Elastic membrane for semiconductor wafer polishing apparatus

- Ebara Corporation
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Description

FIG. 1 is a bottom view of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;

FIG. 2 is a top view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a right side view thereof;

FIG. 5 is a rear view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a perspective view, observed from above thereof enlarged for ease of illustrations;

FIG. 8 is a cross-section view taken along the line 88 of FIG. 2 thereof;

FIG. 9 is a enlarged view of part 9 of FIG. 8 thereof;

FIG. 10 is a bottom view thereof;

FIG. 11 is a top view thereof;

FIG. 12 is a front view thereof;

FIG. 13 is a right side view thereof;

FIG. 14 is a rear view thereof;

FIG. 15 is a left side view thereof;

FIG. 16 is a perspective view, observed from above thereof enlarged for ease of illustrations;

FIG. 17 is a cross-section view taken along the line 1717 of FIG. 11 thereof;

FIG. 18 is a enlarged view of part 18 of FIG. 17 thereof;

FIG. 19 is a bottom view thereof;

FIG. 20 is a top view thereof;

FIG. 21 is a front view thereof; (rear view is omit since it is identical with the front)

FIG. 22 is a right side view thereof; (left side view is omitted since it is identical with the right side view)

FIG. 23 is a perspective view, observed from above thereof enlarged for ease of illustrations;

FIG. 24 is a cross-section view taken along the line 2424 of FIG. 20 thereof; and,

FIG. 25 is a enlarged view of part 25 of FIG. 24 thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for an elastic membrane for semiconductor wafer polishing apparatus, as shown and described.

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Patent History
Patent number: D634719
Type: Grant
Filed: Feb 25, 2010
Date of Patent: Mar 22, 2011
Assignee: Ebara Corporation (Tokyo)
Inventors: Hozumi Yasuda (Ohta-ku), Keisuke Namiki (Ohta-ku), Makoto Fukushima (Ohta-ku), Osamu Nabeya (Ohta-ku), Koji Saito (Ohta-ku), Satoru Yamaki (Ohta-ku), Tomoshi Inoue (Ohta-ku), Shingo Togashi (Ohta-ku), Tetsuji Togawa (Ohta-ku)
Primary Examiner: Selina Sikder
Attorney: Sughrue Mion, PLLC
Application Number: 29/356,450