Abstract: A via design apparatus includes a determination section that determines a value of a shape parameter indicating a shape of a via in a multilayer board. The via has a hole passing through the plurality of layers and a conductive section on a side wall of the hole. The apparatus also includes a calculation section that calculates a value of impedance of the via according to the value of the shape parameter.

Abstract: Mechanisms are provided for predicting effects of soft errors on an integrated circuit device design. A data processing system is configured to implement a unified derating tool that includes a machine derating front-end engine used to generate machine derating information, and an application derating front-end engine used to generate application derating information, for the integrated circuit device design. The machine derating front-end engine executes a simulation of the integrated circuit device design to generate the machine derating information. The application derating front-end engine executes an application workload on existing hardware similar in architecture to the integrated circuit device design and injects a fault into the existing hardware during execution of the application workload to generate application derating information.

Abstract: A simulation parameter extracting method of a MOS transistor according to an exemplary aspect of the present invention includes evaluating a measured value that includes a true gate-overlap capacitance by measuring a capacitance between the gate and the drain in each of a plurality of layout patterns at a predetermined bias voltage, only the number of contact plugs being different for each layout pattern, evaluating a gate-overlap capacitance calculation value of each layout pattern by subtracting a contact parasitic capacitance between the contact plug and the gate from the measured value, the contact parasitic capacitance being obtained by a simulation with varying a model parameter for evaluating a parasitic capacitance between the contact plug and the gate, and extracting the gate-overlap capacitance calculation value as the true gate-overlap capacitance at the model parameter when the gate-overlap capacitance calculation value is about constant regardless of the number of the contact plugs.

Abstract: A method, system and article of manufacture are disclosed for constructing corner models for multiple performance targets for circuit simulations. The method includes identifying N (N?2) performance targets F1, F2, . . . , FN, and obtaining their correlation matrix R, calculating a normalized joint probability density (JPD); and building a common and optimal corner for the N targets. The method further includes constructing corner models to cover both lower and upper bounds of the performance targets; and determining an optimal common corner solution for each corner by maximizing a normalized JPD among all possible common corner solutions for that corner.

Abstract: A test generator and methods for generating tests from a hybrid diagram are provided. A hybrid diagram is a diagram that primarily uses one higher-level semantic notation with portions utilizing one or more secondary higher-level semantic notations. Example higher-level semantic notations are statechart notation and data-flow notation. A test generator processes the hybrid diagram without reducing the higher-level semantic constructs to lower-level semantic constructs. The test generator generates test-generation templates as needed based on the higher-level semantic model used in the diagram. The test generator uses the test-generation templates to generate tests for a system-performing device specified by the diagram. The generated tests may be executed automatically by a test driver or manually by a human tester.

Abstract: Disclosed are a method, a system, and a computer program product for implementing compact manufacturing model during various stages of electronic circuit designs. In some embodiments, the method loads the full design database information on the master; distributes the tasks to be processed in parallel; loads a full design on a master; spawns a plurality of slave sessions; sends to at least one slave a nutshell representation of the electronic circuit design; identifies a task to perform in parallel and sends the task to be performed in parallel; and receives execution results or processing results from some of the plurality of slaves and updates one or more databases to incorporate the execution or processing results. In some embodiments, the method allows speeding up the applications without major rewrite without a need for design partition, and without memory penalty.

Abstract: The present invention provides systems and methods for simulating an analog and mixed-signal circuit design comprising an analog circuit segment and a transmission gate network of a digital circuit segment, where the analog circuit segment is connected to the transmission gate network using a bi-directional connect module, where the analog circuit segment contributes with its own driving force to the digital circuit segment as an equivalent to a driver, and where the digital circuit segment contributes with its own driving force to the analog circuit segment. Additionally, in some systems and methods of the current invention, the bi-directional connect module defers to the transmission gate network any resolution of digital logic values to analog voltages, and any resolution of analog voltages to digital logic values.

Abstract: A system and method are described for converting a circuit description into transaction-based description at a higher level of abstraction. Thus, a designer can readily view a series of transactions that occurred in the simulation of a circuit. In one aspect, the simulated signals are analyzed and converted into messages of a protocol used by the design. A combination of the messages represents a transaction. Thus, the simulated signals are then converted into a series of protocol transactions. In another aspect, a message recognition module performs the analysis of the simulated signals and converts the simulated signals into messages (e.g., request for bus, bus acknowledge, etc.). A transaction recognition module analyzes the messages and converts the messages into transactions (e.g., Read, Write, etc.). Using both the system and method the circuit description is converted into a higher level of abstraction that allows more comprehensive system-level analysis.

Abstract: A method and structure for a computer model of a device has a performance parameter. The performance parameter includes a first bounded range and a second bounded range. The first bounded range has performance parameter variations within a single manufacturing process, and the second bounded range has performance parameter variations of different device designs.

Abstract: A verification system for verifying an integrated circuit design is provided. The verification system includes a functional block finding module configured to identify potential sensitive circuits in the integrated circuit design; and a search module. The search module is configured to find sensitive circuits from the potential sensitive circuits; and verify the sensitive circuits.

Abstract: One embodiment of the present invention provides systems and techniques to execute a hardware simulation and verification solution on a multiprocessor system. The hardware simulation and verification solution can be partitioned into different modules which can include a simulation kernel to simulate changes in signal values, a value change dump module to store the changes in the signal values on a computer-readable storage medium, a functional coverage module to check functionality, a toggle coverage module to check signal toggling, an assertion engine to check complex behaviors, and a testbench module to generate test scenarios. Embodiments of the present invention can execute different modules on different processors, thereby improving performance.

Abstract: Methods and systems are provided to reduce the complexity of sequential digital circuitry including cells of unknown function by grouping and defining like instance of combinational circuitry cells. The system groups together cells that feed into the same combination of one or more state cells. The groups of cells are then replaced by clouds which are defined in the netlist for the sequential digital circuitry to produce a simpler representation of the circuitry for analysis purposes and to aid in determining the function of those cells for which the function is unknown.

Abstract: A method for compliance testing of a circuit design that includes at least one processor and a memory includes defining a memory model. The memory model includes synchronization mechanisms for synchronizing access to the memory by software instructions in different program threads running on the at least one processor. Synchronization-related parameters, which are applicable to at least one sequence of the software instructions in the different program threads, are specified. A coverage model is defined as a multi-dimensional cross-product of values of the synchronization-related parameters. At least one test program is generated using the coverage model, and a compliance of the design with the memory model is tested by subjecting the design to the at least one test program.

Abstract: Predicting simultaneous switching output noise of an IC device is described. User input is obtained. The user input includes: an identification of an input/output bank of an integrated circuit die; an identification of a device package substrate to which the integrated circuit die is to be attached; and an identification of input/output interface to be used by the input/output bank. A noise factor and an impedance are selected responsive to the user input. The noise factor is multiplied with the impedance to provide a result. The result, which is output, is a prediction of the simultaneous switching output noise of the integrated circuit device.

Abstract: A system, method and program to improve the processing speed of a simulation system. A processing system finds an entry point so that functional blocks cover a broad range. The processing system places code of a look-ahead dispatcher for assigning processing. The look-ahead dispatcher monitors an input state at the entry point to determine whether the input state is a stable state. If the input state is stable, the look-ahead dispatcher calls an adaptive execution module at some frequency or otherwise calls an idle execution module. The adaptive execution module performs processing on multiple timestamps at once. When a discrete system receives an input event, the look-ahead dispatcher calls a recovery execution module. Based on the input event on that occasion, the timestamp, and a value stored in a state vector, the recovery execution module calculates a state for which recovery is performed.

Abstract: A system, tool and method for testing and modeling capabilities and functionalities of an integrated circuit or components thereof in an extreme environment, particularly for temperatures encountered in outer space, lunar and planetary environments.

Abstract: A computer-implemented method for converting a representation of a system into a behaviour model of the system is provided. The method can be used to convert a schematic diagram into a behavioural model.

Abstract: A simulation device having an ESD (Electro Static Discharge) protection element has a first parameter file creating unit, a second parameter file creating unit, a parameter file storage storing the parameter files created by the first and second parameter file creating units, a parameter file selector changing a parameter file to be selected from the parameter files stored in the parameter file storage, depending on whether or not operation of the ESD protection element should be verified, a netlist creating unit creating a netlist of the semiconductor circuit utilizing the parameter file selected by the parameter file selector, and a simulation executing unit verifying the operation of the semiconductor circuit based on the netlist.

Abstract: An apparatus and method for performing periodic noise (Pnoise) simulation with full spectrum accuracy is disclosed herein. Noise contributions of a circuit under consideration are identified and separated for different computation treatment. The different computation treatment results in computational efficiency without sacrificing accuracy of simulation results.

Abstract: A computer-readable, non-transitory medium stores therein a verification support program that causes a computer to execute a procedure. The procedure includes first detecting a state change in a circuit and occurring when input data is given to the circuit. The procedure also includes second detecting a state change in the circuit and occurring when the input data partially altered is given to the circuit. The procedure further includes determining whether a difference exists between a series of state changes detected at the first detecting and a series of state changes detected at the second detecting. The procedure also includes outputting a determination result obtained at the determining.

Abstract: A method and apparatus models one or more electromagnetic field modes of a waveguide. The method includes calculating a first matrix having a plurality of elements and having a first bandwidth using a refractive index profile of the waveguide. The plurality of elements of the first matrix represents an action of Maxwell's equations on a transverse magnetic field within the waveguide. The method further includes rearranging the plurality of elements of the first matrix to form a second matrix having a second bandwidth smaller than the first bandwidth. The method further includes shifting the second matrix and inverting the shifted second matrix to form a third matrix. The method further includes calculating one or more eigenvalues or eigenvectors of the third matrix corresponding to one or more modes of the waveguide.

Abstract: Circuit component connectivity evaluation and validation method provides comparing and validating the correctness of electrical phase connectivity at connection nodes between conducting components within a circuit model of a power distribution network or other circuit. Phase connectivity requirements of each connected component/device/equipment in a particular circuit are obtained from a Common Interface Model (CIM) file containing parameter data describing the circuit. XML data strings obtained from the CIM file are parsed into enumerated data objects representing each component's phase connectivity requirements and assigned unique four bit binary phase connectivity mask values indicative of the particular electrical phase connectivity requirements of each component.

Abstract: A semiconductor integrated circuit pattern verification method includes executing simulation to obtain a simulation pattern to be formed on a substrate on the basis of a semiconductor integrated circuit design pattern, comparing the simulation pattern and the design pattern that is required on the substrate to detect a first difference value, extracting error candidates at which the first difference value is not less than a first predetermined value, comparing pattern shapes at the error candidates to detect a second difference value, combining, into one group, patterns whose second difference values are not more than a second predetermined value, and extracting a predetermined number of patterns from each group and verifying error candidates of the extracted patterns.

Abstract: A mechanism is provided for verifying a register-transfer level design of an execution unit. A set of instruction records associated with a test case are generated and stored in a buffer. For each instruction record in the set of instruction records associated with the test case: the instruction record is retrieved from the buffer and sent to both a reference model and an execution unit in the data processing system. Separately, the reference model and the execution unit execute the instruction record and send results of the execution of the instruction record to a result checker in the data processing system. The result checker compares the two results and, responsive to a mismatch in the results, a failure of the test case is indicted, the verification of the test case is stopped, and all data associated with the test case is output from the buffer for analysis.

Abstract: Systems and methods for simulating and verifying an analog mixed signal design provide an analog mixed signal testbench configured to verify analog parameters of the design. The testbench can include a mechanism to fetch a value of an analog object in an analog portion of a mixed signal design. The testbench mechanism can include an argument specifying the name of the object and the analog quantity to be fetched for that object. The testbench can retrieve estimated values and can further specify timing constraints specifying absolute times or events at which values are to be measured and returned.

Abstract: A method and an apparatus for controlling voltage level and clock signal frequency supplied to a system.

Abstract: Various embodiments of a system and method for creating and controlling a model of a sensor device for a computer simulation are disclosed. Sensor information specifying physical properties of the sensor device may be received, and a model of the sensor device may be automatically generated using the sensor information. An electrical circuit simulation may be performed using the model of the sensor device. The system and method may enable the user to interactively change the sensor device model during the simulation. The user may interact with a graphical user interface during the simulation to provide input specifying a change in one or more physical properties of the sensor device. In response to the user input, the model of the sensor device may be dynamically modified during the simulation to simulate the change in the one or more physical properties of the sensor device.

Abstract: An energy distribution of soft error-inducing radiation likely to be encountered by an electronic circuit during operation is determined. A tuned radiation source having a source energy distribution similar to the determined energy distribution is prepared. The electronic circuit is tested using the tuned radiation source.

Abstract: A hardware description language representation of an original circuit block containing one or more hierarchies may be obtained. Some, or all of the hierarchies may be dissolved to access each circuit component within the original circuit block at a same level of hierarchy. Designated circuit components may then be grouped together to create new circuit blocks at a new level of hierarchy. Components and signals within each new circuit block may be renamed to match logically corresponding components and signals within each other new circuit block. Missing pins may be added for each new circuit block, and connected to respective associated signals within the new circuit block, and logically equivalent pins may be given the same name to ensure the new circuit blocks are logically equivalent to each other and have identical interfaces.

Abstract: A software system for development, control, programming, simulation, and emulation of fixed, software-configurable, software-reconfigurable, and software-controlled Lab-on-a-chip (“LoC”) devices. Files may be used to specify LoC configurations for models, emulation, and fabrication, and scripts can be implemented to control numerical simulations as well as physical emulations of modeled LoC devices. Other features include a control software design tool, fabrication design systems, and an authoring/editing tool for specification files. In some cases, an active data visualization system provides visualizations of real-time data generated by past and current simulations and emulations.

Abstract: In an embodiment, an aging analysis tool may be configured to identify transistors that are expected to experience aging effects according to worst case stress vectors and/or designer identified worst case conditions. The aging analysis tool may modify a representation of the circuit (e.g. a netlist), replacing the identified transistors with aged transistors (e.g. by modifying parameters of the transistors in the netlist). The aging analysis tool may process the modified netlist over a range of conditions at which the circuit is expected to operate, to ensure that the design meets specifications after aging. The process may be repeated until the aged design meets specifications (with circuit modifications made by the designer to improve the design).

Abstract: A circuit is simulated by using distributed computing to obtain a real solution. The circuit may be an entire integrated circuit, portion of an integrated circuit, or a circuit block. A circuit simulation technique of the invention generates a system graph, finds a tree, and partitions the tree into two or more subtrees. The technique identifies global links and local links in the graph. Each subtree may be solved individually using distributed, parallel computing. Using the results for the subtrees, the technique obtains a real solution, branch voltages and currents, for the circuit.

Abstract: A single finite element mesh is generated for predicting performance of an integrated circuit design. A plurality of sample points are identified for conducting a variability study on at least one parameter associated with the integrated circuit design. The sample points are selected to predict performance of the integrated circuit design when subject to variations in the at least one parameter due to variations in manufacturing processes to be used to manufacture the integrated circuit design. A parameterized netlist is generated corresponding to each of the sample points. A technology computer aided design (TCAD) simulation is run for each of the parameterized netlists, using the single finite element mesh for each of the parameterized netlists, until convergence is achieved, to obtain, for each of the parameterized netlists, at least one metric indicative of the performance of the integrated circuit design. A predicted design yield is developed for the integrated circuit design.

Abstract: A method for automated startup and/or for automated operation of controllers of an electrical drive system with vibrational mechanics with the following steps: (a) determining a preliminary value of at least one parameter; (b) determining a model of the electrical drive system by determination of initially a non-parameterized model through the recording of frequency data during operation of the drive system subject to the utilization of the preliminary value of at least one parameter and the subsequent determination of parameters of the electrical drive system based on the frequency data and subject to optimization of at least one preliminary value of at least one parameter by a numerical optimization method on the basis of the Levenberg-Marquardt algorithm and (c) parameterizing at least one controller of the electrical drive system by at least one of the determined parameters.

Abstract: The present disclosure provides a semiconductor manufacturing method. The method includes performing a first process to a first plurality of semiconductor wafers; determining a sampling rate to the first plurality of semiconductor wafers based on process quality; determining sampling fields and sampling points to the first plurality of semiconductor wafers; measuring a subset of the first plurality of semiconductor wafers according to the sampling rate, the sampling fields and the sampling points; modifying a second process according to the measuring; and applying the second process to a second plurality of semiconductor wafers.

Abstract: A method and system for debugging using replicated logic and trigger logic is described. A representation of a circuit is compiled. One or more signals are selected for triggering and trigger logic is inserted into the circuit. A portion of the circuit is selected for replication. The selected portion of the circuit is replicated and delay logic is inserted to delay the inputs into the replicated portion of the circuit. The representation of the circuit is recompiled and programmed into a hardware device. A debugger may then be invoked. One or more of the triggering signals are selected. For each selected triggering signal, one or more states are selected to setup a trigger condition. The hardware device may then be run. The replicated portion of the circuit will be paused when the trigger condition occurs. The states of registers in the replicated portion of the circuit and the sequence of steps that led to the trigger condition may then be recorded.

Abstract: In a method of synthesizing components to design a system meeting an exergy loss target value, one or more candidate sets of components are synthesized and an exergy loss value for each of the one or more candidate sets of components are calculated. A determination as to whether at least one of the candidate set of components meets the exergy loss target value is made and at least one candidate set of components determined to meet the exergy loss target value is identified as the set of components for use in the design of the system.

Abstract: The present invention provides an equivalent electrical model of a Silicon On Insulator (SOI) Field Effect Transistor (FET) of a body leading-out structure, and a modeling method thereof. The equivalent electrical model is formed by an internal FET and an external FET connected in parallel, where the SOI FET of a body leading-out structure is divided into a body leading-out part and a main body part, the internal FET represents a parasitic transistor of the body leading-out part, and the external FET represents a normal transistor of the main body part. The equivalent electrical model provided in the present invention completely includes the influence of parts of a physical structure of the SOIMOSFET device of a body leading-out structure, that is, the body leading-out part and the main body part, on the electrical properties, thereby improving a fitting effect of the model on the electrical properties of the device.

Abstract: A software tool and method for performing a simulation of a circuit to automatically test a circuit design are disclosed. A series of primary transactions may be performed on the circuit under test. Resources in the circuit may be monitored to identify the state changes, and a set of new transactions to perform on the circuit may be automatically generated based on the state changes of the resources. The new transactions may then be performed on the circuit. The new transactions that are generated may not be pre-determined transactions, but rather may be transactions that are dynamically generated or learned during the simulation, e.g., in an intelligent manner.

Abstract: A mechanism for improving speed of simulation of complex circuits that include transistors and other devices that share similar properties is provided. Circuit simulation speed is improved by efficiently identifying transistors and other devices having identical properties that share a same state at the time of interest in the simulation. Transistors and other devices are collected into groups having the same characteristics and topologies prior to simulation. Then during simulation, a determination is made as to whether a previously-evaluated transistor or device in the same group as a presently-being evaluated transistor or device has terminal input values that are the same, or nearly the same. If so, then output values of the previously-evaluated transistor or device are used in calculating the output values of the present transistor or device.

Abstract: In a method for increasing coverage convergence during verification of a design for an integrated circuit, multiple simulation runs can be performed. Symbolic variables and symbolic expressions can be generated for the variables and the variable expressions in the hardware code of the design and a test bench. Exemplary hardware code can include the hardware description language (HDL) code and/or the hardware verification language (HVL) code. Symbolic properties, which are derived from propagating the symbolic variables and symbolic expressions through the design and the test bench during the multiple simulation runs, can be collected. Coverage information from the multiple simulation runs can be analyzed to identify coverage points to be targeted. At this point, for each identified coverage point, the constraints resulting from the collected symbolic properties can be solved to generate directed stimuli for the design. These directed stimuli can increase the coverage convergence.

Abstract: A simulation model is provided for flip-chip BGAs to help engineers determine the effects of IC package components. The simulation model includes a bump model, a package planes model, a package bypass capacitor model, a ball model and a PCB model. The simulation model in particular includes resistors, inductors, capacitors and transmission lines to simulate the electrical interaction between signal conductors, power/ground planes, vias and balls that exist in a flip-chip ball grid array (BGA) package. The simulation model helps engineers understand actual physical effects of flip-chip and IC package interactions, as well as the impact of the effects of power supply droop, ground bounce and crosstalk between adjacent signals, not only on the IC package level, but at the computer system level.

Abstract: An embodiment of the invention relates to an integrated circuit such as an FPGA wherein a stable unique identifier is produced by reading an intrinsic characteristic of the IC such as a physically unclonable function, and a related method. In one embodiment, a first unique identifier is generated using the intrinsic characteristic and is subdivided into a plurality of first subsets. A second unique identifier is received and subdivided into a plurality of second subsets. The first and second subsets are compared to identify matching subsets to generate the stable unique identifier. Each of the one or more matching subsets includes a particular one of the plurality of first subsets that matches a corresponding one of the plurality of second subsets. The stable unique identifier can be integrated into logic of the IC. Prior to comparing the subsets, the first and second subsets can be transformed with one-way functions.

Abstract: Semiconductor fabrication using statistical analysis (400) to determine the robustness or reliability of a fabricated integrated circuit module given global and local variations of operating parameters of elements, such as transistors, of the module. Multiple sequences of statistical simulations (408, 414) are run to ascertain (416) the robustness of the module to local variations in an environment of global variations.

Abstract: A method for computing power consumption includes querying a software database for a key node and a gate comprising an input port, connected to the key node, and an output port. The software database is created from a net list associated with a design. The method includes calculating a probability of activity level at the output port based on a predetermined activity level at the key node, and querying the software database for next gate comprising a next input port, connected to the previous output port, and a next output port. The method includes calculating a probability of activity level at the next output port based on the probability of activity level at the previous output port. The method includes computing a sub-circuit gate power by sum of power of all the gates based on the probability of activity level at output ports of the gates.

Abstract: A computer-readable, non-transitory medium stores therein a design support program that causes a computer capable of accessing a storage device storing therein for each cell, an output voltage value of the cell, for each elapsed time period from a start of variation of an input voltage applied to the cell, to execute a process. The process includes extracting from the storage device, the output voltage value for each elapsed time period related to an cell under design selected from circuit information of a circuit under design; determining based on a specific voltage value, an extracted elapsed time period to be corrected; adding a time constant of an output from the cell under design to the elapsed time period determined to correction; and outputting the output voltage value for each corrected elapsed time period and the output voltage value for each elapsed time period that is not determined for correction.

Abstract: A non-transitory, computer-readable recording medium stores therein a program causing a computer to execute calculating, using respective standard deviations of first delay distributions of delay variation independent to each element included in a path among parallel paths in a circuit, standard deviation of a first delay distribution of the path when modeled as a series circuit; correcting the standard deviation of the first delay distribution for each element, using the calculated standard deviation of the first delay distribution of the path and a standard deviation of a first delay distribution of the path obtained by a statistical delay analysis on the circuit; obtaining a correlation distribution representing a correlation between delay and leak current of the circuit by executing, using the corrected standard deviation of the first delay distribution for each element, correlation analysis between delay and leak current of the target circuit; and outputting the obtained correlation distribution.

Abstract: The present invention certifies control modules of engineered safety feature instruments for a power plant automatically. The control modules can be tested before storing or operating. The test is done with enhanced testing speed and saved cost. Thus, safety of the control modules is confirmed.

Abstract: A model parameter extracting apparatus includes: a binning processor for carrying out a binning process; and a model parameter extractor for extracting a model parameter for each of multiple bins formed by the binning process. The model parameter extractor extracts a first model parameter corresponding to a first end portion of a target bin. Based on the first model parameter, the model parameter extractor sets up a candidate for a second model parameter corresponding to a second end portion of the target bin. Subsequently, based on the first model parameter and the candidate for the second model parameter, the model parameter extractor finds a start-point-side gradient and an end-point-side gradient of a limited curve representing an electric characteristic of a semiconductor device. Then, based on a result of a comparison between the gradients, the model parameter extractor extracts the second model parameter.

Abstract: Simulation of an electronic circuit including a model of a ferroelectric capacitor. The model of the ferroelectric capacitor includes a multi-domain ferroelectric capacitor, in which each of the domains is associated with a positive and a negative coercive voltage. A probability distribution function of positive and negative coercive voltages is defined, from which a weighting function of the distribution of domains having those coercive voltages is defined. To create a model of a small ferroelectric capacitor, a Poisson probability distribution is assigned to each of an array of gridcells defining the probability distribution function of positive and negative coercive voltages, and a number of domains assigned to each gridcell is randomly selected according to that Poisson distribution and an expected number of domains in the modeled capacitor for that gridcell, based on the area of the modeled capacitor.