Abstract: Modeling and simulating behavior of a transistor are described. At least one sub-circuit model for modeling at least one second order effect associated with the transistor is obtained. At least one instance parameter for the at least one second order effect is obtained. Operation of a transistor behavior simulator is augmented with the at least one sub-circuit model populated with the at least one instance parameter such that the simulating of the behavior of the transistor produces data that takes into account the at least one second order effect. The at least one second order effect may be an LOD/eSiGe effect, a poly pitch effect, or a DSL boundary effect. Also described is a method for generation of a sub-circuit model.

Abstract: A hybrid simulation model includes a real model, a bus interface and an acceleration model. The real model simulates a group of instructions. The acceleration model includes a trace generation unit, a trace replay unit, a selection unit, a snapshot generation and load unit and a virtual breakpoint control unit. The trace generation unit records at least one trace file of the real model in a first simulation. The trace replay unit reads and accordingly accesses the at least one trace file. The selection unit dynamically switches to perform a real simulation or a trace simulation. The snapshot generation and load unit generates at least one status snapshot file and loads the at least one status snapshot file to the real model in repeated simulations. The virtual breakpoint control unit controls the selection unit to switch between the trace simulation and the real simulation according to a virtual breakpoint.

Abstract: A method and system for compiling a representation of a source circuit including one or more source subchannels associated with portions of source logic driven by a plurality of clock domains are described. Each source subchannel may generate packets carrying signal data from one of the portions of the source logic. A representation of a destination circuit may be compiled to include one or more destination subchannels associated with portions of destination logic replicating the source logic. Each destination subchannel may forward the signal data via the packets to one of the portions of the destination logic. A switching logic may be configured to map the source subchannels to the destination subchannels as virtual channels to forward the packets from the source subchannels to the destination subchannels. A single queue may be configured to couple with the switching logic to record packets from the source subchannels into a packet stream for a delay period to distribute to the destination subchannels.

Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.

Abstract: A method of interconnecting blocks of heterogeneous dimensions using a NoC interconnect with sparse mesh topology includes determining a size of a mesh reference grid based on dimensions of the chip, dimensions of the blocks of heterogeneous dimensions, relative placement of the blocks and a number of host ports required for each of the blocks of heterogeneous dimensions, overlaying the blocks of heterogeneous dimensions on the mesh reference grid based on based on a guidance floor plan for placement of the blocks of heterogeneous dimensions, removing ones of a plurality of nodes and corresponding ones of links to the ones of the plurality of nodes which are blocked by the overlaid blocks of heterogeneous dimensions, based on porosity information of the blocks of heterogeneous dimensions, and mapping inter-block communication of the network-on-chip architecture over remaining ones of the nodes and corresponding remaining ones of the links.

Abstract: A system and methods are provided for verifying a hardware design for an electronic circuit. The method may include: providing a hardware design description for the electronic circuit; extracting a set of design constraints from the hardware design description, where the set of design constraints represents the electronic circuit in terms of signals and logical operations performed on the signals; creating an abstraction model from the set of design constraints, where the abstraction model abstracts one or more of the logical operations in the set of design constraints by replacing the abstracted logical operations with uninterpreted functions; and property checking the abstraction model in relation to one or more design properties. When a violation in the electronic circuit is detected by the property checking step, the feasibility of the violation is then checked and, if the violation is deemed infeasible, the abstraction model is refined.

Abstract: Technologies relating to real time logic simulation within a mixed mode simulation network are described. Mixed mode simulation networks may comprise Boolean Processing Units (BPUs) and Real Time Processing Units (RTPUs). Mixed mode simulation networks may send an input simulation state vector to the processing units, and the processing units may process portions thereof to calculate portions of an output simulation state vector. BPUs may be adapted to calculate portions of the output simulation state vector without accounting for delay times attributable to operation of a simulated system, while RTPUs may be adapted to calculate portions of the output simulation state vector with accounting for delay times attributable to operation of the simulated system. The calculated portions of the output simulation state vector may be combined in a computational memory, and the resulting output simulation state vector may be used as an input simulation state vector in a next simulation calculation cycle.

Abstract: A system for enhancing universal serial bus (USB) applications comprises an upstream processor, a downstream processor and a main controller. The upstream processor accepts standard USB signals from a USB host and independently provides responses required by USB specification within the required time frame. The upstream processor also contains storage for descriptors for a device associated with this upstream processor. The main controller obtains the descriptors by commanding the downstream processor, and passes them to the upstream processor. The downstream processor connectable to USB-compliant devices accepts the USB signals from the USB-compliant devices and provides responses required by USB specification within the required time frame. The main controller interconnects the upstream and downstream processors, and provides timing independence between upstream and downstream timing. The main controller also commands the downstream processor to obtain device descriptors independent of the USB host.

Abstract: In one embodiment, a method to simulate an HDL specification is provided. For each call to a procedure, an intermediate process is dynamically created during simulation. The process containing the call to the procedure is replaced with the intermediate process in an active process list of processes scheduled for execution. The intermediate process is configured to call the procedure and, in response to completing execution of the procedure, cause the simulator to add the calling process to the front of the active process list and remove the intermediate process from the active process list.

Abstract: A method to increase automatic test pattern generation (ATPG) effectiveness and compression identifies instances of “majority gates” and modifies test generation to exploit their behavior so that fewer care bit are needed. This method can increase test coverage and reduce CPU time as previously aborted faults are now tested. The majority gate enhanced ATPG requires no hardware support and can be applied to any ATPG system.

Abstract: Some embodiments provide techniques and systems for optimizing a circuit design's global leakage power. During operation, the system can determine leakage potentials for logic gates in the circuit design, such that a logic gate's leakage potential indicates an amount or degree by which the logic gate's leakage power is decreasable. The system can then determine a processing order for processing the logic gates based at least on the leakage potentials. Next, the system can optimize the circuit design's leakage power by attempting to decrease leakage power of logic gates according to the processing order.

Abstract: Systems, apparatus, and methods of static timing analysis for an integrated circuit design in the presence of noise are disclosed. The integrated circuit design undergoing analysis may be partitioned into a plurality of subcircuit stages. Each subcircuit stage in the integrated circuit design may be modeled to include a model of at least one victim driver, at least one aggressor driver, at least one receiver, and an interconnect network. Associated with each subcircuit stage is a set of related edges of a design graph to compute signal propagation delay. For each subcircuit stage, full timing delays of each edge can be concurrently computed. This includes concurrently computing base timing delays for a nominal response to the at least one victim driver and the interconnect network and noise related timing delays in response to the at least one aggressor driver and the interconnect network.

Abstract: A method may include generating logical transition data for the logic cell based on an analysis of a digital model for the logic cell, the logical transition data including at least one entry indicative of an output transition of the logic cell occurring in response to an input transition of the logic cell. The method may also include generating a parameterized transition based analog model for the logic cell, the parameterized transition based analog model including transition timing parameters associated with each entry of the logical transition data. The method may further include generating an analog model for the logic cell based on the parameterized transition based analog model and one or more analog netlists characterizing the logic cell.

Abstract: Systems and methods for run-time switching for simulation with dynamic run-time accuracy adjustment. In one embodiment, a computer implemented method performs a simulation of a computer instruction executing on a simulated hardware design by a first simulation model, wherein the first simulation model provides first timing information of the simulation. The first timing information is stored to a computer usable media. A pending subsequent simulation of the instruction is detected. Responsive to the presence of the first timing information in the computer usable media, the computer instruction is simulated by a second simulation model, wherein the second simulation model provides less accurate second timing information of the simulation than the first simulation model. The simulation run time information is updated for the subsequent simulation with the first timing information.

Abstract: A simulation system having multiple peripherals that communicate with each other. The system includes a weighted graph with weights set as communication times. The peripherals are represented as nodes and connection paths are represented as edges. Among the communication times in the loop, the minimum time is set as first synchronization timing. Timing with an acceptable delay added is set as second synchronization timing. Timing set by a user to be longer than the first and second timings is set as third synchronization timing. The third synchronization timing is used in a portion where the timing is usable, thus synchronizing the peripherals at the longest possible synchronization timing.

Abstract: Systems and methods that use a solver to find bugs in a target model of a computing system having one or more finite computation paths are provided. The bugs on computation paths of less than a predetermined length are detected by translating the target model to include a state variable AF for one or more states of the target model, wherein AF(S) represents value of the state variable AF at state S; and solving the translated version of the target model that satisfies predetermined constrains.

Abstract: A mechanism is provided in an integrated circuit simulator for tracking array data contents across three-value read and write operations. The mechanism accounts for write operations with data values and address values having X symbols. The mechanism performs writes to a tree data structure that is used to store the three-valued contents to the array. The simulator includes functionality for updating the array contents for a three-valued write and to read data for a three-valued read. The simulator also includes optimizations for dynamically reducing the size of the data structure when possible in order to save memory in the logic simulator.

Abstract: Approaches for preparing a system that is reconfigurable to implement a plurality of optional hardware functions are disclosed. In one approach, a method includes simulating the operation of the system during a time interval. The system is reconfigurable to implement a subset of the optional hardware functions, and the simulating determines which of the optional hardware functions are active and which of the optional hardware functions are inactive during a plurality of subintervals of the time interval. Respective circuit resource sets are estimated for the subintervals of the time interval. For each of the subintervals, the respective circuit resource set implements the system including the optional hardware functions that are active during the subinterval. Information describing the respective circuit resource sets for the subintervals is stored for preparing partial reconfigurations of the system.

Abstract: Software for controlling processes in a heterogeneous semiconductor manufacturing environment may include a wafer-centric database, a real-time scheduler using a neural network, and a graphical user interface displaying simulated operation of the system. These features may be employed alone or in combination to offer improved usability and computational efficiency for real time control and monitoring of a semiconductor manufacturing process. More generally, these techniques may be usefully employed in a variety of real time control systems, particularly systems requiring complex scheduling decisions or heterogeneous systems constructed of hardware from numerous independent vendors.

Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for emulating a mass storage device and a file system of a mass storage device. In a first aspect, a human-portable data processing device that includes one or more data processors that perform operations in accordance with machine-readable instructions, an incoming message classifier configured to classify an incoming read command according to an address of the data requested by the incoming read command, and an emulation data generation component connected to respond to the classification of the incoming read command by the incoming message classifier to generate emulation data emulating that which would have been read by the incoming read command were the human-portable data processing device a mass storage device; and a bus controller configured to respond to the incoming read command with the emulation data generated by the emulation data generation component.

Abstract: Mechanisms are provided for controlling a fidelity of a simulation of a computer system. A model of the system is received that has a plurality of components. A representation of the plurality of individual components of the system is generated. A component is assigned to be a fidelity center having a highest possible associated fidelity value. Fidelity values are assigned to each other component in the plurality of individual components based on an affinity of the other component to the fidelity center. The system is simulated based on assigned fidelity values to the components in the plurality of individual components.

Abstract: A circuit interconnection structure for synchronizing a network of oscillators placed on a semiconductor substrate. One such structure comprises a first synchronizing circuit electrically coupled to a second synchronizing circuit through tunable delay circuits. Also disclosed are methods to tune oscillators placed in different regions of a circuit having multiple clock domains by estimating the relative slack of a first group of signals within the circuit with regard to the period of a first clock domain, and estimating the relative slack of the second group of signals within the circuit with regard to the period of second clock domain, wherein the estimating is performed at process and operational corners that cover the variability of the circuit at different speed conditions, then calculating tuning values for the oscillator delays for each region such that the oscillator delay slack matches the worst relative slack of the signals of the same region.

Abstract: Methods and systems for modeling a multiprocessor system in a graphical modeling environment are disclosed. The multiprocessor system may include multiple processing units that carry out one or more processes, such as programs and sets of instructions. Each of the processing units may be represented as a node at the top level of the model for the multiprocessor system. The nodes representing the processing units of the multiprocessor system may be interconnected to each other via a communication channel. The nodes may include at least one read element for reading data from the communication channel into the nodes. The node may also include at least one write element for writing data from the nodes into the communication channel. Each of the processing unit can communicate with other processing unit via the communication channel using the read and write elements.

Abstract: A exemplary aspect of the present invention is a simulation method for a semiconductor circuit that includes: a semiconductor resistor; a plurality of contacts arranged at regular intervals in a longitudinal direction and in a width direction of the semiconductor resistor on a terminal region of the semiconductor resistor; and a wiring line formed on the plurality of contacts, the simulation method including: defining a ratio of a parasitic-resistance by the semiconductor resistor between two of the contacts neighboring in the longitudinal direction to a resistance of one of the plurality of contacts as a constant k; and modeling a parasitic-resistance net by using the constant k, the parasitic-resistance net including the terminal region of the semiconductor resistor and the plurality of contacts.

Abstract: Some embodiments provide a method of providing configurable ICs to a user. The method provides the configurable IC and a set of behavioral descriptions to the user. The behavioral descriptions specify the effects of accesses to a memory by a set of memory ports given a set of parameters chosen by the user.

Abstract: A simulation parameter extracting method of a MOS transistor according to an exemplary aspect of the present invention includes evaluating a measured value that includes a true gate-overlap capacitance by measuring a capacitance between the gate and the drain in each of a plurality of layout patterns at a predetermined bias voltage, only the number of contact plugs being different for each layout pattern, evaluating a gate-overlap capacitance calculation value of each layout pattern by subtracting a contact parasitic capacitance between the contact plug and the gate from the measured value, the contact parasitic capacitance being obtained by a simulation with varying a model parameter for evaluating a parasitic capacitance between the contact plug and the gate, and extracting the gate-overlap capacitance calculation value as the true gate-overlap capacitance at the model parameter when the gate-overlap capacitance calculation value is about constant regardless of the number of the contact plugs.

Abstract: A system and method are described for converting a circuit description into transaction-based description at a higher level of abstraction. Thus, a designer can readily view a series of transactions that occurred in the simulation of a circuit. In one aspect, the simulated signals are analyzed and converted into messages of a protocol used by the design. A combination of the messages represents a transaction. Thus, the simulated signals are then converted into a series of protocol transactions. In another aspect, a message recognition module performs the analysis of the simulated signals and converts the simulated signals into messages (e.g., request for bus, bus acknowledge, etc.). A transaction recognition module analyzes the messages and converts the messages into transactions (e.g., Read, Write, etc.). Using both the system and method the circuit description is converted into a higher level of abstraction that allows more comprehensive system-level analysis.

Abstract: A mechanism is provided for verifying a register-transfer level design of an execution unit. A set of instruction records associated with a test case are generated and stored in a buffer. For each instruction record in the set of instruction records associated with the test case: the instruction record is retrieved from the buffer and sent to both a reference model and an execution unit in the data processing system. Separately, the reference model and the execution unit execute the instruction record and send results of the execution of the instruction record to a result checker in the data processing system. The result checker compares the two results and, responsive to a mismatch in the results, a failure of the test case is indicted, the verification of the test case is stopped, and all data associated with the test case is output from the buffer for analysis.

Abstract: A method and an apparatus for controlling voltage level and clock signal frequency supplied to a system.

Abstract: Systems and methods for simulating and verifying an analog mixed signal design provide an analog mixed signal testbench configured to verify analog parameters of the design. The testbench can include a mechanism to fetch a value of an analog object in an analog portion of a mixed signal design. The testbench mechanism can include an argument specifying the name of the object and the analog quantity to be fetched for that object. The testbench can retrieve estimated values and can further specify timing constraints specifying absolute times or events at which values are to be measured and returned.

Abstract: A method includes generating a first behavioral model of a circuit, the first behavioral model describing a physical circuit in a first configuration. The first configuration comprises a first logic structure configured to generate a first intermediate signal based on a received first plurality of inputs. The first configuration further comprises a logic cone configured to generate a scan output based on the first intermediate signal and a plurality of scan inputs. The first behavioral model is modified to generate a second behavioral model describing the physical circuit in a second configuration. The second configuration comprises an error circuit configured to receive the scan output and the first intermediate signal. A testability model is generated based on the second behavioral model, the testability model comprising a first structural representation of the first logic structure.

Abstract: A system and method is described for connecting a logic circuit simulation to a hardware peripheral that includes a computer running software for communicating data to and from the hardware peripheral. The software transmits the data received from the hardware peripheral to the device being simulated by the logic circuit simulation. The computer also transmits the data received from the device being simulated by the electronic circuit simulation to the hardware peripheral. This allows the user to test the device being simulated using real hardware for input and output instead of simulated hardware.

Abstract: The present invention certifies control modules of engineered safety feature instruments for a power plant automatically. The control modules can be tested before storing or operating. The test is done with enhanced testing speed and saved cost. Thus, safety of the control modules is confirmed.

Abstract: A method for computing power consumption includes querying a software database for a key node and a gate comprising an input port, connected to the key node, and an output port. The software database is created from a net list associated with a design. The method includes calculating a probability of activity level at the output port based on a predetermined activity level at the key node, and querying the software database for next gate comprising a next input port, connected to the previous output port, and a next output port. The method includes calculating a probability of activity level at the next output port based on the probability of activity level at the previous output port. The method includes computing a sub-circuit gate power by sum of power of all the gates based on the probability of activity level at output ports of the gates.

Abstract: Methods, apparatuses and articles for testing security of a mapping function—such as a Physically Unclonable Function (PUF)—of an integrated circuit (IC) are disclosed. In various embodiments, one or more tests may be performed. In various embodiments, the tests may include a predictability test, a collision test, a sensitivity test, a reverse-engineering test and an emulation test. In various embodiments, a test may determine a metric to indicate a level of security or vulnerability. In various embodiments, a test may include characterizing one or more delay elements and/or path segments of the mapping function. Other embodiments may be described and claimed.

Abstract: An apparatus and method may be used for compiling a hardware logic design into data-driven logic programs to be executed on a data-driven chip. The apparatus may include storage with a library for defining a net-list synthesized by a synthesis tool. The apparatus may also include a data-driven logic verification chip comprising a plurality of logic processors. The apparatus may further include a code generator for adopting heuristics to convert the net-list into data driven logic programs and for allocating hardware resources to balance computing and storage loads across the plurality of logic processors of the verification chip.

Abstract: A computerized system comprising: a processor; a first interface configured to obtain a constraint; a second interface configured to obtain a first model, wherein the first model is configured to be utilized in model checking, and the first model, when constrained by the constraint, comprises at least one finite path; and a finite path removal module implemented in the processor and configured to generate a second model equivalent to the first model obtained by said second interface, wherein the second model excludes a portion of the at least one finite path, and the second model is configured to be utilized in model checking.

Abstract: A method for implementing production processes includes a step of programming a state machine for each production process. The programming step includes a definition of a plurality of states and a definition of a plurality of transitions between states, corresponding to possible actions which the corresponding production process may execute. The programming step further includes the steps of detecting whether or not one or more states to be defined for a state machine have already been defined for state machines already programmed for other production processes, and executing the definition of states only for states not detected in the detecting step.

Abstract: Aspects of the present invention are directed to improving the speed of event-driven simulation by manipulating delta delays in a system model to reduce delta cycle executions. The manipulation is performed in a manner that preserves delta cycle accurate timing on selected signals of the system, which may be of interest to a designer. Methods and systems are provided for identifying the signals of interest, and for determining portions of the design that may have delta delays retimed. Preserving the timing on the signals of interest ensures that race conditions and glitches present in the design on the signals of interest are still viewable by the designer. To reduce simulation time, delta delays may be moved from high activity signals to low activity signals, the total number of delta delays may be reduced, or a number of processes executed may be reduced.

Abstract: A method for simulating an operation of a digital circuit (01) is described. The method utilizes cycle simulation, wherein in a cycle based simulation model (34) of the digital circuit (01) components (02, 03, 04, 05) of the digital circuit (01) are clocked synchronously every cycle (19) of a functional clock (Clk). According to the invention, real digital circuit (01), i.e. chip or combinatorial logic (01), timing information is included in the cycle simulation by inserting delay latches (15, 16, 17) into the cycle based simulation model (34) of the digital circuit (01), wherein a non-functional clock (Sim clock) is used to clock the delay latches (15, 16, 17), so that each delay latch (15, 16, 17) delays the propagation of a signal (I, J, K) by a cycle (20) of the non-functional clock (Sim clock).

Abstract: Mechanisms are provided for modeling a plurality of devices of an integrated circuit design as a single statistically equivalent wide device. An integrated circuit design is analyzed to identify a portion of the integrated circuit design having the plurality of devices. For the plurality of devices, a statistical model of a single statistically equivalent wide device is generated which has a statistical distribution of at least one operating characteristic of the single statistically equivalent wide device that captures statistical operating characteristic distributions of individual devices in the plurality of devices. At least one statistical operating characteristic of the single statistically equivalent wide device is a complex non-linear function of the statistical operating characteristics of the individual devices. The integrated circuit design is modeled using the single statistically equivalent wide device.

Abstract: Methods and systems for simulating logic may translate logic design into executable code for a multi-processor based parallel logic simulation device. A system may implement one or more parallel execution methods, which may include IPMD, MPMD, and/or DDMT.

Abstract: A computer-readable medium encoded with an instruction check program for making a computer to check a status of execution of an instruction by an I/O simulator that performs an operation simulation according to a structure of an I/O area of a microcomputer, the instruction check program when executed by a computer causes the computer to perform a method including obtaining specification information of the microcomputer describing an input and an output condition of a hardware resource in the I/O area, detecting a simulation of a reference instruction to the hardware resource executed by the I/O simulator, determining correctness of the reference instruction by comparing a content of the simulation of the reference instruction detected by the detecting with the input and output condition of the hardware resource included in the obtained specification information, and outputting an error signal when it is determined that the reference instruction is incorrect.

Abstract: A circuit verification method for a logic circuit is presented. The method includes developing a first hardware description language (HDL) code representative of the logic circuit and, for an embedded portion of the logic circuit, developing a second HDL code representative of the embedded portion. The second HDL code includes a process of forcing inputs of the embedded portion to one or more known values. The method further includes operating a processing device in conjunction with the first and second HDL codes and verifying operation of the embedded portion in response to forcing the inputs to the logic circuit.

Abstract: A processing architecture and methods are disclosed in which a simulation state vector can be contained in a common memory, formatted in a known form, distributed in a deterministic bus to a sea of logic processors, and returned to the common memory through the deterministic bus.

Abstract: A logic simulation program, method and system for obtaining a set of reachable states for a logic design that can be used to provide input to other algorithms that simplify the netlist describing the logic design or perform other types of processing, provides an efficient, compact behavior when simulating large designs. Rather than simulating using ternary input and state value representations that are restricted to true, false and unknown, the techniques of the present invention use input symbolic values that are retained in the set of reachable states retained as the output. Behaviors such as oscillators, transient values, identical signals, dependent logical states and chicken-switch determined states can be detected in the simulation results and the netlist simplified using the results of the detection.

Abstract: A computer-implemented method for performing testing on executable logic includes providing, in a test framework, an instance of at least one object that is associated with an object-processing framework. The test framework has at least one interface that is common with the object-processing framework. The method includes calling a logic portion that is to be tested, the logic portion being called with at least one test parameter received from a user. The method includes recording a result of an operation that is performed as the logic portion causes the at least one object in the test framework to be accessed using the at least one interface. Also a related computer program product and graphical user interface.

Abstract: A method for digital circuit design. The first step of the process is the step of providing a circuit design in the form of a hardware definition language. Then, the process produces a binary simulation of the design by setting out for each unit of time during execution of the hardware design the a control state and a program state of the design and assigns a symbol to each signal of the design. The process proceeds by executing a symbolic simulation of the design, concluding with identifying and capturing the combinational logic expression of the simulation output and the next state functions of the simulation.

Abstract: Devices, methods and articles advantageously allow communications between qubits to provide an architecture for universal adiabatic quantum computation. The architecture includes a first coupled basis A1B1 and a second coupled basis A2B2 that does not commute with the first basis A1B1.

Abstract: A system and method for modeling a semiconductor transistor device structure having a conductive line feature of a designed length connected to a gate of a transistor device in a circuit to be modeled, the transistor including an active device (RX) area over which the gate is formed and over which the conductive line feature extends. The method includes providing an analytical model representation including a function for modeling a lithographic flare effect impacting the active device area width; and, from the modeling function, relating an effective change in active device area width (deltaW adder) as a function of a distance from a defined edge of the RX area. Then, transistor model parameter values in a transistor compact model for the device are updated to include deltaW adder values to be added to a built-in deltaW value.