Abstract: The disclosure describes a novel method and apparatus for making device TAPs addressable to allow device TAPs to be accessed in a parallel arrangement without the need for having a unique TMS signal for each device TAP in the arrangement. According to the disclosure, device TAPs are addressed by inputting an address on the TDI input of devices on the falling edge of TCK. An address circuit within the device is associated with the device's TAP and responds to the address input to either enable or disable access of the device's TAP.

Abstract: A hybrid self-test circuit structure comprises a plurality of input terminals and a plurality of output terminals for testing a plurality of memory units. The circuit structure comprises a first level functional unit for driving a plurality of first output terminals electrically coupled to the first level functional unit to output an output signal according to an external control signal transmitted from the outside; a plurality of second level functional units for receiving the output signal and generating a test signal according to the output signal and outputting the test signal to the memory units; a parallel interface parallelly installed between the first level functional unit and at least one of the second level functional units; and a serial interface serially installed between the first level functional unit and at least one of the second level functional units.

Abstract: The disclosure describes a novel method and apparatus for allowing response data output from the scan outputs of a circuit under test to be formatted and applied as stimulus data input to the scan inputs of the circuit under test. Also the disclosure described a novel method and apparatus for allowing the response data output from the scan outputs of a circuit under test to be formatted and used as expected data to compare against the response data output from the circuit under test. Additional embodiments are also provided and described in the disclosure.

Abstract: A Test Wrapper and associated Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test Wrappers that are integrated on the SoC proximate to IP blocks. Test data and commands corresponding to input from an external tester are packaged by the Test Controller and sent to one or more Test Wrappers via an interconnect fabric. The Test Wrappers interface with one or more IP test ports to provide test data, control, and/or stimulus signals to the IP blocks to facilitate circuit-level testing of the IP blocks. Test results for the circuit-level tests are returned to the Test Controller via the fabric. Test Wrappers may be configured to pass through interconnect signals, enabling functional testing of IP blocks to be facilitated via test packages and test results transmitted between the Test Controller and the IP blocks via the fabric.

Abstract: An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.

Abstract: A system and associated data structure that can be utilized within a chip design platform to define the structure of an MBIST architecture. A system for generating a memory built in self test (MBIST) design file in described, including a tool for processing an organization file (Org File), wherein the Org File includes lines of code that dictate a structure of the MBIST design file and conform to a data structure defined by the tool; wherein said data structure provides an infrastructure to describe: associations between MBIST components at a design level; associations between MBIST components and hierarchical test ports at the design level; and a serial order of daisy chains among MBIST components within the design level.

Abstract: A System-on-Chip (SOC) integrated circuit (IC) debugging system includes a plurality of SOC ICs connected to a shared debug bus. One of the plurality of SOC ICs is a master SOC IC having a master/slave debug interface. The master/slave debug interface on the master SOC IC is a bidirectional debug interface operable to send and receive debug data between the SOC ICs and an external host system.

Abstract: A built-in self test circuit includes a pattern generator, an elastic buffer, a symbol detector, and a comparison unit. A pattern generator generates a first test pattern to test a port under test and then a result pattern is gotten and stored in the elastic buffer. The symbol detector detects if a starting symbol exists in the test result pattern. If it exists, a second test pattern is generated to be compared with the test result pattern. As a result, a reliability of data transmission of the port under test is determined.

Abstract: A protocol analyzer for analyzing traffic on a bus. A tap card is used to tap into a bidirectional bus. The tap provides a pass through connection from the card to the host and taps off of the bus. While tapping off the bus, stubs lengths are minimized and input capacitance is minimized. A repeater that preferably has no internal termination provides a differential input and a differential output. The bus lines are input to one of the inputs in the differential inputs and a reference voltage is provided to the other differential input. The reference voltage enables the tap to determine if the data is high or low. A jumper is also included in the tap such that the reference voltage can be selected from the host or from the pod.

Abstract: The disclosure describes a novel method and apparatus for providing expected data, mask data, and control signals to scan test architectures within a device using the falling edge of a test/scan clock. The signals are provided on device leads that are also used to provide signals to scan test architectures using the rising edge of the test/scan clock. According to the disclosure, device test leads serve to input different test signals on the rising and falling edge of the test/scan clock which reduces the number of interconnects between a tester and the device under test.

Abstract: A server includes a baseboard management controller (BMC). More than one inter-integrated circuit (I2C) device may be connected to the BMC via a multiplexing switch. The server sets a first identifier for indicating which channels of I2C device are open, and a second identifier for indicating which channels of the I2C devices are closed, and sends the set information to the BMC. To test a selected I2C device, the server opens a channel to the selected I2C device and assigns the first identifier to the channel of the selected I2C device. During testing of the selected I2C device, if the BMC intends to access a different I2C device, the BMC waits for the identifier of the selected I2C device to change from the first identifier to the second identifier, and then opens a channel to the different I2C device.

Abstract: A System-on-Chip (SoC) may include logic blocks connected to each other and to external connections, and a hardware debug infrastructure logic connected to the logic blocks and for performing functional changes to a design layout of the SoC. The hardware debug infrastructure logic may include software re-configurable modules based upon the logic blocks obtained from substituting a mask programmable ECO base cell configured as a functional logic cell for a logic cell in the design layout.

Abstract: A semiconductor device including an electronic circuit, a memory, and an error detecting module. The electronic circuit is configured to receive an input signal having been generated by a test module, and generate an output signal based on the input signal. The memory is configured to store a predetermined output value that is expected to be output from the electronic circuit based on the electronic receiving the input signal, wherein the predetermined output value is stored in the memory prior to the input signal being generated by the test module. The error detecting module is configured to (i) generate a sample value of the output signal, (ii) compare the sample value of the output signal to the predetermined output value stored in the memory, and (iii) generate a result signal that indicates whether the sample value of the output signal matches the predetermined output value.

Abstract: An automated guardband compensation system may automatically compensate for degradation in the guardband of a clocked data processing circuit while that circuit is connected within a data processing system. A control circuit may automatically and repeatedly request: a switching circuit to switch a critical path within the clocked data processing circuit out of a data processing pathway within the data processing system while the clocked data processing circuit is connected within the data processing system; a guardband test circuit to test the guardband of the critical path while the critical path is switched out of the data processing pathway; a guardband compensation circuit to increase the guardband when the results of the test indicate a material degradation in the guardband; and a switching circuit to switch the critical path back into the data processing pathway after the test.

Abstract: A generalized hardware architecture that supports built-in self testing (BIST) for a range of different computer memory configurations and a generalized BIST algorithm can be compiled, based on specified configuration characteristics (e.g., the number of write ports, the number of read ports, the number of entries, and the number of bits per entry in the computer memory), to generate the hardware design for a particular computer memory system. In one embodiment, the generalized hardware architecture includes a multiplexer block that enables a single BIST comparator to be multiplexed for use in performing BIST testing via different read ports of the computer memory.

Abstract: An apparatus and method for a processor-memory unit for use in system-in-package (SiP) and system-in-package (SiP) integrated circuit devices. The apparatus includes a processing module, a memory module and a programmable system module. The programmable system module is configured to function as an interface between the memory module and the processing module, or as an interface between the memory module and a testing device. The invention facilitates integration and testing of processor-memory units including functional components having different communication protocols.

Abstract: A SRAM (Static Random Access Memory) macro test flop circuit includes a flip-flop circuit, a scan control circuit, and an output buffer circuit. The flip-flop circuit includes a master latch circuit and a slave latch circuit. The master latch circuit includes a master feed-back circuit including a master storage node and a master feed-forward circuit. The slave latch circuit includes a slave feed-back circuit including a slave storage node and a slave feed-forward circuit driven from the master latch. The scan control circuit includes a scan slave feed-forward circuit, a scan latch circuit, and a scan driver circuit driven by the scan feed-back circuit. The scan latch circuit includes a scan feed-back circuit comprising a scan storage node and a scan feed-forward circuit driven from the slave latch. The output buffer circuit includes a master driver driven from master latch circuit and a slave driver driven from slave latch circuit.

Abstract: A method and apparatus for implementing integrated circuit security features are provided to selectively disable testability features on an integrated circuit chip. A test disable logic circuit receives a test enable signal and responsive to the test enable signal set for a test mode, establishes a test mode and disables ASIC signals. Responsive to the test enable signal not being set, the ASIC signals are enabled for a functional mode and the testability features on the integrated circuit chip are disabled. When the functional mode is enabled, the test disable logic circuit prevents the test mode from being established while the integrated circuit chip is powered up.

Abstract: A system receives serial messages from a device under test. The system includes a deserializer configured to i) receive the serial messages and, ii) based on the serial messages, form data frames. A frame sync module is configured to form Joint Task Action Group (JTAG) data bits based on the data frames. A plurality of virtual JTAG test access ports are configured to i) receive the JTAG data bits and ii) shift the JTAG data bits between the plurality of virtual JTAG test access ports.

Abstract: A latch circuit includes a first latch that stores data provided from a data input terminal when a clock is provided from a clock input terminal, and stores scan data provided from a scan data input terminal when a first scan clock is provided from a first scan clock input terminal, a logical circuit that performs a logical operation for a second scan clock provided from the second scan clock input terminal and for an operational mode signal provided from the operation mode input terminal, and generates an update clock and a second latch including an update input terminal connected to an output terminal of the first latch, and an update clock input terminal connected to an output terminal of the logical circuit, the second latch holds the data or the scan data provided from the update input terminal when the update clock is provided.

Abstract: A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.

Abstract: A USB controller and a testing method of the USB controller are disclosed. The USB controller includes a sequence control unit for outputting a transmitting enable signal and a receiving enable signal, and for controlling a sequence of transmission and reception of data based on the transmitting enable signal and the receiving enable signal; a driver unit for transmitting data; a receiver unit for receiving data; a register for setting up a test mode wherein a loop-back test of the USB controller is performed; and a switching unit for providing one of the transmitting enable signal to the receiver unit and the receiving enable signal to the driver unit, if the test mode is set up in the register; wherein the loop-back test is performed if the test mode is set up in the register.

Abstract: A system and method for sharing a communications link between multiple protocols is described. A system includes a communications interface configured to exchange information with other systems using at least one of a plurality of protocols; a protocol select register that stores a value that selects a protocol from among the plurality of protocols to become an active protocol; and a state machine accessible to the communications interface, the state machine used to control the exchange of information through the communications interface according to the active protocol. The active protocol is used by the communications interface to exchange information while the remaining protocols of the plurality of protocols remain inactive. The state machine sequences through a series of states that cause the communications interface to operate according to the active protocol, and that are designated as inert sequences under the remaining protocols.

Abstract: In a non-volatile memory system, test data may be retrieved by means of a circuit without the help of firmware. The circuit is triggered into action when it detects an abnormality in the processor or host interface. In such event, it formats the self test or status signals from the various blocks in the non-volatile memory system controller and sends a test message to the outside world without the assistance of the system processor or interface controller. When implemented in memory systems with multiple data lines, only one of the data lines may be utilized for such purpose, thereby allowing the testing to be performed while the system is still performing data transfer. Preferably, the system includes the test mode communication controller, which can select between a test channel and a host interface channel for the test message transfer so that the same testing may be performed when the memory system is in the test package as well as in an encapsulated package.

Abstract: An embodiment of the invention provides system for detecting faults on a test chain. A circuit provides a test signal to an input of a test chain. The test chain includes a plurality of buffers connected in series. A register receives a logical value representing the output of the test chain. The register sends the logical value representing the output of the test chain to test circuitry where the value is observed.

Abstract: A system and method of sharing testing components for multiple embedded memories and the memory system incorporating the same. The memory system includes multiple test controllers, multiple interface devices, a main controller, and a serial interface. The main controller is used for initializing testing of each of the dissimilar memory groups using a serial interface and local test controllers. The memory system results in reduced routing congestion and faster testing of plurality of dissimilar memories. The present disclosure further provides a programmable shared built in self testing (BIST) architecture utilizing globally asynchronous and locally synchronous (GALS) methodology for testing multiple memories. The built in self test (BIST) architecture includes a programmable master controller, multiple memory wrappers, and an interface. The interface can be a globally asynchronous and locally synchronous (GALS) interface.

Abstract: A data processing system and method for regulating a voltage supply to functional circuitry of the data processing system is provided. The functional circuitry is configured to operate from a voltage supply whose voltage level is variable, the functional circuitry having at least one error correction circuit configured to detect errors in operation of the functional circuitry and to repair those errors in operation. Voltage regulator circuitry provides the voltage supply to the functional circuitry, and modifies the voltage level of the voltage supply based on a feedback control signal. Error rate history circuitry receives error indications from the error correction circuit during operation of the functional circuitry and generates error rate history information therefrom.

Abstract: A device for monitoring events. The device may have a programmable event engine for detecting events and a memory array coupled to the event engine. The array may store data for programming the event engine to monitor for the events. The device may have an external pin coupled to the event engine. The event engine may monitor a signal on the external pin to detect events external to the device. Alternatively, the device may output a signal on an external pin in response to detecting one of the events.

Abstract: A system and method for soft error recovery (SER) within a flip-flop. A first stage of the flip-flop receives an ungated input clock signal. A second stage of the flip-flop receives a gated input clock signal. The second stage may also store a prebuffered data output and one or more feedback storage values on separate nodes. The flip-flop has SER circuitry used to recover the prebuffered data output and any feedback storage value without requiring a transition of a clock signal.

Abstract: A prototype debugging system controlled by a host processor over a host bus includes: (a) a vector processor interface bus; (b) one or more programmable logic circuits, at least one of which provided to implement: (i) a logic circuit under verification; (ii) one or more programmable embedded debug circuits each receiving a first group of selected signals from the logic circuit under verification and providing control signals for (1) selecting a portion of the first group of selected signals, or (2) affecting the values of a second group of selected signals in the logic circuit under verification based on a portion of the first group of selected signals satisfying a predetermined triggering condition, wherein the programmable embedded debug circuits each including a built-in memory for storing signal vectors, the programmable embedded debug circuits each being configured according to a trigger specification defining one or more trigger states and triggering conditions; and (iii) a local debugging controller th

Abstract: A high integration integrated circuit may comprise a plurality of processing cores, a graphics processing unit, and an uncore area coupled to an interface structure such as a ring structure. A generic debug external connection (GDXC) logic may be provisioned proximate to the end point of the ring structure. The GDXC logic may receive internal signals occurring in the uncore area, within the ring structure and on the interfaces provisioned between the plurality of cores and the ring structure. The GDXC logic may comprise a qualifier to selectively control the entry of the packets comprising information of the internal signals into the queue. The GDXC logic may then transfer the packets stored in the queues to a port provisioned on the surface of the integrated circuit packaging to provide an external interface to the analysis tools.

Abstract: A test system tests a full system integrated circuit (IC) model that includes a device under test (DUT) IC model and a support IC model. A test manager information handling system (IHS) maps the full system IC model on a hardware accelerator simulator via an interface bus. The hardware accelerator simulator thus emulates the full system IC model. Of all possible fault injection points in the model, the test manager IHS selects a subset of those injection points for fault injection via a statistical sampling method in one embodiment. In response to commands from the test manager IHS, the simulator serially injects faults into the selected fault injection points. The test manager IHS stores results for respective fault injections at the selected injection points. If a machine checkstop or silent data corruption error occurs as a result of an injected fault, the DUT IC model may return to a stored checkpoint and resume operation from the stored checkpoint.

Abstract: An integrated circuit includes an embedded processor. An embedded in-circuit emulator is located within the embedded processor. The embedded in-circuit emulator performs a test on the integrated circuit. The embedded in-circuit emulator generates a testing result based on the test on the integrated circuit. Trace logic to generate trace data based on the testing result, the trace data being in a parallel format. A serializer is located on the integrated circuit. The serializer converts the parallel format of the trace data into a serial format. The serializer serially outputs the trace data in the serial format from the integrated circuit.

Abstract: Various example embodiments are disclosed. According to one example embodiment, an integrated circuit may include a mode block, a plurality of data blocks, and a reset node. The mode block may be configured to output a test mode signal, a scan mode signal, and a trigger signal based on a received data input. The plurality of data blocks may each include registers configured to store data, each of the plurality of data blocks being configured to write over at least some of the data stored in their respective registers in response to receiving a write-over instruction. The reset node may be configured to reset the registers based on receiving either a first reset input or a second reset input. The integrated circuit may be configured to enter a test mode, enter a scan mode, and exit the test mode.

Abstract: A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.

Abstract: The disclosure describes a novel method and apparatuses for allowing a controller to select and access different types of access ports in a device. The selecting and accessing of the access ports is achieved using only the dedicated TDI, TMS, TCK, and TDO signal terminals of the device. The selecting and accessing of device access ports can be achieved when a single device is connected to the controller, when multiple devices are placed in a daisy-chain arrangement and connected to the controller, or when multiple devices are placed in a addressable parallel arrangement and connected to the controller. Additional embodiments are also provided and described in the disclosure.

Abstract: An interface circuit and method for programming or communicating with an integrated circuit (IC) via a power supply pin is provided herein. In general, the power supply pin may be coupled for receiving a relatively constant voltage signal during a first mode of operation (i.e., a normal mode) and a modulated voltage signal during a second mode of operation (i.e., a programming or communication mode). The interface circuit may be coupled between the power supply pin and other IC components for decoding the modulated voltage signal into data. Various encoding/decoding schemes may be used by the interface circuit and method for communicating data to the IC over the power supply lines. The decoded data may be used for programming or communication purposes.

Abstract: An access pad is used to provide access to a functional block of an integrated circuit (IC) device. The access pad is formed using dummy metal in an open space in a metallization level that is between a top metallization level and a base level on which the functional block is formed in the IC device. The access pad at the metallization level provides a contact to access an underlying circuit of the functional block so that the functional integrity of the functional block of the IC device can be verified during probing.

Abstract: A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

Abstract: A panel driving circuit that produces a panel test pattern and a method of testing a panel are provided. The driving circuit includes a pattern generation unit and a selection unit. The pattern generation unit responds to a system clock and produces pattern test data and pattern test signals. The selection unit responds to a test signal and selects and outputs either (a) the pattern test data and the pattern test signals that are outputted from the pattern generation unit, or (b) the pattern test data and pattern test signals that are directly applied from the outside. The driving circuit and the method of the panel test generates the panel test data, the horizontal synchronizing signal, the vertical synchronizing signal, and the data activating signal within the driving circuit using a system clock so that the testing of the panel can be carried out without using a separate test device.

Abstract: An IC includes an IEEE 1149.1 standard test access port (TAP) interface and an additional Off-Chip TAP interface. The Off-Chip TAP interface connects to the TAP of another IC. The Off Chip TAP interface can be selected by a TAP Linking Module on the IC.

Abstract: A process and apparatus provide a JTAG TAP controller (302) to access a JTAG TAP domain (106) of a device using a reduced pin count, high speed DDR interface (202). The access is accomplished by combining the separate TDI and TMS signals from the TAP controller into a single signal and communicating the TDI and TMS signals of the single signal on the rising and falling edges of the TCK driving the DDR interface. The TAP domain may be coupled to the TAP controller in a point to point fashion or in an addressable bus fashion. The access to the TAP domain may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

Abstract: A built-in self test circuit includes a pattern generator, an elastic buffer, a symbol detector, and a comparison unit. A pattern generator generates a first test pattern to test a port under test and then a result pattern is gotten and stored in the elastic buffer. The symbol detector detects if a starting symbol exists in the test result pattern. If it exists, a second test pattern is generated to be compared with the test result pattern. As a result, a reliability of data transmission of the port under test is determined.

Abstract: Example embodiments relate to a method and system of testing a memory module having the process of receiving single ended input signals via differential input terminals through which differential pairs of packet signals may be received from a testing equipment, wherein a number of terminals of the testing equipment may be different from a number of terminals of the memory module, and testing memory chips of the memory module based on the single ended input signals.

Abstract: The disclosure describes a novel method and apparatus for making device TAPs addressable to allow device TAPs to be accessed in a parallel arrangement without the need for having a unique TMS signal for each device TAP in the arrangement. According to the disclosure, device TAPs are addressed by inputting an address on the TDI input of devices on the falling edge of TCK. An address circuit within the device is associated with the device's TAP and responds to the address input to either enable or disable access of the device's TAP.

Abstract: The disclosure describes a novel method and apparatus for providing expected data, mask data, and control signals to scan test architectures within a device using the falling edge of a test/scan clock. The signals are provided on device leads that are also used to provide signals to scan test architectures using the rising edge of the test/scan clock. According to the disclosure, device test leads serve to input different test signals on the rising and falling edge of the test/scan clock which reduces the number of interconnects between a tester and the device under test.

Abstract: A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.

Abstract: This disclosure describes a reduced pin bus that can be used on integrated circuits or embedded cores within integrated circuits. The bus may be used for serial access to circuits where the availability of pins on ICs or terminals on cores is limited. The bus may be used for a variety of serial communication operations such as, but not limited to, serial communication related test, emulation, debug, and/or trace operations of an IC or core design. Other aspects of the disclosure include the use of reduced pin buses for emulation, debug, and trace operations and for functional operations. In a fifth aspect of the present disclosure, an interface select circuit, FIGS. 41-49, provides for selectively using either the 5 signal interface of FIG. 41 or the 3 signal interface of FIG. 8.

Abstract: Disclosed are methods, systems and devices, such as a device including a data location, a quantizing circuit coupled to the data location, and a test module coupled to the quantizing circuit. The quantizing circuit may include an analog-to-digital converter, a switch coupled to the memory element and a feedback signal path coupled to the output of the analog-to-digital converter and to the switch.

Abstract: A computer-based system for testing a circuit design for implementation within an integrated circuit device can include a design application (205) providing simulation instructions for testing a circuit design and a simulation driver (225) receiving the simulation instructions and translating the simulation instructions into control protocol instructions specifying operations of an integrated circuit control protocol. The system can include a simulation environment (240). The simulation environment can include a communication module (245) communicating with the simulation driver, a simulation cable driver (250) receiving the control protocol instructions from the simulation driver via the communication module, and a control module (255). The simulation cable driver further can translate the control protocol instructions into signaling information corresponding to the integrated circuit control protocol.