Abstract: A semiconductor device and a method for manufacturing the same are provided. A gate insulating film is formed under a vacuum condition to prevent deterioration of reliability of the device due to degradation of a gate insulating material and to have stable operating characteristics. The semiconductor device includes an element isolating film formed at element isolating regions of a semiconductor substrate, which is divided into active regions and the element isolating regions; a gate insulating film having openings with a designated width formed at the active regions of the semiconductor substrate; gate electrodes formed on the gate insulating film; and lightly doped drain regions and source/drain impurity regions formed in the surface of the semiconductor substrate at both sides of the gate electrodes.
Abstract: A method for forming an isolation structure of a flash memory device includes providing a substrate structure where a tunnel insulating layer, a conductive layer, and a padding layer are formed, etching the padding layer, the conductive layer, the tunnel insulating layer and the substrate to form a trench, forming a first insulating layer over the substrate structure and filling in a portion of the trench, forming a second insulating layer over the substrate structure, forming a third insulating layer over the substrate structure to fill the trench, polishing the first, second and third insulating layers using the padding layer as a polish stop layer, removing the padding layer and simultaneously recessing the third insulating layer to protrude the first and second insulating layers, and etching the first and second insulating layers while recessing the third insulating layer to form a protective layer on sidewalls of the conductive layer.
Abstract: Interconnect structures with polygonal cell structures. An exemplary interconnect structure comprises a substrate and a first dielectric layer, overlying the substrate and exposing a conductive feature formed therethrough and connected with the substrate, wherein the first dielectric layer includes a plurality of polygon cell structures with hollow interior.
Abstract: A method (and structure) that selectively forms a dielectric chamber on an electronic device by forming a dummy structure over a semiconductor substrate, depositing a dielectric layer over the dummy structure, forming an opening through the dielectric layer to the dummy structure, and removing the dummy structure to form the dielectric chamber.
Type:
Grant
Filed:
May 16, 2005
Date of Patent:
December 11, 2007
Assignee:
International Business Machines Corporation
Inventors:
George C. Feng, Louis L. Hsu, Rajiv V. Joshi
Abstract: A thin film transistor (TFT) substrate includes a glass substrate, a thin film transistor, an electrode pad, and a conductive bump. The TFT and the electrode pad are formed on the glass substrate, and the electrode pad is used for electrically connecting with the thin film transistor. The conductive bump includes several insulating bumps and a conductive layer. The insulating bumps are formed on the electrode pad dividedly, and the conductive layer covers the top surfaces of the insulating bumps, the inward surfaces of the insulating bumps, and the electrode pad between the insulating bumps for electrically connecting with the electrode pad. The outward side surfaces of the insulating bumps are exposed out of the conductive layer.
Abstract: To change a plurality of trenches to one flat empty space by two-dimensionally forming the trenches on the surface of a semiconductor substrate and then applying heat treatment to the semiconductor substrate.
Abstract: A dielectric wiring structure and method of manufacture therefor. The wiring structure includes air dielectric formed in a hemisphere. The wiring structure also includes, in embodiments, a method of simultaneously forming a MEMS structure with a transistor circuit using substantially the same steps. The MEMS structure of this embodiment includes freestanding electrodes which are not fixed to the substrate.
Type:
Grant
Filed:
May 9, 2000
Date of Patent:
May 1, 2007
Assignee:
International Business Machines Corporation
Abstract: Methods relating to forming interconnects through injection of conductive materials, to fabricating semiconductor component assemblies, and to resulting assemblies. A semiconductor component substrate, such as a semiconductor die or other substrate, has dielectric material disposed on a surface thereof, surrounding but not covering interconnect elements, such as bond pads, on that surface. A second semiconductor component substrate, such as a carrier substrate with interconnect elements such as terminal pads, is adhered to the first semiconductor component substrate, forming a semiconductor package assembly having interconnect voids between the corresponding interconnect elements. A flowable conductive material is then injected into each interconnect void using an injection needle that passes through one of the substrates into the interconnect void, forming a conductive interconnect between the bond pads and terminal pads of the substrates.
Abstract: Structure and method are provided for forming a bipolar transistor. As disclosed, an intrinsic base layer is provided overlying a collector layer. A low-capacitance region is disposed laterally adjacent the collector layer. The low-capacitance region includes at least one of a dielectric region and a void disposed in an undercut underlying the intrinsic base layer. An emitter layer overlies the intrinsic base layer, and a raised extrinsic base layer overlies the intrinsic base layer.
Type:
Grant
Filed:
March 29, 2004
Date of Patent:
March 13, 2007
Assignee:
International Business Machines Corporation
Inventors:
Hiroyuki Akatsu, Rama Divakaruni, Marwan Khater, Christopher M. Schnabel, William Tonti
Abstract: A center beam which is formed out of a thin film constituted to be combined with a light reflection film provided on one surface of the center beam, which has both ends fixed and which is deformed by an electronic force; a substrate electrode which is opposed to the center beam through a gap formed on the other surface of the center beam; an opposed surface which is a surface of the substrate electrode opposed to the center beam modulating the incident light on the light reflection film, the opposed surface restricting deformation of the center beam due to application of a driving voltage to the substrate electrode by abutting on the center beam; and a substrate which has the substrate electrode having the opposed surface, formed in a concave section, and which holds a to-be-held section of the center beam, are provided.
Abstract: A STI (shallow trench isolation) structure is formed with a liner layer that is converted from an initial material to a subsequent material. For example, the liner layer is initially comprised of nitride during wet etch-back of a dielectric fill material comprised of oxide to protect an oxide layer on a semiconductor substrate. Thereafter, an exposed portion of the liner layer is converted into the subsequent material of oxide to protect the dielectric fill material within the STI opening during etching away of masking layers to prevent formation of dents in the STI structure.
Abstract: Provided is a method for manufacturing a nano-gap electrode device comprising the steps of: forming a first electrode on a substrate; forming a spacer on a sidewall of the first electrode; forming a second electrode on an exposed substrate at a side of the spacer; and forming a nano-gap between the first electrode and the second electrode by removing the spacer, whereby it is possible to control the nano-gap position, width, shape, and etc., reproducibly, and manufacture a plurality of nano-gap electrode devices at the same time.
Type:
Application
Filed:
August 28, 2006
Publication date:
December 28, 2006
Inventors:
Chan Park, Sung Choi, Sang Ryu, Han Yu, Ung Pi, Tae Zyung
Abstract: A semiconductor device includes a semiconductor substrate, cavities, and an element isolating region. The cavities, which are each shaped like a flat plate, are made in the semiconductor substrate. The element isolating region is formed in the surface of the semiconductor substrate and located at the sides of the cavities.
Abstract: The present invention provides a metallization scheme, a method for manufacturing the metallization scheme, and an integrated circuit including the metallization scheme. In one aspect, the metallization scheme (300) includes a protective layer (320) located over a substrate (310), and a conductive layer (330) located over the protective layer (320). The metallization scheme (300) further includes a stress-reducing low-modulus material (340) located between the protective layer (320) and the conductive layer (330).
Abstract: Methods and compositions are described for liquid or gel forms of a lipid excipient to be used in pharmaceutical or cosmetic preparations. The lipid excipient comprises a phospholipid such as a lysophospholipid, for example, mono-oleoyl-phosphatidylethanolamine ("MOPE"). Relatively low concentrations of the lipid can be employed in forming the gel, e.g., about 1-2%. The invention discloses the use of a lipid delivery system at a relatively low lipid concentration as a non-toxic, non-irritating carrier or excipient alone or in combination with other agents, for both drugs and cosmetics. For example, the lipid excipient in sprayable or droppable form has special utility in the non-irritating delivery of peptides (e.g., calcitonin and insulin) to the nasal mucosa, due to the ability of the excipient to enhance absorption across nasal membranes. As a cosmetic, it can be used alone or in combination with biologically active agents.