Abstract: Various tester configurations are provided that injects test signals into nets (e.g. 24). Non-linear characteristics of the response are detected (e.g. harmonics, do offset) and used to assess the adequacy or otherwise of device connections in the net.

Abstract: A high-voltage generator of an X-ray apparatus comprises a high-voltage measurement device. The measurement device comprises a compact component comprising both the measurement resistor and a film capacitor used both to protect said resistor and eliminate the parasitic effects induced by parasitic capacitances of the generator. The film capacitor is made in insulating films by a sequence of metallized strips and insulating strips. The films are positioned relative to one another in such a way that the film capacitor is formed by series-mounted discrete capacitors. To this end, between two successive films, the width of the bottom strips of the film crosses two metallized strips of the top film.

Abstract: A linear heater control circuit has a more linear relationship between sensed temperature and a variable resistance. As the user adjusts the variable resistance, the temperature increases linearly rather than abruptly. The linear control circuit has a parallel resistor that is in parallel with the variable resistor and one or two series resistors that are in series with the variable resistor. The tap of the variable resistor is input to a comparator that compares the tap voltage to a reference voltage and adjusts a trigger to a Silicon-Controlled Rectifier (SCR). The SCR switches AC current to a heating element to increase its temperature. When the SCR switches off, temperature sensing is performed using a voltage network that includes the parallel resistor and the variable resistor. A switch or diode isolates the voltage network from the heating element during heating to protect the comparator.

Abstract: A system for accelerating circuit measurements includes a circuit. A signal is applied to the circuit. A set of measurements is taken of a response of the circuit to the applied signal. The system includes a circuit model. The circuit model is a representation of the circuit. A final value of the response of the circuit is determined utilizing the circuit model in accordance with the set of measurements. A stimulus signal is generated in accordance with the final value for driving the circuit model to the final value. The system includes a stimulus generator in communication with the circuit. The stimulus generator is configured to apply the stimulus signal to the circuit. The stimulus signal is configured to accelerate the response of the circuit to reach the final value.

Abstract: A measuring device and a measuring method for non-destructive testing of an ignitor installed in a subassembly, particularly of a motor vehicle. The device and measuring method generate a measuring current with a predefined value, check-test the predefined value of the measuring current while bypassing the ignitor, apply the check-tested measuring current to the subassembly with the installed ignitor for a predefined time interval, determine the internal resistance of the subassembly with the installed ignitor, and derive a test signal indicating the installation condition based on a comparison with a setpoint value.

Abstract: A gas concentration detection apparatus includes a series-connected combination of a sensor element and a resistor, with an AC voltage being applied to one of the outer terminals of that combination and with the other outer terminal being held at a fixed potential. A DC voltage signal at a level determined by an oxygen concentration that is detected by the sensor element, and an AC voltage signal at an amplitude determined by sensor element impedance and hence by the sensor element activation status, are extracted from the series-connected combination by respectively separate circuits which apply separately determined amplification factors.

Abstract: Diamond look-alikes like cubic zirconium, moissanite and other synthetic stones, are distinguishable from nature diamonds based on their thermal and/or electrical conductivities. Germ testers that are on the market are capable of evaluating these two parameters as is the present invention. Electrical resistance of moissanites reaches hundreds of thousands megohms. Existing gem esters use test voltage of 1000 volts, to be able to detect electrical conductivity in most moissanites. Still, reliable detection of high resistance moissanites is difficult. Proposed invention uses significant photo conductivity of moissanites, which was observed by the inventors, to facilitate measurement of electrical conductivity in the toughest gems, to reduce test voltage applied to gems to 300 volts, and to limit electrical test current through a gem to no more than a few micro-amps.

Abstract: A current sensing circuit for sensing a current flowing through a LED bank and a driver circuit for driving the LED bank are provided. The current sensing circuit comprises: a matched transistor group, having a first current path coupled to the load device for sensing the load current and a second current path for generating a first current according to the load current; an operation amplifier, coupled to the first and second current paths; and a current source, having a third current path coupled to the second current path and a fourth current path for generating a second current according to the first current, the second current indicating conductive condition of the load device.

Abstract: A method of determining impedance comprising: supplying power to a powered device from a power sourcing equipment at a first current limited level, Ilim1; measuring, at a plurality of times a voltage associated with the output of the power sourcing equipment; determining a minimum voltage, Vmin1, of the measured plurality of voltages; determining an associated time of the determined Vmin1; removing the supplied power from the powered device; subsequent to the removing, supplying power to the powered device from the power sourcing equipment at a second current limited level, Ilim2, the Ilim2 being different than the Ilim1; measuring, at the determined associated time in relation to the beginning of the supplying power at the Ilim2, a voltage associated with the output of the power sourcing equipment, Vmin2; and determining an impedance responsive to the Vmin1, Vmin2, Ilim1 and Ilim2.

Abstract: A voltage-impressed current measuring apparatus, wherein the voltage from a direct-current power supply portion is impressed on the terminal of a device under test via a range switching portion and the current flowing in the same terminal is measured; wherein the range switching portion has a plurality of current buffers with switches corresponding to current measurement ranges, and a plurality of current measurement resistances respectively connected in series to the output sides of the same; and wherein the current flowing in the terminal of the device under test is measured by measuring the voltage across both ends of the current measurement resistance of the selected series connection, by a voltage difference measuring portion. Each current buffer with switch has an output stage capable of connection/disconnection in response to a control signal.

Abstract: A circuit arrangement for detecting a load current through a load includes a main transistor, a sensing transistor through which a load current flows that is a measure of the load current flowing through the main transistor. In addition, a resistance is connected in series with the load path of the sensing transistor, and a current source is connected to a node arranged between the sensing transistor and the resistance. A detector detects the load current flowing through the main transistor by measuring the voltage across the resistance.

Abstract: A method of measuring impedance of a pH electrode is provided. A test current is applied to the pH electrode for a time duration that is less than 50 percent of a time constant that is associated with electrical characteristics of the pH electrode. A voltage response of the pH electrode is measured when the test current is applied to the pH electrode. An impedance of the pH electrode is calculated as a function of the voltage response.

Abstract: An on-chip signal waveform measurement apparatus mounted on an IC chip measures signal waveforms at detection points on the IC chip. A reference voltage generator successively generates reference voltages different from each other based on a predetermined timing signal, and Signal probing front-end circuits are mounted to correspond to the detection points, respectively, and each buffer-amplifies a voltage at each detection point, compares the buffer-amplified voltage with each reference voltage, and digitizes a comparison result into a binary digital output signal. A multiplexer time-division-multiplexes the binary digital output signals from the signal probing front-end circuits. A data processing unit calculates a judgment output probability for a detected voltage at each detection point detected by the respective signal probing front-end circuits, by counting a number of times of a predetermined binary value of the multiplexed binary digital output signal.

Abstract: A current sensor includes a busbar, a case, a connector, and a bare chip having a current detection circuit. The busbar has a crimp terminal at one end, a ring terminal at the other end, and a shunt resistor welded between the crimp and ring terminals. The shunt resistor is encapsulated in the case, and the busbar has an electrode exposed to a sealed inner room of the case. The connector has a connector body unitary with the case and has a connector terminal that is exposed to the inner room at one end and exposed to an outside of the connector body at the other end. The bare chip is arranged in the inner room of the case and wire-bonded to each of the busbar and the connector terminal.

Abstract: A real-time load current detecting circuit composed of a power supply circuit, a delay circuit, a current sensing circuit, and a current feedback circuit. The power supply circuit is adapted for providing the CPU with a power source. The delay circuit includes a resistor and a capacitor, connected to the power supply circuit. The current sensing circuit includes a comparison circuit connected to the delay and power supply circuits. The current feedback circuit includes a feedback current source and a resistor, connected to the current sensing circuit. The feedback current source is adapted for mirroring a current sensed by the current sensing circuit. In light of this, the current can be accurately monitored and detected and there is hardly inaccuracy for the detection of the current.

Abstract: An offset voltage measuring apparatus includes an offset voltage measuring unit including a plurality of measurement nodes having a current variation in response to a feedback voltage. An offset voltage amplifying unit outputs an output voltage amplified in response to an output signal of the offset voltage measuring unit, changes feedback voltage in response to a change in the output voltage and feeds back the feedback voltage to the offset voltage measuring unit.

Abstract: Apparatus and methods of adjusting system efficiency for a current-consuming system are disclosed. In the disclosed apparatus, a system current detector receives a system current from the current-consuming system and calculates a system current variation accordingly. A system efficiency adjustment module is coupled to the system current detector to receive the system current variation and output a frequency control signal and a voltage control signal accordingly.

Abstract: A reduced number of voltage regulator modules provides a reduced number of supply voltages to the package. The package includes a voltage plane for each of the voltage regulator modules. Each core or other component on the die is tied to a switch on the package, and each switch is electrically connected to all of the voltage planes. A wafer-level test determines a voltage that optimizes performance of each core or other component. Given these voltage values, an engineer may determine voltage settings for the voltage regulator modules and which cores are to be connected to which voltage regulator modules. A database stores voltage setting data, such as the optimal voltage for each component, switch values, or voltage settings for each voltage regulator module. An engineering wire may permanently set each switch to customize the voltage supply to each core or other component.

Abstract: A method for testing effectiveness of a cathodic protection device configured to apply at least one voltage across an underground structure and a reference point is described. The method includes providing a sample of the material from which the underground structure is fabricated, placing the sample proximate the underground structure, electrically connecting the sample to the underground structure through a switch, operating the switch at predetermined intervals, and measuring electrical characteristics of the sample at intervals based at least partially on the predetermined intervals and a position of the switch.

Abstract: A voltage drop measurement circuit includes a voltage drop circuit to generate an output voltage and fluctuate the output voltage according to a fluctuation in a power supply voltage, where the output voltage being the power supply voltage dropped by a predetermined amount and a flip-flop to retain a flag indicating a drop in the power supply voltage according to the output voltage.

Abstract: A circuit for detecting an electric current by which a loss portion of a forward current caused by a backward leakage current of a diode generated by the influence of temperature increase can be compensated such that error in the peak value of a load current detected by surrounding high temperature can be minimized, and reliability can be increased for electric instruments that call for an accurate control of the load current and that generate a high temperature such as induction heating cookers, induction heaters and the like.

Abstract: A device for identifying individual cables communicating between many remote locations to one central location using the building AC ground circuit to communicate between the remote location and the central location. The device includes a plurality of tubes adapted to engage individual cables and corresponding light-emitting diodes (LED) adjacent to each tube. A needle in the tube provides communication with the wire of the insulated cable. A remote interconnection cable provides connection between cable remote ends, and the building ground circuit concurrently providing a means to prevent engagement with the energized AC circuits.

Abstract: A sensor interface circuit is provided to interface many sensors simultaneously in a simple circuit arrangement consisting of two parts. Sensors in both parts operate under identical constant voltage. The circuit provides higher front end sensitivity than the Wheatstone bridge, with temperature compensation from all sensors. The circuit also can provide output zeroing to obtain high resolution measurements. The invention can be used as a unique constant voltage anemometer with auto zeroing, and with much higher sensitivity than related devices. Further, in the constant voltage anemometer embodiment, the time constant and the overheat of the hot-wire/hot-film can be measured in true in situ mode under actual test conditions. In another embodiment, the circuit can be used to measure dynamic capacitance from capacitance sensors, without any effect of associated cable capacitance.

Abstract: A current sensing circuit for sensing the current through a main switch, such as the PMOS or NMOS switches of a switching regulator, is disclosed. The circuit includes a mirror switch, said mirror switch being substantially similar to said main switch but with a smaller aspect ratio, a difference amplifier for ensuring that the voltage across said first leg and across said second leg are substantially equal and thereby to derive from said mirror switch a sensing current nominally equal to a current flowing in said main switch divided by a sensing ratio, a current source for producing a quiescent current in said difference amplifier and a compensatory device for compensating for said quiescent current such that said current sensing circuit can sense currents in the main switch which are smaller than the quiescent current multiplied by the sensing ratio. The compensatory device may be one or two switches essentially similar to the mirror switch.

Abstract: The present invention provides a high-voltage measuring device capable of providing sufficient electric isolation between resistors and between resistors and a voltage measurement circuit without necessity of enlarging a size of a substrate for carry thereon the circuit. A high-voltage measuring device mounted on a substrate, including a high-voltage input terminal pair, a measuring terminal pair, a voltage measuring circuit having input terminals connected to the measuring terminal pair, and two resistive parts. One of the resistive parts electrically connects one of high-voltage input terminal pair and one of measuring terminal pair. The other of resistive parts electrically connects between the other of high-voltage input terminal pair and the other of measuring terminal pair.

Abstract: A method for characterizing the current as a function of applied electric field for a resistor exposed to a high electric fields is described. The method uses current versus voltage measurements at low electric fields, where the resistor is not damaged and the current does not saturate. An example illustrating the importance of such resistor characterization is provided.

Abstract: First, second, and third semiconductor switches are connected in series between input and output terminals and first and second voltage application circuits are connected in parallel to first and third semiconductor switches, whereby providing a semiconductor switch circuit. Each voltage application circuit comprises a first or second voltage application semiconductor switch connected at the output side thereof with a first or second direct current amplifier having a gain state of approximately +1 and whose input side is connected to the input or output terminal. One end of the first or second voltage application semiconductor switch is connected to a first junction of the first and second semiconductor switches, or to a junction of the second and third semiconductor switches, respectively.

Abstract: A device includes a light emitter, a current sensing resistance, a current generator, and detection circuitry. The current generator is connected to the light emitter and to the current sensing resistance. During a normal operating mode of the device, the current generator regulates current flow through the light emitter. In a test mode, the current generator regulates current flow through the current sensing resistance. The detection circuitry, during the test mode, detects when current flow through the current sensing resistance is outside an expected range.

Abstract: A voltage/current (V/I) source includes circuitry having first, second, third and fourth nodes, a first current source electrically connected to the first node, a second current source electrically connected to the second node, where the third and fourth nodes are between the first and second nodes, and an operational amplifier (op-amp) having an output, an inverting input, and a non-inverting input. The output is electrically connected to the third node, and the non-inverting input is electrically connected to a voltage source. A feedback line is between the fourth node and the inverting input.

Abstract: A system for detecting a rail break or train occupancy includes a current source adapted to deliver a current to an isolated block of a rail track. A voltage sensor is coupled to the isolated block and configured to detect voltage across the isolated block. A shunt device is coupled to the isolated block and configured to receive a shunt current from the current delivered by the current source. A shunt current sensor is coupled to the shunt device and adapted to detect the shunt current flowing through the shunt device. A control unit is adapted to receive input from the voltage sensor and the shunt current sensor and to monitor a variation of the shunt current with respect to the voltage to detect the rail break or train occupancy.

Abstract: Provided is a current-mode semiconductor integrated circuit device that operates in a voltage mode during a test mode. The current-mode semiconductor integrated circuit device includes a first transmitting converter, a first receiving converter, a second transmitting converter, and a second receiving converter. During the test mode, one of a first signal path and a second signal path is selected according to the location of the chip. In the first signal path, the first transmitting converter, the first receiving converter, and the second transmitting converter operate. In the second signal path, the second transmitting converter, the second receiving converter, and the first transmitting converter operate. Each of the first and second transmitting converters receives a test voltage signal and converts it into a current signal. Each of the first and second receiving converters generates a reference voltage signal, compares it with the test voltage signal, and outputs the comparing result.

Abstract: Microfluidic devices and methods that use electrical admittance as the basis for measuring flow rate of fluids and/or for distinguishing (e.g., characterizing, sorting, separation, etc.) different particles, chemical compositions or biospecies (e.g., different cells, cells containing different substances, different particles, different chemical compositions, etc.).

Abstract: A transmission device includes a transmission line composed of first and second transmission lines. A first circuit block outputs a non-inverted transmission signal to the first transmission line, and a second output circuit outputs an inverted transmission signal to the second transmission line. The second circuit block comprises an impedance element and a comparison circuit for comparing voltages. The same types of impedance elements as the impedance element are interposed in the first and second transmission lines between the first circuit block and the second circuit block.

Abstract: An electronic circuit and method to determine a resistance value of a resistive element. The circuit includes a current source coupled in series with the resistive element. The current source is configured to force a predetermined value of current through the resistive element and includes a transconducting device coupled to the current source. The transconducting device is configured to sense a voltage across the resistive element and transform the voltage into an output current of the transconducting device such that the output current is not dependent upon any other terminal voltages of the transconducting device.

Abstract: In various embodiments of the present invention, tunable resistors are introduced at the interconnect layer of integrated circuits in order to provide a for adjusting internal voltage and/or current levels within the integrated circuit to repair defective components or to configure the integrated circuit following manufacture. For example, when certain internal components, such as transistors, do not have specified electronic characteristics due to manufacturing defects, adjustment of the variable resistances of the tunable resistors included in the interconnect layer of integrated circuits according to embodiments of the present invention can be used to adjust internal voltage and/or levels in order to ameliorate the defective components. In other cases, the tunable resistors may be used as switches to configure integrated circuit components, including individual transistors and logic gates as well as larger, hierarchically structured functional modules and domains.

Abstract: An FET-characteristic measuring system applies a pulse output from a pulse generator to the gate of an FET in order to measure drain current flowing through the FET. The pulse has a voltage based on a set voltage. The measuring system includes a divider for dividing the pulse output from the pulse generator into a first pulse applied to the gate of the FET and a second pulse for voltage measurement; a voltage measuring device for measuring a voltage of the second pulse; and a set-voltage adjusting device for determining, based on the voltage of the second pulse, a target set voltage for the pulse generator to apply a pulse having a desired gate application voltage to the FET and for adjusting the set voltage to the target set voltage so that a voltage of the first pulse is equal to the desired gate application voltage.

Abstract: There is provided a current measuring apparatus for measuring current-under-measurement flowing between a first measuring terminal and a second measuring terminal, having a plurality of primary coils whose one end is electrically connected with the first measuring terminal and another end thereof is electrically connected with the second measuring terminal, a secondary coil that generates voltage representing the current-under-measurement corresponding to the current-under-measurement flowing through the plurality of primary coils and coaxial cables, each corresponding to the plurality of primary coils and having a signal line that connects one end of the primary coil with the first measuring terminal and a shield, and the coaxial cable has the signal line, an insulating layer for coating the signal line, first one of the shield having a tape-like conductor wound around the insulating layer and second one of the shield made of a conductor provided around the first shield.

Abstract: A semiconductor test circuit is installed inside a semiconductor device to measure the state of at least one electrical signal of the semiconductor device, and includes first, second, and Nth signal selecting units (where N is an integer greater than 2). The first signal selecting unit either outputs a first electrical signal received from a first terminal or provides a high impedance state to a pad connected to a second terminal in response to a first control signal. The second signal selecting unit either outputs a second electrical signal received from a first terminal or provides a high impedance state to the pad connected to a second terminal in response to a second control signal. The Nth signal selecting unit either outputs an Nth electrical signal (N is an integer) received from a first terminal or provides a high impedance state to the pad connected to the second terminal in response to an Nth control signal.

Abstract: A method and apparatus is described according to various embodiments, for flowing current from one region of a coil to another region of the coil. The flowing induces—through flux linkage —a voltage across a second coil. A second current substantially does not flow though the second coil. The method and apparatus also includes measuring the current with the voltage between the two coils.

Abstract: A circuit for alternatively controlling a current through a device and permitting measurement of a voltage across the device or controlling a voltage across the device and permitting measurement of a current through the device includes a sense impedance in series combination with the device, an error amplifier selectable to control the controlled current or voltage, the error amplifier providing an error signal for the control, and a floating buffer driving the series combination in response to the error signal.

Abstract: A process and circuit for the connection of electrical loads to the terminals of an amplifier, and for detection of a possible connection defect of said electrical loads. An electrical load is connected to two terminals of the amplifier according to a complete-bridge mounting. At least one second electrical load is connected according to a half-bridge mounting. In a preliminary phase, reference values representative of the currents flowing in each of the connection branches are memorized and measured and there are detected from these measurements and memorized, the reference values of the currents flowing through each of the terminals. During operation of the amplifier, the current passing through each of the two terminals is measured and compared to the corresponding memorized reference value, so as to detect therefrom the connection branch or branches which suffer a connection defect of an electrical load.

Abstract: An apparatus for measuring alignment of polysilicon shapes to a silicon area. Each polysilicon shape in a first plurality of polysilicon shapes has a bridging vertex positioned near the silicon area. Each polysilicon shape in a second plurality of polysilicon shapes has a bridging vertex positioned near the silicon area. The second plurality of silicon shapes is positioned on the opposite side of the silicon area from the first plurality of silicon shapes. An electrical measurement of how many of the polysilicon shapes in the first plurality of polysilicon shapes and in the second plurality of polysilicon shapes provides a measurement of alignment of the polysilicon shapes and the silicon area.

Abstract: A method and apparatus is provided for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and transfer characteristics of the plurality of semiconductor devices are measured using only DC input/output.

Abstract: Integrated voltage and current (VI) probe (18) for integration inside a transmission line (17) having inner (3) and an outer (4) conductors. Current probes, often implemented as loop antennas, can be coupled to the outer conductor. The probes can either be built onto the same panel or on different panels.

Abstract: A plasma having a certain density is generated between a test electrode and an electrode on a display substrate comprising a TFT array which is a circuit under test, and a test signal is transmitted between the electrode and the test electrode via the plasma. With this technique, a probe means and a testing apparatus enabling measurement of the electrical characteristics of the TFT array formed on the display substrate in a non-contact manner can be provided.

Abstract: A contact impedance test circuit for testing impedance between a first contact element and a second contact element comprising an AC signal source for applying an AC signal voltage to the first contact element, an AC contact voltage being emitted by the second contact element, an AC amplifier connected to the second contact element for amplifying the AC contact voltage from the second contact element, an amplified AC contact voltage being produced by the AC amplifier, and a phase angle voltmeter for detecting phase difference between the amplified AC contact voltage and the AC signal voltage at an instance of time, the AC. signal voltage being applied to a reference input of the phase angle voltmeter, the amplified AC contact voltage being applied to a signal input of the phase angle voltmeter.

Abstract: A system for automated testing of the lamp filaments has an ohm meter. The ohm meter is used to determine the resistance of the lamp filament prior to energizing the lamp. A multiplexer switches the ohm meter from one lamp filament to the next so that the lamp filaments are quickly and accurately tested. After the cold resistance of the lamp filaments is measured, a power supply energizes the lamp filaments.

Abstract: A switching circuit includes at least two first semiconductor switches, each having a first input portion and a second input portion; range resistors that are provided between output portions of the first semiconductor switches and a device under test and that have different resistances from each other; a second semiconductor switch having an input portion connected to the output portions of the first semiconductor switches; and a differential amplifier having an input portion connected to the output portion of the second semiconductor switch and an input portion connected to ends of the range resistors, the ends being adjacent to the device under test. In accordance with a control signal, a desired one of the first semiconductor switches is connected to the first input portion and the second switch is connected to the output portion of the desired first semiconductor switch.

Abstract: A current is injected in the vicinity of a liquid-containment facility of interest to create a measurable electrical potential field in the ground underlying the site. Voltage is measured at each of a plurality of electrodes and plotted as a function of time. The rate of change of the voltages measured at each electrode was found to be proportional to the flow rate of any leak from the facility. Accordingly, the monitoring system is calibrated with artificially imposed leaks flowing at various rates and the resulting information is used to estimate the flow rate of actual leaks on the basis of the slope of the potential plot recorded by any given electrode over time. In the preferred embodiment of the invention, the flow rates so calculated are averaged to produce an estimate of the rate of leakage.

Abstract: Device for resistivity soundings on water covered subsurfaces including a Fixed Current Asymmetric Schlumberger electrode configuration with a first and second current electrode and a number of voltage electrodes that are positioned on one line between the current electrodes, and method for measuring the apparent resistivity of water covered subsurfaces using said device and electrode configuration whereby a voltage gradient associated with a generated electrical field between the current electrodes, is measured between the voltage electrodes such that it allows noise recognition and noise filtering by Coupled Electrode Noise Filtering.