Abstract: Provided is a test apparatus that tests a device under test, including a vector expanding section that sequentially generates a plurality of test vectors; a vector selecting section that selects test vectors that cause a prescribed characteristic of the device under test, which is to be measured when test signals that are each based on one of the test vectors are supplied to the device under test, to fulfill a preset condition; and a judging section that judges pass/fail of the device under test based on measured values of the prescribed characteristic of the device under test supplied with the test signal based on the test vectors selected by the vector selecting section.

Abstract: Various techniques involving snapshots of the contents of registers are described and claimed. In some embodiments, a method includes receiving descriptions of design circuitry including design registers to receive register input signals. The method also includes generating additional descriptions through at least one computer program including descriptions of additional registers (snapshot registers) to receive snapshots of the register input signals, wherein the additional registers provide register initial condition signals for use in a simulation of at least a portion of the design circuitry. Other embodiments are described.

Abstract: Extended linear superposition methods, computer program products and systems to calculate Simultaneous Switching Noise (SSN) on victim Input/Output (I/O) pins of an electronic component caused by aggressor I/O pins is provided. A method includes calculating the quiet output voltage on a victim pin caused by the power supply only, and then calculating an aggressor noise response induced on the victim pin caused by a single aggressor pin and the power supply. To calculate SSN for a combination of aggressors, the SSNs for the different aggressors are linearly combined, and then the effects of the power supply are discounted by using the calculated quiet output voltage. Additionally, a linear victim substitution model is introduced to replace a full buffer model for a victim pin with a resistor with different resistance values depending on the induced voltage. Further, an alternate transmission line model is introduced to simplify SSN simulations of transmission lines.

Abstract: The drift region for increasing the breakdown voltage in an LDMOSFET is regarded as a resistive element. The potential distribution of the overall device is calculated by obtaining a potential distribution considering the resistance by iterative calculation. A capacitance generated in the drift region is analytically calculated assuming a linear potential distribution. A capacitance generated in the overlap region between the gate electrode and the drift region is calculated by considering the potential from the depletion region to the accumulation region.

Abstract: Improved responses can be generated to scan patterns (e.g., test patterns) for an electronic circuit designs having timing exception paths by more accurately determining the unknown values that propagate to observation points in the circuit, where the response is captured. For instance, the responses are determined more accurately by analyzing the effect of sensitizing a timing exception path during each time frame associated with a scan pattern. Path sensitization can be determined based on observing whether values injected at starting points of the timing exception paths due to signal transitions and glitches propagate to their end points. The response can be updated by masking the affected end points and propagating unknown values further in the circuit to determine whether they are captured at observation points of the circuit. For instance, the methods and systems described herein may result in reduced unknowns, improved test coverage and test compression.

Abstract: A verification target register to be verified is specified from a configuration of a verification target circuit, and patterns requiring verification are extracted as a coverage standard with regard to the specified verification target register. When the patterns are extracted, a DIRW matrix is prepared to indicate possibly occurring state transitions among four states Declare, Initialize, Read, and Write in the register included in the verification target circuit, and used to decide two coverage standards, a matrix coverage standard and an implementation coverage standard.

Abstract: Single hardware subsystems that present two software views that appear to be two separate hardware subsystems attached in a hierarchy are implemented with PCI arrangements. In an embodiment, a hardware arrangement is configured to emulate two virtually separate hierarchical subsystems in a single hardware block. This emulation facilitates the coupling of devices to PCI Express communications links while addressing PCI-Express linking requirements for such devices.

Abstract: Methods, software, and apparatus for providing a netlist for simulation that includes one or more parameters that are determined by one or more pattern dependent effects. One particular embodiment of the present invention receives a layout of a circuit including one or more MOSFET transistors. For one or more of the MOSFET transistors, spacing between transistors is measured using the received layout and a pattern dependent parameter is determined. This parameter modifies the length of the gate that is used in simulation. In other embodiments, other pattern dependent effects can be used to determine the values of one or more parameters. These parameters may be used to modify gate length, emitter size, resistor width, or other device characteristics.

Abstract: Methods for analyzing circuit distortion based on contributions from separate circuit elements are presented. Local approximations that do not require high-order derivatives of device models are developed near an operating point for calculating distortion summaries including compression summaries and second-order intermodulation (IM2) distortion summaries.

Abstract: A circuit simulation model generation apparatus includes: a power supply wiring model generation section that generates a power supply wiring model which is a model of the power supply wiring; a logic circuit model generation section that generates a logic circuit model which is a model of the logic circuit; and a link section that adds, to the logic circuit model and the power supply wiring model, a voltage controller that acquires a potential value of a logic circuit connecting terminal and gives the acquired potential value to a power supply wiring connecting terminal and a current controller that acquires a current value of the power supply wiring connecting terminal and gives the acquired current value to the logic circuit connecting terminal in the simulation, and links the logic circuit model and the power supply wiring model to generate a simulation model.

Abstract: A memory hub device with test logic is configured to communicate with memory devices via multiple hub device ports, and is also configured to communicate on one or more busses in an upstream and downstream direction. The test logic includes a built-in self test apparatus providing logic to simultaneously and independently test the memory devices interfaced to one or more of the hub device ports using read and write data patterns. The test logic also includes configuration registers to hold fault and diagnostic information, and to initiate one or more tests. The memory hub device can further include command collision detection logic, a trace array, buffer transmit mode logic, trigger logic, clock adjustment logic, transparent mode logic, and a configured command sequencer, as well as additional features.

Abstract: A method, system and program are provided for development of an adaptive computing integrated circuit and corresponding configuration information, in which the configuration information provides an operating mode to the adaptive computing integrated circuit. The exemplary system includes a scheduler, a memory, and a compiler. The scheduler is capable of scheduling a selected algorithm with a plurality of adaptive computing descriptive objects to produce a scheduled algorithm and a selected adaptive computing circuit version. The memory is utilized to store the plurality of adaptive computing descriptive objects and a plurality of adaptive computing circuit versions generated during the scheduling process. The selected adaptive computing circuit version is converted into a hardware description language, for fabrication into the adaptive computing integrated circuit.

Abstract: A model for a silicon controlled rectifier includes three diode models connected in series, with the middle diode model being reverse biased. Each diode model corresponds to and can be configured to simulate DC operation of a junction in the silicon controlled rectifier. The model can be used to evaluate behavior of a circuit that includes the silicon controlled rectifier. For example, the circuit can include an electrostatic discharge protection circuit that includes the silicon controlled rectifier.

Abstract: A method of testing a physical manufacturing automation system for manufactured work pieces is provided via a testing system and includes connecting a computer-simulated manufacturing automation system to a controller of the physical manufacturing automation system, wherein the computer-simulated manufacturing automation system is configured to represent a portion of the physical manufacturing automation system, including a simulated work piece. The method then includes concurrently running the physical manufacturing automation system and the computer-simulated manufacturing automation system via the controller, with the physical automation system running in the absence of the physical work pieces.

Abstract: A method of producing a temperature model of a surface of an object using ultrasonic transducers comprises the steps of iteratively adjusting a temperature model by using measured travel times of ultrasonic waves and their predictions model-based. The ultrasonic waves used for producing the temperature model are preferably substantially non-dispersive ultrasonic waves. The method may further involve a height model of the surface, which height model is produced using substantially dispersive ultrasonic waves and is corrected by using the temperature model.

Abstract: Some embodiments of the present invention provide a method of circuit design and circuit simulation. A method for electrical modeling of passive structures of a circuit design wherein the passive structures have DC properties is disclosed. The method comprises constructing a physical topology based on the passive structures of the circuit design, mapping the physical topology to a network of EM modeling elements, and determining parameters of the EM modeling elements to model the passive structures based on electromagnetic simulation data.

Abstract: A mechanism for exploiting the data gathered about a system model during the system design phase to aid the identification of errors subsequently detected in a deployed system based on the system model is disclosed. The present invention utilizes the coverage analysis from the design phase that is originally created to determine whether the system model as designed meets the specified system requirements. Included in the coverage analysis report is the analysis of which sets of test vectors utilized in simulating the system model excited individual components and sections of the system model. The present invention uses the information associated with the test vectors to select appropriate test vectors to use to perform directed testing of the deployed system so as to confirm a suspected fault.

Abstract: In one embodiment, the invention is a method and apparatus covering a multilayer process space during at-speed testing. One embodiment of a method for selecting a set of paths with which to test a process space includes determining a number N of paths to be included in the set of paths such that at least number M of paths in N for which testing of the process space will fail, computing a metric that substantially ensures that the set of paths satisfies the requirements of N and M, and outputting the metric for use in selecting the set of paths.

Abstract: Disclosed is an improved method, system, and article of manufacture for implementing routing for an electrical circuit and chip design. A routing architecture can be represented as a spectrum of different granular routing levels. Instead of routing based upon area, routing can be performed for specific routes or portions of routes. Different types of representation or levels of abstraction for the routing can be used for the same net or route. Partial topological reconfiguration, refinement, or rip-up can be performed for a portion of the integrated circuit design, where the portion is smaller than an entire route or net. Non-uniform levels of routing activities or resources may be applied to route the design. Prioritization may be used to route certain portions of the design with greater levels of detail, abstraction, or resources than other portions of the design.

Abstract: In one embodiment, a method for simulating an electric circuit that is represented as one or more partitions, each partition comprising a plurality of constituents representing portions of the circuit, wherein at least one of the constituents is a variable constituent for which the corresponding portion of the electronic circuit includes non-linear behavior, comprises: determining a first matrix for the variable constituent, wherein the first matrix describes a system of equations that represents a behavior of the variable constituent; determining a second matrix for the partition, wherein the second matrix permits calculation of short circuit currents from open circuit voltages according to a node tearing analysis method; and simulating a timestep of the simulation, the simulating comprising iteratively solving a state of the partition using successive guesses of the state of the variable constituent, wherein each iteration comprises solving the variable constituent independently to generate the open circuit

Abstract: A storage section stores a netlist representing a test object circuit. An extracting section extracts, from the netlist stored in the storage section, a subnetlist representing a periodic circuit which is included in the test object circuit and which outputs a periodic output signal corresponding to a periodic input signal. An analyzing section performs transient analysis of the periodic circuit represented by the subnetlist extracted by the extracting section, for one period of the periodic output signal outputted by the periodic circuit. A simulation section performs transient analysis of the test object circuit represented by the netlist stored in the storage section on the basis of the result of the analysis performed by the analyzing section.

Abstract: A method includes selecting one of a plurality of existing transistor models for which fabrication and performance data are available, receiving first model data for a next-generation transistor based on target response data and the selected transistor model data, and simulating a response of a circuit including the next-generation transistor. The selection of the existing transistor model is based on target response data for the next-generation transistor for which fabrication and performance data are not available. The simulation is performed using the first transistor model data for the next-generation transistor. A difference between the target response and the simulated response of the next-generation transistor is calculated, and the first model data representing the next-generation transistor is stored in a computer readable storage medium if the performance data difference between the target response and the simulated response is below a threshold.

Abstract: A static voltage drop analyzing apparatus applied to a Multi-Threshold Complementary Metal-Oxide-Semiconductor (MTCMOS) transistor is provided. The static voltage drop analyzing apparatus includes a calculating module, a processing module, and a measuring module. The calculating module calculates a voltage drop tolerance according to the voltage drop characteristic of the MTCMOS transistor. The processing module selects a simulation metal layer corresponding to the voltage drop tolerance from a plurality of candidate simulation metal layers, and adds the simulation metal layer into the MTCMOS transistor. The measuring module measures the voltage drop of the simulation metal layer added into the MTCMOS transistor. The measured voltage drop of the simulation layer added into the MTCMOS is substantially the static voltage drop of the MTCMOS transistor.

Abstract: A design structure embodied in a machine readable storage medium for designing, manufacturing, and/or testing a design, the design structure comprising for an interface system is disclosed. The system includes a buffer that receives data from a source in a first clock domain and stores the data to be read by a destination in a second clock domain, wherein the buffer functions in both the first clock domain and the second clock domain; a write pointer that points to data written by the source; and a read pointer that points to data read by the destination. According to the design structure, the write pointer and the read pointer are utilized to enable the data to be transmitted from the first clock domain to the second clock domain asynchronously.

Abstract: An integrated power amplifier includes a divider and a combiner. The integrated power amplifier also includes two or more amplifiers. Each of the amplifier input terminals is electrically coupled to a divider output terminal and each of the amplifier output terminals is electrically coupled to a combiner input terminal. At least one power sensor is configured to provide a power amplifier performance metric. The divider and the combiner include a plurality of actuators. Each actuator has at least one actuator control terminal which is configured to provide an actuator setting. The actuators are configured via the actuator control terminals to optimize the power amplifier performance metric. Methods to simulate the operation of a self-healing power amplifier and a process for the operation of a self-healing circuit are also described.

Abstract: A simulation parameter extracting method of a MOS transistor according to an exemplary aspect of the present invention includes evaluating a measured value that includes a true gate-overlap capacitance by measuring a capacitance between the gate and the drain in each of a plurality of layout patterns at a predetermined bias voltage, only the number of contact plugs being different for each layout pattern, evaluating a gate-overlap capacitance calculation value of each layout pattern by subtracting a contact parasitic capacitance between the contact plug and the gate from the measured value, the contact parasitic capacitance being obtained by a simulation with varying a model parameter for evaluating a parasitic capacitance between the contact plug and the gate, and extracting the gate-overlap capacitance calculation value as the true gate-overlap capacitance at the model parameter when the gate-overlap capacitance calculation value is about constant regardless of the number of the contact plugs.

Abstract: A method and computer program product models connections for a system having a plurality of components, having component terminals, and connections. The connections are located to selectively connect the components of the system to each other. The method and computer product models signal levels for nodes of the system as a variable wherein the nodes of the system are representative of the connections. Each potential component terminal connection of the connections that could potentially influence the signal level on each of the nodes is modeled, as a qualitative variable. This results in each node of the system being modeled with n+1 variables.

Abstract: A method for determining a current spectrum for a circuit design is provided. The method includes determining timing characteristics and power consumption characteristics for the circuit design. From the timing characteristics and the power consumption characteristics a time domain current waveform is constructed. The time domain current waveform is then converted to a frequency domain current waveform. With the frequency domain waveform, one skilled in the art can then identify a location and an amount of decoupling capacitors for a printed circuit board housing the circuit design based on the frequency domain current waveform. A computing system configured to perform the method is also provided.

Abstract: A design structure comprising elements that when processed in a computer-aided design system generates a machine-executable representation of a circuit that compensates for variances in the resistance of the buried resistor during operation of the integrated circuit using a waveform that is representative of the thermal characteristics of the buried resistor.

Abstract: Disclosed are an improved method, system, and computer program product for a method or system with concurrent models to more accurately determine and represent the three-dimensional design features of electronic designs. Some embodiments disclose a method or a system for determining the design feature characteristics based upon their respective three-dimensional profiles. Some other embodiments further determine whether the design objectives or constraints are met or may be relaxed based upon the design feature characteristics in order to complete the design. Other embodiments store the profile or geometric characteristics, or information derived therefrom, in a database associated with the design to reduce the need for potentially expensive computations. The method or system may modify the designs or the processes to reflect whether the design objectives or constraints are met or relaxed.

Abstract: A method of selecting fault candidates based on the physical layout of an Integrated Circuit (IC) layout, that includes, identifying failing observation points in an IC layout, determining the failing observation points proximity geometry in the IC circuit layout, determining if a proximity criteria for the failing observation points is met, and identifying faults associated with the failing observation points that meet the proximity criteria; and including the identified faults in a fault candidate set.

Abstract: A hard/soft cooperative verifying simulator is based on a SystemC simulator, and provides the capability of reducing overhead of context switching control thereby to shorten processing time. Time keepers for controlling simulation times of a plurality of threads are provided corresponding to the threads generated as simulation models for hardware and software. Each of the time keepers has a variable which holds a simulation time for each thread, a variable which holds a summation time, and a break request queue which stores a break time and its corresponding break method therein. The time keeper manages both variables and the queue in response to six types of method invocations from the thread, and invokes a wait function of the SystemC simulator when necessary. It is thus possible to reduce the number of times that a wait function invocation is performed, and shorten the entire processing time.

Abstract: A design structure for a hybrid phase locked loop (PLL) circuit that obtains stabilized dynamic response and independent adjustment of damping factor and loop bandwidth is provided. The hybrid PLL circuit of the illustrative embodiments includes the resistance/capacitance (RC) filter elements of a conventional RC PLL and the feed-forward path from the output of the phase frequency detector to the voltage controlled oscillator (VCO). The hybrid PLL essentially enhances the performance of the conventional feed-forward PLL by providing the RC filter whose components can be weighted to provide a dynamic response that is significantly less sensitive to parameter variation and which allows loop bandwidth optimization without sacrificing damping.

Abstract: A production method for a semiconductor integrated circuit includes: creating a model parameter of an element constituting a cell, wherein the model parameter is defined by a design value and a distribution function of variability from the design value; performing a circuit simulation using the model parameter to create a response function that expresses response of cell characteristic to the model parameter; and creating a statistical cell library by using the response function. The statistical cell library used for circuit design and verification gives an expected value and statistical variation of the cell characteristic. The statistical variation is expressed by a product of the distribution function and sensitivity. The sensitivity is calculated based on the response function. When the model parameter is updated, the statistical cell library is updated by using the post-update model parameter and the response function without performing a circuit simulation.

Abstract: A transmission line on a printed wiring board is tested and printed wiring board manufacturing variability is assessed. A response of the transmission line to a signal test pattern is measured. A network including a plurality of components connected by the transmission line is then simulated. The simulated network is based on the measured scattering parameters and virtual models representative of each of the components in the network. A system-level output response of the simulated network to a simulated input signal is analyzed, and the printed wiring board is characterized based on a comparison of the system-level output response to a printed wiring board performance metric threshold.

Abstract: One set of illegal vector sequences is manually generated for a circuit design and a symbolic simulator is used to automatically generate another set of illegal vector sequences for the circuit design. For verification purposes, the relationship between the manually generated set and the automatically generated set is determined. Prior to determining this relationship, one or both of the sets are simplified. One simplification technique includes replacing pairs of illegal vector sequences that are the same except at one bit position with a more general illegal vector sequence representative of both illegal vector sequences of the pair.

Abstract: A system and method of analyzing a power grid in an integrated circuit includes inputting a circuit design to a test bench, inputting a plurality of initial values for the circuit design in to the test bench, setting a current time t to 0 value for an initial time (t0) of the operation of the circuit design, representing each capacitor in an RC circuit corresponding to the power grid circuit design by the each capacitor's respective time variant equivalent companion model, describing each one of the plurality of RC equivalent circuits mathematically as one of a corresponding plurality of linear equations, storing the plurality of linear equations in a matrix Y0 for time t0, resolving the matrix Y0 to determine a DC operating point, updating the RC equivalent circuits and the corresponding plurality of linear equations at a second time step t1=t+h where h is a time step value equal to the current time t and a next simulated operation time, storing the updated plurality of linear equations in a matrix Y1 for ti

Abstract: The computer-implementable method allows for the fast creation of a multi-unit interval data signal suitable for simulation. The created signal represents the output of an otherwise ideal Discrete Time Filter (DTF) circuit, and the quick creation of the signal merely requires a designer to input the number of taps and their weights without the need of laying out or considering the circuitry of the DTF. A matrix is created based on a given data stream, and the number of taps and weights, which matrix is processed to create the multi-unit-interval data signal. Noise and jitter can be added to the created signal such that it now realistically reflects non-idealities common to actual systems. The signal can then be simulated using standard computer-based simulation techniques.

Abstract: System and method for generating test information for a physical circuit. A virtual circuit may be generated. First user input specifying one or more test conditions and/or instrument settings for the virtual circuit may be received. In response to the first user input, first test information may be generated. The first test information may be configured for use in performing one or more virtual tests on the virtual circuit. Second user input requesting that second test information be generated based on the first test information may be received. The second test information may be automatically generated based on the first test information in response to the second user input, without user input specifying the one or more test conditions and/or instrument settings. The second test information may be configured for use in performing one or more physical tests on a physical circuit corresponding to the virtual circuit.

Abstract: A non-transitory, computer-readable recording medium stores therein a program causing a computer to execute calculating, using respective standard deviations of first delay distributions of delay variation independent to each element included in a path among parallel paths in a circuit, standard deviation of a first delay distribution of the path when modeled as a series circuit; correcting the standard deviation of the first delay distribution for each element, using the calculated standard deviation of the first delay distribution of the path and a standard deviation of a first delay distribution of the path obtained by a statistical delay analysis on the circuit; obtaining a correlation distribution representing a correlation between delay and leak current of the circuit by executing, using the corrected standard deviation of the first delay distribution for each element, correlation analysis between delay and leak current of the target circuit; and outputting the obtained correlation distribution.

Abstract: A method of extracting an equivalent circuit of a T-type transmission circuit measures signals of the first and second terminals to obtain S parameters, converts the S parameters into Z parameters to generate a T-type circuit by using the Z parameters, obtains first to third lead line resistors and first to third lead line inductors in the T-type circuit based on the Z parameters corresponding to constants of the T-type circuit, subtracts the Z parameters corresponding to the T-type circuit from the Z parameters corresponding to all of the equivalent circuit to calculate the Z parameters of a ?-type circuit, converts the Z parameters of the ?-type circuit into the Y parameters, and calculates first to third coupling capacitances based on the Y parameters.

Abstract: For generating a simulation case to verify an operation of an IC device, a database including a plurality of device description files, a plurality of pattern files and a plurality of command files is established. Files stored in the database and corresponding to an IC device are collected. The collected files are parsed to find out entries to be edited. Specified entries are edited by a user according to the operation of the IC device. A simulation case or a plurality of simulation cases are generated according to the entries.

Abstract: A method and apparatus for modeling the characteristics of memristor devices. The invention provides methods and an apparatus for accurately characterizing the linear and non-linear Lissajous current-voltage behavior of actual memristor devices and incorporating such behavior into the resultant model. The invention produces a model that is adaptable to large scale memristor device simulations.

Abstract: A system and method for design verification and, more particularly, a hardware simulation accelerator design and method that exploits a parallel structure of user models to support a large user model size. The method includes a computer including N number of logic evaluation units (LEUs) that share a common pool of instruction memory (IM). The computer infrastructure is operable to: partition a number of parallel operations in a netlist; and send a same instruction stream of the partitioned number of parallel operations to N number of LEUs from a single IM. The system is a hardware simulation accelerator having a computer infrastructure operable to provide a stream of instructions to multiple LEUs from a single IM. The multiple LEUs are clustered together with multiple IMs such that each LEU is configured to use instructions from any of the multiple IMs thereby allowing a same instruction stream to drive the multiple LEUs.

Abstract: The invention discloses a method for tuning nano-scale analog-circuit designs in order to reduce random-device mismatches and optimize said design, where nano-scale devices potentially have large-scale process variations. The method includes providing a tunable circuit topology, wherein each nano-scale device comprises a single component or comprises multiple parallel components. Each component is decomposed into multiple discrete sub-components, wherein each said sub-component either operates in parallel with other like components to effectively operate like one bigger component. The sub-components are subjected to a dynamic-programming process to adaptively select the sub-components to be kept operational, while configuring the nonselected sub-components to be nonoperational, based on the measurement of at least one operational parameter.

Abstract: A method to validate data used in a design of a semiconductor product currently in a partially fabricated state is disclosed. The partially fabricated state having a plurality of layers up to and including a first conductive layer. The method generally includes the steps of (A) adding a second conductive layer from a user specification to an application set, the application set having a plurality of resources that define the semiconductor product, (B) validating a new resource in the user specification against the resources in the application set, (C) adding the new resource to the application set upon passing the validating and (D) propagating the new resource throughout a description of the semiconductor product, the description being stored in a computer-readable medium.

Abstract: A method for on demand functional verification of a software model of an application specific integrated circuit (ASIC), in a low-level programming language, which separately handles the creation of the model and the debugging of the functional verification tests to be applied to the model in order to create a verification platform. In a transmission mode, an autonomous circuit emulator is created by replacing the model in a low level programming language physically describing the circuit to be validated with a high level description generating response data in accordance with the functional specification of the design as a function of stimuli received. A verification mode includes integration of the software model in low level language of the circuit resulting from the design into a verification platform, and creation of a connection of a previously validated autonomous circuit emulator to the interfaces of the software model.

Abstract: A simulation system for performing simulation of an operation of a circuit including a particular signal substituting section for making, in the simulation, an output signal of a first flipflop or an input signal of a second flipflop be a particular signal indicating neither high level nor low level during a period which is 1 cycle shorter than a specified clock cycle number of a multicycle path which has been specified in advance; and an output section for outputting information corresponding to whether or not a signal at an output terminal of the second flipflop or at part of the circuit located in a subsequent stage of the output terminal of the second flipflop, which has been specified in advance, is made to be the particular signal.

Abstract: One embodiment is a method of designing an integrated circuit (“IC”) using an online design platform system comprising a design platform provider, at least one electronic design automation (“EDA”) tool and at least one intellectual property (“IP”) library. The method comprises accessing the design platform provider using a computer remote from the design platform provider, wherein the remote computer is connected to the design platform provider and the accessing occurs via an Internet connection; providing access via the remote computer to the at least one EDA tool and the at least one IP library for enabling a user at the remote computer to design an IC; and providing at least one file comprising a final design of the IC directly from the online design platform system to a designated foundry.

Abstract: Some embodiments provide a system that performs a simulation within an electronic design automation (EDA) application. During operation, the system obtains a design from a user of the EDA application. Next, the system performs the simulation using the design to create a set of current simulation results associated with the design. The system then automatically saves a current design state of the design which is associated with the current simulation results. Finally, the system enables subsequent access to the current design state and one or more previous design states of the design by the user through a graphical user interface (GUI) associated with the EDA application.