Abstract: A program that simulates a netlist data including a plurality of basic elements using a computer includes a logic operation section configured to stipulate a logic operation of at least one of the plurality of the basic elements, a change detection section configured to detect changes in signal levels at an input-and-output end of the at least one of the plurality of the basic elements, and a data storage section configured to store a position data corresponding to the changes of the signal levels.

Abstract: A method for verifying a logic circuit in a prototyping system includes (a) configuring programmable logic circuits of the prototyping system to implement the logic circuit and to implement probe circuits for accessing internal nodes of the logic circuit; (b) preparing emulation vectors for use in a vector emulation of the logic circuit in the prototyping system; (c) setting one or more vector substitution points; (d) preparing one or more packet vectors at each vector substitution point for replacing emulation vectors in the vector emulation; (e) performing the vector emulation using the emulation vectors until one of the vector substitution points is reached; and (f) substituting packet vectors for the corresponding emulation vectors at vector substitution point and continuing the vector emulation.

Abstract: A method uses a SAT solver operating to cycle k to find bugs in a model having finite computation paths therein, wherein said bugs are on computation paths of less than length k. Another method includes adding an additional state variable to a model to be checked, where a governing state machine of the additional variable has a “sink” state. The method includes having a translation using the additional variable whenever a state indicates a bad state and performing satisfiability solving with the model and the translation.

Abstract: According to a method of simulation processing, a collection of files including one or more HDL source files describing design entities collectively representing a digital design to be simulated is received. The HDL source file(s) include a statement specifying inclusion of an instrumentation entity not forming a portion of the digital design but enabling observation of its operation during simulation. The instrumentation entity includes sequential logic containing at least one storage element, where the instrumentation entity has an output signal indicative of occurrence of a simulation event. The collection of files is processed to obtain an instrumented simulation executable model. The processing includes instantiating at least one instance of each of the plurality of design entities and instantiating the instrumentation entity. The processing further includes instantiating external instrumentation logic, logically coupled to each instance of the instrumentation entity, to record occurrences of the event.

Abstract: Methods and systems for simulating logic may translate logic design into executable code for a multi-processor based parallel logic simulation device. A system may implement one or more parallel execution methods, which may include IPMD, MPMD, and/or DDMT.

Abstract: A system and method for performing circuit simulation is described. The present approach provides methods and systems that create reusable and independent measurements for use with circuit simulators. Also disclosed are parallelizable measurements having looping constructs that can be run without interference between parallel iterations. Reusability is enhanced by having parameterized measurements. Revisions and history of the operating parameters of circuit designs subject to simulation are tracked. Mechanisms are provided that allow for viewing, measurement or other manipulation of signals at specific locations in a circuit design for simulation, such as parameters that include observation points which are implemented using probes. One approach to executing a measurement is via a controllable and flexible control statement, which in one embodiment is the “run” statement. Improved interfaces for viewing, controlling, and manipulating simulations and simulation results are also provided.

Abstract: Disclosed is simulation of circuit behavior by running a central electronic core simulation in a high level simulator up to and including initial microload, creation of a post-IML (initial microcode load) state, and transferring the post-initial microcode state from the central electronic core simulation to the post-initial microcode load co-simulator.

Abstract: A system and method for modeling a semiconductor transistor device structure having a conductive line feature of a designed length connected to a gate of a transistor device in a circuit to be modeled, the transistor including an active device (RX) area over which the gate is formed and over which the conductive line feature extends. The method includes providing an analytical model representation including a function for modeling a lithographic flare effect impacting the active device area width; and, from the modeling function, relating an effective change in active device area width (deltaW adder) as a function of a distance from a defined edge of the RX area. Then, transistor model parameter values in a transistor compact model for the device are updated to include deltaW adder values to be added to a built-in deltaW value.

Abstract: Methods of detecting unwanted logic in a configuration bitstream for a programmable logic device (PLD). The bitstream can be reversed engineered to generate a model of the design. The model is then tested for unwanted logic, e.g., logic inserted for the purpose of monitoring or interfering with the desired functionality of the design, by applying a test suite that exercises all desired functions for the design. If some of the logic nodes in the model are not exercised by the test suite, then the unexercised nodes might constitute unwanted logic and might have been inserted for malicious purposes. To reverse engineer the bitstream, a simulation model of the unprogrammed PLD can be used. Configuration bits from the bitstream can be inserted into the model of the unprogrammed PLD. The modified model can be simplified by propagating constants through the model in response to the values inserted into the model.

Abstract: A method, apparatus, and computer program product for creating a model representing an electrical network residing in an integrated circuit package.

Abstract: A power source noise analysis device includes an analysis portion. The analysis portion estimates an internal impedance of a semiconductor chip being an object to be analyzed based on a power current waveform, which is obtained by simulation of the semiconductor chip based on design data of the semiconductor chip. The analysis portion carries out a noise analysis of a power system including a board having the semiconductor chip mounted thereon based on the internal impedance.

Abstract: A design of an integrated circuit device, in which locations of power wires and memory/logic circuitry are known, is analyzed by at least: identifying intersections of power wires with one another, for power wires that are electrically connected to one another through vias; segmenting power wires, at their intersections; preparing estimates of conductance of vias and wire segments in the form of conductance matrix G; and preparing estimates of current I at each intersection based on power consumed by surrounding circuitry, and current vector “I” and conductance matrix “G” are used to solve for voltage drop ?V, in a matrix equation G?V=I, and the voltage drop is displayed, to allow a human to make changes in the design. Pins of unconnected hard macros are temporarily connected to their closest wires, and current therethrough is included in the estimates.

Abstract: A method of passing data among modules of a heterogeneous software system can include identifying a scripted function to be executed within the heterogeneous software system and building a wrapper script by embedding a call to the scripted function and an XTable object associated with the scripted function within the wrapper script. The method further can include executing the wrapper script thereby causing the scripted function to execute and receiving a result from execution of the scripted function.

Abstract: A design of an integrated circuit device, in which locations of power wires and memory/logic circuitry are known, is analyzed by at least: identifying intersections of power wires with one another, for power wires that are electrically connected to one another through vias; segmenting power wires, at their intersections; preparing estimates of conductance of vias and wire segments in the form of conductance matrix G; and preparing estimates of current I at each intersection based on power consumed by surrounding circuitry, and current vector “I” and conductance matrix “G” are used to solve for voltage drop ?V, in a matrix equation G?V=I, and the voltage drop is displayed, to allow a human to make changes in the design. Pins of unconnected hard macros are temporarily connected to their closest wires, and current therethrough is included in the estimates.

Abstract: A method and an apparatus for obtaining an equivalent circuit model of a multi-layer circuit are disclosed. The method includes simulating the multi-layer circuit using an electromagnetic field analysis to provide a coupling network; and simplifying the coupling network using a circuit model order reduction method to generate the equivalent circuit model. The method is very simple to implement and the equivalent circuit model obtained has an apparent physical meaning.

Abstract: Technologies disclosed herein can be used to diagnose defects on die having both scan chain and system logic defects, including in situations where the presence of one or more faults in the system logic potentially obscures the detectability of one or more faults in the scan chains (or channels) and vice versa. At least some embodiments employ an iterative approach where at least some scan chain faults are identified, these chain faults are used to identify system logic faults, and then additional chain faults are identified using the system logic faults and vice versa. Failing bits can be partitioned into at least two groups: failing bits determined as being caused by system logic failures, and failing bits determined as being possibly caused by chain defects, system logic defects, or the compound effects of both types of defects.

Abstract: A digital system design method uses a higher programming language. In order to realize a digital system, an algorithm is verified based on a program written by the higher programming language and a program is programmed considering the higher programming language-hardware characteristics before the program is written in the lower programming language, and thus conversion into the lower programming language may be easily performed.

Abstract: Embodiments of the present invention provide a method for generating write and read commands used to test hardware device models. The method is able to generate multiple write commands to a location without having to generate intervening read commands to validate the data. In addition, the method enables read commands to be generated in a different sequence from the sequence of generated write commands, having different sizes than the sizes of the write commands, and that maximize the amount of data read (verified) and minimize the amount of unnecessary reads (re-verification).

Abstract: Modify H.263-type quantization with an adaptive quantization parameter floor; this limits clipping of quantized DCT coefficients and consequent artifacts. The maximum absolute level of AC coefficients of a DCT transformed macroblock provides a minimum quantization parameter from integer division by 256 when the quantized levels are clipped to a range such as ?127 to +127.

Abstract: There is provided a data processing apparatus (1) including a logic circuit (10) that is reconfigurable in each cycle and a library (2) that stores hardware control information (20). The hardware control information (20) includes a plurality of pieces of cycle-based mapping information (21) for individually mapping a plurality of cycle-based circuits, which each realize a function in each cycle for executing an application, onto the logic circuit (10) and configuration selection information (22) for selecting at least one of the plurality of pieces of cycle-based mapping information according to an execution state of the application. The data processing apparatus (1) includes a control unit (11) that reconfigures at least part of the logic region (10) using at least one of the plurality of pieces of cycle-based mapping information (21) according to a request in each cycle based on the configuration selection information (22).

Abstract: A hardware accelerator includes hardware support for a combinational only cycle and a latch only cycle in a simulation model with a single partition of latches and combinational logic. Preferred embodiments use a special 4-input 1-output function unit in the hardware accelerator in place of the normal latch function that write back the old latch value for combinational only cycles. Other embodiments include hardware support for separate array write disables for arrays and transparent latches depending on whether the cycle is a combinational only cycle and a latch only cycle. A conditional array write disable dependent on the occurrence of a hardware breakpoint is also included that supports switching from a latch plus combinational cycle to a latch only cycle, to give control to the user before evaluating the combinational logic if a breakpoint occurs on a latch.

Abstract: Various embodiments of the invention provide a frequency shifter to vary the frequency of data transmitted over time, such as to increase and decrease the frequency of test data transmitted over time to verify a digital communication device's ability to receive data having various frequencies within a specific parameter range. The frequency shifter includes a frequency modifier to shift or vary an input clock frequency to a variety of output clock frequencies, such as according to a test protocol. The frequency shifter also includes an elastic data buffer to receive the test data at the input clock frequency and to output the test data at the plurality of output clock frequencies provided by the frequency modifier.

Abstract: A method for performing an analysis of at least one logic stage in a netlist, which include one or more drivers, is provided. The method includes operations of generating at least one look-up table for an output transient current to be based on values of input and output voltages using data available from a cell library; synthesizing analytically at least one current source model, which includes a DC component and a plurality of parasitic capacitances, using the look-up table; simulating the logic stage using the current source model to model the drivers; and obtaining characteristics of the simulated logic stage. A system and a machine-readable medium for performing the method are also provided.

Abstract: A computer-implemented method may include defining an input bus signal in a graphical block diagram model by associating the input bus signal with a first group of signals, at least two of the first group of signals having a different data type; defining an output bus signal in the graphical block diagram model by associating the second bus signal with a second group of signals, each of the second group of signals corresponding to one of the first group of signals; defining an input to a non-virtual operation block in the graphical block diagram model as the input bus signal; defining an output to the non-virtual operation block in the graphical block diagram as the output bus signal; and simulating an operation performed on the input bus signal by the non-virtual operation block, the operation being performed on each of the first group of signals and output to each of the second group of signals.

Abstract: Various aspects of the present invention are directed to design modeling and/or processing of streaming data. According to an example embodiment, a system to model a hardware specification includes a platform (106) arranged to receive an input data stream and transmit an output data stream. The system also includes a source (102) for a streaming application adapted to provide the input data stream at a source data rate, a destination (104) for the streaming application adapted to consume the output data stream at a destination data rate, and a data channel (110) coupling the platform and a computer (108). The computer uses the hardware specification to generate intermediate data streams, which, in turn, are used to streamline the modeling for the platform.

Abstract: In one embodiment, a method for satisfiability (SAT)-based bounded model checking (BMC) includes isolating information learned from a first iteration of an SAT-based BMC process and applying the isolated information from the first iteration of the SAT-based BMC process to a second iteration of the SAT-based BMC process subsequent to the first iteration.

Abstract: Testing a model of a logic circuit model. The testing includes generating valid random input stimulus sequences for a logic circuit model. Enumerating critical resource requirements, enumerating critical resource availabilities does this, and selecting of stimulus sequences and determining legal times for execution of said stimulus sequences based on resource availability. This includes generating a plurality of possible combinations of input stimulus sequences and generating an array representation of critical resource requirements. These are used to generate an array representation of critical resources availabilities.

Abstract: A circuit analyzing device includes: a peripheral input signal setting part configured to make a signal setting by a predetermined requirement for a peripheral input which does not logically affect operation of the predetermined circuit part, upon analyzing a signal delay in operation of a predetermined circuit part, and wherein: analysis is made for a signal propagation operation delay in operation of the predetermined circuit part, in consideration of influence of the signal input from the signal setting.

Abstract: The process by which a logical simulation model is implemented in a physical device may introduce errors in the resulting implementation. A simulation system enables comparison of a realized physical implementation against the simulation models that produce them, thereby detecting differences between an initial, logical design and the resulting physical embodiment. Errors introduced by an initial design, faulty Intellectual Property blocks, faulty programmable logic device silicon, faulty synthesis algorithms and software, and faulty place and route algorithms and software may be detected. As a result, the simulation system reflects both the accuracy of the actual implemented device with the capacity and performance of a purpose built hardware-assisted solution.

Abstract: A system that includes a controller for enabling an enumeration operation. The enumeration operation is performed by a controller (110) and logic elements (120) in a system, such that each logic element in the system assigns itself a unique identifier. Each logic element can then be controlled by another source or have a means to communicate with other logic elements in the system. The unique identifier enables greater system flexibility, thereby reducing cost and improving efficiency.

Abstract: To provide a logic verification apparatus capable of preventing, when an indeterminate value is generated in logic verification, the indeterminate value from being unintentionally erased. A simulation part performs a simulation based on a description of the logic function described in a hardware description language. A second symbol replacing part replaces an indeterminate value generated in the simulation by the simulation part with a symbol. The simulation part generates a symbol expression and propagates it to an element at a later stage when the symbol replaced by the second symbol replacing part reaches an element being processed. Therefore, unintentional erasing of the indeterminate value generated during the simulation can be prevented.

Abstract: Methods and apparatus are provided for efficiently generating test components for testing and evaluating a design under test. As a design is being configured, generated test components are made available. In one example, test components are automatically generated and included in a simulation testbench based on selected components in the design. Generally, the test components complement the selected components in the design. Moreover, the test components can be automatically seeded with initial contents.

Abstract: For the purpose of providing a simulation model allowing gate simulation but is capable of keeping the circuit information on the functional block (IP) secret, a method of generating a simulation model provided herein by the present invention comprises a step of generating a net list containing circuit information of an electronic circuit using a functional block; and a step of deleting the circuit information based on the net list, and generating a gate simulation model carrying out a timing simulation, including logic information and delay information between input/output of the functional block.

Abstract: A method of creating a secure intellectual property (IP) representation of a circuit design for use with a software-based simulator can include translating a hardware description language representation of the circuit design into an encrypted intermediate form and compiling the intermediate form of the circuit design to produce encrypted object code. The method further can include linking the encrypted object code with a simulation kernel library thereby creating the secure IP representation of the circuit design. The secure IP can include an encrypted simulation model of the circuit design and a simulation kernel configured to execute the encrypted simulation model.

Abstract: A simulation environment is disclosed wherein both analog and RF signals are simulated in a single flow by a mixed-domain simulator. The simulator includes a simulator kernel with an analog solver and an RF solver to allow both analog- and RF-type of signals to be solved in an interrelated fashion. The simulator may also include a partitioner that divides the circuit into various RF and analog modules to be solved. User input may control the partitioning process, but the simulator may refine the partitions or generate sub-partitions to provide a higher probability of convergence.

Abstract: A logic simulation apparatus includes: a jitter detector generation section 21 that generates information concerning a jitter circuit for determining whether a time variation occurs in signal passing between a first circuit and a second circuit, the first circuit configured to output a signal with a clock output from a predetermined clock source and the second circuit configured to output a signal with a clock output from a clock source different from the above predetermined clock source; and a constraint solver generation section 22 that generates information concerning a solver that is configured to create a signal to be output at an observation point using a logical expression of an output signal of the second circuit and output, based on the logical expression and output signal of the jitter detector circuit, a signal constrained by the output signal of the jitter detector circuit and output signal of the second circuit.

Abstract: Design for testability (DFT) algorithms, which use both gradient descent and linear programming (LP) algorithms to insert test points (TPs) and/or scanned flip-flops (SFFs) into large circuits to make them testable are described. Scanning of either all flip-flops or a subset of flip-flops is supported. The algorithms measure testability using probabilities computed from logic simulation, Shannon's entropy measure (from information theory), and spectral analysis of the circuit in the frequency domain. The DFT hardware inserter methods uses toggling rates of the flip-flops (analyzed using digital signal processing (DSP) methods) and Shannon entropy measures of flip-flops to select flip-flops for scan. The optimal insertion of the DFT hardware reduces the amount of DFT hardware, since the gradient descent and linear program optimizations trade off inserting a TP versus inserting an SFF.

Abstract: A circuit simulation model generation apparatus includes: a power supply wiring model generation section that generates a power supply wiring model which is a model of the power supply wiring; a logic circuit model generation section that generates a logic circuit model which is a model of the logic circuit; and a link section that adds, to the logic circuit model and the power supply wiring model, a voltage controller that acquires a potential value of a logic circuit connecting terminal and gives the acquired potential value to a power supply wiring connecting terminal and a current controller that acquires a current value of the power supply wiring connecting terminal and gives the acquired current value to the logic circuit connecting terminal in the simulation, and links the logic circuit model and the power supply wiring model to generate a simulation model.

Abstract: A method and a system for conducting a static timing analysis on a circuit having a plurality of point-to-point delay constraints between two points of the circuit, in which two conservative and two optimistic user defined tests are derived for all types of the point-to-point delay constraints. The method shows that when a conservative test is performed without introducing any special tags, then it is found that the point-to-point constraint is satisfied. On the other hand, when the optimistic test fails without any special tags, it is determined that the point-to-point constraint is bound to fail if special tags are introduced, in which case, they are to be introduced only when an exact slack is desired. Finally, for anything in between, a real analysis with special tags or path tracing is required. Based on the topology of the graph, arrival time based tests may be tighter in some situations, while the required arrival time based tests, may be tighter in others.

Abstract: A configurable, low power high fan-in multiplexer (MUX) and design structure thereof are disclosed. The MUX circuit includes multiple current control elements, which each include multiple inverters coupled to a transmission gate. Each current control element receives a data signal and a select signal that corresponds to the data signal. If a select signal exceeds a threshold value (e.g., a logical “1”), the select signal deactivates a pull-up transistor (e.g., a p-type field effect transistor), and the transmission gate enables the corresponding data signal to provide input to a logic gate (e.g., a NAND gate) coupled to the output of the MUX. If the select signal does not exceed the threshold value, the select signal activates the pull-up transistor, and the transmission gate prevents the corresponding data signal from providing input to the logic gate.

Abstract: Various embodiments include methods and apparatus for simulating a transistor using a simulation model that includes a transistor simulation model coupled to diode simulation model.

Abstract: Translation of high-level design blocks into a design specification in a hardware description language (HDL). Each block in the high-level design is assigned to a group. A set of attributes is identical between the blocks in a group. For each group of blocks, a respective set of parameters having different values on subblocks of at least two blocks in the group is determined. An HDL specification is generated for each group. The HDL specification for a group has for each parameter in the set of parameters, a parameter input.

Abstract: A novel hybrid stochastic gradient adaptation apparatus and method for calibrating the gain of an RF or non-RF digitally controlled oscillator (DCO). The adaptation algorithm determines a true stochastic gradient between a forcing function and its corresponding system measure to estimate the system parameters being adapted. A momentum term is generated and injected into the adaptation algorithm in order to stabilize the algorithm by adding inertia against any large transient variations in the input data. In the case of adaptation of DCO gain KDCO, the algorithm determines the stochastic gradient between time varying calibration or actual modulation data and the raw phase error accumulated in an all digital phase locked loop (ADPLL). Two filters preprocess the observable data to limit the bandwidth of the computed stochastic gradient providing a trade-off between sensitivity and settling time.

Abstract: Latches in a net of a simulated integrated circuit design are initialized to known logical states prior to application of a reset signal at the beginning of the simulation. The logical states may be set by generating a list of the latches, sorting them in random order, and then dividing them into two groups based on the random order with high and low logical states respectively assigned to the two groups. In a specific implementation the latch states are set using an HDL force command prior to applying the reset signal, and the force command is removed after applying the reset signal using an HDL release command. If the circuit description is a gate-level netlist, then logical states of gates within the storage elements are also set.

Abstract: An interface test can be performed by, for example, only a self apparatus when interface operation specifications are different between the self apparatus and an original connection partner apparatus. An LSI has a plurality of interfaces (IFs) for transmission/reception of data with an external device, and the LSI includes an emulation control unit for allowing one of the two of the plurality of IFs to perform an operation of emulating an IF of a connection partner device having operation specifications different from those of the LSI, when two IFs are connected to each other via a transmission line.

Abstract: A display designing system and a method thereof. The display designing system includes a variety of operation modules and an integration module. After receiving initial parameters and selecting operation type parameters, the operation modules generate operation results and transfer the operation results to the integration module. The integration module integrates the operation results and generates a correspondence relation, such as an operation window, a compare-table and an equation. The integration module then transfers the operation results and the correspondence relation to the output module. The output module displays effect variations of a variety of designs corresponding to the initial parameters. Therefore, the method can provide a user with an easy way to obtain ideal design parameters for designing a display pixel circuit.

Abstract: A system and method of providing error detection and correction capability in an IC using redundant logic cells and an embedded field programmable gate array (FPGA). The system and method provide error correction (EC) to enable a defective logic function implemented within an IC chip design to be replaced, wherein at least one embedded FPGA is provided in the IC chip to perform a logic function. If a defective logic function is identified in the IC design, the embedded FPGA is programmed to correctly perform the defective logic function. All inputs in an input cone of logic of the defective logic function are identified and are directed into the embedded FPGA, such that the embedded FPGA performs the logic function of the defective logic function.

Abstract: The present invention provides for simulating signal transitions. Circuit characteristics are generated. Circuit characteristics are loaded into memory. Circuit behaviour is simulated. A non-leading edge circuit transition is captured. This occurs in software.

Abstract: A method and system for simulation of an electronic circuit is provided, the circuit being represented by a network of a plurality of logic elements, the circuit comprising first and second asynchronous clock domains, whereby jitter elements are additionally inserted at predetermined portions of circuit boundaries between the first and second clock domains, the jitter elements being represented as logic elements, the values of which are randomly set.

Abstract: A differential amplifier and a method for generating a computer simulation model thereof are disclosed. The device is thermally stable through adoption of a ballast resistor to a differential structure of a unit transistor pair, such that the differential amplifier prevents heat effect phenomena, such as performance deterioration and device destruction by heating, and, at the same time, improves or maintains other performances, thereby achieving high gain, high efficiency, high linearity, and wide bandwidth characteristics. Therefore, the differential amplifier can be easily designed as undesired effects of parasitic resistor of emitter or via or bonding wire, etc. for the differential amplifier are reduced in a differential mode.