Abstract: A method and apparatus of a novel command coverage analyzer is disclosed. Combinations of commands, options, arguments, and values of a product are extracted, customer environment and uses are considered, and a more comprehensive and accurate quality of software process and metric is provided.

Abstract: A method of generating a layout of an IC includes identifying a target pin in a first cell in an IC layout, the first cell being adjacent to a second cell and sharing a boundary with the second cell, and determining whether or not the target pin is capable of being extended into the second cell. Based on a determination that the target pin is capable of being extended into the second cell, the target pin is modified to include an extension into the second cell, the target pin thereby crossing the shared boundary. At least one of the identifying, determining, or modifying is executed by a processor of a computer.

Abstract: A circuit design is simulated in a simulation environment. When a simulation model in the simulation environment transfers state information to a second simulation model, the simulation environment receives the state information and makes it available to the second simulation model without simulating the transfer through the simulated circuit design.

Abstract: This application discloses a computing system configured to divide bins into primary bins and secondary bins based, at least in part, on a configuration of a circuit design describing an electronic device. The computing system can utilize the primary bins to record coverage events performed by the electronic device when modeled in a verification environment by the computing system, and infer coverage event records for the secondary bins based, at least in part, on the coverage event records for the primary bins.

Abstract: Analyzing a security specification. An embodiment can include identifying a downgrader in a computer program under test. Testing on the downgrader can be performed in a first level of analysis. Responsive to the downgrader not passing the testing performed in the first level of analysis, a counter example for the downgrader can be automatically synthesized. Further, a test unit can be created for the downgrader using the counter example as an input parameter to the downgrader. The test unit can be executed to perform testing on the downgrader in a second level of analysis. Responsive to the downgrader passing the testing performed in the second level of analysis, a user can be prompted to simplify a model of the downgrader.

Abstract: Disclosed below are representative embodiments of methods, apparatus, and systems for performing power analysis during the design and verification of a circuit. Certain exemplary embodiments include user interfaces and software infrastructures that provide a flexible and powerful environment for performing power analysis. For example, embodiments of the disclosed technology can be used to construct complex and targeted power queries that quickly provide a designer with power information during a circuit design process. The disclosed methods can be implemented by a software tool (e.g., a power analysis tool or other EDA tool) that computes and reports power characteristics in a circuit design (e.g., a system-on-a-chip design or other integrated design).

Abstract: A circuit for modeling capacitive coupling comprising a victim line to be tested, a first aggressor line, running alongside the victim line, creating a coupling capacitance between the victim line and the first aggressor line, and a sensor circuit coupled to the victim line, to detect effects of the first aggressor line on the victim line, the sensor circuit measuring timing effects in pseudo-real time.

Abstract: A method is presented for responding to user input by displaying when a circuit has a property expressed by an assertion based on data indicating values of signals of the circuit at a succession of times. The assertion expresses the property as a first sequence of expressions, and separately defines for each expression a corresponding evaluation time relative to the succession of times at which the expression is to be evaluated. The circuit has the property only if every expression of the first sequence evaluates true at its corresponding evaluation time. The method includes displaying a representation of each expression of the first sequence and identifying each variable that caused that expression to evaluate false and distinctively marking that variable's symbol relative to other variable symbols within the display for each expression of the first sequence that evaluates false at its corresponding evaluation time.

Abstract: Closing timing for a circuit design can include displaying, using a display device, a first region having a plurality of controls corresponding to a plurality of data sets generated at different times during a phase of a design flow for a circuit design, wherein each control selects a data set associated with the control, and displaying, using the display device, a second region configured to display a list of critical paths for data sets selected from the first region using one of the plurality of controls. Closing timing further can include displaying, using the display device, a third region configured to display a representation of a target integrated circuit including layouts for the critical paths of the list for implementations of the circuit design specified by the selected data sets.

Abstract: Methods and systems for verifying a derived clock using assertion-based verification. The method comprises counting the number of full or half cycles of a fast clock that occur between the rising edge and the falling edge of a slow clock (i.e. during the ON phase of the slow clock); counting the number of full or half cycles of the fast clock that occur between the falling edge and the rising edge of the slow clock (i.e. during the OFF phase of the slow clock); and verifying the counts using assertion-based verification.

Abstract: The present invention relates to a multichip system and a method for scheduling threads in 3D stacked chip. The multichip system comprises a plurality of dies stacked vertically and electrically coupled together; each of the plurality of dies comprising one or more cores, each of the plurality of dies further comprising: at least one voltage violation sensing unit, the at least one voltage violation sensing unit being connected with the one or more cores of each die, the at least one voltage sensing unit being configured to independently sense voltage violation in each core of each die; and at least one frequency tuning unit, the at least one frequency tuning unit being configured to tune the frequency of each core of each die, the at least one frequency tuning unit being connected with the at least one voltage violation sensing unit. The multichip system and method described in present invention have many advantages, such as reducing voltage violation, mitigating voltage droop and saving power.

Abstract: A method for converting a circuit in a format of a first circuit simulation program to format of a second circuit simulation program includes identifying components in the circuit that are recognized by the second simulation program. Characteristics for components that are not recognized by the second simulation program are created. Connections in the circuit are formatted to a format that is recognized by the second simulation program. The components, characteristics, and connections are stored in a single computer-readable file.

Abstract: Systems and methods allow an IC design process to continue in the face of errors while those errors are being investigated and fixed in the actual design data. Potential mismatches can be categorized and a user can choose which action (if any) to take when a specific mismatch is discovered. A set of potential mismatches and their action settings can be aggregated into a higher level setting that the end user of the system can choose during different stages of a design project. A record of the mismatches that have been encountered, the design elements that are involved in each mismatch, and what action where taken to repair the mismatch is kept and maintained.

Abstract: Computer-implemented methods for evaluating integrity of data models with improved efficiency by providing an automation tool for core data services test double framework. A package is selected where a semantic and reusable data model is expressed in data definition language. Subsequently, a class is selected to create local test classes. Local test class templates are generated for the package based on a class name and a package name. Then integrity of the data model is determined by comparing an actual result for the data model and an expected result for the data model. Related apparatus, systems, techniques and articles are also described.

Abstract: Methods and apparatuses are described for sharing inductive invariants while performing formal verification of a circuit design. Specifically, some embodiments assume at least an inductive invariant for a property to be true while proving another property. According to one definition, an inductive invariant of a property is an inductive assertion such that all states that satisfy the inductive assertion also satisfy the property. According to one definition, an inductive assertion describes a set of states that includes all legal initial states of the circuit design and that is closed under a transition relation that models the circuit design.

Abstract: Embodiments of the present invention provide methods, computer program products, and systems for generating comprehensive test cases covering new events yet to be covered. Embodiments of the present invention can be used to receive a request to generate a test case, wherein the request comprises a coverage schema associated with a first set of events to be covered in the generated test case. Embodiments of the present invention can update the coverage schema, wherein updating the coverage schema comprises adding a second set of events to be covered in the generated test case and generate constraints used to satisfy requirements for meeting the first and the second set of events in the updated coverage schema. Embodiments of the present invention can generate a test case using the generated constraints and the updated schema.

Abstract: Methods and systems for timing analysis and optimization of asynchronous circuit designs are disclosed. Registration stages are placed between combinational logic circuits. For timing purposes, the registration stages are modified to have a duplicate set of pins. New paths are formed in the circuit for the purposes of timing analysis. The paths are analyzable by timing tools. Once the timing analysis is complete, the paths are reverted to original paths, and new devices are selected for the circuit design based on results of the timing analysis. An updated design is sent for manufacture, based on the timing analysis and optimization of the asynchronous circuit.

Abstract: A simulation method includes receiving a netlist describing a plurality of devices, performing an arithmetic operation by using values of random telegraph signal (RTS) noise factors respectively corresponding to the plurality of devices, generating an RTS model corresponding to each of the devices, based on a result of the arithmetic operation, and generating a netlist in which the RTS model is reflected.

Abstract: A model-building method and a model-building system for executing the method are disclosed. The method includes the following steps: reading a first netlist; extracting a netlist between an input and an initial-stage clock multi-vibrator and extracting a netlist between a final-stage clock multi-vibrator and an output from the first netlist; extracting a netlist between the input and the output from the first netlist; extracting a netlist between a first clock multi-vibrator and a second clock multi-vibrator from the first netlist; extracting netlists between the first clock input and the initial-stage clock multi-vibrator and the first clock multi-vibrator from the first netlist; extracting netlists between the second clock input and the final-stage clock multi-vibrator and the second clock multi-vibrator from the first netlist; and generating a second netlist based on extracted netlists.

Abstract: Systems and methods for device identity augmentation. In some embodiments, an Information Handling System (IHS) may include a processor and a memory coupled to the processor, the memory including program instructions stored thereon that, upon execution by the processor, cause the IHS to: receive high-level metrics; receive low-level metrics; determine, using a plurality of sets of threshold values, that the high-level metrics and the low-level metrics match at least one of a plurality of device profiles; and at least one of: (a) identify a device as belonging to class of devices corresponding to the matching device profile, or (b) identify whether at least a subset of the high-level metrics or the low-level metrics are outside one or more of the sets of threshold values.

Abstract: This test device for a monitoring control device includes an input/output controller, a logic controller, a logic connector, a logic executing simulator, a test target indication unit, an apparatus characteristic receiver, a logic managing simulator, and a logic connection information generator. Using an apparatus characteristic obtained by the apparatus characteristic receiver, the logic managing simulator specifies a simulation logic appropriate for a control logic on the basis of a simulation logic management rule. The logic connector connects the control logic and the simulation logic, by using logic connection information generated on the basis of a logic connection rule.

Abstract: Optical verification testing of an IC includes obtaining images of the IC by, for each image: (i) illuminating the IC with excitation light, wherein the excitation light corresponds to a respective specific optical excitation of a predefined spectrum of optical excitations (e.g., wavelength spectrum); and (ii) detecting scattered light from the IC in response to the specific optical excitation. For each of a set of sub-regions of the images, the respective sub-region is mapped to at least one of (i) a specific sub-unit of a predefined set of sub-units (e.g., gates) of the IC and (ii) a null result, thereby creating a representation of a detected layout of the IC as an arrangement of the sub-units. The representation can be used to verify that an as-fabricated layout is consistent with an as-designed layout, to detect unauthorized modifications of the IC structure.

Abstract: A method is provided that includes receiving shape data specifying a shape of an electromagnetic (EM) structure in a circuit layout and transferring the shape data to a schematic cell representation based on a logic function of the EM structure and package technology layers of the circuit layout. The method includes placing a symbol for the EM structure in the schematic cell representation, associating the shape data and a model path with a cell parameter in the symbol, mapping the shape data to the package technology layers, and specifying pins in the schematic cell representation according to the shape data. Further, the method includes verifying ports for the EM structure and placing the EM structure in a package layout for a printed circuit board (PCB). A system and a non-transitory, computer readable medium storing commands to perform the above method are also provided.

Abstract: An identification of a first area of an IC design surrounding a failure component is received; and, in response, a smaller portion of the first area is selected. The smaller portion also surrounds the failure component, is smaller than the first area, and contains less circuit components than the first area. The smaller portion is matched to other areas of the IC design to identify potentially undesirable patterns of the IC design that are the same size as the first area. Additionally, the potentially undesirable patterns are grouped into pattern categories, the pattern categories are matched to known good pattern categories, and the known good patterns are removed from the potentially undesirable patterns to leave potential failure patterns. The potential failure patterns of the IC design are then output.

Abstract: A node type of a plurality of distributed nodes to which a table to be added to a distributed database should be assigned can be identified by applying a set of placement rules defined for the table. The set of placement rules can also be applied to determine whether the table should be partitioned into more than one partition. A table group name associated with the table can be obtained and used in conjunction with the node type and determination of whether to partition the table to store the table in the distributed database on at least one node of the plurality of nodes as one or more partitions.

Abstract: The present disclosure relates to a system and method for constraint validation in an electronic design. The method may include receiving an electronic design at an electronic design automation application and analyzing at least a portion of the electronic design at a constraint validation tool configured to analyze one or more physical constraints in a design layout associated with the electronic design. The method may further include applying one or more programmable electrical rule check (“PERC”) rules and one or more constraints to the electronic design, wherein the one or more PERC rules are configured to perform one or more electrical rule checks.

Abstract: A method for determining a connectivity of at least one fracture to other fractures in an earth formation includes: obtaining connectivity information for each fracture of interest in the earth formation where the connectivity information for each fracture of interest includes connections with other fractures. The method further includes converting the connectivity information for each fracture of interest into a conjunctive normal form and determining the connectivity of the at least one fracture to other fractures by solving the connectivity information for each fracture of interest in the conjunctive normal form using a Boolean Satisfiability problem solver.

Abstract: The present disclosure relates to systems and methods for performing out of order name resolution in an electronic design language. Embodiments may include receiving, one or more design units associated with an electronic design and registering the one or more design units in a registry database. Embodiments may further include performing local name resolution for each element reference within at least one of the one or more design units. In response to registering, embodiments include identifying at least one element reference upon which local name resolution was not performed and obtaining an appropriate element reference from the registry database. Embodiments may further include reviewing at least one secondary design unit for one or more local declarations and performing local name resolution for one or more remaining element references using a design hierarchy.

Abstract: According to the present invention, a method and system for emulating multiple electronic designs on a single testbench is disclosed wherein number of instances of the original design to be connected on a single testbench is derived by calculating the capacity of the design and the testbench. It further creates a new wrapper design corresponding to number of instances of the original design; and selectively adapt the design for emulation.

Abstract: This application discloses a computing system implementing a source application to extract coverage data from a source database with application program interface (API) routines specific to the source database, and classify the coverage data according to a Unified Coverage Interoperability Standard (UCIS)-compliant format. The coverage data can include at least one of data from verification operations performed on a circuit design, test information utilized during the verification operations, or at least one test plan. The computing system implementing the source application can, based on the classification, select exchange routines to transfer the coverage data towards a target database. The computing system can implement a target application to utilize the classification of the coverage data to identify corresponding API routines specific to the target database, and write the coverage data to the target database with the identified API routines.

Abstract: A method for reuse of extracted layout-dependent effects for circuit design using circuit stencils includes receiving a schematic of an integrated circuit including a circuit segment. A circuit stencil corresponding to the circuit segment is instantiated in a schematic of a second integrated circuit. The circuit stencil includes layout-dependent effects information for the circuit segment extracted from a layout of the first integrated circuit. Simulation is performed on the schematic of the second integrated circuit using the layout-dependent effects information for the circuit segment. A layout of at least a portion of the second integrated circuit corresponding to the circuit segment is generated responsive to performing the simulation.

Abstract: An exemplary system, method and computer-accessible medium for detecting the presence of a Trojan(s) in a circuit(s), can include, for example, receiving information related to a property(s) configured to determine the presence of the Trojan(s), and determining the presence of the Trojan(s) based on the property(s) and a design(s) of the circuit(s) using a bounded model checking tool.

Abstract: A method and circuits are provided for implementing enhanced scan data testing using an XOR network to prioritize faults to be simulated during diagnostic isolation, and reducing the number of faults requiring re-simulation. A test is run, scan data are applied to scan channels using the XOR network and the output scan data are unloaded. A list of possible faults is identified based on pin flips, and the possible faults to be simulated during diagnostic isolation are prioritized by a number of occurrences in the list, and possible faults are further graded to reduce the number of possible faults requiring re-simulation.

Abstract: An integrated circuit includes user storage circuits, a local control circuit, and scan storage circuits arranged in a scan chain. At least a portion of a design-under-test is implemented in a subset of the integrated circuit that comprises the user storage circuits. The local control circuit retrieves data stored in the user storage circuits through the scan storage circuits without erasing the data stored in the user storage circuits after halting oscillations in a user clock signal that clocks the user storage circuits. The local control circuit restarts oscillations in the user clock signal after the data is provided from the user storage circuits to the scan storage circuits.

Abstract: A development device for configuring a model of a technical system to represent signal paths, in particular on a computer with a display, wherein the model depicts at least two signal paths of the technical system and, in an initial representation, all input signals, output signals, and all processing units are depicted in the form of block elements in a circuit diagram, characterized in that the development device is configured to reduce the representation of the model to the signal path of the selected signal once any desired input signal or output signal has been selected, wherein only the relevant processing units are displayed or highlighted.

Abstract: Electronic design automation to simulate the behavior of structures and materials at multiple simulation scales with different simulators.

Abstract: A method of configuring an integrated circuit device with a user logic design includes analyzing the user logic design to identify timing requirements of paths within the user logic design, determining latency requirements along those paths, routing the user logic design based on availability of storage elements for incorporation into those paths to satisfy the latency requirements, and retiming the user logic design following that routing by incorporating at least some of the storage elements.

Abstract: The present disclosure relates to a computer-implemented method for electronic design verification. The method may include receiving, using a processor, an electronic design at a verification environment and generating a symbolic constant for use with the verification environment. The method may further include identifying a plurality of X sources associated with the verification environment and modifying the plurality of X sources based upon, at least in part, the symbolic constant. The method may also include running a first target node and if the first target node is proven, run at least one additional target node until all target nodes are proven.

Abstract: A computerized method of creating a circuit logic model of a VLSI device, comprising mapping a plurality of logic function patterns of one or more circuits of a VLSI device through a plurality of probe iterations and generating a circuit logic model of the circuit(s) by reconstructing a logical function of a combinatorial logic of the circuit(s) based on analysis of the logic function patterns. Each of the probe iteration comprises switching between scan shift mode and functional mode of the VLSI device such that while the VLSI device operates in scan shift mode register(s) associated with the circuit(s) is accessed and while the VLSI device operates in functional mode external pin(s) of the VLSI device associated with the circuit(s) is probed and mapping a respective one of the logic function patterns according to a logic state of one or more bits in the register(s) and/or the external pin(s).

Abstract: A system-on-chip (SoC) may include a master, a slave, and an asynchronous interface having a first first-in first-out (FIFO) memory connected to the master and the slave. A write operation of the FIFO memory is controlled based upon a comparison of a write pointer and an expected write pointer of the FIFO memory, and a read operation of the FIFO memory is controlled based upon a comparison of a read pointer and an expected read pointer of the FIFO.

Abstract: A method of performing a static timing analysis on an integrated circuit includes loading a library that includes local random variation information of the integrated circuit and global variation information of the integrated circuit that is obtained based on a set of a plurality of global variation parameters of the integrated circuit, calculating delays of timing arcs included in the integrated circuit based on the library, and determining whether at least one timing path of a plurality of timing paths included in the integrated circuit violates a timing constraint based on the delays of the timing arcs in the at least one timing path, the local random variation information of the integrated circuit and the global variation information of the integrated circuit.

Abstract: A method and apparatus for ranking combinations of mutants, test cases and random seeds in mutation testing, comprising obtaining, based on a signal of a test case target, logic gates related to the signal of the test case target and mutants on the related logic gates, for a compiled integrated circuit under test; calculating distances between the mutants and the signal of the test case target; performing a circuit simulation on the compiled integrated circuit under test to obtain activation cycle numbers corresponding to combinations of the mutants, test cases and random seeds; obtaining activation cycle number variances corresponding to combinations of the mutants and the test cases; and ranking the combinations of the mutants, the test cases and the random seeds based on the distances, the activation cycle numbers and the activation cycle number variances. The invention can reduce the probability that the mutation simulation selects equivalent mutants.

Abstract: Disclosed are techniques for implementing a layout-driven, multi-fabric schematic design of an electronic design. These techniques identify a multi-fabric layout spanning across multiple design fabrics and layout connectivity information and determine a device map that correlates a first set of devices in the multi-fabric layout with respective parasitic models. The device map can be identified one or more pre-existing device maps or can be constructed anew. A multi-fabric schematic can be generated by using at least the respective parasitic models and the layout connectivity information.

Abstract: A test pattern generation apparatus includes an input unit, an output unit, and a pattern generating unit configured to, when a source code based on a system description language is created through the input unit, store an execution file created from the source code, generate a test pattern from the execution file according to an external command for testing a semiconductor apparatus as a DUT, and output the generated test pattern through the output unit.

Abstract: Techniques for employing an additive design process to design heat sinks are disclosed. A heat sink “grows” through an iteration process. During each iteration step, an object is added to a location determined based on simulation. The criterion for the determination may be being a location having a highest fluid apparent surface temperature value or being a location having a highest bottleneck heat transfer characteristic value. The thermal performance of the newly derived structure is simulated. If a predetermined condition is met, the object is kept. Otherwise, the object is removed and the location is marked so that the same addition may not occur subsequently. The iteration process may be repeated.

Abstract: Disclosed are techniques for simplifying an electronic design for verification by domain reduction. These techniques extract one or more data flows for at least a portion of an electronic design under verification, construct a comparison graph comprising tokens and edges for the at least the portion of the electronic design, color the comparison graph with a number of colors, and reduce a domain size of the at least the portion of the electronic design based in part or in whole upon the number of colors.

Abstract: Methods and systems for performing mainframe batch testing and/or property-based validation testing using a finite-state machine are provided. According to certain aspects, a validation server may receive a set of batch data designed to validate a property under test, such as during mainframe batch testing. A validation server may validate that the set of batch data is in a proper format. The validation server may then cause a finite-state machine to process instructions contained within the set of batch data. Once the finite-state machine processes the set of batch data, the validation server may then validate that the finite-state machine adheres to the property under test. If the validation fails, the validation server may generate an error report describing the failure.

Abstract: Embodiments of the present invention provide methods, computer program products, and systems for generating comprehensive test cases covering new events yet to be covered. Embodiments of the present invention can be used to receive a request to generate a test case, wherein the request comprises a coverage schema associated with a first set of events to be covered in the generated test case. Embodiments of the present invention includes updating the coverage schema, wherein the updating the coverage schema comprises adding a second set of events to be covered in the generated test case and generating constraints used to satisfy requirements for meeting the first set of events and the second set of events in the updated coverage schema. Embodiments of the present invention can generate a test case using the generated constraints and the updated coverage schema.

Abstract: A system for concurrent target diagnostics is disclosed. The system comprises dedicated FPGA for generating test data to test target connections between an emulator and a target system. In this way, domains of the emulator may continue to emulate at least a portion of a hardware design during the testing of the target connections. Further, a multiplexer operable to select target connections for testing eliminates errors resulting from manual swapping of target connections during the testing process. The system further comprises multiple paths to a target pod. The paths enable monitoring and reporting on the status of target connections between an emulator and a target system.

Abstract: A method for measuring the effect of microscopic hardware faults in high-complexity applications includes carrying out on a processing system a step of simulation of an electronic system that executes a software instance of the application. The simulation step includes injecting faults at a microscopic level and measuring a corresponding final effect. The operation of injecting faults includes selecting a microscopic fault to be injected, selecting a mutant corresponding to the microscopic fault, applying the selected mutant to the software instance to obtain a mutated instance, simulating the electronic system that executes the mutated instance, and measuring the corresponding effect.