Manufacturing Or Product Inspection Patents (Class 382/141)
  • Patent number: 8942463
    Abstract: A method for determining an image of a mask pattern in a resist coated on a substrate, the method including determining an aerial image of the mask pattern at substrate level; and convolving the aerial image with at least two orthogonal convolution kernels to determine a resist image that is representative of the mask pattern in the resist.
    Type: Grant
    Filed: March 25, 2014
    Date of Patent: January 27, 2015
    Assignee: ASML Netherlands B.V.
    Inventors: Yu Cao, Luoqi Chen, Antoine Jean Bruguier, Wenjin Shao
  • Patent number: 8942462
    Abstract: A method to automatically quantify dendrite arm spacing in dendritic microstructures. Once a location of interest in a cast material specimen has been identified, the information contained in it is automatically analyzed to quantify dendrite cell size information that is subsequently converted into a quantified dendrite arm spacing through an empirical relationship or a theoretical relationship. In one form, the relationship between DCS and DAS is such that the DAS in dendritic structure of cast aluminum alloys may be automatically determined from the measurement of one or more of dendrite cell size and the actual volume fraction of the eutectic phases in the local casting microstructure. Non-equilibrium conditions may be accounted for in situations where a theoretical volume fraction of a eutectic phase of the alloy in equilibrium condition is appropriately modified.
    Type: Grant
    Filed: February 4, 2013
    Date of Patent: January 27, 2015
    Assignee: GM Global Technology Operations LLC
    Inventors: Qigui Wang, James W. Knight
  • Patent number: 8934702
    Abstract: A system for determining cumulative tow gap width includes an in-process vision system having at least one camera adapted to record images of a composite material and a data analysis computer communicating with and adapted to receive image data from the in-process vision system. The data analysis computer may be adapted to calculate a cumulative gap width of tow gaps in the composite material. A user interface may communicate with and be adapted to receive data analysis results from the data analysis computer. A method for determining cumulative tow width gap of tow gaps in a composite structure is also disclosed.
    Type: Grant
    Filed: January 2, 2008
    Date of Patent: January 13, 2015
    Assignee: The Boeing Company
    Inventors: Roger W. Engelbart, Reed Hannebaum, Eric Rector, Jeffrey Haywood
  • Patent number: 8934703
    Abstract: A determination assist system including a first image generating section for generating a first planar image based on data of a first test index; a second image generating section for generating a second planar image based on data of a second test index; a differentiation section which differentiates the first planar image and the second planar image to generate a first differential image and a second differential image, respectively; a binarization section which binarizes the first differential image to generate a first binary image including a first region which is not less than a first threshold and a second region which is less than the first threshold, and binarizes the second differential image to generate a second binary image including a third region which is not less than a second threshold and a fourth region which is less than the second threshold; and a determination image generating section.
    Type: Grant
    Filed: October 4, 2010
    Date of Patent: January 13, 2015
    Assignee: Kawasaki Jukogyo Kabushiki Kaisha
    Inventors: Kenji Tsubaki, Katsumi Nagata, Toshihiro Yamaoka, Hideyuki Hirasawa, Hironori Okauchi
  • Patent number: 8934704
    Abstract: Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are accepted and stored, and a defect threshold for detecting a defective portion of an inspection object and a determination threshold for making a non-defective/defective determination are set based on the plurality of stored images. A defective item image which is an image of an item determined as a defective item is previously stored and when an input of an image newly acquired by capturing an inspection object is accepted, non-defective item learning processing is performed by use of a plurality of stored images including the image whose input has been accepted, to at least reset the defect threshold. A defective portion is re-detected based on the reset defect threshold, to determine whether or not the stored defective item image is an image of a defective item based on the set determination threshold.
    Type: Grant
    Filed: December 5, 2012
    Date of Patent: January 13, 2015
    Assignee: Keyence Corporation
    Inventor: Takashi Hirano
  • Patent number: 8934706
    Abstract: A device is provided having a robotic arm for handling a wafer, the robotic arm including one or more encoders that provide encoder data identifying a position of one or more components of the robotic arm. The device also having a processor adapted to apply an extended Kalman Filter to the encoder data to estimate a position of the wafer.
    Type: Grant
    Filed: January 20, 2014
    Date of Patent: January 13, 2015
    Assignee: Brooks Automation, Inc.
    Inventors: Christopher C. Kiley, Peter van der Meulen, Forrest T. Buzan, Paul E. Fogel
  • Patent number: 8934705
    Abstract: Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause.
    Type: Grant
    Filed: August 8, 2011
    Date of Patent: January 13, 2015
    Assignee: BT Imaging Pty Ltd
    Inventor: Ian Andrew Maxwell
  • Publication number: 20150010228
    Abstract: The instant application describes a method for acquiring via a vehicle wheel alignment system an image of a target including a validation logo, the validation logo being used for recognition by the vehicle wheel alignment system and determination of authenticity of the validation logo by the vehicle wheel alignment system; identifying the validation logo within the image of the target; comparing the identified validation logo with a reference validation logo; computing a similarity metric based on a result of a comparison between the identified validation logo and the reference validation logo; and based on the computed similarity metric, enabling or disabling the vehicle wheel alignment system.
    Type: Application
    Filed: July 2, 2014
    Publication date: January 8, 2015
    Inventors: Steven W. ROGERS, Donald L. WALCHUK, Robert J. D'AGOSTINO
  • Publication number: 20150010758
    Abstract: A method of producing a tablet in which an uncoated tablet is coated by a coating agent, the method including: a coating process of coating uncoated tablets with a coating agent by spray coating the coating agent onto tablets that are churned and tumbled inside a container, and drying the tablets inside the container by supplying drying air into the container and exhausting air from the container, wherein spray coating conditions, including air supply temperature, air supply rate, and spray speed, are controlled according to the weight of the coating agent with which the uncoated tablets are coated, such that the humidity of air exhausted during spray coating is within a range of from 14% RH to 30% RH.
    Type: Application
    Filed: August 23, 2012
    Publication date: January 8, 2015
    Applicants: DAIICHI SANKYO COMPANY, LIMITED, FUJI XEROX CO., LTD.
    Inventors: Kensuke Ito, Yasuhiro Suzuki
  • Patent number: 8929661
    Abstract: The disclosed embodiment relates to methods for measuring camber on a surface. The method preferably comprises receiving, by a computing device, a plurality of images of a surface, identifying, by a computing device, a key image of the surface from the plurality of images, extracting, by a computing device, a portion of the key image including the surface, and analyzing, by a computing device, the extracted portion of the key image to thereby determine the camber on the surface. The disclosed embodiment also relates to a system and computer-readable code that can be used to implement the exemplary methods.
    Type: Grant
    Filed: August 22, 2011
    Date of Patent: January 6, 2015
    Assignee: Infosys Limited
    Inventors: Sivaram Vargheese Thangam, Harikrishna Gandhinagara Narayana Rai, Sunil Arora
  • Patent number: 8921733
    Abstract: Removing material from the surface of a first circuit comprises generating a first laser pulse using a pulse generator; targeting a spot on the first circuit using a focusing component; delivering the first laser pulse to the spot on the first circuit, the first circuit including a digital component; ablating material from the spot using the first laser pulse without changing a state of the digital component; testing performance of the first circuit, the testing being performed without reinitializing the circuit between the steps of ablating material and testing performance. Targeting the spot on the first circuit comprises generating a second laser pulse using a pulse generator; delivering a second laser pulse to a sacrificial piece of material; detecting the position of the ablation caused by the second laser pulse with a vision system that forms an image; and using this image to guide the first laser to the spot.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: December 30, 2014
    Assignee: Raydiance, Inc.
    Inventors: David Gaudiosi, Laurent Vaissie
  • Patent number: 8922643
    Abstract: A light emitting diode (LED) inspection apparatus includes at least one LED including a phosphor applied on an emission surface, a first lighting unit to emit visible light to the LED, a second lighting unit to emit ultraviolet (UV) light to the LED, a photographing unit to generate at least one first image data by photographing the visible light reflected from the LED and to generate at least one second image data by photographing the UV light reflected from the LED, and a determination unit to determine a defect in appearance and emission characteristics of the LED using the at least one first image data and second image data.
    Type: Grant
    Filed: March 5, 2012
    Date of Patent: December 30, 2014
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Won Soo Ji, Oh Seok Kwon, Choo Ho Kim
  • Patent number: 8923599
    Abstract: The present invention relates to a method and an arrangement for representing the characteristics of an object with a measuring system, in which either the measuring system or the object is designed to move in relation to one another in a predefined direction of movement. The object preferably is designed to move in relation to the measuring system. At least one light source is designed to illuminate the object with a light which is incident upon the object and has a limited extension in the direction of movement. An imaging sensor, which is arranged on the same side of the object as the light source is designed to pick up light reflected from the object and to convert this into electrical charges. An image-processing unit is furthermore designed to create a digital representation of the object from said electrical charges.
    Type: Grant
    Filed: February 10, 2004
    Date of Patent: December 30, 2014
    Assignee: Sick IVP AB
    Inventors: Anders Åström, Erik Åstrand
  • Publication number: 20140376799
    Abstract: Provided are a system and a method for detecting a number of layers of few-layer graphene employing multispectral image reproduction process to provide rapid detection of numbers of layers of few-layer graphenes on transparent or non-transparent substrates. The application of the system and method in relevant industries expedites validation and/or verification of the number of layers of an FLG product and improves the quality control efficiency thereof.
    Type: Application
    Filed: June 21, 2013
    Publication date: December 25, 2014
    Inventors: Hsiang-Chen Wang, Guan-Huang Wu, Jhe-Ming Yang
  • Publication number: 20140376800
    Abstract: A method for analyzing displays is described. A processing device receives a first scanned image of a first display and determines a first characteristic of the first display by analyzing the first scanned image. The processing device also receives a second scanned image of a second display and determines a second characteristic of the second display by analyzing the second scanned image. The processing device compares the first characteristic and the second characteristic to determine a third characteristic of the second display.
    Type: Application
    Filed: September 10, 2014
    Publication date: December 25, 2014
    Inventors: Ted John Cooper, Omair Abdul Rahman
  • Patent number: 8917900
    Abstract: In a measurement apparatus, higher-quality measurement is realized in measurement of measurement object displacement or imaging of a two-dimensional image. In a controller, a light receiving signal of a photodiode is supplied to a displacement measuring unit of a sensor head in order to measure a height of a measurement object, and the height of a surface of the measurement object is measured based on the light receiving signal. Then, in the controller, image obtaining timing is determined based on the height of the measurement object. Specifically, a focus adjustment value corresponding to the computed height of the measurement object is obtained from the table, and an image obtaining signal is transmitted to an imaging device at the timing the focus adjustment value is realized. Therefore, a length between two points on the measurement object is computed from the thus obtained image based on the height of the measurement object.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: December 23, 2014
    Assignee: Omron Corporation
    Inventors: Yoshihiro Kanetani, Takahiro Suga, Hiroaki Takimasa, Naoya Nakashita, Yusuke Iida
  • Patent number: 8917312
    Abstract: An optical defect detection system is provided for recording an image of a transparency for detecting optical defects therein. The transparency may be formed with a contour. The defect detection system may comprise a light source, a diffuser and an image recording device for recording images of the transparency. The light source is configured to emit light and may be positioned adjacent one of the sides of the transparency. The image recording device may be positioned on a side of the transparency opposite the diffuser. The diffuser may be contoured complementary to the contour of the transparency and may be positioned between the light source and the transparency.
    Type: Grant
    Filed: February 26, 2009
    Date of Patent: December 23, 2014
    Assignee: The Boeing Company
    Inventors: Michael P. Gleason, Daniel E. Pulcher, Douglas E. Reed, Anthony C. Roberts, Matthew M. Thomas
  • Publication number: 20140369591
    Abstract: Techniques are described for maintaining synchronization of inspection data when a web roll is converted into intermediate smaller rolls prior to cutting the web into individual parts. A system comprises a database that stores anomaly data acquired from a manufactured web. The anomaly data specifies positions anomalies within a manufactured web relative to a set of fiducial marks on the manufactured web. A conversion processing line comprises a fiducial mark reader to output position information for the set of fiducial marks on the manufactured web, a slitter that cuts the manufactured web into slit rolls, and a fiducial mark printer to print a set of fiducial marks on each slit roll. A position monitoring system maintains spatial synchronization of the anomaly data by computing an updated position for the anomalies relative to the set of fiducial marks printed on the slit rolls.
    Type: Application
    Filed: December 19, 2012
    Publication date: December 18, 2014
    Inventors: Steven P. Floeder, Carl J. Skeps, James A. Masterman, Matthew V. Rundquist
  • Publication number: 20140363072
    Abstract: A method and system to analyze various dimensional parameters of a structure, such as a self-assembled block copolymer structure whether formed by graphoepitaxy or chemical epitaxy. The method involves image processing including median filtering and feature detection to determine critical dimension information, and optionally the use of a Hough transform to find periodicity values and to determine placement errors.
    Type: Application
    Filed: January 15, 2013
    Publication date: December 11, 2014
    Inventors: Christianus Martinus Van Heesch, Hieronymus Johannus Christiaan Meessen
  • Patent number: 8908919
    Abstract: A detection system includes processing circuitry configured to receive overhead image data divided into a plurality of image chips and receive metadata associated with the image data. The metadata includes ground sample distance information associated with the image data and provides an indication of ground area represented by each pixel within the image chips. The processing circuitry is further configured to screen the image chips for candidate detections based on a multi-stage screening process and determine whether to classify candidate detections as target detections. The process includes an intensity based screening stage, an object extraction stage that employs binary shape features to extract objects from detect positions identified based on an output of the intensity based screening stage, and a candidate detection identification stage employing template based and structural feature criteria to identify candidate detections from an output of the object extraction stage.
    Type: Grant
    Filed: May 14, 2013
    Date of Patent: December 9, 2014
    Assignee: The Johns Hopkins University
    Inventors: William C. Walton, Christopher M. Gifford, Marc A. Kolodner, Donald A. Ruffle
  • Patent number: 8908956
    Abstract: A method for inspecting surface defect of metal balls by image recognition includes the steps of feeding metal ball, capturing image for a first time, making metal ball rotate, capturing image for a second time, comparing images, and discharging metal balls. With the above steps, not only can the metal balls be sorted into the acceptable and the unacceptable metal balls, but the unacceptable metal balls can be sorted into different kinds according to the defects such as scratch, strain, and so on. Hence, effective data can be offered to improve the metal ball manufacturing process accurately.
    Type: Grant
    Filed: April 15, 2013
    Date of Patent: December 9, 2014
    Inventors: Ya-Chen Hsu, Fang-Chih Tien
  • Publication number: 20140355866
    Abstract: Provided are a method and apparatus for automatically determining defective equipment by using a sample defect map showing defect distribution in each cell of a defective sample and production history information of each product, wherein the defective sample is a set of products, each being divided into a plurality of cells. According to this invention, the method of determining defective equipment is provided.
    Type: Application
    Filed: December 31, 2013
    Publication date: December 4, 2014
    Applicant: SAMSUNG SDS CO., LTD.
    Inventors: Kae Young SHIN, Min Kyun DOO
  • Patent number: 8903122
    Abstract: A hard disk drive manufacture process may use a database to track the sliders stored within a slider tray. Instead of requiring an operator to visually inspect each tray to confirm that the database information is accurate, the trays may be sent to a detection system that uses a computer vision technique to identify the total number of sliders in a tray. In one embodiment, the computer vision technique may also determine where the sliders are stored in the slider tray—e.g., a particular row and column. If the information obtained using the computer vision technique differs from the information stored in the database, the system may perform one or more actions for correcting the discrepancy. In this manner, the computer vision technique may be used to update and confirm the slider tracking information stored in the database.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: December 2, 2014
    Assignee: HGST Netherlands B.V.
    Inventors: Justice D. Cansancio, Mark Lven T. Palejaro, Luis A. Pelo, Quintin L. Rullan, Jr., Rufino F. Sadiasa, Jr.
  • Patent number: 8902464
    Abstract: Colorimetric values for generating a color separation table, which are obtained by measuring a plurality of color patches included in a color chart, are input, and measurement values corresponding to the input plural measurement values other than supervised input measurement values are estimated using supervised measurement values. Then, color differences between the estimated measurement values and the input plural measurement values other than the supervised measurement values are calculated. Based on the color differences, it is determined whether printing of the plurality of color patches or measurement of the plurality of color patches has been performed correctly.
    Type: Grant
    Filed: March 19, 2009
    Date of Patent: December 2, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takamasa Seto
  • Patent number: 8897540
    Abstract: An optical inspection method including the following steps is disclosed. A tester is utilized to obtain an image of an inspection object. A target image region of the image is determined. Multiple central coordinates of multiple inspection ranges of a target image region are obtained. The central coordinates are filled to an array, and then the central coordinates are reordered according to relative relationships of the central coordinates to obtain a reordered coordinate array. The reordered coordinate array is compared with an original coordinate array to inspect whether parts of the inspection object corresponding to the inspection ranges are missed.
    Type: Grant
    Filed: March 15, 2013
    Date of Patent: November 25, 2014
    Assignee: Quanta Computer Inc.
    Inventor: Chin-Lin Lin
  • Patent number: 8897537
    Abstract: A method and systems for cloud-based digital pathology include scanning received slides that include a pathology sample to produce a sample image in a shared memory, analyzing the sample image using one or more execution nodes, each including one or more processors, according to one or more analysis types to produce intermediate results, transmitting some or all of the sample image to a client device, further analyzing the sample image responsive to a request from the client device to produce a final analysis based on the intermediate results, and transmitting the final analysis to the client device.
    Type: Grant
    Filed: August 1, 2012
    Date of Patent: November 25, 2014
    Assignee: NEC Laboratories America, Inc.
    Inventors: Eric Cosatto, Christopher Malon, Hans P. Graf
  • Publication number: 20140341460
    Abstract: A method and apparatus for controlling the deposition of elementary semifinished products in a process for building tyres for vehicle wheels includes: driving in rotation, around a rotation axis, at a rotation speed between about ?/8 raft and about 6 ? rad/s, a tyre being processed which tyre has a radially external surface including one or more elementary semifinished products; sending a first electromagnetic radiation to the radially external surface, the latter generating a corresponding first reflected radiation; detecting, through a first detecting device, at least one first image representative of the first reflected radiation; controlling the first detecting device in such a manner that a first exposure time for detecting the at least one first image is included between about 0.1 s and about 10 s; carrying out a first comparison between the at least one first image and one or more reference data; and generating a first notification signal as a function of the first comparison.
    Type: Application
    Filed: December 11, 2012
    Publication date: November 20, 2014
    Inventors: Michele Ballabio, Gaetano Lo Presti, Bartolomeo Montrucchio, Vincenzo Orlando
  • Patent number: 8891852
    Abstract: Disclosed are systems and methods for configuring a vision detector, wherein a training image is obtained from a production line operating in continuous motion so as to provide conditions substantially identical to those that will apply during actual manufacturing and inspection of objects. A training image can be obtained without any need for a trigger signal, whether or not the vision detector might use such a signal for inspecting the objects. Further disclosed are systems and methods for testing a vision detector by selecting, storing, and displaying a limited number of images from a production run, where those images correspond to objects likely to represent incorrect decisions.
    Type: Grant
    Filed: November 2, 2004
    Date of Patent: November 18, 2014
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Andrew Eames, Brian V. Mirtich, William M Silver
  • Publication number: 20140333758
    Abstract: A method for inspecting a composite structure includes acquiring an image of the composite structure. The composite structure includes at least a first ply and a second ply adjacent the first ply. The method also includes transforming the image into a binary image, and determining a first boundary line between the first ply and the second ply. The method further includes characterizing an irregularity in the composite structure based at least partially on the first boundary line.
    Type: Application
    Filed: May 10, 2013
    Publication date: November 13, 2014
    Applicant: The Boeing Company
    Inventor: The Boeing Company
  • Patent number: 8885914
    Abstract: Disclosed are an apparatus and a method for reinspecting a prescription drug, which reinspect the defect state of a defective drug pack after the defect state of an individually packaged drug has been inspected by analyzing the image of the drug. The apparatus includes a drug pack information transceiving module to receive primary inspection data, a drug reinspection controlling module to control a procedure of reinspecting a defect state of a drug pack which has been primarily determined as a defective drug pack, an image processing module to photograph the drug pack, which has been primarily determined as the defective drug pack, and to process an image of the drug pack, and a defect analyzing module to determine a defect state of the drug by analyzing a drug contained in the image of the drug pack provided from the image processing module.
    Type: Grant
    Filed: April 30, 2012
    Date of Patent: November 11, 2014
    Assignee: JVM Co., Ltd.
    Inventor: Jun-Ho Kim
  • Patent number: 8885915
    Abstract: A method for measuring a distance between a lower end surface of a heat shielding member including a criterion reflector inside a concavity on the lower end surface and a surface of a raw material melt includes: a silicon single crystal is pulled by the Czochralski method while a magnetic field is applied to the raw material melt in a crucible, measuring the distance between the lower end surface of the heat shielding member and the surface of the raw material melt and observing a position of a mirror image of the criterion reflector with a fixed point observation apparatus; and measuring a movement distance of the mirror image with the apparatus and calculating the distance between the lower end surface of the heat shielding member and the surface of the raw material melt from the movement distance of the image and the measured distance.
    Type: Grant
    Filed: April 28, 2011
    Date of Patent: November 11, 2014
    Assignee: Shin-Etsu Handotai Co., Ltd.
    Inventors: Kosei Sugawara, Masahiko Urano, Ryoji Hoshi
  • Patent number: 8885916
    Abstract: Methods, systems, and computer readable media are disclosed for determining a pixel-to-length ratio between a number of pixels disposed over a predetermined length of a reference object within an image of a siding sample and the predetermined length of the reference object. A first and second distance between respective first and second pairs of points within the image corresponding to respective first and second length measurements of the siding sample are determined, as well as a first and second number of pixels disposed between the first and second pair of points, respectively. Furthermore, the method, system, and computer readable medium disclose determining the first length measurement based on the pixel-to-length ratio and the first number of pixels, determining the second length measurement based on the pixel-to-length ratio and the second number of pixels, and identifying a siding product associated with the first and second length measurements.
    Type: Grant
    Filed: March 28, 2014
    Date of Patent: November 11, 2014
    Inventors: Jonathan D. Maurer, Nicholas U. Christopulos
  • Patent number: 8885918
    Abstract: A method for inspecting a wafer. The method comprises a training process for creating reference images. The training process comprises capturing a number of images of a first wafer of unknown quality, each of the number of images of the first wafer being captured at a predetermined contrast illumination and each of the number of images of the first wafer comprising a plurality of pixels. The training process also comprises determining a plurality of reference intensities for each of the plurality of pixels of each of the number of images of the first wafer, calculating a plurality of statistical parameters for the plurality of reference intensities of each of the plurality of pixels of each of the number of images of the first wafer, and selecting a plurality of reference images from the plurality of images of the first wafer based on the calculated plurality of statistical parameters.
    Type: Grant
    Filed: January 13, 2010
    Date of Patent: November 11, 2014
    Assignee: Semiconductor Technologies & Instruments Pte Ltd
    Inventors: Ajharali Amanullah, Albert Archwamety, Hongtu Guo
  • Publication number: 20140328533
    Abstract: A product testing apparatus is described as having one or more imager configured to capture one or more images of a sample having a substrate coating applied to a substrate, a processor in communication with the imager, and a non-transitory processor readable medium, in communication with the processor. The non-transitory processor readable medium stores processor executable instructions that when executed cause the processor to receive the one or more images from the one or more imager. The processor then processes the one or more image by filtering lighting variations in the pixels of the one or more images to identify one or more objects of interest in the one or more images of the cured/uncured substrate coating. The processor quantifies one or more property of the one or more objects of interest. The processor executable instructions then cause the processor to generate one or more signal indicative of the quantification of the one or more objects of interest.
    Type: Application
    Filed: May 2, 2014
    Publication date: November 6, 2014
    Applicant: HERCULES INCORPORATED
    Inventors: Bruce K Fillipo, Sowmitri Tarimala
  • Patent number: 8879820
    Abstract: To image a component larger than the field of view of a camera, a range based on the shape and dimension of the component to be imaged and the field of view of the camera, a range of the component is divided, and imaging ranges of a plurality of characteristic parts to be imaged are determined. Then, images of the plurality of characteristic parts obtained by imaging the plurality of characteristic parts with the camera are combined to create a combined image of the characteristic parts of the component. Based on the combined image, the position of the component is measured.
    Type: Grant
    Filed: April 14, 2011
    Date of Patent: November 4, 2014
    Assignee: Fuji Machine Mfg. Co., Ltd.
    Inventors: Hiroshi Oike, Kenji Sugiyama
  • Publication number: 20140321729
    Abstract: A method, an apparatus and a system are provided for deriving a characteristic of a product using X-rays. X-ray image data derived by performing an X-ray scan of the product and conveying attenuation information is received. A response of a reference product to X-rays is then simulated to generate simulated X-ray image data. The simulated X-ray image data and the received X-ray image data are then processed to derive one or more characteristics of the product. In a specific implementation, the product is a liquid product comprised of a bottle at least partially filled with liquid and the derived characteristic is a threat status assessment associated with the liquid in the bottle. In another aspect, a simulation engine for simulating interactions between X-rays and objects is also provided.
    Type: Application
    Filed: June 5, 2014
    Publication date: October 30, 2014
    Inventors: Dan GUDMUNDSON, Eric BOURBEAU, Luc PERRON
  • Publication number: 20140318078
    Abstract: A drug supply device includes a hopper that collects solid drugs discharged from tablet cases on the basis of predetermined prescription data, an inspection device that inspects the solid drugs introduced from the hopper, and a packaging device that fills and packages the inspected solid drugs into a packaging sheet. The inspection device includes inspection containers that each hold a single administration dosage of the solid drugs, a movement mechanism that moves the inspection containers, and an imaging device that captures an image of the solid drugs in the inspection containers. As a result of capturing the image of the solid drugs in the inspection container by the imaging device, when a number of the solid drugs is different from the prescription data, the solid drugs are disposed of.
    Type: Application
    Filed: July 11, 2014
    Publication date: October 30, 2014
    Inventors: Akira KONDO, Hideyuki TAKAHASHI, Takashi MORI
  • Publication number: 20140314302
    Abstract: An inspection area setting method for setting inspection area-defining information defining an inspection area to an image inspecting device, the image inspecting device being configured to extract a portion constituting the inspection area as an inspection area image from an original image obtained by taking an image of an inspection object, and to inspect the inspection object by analyzing the inspection area image, includes an acquisition step of acquiring a sample image obtained by taking an image of a sample of the inspection object, an inspection area searching step, and a setting step.
    Type: Application
    Filed: August 29, 2012
    Publication date: October 23, 2014
    Applicant: OMRON CORPORATION
    Inventors: Yoshihisa Minato, Yukiko Yanagawa
  • Patent number: 8867817
    Abstract: A method for analyzing a display is described. The method includes scanning the display to generate a scanned image of the display. The scanned image may be analyzed to determine a characteristic of the display, such as whether or not the display is defective.
    Type: Grant
    Filed: October 29, 2012
    Date of Patent: October 21, 2014
    Assignee: Amazon Technologies, Inc.
    Inventors: Ted John Cooper, Omair Abdul Rahman
  • Patent number: 8867847
    Abstract: A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.
    Type: Grant
    Filed: October 19, 2012
    Date of Patent: October 21, 2014
    Assignee: Cognex Technology and Investment Corporation
    Inventors: William M. Silver, E. John McGarry, Sanjay Nichani, Adam Wagman
  • Patent number: 8867816
    Abstract: A method, an apparatus and a system are provided for assessing at a security checkpoint the threat status of a liquid product, where the liquid product is comprised of a bottle at least partially filled with liquid. In accordance with a broad aspect, the level of fill is used as a factor in the determination of the threat status of the liquid product. In accordance with another broad aspect, an X-ray image of the liquid product is obtained and processed to derive a level of fill of the bottle and the threat status of the liquid product is determined at least in part based on the level of fill of the bottle. In accordance with yet another broad aspect, an X-ray image of the liquid product is processed to derive location information associated with a meniscus formed by the liquid in the bottle. An estimated length of a path followed by X-rays through the liquid held in the bottle is derived in part based on the location information and is used to determine the threat status of the liquid product.
    Type: Grant
    Filed: March 27, 2009
    Date of Patent: October 21, 2014
    Assignee: Optosecurity Inc.
    Inventors: Michel Bouchard, Dan Gudmundson, Eric Bourbeau
  • Publication number: 20140307941
    Abstract: Method for processing the three-dimensional digital image of the surface of a tyre in which the three-dimensional image of the said surface is captured while assigning to each pixel of the plane of the image an item of information relating to the elevation of this point with respect to the surface to be inspected, characterized in that, with the aid of a morphological operator using a structuring element, a first transformation of the image of the surface is performed with the aid of an opening and then of a closing, so as to tailor the grey level of the pixels situated abnormally above or below the surface to be inspected.
    Type: Application
    Filed: March 21, 2012
    Publication date: October 16, 2014
    Applicants: MICHELIN RECHERCHE ET TECHNIQUE S.A., COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN
    Inventors: Jean-Paul Zanella, Claire Moreau, Guillaume Noyel, Yusi Shen
  • Publication number: 20140307942
    Abstract: A device includes a holding device, a first camera module, a second camera module, a driving device, and an image processor. The holding device is configured for holding a plurality of lens elements, each of which includes lenses. The driving device is connected to the first camera module and the second camera module and configured for driving the first camera module and the second camera module to move such that the first camera module and the second camera module aim at and capture an image of each lens. The image processor is in communication with the first camera module and the second camera module and configured for processing the images to detect defects of the lenses, if any.
    Type: Application
    Filed: March 28, 2014
    Publication date: October 16, 2014
    Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
    Inventor: CHEN-YU YU
  • Patent number: 8860802
    Abstract: An inspection station identifies defects such as artifacts (e.g., dust, hair, particles) in the sealing areas of sealed sterile packages. A multi-head optical scanner can include at least two fiber optic sensors each comprised of a bundle of optical fibers arranged into a linear face coupled to an image processing module and oriented towards a scanning area of sealed packages moving through a conveyance system. An image processing module can analyze input from the at least two fiber optic sensor arrangements to identify artifacts in the sealing areas of the sealed packages.
    Type: Grant
    Filed: October 8, 2009
    Date of Patent: October 14, 2014
    Inventor: Youri N. Djachiachvili
  • Patent number: 8860940
    Abstract: A method and system of aligning color filter array are disclosed. Other embodiments are disclosed herein.
    Type: Grant
    Filed: February 14, 2012
    Date of Patent: October 14, 2014
    Assignee: Arizona Board of Regents, a body corporate of the State of Arizona, Acting for and on behalf of Arizona State University
    Inventors: Cynthia Bell, John Stowell, Donald E. Adams
  • Patent number: 8861831
    Abstract: A method for analyzing quality of a glazing unit including: generating a digital image of a test chart produced in reflection by an outer surface of the glazing, the test chart presenting a pattern composed of a plurality of contrasted elements defining between them interface lines; calculating quantities representative of the glazing from the image generated, the calculation being carried out by a processing unit; and comparing the calculated values for the representative values relative to reference values. The representative quantities are representative of a deformation of the image of the test chart produced in reflection by the outer surface of the glazing.
    Type: Grant
    Filed: October 15, 2010
    Date of Patent: October 14, 2014
    Assignee: Saint-Gobain Glass France
    Inventors: Simon Le Moal, Corinne Payen
  • Patent number: 8861833
    Abstract: A system for simultaneous real-time three-dimensional geometry and color texture acquisition. The system includes a system processor for generating at least three phase shifted black and white fringe patterns with a phase shift of 2 ?/3, a light projector adapted to project the fringe patterns onto an object, the projector being electrically connected with the system processor, and a color camera for capturing the fringe patterns to generate at least three raw fringe images. The fringe images are used to calculate a black and white texture image which is further converted to a color image by employing a demosaicing algorithm. The fringe images are also used to calculate a wrapped phase map that is further processed to generate a continuous unwrapped phase map by employing a phase unwrapping algorithm and the unwrapped phase map is converted to co-ordinates using calibrated system parameters for point-by-point three-dimensional shape measurement.
    Type: Grant
    Filed: February 18, 2009
    Date of Patent: October 14, 2014
    Assignee: International Press of Boston, Inc.
    Inventors: Shing-Tung Yau, Song Zhang, Xiangfeng Gu
  • Publication number: 20140301627
    Abstract: A computer implemented method for determining the 3-dimensional shape of an implant to be implanted into a subject includes obtaining a computer readable image including a defective portion and a non-defective portion of tissue in the subject, superimposing on the image a shape to span the defective portion, and determining the 3-dimensional shape of the implant based on the shape that spans the defective portion.
    Type: Application
    Filed: May 15, 2014
    Publication date: October 9, 2014
    Applicant: OSTEOPLASTICS LLC
    Inventors: Howard David Dean, Krishnamoorthy Subramanyan, Alexandros T. Moullas, Robert A. Ratcheson
  • Publication number: 20140301628
    Abstract: A method for measuring the absorption of fluid in an absorbent product includes at least the following steps performed by a mobile device having an image capturing device: capturing at least one image of a used absorbent product; determining a measure of absorption of fluid by the product based on image information in the captured image; and displaying information relating to the use of the absorbent product based the measure of absorption of fluid on the mobile device. The method can aid a user of absorbent product to choose the right type of product for the user's individual needs.
    Type: Application
    Filed: December 21, 2011
    Publication date: October 9, 2014
    Applicant: SCA Hygiene Products AB
    Inventor: Joshua Carney
  • Patent number: 8855399
    Abstract: A system for location based wafer analysis, the system comprising: (i) a first input interface; (ii) a second input interface; (iii) a correlator; and (iv) a processor, configured to generate inspection results for the inspected wafer, with the help of at least one frame run-time displacement.
    Type: Grant
    Filed: February 7, 2012
    Date of Patent: October 7, 2014
    Assignee: Applied Materials Israel, Ltd.
    Inventors: Zvi Goren, Nir Ben-David Dodzin