Cleaning Or Removing Part Of Substrate (e.g., Etching With Plasma, Glow Discharge, Etc.) Patents (Class 427/534)
  • Patent number: 6443165
    Abstract: A method for use in a plasma treatment system that shortens the time required for the cleaning of a fluorine containing carbon film adheared in a vacuum vessel and protects the surface of a transfer table when the cleaning is carried out. After a CF film is deposited by, e.g., a plasma treatment system, the cleaning of the CF film adhered in a vacuum vessel 2 is carried out. In the cleaning, a plasma of O2 gas is produced, and the C—C and C—F bonds on the surface of the CF film are physically and chemically cut by the active species of O produced by the plasma. The O2 gas penetrates into the CF film at places where the C—C and C—F bonds have been cut, to react with C of the CF film to form CO2 which scatters. On the other hand, F scatters as F2. Thus, the CF film is removed.
    Type: Grant
    Filed: September 21, 1998
    Date of Patent: September 3, 2002
    Assignee: Tokyo Electron Limited
    Inventors: Takashi Akahori, Masaki Tozawa, Yoko Naito, Risa Nakase, Shuichi Ishizuka, Masahide Saito, Tadashi Hirata
  • Patent number: 6437903
    Abstract: Manufacture a spatial light modulator by fabricating a first set of micro-mirrors, then subsequently fabricating a second set of micro-mirrors interspersed with the first set, to reduce space between adjacent micro-mirrors versus what could be done by simultaneously fabricating all the micro-mirrors as one set.
    Type: Grant
    Filed: February 20, 2002
    Date of Patent: August 20, 2002
    Assignee: Intel Corporation
    Inventor: Michael Kozhukh
  • Patent number: 6436488
    Abstract: Method of depositing a layer of amorphous silicon film on a substrate at a very fast deposition rate while maintaining superior film quality. A plasma volume in a process chamber is defined. A total flow rate of a mixture of gases introduced into the chamber is also defined. The total flow rate is the sum of the flow rates of the respective gases in the mixture. Next, a process parameter that includes the plasma volume and total flow rate is defined. The process parameter is then maintained in a first predetermined relationship with a predetermined value during the deposition of the amorphous silicon film.
    Type: Grant
    Filed: June 12, 2000
    Date of Patent: August 20, 2002
    Assignee: Agilent Technologies, Inc.
    Inventors: Jeremy A Theil, Gerrit J Kooi, Ron P Varghese
  • Patent number: 6419994
    Abstract: In one aspect, the invention encompasses a method of chemical vapor deposition. A vaporization surface Is provided and heated. At least one material is flowed past the heated surface to vaporize the material. A deposit forms on the vaporization surface during the vaporization. The vaporization surface is then utilized as an electrode to form a plasma, and at least a portion of the deposit is removed with the plasma. In another aspect, the invention encompasses a vapor forming device. Such device includes a non-vapor-state-material input region, a vaporization surface, and a flow path between the non-vapor-state-material input region and the vaporization surface. The device further includes a vapor-state-material output region, and a vapor flow path from the vaporization surface to the vapor-state-material output region.
    Type: Grant
    Filed: April 4, 2000
    Date of Patent: July 16, 2002
    Assignee: Micron Technology, Inc.
    Inventor: Eugene P. Marsh
  • Patent number: 6419993
    Abstract: A production process for a magnetic recording medium comprising a non-magnetic substrate, a non-magnetic undercoat film, a magnetic film, and a protective film predominantly comprising carbon, which protective film is formed through a plasma CVD method by use of carbon-containing gas as a source and which process comprises applying an oxygen plasma to carbon deposits on the inner walls of a chamber or carbon present in the chamber for transformation.
    Type: Grant
    Filed: March 30, 2000
    Date of Patent: July 16, 2002
    Assignee: Showa Denko K.K.
    Inventors: Kimie Takagi, Mikio Suzuki, Emi Shimaoka, Noriyuki Miyamoto
  • Patent number: 6417062
    Abstract: A method of forming a ruthenium dioxide film for such purposes as the fabrication of stable thin-film resistors for microcircuits. The method generally entails forming an inorganic ruthenium-based film on a substrate, and then thermally decomposing at least a portion of the ruthenium-based film by exposure to a high-intensity beam of radiation, preferably visible light, to yield a ruthenium dioxide film on the substrate. Particular ruthenium-based precursors useful for forming the ruthenium-based film include ruthenium (III) chloride (RuCl3.nH2O) and ruthenium (III) nitrosyl nitrate. The method does not require a thermal treatment that heats the bulk of the substrate on which the ruthenium dioxide film is formed, and is therefore suitable for non-ceramic substrate materials, e.g., polymers such as those used as printed circuit boards (PCBs) and flexible circuits.
    Type: Grant
    Filed: May 1, 2000
    Date of Patent: July 9, 2002
    Assignee: General Electric Company
    Inventors: Donald Franklin Foust, James Wilson Rose, Ernest Wayne Balch
  • Patent number: 6410125
    Abstract: The invention relates to a wear-resistant, highly stressed and low-friction boundary coating construction for titanium or the alloys thereof which can be advantageously used in order to protect human implants. According to the inventive boundary coating construction the boundary coating is comprised of a 200 to 400 nm thick DLC coating (4), a 5 to 50 nm thick intermediate coating (3) and a 0.3 to 2.0 mm thick gas alloyed coating (2), said gas alloyed coating having a hardness between 600 HV0.1 and 1,400 HV0.1. The inventive boundary coating construction is produced by firstly melting the surface of the member which is to be protected. The surface is then gas alloyed and cleaned in an N2/Ar atmosphere. Subsequently, the intermediate coating is first deposited followed by a depositing of the hard amorphous carbon coating by means of the laser-induced, pulsed vacuum arc (laser-arc) method.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: June 25, 2002
    Assignee: Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung e.v.
    Inventors: Berndt Brenner, Steffen Bonss, Hans-Joachim Scheibe, Holger Ziegele
  • Patent number: 6410101
    Abstract: A method for scrubbing and passivating an anode plate (100) of a field emission display (120) includes the steps of providing a scrubbing passivation material (127); imparting to scrubbing passivation material (127) an energy selected to cause removal of a contamination layer (123, 117) from anode plate (100); causing scrubbing passivation material (127) to be received by contamination layer (123, 117), thereby removing contamination layer (123, 117); and depositing at least a portion of scrubbing passivation material (127) on anode plate (100), thereby forming a passivation layer (129).
    Type: Grant
    Filed: February 16, 2000
    Date of Patent: June 25, 2002
    Assignee: Motorola, Inc.
    Inventors: James E. Jaskie, Albert Alec Talin
  • Patent number: 6410102
    Abstract: A plasma process, which can fabricate a deposition film in short time and at low cost, which can fabricate a deposition film with excellent reproducibility, which can greatly decrease the cleaning time upon cleaning, and which is optimum for fabricating a deposit film, especially a photosensitive member for electrophotography, capable of achieving a high charge potential upon electrification and capable of obtaining clear images with less image defects, is arranged such that a raw-material gas comprising silicon is introduced into a deposition chamber while evacuating the deposition chamber capable of being kept airtight in a vacuum, the raw-material gas is decomposed by high-frequency power in the VHF band, film formation is carried out to form a deposit film on a substrate installed in the deposition chamber, and thereafter cleaning inside the deposition chamber is carried out by etching and removing a deposit film depositing inside the deposition chamber, using a gas containing at least fluorine and using
    Type: Grant
    Filed: June 13, 1997
    Date of Patent: June 25, 2002
    Assignee: Canon Kabushiki Kaisha
    Inventors: Junichiro Hashizume, Shigenori Ueda, Makoto Aoki
  • Patent number: 6406759
    Abstract: An OAUGD plasma is generated using, for example, paraelectric or peristaltic electrohydrodynamic (EHD) techniques, in the plasma generator of a remote-exposure reactor, wherein one or more active species, especially oxidizing species in the plasma are convected away from the plasma-generation region and directed towards a workpiece that is located outside of the plasma-generation region (e.g., within an optional remote-exposure chamber configured to the plasma generator). In this way, the workpiece can be subjected to the one or more active species without directly being subjected to either the plasma or to the electric fields used to generate the plasma. The plasma generator may have a set of flat panels arranged within an air baffle to convect the active species in a serpentine manner through the plasma generator.
    Type: Grant
    Filed: July 28, 1999
    Date of Patent: June 18, 2002
    Assignee: The University of Tennessee Research Corporation
    Inventor: J. Reece Roth
  • Publication number: 20020049020
    Abstract: A water-vapor-permeable, watertight, heat-reflecting flat composite is made by a process of combining a metal layer and a nonporous, water-vapor-permeable, watertight, hydrophilic flat substrate. The process includes at least the three steps of (1) selecting the substrate, (2) pre-cleaning the substrate, and (3) applying the substrate to the metal layer. Such a composite offers protection from heat loss, infrared-based detection, ultraviolet radiation, electro-smog, and static electricity.
    Type: Application
    Filed: August 31, 2001
    Publication date: April 25, 2002
    Applicant: Sympatex Technologies GmbH
    Inventors: Henricus J.M. Van De Ven, Jozef C.W. Spijkers, Karl W. Kopp
  • Patent number: 6372301
    Abstract: The present invention generally provides a method for stabilizing a halogen-doped silicon oxide film, particularly a fluorinated silicon oxide film. The invention also provides a method for preventing loosely bonded halogen atoms from reacting with components of the barrier layer during subsequent processing of the substrate. The invention provides a hydrogen plasma treatment of the halogen-doped silicon oxide film without subjecting the substrate to a heated environment that may damage the substrate and the structures formed on the substrate. The invention also improves the adhesion strength between the halogen-doped silicon oxide film and the barrier layer. Furthermore, the hydrogen plasma treatment can be practiced in a variety of plasma processing chambers of an integrated process sequence, including pre-clean chambers, physical vapor deposition chambers, chemical vapor deposition chambers, etch chambers and other plasma processing chambers.
    Type: Grant
    Filed: December 22, 1998
    Date of Patent: April 16, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Murali Narasimhan, Vikram Pavate, Kenny King-Tai Ngan, Xiangbing Li
  • Patent number: 6368677
    Abstract: A method for providing a waterborne, inorganic barrier coating to a polyolefin substrate is described. The method involves applying a primer composition containing a vinyl polymer, wherein at least 75% of the polymer repeat units contain side groups having hydroxyl moieties, to the substrate. This primer coating facilitates the application and binding of the subsequently applied barrier coating composition to the substrate.
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: April 9, 2002
    Assignee: Hoechst Trespaphan GmbH
    Inventors: Michael A. Hubbard, James A. McCaulley, Douglas R. Holcomb
  • Patent number: 6361836
    Abstract: A method of making a spinner disc for a rotary fiberization process, such as but not limited to a glass fiberization process, includes: forming a spinner disc from an alloy that forms a protective oxide film on surfaces of the spinner disc exposed to the atmosphere; forming fiberizing holes in an annular peripheral sidewall of the spinner disc; and applying a plasma to a surface of the spinner disc to remove hydrocarbons and sulfurous compounds from the surface of the spinner disc which would otherwise reduce and/or react with and degrade the protective oxide film forming on the surface of the spinner disc when the spinner disc is exposed to the atmosphere.
    Type: Grant
    Filed: December 9, 1999
    Date of Patent: March 26, 2002
    Assignee: Johns Manville International, Inc.
    Inventor: Walter A. Johnson
  • Patent number: 6358428
    Abstract: Method for removing a portion of the binder phase from the surface of a substrate that is composed of particles of at least a first phase joined together by the binder phase, and wherein the surface is etched by contacting it with a gas flow of an etchant gas and a second gas. The second gas is one or more gases that will not react with the substrate or the removed binder phase and will not alter the oxidation state of the substrate during etching.
    Type: Grant
    Filed: July 28, 2000
    Date of Patent: March 19, 2002
    Assignee: TDY Industries, Inc.
    Inventors: Roy V. Leverenz, John Bost
  • Patent number: 6358572
    Abstract: A method for manufacturing a nonlinear optical thin film of a silica glass system with sufficient nonlinear optical characteristics, in which a glass substrate 12 is disposed within a vacuum deposition chamber 10 and an electron beam is applied to a SiO2—GeO2-system glass placed on a hearth liner 14 to form a SiO2—GeO2-system thin film on the surface of the substrate 12. In an application of this method, ions of argon, for example, are emitted from an ion source to produce dipoles in the deposited SiO2—GeO2-system thin film. By applying an electric field to the SiO2—GeO2-system thin film thus formed, the dipoles are oriented to let the thin film exhibit nonlinear optical characteristics.
    Type: Grant
    Filed: September 20, 1999
    Date of Patent: March 19, 2002
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Naoki Nakamura, Hiroshi Hasegawa, Kiyohito Murata, Hideki Nakayama
  • Patent number: 6355106
    Abstract: A method and apparatus for improving the adhesion of a copper layer to an underlying layer on a wafer. The layer of copper is formed over a layer of material on a wafer and the copper layer impacted with ions to improve its adhesion to the underlying layer.
    Type: Grant
    Filed: November 3, 2000
    Date of Patent: March 12, 2002
    Assignee: Applied Materials, Inc.
    Inventors: Bo Zheng, Ling Chen, Alfred Mak, Mei Chang
  • Patent number: 6352938
    Abstract: A method of manufacturing metallic interconnects. A substrate has a copper line formed therein. An inter-metal dielectric layer is formed over the substrate and the copper line. A patterned photoresist layer is formed over the inter-metal dielectric layer. The inter-metal dielectric layer is etched to form a trench and a contact opening that exposes a portion of the copper line, wherein the contact opening is under the trench. At a low temperature and using a plasma derived from a gaseous mixture N2H2 (H2:4%)/O2, the photoresist layer is removed. Any copper oxide layer formed on the copper line in the process of removing photoresist material is reduced back to copper using gaseous N2H2 (H2:4%). A barrier layer conformal to the trench and the contact opening profile is formed. Copper is deposited to form a conformal first copper layer over the trench and the contact opening.
    Type: Grant
    Filed: December 9, 1999
    Date of Patent: March 5, 2002
    Assignee: United Microelectronics Corp.
    Inventors: Tong-Yu Chen, Hsi-Ta Chuang, Chan-Lon Yang
  • Publication number: 20020025378
    Abstract: A method is disclosed for treating the surface of tools made of tool steel, wherein primary carbides are embedded in the tool steel matrix. The thickness of the primary carbides disposed near the surface can be reduced by forming a surface which has point-wise recess; alternatively, the primary carbides can be completely removed. A hard material layer is deposited on this surface. The invention also describes tools made of tool steel, wherein primary carbides are embedded in the tool steel matrix. The primary carbides are significantly recessed, and a hard material layer is deposited thereon.
    Type: Application
    Filed: August 13, 2001
    Publication date: February 28, 2002
    Inventors: Klaus Keller, Fritz Koch
  • Patent number: 6346294
    Abstract: A process for producing a coating on components having peripheries to be placed in direct contact with vaporous media. Such peripheries are wetted over part or all of their surface with a film of liquid when the vaporous media are changed from the vapor state into the liquid state by phase transition. Such films of liquid increase the thermal resistance, for example, of the components. In order to avoid such wetting, the peripheries of each component are roughened. A coat of a non-wettable, amorphous carbon is then applied to the peripheries, at least in regions thereof.
    Type: Grant
    Filed: April 28, 1999
    Date of Patent: February 12, 2002
    Assignee: ABB Patent GmbH
    Inventors: Harald Reiss, Manfred Wetzko
  • Publication number: 20010055653
    Abstract: The surface of an article with a metallic base body is cleaned. A plasma comprising electrically positively charged ions is generated, and the ions are accelerated toward the article, so that they come into contact with the base body for cleaning purposes. To do this, an electron beam is directed onto the base body. The outgoing flux of electrons which come into contact with the base body is controlled by the base body being connected to a reference potential via a switch of at a fixed, adjustable or regulated frequency.
    Type: Application
    Filed: April 23, 2001
    Publication date: December 27, 2001
    Inventor: Gebhard Dopper
  • Patent number: 6331260
    Abstract: This invention is a process and apparatus for producing single crystal, polycrystal or amorphous stand-alone films. The process has two steps: First, thin layers of the desired materials are deposited by VD onto a hot foreign single crystal substrate wafer held by a substrate platter in a pocket formed in such. The second step is to chemically etch away the substrate while still being held by the substrate platter while the film-substrate is still hot. The etch is stopped as soon as all of the foreign substrate is consumed. This leaves just the thin film which is then cooled down to room temperature. The bottom surface of this pocket has a plurality of channels for carrying an etching gas which is input by a central channel in the substrate platter. The reactants that form the stand-alone film are input through an actively cooled effusion cell having a plenum for receiving the reactant gas.
    Type: Grant
    Filed: December 13, 1999
    Date of Patent: December 18, 2001
    Assignee: The United States of America as represented by the Secretary of the Air Force
    Inventors: David W. Weyburne, Brian S. Ahern
  • Patent number: 6328865
    Abstract: There is disclosed a method and apparatus for forming a thin film of a composite metal compound. Independent targets formed of at least two different metals are sputtered so as to form on a substrate an ultra-thin film of a composite metal or an incompletely-reacted composite metal. The ultra-thin film is irradiated with the electrically neutral, activated species of a reactive gas so as to convert the composite metal or the incompletely-reacted composite metal to a composite metal compound through the reaction of the ultra-thin film with the activated species of the reactive gas. The formation of the ultra-thin film and the conversion to the composite metal compound are sequentially repeated so as to form on the substrate a thin film of the composite metal compound having a desired thickness.
    Type: Grant
    Filed: December 7, 2000
    Date of Patent: December 11, 2001
    Assignee: Shincron Co., Ltd.
    Inventors: Shigeharu Matsumoto, Kazuo Kikuchi, Masafumi Yamasaki, Qi Tang, Shigetaro Ogura
  • Patent number: 6326415
    Abstract: Provided is a support for an ink jet recording material. The support comprises a substrate and a UV cured resinous coating layer on the substrate, with said resinous coating layer being comprised of a tetrafunctional polyester acrylate, a difunctional acrylic ester, a UV photoinitiator and a polyether.
    Type: Grant
    Filed: August 5, 1999
    Date of Patent: December 4, 2001
    Assignee: Rexam Graphics Inc.
    Inventors: Alexander J. Miklasiewicz, Son T. Vo, Everett Wyman Bennett
  • Patent number: 6319566
    Abstract: A method for mask-free molecular or atomic patterning of surfaces of reactive solids is disclosed. A molecular-scale pattern of adsorbate molecules is used in place of the conventional macroscopic “mask”. Molecules adsorb at surfaces in patterns, governed by the structure of the surface, the chemical nature of the adsorbate, and the adsorbate coverage at the surface. The surface is patterned and then marked or imprinted with the pattern by inducing localised chemical reaction between adsorbate molecules and the surface of the solid, resulting in an imprint being formed in the vicinity of the adsorbate molecules. In one aspect of the invention, photoinduced or electron-induced reaction of the patterned adsorbate leads to patterned reaction with the surface.
    Type: Grant
    Filed: May 19, 2000
    Date of Patent: November 20, 2001
    Inventors: John C. Polanyi, Duncan Rogers
  • Publication number: 20010040144
    Abstract: In one aspect, the invention encompasses a method of utilizing a vaporization surface as an electrode to form a plasma within a vapor forming device. In another aspect, the invention encompasses a method of chemical vapor deposition. A vaporization surface is provided and heated. At least one material is flowed past the heated surface to vaporize the material. A deposit forms on the vaporization surface during the vaporization. The vaporization surface is then utilized as an electrode to form a plasma, and at least a portion of the deposit is removed with the plasma. In another aspect, the invention encompasses a vapor forming device. Such device includes a non-vapor-state-material input region, a vaporization surface, and a flow path between the non-vapor-state-material input region and the vaporization surface. The device further includes a vapor-state-material output region, and a vapor flow path from the vaporization surface to the vapor-state-material output region.
    Type: Application
    Filed: July 13, 1999
    Publication date: November 15, 2001
    Inventor: EUGENE P. MARSH
  • Patent number: 6314764
    Abstract: A method of manufacturing a 1-inch diameter glass substrate for a magnetic disc in which a plate glass is press molded using a mold formed of a super-hard material and having a surface of a prescribed roughness. Ion implantation using nitrogen ions is performed on the surface of the mold, after which ion implantation using palladium ions, platinum ions, and carbon ions is performed in the order given. Finally, the surface of the mold is coated with a graphite or amorphous diamond-like carbon coating.
    Type: Grant
    Filed: February 16, 2001
    Date of Patent: November 13, 2001
    Assignee: Saatec Engineering Corporation
    Inventor: Yasuaki Sakamoto
  • Patent number: 6314763
    Abstract: A method of manufacturing a 2-5 inch diameter glass substrate for a magnetic disc in which a plate glass is press molded using a mold formed of a super-hard material and having a surface of a prescribed roughness. Ion implantation using nitrogen ions is performed on the surface of the mold, after which ion implantation using palladium ions, platinum ions, and carbon ions is performed in the order given. Finally, the surface of the mold is coated with a graphite or amorphous diamond-like carbon coating.
    Type: Grant
    Filed: February 16, 2001
    Date of Patent: November 13, 2001
    Assignee: Saatec Engineering Corporation
    Inventor: Yasuaki Sakamoto
  • Patent number: 6312767
    Abstract: A process for the surface treatment of a running substrate by an electrical discharge created between two roller electrodes, comprising a first roller electrode and a second roller electrode, in a gas mixture comprising the steps of passing the substrate in between the two roller electrodes by applying it against the first roller electrode; injecting the gas mixture between the rollers to apply a first surface treatment to the substrate; passing the substrate in between the two roller electrodes by applying it against a second roller electrode; and injecting the gas mixture between the rollers to apply a second surface treatment to the substrate.
    Type: Grant
    Filed: November 5, 1998
    Date of Patent: November 6, 2001
    Assignee: L'Air Liquide, Societe Anonyme pour l'Exploitation des Procedes Georges Claude
    Inventors: Alain Villermet, François Coeuret, Panayotis Cocolios, Bernd Martens, Eckhard Prinz, Jürgen Salge
  • Patent number: 6296740
    Abstract: Before submitting a sample, including a first material layered upon a substrate, to an ion milling process, whereby a second material is sputtered onto the surface of the first material and the sample is then submitted to an etching process, an irregularity is formed on the surface of the first material. The overall process results in the formation of cones, or micro-tip structures, which may then be layered with a layer of low work function material, such as amorphous diamond. The irregularity in the surface of the first material may be formed by polishing, sandblasting, photolithography, or mechanical means such as scratching.
    Type: Grant
    Filed: April 24, 1995
    Date of Patent: October 2, 2001
    Assignee: SI Diamond Technology, Inc.
    Inventors: Chenggang Xie, Dean Joseph Eichman
  • Patent number: 6296946
    Abstract: There is provided a plastic base material having a reformed layer 2 formed on a plastic substrate 1 by reforming the surface layer thereof into a component containing fluorine at the ratio of the number of fluorine atoms to the number of carbon atoms, F/C, of 0.85 or more and 1.30 or less, and having highly durable water repellency and ink repellency. The method of manufacturing such a plastic base material comprises a step of reforming the surface of the plastic substrate 1 into a fluorine-containing carbon layer by imparting a specific energy to fluorine-containing plasma by applying an RF bias voltage to the plastic substrate 1 to form a surface having highly durable water repellency and ink repellency. A highly durable ink-jet printer that enables high-quality printing can be provided by the use of a head for an ink-jet printer fabricated by using this plastic base material.
    Type: Grant
    Filed: April 1, 1999
    Date of Patent: October 2, 2001
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Koichi Kotera, Hiroyoshi Tanaka, Isamu Inoue, Osamu Watanabe
  • Patent number: 6285038
    Abstract: The invention comprises integrated circuitry fabrication methods of making a conductive electrical connection, methods of forming a capacitor and an electrical connection thereto, methods of forming DRAM circuitry, integrated circuitry, and DRAM integrated circuitry. In one implementation, an integrated circuitry fabrication method of making a conductive electrical connection includes forming a conductive layer including a conductive metal oxide over a substrate. The conductive layer has an outer surface. At least a portion of the conductive layer outer surface is exposed to reducing conditions effective to reduce at least an outermost portion of the metal oxide of the conductive layer, most preferably by removing oxygen. Conductive material is formed over the reduced outermost portion and in electrical connection therewith. In one implementation, integrated circuitry includes a conductive metal oxide comprising layer received over a substrate.
    Type: Grant
    Filed: March 1, 2000
    Date of Patent: September 4, 2001
    Assignee: Micron Technology, Inc.
    Inventor: Howard E. Rhodes
  • Patent number: 6284044
    Abstract: A polyimide solution is supplied to a wafer and the wafer is rotated by means of a spin chuck, thereby forming a polyimide film on the wafer. An irradiator for irradiating a laser beam to a peripheral portion of the wafer W is provided. After the polyimide film is formed and side rinse is performed, a laser beam is irradiated to the peripheral portion to solidify the film at the peripheral portion. The solidified polyimide film forms a weir, thus preventing the polyimide solution which has not dried yet from flowing out toward a peripheral edge portion.
    Type: Grant
    Filed: March 7, 2000
    Date of Patent: September 4, 2001
    Assignee: Tokyo Electron Limited
    Inventors: Yasuhiro Sakamoto, Hidetami Yaegashi
  • Patent number: 6271054
    Abstract: The dark current defects in a charge couple device are reduced by employing a hydrogen anneal followed by depositing a silicon nitride barrier layer by RTCVD.
    Type: Grant
    Filed: June 2, 2000
    Date of Patent: August 7, 2001
    Assignee: International Business Machines Corporation
    Inventors: Arne W. Ballantine, George A. Dunbar, III, James V. Hart, III, Donna K. Johnson, Glenn C. MacDougall
  • Patent number: 6267867
    Abstract: A process for coating a tungsten carbide base material substrate with CVD diamond film includes carburization and gas-assisted vaporization of cobalt from the surface with simultaneous recrystallization of surface grains of tungsten carbide to change their stoichiometry for improved adherence. Also disclosed is a WC—Co cutting tool having a relatively fine WC grain size and being coated with adherent CVD diamond.
    Type: Grant
    Filed: April 27, 1999
    Date of Patent: July 31, 2001
    Assignee: Saint-Gobain Industrial Ceramics, Inc.
    Inventor: James M. Olson
  • Patent number: 6261423
    Abstract: A method for coating substrates having sides of the substrate with unequal adhesion properties includes the steps of non-symmetrically coating the substrate by coating a first side under a first set of coating conditions and coating a second side under a second set of operating conditions wherein the operating conditions used to coat each side are varied so as to compensate for the unequal adhesion properties of the sides.
    Type: Grant
    Filed: September 19, 2000
    Date of Patent: July 17, 2001
    Assignee: Honeywell International Inc.
    Inventors: Richard J. Pommer, Glen Roeters, Stephen M. Avery
  • Patent number: 6235354
    Abstract: The present invention relates to a method of forming a level silicon oxide layer on a semiconductor wafer. The semiconductor wafer comprises a substrate having a first region containing no silicon nitride on its surface and a second region which is higher than the first region and contains a silicon nitride layer on its surface. The method comprises performing a cleaning process on the semiconductor wafer with an alkaline solution to uniform the deposition rate over the surface of the first region; and performing a deposition process employing ozone as a reactive gas with a flow capacity of 80-200 g/L to form a silicon oxide layer above the first and second regions wherein the deposition rate of the silicon oxide layer on the first region is higher than that on the second region and the silicon oxide layer above the first region is leveled with that above the second region after a predetermined period of time.
    Type: Grant
    Filed: November 1, 1999
    Date of Patent: May 22, 2001
    Assignee: United Microelectronics Corp.
    Inventors: Chin-Hui Lee, Ting-Chi Lin, Chih-Cheng Liu
  • Patent number: 6235541
    Abstract: Substrates are patterned with antibodies attached thereto at discrete locations from which absorption resistant coating is removed by selectively controlled mechanical scribing contact to avoid chemical removal so as to decrease fabrication costs and increase fabrication speed.
    Type: Grant
    Filed: May 6, 1999
    Date of Patent: May 22, 2001
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Robert A. Brizzolara
  • Patent number: 6231956
    Abstract: Wear-resistant edge layer for titanium and its alloys which can be subjected to high loads and has a low coefficient of friction. The wear-resistant edge layer includes a hard amorphous carbon layer, an intermediate layer, and a laser gas alloyed layer. The wear-resistant edge layer may include a 200 to 400 nm thick hard amorphous carbon layer, a 50 to 200 nm thick intermediate layer, and a 0.3 to 2.0 mm thick laser gas alloyed layer. The laser gas alloyed layer may include precipitated titanium nitride needles and have a hardness between 600 HV0.1 and 1400 HV0.1. Process for producing a wear resistant edge layer on a substrate. The process includes forming a laser gas alloyed layer by melting a surface of a substrate, applying an intermediate layer by Laser-Arc, and depositing a hard amorphous carbon layer on the intermediate layer by Laser-Arc.
    Type: Grant
    Filed: June 14, 1999
    Date of Patent: May 15, 2001
    Assignee: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V
    Inventors: Berndt Brenner, Steffen Bonss, Hans-Joachim Scheibe, Holger Ziegele
  • Patent number: 6228438
    Abstract: A radiofrequency plasma reactor (1) for the treatment of substantially large sized substrates is disclosed, comprising between the electrodes (3, 5) of the plasma reactor a solid or gaseous dielectric layer (11) having a non planar-shaped surface-profile, said profile being defined for compensating a process non uniformity in the reactor or generating a given distribution profile.
    Type: Grant
    Filed: September 22, 1999
    Date of Patent: May 8, 2001
    Assignee: Unakis Balzers Aktiengesellschaft
    Inventor: Jacques Schmitt
  • Publication number: 20010000477
    Abstract: In this impurity eliminating apparatus, a mounting stand on which a wafer is mounted and a casing which confronts the mounting stand are provided in a container. A lower face of the casing consists of quartz glass. Inside the casing, an irradiating body for irradiating ultraviolet rays toward the wafer on the mounting stand is provided. The casing is full of inactive gas atmosphere supplied from an inactive gas supply pipe. The atmosphere above the wafer is exhausted from one side by an exhauster. Following the treatment by the impurity eliminating apparatus with the above structure, coating treatment with a treatment solution for forming a SOG film is performed. Thus, organic substances on the surface of the wafer is eliminated to form the SOG film.
    Type: Application
    Filed: December 22, 2000
    Publication date: April 26, 2001
    Applicant: TOKYO ELECTRON LIMITED
    Inventor: Koji Harada
  • Patent number: 6221493
    Abstract: According to the present invention there is now provided a body of cemented carbide or cermets coated with at least one diamond layer. The diamond layer is smooth on all sides of the body with an Ra<1 &mgr;m. According to the present invention there is also provided a method for reactive ion etching of a diamond layer on a complex shape body where the etching is efficient at all sides of the body exposed to the plasma. The etching is made using a C— or oxygen-containing plasma with the possibility of etching of a diamond layer covered by an outer layer of preferably a Si containing material.
    Type: Grant
    Filed: May 28, 1999
    Date of Patent: April 24, 2001
    Assignee: Sandvik AB
    Inventors: Ingrid Reineck, Bengt Edholm, Christian Strondl
  • Patent number: 6214425
    Abstract: The invention relates to a storage box for an object that is to be protected from physicochemical contamination. The storage box is intended to have low weight, good mechanical strength, a good electrical condition, with a low degassing rate in time with prevention of diffusion of gasses from the external atmosphere into the interior of the box. The inner and/or outer surface of the box's walls are coated with at least one protective layer. The box may be used to store silicon wafers.
    Type: Grant
    Filed: September 29, 1997
    Date of Patent: April 10, 2001
    Assignees: Commissariat a l'Energie Atomique, L'Air Liquide
    Inventors: Philippe Spinelli, Claude Doche, Jean-Christophe Rostaing, François Coeuret, Sylvain Scotto D'Apolinia
  • Patent number: 6204085
    Abstract: A method and system of reducing the permanent accumulated deformation of a deflectable member of a micromechanical device through thermal stabilization. The accumulated deformation is due to the repeated bending or twisting of a flexible component of the micromechanical deice typically the repetitive deformation of a flexible hinge connecting a rigid member to substrate. After the device is fabricated, passivated (316), and packaged (322), the packaged device is baked (326) at a temperature of at least 120° C. A 150° C. bake for 12 to 16 hours is preferred. Lower temperatures required longer baking periods.
    Type: Grant
    Filed: September 8, 1999
    Date of Patent: March 20, 2001
    Assignee: Texas Instruments Incorporated
    Inventors: Mark H. Strumpell, Judith C. Frederic, Michael R. Douglass
  • Patent number: 6197388
    Abstract: A method for processing a substrate having an aluminum neodymium-containing layer is disclosed. The aluminum neodymium-containing layer has residual chlorine proximate to its etch surface. The method includes providing a first gas chemistry including HBr and SF6 which supplies a first plurality of fluorine ions, forming a first plasma from said first gas chemistry, passivating the etch surface of the aluminum neodymium-containing layer with the first plasma to cause a second plurality of fluorine ions to replace a first portion of the residual chlorine. This second plurality of fluorine ions is a subset of the first plurality of fluorine ions.
    Type: Grant
    Filed: March 31, 1999
    Date of Patent: March 6, 2001
    Assignee: Lam Research Corporation
    Inventors: Thomas S. Choi, John P. Holland, Nancy Tran
  • Patent number: 6171661
    Abstract: A method and apparatus for improving the adhesion of a copper layer to an underlying layer on a wafer. The layer of copper is formed over a layer of material on a wafer and the copper layer impacted with ions to improve its adhesion to the underlying layer.
    Type: Grant
    Filed: February 25, 1998
    Date of Patent: January 9, 2001
    Assignee: Applied Materials, Inc.
    Inventors: Bo Zheng, Ling Chen, Alfred Mak, Mei Chang
  • Patent number: 6156394
    Abstract: A pretreatment method for use in manufacturing an improved optical component comprises (i) providing a polymeric optical substrate; and (ii) exposing the polymeric optical substrate to electromagnetic energy having a wavelength of about 30 nm to about 350 nm. The exposure of the polymeric optical substrate to the electromagnetic energy substantially improves adhesion between the substrate and an optical coating deposited onto the substrate following pretreatment. The invention addresses the significant need for coated plastic optics by providing a method to achieve reliable adhesion of optical coatings placed on polymeric optical substrates. Specifically, this invention enables improved adhesion for even highly curved or shaped parts which have been historically more difficult to coat. The pretreatment method is particularly useful for molded substrates such as molded polymethylmethacrylate.
    Type: Grant
    Filed: April 17, 1998
    Date of Patent: December 5, 2000
    Assignee: Optical Coating Laboratory, Inc.
    Inventors: Nancy Lee Schultz Yamasaki, Ludvik Martinu, Jolanta E. Klemberg-Sapieha
  • Patent number: 6156393
    Abstract: A method for mask-free molecular or atomic patterning of surfaces of reactive solids is disclosed. A molecular-scale pattern of adsorbate molecules is used in place of the conventional macroscopic "mask". Molecules adsorb at surfaces in patterns, governed by the structure of the surface, the chemical nature of the adsorbate, and the adsorbate coverage at the surface. The surface is patterned and then marked or imprinted with the pattern by inducing localized chemical reaction between adsorbate molecules and the surface of the solid, resulting in an imprint being formed in the vicinity of the adsorbate molecules. In one aspect of the invention, photoinduced reaction of the patterned adsorbate leads to patterned photoreaction with the surface.
    Type: Grant
    Filed: November 12, 1997
    Date of Patent: December 5, 2000
    Assignees: John C. Polanyi, Duncan Rogers
    Inventors: John C. Polanyi, Duncan Rogers
  • Patent number: 6153060
    Abstract: A method for coating substrates having sides of the substrate with unequal adhesion properties includes the steps of non-symmetrically coating the substrate by coating a first side under a first set of coating conditions and coating a second side under a second set of operating conditions wherein the operating conditions used to coat each side are varied so as to compensate for the unequal adhesion properties of the sides.
    Type: Grant
    Filed: August 4, 1999
    Date of Patent: November 28, 2000
    Assignee: Honeywell International Inc.
    Inventors: Richard J. Pommer, Glen Roeters, Stephen M. Avery
  • Patent number: RE37294
    Abstract: An ion beam deposition method is provided for manufacturing a coated substrate with improved abrasion resistance, and improved lifetime. According to the method, the substrate is first chemically cleaned to remove contaminants. In the second step, the substrate is inserted into a vacuum chamber, and the air in said chamber is evacuated. In the third step, the substrate surface is bombarded with energetic ions to assist in the removal of residual hydrocarbons and surface oxides, and to activate the surface. Alter After the substrate surface has been sputter-etched, a protective, abrasion-resistant coating is deposited by ion beam deposition. The ion beam-deposited coating may contain one or more layers. Once the chosen thickness of the coating has been achieved, the deposition process on the substrates is terminated, the vacuum chamber pressure is increased to atmospheric pressure, and the coated substrate products having improved abrasion-resistance are removed from the vacuum chamber.
    Type: Grant
    Filed: March 25, 1998
    Date of Patent: July 24, 2001
    Assignee: Diamonex, Incorporated
    Inventors: Bradley J. Knapp, Fred M. Kimock, Rudolph H. Petrmichl, Norman D. Galvin