifiers.

Abstract: A method and apparatus are provided for reducing leakage current in a read only memory device. Leakage current is reduced by precharging only a portion of the columns in a read only memory array during a given read cycle. The portion of the columns that are precharged is limited to a subset of columns that includes those columns that will be read during a given read cycle. A read column address is decoded to precharge only the portion of the columns of transistors that will be read during the given read cycle. The columns of transistors can be grouped into a plurality of sub-arrays and only those sub-arrays having columns that will be read during a given read cycle are precharged during the read cycle.

Abstract: A method for associating a gene with a trait exhibited by one or more organisms in a plurality of organisms from a species. A genetic marker map is constructed from a set of genetic markers associated with the plurality of organisms. For each gene in a plurality of genes, a quantitative trait locus analysis is performed using the genetic marker map and a quantitative trait. The quantitative trait locus analysis produces quantitative trait locus data. A quantitative trait comprises an expression statistic for a gene. The expression statistic for a gene is derived from a cellular constituent level that corresponds to the gene in each organism in the plurality of organisms. The quantitative trait locus data are clustered from each quantitative trait locus analysis to form a quantitative trait locus interaction map. Clusters of genes in the map are identified as a candidate pathway group. An expression cluster map is used to refine the candidate pathway group.

Abstract: The present invention relates to bit cell arrays of read-only-memories, and more specifically, to a bit cell array capable of preventing a coupling effect between adjacent bit lines. In addition, the bit cell array according to the present invention does not require an additional device in order to prevent the coupling effect. In accordance with the present invention, the bit cell array comprising: a plurality of bit lines arranged in a row in a first direction; a plurality of ground lines in a row in a second direction vertical to the first direction; a plurality of word lines arranged with a zigzag line with respect to the second direction; and a plurality of ROM bit cells partially formed at a cross-section point of the bit lines and the word lines. In the meanwhile, the ROM bit cells are arranged with a zigzag line with respect to adjacent bit lines. Additionally, the ROM bit cells comprise a drain terminal, a gate terminal and a source terminal.

Abstract: The present invention relates to a computer-based algorithm that is used to determine the pKa, pH stability and electrostatic interactions of a protein.