Abstract: A method of predicting a substrate current in a high voltage device that may accurately predict substrate current components in each of a first region, a second region, and a third region. This may be accomplished by modeling a substrate current component in a third region, in which an inconsistency may occur when a substrate current in a high voltage device is calculated, for example using BSIM3-based modeling. According to embodiments, a substrate current for a third region may be modeled by an expression with a ternary operator, and the modeled substrate current may be added to a substrate current obtained through BSIM3-based modeling.

Abstract: Evaluation by logic simulation can be favorably performed. A target packet determination part determines if a target packet which is a response packet that is to be transmitted with respect to a request packet that is received is in a simulation result table. When there is a target packet, a response packet output reads out and transmits the target packet from the simulation result table. On the other hand, when there is no target packet, a system controller forces a logic simulator to perform logic simulation regarding the received request packet, disconnects a connection with an opposing connection device, so as to perform reconnection after completion of the logic simulation by the logic simulator. A table generating part writes the request packet and the response packet obtained by the logic simulator into the simulation result table, the request packet and the response packet being made correspondent to each other.

Abstract: A system and method is disclosed for breaking a feedback loop by replacing at least one component in the feedback loop with a model containing two physically disconnected subnetworks that have terminals that are connected to ground with voltage controlled, voltage sources (VCVSs). Dependent source parameters of the VCVSs control lateral signal transfer though the model allowing the feedback loop to be opened or closed. The model maybe used in a software simulation in which a replicate circuit is used to set and maintain a closed-loop bias on the open-loop circuit. Small-signal analysis of the equivalent open-loop circuit allows extraction of transfer functions that yield a return ratio RR(s) corresponding to the modeled component.

Abstract: According to the embodiments, an impact ionization current is calculated based on a drain transverse electric field calculation formula in which a saturated source-drain voltage is given by a function of a source-gate voltage and a source-drain voltage.

Abstract: In an electronic device and a method of generating composite electrical signals, a plurality of post-processing software is installed. An output file, which comprises times and voltages of data points that represent an electrical signal, of an electronic circuit simulation software is loaded, and is read using the installed post-processing software. A time interval of outputs of the electrical signal is obtained by selecting an output type of the electrical signal. The worst bit combination of outputs of the electrical signal is analyzed according to the times, the voltage, and the time interval, and a composite electrical signal is generated according to the worst bit combination.

Abstract: One aspect provides a method of standardized data creation and analysis of semiconductor technology node characteristics. In one embodiment, the method includes: (1) designing at least one representative benchmark circuit, (2) establishing standard sensitization and measurement rules for delay and power for the at least one representative benchmark circuit and across corners in the technology nodes, (3) performing a simulation by sweeping through a range of values and at predetermined intervals across the corners, (4) extracting data from the simulation and (5) parsing and interpreting the data to produce at least one report.

Abstract: A computer-implemented method may include defining an input bus signal in a graphical block diagram model by associating the input bus signal with a first group of signals, at least two of the first group of signals having a different data type; defining an output bus signal in the graphical block diagram model by associating the second bus signal with a second group of signals, each of the second group of signals corresponding to one of the first group of signals; defining an input to a non-virtual operation block in the graphical block diagram model as the input bus signal; defining an output to the non-virtual operation block in the graphical block diagram as the output bus signal; and simulating an operation performed on the input bus signal by the non-virtual operation block, the operation being performed on each of the first group of signals and output to each of the second group of signals.

Abstract: Described herein are embodiments of methods for extracting various high frequency parameters for a circuit design. In one exemplary embodiment, circuit design information indicating at least a geometric layout of conductors in the circuit design and a desired frequency of operation for the circuit design is received. Conduction modes representing distribution functions for currents in the conductors at the desired frequency of operation are defined. A conduction mode matrix including matrix elements based on the defined conduction modes is generated. Values for one or more matrix elements are computed by decomposing integrands for calculating the matrix elements into simplified terms that are less computationally intensive than the integrands and computing the values of the simplified terms. The values for the one or more matrix elements can be stored (e.g., on one or more computer-readable media).

Abstract: Methods and apparatuses for retiming of multirate system for clock period minimization with a polynomial time without sub-optimality. In an embodiment, a normalized factor vector for the nodes of multirate graph is introduced, allowing the formulation of the multirate graph retiming constraints to a form similar to a single rate graph. In an aspect, the retiming constraints are formulated to allowed the usage of linear programming methodology instead of integer linear programming, thus significantly reducing the complexity of the solving algorithm. The present methodology also uses multirate constraints, avoiding unfolding to single rate equivalent, thus avoiding graph size increase. In a preferred embodiment, the parameters of the multirate system are normalized to the normalized factor vector, providing efficient algorithm in term of computational time and memory usage, without any sub-optimality.

Abstract: A method of generating debug data in a simulation environment includes generating a listing of one or more signals that relate to a failure signal; monitoring simulation data of the one or more signals for transitions between a defined state and an undefined state; and generating a waveform of data based on the transitions between the defined state and the undefined state.

Abstract: A Hardware Description Language (HDL) processing method is implemented in a computer and processes a HDL file which is written in HDL having a hierarchical structure including three or more hierarchical levels in a Computer-Aided Design (CAD) which supports hardware design. The HDL processing method analyzes the hierarchical structure of the HDL and obtaining an analysis result, and processes the HDL one at a time for each hierarchical level based on the analysis result or, process the HDL one at a time by a parallel distributed processing for each hierarchical level based on the analysis result.

Abstract: The present invention relates to an automata unit, a tool for designing circuitry and/or checker circuitry, and a method for manufacturing hardware circuitry. The automata unit includes an input unit for receiving assertions using Boolean expressions, an automata generator for translating the assertions into automata, and an automata adaptor. The automata generator uses a dual layer symbolic alphabet for representing the assertions, and the automata adaptor adapts automata algorithms so as to support the symbolic alphabet in the generated automata. The tools for designing circuitry and checker circuitry rely on the automata unit, and further include an assertion unit and either a circuit generator or a checker generator.

Abstract: A lithography model uses a transfer function to map exposure energy dose to the thickness of remaining photoresist after development; while allowing the flexibility to account for other physical processes. In one approach, the model is generated by fitting empirical data. The model may be used in conjunction with an aerial image to obtain a three-dimensional profile of the remaining photoresist thickness after the development process. The lithography model is generally compact, yet capable of taking into account various physical processes associated with the photoresist exposure and/or development process for more accurate simulation.

Abstract: Provided are a device model, a recording medium storing a program, a simulation circuit, device, and method that calculate a local temperature increase in an element. The device model according to the present invention is used for a semiconductor circuit simulation and has at least two model parameters. The model parameters include an electrical model describing temperature characteristics and a thermal model describing thermal characteristics and corresponding to the electrical model.

Abstract: Some embodiments of the invention provide a process for designing and manufacturing an integrated circuit (“IC”). The process selects a wiring configuration and an illumination configuration. The process uses the selected wiring configuration to design an IC layout. The process then uses the selected illumination configuration to manufacture the IC based on the designed IC layout. Some embodiments select a wiring configuration based on the selected illumination configuration. In some embodiments, selecting the illumination configuration entails selecting at least one stepper lens for the IC layout, where the stepper lens illuminates at least one mask for at least one particular layer of the IC layout. Also, in some embodiments, selecting the wiring configuration entails defining the width and/or spacing of the routes along different directions on at least one particular wiring layer of the IC layout.

Abstract: Functional coverage techniques during design verification using cross-product coverage models and hole analysis are enhanced by the use of coverage queries. After running a test suite, a core set of non-covered events is specified. A coverage query is then automatically constructed and executed on the test results to identify a hole in the functional coverage that satisfies conditions of the coverage query and includes the core set. The results of the query are presented as a simplified view of the coverage of the events in the cross-product space. Use of coverage queries allows a verification team to focus on specific areas of interest in the coverage space and to deal practically with highly complex coverage models. It also avoids the burden of producing and evaluating complete hole analysis reports.

Abstract: A method and apparatus for producing a verification of digital circuits is provided. In an exemplary embodiment, a set of Boolean and Integer constraints are derived, and a set of Boolean and Integer stimuli are generated that meet the constraints. These stimuli are then used to verify a digital design, and a verification report is generated. In other example embodiments, a computing apparatus and computer software product are provided. The computer software product containing a set of executable instructions that, when executed, configure the computing apparatus to produce a verification report by the provided methods.

Abstract: A simulation apparatus according to an embodiment performs an electromagnetic field circuit coupling analysis on a first substrate and a second substrate electrically coupled via a circuit element having a finite delay time. A first coupling analysis unit carries out a time domain electromagnetic field analysis and also a circuit analysis on a circuit element at a first analytical domain including the first substrate. The second coupling analysis unit carries out a time domain electromagnetic field analysis and also a circuit analysis on a circuit element at a second analytical domain including the second substrate.

Abstract: Systems, apparatuses, methods, and computer program products for performing silicon debugging and isolating faults in integrated circuits are disclosed. Some embodiments comprise a simulator to simulate operation of one or more portions of a circuit in order to identify elements of the circuit which are related to a fault, a circuit pruner to separate the related elements from other elements of the circuit and correlate the related elements to a physical layout of the elements, and a probe tool to locate one or more of the related elements which cause or contribute to the fault. Alternative embodiments may comprise computer programs for simulating operation of a circuit to determine related elements of a fault, correlating the related elements to a physical layout or arrangement of the elements in the circuit, and testing the related elements via the physical layout to determine which elements contribute to the fault.

Abstract: Operating splitting methods for splitting a circuit into two sub circuits and analyzing the two sub circuits with improved computation efficiency and processing speed.

Abstract: In a verification supporting apparatus, a recording unit records a DIRW matrix in which a state transition possibly occurring in a register of a circuit to be verified and information concerning validity of a path corresponding to the state transition are set and an acquiring unit acquires a control data flow graph that includes a control flow graph having a data flow graph written therein. When a register is designated for verification, a data flow graph having described therein the designated register is extracted from the control data flow graph. From the data flow graph extracted, a path indicating the flow of data concerning the register is extracted. The state transition of the path extracted is identified and if the state transition is determined to be is set in the DIRW matrix, information concerning the validity set in the DIRW matrix and the path are correlated, and output.

Abstract: There is provided a system and method for statistical timing analysis and optimization of an electrical circuit having two or more digital elements. The system includes at least one parameter input and a statistical static timing analyzer and electrical circuit optimizer. The at least one parameter input is for receiving parameters of the electrical circuit. At least one of the parameters has at least one of a non-Gaussian probability distribution and a non-linear delay effect. The statistical static timing analyzer and electrical circuit optimizer is for calculating at least one of a signal arrival time and a signal required time for the electrical circuit using the at least one parameter and for modifying a component size of the electrical circuit to alter gate timing characteristics of the electrical circuit based upon the at least one of the signal arrival time and the signal required time.

Abstract: The present invention provides a signal analyzing method for an electronic device having an on-chip network and an off-chip network. Compared with the conventional signal analyzing method for an electronic device having an on-chip network and an off-chip network, the signal analyzing method of the present invention is able to provide a complete electrical connection and accurate electrical characteristics for an electronic device having an on-chip network and an off-chip network.

Abstract: An electronic design automation (EDA) tool for and method of optimizing a placement of process monitors (PMs) in an integrated circuit (IC). In one embodiment, the EDA tool includes: (1) a critical path/cell identifier configured to identify critical paths and critical cells in the IC, (2) a candidate PM position identifier coupled to the critical path/cell identifier and configured to identify a set of candidate positions for the PMs, (3) a cluster generator coupled to the critical path/cell identifier and configured to associate the critical cells to form clusters thereof and (4) a PM placement optimizer coupled to the candidate PM position identifier and the cluster generator and configured to place a PM within each of the clusters by selecting among the candidate positions.

Abstract: In a graphical modeling environment, bus signals, which group a plurality of signals together for simplifying a model, include a partial or complete physical definition. Models are simplified by passing bus signals through graphical objects representing functional entities, without degrouping the bus signal. During simulation of the model, code can be generated for the bus signal having a complete definition independent of other components of the graphical model.

Abstract: A multi-path simulation system (100) includes a signal generator (10) generating a signal, a power divider (24) connected to the signal generator for dividing the signal into N attenuated sub-signals, N delay lines (26) connected to the power divider delaying the N attenuated sub-signals to simulate the delays resulting from the transmission of the signal in the N paths, P switches (28) connected to the delay lines selecting the attenuated sub-signals delayed by the delay lines, thereby generating selected signals, and a signal combiner (29) connected to the switches combining the selected signals into a single signal. The delay lines are respectively represented by transmission lines disposed on a printed circuit board. A length of the transmission line controls a distance of transmission of the signal. Wherein N is an integer greater than one, and P is an integer equal to or greater than one.

Abstract: A computer-implemented method of implementing a circuit design within a programmable logic device can include selecting at least one circuit element of the circuit design. The selected circuit element can be converted to a latch. A timing analysis can be performed upon the circuit design after conversion of the selected circuit element to a latch. A determination can be made as to whether the timing of the circuit design improves and the conversion of the selected circuit element to a latch can be accepted when the timing of the circuit design improves. The circuit design can be output.

Abstract: A method for injecting timing irregularities into test patterns self-generated by a device under test (DUT) includes obtaining timing irregularities, receiving the test patterns generated by the device under test driven from output drivers of the DUT, injecting the timing irregularities into the test patterns to generate test patterns with timing irregularities injected therein, and applying the test patterns with timing irregularities injected therein to input receivers of the DUT. A tester is configured to test loopback functionality of a device under test (DUT) utilizing a timing irregularities injection apparatus which receives timing irregularity data readable by the tester and test data generated by the DUT, and injects the timing irregularity data into the test data for application to the DUT.

Abstract: A configurable logic tool that allows minimization of dynamic power within an FPGA design without changing user-entered specifications. The minimization of power may use minimized clock nets as a first order operation, and a second order operation that minimizes other factors, such as area of placement, area of clocks and/or slack.

Abstract: An Integrated Circuit Design tool incorporating a Stochastic Analysis Process (“SAP”) is described. The SAP can be applied on many levels of circuit components including transistor devices, logic gate devices, and System-on-Chip or chip designs. The SAP replaces the large number of traditional Monte Carlo simulations with operations using a small number of sampling points or corners. The SAP is a hierarchical approach using a model fitting process to generate a model that can be used with any number of performance metrics to generate performance variation predictions along with corresponding statistical information (e.g., mean, three-sigma probability, etc.). A hierarchical SAP process breaks an overall circuit into a plurality of subcircuits and performs circuit simulation and SAP analysis steps on each subcircuit. An integration and reduction process combines the analysis results of each subcircuit, and a final SPICE/SAP process provides a model for the overall circuit based on the subcircuits.

Abstract: A computer implemented representation of a circuit design including memory is abstracted to a smaller netlist, which can be analyzed by standard verification tools and by other tools that operate on netlists. The correctness of such systems can require reasoning about a much smaller number of memory entries than exist in the circuit design, and by abstracting such memories to a smaller number of entries, the computational complexity of the verification problem is substantially reduced.

Abstract: A method, system, and computer program product are disclosed for using pattern-dependent models at early stages of the design process. This addresses the key disadvantage of prior approaches which are restricted to using such models later in the design process for IC designs that are nearly complete. Pattern-dependent manufacturing effects are extracted from early stage designs and using the extracted pattern-dependent effects to efficiently and effectively design the integrated circuit. One or more contexts are built around one or more units of the design, with examples of units being a block or cell. The units are then used in the context to generate pattern-dependent data as a basis for one or more pattern-dependent models.

Abstract: A semiconductor integrated circuit includes multiple cells each containing transistors. The transistors include a gate and diffusion layers. The multiple cells are adjacently formed in a first direction perpendicular to the gate. The distance between the cell border and the adjacent and corresponding diffusion layer, the first direction, is the same.

Abstract: A computer-implemented method of measuring bridge fault coverage for a test pattern for a circuit design to be implemented within a programmable logic device can include identifying simulation results and stuck at coverage of the circuit design for the test pattern (610, 620). Pairs of nets in the circuit design that are adjacent can be identified (625). Each type of bridge fault for which each pair is tested can be determined according to the simulation results (640, 645, 655, 660). A measure of bridge fault coverage for the test pattern can be calculated according to which types of bridge faults each pair is tested and which net of each pair acts as an aggressor for each type of bridge fault tested (675). The measure of bridge fault coverage can be output (680).

Abstract: A system is provided for modeling an integrated circuit including at least one insulated-gate field-effect transistor. The system includes generator means for defining a parameter representing mechanical stresses applied to the active area of the transistor, and processing means for determining at least one of the electrical parameters of the transistor based at least partially on the stress parameter. Also provided is a method of modeling an integrated circuit including at least one insulated-gate field-effect transistor, and a method of producing an integrated circuit including at least one insulated-gate field-effect transistor.

Abstract: A system for reducing the signal delay skew is disclosed, according to a variety of embodiments. One illustrative embodiment of the present disclosure is directed to a method. According to one illustrative embodiment, the method includes receiving an initial netlist comprising components and connection paths among the components. The method further includes identifying one or more skew-influencing features in a first connection path in the initial netlist that lack corresponding skew-influencing features in a second connection path in the initial netlist. The method also includes generating a skew-corrected netlist wherein the second connection path includes one or more added skew-influencing features corresponding to those of the first connection path. The method further includes outputting the skew-corrected netlist.

Abstract: Techniques for electronic circuit design simulation are provided. In one aspect, a method for electronic circuit design simulation includes the following steps. A model (e.g., a physics-based model) of the circuit design is created. Error tables are created containing data related to one or more regions of the circuit design. The model is modified with data from the error tables. The modified model is used to simulate the circuit design.

Abstract: Network-on-Chip (NoC) is to solve the performance bottleneck of communication in System-on-Chip, and the performance of the NoC significantly depends on the application traffic. The present invention establishes a system framework across multiple layers, and defines the interface function behaviors and the traffic patterns of layers. The present invention provides an application modeling in which the task-graph of parallel applications is described in a text method, called Parallel Application Communication Mechanism Description Format. The present invention further provides a system level NoC simulation framework, called NoC-centric System Exploration Platform, which defines the service spaces of layers in order to separate the traffic patterns and enable the independent designs of layers. Accordingly, the present invention can simulate a new design without modifying the framework of simulator or interface designs.

Abstract: A method for determining a predicted soft error rate (SER) for an integrated circuit device design includes calculating the SER based on a predicted amount of charge imparted by a one or more particles to the integrated circuit device based on the design. The SER is further based on a predicted sensitivity level of a region of the integrated circuit device to the charge imparted by the one or more particles, and can also be based on the energy spectrum of the particles.

Abstract: A method includes accepting a simulation task for simulation by a simulator that controls multiple co-simulators. Each of the multiple co-simulators is assigned to execute one or more respective sub-tasks of the simulation task. The simulation task is executed by invoking each co-simulator to execute the respective assigned sub-tasks.

Abstract: A mechanism for providing equation-level diagnostic error messages for system models undergoing circuit simulations is discussed. The components in a model of a system being simulated are converted into multiple numerical equations where each equation corresponds to a component in the system being simulated or a topology equation for the system model. Each numerical equation is numerically analyzed in order to identify illegal configurations in the system. Upon detection of an error, an error message listing the components associated with the illegal configuration is generated for the user.

Abstract: A method for simulating a complex system including a plurality of constituents is provided. The method includes constructing at least one complex system model, each system model including a hierarchised set of modelled constituents. The construction step includes, for each model, obtaining a multiple instance hierarchical model including at least one instance vector corresponding to a plurality of instances of one and the same modelled constituent, each instance vector being able to be located at any level of a hierarchical decomposition tree of the multiple instance hierarchical model. The construction step additionally includes, for each model, expanding the multiple instance hierarchical model into an expanded model by expansion of at least one instance vector included in the multiple instance hierarchical model.

Abstract: A method and an apparatus for indirectly simulating a semiconductor integrated circuit (IC) are described. A circle chain is formed using input pins and output pins to provide an intellectual property (IP) core model that substitutes for a real IP core circuit. A test bench for the IP core model is generated, the semiconductor IC that includes the IP core model is integrated using the generated test bench, and the semiconductor IC is simulated.

Abstract: A system and method is provided which predicts problematic areas for lithography in a circuit design, and more specifically, which uses modeling data from a modeling tool to accurately predict problematic lithographic areas. The method includes identifying surface heights of plurality of tiles of a modeled wafer, and mathematically mimicking a lithographic tool to determine best planes of focus for exposure for the plurality of tiles.

Abstract: One embodiment of the invention provides a system for speeding up an iterative process that simulates and, if necessary, corrects a layout of a target cell within an integrated circuit so that a simulated layout of the target cell matches a desired layout for the target cell. The system operates by determining if the target cell is similar to a preceding cell for which there exists a previously calculated solution. If so, the system uses the previously calculated solution as an initial input to the iterative process that produces the solution for the target cell.

Abstract: Provided are a method and apparatus for analyzing a circuit model by reducing, and a computer program product for analyzing the circuit model. The circuit model at least includes independent current source models, resistance models, and capacitance models. Also, the circuit model forms a resistance capacitance (RC) network with independent current sources. The method includes selecting a node to be removed using resistance information and comparing conductance of a capacitor for a given time step and the total conductance of the node. Further, the method includes removing the selected nodes and generating RC elements and independent current sources using adjacent nodes, which maintain the accuracy of node voltages of a circuit reduced in an accuracy order used for entrywise perturbation of the corresponding circuit equation. Moreover, an efficient method of handling the independent current sources while reducing the circuit is provided.

Abstract: A method is provided for constructing at least a functional model of a complex system including a plurality of components. The method includes constructing the functional model of the complex system, including a hierarchized set of modelled functional components. Each of the functional modelled components is an instance of an object class belonging to a specific set of object classes. The specific set of object classes includes a “Functional Router” class, representing an abstract model of a dummy router, which describes a set of interconnections between at least two modelled functional components, each instance of the “Functional Router” class being called a modelled functional router. The functional model of the system includes at least one functional modelled router.

Abstract: The present invention relates generally to semiconductor wafer fabrication and more particularly but not exclusively to predictive, pre-fabrication methodologies for determining inefficiencies in an integrated circuit (IC) design. The present invention, in one or more implementations, provides an effective pre-production methodology for predicting the efficiency and behavior of a designed ESD protective circuit and testing the ESD protective circuit with a simulated IC. The method of the present invention yields predictive results that have been comparatively tested.

Abstract: Methods and apparatuses for enforcing terms of a licensing agreement between a plurality of parties involved in a particular hardware design through the use of hardware technologies. According to one embodiment, a hardware sub-design includes a license verification sub-design that is protected from user modification by encryption. In one embodiment, a license is generated based on a trusted host identifier within an external hardware device. In one embodiment, each trusted host identifier is unique, and no two integrated circuits share the same trusted host identifier. In another embodiment, the integrated circuit is a field programmable gate array or an application specific integrated circuit. In one embodiment, a license determines how long the hardware sub-design will operate when the hardware sub-design is implemented within an integrated circuit having a trusted host identifier.

Abstract: The present disclosure relates to a curve-fitting procedure for determining proximity effect device parameters in semiconductor fabrication. Methods presented herein are adapted to determine the impact of narrow width related edge effects on device characteristics by comparing two-dimensional (2D) and/or three-dimensional (3D) device simulations. Methods presented herein are adapted to determine the accuracy of conventional extraction methods utilizing non-rectangular gate device simulation.