Abstract: A method, a system and a computer readable medium for providing information relating to a verification of a digital circuit. The verification may be formal verification and comprise formally verifying that a plurality of formal properties is valid for a representation of the digital circuit. The method comprises replacing at least a first input value relating to the representation of the digital circuit by a first free variable, determining if at least one of the plurality of formal properties is valid or invalid after replacing the first input value by the first variable and indicating if the at least one of the plurality of formal property is valid or invalid. The use of a free or open variable that has not determined value can be directly in the description or representation of the digital circuit. It is not necessary to insert errors or to apply an error model.

Abstract: Verification-result ranking techniques for root cause analysis are disclosed using violation report analysis and violation weighting. Violation reports are unwieldy and result from a variety of design and process checks. The check coverage can overlap, causing a specific violation to trigger multiple reported violations. High turn around times for violation report analysis increase the risk that selective violation analysis will inadvertently suppress real design bugs. This reduces the odds that static checker reports alone will meet design sign-off criteria. Determining relationships among a plurality of violations for a design permits clustering violations into hot spots. Identification of primary and subsequent contributors to the plurality of violations is based on the relationships among violations. The hot spot with the highest weight is identified, and then subsequent violations are identified to maximize violation coverage.

Abstract: A leakage power control vector is loaded into existing test scan chain elements for application to circuit elements of a circuit in which the leakage currents are to be controlled. The vector is designed to configure the circuit elements into states in which leakage currents are reduced. A multiplexer selects the power control vector for loading into the scan chain elements, and a clock generator clocks the configuration vector into the scan chain elements. A sleep mode detector may be provided to configure the multiplexer to select the power control vector and to operate the clock generator to clock the power control vector into the scan chain elements when a sleep mode of the circuit is detected.

Abstract: An electronic design automation system combines features of discrete EDA/CAD systems and manufacturing systems into a monolithic system to enable a layperson to efficiently design, construct and have manufactured a specific class of custom electronic device, namely a computer processing unit with embedded software. A Graphical User Interface (GUI) is provided as the front-end to a Computer Aided Design (CAD) server that generates sophisticated control and manufacturing instructions that are delivered to a fabrication supply chain, which produces a specified device that is then transported via managed logistics into inventory and ordering systems at vendors for delivery to a designated customer.

Abstract: A method of designing arrangement of through silicon vias (TSVs) in a stacked semiconductor device is provided The method includes: determining a plurality of TSV candidate grids representing positions, into which the TSVs are insertable, in each of a plurality of semiconductor dies stacked mutually and included in a stacked semiconductor device; creating a plurality of path graphs representing linkable signal paths for a plurality of signals transmitted through the stacked semiconductor device, respectively, based on the TSV candidate grids; determining initial TSV insertion positions corresponding to shortest signal paths for the signals based on the path graphs; and determining final TSV insertion positions by verifying the initial TSV insertion positions so that a plurality of signal networks corresponding to the shortest signal paths for the signals have routability.

Abstract: Embodiments relate to methods, computer systems and computer program products for performing a dielectric reliability assessment for an advanced semiconductor. Embodiments include receiving data associated with a test of a macro of the advanced semiconductor to a point of dielectric breakdown. Embodiments also include scaling the data for the macro down to a reference area and extracting a parameter for a Weibull distribution from the scaled down data for the reference area. Embodiments further include deriving a cluster factor (?) from the scaled down data for the reference area and projecting a failure rate for a larger area of the advanced semiconductor based on the extracted parameter, the cluster factor and the recorded data associated with the dielectric breakdown of the macro.

Abstract: To assist verification of a digital circuit design, a data processing system presents, within a graphical user interface of a display device, a presentation including a plurality of verification notifications arising from verification of a digital circuit design. The data processing system detects one or more user operations by which a user interacts with the plurality of verification notifications utilizing one or more user input devices and stores, in a memory, user operation information regarding the one or more user operations detected by the data processing system. The data processing system determines, based on said user operation information, a recommended subsequent user operation and presents, within the graphical user interface, an indication of the recommended subsequent user operation.

Abstract: The present patent document relates to a method and apparatus for more efficiently simulating a circuit design (DUT), making use of a hardware functional verification device such as a processor-based emulator. A set of linked databases are compiled for the DUT, one for hardware emulation (without timing information for the DUT) and one for software simulation (including timing information) that remain synchronized during runtime. The compiled design is run in a hardware emulator during an initialization/configuration phase and the state saved. The state is then swapped to a software simulator where timing information, such as SDF timing, may be honored during the second part of the run and the user's test bench stimuli applied to the design.

Abstract: A system, method, and computer program product are provided for applying a callback function to data values. In use, a plurality of data values and a callback function are identified. Additionally, the callback function is recursively applied to the plurality of data values in order to determine a result. Further, the result is returned.

Abstract: An apparatus includes a memory device that includes instructions for analyzing RTL code to determine congestion of a logic design without completing a synthesis phase of a chip design process. The instructions can include receiving RTL code, and identifying a statement in the RTL code. The instructions can include determining that the statement in the RTL code corresponds to a structured device group in a component library, wherein the structured device group includes logic devices configured to occupy an area in a predefined spatial arrangement and with predetermined connectivity between the logic devices. The instructions can include determining congestion associated with the structured device group by performing operations including determining a congestion figure. The instructions can also include providing, based on the congestion figure, an indication of the congestion associated with the structured device group.

Abstract: Systems and methods for generating compact models that include the effects of physical and electrical variations independent of available hardware data. A method includes generating a physics-based model using a technology computer-aided design (TCAD) of the one or more devices in a technology node. The method further includes deriving electrical parameters for the one or more devices from the physics-based model. The method further includes generating the compact model based on the derived electrical parameters.

Abstract: A method of determining if a layout design for fabricating a layer of features of an integrated circuit is N-colorable, comprising identifying a set of candidate cells among layout cells of a layout design. Each candidate cell of the set of candidate cells is one of the set of base layout cells, or one of the set of composite layout cells, and constituent layout cells of the one of the set of composite layout cells having been determined as N-colorable. Whether a first candidate cell of the set of candidate cell is N-colorable is determined. An abutment-sensitive conflict graph of the first candidate cell is generated when the first candidate cell is N-colorable and the first candidate cell is not the top layout cell.

Abstract: A method for determining an interface timing of an integrated circuit includes: reading a netlist file and a timing constraint file of the integrated circuit, and determining a first interface port of the netlist file according to the netlist file and the timing constraint file; determining a first transmission path and a load on the first transmission path between the first interface port and a specific circuit element in the netlist file; generating an interface circuit file according to the first transmission path and the load on the first transmission path; and calculating a first signal transmission time of the first transmission path out according to the interface circuit file.

Abstract: A method generally comprises arranging a plurality of layer combinations into a plurality of groups such that each of the layer combinations is assigned to at least one group. A shifting analysis is performed on a plurality of benchmark circuits for each of the groups. At least one tuning vector value is calculated based, at least in part, on a plurality of criteria vectors of the benchmark circuits. A shift is applied on each of the groups by the tuning vector value and a technology file, such as a 2.5 dimensional RC techfile, is regenerated.

Abstract: A method is disclosed that includes the operations outlined below. A first criteria is determined to be met when directions of a first current and a second current around a first end and a second end of a metal segment respectively are opposite, in which the metal segment is a part of a power rail in at least one design file of a semiconductor device and is enclosed by only two terminal via arrays. A second criteria is determined to be met when a length of the metal segment is not larger than a electromigration critical length. The metal segment is included in the semiconductor device with a first current density limit depending on the length of the metal segment when the first and the second criteria are met.

Abstract: The capacitance or inductance of electrical circuits is adjusted by measuring inductance or capacitance values of passive components fabricated on a first substrate, storing individual associations between the passive components and the respective measured values of the passive components, and determining electrical connections for the passive components based on the stored individual associations between the passive components and the respective measured values of the passive components.

Abstract: Methods and apparatuses to automatically modify a circuit design (e.g., a synthesis solution) according to the sensitivity in design parameters with respect to the possible deviation in the subsequent implementation (e.g., placement and routing) of the circuit. In one aspect of the present invention, a method to design a circuit includes: determining likelihood of a design constraint being violated in an implementation of a first circuit design (e.g., a technology specific netlist with or without a placement solution); and, modifying the first circuit design to reduce the likelihood of the design constraint being violated. In one example, the implementation of the first circuit design includes a routing solution for implementing the first circuit design; and, the first circuit is modified through sizing an instance of a logic element, buffering a signal, load shielding for a signal, or other operations.

Abstract: A viewer shows circuit design activities, displaying a signal, its corresponding trace, and the values of the trace over time. A global zoom-in, zoom-out, and zoom-fit are provided over the value display to adjust the time interval covered within the viewer. Non-linear manipulation of the traces within the viewer enables simultaneous zoomed in display of multiple time intervals, and zoomed out display of other time intervals. The non-linear manipulations may be performed within a same display region by designating zoom groups corresponding to the selection of a designated time period of activities of the circuit. Each zoom group may be scaled independently of other timer periods to zoom in or out of activities occurring within the designated time period. A list of behaviors may also be provided. Selection of a behavior generates a separate signal list for signals associated with the behavior and corresponding traces for enhanced debugging.

Abstract: A system and method tests for functional equivalence prior to automatically retiming a high-level specification. An Intermediate Representation (IR) includes one or more graphs or trees based on the high-level specification. A functional equivalence (FE) analyzer determines whether one or more components in the graph meet certain value and state conditions and thus is a candidate for retiming. A bounded scheduler then retimes only those components that pass the FE analysis.

Abstract: One embodiment relates to a method of achieving an circuit dimension which is greater than a size of an exposure field of an illumination tool. A first area of a first reticle field and a second area of a second reticle field are defined. An extension zone is created as a region outside the first area, and includes a first layout shape formed on a first design level. A corresponding forbidden zone is created for the second reticle field as a region inside the second area where no layout shape on the first design level is permitted. A second layout shape is formed on a second design level within the forbidden zone. The first and second areas are then abutted. Upon abutment of the first and second areas, the second layout shape overlaps the first layout shape to form a connection between circuitry of the first and second reticle fields.

Abstract: Methods and apparatus of performing layout-versus-layout (LVL) comparison are disclosed. A layout may be in various formats such as GDSII or OASIS, for different circuits, and represented by a basic layout element, a hierarchical cell or a plurality of independent cells in various layers. A basic layout element, a hierarchical cell, and a layout with a plurality of independent cells may have a signature generated according to the embodiment methods. The signature of a basic layout element may be generated based on values of a center and a circumference, and a hashed trace value generated by a hash function of a trace of the basic layout element. The signature of a hierarchical cell can be generated recursively. A signature of a first layout may be compared to a signature of a second layout to determine whether the first layout matches the second layout.

Abstract: According to an embodiment, a pattern data generation method is provided. In the pattern data generation method, when a resist on a substrate is exposed using a mask, an optical image at a designated resist film thickness position is calculated using a mask pattern. Feature quantity related to a shape of a resist pattern at the resist film thickness position is extracted, based on the optical image. Also, whether the resist pattern is failed is determined, based on the feature quantity, and pattern data of a mask pattern determined as failed is corrected.

Abstract: An approach is provided in which a model verification system partitions one of a design specification's circuit design properties into multiple unsolved cases. The model verification system then performs property checking on one of the unsolved cases against a corresponding circuit design model, which results in a property checked solved case and a subset of unsolved cases. In turn, the model verification system performs sequential equivalence checking on one or more of the subset of unsolved cases by checking their sequential equivalence against the property checked solved case. As a result, the model verification system stores the cases as sequentially equivalent solved cases and verifies of a portion of the design specification against a portion of the circuit design model.

Abstract: A design apparatus generates an optimal design condition by design space exploration. The apparatus including a source code parsing (301) which parses source code and generates a parse tree, a cluster generation task (302) which generates clusters based on the parse tree, each of the clusters including a group of source codes which can operate independently, a log file task (303) which generates a log file based on a structure of the cluster, and a comparison task (304) which compares a first log file of a previous cluster with a second log file of a current cluster and re-uses previous exploration result based on a comparison result, the first log file being obtained from a previous design space exploration, the second log file being generated from a current operation.

Abstract: In one embodiment, a method of designing an integrated circuit is disclosed, including receiving a plurality of top level timing constraints and a description of the integrated circuit design defining a hierarchy of partitions having multiple levels with one or more nested partitions; generating timing models for each partition of the plurality of partitions in response to the description of the integrated circuit design; and concurrently generating timing budgets level by level for all partitions at each level, beginning with the lowest level to each next upper level of the hierarchy of the partitions in response to the description of the integrated circuit design, the timing models, and the plurality of top level timing constraints. Please see the detailed description and claims for other embodiments that are respectively disclosed and claimed.

Abstract: A method for using computing equipment to perform timing analysis on an integrated circuit design includes identifying a timing arc of the integrated circuit design. The timing arc may be a clock path or a data path in the integrated circuit design. A probability of the timing arc may be obtained and an aging effect for the timing arc may be calculated. The aging effect of the timing arc is calculated based on the probability. The timing arc may include maximum and minimum delays that are adjusted based at least partly on the calculated aging effect on the timing arc.

Abstract: A method of making a semiconductor device includes arranging a first cell and a second cell, determining, by a processor, a first pattern density of a first cell, determining a second pattern density of a second cell, determining a pattern density gradient from the first pattern density to the second pattern density, determining whether the pattern density gradient exceeds a pattern density gradient threshold, and indicating a design change if the pattern density gradient exceeds than the pattern density gradient threshold.

Abstract: The present disclosure relates to an arrangement and a method of performance-aware buffer zone placement for a high-density array of unit cells. A first feature density of the array is measured and maximum variation for a parameter within a unit cell is determined. A look-up table of silicon data is consulted to predict a buffer zone width and gradient value that achieves a variation that is less than the maximum variation for the unit cell. The look-up table contains a suite of silicon test cases of various array and buffer zone geometries, wherein variation of the parameter within a respective test structure is measured and cataloged for the various buffer zone geometries, and is also extrapolated from the suite of silicon test cases. A buffer zone is placed at the border of the array with a width that is less than or equal to the buffer zone width.

Abstract: An approach is provided in which a model verification system partitions one of a design specification's circuit design properties into multiple unsolved cases. The model verification system then performs property checking on one of the unsolved cases against a corresponding circuit design model, which results in a property checked solved case and a subset of unsolved cases. In turn, the model verification system performs sequential equivalence checking on one or more of the subset of unsolved cases by checking their sequential equivalence against the property checked solved case. As a result, the model verification system stores the cases as sequentially equivalent solved cases and verifies of a portion of the design specification against a portion of the circuit design model.

Abstract: A system and method of designing an integrated circuit capable of deriving timing constraints for individual block-level circuits of an integrated circuit that are derived from the chip-level timing constraints and analysis. The block-level timing constraints are in the form of one or more logical timing constraint points at the input and output ports of block-level circuits. Each logical timing constraint points specifies a clock source used to clock data through the port, a delay parameter specifying data propagation delay backward from an input port and forward from an output port, and any timing exception associated with the data path. Using the logical timing constraint point, the circuit design system performs independent timing analysis and optimization of each block-level circuit. The system then reassembles the block-level circuits into a modified chip-level circuit for which timing closure can be achieved.

Abstract: A system and method of producing an integrated circuit using abutted cells having shared polycrystalline silicon on an oxide definition region edge (PODE) includes modeling inter-cell leakage current in a plurality of different cells. Each of the plurality of different cells is abutted with another cell and having the shared PODE. The method also comprises verifying a pre-determined acceptable power consumption of the integrated circuit based on the inter-cell leakage current.

Abstract: A computer-implemented method for generating a layout of a design includes invoking the computer to receive a schematic representation of the design, generating a connection graph associated with the design, comparing the connection graph with a plurality of connection graphs stored in a database and selecting a layout associated with the matching connection graph in generating the layout of the design.

Abstract: A datapath extraction tool uses machine-learning models to selectively classify clusters of cells in an integrated circuit design as either datapath logic or non-datapath logic based on cluster features. A support vector machine and a neural network can be used to build compact and run-time efficient models. A cluster is classified as datapath if both the support vector machine and the neural network indicate that it is datapath-like. The cluster features may include automorphism generators for the cell clusters, or physical information based on the cell locations from a previous (e.g., global) placement, such as a ratio of a total cell area for a given cluster to a half-perimeter of a bounding box for the given cluster.

Abstract: A method for checking the inter-chip connectivity of a three-dimensional (3D) integrated circuit (IC) generally comprises receiving a design file for each of a plurality of chips of the 3D IC and generating a plurality of inter-layer ports to be shared between at least two of the of chips based on the design files for each of the chips. A layout without the share ports for each of the chips based on the design files for each of the chips is generated and a layout versus schematic (LVS) check is conducted for each of the generated layouts by using the identified inter-layer ports.

Abstract: The present disclosure relates to a method of performing an optical proximity correction (OPC) procedure that provides for a high degree of freedom by using an approximation design layer. In some embodiments, the method is performed by forming an integrated chip (IC) design having an original design layer with one or more original design shapes. An approximation design layer, which is different from the original design layer, is generated from the original design layer. The approximation design layer is a design layer that has been adjusted to remove features that may cause optical proximity correction (OPC) problems. An optical proximity correction (OPC) procedure is then performed on the approximation design layer. By performing the OPC procedure on the approximation design layer rather than on the original design layer, characteristics of the OPC procedure can be improved.

Abstract: Effective timing and power characterization flows are described for asynchronous circuits. Verification can be provided for both relative-timing constraints as well as performance (e.g., throughput) targets using commercially-standard STA tools. Fully-automated scripts are developed that verify all relative timing assumptions (e.g., isochronic forks) as well as the gate-level performance of any circuit designed with these templates. Library characterization can be utilized and asynchronous logic cells not found in standard-cell libraries, such as dual-rail domino logic and dynamic C-elements with staticizers, can be characterized in terms of both their timing and power. These values are a function of both input slew and output load and are preferably captured in an industry standard format, such as the Liberty™ file format, before being compatible with commercial STA tools.

Abstract: Provided is a method of assigning a first set of probe pads to an interposer for maximizing a defect coverage for the interposer. The interposer includes a second set of nets and the defect coverage is based on a ratio between a tested net length and an overall net length. The method includes processing the second set such that every net interconnecting more than two micro-bumps is divided into a plurality of nets and every two of the more than two micro-bumps are interconnected by one of the plurality of nets. The method further includes calculating an untested length of each net in the second set; selecting a first net from the second set with the maximum untested length; selecting two probe pads from the first set based on a user-defined cost function; and connecting the two probe pads to the first net with two dummy nets.

Abstract: A design support method includes: selecting, by a computer, a power feed point of an integrated semiconductor circuit on a first board model in which a power supply layer and a ground layer are stacked; determining a first placement position of a first protrusion portion from the first board model on a side of the first board model, the first protrusion portion being corresponding to the power feed point; determining a second placement position of a second protrusion portion from the first board model on the side of the first board model, the second protrusion portion provided so as to separate from the first placement position by a distance; and placing the first protrusion portion and the second protrusion portion on the first placement position and the second placement position, respectively.

Abstract: A method for estimating delay deterioration in an integrated circuit comprising estimating degradation in at least one characteristic of each device defined within the integrated circuit using voltages and logic values monitored during a simulation of the digital circuit. Generating an end-of-life netlist in which the at least one device characteristic of each device has been modified to reflect the estimated degradation or estimating a change in timing delay of each device directly from the estimated degradation of the at least one characteristic of each device. A timing analysis is performed using the estimated change in timing delay of each device to determine circuit path delays. The timing analysis is static or statistical.

Abstract: A method of assigning layout patterns includes identifying a first set of layout patterns of a current layout design that is new or has been modified in comparison with a reference layout design. A second set of layout patterns of the current layout design is identified. A member of the second set of layout patterns that is not a member of the first set of layout patterns has a distance, less than a predetermined threshold distance, to at least another member of the second set of layout patterns. A third set of layout patterns is not modified in comparison with the reference layout design. The third set of layout patterns is assigned to a plurality of masks according to the reference pattern-assigning result.

Abstract: A system, method, and computer program product is disclosed for performing electrical analysis of a circuit design. A voltage-based approach is described for performing two-stage transient EM-IR drop analysis of an electronic design. A two-stage approach is performed in some embodiments, in which the first stage operates by calculating the voltage at certain interface nodes. In the second stage, simulation is performed to simulate the circuit to concurrently obtain the current at the interface nodes. In some embodiments, multiple adjacent devices as identified as interface devices for purposes of the analysis. One situation where it may be useful to analyze a larger portion of the circuitry in this way where the analysis is being performed on a netlist having a power gate.

Abstract: A circuit analysis device includes: a processor configured to execute a procedure by: calculating, for power supply noise included in a power supply voltage supplied to a semiconductor memory device, variation characteristics of an electric potential relative to the power supply voltage in a specific memory cell included in a memory cell array; calculating power supply noise of a power supply system that occurs when a current is supplied to an equivalent circuit of the power supply system under a predetermined condition, the power supply system including a power supply line and an element for supplying a power supply voltage from a voltage source to a semiconductor device; calculating, from the variation characteristics, the electric potential obtained when the power supply noise is equal to a specific magnitude; and determining, by comparing the calculated electric potential with a threshold, whether memory latch-up will occur in the specific memory cell.

Abstract: A set of nets in an integrated circuit design, having a timing margin and traverse routing tiles, are identified. The set of nets are assigned a utilization metric based on the traversed routing tiles. A set of sparse nets are determined from the set of nets, based on the utilization metric of each net in the set of sparse nets. One or more target nets are selected from the set of sparse nets, based on the timing margin of the target nets. The target nets may be modified.

Abstract: A method, apparatus and product for detecting corresponding paths in combinationally equivalent circuit designs. The method comprising: obtaining a first circuit design and a second circuit design, the first and second circuit designs have corresponding sets of input and output elements; obtaining a path in the first circuit design, the path commencing in an input element and ending in an output element, wherein the input element and the output element are connected by combinational logic elements; automatically extracting, by a computer, a sensitization function of the path in the first circuit design; and automatically determining, by the computer, one or more paths in the second circuit design which are sensitized by the sensitization function of the path.

Abstract: An aspect of the present invention replaces memory elements in a scan chain with corresponding new (memory) elements, with each new element having two paths to provide the corresponding data output. One of the two paths is operable to connect the data value to the combinational logic only during a capture phase of said test mode, and the second path is operable to connect the data value to the next element in the chain during a shift phase of said test mode. As a result, unneeded transitions/evaluations in the combinational logic are avoided during shift time, thereby reducing the resource requirements in the corresponding duration. However, the further processes (including various design phases and fabrication) are continued based on the original data (i.e., without the new elements) such that unneeded delays are avoided during the eventual operation in functional mode of the various fabricated IC units.

Abstract: The invention provides techniques and apparatuses for generating a hierarchical representation of the power behavior of an electronic design. In some implementations, a flat finite state machine, representing the power behavior of an electronic design is extracted from the power specification for the electronic design. Subsequently, a hierarchical finite state machine representation for the power behavior is generated from the flat finite state machine, the power specification and the logical specification.

Abstract: Methods for standard cells using finFET standard cell structures with polysilicon on OD edges. Standard cells are defined using finFET transistors and having gate structures forming a transistor at an intersection with a semiconductor fin. Polysilicon dummy structures are formed on the edges of the active areas or OD areas of the standard cells. In a design flow, a pre-layout netlist schematic for the standard cells includes a three terminal MOS device corresponding to the polysilicon dummy structure on the edges of the standard cell. After an automated place and route process forms a device layout using the standard cells, a post layout netlist is extracted. Where two standard cells abut one another, a single polysilicon dummy structure is formed on the common boundary. A layout versus schematic comparison is then performed comparing the pre-layout netlist and the post-layout netlist to verify the layout obtained. Additional methods are disclosed.

Abstract: A method of checking an integrated circuit design database includes providing the integrated circuit design stored in a storage media; providing application rules; and providing an instance abstract of instances of libraries and IP(s). Instance-level information is extracted from the integrated circuit design database. An application-rule check is performed against the instance-level information using the information provided in an abstract file.

Abstract: A system, method, and computer program product for automatically providing circuit designers with verification coverage information for analog/mixed-signal circuit designs. A graphical user interface based environment allows circuit designers to assemble a schematic representation of a lower-level circuit design from pre-defined building blocks and various types of connections. Embodiments convert the schematic representation into a behavioral model for rapid simulation. Building blocks in the behavioral circuit have coverage-related terms defined either by the designer or by default, such as input and output value ranges, internal state changes, and state timers and timing-related constraints. Embodiments simulate the behavioral circuit, and determine and tangibly output coverage-related information. Manual and automatic behavioral circuit and stimulus modification can maximize coverage for improved behavioral circuit verification.

Abstract: A method for the automatic design of an electronic circuit includes operations for evaluation of the thermal effects in the electronic circuit. The method generates a layout of the electronic circuit. Abstract data at the substrate level associated to the layout of the electronic circuit is then generated. A grid of partitioning is generated with respect to a view regarding the aforesaid abstract into meshes and nodes. The grid is applied to the substrate. On the basis of the grid (TG), a list of nodes or netlist representing a thermal network that represents the thermal behavior of the substrate or of its portions or elements is extracted. The netlist is useful in simulation operations, in particular of a SPICE type, for making an evaluation of thermal effects in the electronic circuit.