Particular Type Of Scanning Probe Microscopy [spm] Or Microscope; Essential Components Thereof (epo) Patents (Class 850/21)
- Scanning Tunnelling Microscopy [STM] combined with Atomic Force Microscopy [AFM](EPO) (Class 850/23)
- Scanning Near-field Optical Microscopy [SNOM] combined with Atomic Force Microscopy [AFM] (EPO) (Class 850/24)
- Magnetic Force Microscopy [MFM] combined with Atomic Force Microscopy [AFM] (EPO) (Class 850/25)