Abstract: The present disclosure describes a novel method and apparatus of using the JTAG TAP's TMS and TCK terminals as a general purpose serial Input/Output (I/O) bus. According to the present disclosure, the TAP's TMS terminal is used as a clock signal and the TCK terminal is used as a bidirectional data signal to allow serial communication to occur between; (1) an IC and an external controller, (2) between a first and second IC, or (3) between a first and second core circuit within an IC.

Abstract: The disclosure describes a novel method and apparatus for allowing response data output from the scan outputs of a circuit under test to be formatted and applied as stimulus data input to the scan inputs of the circuit under test. Also the disclosure described a novel method and apparatus for allowing the response data output from the scan outputs of a circuit under test to be formatted and used as expected data to compare against the response data output from the circuit under test. Additional embodiments are also provided and described in the disclosure.

Abstract: A multiple defect diagnosis method includes: receiving a gate-level netlist of a chip, a plurality of test patterns and a plurality of test failure reports; deriving a plurality of seed nets from the gate-level netlist according to the plurality of test patterns and the plurality of test failure reports; utilizing a processor to compute similarity between the plurality of seed nets, and accordingly merging the plurality of seed nets to obtain a single seed net tree; and deriving at least one suspected seed net according to the single seed net tree.

Abstract: An integrated circuit operable in a scan mode includes a scan chain formed by cascaded flip-flop cells. Each flip-flop cell includes a master latch that receives a first data signal and generates a first latch signal, a slave latch that receives the first latch signal and generates a second latch signal, and a multiplexer having first and second inputs respectively connected to the master and slave latches for receiving a first input signal and the second latch signal, and generating a scan data output signal depending on a trig signal. The first input signal is one of the first data signal and the first latch signal. The clock signal provided to the slave latch is gated by the trig signal.

Abstract: Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

Abstract: An integrated circuit (IC), a method of testing the IC, and a method of manufacturing the IC are provided. The IC includes analog circuitry, digital circuitry, at least one first connector, and a switching unit operatively coupled with the at least one first connector and configured to, if a first signal is received, couple the analog circuitry and the at least one first connector, and, if a second signal is received, couple the digital circuitry and the at least one first connector.

Abstract: A trusted guard module stores one or more identifiers, each identifier uniquely identifying a respective electronic component of one or more electronic components in a circuit, wherein each electronic component is previously programmed with its respective identifier. In one embodiment, the one or more electronic components are in communication with the guard module via a test data channel. A query is sent from the guard module to one of the components via the test data channel, requesting that the queried component provide its respective identifier to the guard module. The guard module then receives a response from the queried component via the test data channel. The guard module compares the response to the stored identifier for the queried component. If the response fails to correspond to the stored identifier for the queried component, the guard module asserts an alarm condition.

Abstract: Various aspects of the disclosed technology relate to deterministic built-in self-test. A deterministic built-in self-test system comprises: a decompressor configured at least to decompress one of compressed test patterns stored on chip for a predetermined number of times; and a controller configured at least to output a control signal that inverts outputs of the decompressor at one or more scan shift clock cycles based on control data stored on chip, enabling the system to output the predetermined number of test patterns based on the one of compressed test patterns, wherein the one or more scan shift clock cycles are different for each of the predetermined number of test patterns.

Abstract: A method includes receiving a circuit design comprising an input scan chain comprising a plurality of latches connected by one or more scan connections, dividing the plurality of latches into one or more clusters, determining a number of scan controls for each cluster, placing the determined scan controls in selected locations; and adjusting the scan connections based on the scan control location. A corresponding computer system and computer program product are also disclosed.

Abstract: Topology discovery of a target system having a plurality of components coupled with a scan topology may be performed by driving a low logic value on the data input signal and a data output signal of the scan topology. An input data value and an output data value for each of the plurality of components is sampled and recorded. A low logic value is then scanned through the scan path and recorded at each component. The scan topology may be determined based on the recorded data values and the recorded scan values.

Abstract: A system-on-chip (SoC) includes a logic circuit having a scan flip-flop and a an on-chip clock controller. The scan flip-flop is configured to store data using a passive keeper. The on-chip clock controller is configured to receive a reference clock for driving the logic circuit, to generate an internal clock based on a high-state interval of the reference clock, and to provide the internal clock to the scan flip-flop.

Abstract: A method and system for graphical enumeration. The method includes creating an ordered set of vertices for a graph such that each vertex is associated with a corresponding index, and wherein each vertex in the ordered set of vertices includes information. A plurality of keys is created for defining the information. A plurality of lists of vertices is created, each of which is associated with a corresponding key such that vertices in a corresponding list include information associated with the corresponding key. For a first list of vertices, a least valued index is determined from a group of associated vertices based on vertices in the first list and vertices pointed to by the vertices in the first list. Also, all associated vertices are pointed to a root vertex associated with the least valued index.

Abstract: This application discloses a computing system to implement a design verification tool and simulate a circuit design with a test bench. The computing system can identify multiple components in the circuit design to combine for distributed state coverage analysis based, at least in part, on data transactions generated during the simulation of the circuit design. The computing system can correlate information captured during simulation that corresponds to the identified components. The correlated information can identify at least one distributed state coverage event for the test bench. The computing system can generate a distributed state coverage metric based on the correlated information corresponding to the identified components. The computing system can prompt presentation of the correlated information a display window, which can graphically show how a test bench exercised the identified components during simulation.

Abstract: The present disclosure describes using the JTAG Tap's TMS and/or TCK terminals as general purpose serial Input/Output (I/O) Manchester coded communication terminals. The Tap's TMS and/or TCK terminal can be used as a serial I/O communication channel between; (1) an IC and an external controller, (2) between a first and second IC, or (3) between a first and second core circuit within an IC. The use of the TMS and/or TCK terminal as serial I/O channels, as described, does not effect the standardized operation of the JTAG Tap, since the TMS and/or TCK I/O operations occur while the Tap is placed in a non-active steady state.

Abstract: An asynchronous circuit may include a single-rail logic datapath; one or more error-detecting latches; a controller that controls the error-detecting latches; and delay lines. The controller and the delay lines may cooperate to communicate with one or more other controllers that the output of the controlled error-detecting latches may be valid prior to when the error-detecting latches indicate whether or not an error occurred.

Abstract: A test-used PCB having an in-series circuit involved with a join test action group (JTAG) signal is provided. A first JTAG connection interface and a second JTAG connection interface are configured on test circuit boards. Test circuit boards can be seriously connected with each other through the first JTAG connection interface and the second JTAG connection interface. Therefore, the efficiency of providing series test circuit boards, reducing TAP controller and JTAG port may be achieved.

Abstract: A receiver includes a first transfer gate, a first inverter, a second inverter, a second transfer gate, a third inverter, and a fourth inverter connected in series, a first power supply supplying power to the first and second inverters, a second power supply supplying power to the third and fourth inverters, a third power supply supplying power to the second transfer gate, first and second signals having opposite logic levels for controlling the first transfer gate. The third power supply is significantly lower than the first or second power supply. The leakage current of the receiver is significantly reduced in the core when the second power supply remains on but the first power supply is turned off while the performance of the receiver remains the same.

Abstract: An electronic device having a functional portion and a test portion. The test portion includes a boundary scan register formed by a plurality of test cells arranged in the body according to a register sequence, where first test cells are configured to form a serial-to-parallel converter and second test cells are configured to form a parallel-to-serial converter. The test cells are each coupled to a respective data access pin of the device and to a respective input/output point of the functional part and have a first test input and a test output. The boundary scan register defines two test half-paths formed, respectively, by the first test cells and by the second test cells. The first test cells are directly coupled according to a first sub-sequence, and the second test cells are directly coupled according to a second sub-sequence.

Abstract: A measurement device measuring a current passing through a detection resistor coupled between a first node and a second node is provided. An interference elimination unit is coupled to the first and second nodes and selectively outputs the voltage of at least one of the first and second nodes according to a control signal. A first voltage-dividing unit is coupled to the interference elimination unit and processes the voltage of the first or second node to generate a first processed signal. A second voltage-dividing unit is coupled to the interference elimination unit and processes the voltage of the first or second node to generate a second processed signal. A processing unit is coupled to the first and second voltage-dividing units to receive the first and second processed signals and calculates the first and second processed signals to obtain the current passing through the detection resistor.

Abstract: An integrated circuit has a first scan cell segment, a second scan cell segment connected to one or more hidden content, and a scan cell circuit connected to the first scan cell segment and the second scan cell segment. The scan cell circuit alternatively provides access to the first scan cell segment and the second scan cell segment based on a state of the scan cell circuit.

Abstract: In a first embodiment a TAP 318 of IEEE standard 1149.1 is allowed to commandeer control from a WSP 202 of IEEE standard P1500 such that the P1500 architecture, normally controlled by the WSP, is rendered controllable by the TAP. In a second embodiment (1) the TAP and WSP based architectures are merged together such that the sharing of the previously described architectural elements are possible, and (2) the TAP and WSP test interfaces are merged into a single optimized test interface that is operable to perform all operations of each separate test interface.

Abstract: A trusted boot device secures JTAG scan chains of integrated circuit components on a circuit card assembly without necessarily modifying the integrated circuit components. Component JTAG port I/O scan chain signal pins are independently routed to FPGA fabric on the trusted boot device. The trusted boot device monitors the JTAG paths and triggers a security event if unauthorized activity is detected on a JTAG path. JTAG paths on the secure trusted boot device are latch disabled by default and upon detection of a security event. JTAG paths are only enabled for a predefined length of time. To prevent JTAG access when protected data is exposed, a watchdog timer latch disables the JTAG paths when the predefined time has expired and may trigger a security event if activity is detected after the time has expired. A power cycle is then used to re-enable authenticated JTAG enable requests.

Abstract: Embodiments of the disclosure relate to identifying remote units in a wireless distribution system (WDS) based on assigned unique temporal delay patterns. The WDS includes a plurality of remote units configured to communicate communications signals in signal paths. Each of the signal paths is assigned a unique temporal delay pattern. The communications signals are digitally delayed by respective delay elements based on the plurality of unique temporal delay patterns to provide delayed communications signals. A remote unit identification system analyzes a delayed communications signal to determine a respective temporal delay pattern associated within the delayed communication signal. By uniquely identifying a remote unit from which a delayed communication signal is communicated, it is possible to determine the locations client devices in the WDS, thus enabling a variety of location-based services and optimizations in the WDS.

Abstract: In a processor or the like including a reconfigurable (RC) circuit, the RC circuit is used to form a test circuit to test a core, a cache memory, or the like, and then part of the RC circuit is used as an auxiliary cache memory. When a memory can store data after stop of power supply, a startup routine program (SRP) of the processor can be stored therein. For example, after the test, an SRP is loaded to a memory in the RC circuit from an external ROM or the like, and when power is resupplied to the processor, a startup operation is performed using the loaded SRP. When the processor is in a normal operation state, this memory is used as an auxiliary cache memory and the SRP is overwritten. The SRP is loaded to the memory again at the end of use of the processor.

Abstract: A semiconductor device addresses to a problem in which a current consumption variation rate increases during BIST execution causing resonance noise generation in a power supply line. The semiconductor device includes a self-diagnosis control circuit, a scan target circuit including a combinational circuit and a scan flip-flop, and an electrically rewritable non-volatile memory. A scan chain is configured by coupling a plurality of the scan flip-flops. In accordance with parameters stored in the non-volatile memory, the self-diagnosis control circuit can change a length of at least one of a scan-in period, a scan-out period and a capture period, and can also change a scan start timing.

Abstract: Systems and methods are provided for implementing customer-transparent logic redundancy in scan chains for improved yield of integrated circuits. More specifically, an integrated circuit structure is provided for that includes a plurality of combined latch structures. Each of the combined latch structures includes an original latch and a redundant latch. The integrated circuit structure further includes a plurality of combined logic structures. Each of the combined logic structures includes an original logic structure a redundant logic structure. Each redundant latch is a duplicate of each respective original latch within a combined latch structure and each redundant logic structure is a duplicate of each respective original logic structure within a combined logic structure such that a two-fold library of latches and logic is provided for one or more scan chains of the integrated circuit structure.

Abstract: Topology discovery of a target system having a plurality of components coupled with a scan topology may be performed by driving a low logic value on the data input signal and a data output signal of the scan topology. An input data value and an output data value for each of the plurality of components is sampled and recorded. A low logic value is then scanned through the scan path and recorded at each component. The scan topology may be determined based on the recorded data values and the recorded scan values.

Abstract: An integrated circuit with functional circuitry and testing circuitry, the testing circuitry having a state machine operable in a plurality of different states. The integrated circuit also has a pin for receiving a signal, wherein the state machine is operable to transition between states in response to a change in level of the signal. Circuitry couples the signal of the pin, in a first level, to the state machine in a first time period for causing the state machine to enter a predetermined state, and circuitry maintains the signal in the first level to the state machine in a second time period for maintaining the state machine in the predetermined state. Also during the second time period, circuitry couples data received at the pin to a destination circuit other than the state machine, wherein the destination circuit is operable to perform plural successive scan tests using data from the pin without a power on reset of the functional circuitry.

Abstract: A method for testing a multi-chip system with multiple ports includes determining a test path formed by connecting the multiple ports. The test path is determined in such a way that the internal logic circuit of each chip in the multi-chip system is bypassed. The method further includes injecting a test traffic to the test path, and receiving the test traffic from the test path.

Abstract: A method for scanning a partially functional chip. The method may include applying a failed core map to the partially functional chip, bypassing at least one failed core scan chain, based on contents of the failed core map. The method may also include performing comparisons of scan status information to the failed core map and inhibiting movement of scan data of at least one failed core, based on results of the comparisons.

Abstract: This disclosure describes die test architectures that can be implemented in a first, middle and last die of a die stack. The die test architectures are mainly the same, but for the exceptions mentioned in this disclosure.

Abstract: The invention provides a method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit comprises iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock, iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock, launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains, delaying the last shift cycle for the second one of the scan chains for a predetermined time span, launching an at-speed scan test clocked with a functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains, capturing the sample values of the functional elements of the first and second scan chains after the last shift cycle of the scan chains.

Abstract: State machine engines are disclosed, including those having an inter-rank bus control system, which may include a register. The state machine engine may include a plurality of configurable elements, such that each of the plurality of configurable elements comprises a plurality of memory cells. These cells may analyze data and output a result of the analysis. The IR bus control system may halt a write operation of data to be analyzed by the cells based, at least in part, on one or more conditions.

Abstract: A retention circuit provided in a logic circuit enables power gating. The retention circuit includes a first terminal, a node, a capacitor, and first to third transistors. The first transistor controls electrical connection between the first terminal and an input terminal of the logic circuit. The second transistor controls electrical connection between an output terminal of the logic circuit and the node. The third transistor controls electrical connection between the node and the input terminal of the logic circuit. A gate of the first transistor is electrically connected to a gate of the second transistor. In a data retention period, the node becomes electrically floating. The voltage of the node is held by the capacitor.

Abstract: An integrated circuit is configured to receive a test clock input and includes circuitry configured to generate test clocks from the test clock input, and test circuitry configured to use the test clocks in a test mode.

Abstract: A buffer that drives components during a standby mode includes a first combination of two standard voltage threshold (SVT) transistors and two high voltage threshold (HVT) transistors that generate a logic 1 signal at a first output. A second combination of two SVT transistors and two HVT transistors generates a logic 0 signal at a second output. A power supply operates the buffer, wherein the power supply generates a voltage less that the threshold voltages of the HVT transistors.

Abstract: A Propagation Test instruction, a Decay Test instruction and a Cycle Test instruction provide testing of DC and AC interconnect circuits between circuits including JTAG boundary scan cells. A few additions to the Test Access Port circuitry, including gating producing a Capture Test Strobe (CTS) signal, and the boundary scan cells are required to implement the additional instructions. The instructions are extensions of the conventional JTAG operating structure.

Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.

Abstract: A method for checking an output signal of a timer module is provided, the timer module having at least one output module, at least one input module, and at least one logic module. The output signal to be checked is read in into the timer module via an input module in addition to its output via an output module, and in the input module, signal characteristics to be checked are determined for the output signal to be checked. Furthermore, the signal characteristics to be checked are read by the logic module from the input module and the signal characteristics to be checked are compared in the logic module to the predefined values for the signal characteristics.

Abstract: A method for applying test patterns to scan chains in a circuit-under-test. The method includes providing a compressed test pattern of bits; decompressing the compressed test pattern into a decompressed test pattern of bits as the compressed test pattern is being provided; and applying the decompressed test pattern to scan chains of the circuit-under-test. The actions of providing the compressed test pattern, decompressing the compressed test pattern, and applying the decompressed pattern are performed synchronously at the same or different clock rates, depending on the way in which the decompressed bits are to be generated. A circuit that performs the decompression includes a decompressor such as a linear finite state machine adapted to receive a compressed test pattern of bits. The decompressor decompresses the test pattern into a decompressed test pattern of bits as the compressed test pattern is being received.

Abstract: An IC includes a memory core logic unit, an output unit, and an input unit. The memory logic unit is coupled to a plurality of bit cells configured to control read and write of data to and from the plurality of bit cells. The input unit is formed on the integrated circuit. The output unit is formed on the integrated circuit. The input unit includes a second plurality of multiplexers for signal selection, at least one lock up latch for storing data and configured to increase a hold time for the data, and at least one shadow latch configured to store a copy of the data stored in the at least one lock up latch. The output unit includes a first plurality of multiplexers for signal selection and at least one high phase pass latch for storing data.

Abstract: Various aspects of the disclosed technology relate to techniques of creating test templates for test pattern generation. Residual test cubes for a plurality of faults are first generated based on a signal probability analysis of a circuit design. Test templates are then generated based on merging the residual test cubes. Finally, a plurality of test patterns and/or compressed test cubes are generated based on one of the test templates.

Abstract: Embodiments of the disclosure relate to identifying remote units in a wireless distribution system (WDS) based on assigned unique temporal delay patterns. The WDS includes a plurality of remote units configured to communicate communications signals in signal paths. Each of the signal paths is assigned a unique temporal delay pattern. The communications signals are digitally delayed by respective delay elements based on the plurality of unique temporal delay patterns to provide delayed communications signals. A remote unit identification system analyzes a delayed communications signal to determine a respective temporal delay pattern associated within the delayed communication signal. By uniquely identifying a remote unit from which a delayed communication signal is communicated, it is possible to determine the locations client devices in the WDS, thus enabling a variety of location-based services and optimizations in the WDS.

Abstract: A secure switch assembly is provided and includes inputs respectively associated with at least first and second security levels, switch element outputs respectively associated with the at least first and second security levels and a field programmable gate array (FPGA) operably interposed between the inputs and the switch element outputs. The FPGA has a first side facing the inputs and a second side facing the switch element outputs and includes a gate array. The gate array is programmable to generate entirely separate physical interconnections extending from the first side to the second side by which each of the first security level associated inputs and switch element outputs are connectable and each of the second security level associated inputs and switch element outputs are connectable.

Abstract: The disclosure describes a novel method and apparatus for providing expected data, mask data, and control signals to scan test architectures within a device using the falling edge of a test/scan clock. The signals are provided on device leads that are also used to provide signals to scan test architectures using the rising edge of the test/scan clock. According to the disclosure, device test leads serve to input different test signals on the rising and falling edge of the test/scan clock which reduces the number of interconnects between a tester and the device under test.

Abstract: A latch circuit having a master latch and a slave latch includes a device used to short either the master latch or the slave latch. The device includes a transistor and a global control used to assert a signal, and is positioned to short an inverter of the master latch or the slave latch. When the signal is asserted by the global control, the inverter is shorted such that the output value of the inverter is the same as the input value. The assertion of the signal is facilitated by another device connected to the master latch and the slave latch that includes the global control and a transistor.

Abstract: Aspects of the present invention relate to a display device, a timing controller, and an image display method. When a frame of an input image signal including an odd-field signal and an even-field signal is received, a timing controller outputs a gate scanning clock (GCK) signal and an output enable (OE) signal in an interlaced scanning manner, to separately scan the odd-field image and the even-field image in the interlaced scanning manner in real time. The interlaced scanning manner is used for the interlaced signal, thereby saving a storage equipped in a converter.

Abstract: Provided is a device capable of generating test patterns even after the design stage. The area of a circuit which is included in the device and unnecessary during normal operation can be reduced. The device includes a first circuit and a second circuit. The second circuit includes a plurality of third circuits, a plurality of fourth circuits, and a fifth circuit and has a function of generating a signal for testing operation of the first circuit and a function of operating as part of the first circuit. The fourth circuit has a function of storing a first data and a function of storing a second data. The fifth circuit has a function of writing the first data to the plurality of fourth circuits, a function of writing the second data to the plurality of fourth circuits, and a function of reading the second data from the plurality of fourth circuits.

Abstract: Technical solutions are described for optimizing a set of test configurations used for testing an electronic circuit that includes latches. An example method includes receiving a test configuration that includes settings that initiate a set of predetermined input values and corresponding expected output values. The method also includes evaluating the test configuration by executing the electronic circuit according to the test configuration and recording parametric data during the execution, where the parametric data is representative of switching activity of the latches in the electronic circuit. The evaluation includes analyzing the parametric data to identify presence of a predetermined pattern in the switching activity and selecting the test configuration based on the predetermined pattern being absent/present in the switching activity.

Abstract: Specific logic gates for Q-gating are selected by determining the minimum leakage state for a circuit design and then selecting logic gates that hold the circuit design in its lowest leakage state. Depending on the input desired to implement the minimum leakage state, the gate may be selected as a NOR or OR gate. Q-gating that is implemented with gates chosen to implement the minimum leakage state may be enabled during selected operating modes. The minimum leakage state of a circuit can be determined with an automatic test pattern generation (ATPG) tool.